Integrated circuit test carrier plate

Abstract

The utility model discloses an integrated circuit test carrier plate comprising a main body assembly which comprises a test carrier plate and an alumina plate; the aluminum oxide plate is embedded in the middle of the test carrier plate; the damage prevention assembly comprises an embedded groove, a supporting frame, a connecting plate, a fixing plate, a connecting frame, a connecting shaft and a torsional spring; the fixing plate is connected to the side edge of the test carrier plate through screws, the connecting shaft is connected to the middle of the fixing plate through screws, the connecting frame is connected to the connecting shaft in a sleeving mode, the connecting plate is connected to the upper end of the connecting frame in an injection molding mode, and the supporting frame is connected to one end of the connecting plate in a glued mode. The utility model relates to an integrated circuit board testing device, and aims to solve the problems that after an integrated circuit board is placed on an aluminum oxide board and a test is finished, because the integrated circuit board is thin, when a detector takes the integrated circuit board carelessly, the integrated circuit board may be physically damaged, such as bending, breaking or scratching, and if the integrated circuit board is carefully taken, the overall working efficiency is affected, and a production line is delayed.

Description

Technical Field

[0001] The utility model relates to the technical field of integrated circuits, in particular to an integrated circuit test carrier board. Background Art

[0002] An integrated circuit is a miniature electronic device or component that uses a specific process to integrate the transistors, resistors, capacitors and other components required for the circuit on a small semiconductor chip and encapsulates it in a tube shell to become a miniature structure with the required circuit function. In order to ensure the quality and reliability of the chip, the completed integrated circuit needs to be tested.

[0003] Now we search for a Chinese patent for an integrated circuit test carrier, publication number CN 216670187 U, which includes a test carrier, an aluminum oxide plate and a slide rail, and also includes heat dissipation fins, a pull-out plate and a pressure plate. The top of the test carrier is embedded with an aluminum oxide plate, and the two sides of the top of the test carrier are respectively installed with slide rails by bolts. A slider is slidably connected to the slide rail, and a slot is opened through the top of the slider, and a pull-out plate is inserted in the slot. A pressure plate is provided at the bottom of one end of the pull-out plate, and a heat dissipation fin is welded and connected to the bottom of the test carrier. The integrated integrated circuit test carrier is flexible and convenient to use, which can help personnel to fix and limit integrated circuit boards of various specifications to be tested, and is equipped with a good heat dissipation component, so that personnel can better test and process the integrated circuit board, and better understand the performance of the integrated circuit board and the component modules thereon, and has high practicality.

[0004] However, it still has the following disadvantages in actual use:

[0005] The integrated circuit board is placed on an alumina board. After the test, since the integrated circuit board is thin, if the inspector is not careful when picking it up, it may cause physical damage to the board, such as bending, breaking or scratching. If it is picked up carefully, it will affect the overall work efficiency and cause delays in the production line.

[0006] Therefore, a new integrated circuit test carrier is proposed to solve the above problems. Utility Model Content

[0007] The purpose of the utility model is to provide an integrated circuit test carrier to solve the problem raised in the above-mentioned background technology that the integrated circuit board is placed on an alumina board. After the test is completed, since the integrated circuit board is thin, if the inspector is not careful when picking it up, it may cause physical damage to the board, such as bending, breaking or scratching. If it is picked up with caution, it will affect the overall work efficiency and cause delays in the production line.

[0008] In order to solve the above technical problems, the utility model is realized by the following technical solutions:

[0009] The utility model is an integrated circuit test carrier, comprising:

[0010] A main body assembly, the main body assembly comprising a test carrier plate and an aluminum oxide plate;

[0011] The test carrier is fixed to the upper surface of the workbench of the testing equipment by screws, and the alumina plate is embedded in the middle of the test carrier;

[0012] An anti-damage component, the anti-damage component comprising an embedded groove, a support frame, a connecting plate, a fixing plate, a connecting frame, a connecting shaft and a torsion spring;

[0013] The embedded groove is opened in the middle of the aluminum oxide plate, the fixed plate is connected to the side of the test carrier plate by screws, the connecting shaft is connected to the middle of the fixed plate by screws, the connecting frame is sleeved on the connecting shaft, the connecting plate is injection-molded and connected to the upper end of the connecting frame, and the support frame is glued to one end of the connecting plate.

[0014] Furthermore, the support frame is made of alumina material, and the support frame is movably connected in the embedded groove.

[0015] Furthermore, the main body assembly also includes a slide rail, a slider and a pull-out plate;

[0016] The slide rails are connected to both sides of the upper surface of the test carrier plate by screws, the slider is slidably connected to the slide rails, and the upper section of the slider is provided with holes, and the pull-out plate is movably connected to the holes in the upper section of the slider.

[0017] Furthermore, the main body assembly also includes a pressing plate, an adjusting rod, a rotating rod and a limiting rod;

[0018] The adjusting rod is rotatably connected to one end of the pull-out plate located inside the test carrier plate, the limiting rod is movably connected to one end of the pull-out plate located inside the test carrier plate, and the limiting rod is located on both sides of the adjusting rod, the rotating rod is inserted in the upper section of the adjusting rod, and the pressing plate is welded to the lower ends of the adjusting rod and the limiting rod.

[0019] Furthermore, the main body assembly also includes heat dissipation fins;

[0020] The heat dissipation fins are connected to the lower surface of the test carrier plate by screws, and the upper ends of the heat dissipation fins are in contact with the lower surface of the aluminum oxide plate.

[0021] Furthermore, it also includes a limit assembly;

[0022] The limiting assembly also includes a through hole and a T-shaped limiting plate;

[0023] The through holes are arranged at two ends of the support frame, and the T-shaped limiting plates are movably connected in the through holes.

[0024] Furthermore, the limiting assembly also includes a movable column, a spring and a limiting plate;

[0025] The movable column is movably connected in the T-shaped limit plate, the limit plate is injection-molded and connected to the top of the movable column, one end of the spring is connected to the T-shaped limit plate by screws, and the other end is connected to the lower surface of the limit plate by screws, and the spring is sleeved on the movable column.

[0026] Compared with the prior art, the advantages of the present invention are:

[0027] 1. The utility model has an anti-damage component. After the test is finished, the connecting plate is gently pressed to drive the connecting frame to rotate around the connecting axis in the middle of the fixed plate, so that the support frame is tilted, and the integrated circuit board above the alumina plate is lifted, so that the integrated circuit board can be quickly removed. After removal, the connecting plate is loosened, and the support frame moves back to the embedded groove under the action of the torsion spring. This setting can avoid damage to the circuit board when taking the integrated circuit board, and can also speed up the production speed.

[0028] 2. The utility model, through the setting of the limit assembly, pulls the limit plate according to the width of the integrated circuit board, so that the limit plate is away from the support frame, and then moves the limit plate to drive the movable column and the T-shaped limit plate to move to the appropriate position, so that the middle position of the limit plates at both ends is just right to place the integrated circuit board. When the integrated circuit board is taken out after the test is completed, the support frame is tilted, and the limit plate can prevent the integrated circuit board from sliding and falling.

[0029] Of course, any product implementing the present invention does not necessarily need to achieve all of the advantages described above at the same time. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] In order to more clearly illustrate the technical solutions of the embodiments of the utility model, the drawings required for describing the embodiments are briefly introduced below. Obviously, the drawings described below are only some embodiments of the utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0031] Figure 1 It is a schematic diagram of the overall structure of the utility model;

[0032] Figure 2 This is a schematic diagram of the tilting of the support frame of the utility model;

[0033] Figure 3 For the utility model Figure 2 Enlarged view of point A in the middle;

[0034] Figure 4 It is a partial structural schematic diagram of the limiting component of the utility model.

[0035] In the accompanying drawings, the components represented by the reference numerals are listed as follows:

[0036] 10. Test carrier; 11. Slide rail; 12. Slider; 13. Pull-out plate; 14. Aluminum plate; 15. Press plate; 16. Adjustment rod; 17. Rotating rod; 18. Limit rod; 19. Heat dissipation fin; 20. Embedded groove; 21. Support frame; 22. Connecting plate; 23. Fixed plate; 24. Connecting frame; 25. Connecting shaft; 26. Torsion spring; 30. Through hole; 31. T-type limit plate; 32. Movable column; 33. Spring; 34. Limit plate. DETAILED DESCRIPTION

[0037] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, the specific implementation methods of the present invention are described in detail below with reference to the accompanying drawings.

[0038] In the following description, many specific details are set forth to facilitate a full understanding of the present invention, but the present invention may also be implemented in other ways different from those described herein, and those skilled in the art may make similar generalizations without violating the connotation of the present invention. Therefore, the present invention is not limited to the specific implementation methods disclosed below.

[0039] In order to make the purpose, technical solution and advantages of the present invention more clear, the implementation mode of the present invention will be further described in detail below with reference to the accompanying drawings.

[0040] See also Figure 1-3 As shown, this embodiment is an integrated circuit test carrier, comprising:

[0041] A main body component, the main body component includes a test carrier plate 10 and an aluminum oxide plate 14;

[0042] The test carrier plate 10 is fixed on the upper surface of the workbench of the testing equipment by screws, and the alumina plate 14 is embedded in the middle of the test carrier plate 10;

[0043] The support function of the test carrier 10 is tested, and the alumina plate 14 can absorb heat;

[0044] The anti-damage component includes an embedded groove 20, a support frame 21, a connecting plate 22, a fixing plate 23, a connecting frame 24, a connecting shaft 25 and a torsion spring 26;

[0045] The embedded groove 20 is opened in the middle of the anodized aluminum plate 14, the fixing plate 23 is connected to the side of the test carrier 10 by screws, the connecting shaft 25 is connected to the middle of the fixing plate 23 by screws, the connecting frame 24 is sleeved on the connecting shaft 25, the connecting plate 22 is injection-molded and connected to the upper end of the connecting frame 24, and the supporting frame 21 is glued to one end of the connecting plate 22;

[0046] The embedded groove 20 has a storage function, the support frame 21 has a supporting function, the connecting plate 22 is convenient for hand operation, the fixing plate 23 and the connecting frame 24 have a connecting function, and the connecting shaft 25 is convenient for the connecting frame 24 to rotate, and the torsion spring 26 has a reset function;

[0047] The support frame 21 is made of anodized aluminum, and the support frame 21 is movably connected in the embedded groove 20;

[0048] The main body assembly also includes a slide rail 11, a slider 12 and a pull-out plate 13;

[0049] The slide rail 11 is connected to both sides of the upper surface of the test carrier 10 by screws, the slider 12 is slidably connected to the slide rail 11, and a hole is opened in the upper section of the slider 12, and the pull-out plate 13 is movably connected in the hole of the upper section of the slider 12;

[0050] The slide rail 11 serves as a connection and limiter, the slider 12 and the pull-out plate 13 serve as a support, and the pull-out plate 13 can be adjusted according to the size of the integrated circuit board;

[0051] The main assembly also includes a pressing plate 15, an adjusting rod 16, a rotating rod 17 and a limiting rod 18;

[0052] The adjusting rod 16 is rotatably connected to one end of the pull-out plate 13 located inside the test carrier 10, the limiting rod 18 is movably connected to one end of the pull-out plate 13 located inside the test carrier 10, and the limiting rod 18 is located on both sides of the adjusting rod 16, the rotating rod 17 is plugged into the upper section of the adjusting rod 16, and the pressing plate 15 is welded to the lower ends of the adjusting rod 16 and the limiting rod 18;

[0053] The adjusting rod 16 plays an adjusting role, and the rotating rod 17 facilitates the operation of the adjusting rod 16. The rotating rod 17 drives the adjusting rod 16 to rotate, so that the adjusting rod 16 can move up and down, and the pressing plate 15 can move up and down. The pressing plate 15 can clamp the integrated circuit board, and the limiting rod 18 plays a limiting role, which can prevent the adjusting rod 16 and the pressing plate 15 from deviating during the upward and downward movement;

[0054] The main assembly also includes heat dissipation fins 19;

[0055] The heat dissipation fins 19 are connected to the lower surface of the test carrier 10 by screws, and the upper ends of the heat dissipation fins 19 are in contact with the lower surface of the aluminum oxide plate 14;

[0056] The heat dissipation fins 19 can absorb the heat from the alumina plate 14 and dissipate it.

[0057] Working principle:

[0058] Place the integrated circuit board on the alumina plate 14 and the support frame 21, rotate the rotating rod 17, drive the adjusting rod 16 to move downward, so that the pressing plate 15 presses the integrated circuit board, and then test it;

[0059] After the test is finished, the rotating rod 17 is rotated in the opposite direction, so that the adjusting rod 16 drives the pressing plate 15 to move upward, and the pressing plate 15 is away from the integrated circuit board;

[0060] Press the connecting plate 22 downward to drive the connecting frame 24 to rotate around the connecting shaft 25 in the middle of the fixing plate 23, and drive the supporting frame 21 to tilt upward. At this time, the integrated circuit board is lifted up, and the staff can remove the integrated circuit board from the side;

[0061] Finally, the connecting plate 22 is released, and under the action of the torsion spring 26 , the connecting plate 22 returns to its original position and drives the supporting frame 21 to move back into the embedded groove 20 .

[0062] This step facilitates quick removal of the integrated circuit board.

[0063] See also Figure 2 , Figure 4 As shown, this embodiment is based on the above embodiment 1 and also includes:

[0064] The limiting assembly further includes a through hole 30 and a T-shaped limiting plate 31;

[0065] Through holes 30 are provided at both ends of the support frame 21, and T-shaped limit plates 31 are movably connected in the through holes 30;

[0066] The through hole 30 provides a moving route and plays a limiting role, and the T-shaped limiting plate 31 plays a limiting role;

[0067] The limiting assembly also includes a movable column 32, a spring 33 and a limiting plate 34;

[0068] The movable column 32 is movably connected in the T-shaped limit plate 31, the limit plate 34 is injection-molded and connected to the top of the movable column 32, one end of the spring 33 is connected to the T-shaped limit plate 31 by screws, and the other end is connected to the lower surface of the limit plate 34 by screws, and the spring 33 is sleeved on the movable column 32;

[0069] The movable column 32 plays a connecting role, and the spring 33 has a tightening function, which can clamp the limiting plate 34 on the support frame 21, and the limiting plate 34 plays a limiting role.

[0070] Working principle:

[0071] Before testing, adjust the position of the limit plate 34 according to the size of the integrated circuit board;

[0072] Pull the limiting plate 34 to separate the limiting plate 34 from the supporting frame 21, and then move the limiting plate 34 to a suitable position;

[0073] Loosen the limit plate 34. Under the action of the spring 33, the movable column 32 moves into the T-shaped limit plate 31, and the limit plate 34 is tightly attached to the support frame 21.

[0074] At this time, the integrated circuit board can be placed on the support frame 21 and located between the two limit plates 34, and the pressing plate 15 is pressed to test the integrated circuit board;

[0075] After the test is finished, the pressing plate 15 is opened, the connecting plate 22 is pressed, the supporting frame 21 is tilted up, and the integrated circuit board is lifted up to remove the integrated circuit board.

[0076] In this step, the integrated circuit board can be confined in the middle of the limiting plate 34 to prevent it from sliding and being damaged.

[0077] In the description of the present invention, it is also necessary to explain that, unless otherwise clearly specified and limited, the terms "set", "install", "connect", and "connect" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0078] Finally, it should be noted that the above description is only a preferred embodiment of the utility model and is not intended to limit the utility model. Although the utility model is described in detail with reference to the above embodiments, those skilled in the art can still modify the technical solutions recorded in the above embodiments or replace some of the technical features therein by equivalents. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the utility model shall be included in the protection scope of the utility model.

Claims

1. An integrated circuit test carrier, characterized in that: include: A main body component, the main body component comprising a test carrier plate (10) and an aluminum oxide plate (14); The test carrier plate (10) is fixed to the upper surface of the workbench of the detection equipment by screws, and the alumina plate (14) is embedded in the middle of the test carrier plate (10); An anti-damage component, the anti-damage component comprising an embedded groove (20), a support frame (21), a connecting plate (22), a fixing plate (23), a connecting frame (24), a connecting shaft (25) and a torsion spring (26); The embedded groove (20) is provided in the middle of the anodized aluminum plate (14); the fixing plate (23) is connected to the side of the test carrier plate (10) by screws; the connecting shaft (25) is connected to the middle of the fixing plate (23) by screws; the connecting frame (24) is sleeved on the connecting shaft (25); the connecting plate (22) is injection-moldedly connected to the upper end of the connecting frame (24); and the supporting frame (21) is glued to one end of the connecting plate (22).

2. An integrated circuit test carrier according to claim 1, characterized in that: The support frame (21) is made of aluminum oxide, and the support frame (21) is movably connected in the embedded groove (20).

3. The integrated circuit test carrier according to claim 1, characterized in that: The main body assembly also includes a slide rail (11), a slide block (12) and a pull-out plate (13); The slide rail (11) is connected to both sides of the upper surface of the test carrier (10) by screws, the slider (12) is slidably connected to the slide rail (11), and a hole is opened in the upper section of the slider (12), and the pull-out plate (13) is movably connected in the hole in the upper section of the slider (12).

4. The integrated circuit test carrier according to claim 3, characterized in that: The main body assembly also includes a pressing plate (15), an adjusting rod (16), a rotating rod (17) and a limiting rod (18); The adjusting rod (16) is rotatably connected to one end of the pull-out plate (13) located inside the test carrier (10), the limiting rod (18) is movably connected to one end of the pull-out plate (13) located inside the test carrier (10), and the limiting rod (18) is located on both sides of the adjusting rod (16), the rotating rod (17) is plugged into the upper section of the adjusting rod (16), and the pressing plate (15) is welded to the lower ends of the adjusting rod (16) and the limiting rod (18).

5. The integrated circuit test carrier according to claim 1, characterized in that: The main body assembly also includes heat dissipation fins (19); The heat dissipation fins (19) are connected to the lower surface of the test carrier plate (10) by means of screws, and the upper ends of the heat dissipation fins (19) are in contact with the lower surface of the aluminum oxide plate (14).

6. The integrated circuit test carrier according to claim 1, characterized in that: Also includes a limiter assembly; The limiting assembly further comprises a through hole (30) and a T-shaped limiting plate (31); The through holes (30) are provided at both ends of the support frame (21), and the T-shaped limiting plate (31) is movably connected in the through holes (30).

7. The integrated circuit test carrier according to claim 6, characterized in that: The limiting assembly also includes a movable column (32), a spring (33) and a limiting plate (34); The movable column (32) is movably connected in the T-shaped limit plate (31), the limit plate (34) is injection-molded and connected to the top of the movable column (32), one end of the spring (33) is connected to the T-shaped limit plate (31) by screws, and the other end is connected to the lower surface of the limit plate (34) by screws, and the spring (33) is sleeved on the movable column (32).

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