Transistor tester

Abstract

The utility model provides a transistor tester, which comprises a test assembly, a transmission assembly and a shell, and is characterized in that the test assembly is used for testing the performance of a transistor, the transmission assembly is electrically connected with the test assembly and is used for storing and transmitting data generated by the test assembly to the outside, and the shell comprises a top shell and a bottom shell; according to the transistor tester, the storage module is arranged on the circuit board, so that the transistor tester can store data obtained through testing, and then the transistor tester is connected with external electronic equipment through the USB interface to export the data. In this way, the problem that data measured by a traditional transistor measuring instrument cannot be observed in real time is solved.

Description

Technical Field

[0001] The present application relates to the technical field of transistor testing, and in particular to a transistor tester. Background Art

[0002] Transistor testers are mainly used to measure the performance parameters of transistors, but the data measured by traditional transistor testers cannot be viewed in real time, and cannot be stored and transmitted to external devices, which brings inconvenience to the recording and analysis of experimental data. And it cannot provide convenient data recording for subsequent research or report generation.

[0003] In order to solve this problem, there have been some attempts in the prior art, such as taking photos of the data or manually recording the data. However, such methods are not only inefficient, but also prone to human errors, and also affect the credibility of the data.

[0004] Therefore, it is necessary to design a transistor tester that can store and transmit transistor measurement data to external equipment to solve the problem that the data measured by traditional transistor testers cannot be viewed in real time. Utility Model Content

[0005] In view of this, it is necessary to provide a transistor tester to solve the above problems.

[0006] An embodiment of the present application provides a transistor tester, comprising:

[0007] Test components for testing transistor performance;

[0008] A transmission component, electrically connected to the test component, and used for storing and transmitting data generated by the test component to the outside world;

[0009] The housing comprises a top housing and a bottom housing, wherein the testing component and the transmission component are both arranged between the top housing and the bottom housing.

[0010] In at least one embodiment of the present application, the test component includes:

[0011] A measuring module is used to connect to an external power supply to test the transistor;

[0012] a connection module, electrically connected to the measuring module, on which the transistor is fixed for testing;

[0013] A circuit board, the measuring module, the connecting module and the transmission component are all arranged on the circuit board, and are electrically connected through the circuit board.

[0014] In at least one embodiment of the present application, the measurement module includes:

[0015] Electrical interface, in direct contact with external power supply;

[0016] An electric bridge, provided between the electric interface and the circuit board, electrically connected to the electric interface and the circuit board, and a plurality of the electric interfaces are provided on the electric bridge;

[0017] Wherein, the electrical bridge is provided with a fixing screw, and the fixing screw extends into the electrical interface when tightened.

[0018] In at least one embodiment of the present application, the connection module includes:

[0019] A connection block, fixedly connected to the circuit board, wherein the connection block is provided with an electrical socket, and the electrical socket is electrically connected to the circuit board;

[0020] The clamp includes a rocker and a clamp block, wherein the clamp block is arranged between the electrical socket and the circuit board, and the rocker is arranged on the clamp block. When the rocker rotates in a direction away from the circuit board, the clamp block opens, and the electrical socket is connected to the circuit board. When the transistor is inserted into the electrical socket, the rocker rotates in a direction close to the circuit board, the clamp block is clamped, and the transistor is fixed in the electrical socket by the clamp block.

[0021] In at least one embodiment of the present application, the transmission component includes:

[0022] A storage module, electrically connected to the test component, and used to store data measured by the transmission component;

[0023] The USB interface is electrically connected to the storage module and is used to connect to an external device to export the data in the storage module.

[0024] In at least one embodiment of the present application, the top shell is snap-connected to the bottom shell.

[0025] In at least one embodiment of the present application, a non-slip pad is provided on a side of the bottom shell away from the circuit board, and the non-slip pad is located at a corner of the bottom shell.

[0026] In at least one embodiment of the present application, a display component is further included, and the display component is disposed on the top shell and electrically connected to the storage module, and is used to display the data measured by the test component.

[0027] In at least one embodiment of the present application, the circuit board is provided with a switch, and the switch is used to control the display component to start and shut down.

[0028] In at least one embodiment of the present application, the circuit board is connected to the top shell by bolts.

[0029] The transistor tester provided above sets a storage module on the circuit board so that the transistor tester can store the test data, and then connects to external electronic devices through a USB interface to export the data. In this way, the problem that the data measured by traditional transistor testers cannot be viewed in real time is solved. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] Figure 1 A three-dimensional image of one side of the top case of a transistor tester.

[0031] Figure 2 This is a three-dimensional image of one side of the bottom case of the transistor tester.

[0032] Figure 3 A perspective view of the transistor tester with the top and bottom cases hidden.

[0033] Figure 4 for Figure 3 The transistor tester is provided with a three-dimensional view of one side of a storage module.

[0034] Main component symbols

[0035] 100. Transistor tester; 1. Test component; 11. Measuring module; 111. Electrical interface; 112. Bridge; 113. Fixing screw; 12. Connection module; 121. Connection block; 122. Electrical socket; 123. Fixture; 1231. Joystick; 1232. Clamp; 13. Circuit board; 2. Transmission component; 21. Storage module; 22. USB interface; 3. Outer shell; 31. Bottom shell; 321. Anti-skid pad; 32. Top shell; 4. Display component; 5. Switch. DETAILED DESCRIPTION

[0036] The embodiments of the present application will be described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments.

[0037] It should be noted that when a component is considered to be "connected" to another component, it may be directly connected to the other component or there may be a central component at the same time. When a component is considered to be "located on" another component, it may be directly located on the other component or there may be a central component at the same time. The terms "top", "bottom", "upper", "lower", "left", "right", "front", "back", and similar expressions used herein are for illustrative purposes only.

[0038] An embodiment of the present application provides a transistor tester, comprising:

[0039] Test components for testing transistor performance;

[0040] A transmission component, electrically connected to the test component, and used for storing and transmitting data generated by the test component to the outside world;

[0041] The housing comprises a top housing and a bottom housing, wherein the testing component and the transmission component are both arranged between the top housing and the bottom housing.

[0042] The transistor tester provided above sets a storage module on the circuit board so that the transistor tester can store the test data, and then connects to external electronic devices through a USB interface to export the data. In this way, the problem that the data measured by traditional transistor testers cannot be viewed in real time is solved.

[0043] Some embodiments of the present application are described in detail below in conjunction with the accompanying drawings. In the absence of conflict, the following embodiments and features in the embodiments can be combined with each other.

[0044] See also Figure 1-Figure 3 An embodiment of the present application provides a transistor tester 100, including a test component 1, a transmission component 2 and a housing 3, wherein the test component 1 is used to test transistor performance, the transmission component 2 is electrically connected to the test component 1, and is used to store and transmit data generated by the test component 1 to the outside world, the housing 3 includes a top shell 32 and a bottom shell 31, and the test component 1 and the transmission component 2 are both arranged between the top shell 32 and the bottom shell 31.

[0045] Specifically, the test component 1 is the core part of this instrument, which is used to perform performance tests on transistors, including measuring electrical characteristics, power consumption, response time, etc., which can ensure the quality and performance of transistors so that they can be used reliably in electronic devices. Through the test component 1, unqualified transistors can be screened out to improve the reliability of the product. The transmission component 2 is responsible for storing the data obtained from the test component 1 and transmitting it to other devices or systems through an external interface. The data transmission and storage functions enable users to record and analyze test results for subsequent analysis or quality control. The housing 3 provides protection and support, fixing the test component 1 and the transmission component 2 together, while protecting them from interference from the external environment. At the same time, because of the existence of the housing 3, the transistor measuring instrument can be easily moved, because it can be directly carried without worrying about touching the internal components.

[0046] In a specific example, the test component 1 includes:

[0047] A measuring module 11 is used to connect to an external power supply to test the transistor;

[0048] A connection module 12, electrically connected to the measuring module 11, on which the transistor is fixed for testing;

[0049] A circuit board 13 , on which the measuring module 11 , the connecting module 12 and the transmission component 2 are all arranged, and are electrically connected via the circuit board 13 .

[0050] Specifically, the main task of the measurement module 11 is to provide power and measurement circuits so as to perform various electrical characteristic measurements on the transistor during testing, such as current, voltage, etc. The function of the connection module 12 is to stably connect the transistor to the measurement module 11 to ensure that the transistor does not move or loosen during testing. The circuit board 13 acts as a platform for connecting and supporting components, and at the same time provides electrical connections so that the test components 1 can communicate with each other.

[0051] In a specific example, the measuring module 11 includes:

[0052] The electrical interface 111 is in direct contact with an external power source;

[0053] an electric bridge 112, disposed between the electric interface 111 and the circuit board 13, and electrically connected to the electric interface 111 and the circuit board 13, wherein a plurality of the electric interfaces 111 are disposed on the electric bridge 112;

[0054] The electrical bridge 112 is provided with a fixing screw 113 , and the fixing screw 113 extends into the electrical interface 111 when tightened.

[0055] Specifically, the electrical interface 111 is the interface of the measuring module 11, which is used to connect an external power supply to supply electrical energy and voltage to the transistor for testing. The bridge 112 acts as a bridge connecting the electrical interface 111 and the circuit board 13, so that electrical energy can be transmitted to the circuit board 13. At the same time, multiple electrical interfaces 111 are provided to support multi-channel testing. The function of the fixing screw 113 is to ensure that the electrical connection between the electrical interface 111 and the bridge 112 is tight. The external power supply is mostly wires, and the metal in the wires has good ductility. Using the fixing screw 113 to fix it can be very tight to prevent loosening or falling off.

[0056] In a specific example, the connection module 12 includes:

[0057] A connection block 121 is fixedly connected to the circuit board 13. The connection block 121 is provided with an electrical socket 122. The electrical socket 122 is electrically connected to the circuit board 13.

[0058] The clamp 123 includes a rocker 1231 and a clamp block 1232. The clamp block 1232 is arranged between the electrical socket 122 and the circuit board 13. The rocker 1231 is arranged on the clamp block 1232. When the rocker 1231 rotates in a direction away from the circuit board 13, the clamp block 1232 opens, and the electrical socket 122 is connected to the circuit board 13. When the transistor is inserted into the electrical socket 122, when the rocker 1231 rotates in a direction close to the circuit board 13, the clamp block 1232 is clamped, and the transistor is fixed in the electrical socket 122 by the clamp block 1232.

[0059] Specifically, the connection block 121 is a component fixed on the circuit board 13, on which an electrical socket 122 is provided for electrical connection with the circuit board 13. The function of this feature is to provide a stable connection point to ensure that the electrical connection between the connection module 12 and the circuit board 13 is firm. The beneficial effect is to improve the reliability and stability of the connection. The application scenario can be any test instrument that requires a stable electrical connection, such as a transistor tester 100, an electronic equipment test equipment, etc. The clamping block 1232 is located between the electrical socket 122 and the circuit board 13 and can be opened and clamped. When the rocker 1231 rotates in a direction away from the circuit board 13, the clamping block 1232 opens to connect the electrical socket 122 with the circuit board 13. When the rocker 1231 rotates in a direction close to the circuit board 13, the clamping block 1232 clamps to cut off the connection between the electrical socket 122 and the circuit board 13. The function of this feature is to allow the user to conveniently clamp the transistor, because the pins of the transistor have good rigidity, and the clamping block 1232 will abut against the transistor when clamped, so that the transistor being tested can be installed or replaced more easily. The beneficial effect is to improve the convenience and efficiency of use. The application scenario can be any test instrument that needs to frequently change the test object, such as electronic component testing equipment.

[0060] In a specific example, the transmission component 2 includes:

[0061] A storage module 21, electrically connected to the test component 1, and used to store data measured by the transmission component 2;

[0062] The USB interface 22 is electrically connected to the storage module 21 and is used to connect to an external device to export the data in the storage module 21 .

[0063] Specifically, the storage module 21 is part of the transmission component 2 and is electrically connected to the test component 1. Its main function is to store the data generated from the test component 1. When the test component 1 performs a transistor performance test, the generated data will be transmitted and stored in the storage module 21. This is beneficial for recording the test results for subsequent analysis and report generation. The USB interface 22 is part of the transmission component 2 and is electrically connected to the storage module 21. The function of the USB interface 22 is to allow external devices to be connected to the transistor tester 100 so as to export the data stored in the storage module 21. The user can transfer the test data to a computer or other device through the USB interface 22 for data analysis, backup or test report generation.

[0064] Furthermore, during the test process, the data generated by the test component 1 will first be transmitted to the storage module 21, which ensures the reliable storage of the data. When the data needs to be exported, the user can connect an external device (such as a computer) to the USB interface 22 of the tester. Through the USB interface 22, the user can access the data in the storage module 21 and transfer it to an external device for analysis or report generation.

[0065] In a specific example, the top shell 32 is snap-connected to the bottom shell 31 .

[0066] Specifically, the snap connection provides a reliable mechanical connection method to tightly fix the top shell 32 and the bottom shell 31 together, ensuring the stability and safety of the various components of the tester. This connection method makes maintenance and repair easier. Users can easily disassemble and assemble the shell 3 of the tester to access the internal components, such as replacing damaged parts or performing regular maintenance. The snap connection can effectively disperse external pressure and vibration, thereby reducing the risk of damage to the shell 3 and internal components and extending the life of the tester.

[0067] In a specific example, a non-slip pad 321 is provided on a side of the bottom shell 31 away from the circuit board 13 , and the non-slip pad 321 is located at a corner of the bottom shell 31 .

[0068] Specifically, the anti-skid pads 321 on the bottom shell 31 provide additional friction to prevent the tester from accidentally sliding or shifting during use. This increases the stability of the tester on the table, helps prevent it from accidentally sliding or tilting during testing, and thus improves safety. The anti-skid pads 321 are located at the corners of the bottom shell 31, which helps to reduce vibration and impact between the bottom shell 31 and the internal circuit board 13. This can reduce the impact of mechanical stress on the circuit board 13, extend the life of the circuit board 13, and reduce the cost of repairing and replacing parts. At the same time, designing the anti-skid pads 321 at the corners can achieve the same effect as setting the anti-skid pads 321 on the entire bottom surface of the anti-skid pads 321, so this method can reduce the material cost during production.

[0069] In a specific example, a display component 4 is further included, and the display component 4 is disposed on the top shell 32 and electrically connected to the storage module 21 , and is used to display the data measured by the test component 1 .

[0070] Specifically, the display component 4 provides an intuitive way to present the data measured by the transistor tester 100. Users can view the measurement results directly through the display screen without having to rely on external devices or software to interpret and analyze the data. The display component 4 can instantly display the test results, allowing operators to quickly evaluate transistor performance. This helps to improve efficiency, especially in situations where quick decisions are required, such as quality control on a manufacturing line. Through the display component 4, users can easily understand and interpret test results without having to have in-depth technical knowledge. This enhances the user-friendliness of the device and reduces the user's learning curve. The display component 4 can be customized as needed to meet the requirements of different types of tests. Users can choose to display different parameters, charts, or graphs to better meet the needs of their specific applications.

[0071] In a specific example, the circuit board 13 is provided with a switch 5, and the switch 5 is used to control the display component 4 to start and shut down.

[0072] Specifically, the switch 5 allows the user to start or shut down the display assembly 4 at any time. The user can choose when to view the test results as needed, thereby saving energy and extending the life of the display assembly 4. In some cases, the test data may contain sensitive information, or the user may not want the test results to be displayed at certain times. By controlling the switch 5, the user can ensure that the data is only displayed when necessary, thereby enhancing privacy protection.

[0073] In a specific example, the circuit board 13 and the top shell 32 are connected by bolts.

[0074] Specifically, through the bolt connection, a strong physical connection is established between the circuit board 13 and the top shell 32, ensuring the structural stability of the device. This is particularly important for application scenarios where the device is subject to vibration or external impact during operation. The bolt connection allows the circuit board 13 to be quickly disassembled for maintenance or repair. This provides a more convenient way to access the circuit board 13 to replace parts or perform maintenance. The bolt connection structure can adapt to different sizes of circuit boards 13 and top shells 32, making the design of the device more flexible and applicable to transistor testers 100 of various specifications.

[0075] The above is only an implementation method of the present application. It should be pointed out that a person skilled in the art can make improvements without departing from the inventive concept of the present application, but these improvements are within the scope of protection of the present application.

Claims

1. A transistor tester, characterized in that: include: Test components for testing transistor performance; A transmission component, electrically connected to the test component, and used for storing and transmitting data generated by the test component to the outside world; The housing comprises a top housing and a bottom housing, wherein the testing component and the transmission component are both arranged between the top housing and the bottom housing; The test components include: A measuring module is used to connect to an external power supply to test the transistor; a connection module, electrically connected to the measuring module, on which the transistor is fixed for testing; A circuit board, on which the measuring module, the connecting module and the transmission component are all arranged and electrically connected; The measurement module comprises: Electrical interface, in direct contact with external power supply; An electric bridge, provided between the electric interface and the circuit board, electrically connected to the electric interface and the circuit board, and a plurality of the electric interfaces are provided on the electric bridge; Wherein, the electrical bridge is provided with a fixing screw, and the fixing screw extends into the electrical interface when tightened.

2. The transistor tester according to claim 1, characterized in that: The connection module comprises: A connection block, fixedly connected to the circuit board, wherein the connection block is provided with an electrical socket, and the electrical socket is electrically connected to the circuit board; The clamp includes a rocker and a clamp block, wherein the clamp block is arranged between the electrical socket and the circuit board, and the rocker is arranged on the clamp block. When the rocker rotates in a direction away from the circuit board, the clamp block opens, and the electrical socket is connected to the circuit board. When the transistor is inserted into the electrical socket, the rocker rotates in a direction close to the circuit board, the clamp block is clamped, and the transistor is fixed in the electrical socket by the clamp block.

3. The transistor tester according to claim 1, characterized in that: The transmission component comprises: A storage module, electrically connected to the test component, and used to store data measured by the transmission component; The USB interface is electrically connected to the storage module and is used to connect to an external device to export the data in the storage module.

4. The transistor tester according to claim 1, characterized in that: The top shell is snap-connected to the bottom shell.

5. The transistor tester according to claim 1, characterized in that: A non-slip pad is provided on one side of the bottom shell away from the circuit board, and the non-slip pad is located at a corner of the bottom shell.

6. The transistor tester according to claim 3, characterized in that: It also includes a display component, which is arranged on the top shell and electrically connected to the storage module for displaying the data measured by the test component.

7. The transistor tester according to claim 6, characterized in that: The circuit board is provided with a switch, and the switch is used to control the display component to start and shut down.

8. The transistor tester according to claim 1, characterized in that: The circuit board is connected to the top shell by bolts.

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