Special test fixture for electronic component
By designing a flexible test fixture structure, including sliding rods and rubber pads, the test inconvenience caused by the fixed size of electronic components in the prior art is solved, and stable clamping and protection of electronic components of different sizes is achieved, and testing is improved. Practical and safe.
Patent Information
- Application Number
- CN202420502675.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-03-15
- Publication Date
- 2025-01-07
- Estimated Expiration
- 2034-03-15
AI Technical Summary
The existing electronic component test fixtures have relatively fixed requirements for the size of electronic components, which leads to the need to replace different test benches to adapt to different sizes of electronic components for clamping testing, which makes them unpractical.
A test fixture including an operating table, support plate, sliding block, support plate, compression spring, L-shaped plate, sliding rod and rubber pad is designed. Through the coordination of the limit groove of the sliding rod and the spring, the electronics of different sizes are realized. The clamping of components and provides thermal protection through rubber pads to prevent excessive heat from the electronic components during detection.
It realizes stable clamping and protection of electronic components of different sizes, avoids the disadvantages of replacing the test bench in the original technology, and improves the practicality and safety of the device.
Smart Images
Figure CN222318997U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of electronic components, in particular to a special test fixture for electronic components. Background Art
[0002] Electronic components are components of electronic components and small electrical machines and instruments. They are usually composed of several parts and can be used in similar products. They often refer to certain parts of electrical appliances, radios, instruments and other industries, such as capacitors, transistors, hairsprings, springs and other sub-devices. Common ones include diodes.
[0003] The inventors believe that the following defects often exist: when existing electronic components are clamped for testing, the size requirements of the electronic components are relatively fixed, and different test benches need to be replaced to perform clamping tests on electronic components of other sizes; therefore, a special test fixture for electronic components is proposed to address the above problems. Utility Model Content
[0004] The purpose of the utility model is to solve the shortcomings in the prior art that when electronic components are clamped for testing, the size requirements of the electronic components are relatively fixed, and different test benches need to be replaced to clamp and test electronic components of other sizes, and to propose a special test fixture for electronic components.
[0005] In order to achieve the above-mentioned purpose, the utility model adopts the following technical scheme: a special test fixture for electronic components, including an operating table, the upper surface of the operating table is fixedly connected to a support plate, the upper surface of the operating table is provided with two slide rails, the inner surfaces of the operating table slide rails are slidably connected with a sliding block, the upper surface of the sliding block is fixedly connected to a support plate, the support plate is fixedly connected to a long plate on the side close to the support plate, two compression springs are fixedly connected to one side of the support plate, the two compression springs are fixedly connected to an L-shaped plate on the side away from the support plate, the support plate is fixedly connected to an L-shaped frame on the side close to the support plate, a plurality of circular grooves are provided on the surface of the operating table, one side of the support plate is fixedly connected to a fixing plate, a sliding rod is slidably inserted in the fixing plate, one end of the sliding rod is fixedly connected to a pulling plate, and the arc surface of the sliding rod is slidably connected to the inner surface of the circular groove of the operating table.
[0006] The effect achieved by the above components is: it achieves the effect of clamping electronic components of different sizes, avoiding the situation where the original electronic component test bench has relatively fixed requirements on the size of electronic components and needs to replace different test benches to clamp and test electronic components of other sizes, thereby improving the practicality of the device.
[0007] Preferably, the arc surface of the sliding rod is sleeved with a first spring, and two ends of the first spring are fixedly connected to the pulling plate and the fixing plate respectively.
[0008] The effect achieved by the above components is that under the action force of the first spring, the stability of the sliding rod in the circular groove of the operating table is improved.
[0009] Preferably, a limiting groove is provided on the arc surface of the sliding rod, a limiting rod is slidably inserted into the fixing plate, and the arc surface of the limiting rod is slidably connected to the inner surface of the limiting groove of the sliding rod.
[0010] The effect achieved by the above components is: achieving the effect of limiting the stretched sliding rod, making it convenient for the operator to adjust the position of the support plate, thereby adapting to the detection of electronic components of different sizes and improving the practicability of the device.
[0011] Preferably, the L-shaped frame and the L-shaped plate are fixedly connected to a connecting plate on one side close to each other, and threaded rods are threadedly inserted in the two connecting plates, one end of the threaded rod is rotatably connected to an abutment plate, and the end of the threaded rod away from the abutment plate is fixedly connected to a turning handle.
[0012] The effects achieved by the above components are: the electronic components placed on the L-shaped plate and the L-shaped frame are fixed, the shaking of the electronic components during detection is avoided, and the practicability of the device is improved.
[0013] Preferably, a sliding rod is slidably inserted in the connecting plate, and one end of the sliding rod is fixedly connected to the abutting plate.
[0014] The effect achieved by the above-mentioned components is: achieving the effect of vertical movement of the abutment plate, avoiding the situation where when the handle is turned, the threaded rod drives the abutment plate to rotate in the connecting plate, and the threaded rod drives the abutment plate to rotate, and friction occurs between the abutment plate and the electronic components, thereby improving the practicability of the device.
[0015] Preferably, the upper surfaces of the L-shaped plate and the L-shaped frame are fixedly connected with rubber pads, and the rubber pads have a heat-conducting effect.
[0016] The effects achieved by the above components are: achieving the effect of protecting the electronic components, avoiding the occurrence of excessive heat in the electronic components during detection, and improving the practicality of the device.
[0017] Preferably, a handle is fixedly connected to one side of the support plate, and the size of the limit rod is adapted to the size of the limit groove of the sliding rod.
[0018] The effect achieved by the above components is that by pulling the handle, the operator can easily pull the handle to adjust the distance between the support plate and the support plate, thereby improving the practicality of the device.
[0019] In summary, the beneficial effects of the utility model are:
[0020] In the utility model, the effect of clamping electronic components of different sizes is achieved, which avoids the situation that when the original electronic component test bench is used for electronic components, the size requirements of the electronic components are relatively fixed, and different test benches need to be replaced to clamp and test electronic components of other sizes, thereby improving the practicality of the device. BRIEF DESCRIPTION OF THE DRAWINGS
[0021] Figure 1 It is a three-dimensional structural schematic diagram of the utility model;
[0022] Figure 2 It is a side view of the utility model;
[0023] Figure 3 For the utility model Figure 2 A magnified image of point A;
[0024] Figure 4 For the utility model Figure 2 Enlarged view of point B.
[0025] Legend: 1. Operating table; 2. Support plate; 3. Sliding block; 4. Support plate; 5. Long plate; 6. Compression spring; 7. L-shaped plate; 8. L-shaped frame; 9. Fixed plate; 10. Sliding rod; 11. Pull plate; 12. First spring; 13. Limiting rod; 14. Connecting plate; 15. Threaded rod; 16. Abutment plate; 17. Sliding rod; 18. Rubber pad; 19. Handle. DETAILED DESCRIPTION
[0026] Reference Figure 1-4As shown, the utility model provides a technical solution: a special test fixture for electronic components, including an operating table 1, a support plate 2 is fixedly connected to the upper surface of the operating table 1, two slide rails are arranged on the upper surface of the operating table 1, a sliding block 3 is slidably connected to the inner surface of the slide rail of the operating table 1, a support plate 4 is fixedly connected to the upper surface of the sliding block 3, a long plate 5 is fixedly connected to the side of the support plate 2 close to the support plate 4, two compression springs 6 are fixedly connected to one side of the support plate 2, an L-shaped plate 7 is fixedly connected to the side of the two compression springs 6 away from the support plate 2, an L-shaped frame 8 is fixedly connected to the side of the support plate 4 close to the support plate 2, a plurality of circular grooves are arranged on the surface of the operating table 1, a fixed plate 9 is fixedly connected to one side of the support plate 4, and a sliding rod 1 is slidably inserted in the fixed plate 9 0, one end of the sliding rod 10 is fixedly connected with a pull plate 11, and the arc surface of the sliding rod 10 is slidably connected to the inner surface of the circular groove of the operating table 1, so as to achieve the effect of clamping electronic components of different sizes, avoiding the situation that when the original electronic component test bench is used for electronic components, the size requirements of the electronic components are relatively fixed, and different test benches need to be replaced to clamp and test electronic components of other sizes, thereby improving the practicality of the device, and the arc surface of the sliding rod 10 is sleeved with a first spring 12, and the two ends of the first spring 12 are fixedly connected to the pull plate 11 and the fixed plate 9 respectively. Under the action of the first spring 12, the stability of the sliding rod 10 in the circular groove of the operating table 1 is improved, and a limiting groove is provided on the arc surface of the sliding rod 10, which is fixed A limit rod 13 is slidably inserted in the plate 9, and the arc surface of the limit rod 13 is slidably connected to the inner surface of the limit groove of the sliding rod 10, so as to achieve the effect of limiting the stretched sliding rod 10, which is convenient for the operator to adjust the position of the support plate 4, so as to adapt to the detection of electronic components of different sizes, thereby improving the practicability of the device, and the L-shaped frame 8 and the L-shaped plate 7 are fixedly connected to the side close to each other with a connecting plate 14, and the two connecting plates 14 are threadedly inserted with a threaded rod 15, one end of the threaded rod 15 is rotatably connected to the abutment plate 16, and the end of the threaded rod 15 away from the abutment plate 16 is fixedly connected to the handle, so as to achieve the effect of fixing the electronic components placed on the L-shaped plate 7 and the L-shaped frame 8, and avoid the shaking of the electronic components during detection. The present invention improves the practicability of the device. A sliding rod 17 is slidably inserted in the connecting plate 14. One end of the sliding rod 17 is fixedly connected to the abutment plate 16, so as to achieve the effect of vertical movement of the abutment plate 16, thereby avoiding the situation that when the turning handle drives the threaded rod 15 to rotate in the connecting plate 14, the threaded rod 15 drives the abutment plate 16 to rotate, and the abutment plate 16 and the electronic components rub against each other, thereby improving the practicability of the device. The upper surfaces of the L-shaped plate 7 and the L-shaped frame 8 are fixedly connected with rubber pads 18. The rubber pads 18 have a heat-conducting effect, thereby achieving the effect of protecting the electronic components, thereby avoiding the situation that the electronic components are overheated during detection, thereby improving the practicability of the device. A handle 19 is fixedly connected to one side of the support plate 4.The size of the limiting rod 13 is matched with the size of the limiting groove of the sliding rod 10. By pulling the handle 19, the operator can adjust the distance between the support plate 4 and the support plate 2 by pulling the handle 19, thereby improving the practicality of the device.
[0027] Working principle: when the staff needs to inspect the electronic components, the staff first observes the size of the electronic components, adjusts the position of the support plate 4 according to the size of the electronic components, places the electronic components on the L-shaped frame 8, and turns the handle to drive the threaded rod 15 to rotate in the connecting plate 14, and the threaded rod 15 drives the abutment plate 16 to move, and the abutment plate 16 drives the sliding rod 17 to slide in the connecting plate 14 until the abutment plate 16 abuts against the surface of the electronic components, and then pulls the pull plate 11 to drive the sliding rod 10 to slide in the fixed plate 9, and the first spring 12 is in a stretched state. When the sliding rod 10 slides out of the circular groove of the operating table 1, the limiting rod 13 is pushed to slide in the fixed plate 9 until the limiting rod 13 slides into the limiting groove of the sliding rod 10, thereby achieving the effect of limiting the sliding rod 10, and pushing the handle 19 drives the support plate 4, and the support plate 4 drives the two sliding blocks 3 to slide in the slide rail of the operating table 1. Until the electronic component contacts the L-shaped plate 7, the electronic component drives the L-shaped plate 7 to slide on the long plate 5, and the L-shaped plate 7 drives the two compression springs 6 to be compressed. At this time, the limit rod 13 is pulled to slide in the fixed plate 9 until the limit rod 13 slides out of the limit groove of the sliding rod 10. The limit rod 13 releases the limit on the sliding rod 10. Under the action of the first spring 12, the sliding rod 10 is automatically bounced into the circular groove of the operating table 1. Finally, the threaded rod 15 in the connecting plate 14 is rotated to fix the other side of the electronic component. At this time, the electronic component is clamped and fixed. The effect of clamping electronic components of different sizes is achieved, which avoids the situation that the size requirements of the original electronic component test bench for electronic components are relatively fixed, and different test benches need to be replaced to clamp and test electronic components of other sizes, thereby improving the practicability of the device.
[0028] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installation", "connection" and "connection" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be an indirect connection through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood by specific circumstances.
Claims
1. A special test fixture for electronic components, comprising an operating table (1), characterized in that: The upper surface of the operating table (1) is fixedly connected to a support plate (2), the upper surface of the operating table (1) is provided with two slide rails, the inner surface of the slide rail of the operating table (1) is slidably connected to a sliding block (3), the upper surface of the sliding block (3) is fixedly connected to a support plate (4), the side of the supporting plate (2) close to the support plate (4) is fixedly connected to a long plate (5), one side of the supporting plate (2) is fixedly connected to two compression springs (6), and the two compression springs (6) are away from the supporting plate ( 2), an L-shaped plate (7) is fixedly connected to one side of the support plate (4), an L-shaped frame (8) is fixedly connected to one side of the support plate (4) close to the support plate (2), a plurality of circular grooves are provided on the surface of the operating table (1), a fixed plate (9) is fixedly connected to one side of the support plate (4), a sliding rod (10) is slidably inserted in the fixing plate (9), one end of the sliding rod (10) is fixedly connected to a pulling plate (11), and the arc surface of the sliding rod (10) is slidably connected to the inner surface of the circular groove of the operating table (1).
2. The electronic component test fixture according to claim 1, characterized in that: The arc surface of the sliding rod (10) is sleeved with a first spring (12), and the two ends of the first spring (12) are respectively fixedly connected to the pulling plate (11) and the fixing plate (9).
3. The electronic component test fixture according to claim 1, characterized in that: The arc surface of the sliding rod (10) is provided with a limiting groove, a limiting rod (13) is slidably inserted in the fixing plate (9), and the arc surface of the limiting rod (13) is slidably connected to the inner surface of the limiting groove of the sliding rod (10).
4. The electronic component test fixture according to claim 1, characterized in that: The L-shaped frame (8) and the L-shaped plate (7) are both fixedly connected to a connecting plate (14) on one side close to each other, and a threaded rod (15) is threadedly inserted in each of the two connecting plates (14). One end of the threaded rod (15) is rotatably connected to an abutment plate (16), and one end of the threaded rod (15) away from the abutment plate (16) is fixedly connected to a turning handle.
5. The electronic component test fixture according to claim 4, characterized in that: A sliding rod (17) is slidably inserted in the connecting plate (14), and one end of the sliding rod (17) is fixedly connected to the abutting plate (16).
6. The electronic component test fixture according to claim 1, characterized in that: The upper surfaces of the L-shaped plate (7) and the L-shaped frame (8) are both fixedly connected with a rubber pad (18), and the rubber pad (18) has a heat-conducting effect.
7. The electronic component test fixture according to claim 3, characterized in that: A handle (19) is fixedly connected to one side of the support plate (4), and the size of the limiting rod (13) is compatible with the size of the limiting groove of the sliding rod (10).