Electron microscope with adjustable sample fixing table
By designing adjustment components of components such as threaded rods, knobs and curved plates on the electron microscope sample fixing table, stable adjustment and limiting of the sample fixing table are achieved, and the problem of deviation caused by external force touching of the sample fixing table is solved. , improves the stability and accuracy of observation.
Patent Information
- Application Number
- CN202420308221.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-02-20
- Publication Date
- 2024-12-13
- Estimated Expiration
- 2034-02-20
AI Technical Summary
The existing electron microscope sample fixing table cannot be effectively limited when used, and it is prone to shift due to external force touching, affecting the observation effect.
An adjustment component including a threaded rod, knob, slider, movable rod and limit slot is designed. The threaded rod and slider are driven to move through the knob rotation. Combined with the design of the arc plate and the connecting rod, the spring and the clamp plate are used to achieve the The limit of the knob prevents the sample fixing table from being offset.
Effectively prevent the sample fixing table from being offset due to mistouching of external forces, ensure observation stability and accuracy, and improve the adjustment flexibility and stability of the sample fixing table.
Smart Images
Figure CN222168320U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of electron microscopes, in particular to an electron microscope with an adjustable sample fixing platform. Background Art
[0002] An electron microscope is a type of microscope that uses a beam of electrons to observe and magnify samples. Compared to ordinary optical microscopes, electron microscopes can provide higher magnification and higher resolution, allowing us to observe smaller structures and details.
[0003] When an existing electron microscope is in use, the object to be observed is placed on a sample holding table and then observed. Although some existing electron microscopes can adjust the sample holding table during use, the sample holding table cannot be limited after the adjustment. Therefore, if an external force touches the sample holding table during use, the sample holding table may be offset, thereby affecting the normal observation of personnel. Utility Model Content
[0004] The utility model aims to provide an electron microscope with an adjustable sample fixing platform to solve the problems raised in the above background technology.
[0005] To achieve the above object, the utility model provides the following technical solution: an electron microscope with an adjustable sample fixing table, comprising an electron microscope body, a base is fixed on the surface of the electron microscope body, the top of the base is open, a slide groove is provided on the surface of the base, a sample fixing table is placed on the top of the base, and an adjustment component is provided on the inner wall and surface of the base, and the adjustment component comprises:
[0006] A threaded rod, the threaded rod is rotatably connected to the inner wall of the base, the surface of the base is rotatably connected to a knob, the output shaft of the knob passes through the base, and the output shaft of the knob is rotatably connected to the base, the output shaft of the knob is fixedly connected to the threaded rod, the threaded rod passes through a slide plate, the slide plate is threadedly connected to the threaded rod, the bottom of the slide plate is slidably connected to the bottom of the inner wall of the base, the top of the slide plate is hinged with a movable rod, the top of the movable rod is hinged to the bottom of the sample fixing table, a limiting groove is provided on the surface of the knob, and the adjustment assembly also includes a fixing part, turning the knob to rotate the threaded rod, thereby driving the slide plate to move inward or outward synchronously, and the sample fixing table is raised or moved down through the movable rod.
[0007] Preferably, the fixing member includes an arc-shaped plate, which is slidably connected to the inner wall of the slide groove, a through hole is opened inside the arc-shaped plate, and a connecting rod is fitted on the inner wall of the through hole, and the arc-shaped plate and the connecting rod are each provided with four groups, and the four groups of arc-shaped plates and the connecting rod are arranged in a circular array with the center of the knob as the axis, and springs are fixed between the four groups of connecting rods, and a clamping plate is fixed on the side of the arc-shaped plate close to the knob, and a pull rod is fixed on the side surface of one of the four groups of arc-shaped plates away from the knob, and the arc-shaped plate can be pulled down to drive the clamping plate to disengage from the limiting groove, so that the knob can rotate normally, and the pull rod is released, and under the action of the spring, the four groups of arc-shaped plates synchronously drive the clamping plate to move radially inward, so that the clamping plate enters the limiting groove, thereby limiting the knob and preventing the knob from rotating and causing the sample fixing platform to shift.
[0008] Preferably, the threaded rod is provided with two opposite threads, which facilitates the sliding plate to move synchronously when rotating.
[0009] Preferably, two groups of the slide plates and movable rods are provided, and the two groups of slide plates and movable rods are symmetrically arranged with the center line of the base as the symmetry axis to maintain the stability of the movement of the sample fixing table.
[0010] Preferably, the shape of the clamping plate is consistent with the shape of the limiting groove, so that the clamping plate can enter the limiting groove conveniently.
[0011] Preferably, the arc plate and the connecting rod are both arranged in an arc shape, which will not affect the radial movement of the arc plate.
[0012] Compared with the prior art, the utility model provides an electron microscope with an adjustable sample fixing table, which has the following beneficial effects:
[0013] 1. The electron microscope with an adjustable sample fixing table has an adjustment component set up. When the knob is turned, the threaded rod can be rotated, so that the slide plate drives the movable rod to move, and then the sample fixing table is adjusted. When the pull rod is loosened, the arc plate can be synchronously moved radially inward under the action of the spring, so that the clamping plate enters the limit groove to limit the knob, thereby preventing the knob from being rotated due to accidental touch of external force, causing the sample fixing table to shift and affecting personnel observation.
[0014] 2. The electron microscope with an adjustable sample fixing table can limit the moving range of the arc plate by setting a slide groove, so that the arc plate can only move along the slide groove, thereby allowing four groups of arc plates to perform radial synchronous movement. BRIEF DESCRIPTION OF THE DRAWINGS
[0015] Figure 1 This is a schematic diagram of the front view structure of the utility model;
[0016] Figure 2It is a schematic diagram of the partial internal structure of the utility model;
[0017] Figure 3 It is a partial side view structural schematic diagram of the utility model;
[0018] Figure 4 For this utility model Figure 3 A is a schematic diagram of the enlarged structure;
[0019] Figure 5 It is a partial cross-sectional structural schematic diagram of the utility model;
[0020] Figure 6 For this utility model Figure 5 Middle B is a schematic diagram of the enlarged structure.
[0021] In the figure: 1. electron microscope body; 2. base; 3. sample fixing table; 5. slide groove; 6. adjustment component; 60. threaded rod; 61. knob; 62. slide plate; 63. movable rod; 64. limit groove; 65. fixing part; 650. arc plate; 651. through hole; 652. connecting rod; 653. spring; 654. clamping plate; 655. pull rod. DETAILED DESCRIPTION
[0022] like Figure 1-Figure 6 As shown, the utility model provides a technical solution: an electron microscope with an adjustable sample fixing table, comprising an electron microscope body 1, a base 2 is fixed on the surface of the electron microscope body 1, the top of the base 2 is open, a slide groove 5 is provided on the surface of the base 2, a sample fixing table 3 is placed on the top of the base 2, and an adjustment component 6 is provided on the inner wall and surface of the base 2. The adjustment component 6 includes: a threaded rod 60, a knob 61, a slide plate 62, a movable rod 63, a limiting groove 64, a fixing part 65, an arc plate 650, a through hole 651, a linkage rod 652, a spring 653, a clamping plate 654, and a pull rod 655.
[0023] The threaded rod 60 is rotatably connected to the inner wall of the base 2, and the surface of the base 2 is rotatably connected with a knob 61, the output shaft of the knob 61 passes through the base 2, and the output shaft of the knob 61 is rotatably connected to the base 2, the output shaft of the knob 61 is fixedly connected to the threaded rod 60, the threaded rod 60 passes through a slide plate 62, the slide plate 62 is threadedly connected to the threaded rod 60, the bottom of the slide plate 62 is slidably connected to the bottom of the inner wall of the base 2, the top of the slide plate 62 is hinged with a movable rod 63, and the top of the movable rod 63 is hinged to the bottom of the sample fixing table 3. The surface of the knob 61 is provided with a limit groove 64, and the adjustment component 6 also includes a fixing member 65, and the fixing member 65 includes an arc plate 650, and the arc plate 650 is slidably connected to the inner wall of the slide groove 5. A through hole 651 is provided inside the arc plate 650, and a connecting rod 652 is attached to the inner wall of the through hole 651. There are four groups of arc plates 650 and connecting rods 652, and the four groups of arc plates 650 and connecting rods 652 are arranged in a circular array with the center of the knob 61 as the axis center. Springs 653 are fixed between the four groups of connecting rods 652. A clamping plate 654 is fixed to the side of the curved plate 650 close to the knob 61, and a pull rod 655 is fixed to the surface of one side of the four curved plates 650 away from the knob 61. The pull rod 655 is pulled down, and the pull rod 655 drives the curved plate 650 to move away from the knob 61. Through the provided slide groove 5 and the connecting rod 652, the four curved plates 650 can be made to move radially synchronously. The curved plate 650 drives the clamping plate 654 to disengage from the limiting groove 64. At this time, the knob 61 can be rotated, and the threaded rod 60 can be rotated. The slide plate 62 moves inward synchronously, and the movable rod 63 is used to make the sample fixing table 3 move upward vertically for adjustment. When it is adjusted to a suitable height, the personnel pushes away the pull rod 655. At this time, under the action of the spring 653, the four groups of arc plates 650 move radially close to the knob 61 synchronously through the resistance force, so that the card plate 654 enters the limit groove 64, so that the card plate 654 limits the knob 61, which can prevent the knob 61 from rotating due to accidental touch due to external force, causing the sample fixing table 3 to shift, affecting the observation of personnel.
[0024] The threaded rod 60 is provided with two opposite sections of threads. When rotating, the slide plate 62 can be moved inward or outward synchronously. There are two groups of slide plates 62 and movable rods 63, and the two groups of slide plates 62 and movable rods 63 are symmetrically arranged with the center line of the base 2 as the symmetry axis. When the threaded rod 60 rotates forward, the slide plate 62 can move inward synchronously, and the movable rod 63 can be flipped, driving the sample fixing table 3 to move up for adjustment. The flipping knob 61 can flip the threaded rod 60, so that the slide plate 62 moves to the side away from the center point of the base 2, thereby moving the sample fixing table 3 downward.
[0025] The shape of the clamping plate 654 is consistent with the shape of the limiting groove 64, so that the clamping plate 654 can enter the limiting groove 64. The arc plate 650 and the linkage rod 652 are both arranged in an arc shape, which will not affect the normal radial movement of the arc plate 650.
[0026] When it is necessary to observe the object, the object is placed on the surface of the sample fixing table 3. When it is necessary to adjust, the pull rod 655 is pulled down, so that the pull rod 655 drives the arc plate 650 to move away from the side of the knob 61. Through the provided slide groove 5 and the connecting rod 652, the four groups of arc plates 650 can perform radial synchronous movement, so that the arc plate 650 drives the clamping plate 654 to disengage from the limit groove 64. At this time, the person can turn the knob 61 to rotate the threaded rod 60. At this time, the slide plate 62 is simultaneously The sample fixing table 3 is moved inwardly through the movable rod 63 to be adjusted vertically upward. When it is adjusted to a suitable height, the personnel releases the pull rod 655. At this time, under the action of the spring 653, the four groups of arc plates 650 are synchronously moved radially close to the knob 61 through the resistance force, so that the clamping plate 654 enters the limiting groove 64, so that the clamping plate 654 limits the knob 61, which can prevent the knob 61 from rotating due to accidental touch due to external force, causing the sample fixing table 3 to deviate, affecting the observation of personnel.
[0027] The above generally describes the present invention in detail, but it is obvious to a person skilled in the art that some modifications or improvements can be made to the present invention. Therefore, modifications or improvements that do not deviate from the spirit of the present invention are within the scope of protection of the present invention.
Claims
1. An electron microscope with an adjustable sample fixing table, comprising an electron microscope body (1), characterized in that: A base (2) is fixed on the surface of the electron microscope body (1), the top of the base (2) is open, a slide groove (5) is provided on the surface of the base (2), a sample fixing table (3) is placed on the top of the base (2), and an adjustment component (6) is provided on the inner wall and surface of the base (2), and the adjustment component (6) comprises: A threaded rod (60), wherein the threaded rod (60) is rotatably connected to the inner wall of the base (2), and a knob (61) is rotatably connected to the surface of the base (2), an output shaft of the knob (61) passes through the base (2), and the output shaft of the knob (61) is rotatably connected to the base (2), the output shaft of the knob (61) is fixedly connected to the threaded rod (60), the threaded rod (60) passes through a slide plate (62), the slide plate (62) is threadedly connected to the threaded rod (60), the bottom of the slide plate (62) is slidably connected to the bottom of the inner wall of the base (2), the top of the slide plate (62) is hinged to a movable rod (63), the top of the movable rod (63) is hinged to the bottom of the sample fixing table (3), a limiting groove (64) is provided on the surface of the knob (61), and the adjustment component (6) also includes a fixing member (65).
2. The electron microscope with an adjustable sample fixing platform according to claim 1, characterized in that: The fixing member (65) comprises an arc-shaped plate (650), wherein the arc-shaped plate (650) is slidably connected to the inner wall of the slide groove (5), a through hole (651) is opened inside the arc-shaped plate (650), and a connecting rod (652) is attached to the inner wall of the through hole (651), and the arc-shaped plate (650) and the connecting rod (652) are each provided with four groups, and the four groups of arc-shaped plates (650) and the connecting rod (652) are all arranged in a circular array with the center of the circle of the knob (61) as the axis center, and a spring (653) is fixed between the four groups of the connecting rod (652), and a clamping plate (654) is fixed on the side of the arc-shaped plate (650) close to the knob (61), and a pull rod (655) is fixed on the surface of the side of one of the four groups of arc-shaped plates (650) away from the knob (61).
3. The electron microscope with an adjustable sample fixing platform according to claim 1, characterized in that: The threaded rod (60) is provided with two opposite threads.
4. The electron microscope with an adjustable sample fixing table according to claim 1, characterized in that: The slide plates (62) and movable rods (63) are provided in two groups, and the two groups of slide plates (62) and movable rods (63) are symmetrically arranged with the center line of the base (2) as the symmetry axis.
5. The electron microscope with an adjustable sample fixing platform according to claim 2, characterized in that: The shape of the clamping plate (654) is consistent with the shape of the limiting groove (64).
6. The electron microscope with an adjustable sample fixing platform according to claim 2, characterized in that: The arc plate (650) and the connecting rod (652) are both arranged in an arc shape.