Fixing device for electronic component performance test

Abstract

The utility model relates to the technical field of fixing devices for testing, and discloses a fixing device for performance testing of electronic components, which comprises a test board, an operation board arranged at the top of the test board, a plurality of electronic component placing grooves arranged at the top of the operation board, and two insertion grooves arranged on the inner wall of each electronic component placing groove. Metal rods are arranged on the upper sides of the insertion grooves, and after the push rod ends of the electric push rods extend out, the second transverse plate drives the multiple connecting frames to move downwards, so that the metal rods are inserted into the inner sides of the insertion grooves, the metal rods make contact with pins of the electronic components, and therefore performance detection is conducted on the electronic components; when the metal rod is in contact with the pins of the electronic element, certain buffering is achieved, pin damage possibly caused by hard contact is avoided, an operator only needs to press the switch, automatic contact between the metal rod and the pins of the electronic element can be achieved, manual operation is not needed, and therefore work efficiency is greatly improved.

Description

Technical Field

[0001] The utility model relates to the technical field of test fixtures, in particular to a fixture used for electronic component performance testing. Background Art

[0002] Electronic components are basic elements in electronic circuits, usually in individual packages with two or more leads or metal contacts. Electronic components must be connected to each other to form an electronic circuit with a specific function, such as an amplifier, a radio receiver, an oscillator, etc. One of the common ways to connect electronic components is to solder them to a printed circuit board. Electronic components may be individual packages or groups of varying complexity.

[0003] Performance testing is an essential part of the production and development of electronic components. In the traditional performance testing process of electronic components, the fixation of electronic components is often achieved by manual operation or simple mechanical structure. Such a fixation method is not only inefficient, but also often cannot provide sufficient stability and safety, which can easily cause damage to electronic components during the test, thereby affecting the accuracy of the test results. Therefore, a fixing device for electronic component performance testing is proposed. Utility Model Content

[0004] The purpose of the utility model is to provide a fixing device for electronic component performance testing to solve the problems raised in the above background technology.

[0005] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a fixing device for electronic component performance testing, comprising a test bench, an operating table is arranged on the top of the test bench, a plurality of electronic component placement slots are opened on the top of the operating table, two insertion slots are arranged on the inner wall of the electronic component placement slot, a metal rod is arranged on the upper side of the insertion slot, and a clamping assembly is arranged on one side of the metal rod;

[0006] The clamping assembly includes a fixed plate, an electric push rod is fixed on the top of the fixed plate, a first cross plate is fixed to the push rod end of the electric push rod, a plurality of sliding columns are movably penetrated on one side of the bottom of the first cross plate, and a first limit block is fixed on the top of the sliding column.

[0007] Preferably, the above-mentioned: a second transverse plate is fixed to the bottom of the slide column, and a rubber block located on the upper side of the electronic component placement groove is bonded to the bottom of the second transverse plate.

[0008] Preferably, as mentioned above: a first limit block is fixed on the top of the sliding column, and the first limit block is located on the top of the first cross plate.

[0009] Preferably, as mentioned above: support frames are fixed to both sides of the top of the test bench respectively, two ends of the fixing plate are fixed to both sides of the top of the support frames respectively, and the fixing plate is in the shape of a cuboid.

[0010] Preferably, as mentioned above: a plurality of connecting frames are fixed on both sides of the second transverse plate, and the outer side of the metal rod movably passes through one side of the connecting frame.

[0011] Preferably, the outer side of the sliding column is sleeved with a spring, and two ends of the spring are respectively connected to one side of the first transverse plate and the second transverse plate.

[0012] Preferably, as mentioned above: a second limit block is fixed to one end of the top of the metal rod, a tension spring is sleeved on the outer side of the metal rod, and two ends of the tension spring are respectively connected to the second limit block and one side of the connecting frame.

[0013] Compared with the prior art, the utility model adopts the above technical solution and has the following technical effects:

[0014] 1. By placing multiple electronic components on the inner sides of multiple electronic component placement grooves respectively, and then pressing the switch to control the push rod end of the electric push rod to extend, the first cross plate pushes the second cross plate and the rubber block downward under the elastic force of the spring, and the rubber block clamps the electronic components on the inner sides of the electronic component placement grooves. Through the elastic force of the spring, damage to the electronic components after clamping and fixing is avoided. Pressing the switch to control the push rod end of the electric push rod to extend realizes rapid clamping and fixing of the electronic components. During the clamping and fixing process, the elastic force of the spring can ensure that the electronic components will not be over-pressed, thereby avoiding possible damage. The use of rubber blocks also reduces potential damage to electronic components caused by friction or hard contact, effectively avoiding possible damage to electronic components during the clamping and fixing process. The stable fixing state also ensures the accuracy of the test results, thereby improving the reliability of the electronic components.

[0015] 2. After the push rod end of the electric push rod is extended, the second horizontal plate drives multiple connecting frames to move downward, so that the metal rod is inserted into the inner side of the insertion groove, so that the metal rod contacts the pins of the electronic component, thereby performing performance testing on the electronic component. Under the action of the tension spring, the metal rod has a certain buffer when contacting the pins of the electronic component, avoiding the damage to the pins caused by hard contact. The operator only needs to press the switch to realize the automatic contact between the metal rod and the pins of the electronic component without manual operation, thereby greatly improving work efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0017] Figure 1 This is a schematic diagram of the structure of the utility model from a first perspective;

[0018] Figure 2 This is a schematic diagram of the structure of the utility model from a second viewing angle;

[0019] Figure 3 This is a schematic diagram of the main structure of the utility model;

[0020] Figure 4 It is a schematic diagram of the top view structure of the utility model;

[0021] Figure 5 This is a schematic diagram of the distribution structure of the connecting frame of the utility model.

[0022] Explanation of the reference numerals in the accompanying drawings: 1. test bench; 2. support frame; 3. clamping assembly; 31. electric push rod; 32. first limit block; 33. first horizontal plate; 34. second horizontal plate; 35. fixing plate; 36. rubber block; 37. sliding column; 38. spring; 4. connecting frame; 5. electronic component placement slot; 6. insertion slot; 7. tension spring; 8. metal rod; 9. second limit block; 10. operating table. DETAILED DESCRIPTION

[0023] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0024] It should be noted that the structures, proportions, sizes, etc. illustrated in the drawings of this specification are only used to match the contents disclosed in the specification for people familiar with this technology to understand and read, and are not used to limit the conditions under which this application can be implemented. Therefore, they have no substantive technical significance. Any structural modification, change in proportional relationship or adjustment of size should still fall within the scope of the technical content disclosed in this application without affecting the effects and purposes that can be achieved by this application.

[0025] Example

[0026] See also Figure 1-5The utility model provides a technical solution: a fixing device for electronic component performance testing, comprising a test bench 1, an operating table 10 is arranged on the top of the test bench 1, a plurality of electronic component placement slots 5 are opened on the top of the operating table 10, a plurality of electronic components are placed inside the plurality of electronic component placement slots 5, two insertion slots 6 are arranged on the inner wall of the electronic component placement slot 5, the pins of the electronic component are located inside the insertion slot 6, the electronic component can be a resistor, an inductor, etc., the resistance value of the resistor can be tested, a metal rod 8 is arranged on the upper side of the insertion slot 6, and a clamping assembly 3 is arranged on one side of the metal rod 8;

[0027] In order to facilitate the fixing of multiple electronic components, a clamping assembly 3 is provided. The clamping assembly 3 includes a fixing plate 35. An electric push rod 31 is fixed on the top of the fixing plate 35. A first horizontal plate 33 is fixed to the push rod end of the electric push rod 31. The push rod end of the electric push rod 31 is controlled to extend. At this time, the push rod end pushes the first horizontal plate 33 to move downward. At the same time, the first horizontal plate 33 pushes the second horizontal plate 34 and the rubber block 36 to move downward under the elastic force of the spring 38. A plurality of sliding columns 37 are movably penetrated on one side of the bottom of the first horizontal plate 33. A first limit block 32 is fixed to the top of the sliding column 37.

[0028] When the rubber block 36 contacts the electronic component, the slide column 37 moves through one side of the first cross plate 33, and the spring 38 is in a compressed state. At this time, the rubber block 36 clamps the electronic component to the inner side of the electronic component placement groove 5. The second cross plate 34 is fixed to the bottom of the slide column 37. The rubber block 36 located on the upper side of the electronic component placement groove 5 is bonded to the bottom of the second cross plate 34. The first limit block 32 is fixed to the top of the slide column 37. The first limit block 32 is located at the top of the first cross plate 33. The elastic force of the spring 38 avoids damage to the electronic component after clamping and fixing. Pressing the switch controls the push rod end of the electric push rod 31 to extend, thereby realizing rapid clamping and fixing of the electronic component. The support frame 2 is fixed to both sides of the top of the test bench 1. The two ends of the fixing plate 35 are fixed to both sides of the top of the support frame 2. The fixing plate 35 is in the shape of a rectangular parallelepiped. The elastic force of the spring 38 can ensure that the electronic component will not be over-pressed, thereby avoiding possible damage. The use of the rubber block 36 also reduces the potential damage to the electronic component caused by friction or hard contact.

[0029] Several connecting frames 4 are fixed on both sides of the second cross plate 34. The outer side of the metal rod 8 is movable and runs through one side of the connecting frame 4. The second cross plate 34 drives the multiple connecting frames 4 to move downward, and the second cross plate 34 drives the multiple metal rods 8 to move downward, so that the metal rod 8 is inserted into the inner side of the insertion groove 6. The outer side of the sliding column 37 is sleeved with a spring 38, and the two ends of the spring 38 are respectively connected to one side of the first cross plate 33 and the second cross plate 34. A second limiting block 9 is fixed to one end of the top of the metal rod 8. The metal rod 8 contacts the pins of the electronic component, so as to perform performance testing on the electronic component. At the same time, under the action of the tension spring 7, the metal rod 8 is prevented from hard contact with the pins of the electronic component, and the metal rod 8 is prevented from causing damage to the pins of the electronic component. The outer side of the metal rod 8 is sleeved with a tension spring 7, and the two ends of the tension spring 7 are respectively connected to the second limiting block 9 and one side of the connecting frame 4. Under the action of the tension spring 7, the metal rod 8 has a certain buffer when contacting the pins of the electronic component, thereby avoiding damage to the pins caused by hard contact.

[0030] Working principle: When it is necessary to test the performance of electronic components, first connect the metal rod 8 to the multimeter interface through a wire, then place multiple electronic components inside multiple electronic component placement slots 5 respectively, and then press the switch to control the push rod end of the electric push rod 31 to extend. At this time, the push rod end pushes the first cross plate 33 to move downward. At the same time, the first cross plate 33 pushes the second cross plate 34 and the rubber block 36 to move downward under the elastic force of the spring 38. When the rubber block 36 contacts the electronic component, the sliding column 37 moves through one side of the first cross plate 33, and the spring 38 is in a compressed state. At this time, the rubber block 36 clamps the electronic component to the electronic component. The inner side of the placement groove 5 is placed, and at the same time, the elastic force of the spring 38 is used to avoid damage to the electronic components after clamping and fixing. The push rod end of the electric push rod 31 is extended by pressing the switch to realize the rapid clamping and fixing of the electronic components. During the clamping and fixing process, the elastic force of the spring 38 can ensure that the electronic components will not be over-pressed, thereby avoiding possible damage. The use of the rubber block 36 also reduces the potential damage to the electronic components caused by friction or hard contact, and effectively avoids possible damage to the electronic components during the clamping and fixing process. The stable fixing state also ensures the accuracy of the test results, thereby improving the reliability of the electronic components.

[0031] When the push rod end of the electric push rod 31 is extended, the second cross plate 34 drives the multiple connecting frames 4 to move downward, and the second cross plate 34 drives the multiple metal rods 8 to move downward, so that the metal rods 8 are inserted into the inner side of the insertion slot 6, so that the metal rods 8 are in contact with the pins of the electronic components, thereby performing performance testing on the electronic components. At the same time, under the action of the tension spring 7, the metal rods 8 are prevented from making hard contact with the pins of the electronic components, and the metal rods 8 are prevented from causing damage to the pins of the electronic components. Under the action of the tension spring 7, the metal rods 8 have a certain buffer when contacting the pins of the electronic components, thereby avoiding damage to the pins that may be caused by hard contact. The operator only needs to press the switch to realize the automatic contact between the metal rods 8 and the pins of the electronic components, without manual operation, thereby greatly improving work efficiency.

[0032] Those skilled in the art will appreciate that the features described in the various embodiments and / or claims of the present invention may be combined and / or combined in various ways, even if such combinations and / or combinations are not explicitly described in the present invention. In particular, the features described in the various embodiments and / or claims of the present invention may be combined and / or combined in various ways without departing from the spirit and teachings of the present invention. All of these combinations and / or combinations fall within the scope of the present invention.

Claims

1. A fixture for electronic component performance testing, comprising a test bench (1), characterized in that: An operating table (10) is arranged on the top of the test bench (1), a plurality of electronic component placement slots (5) are provided on the top of the operating table (10), two insertion slots (6) are provided on the inner wall of the electronic component placement slot (5), a metal rod (8) is provided on the upper side of the insertion slot (6), and a clamping assembly (3) is provided on one side of the metal rod (8); The clamping assembly (3) comprises a fixing plate (35), an electric push rod (31) is fixed on the top of the fixing plate (35), a first transverse plate (33) is fixed on the push rod end of the electric push rod (31), a plurality of sliding columns (37) are movably penetrated on one side of the bottom of the first transverse plate (33), and a first limit block (32) is fixed on the top of the sliding column (37).

2. A fixture for electronic component performance testing according to claim 1, characterized in that: A second transverse plate (34) is fixed to the bottom of the slide column (37), and a rubber block (36) located on the upper side of the electronic component placement groove (5) is bonded to the bottom of the second transverse plate (34).

3. A fixture for electronic component performance testing according to claim 2, characterized in that: A first limiting block (32) is fixed on the top of the sliding column (37), and the first limiting block (32) is located on the top of the first transverse plate (33).

4. A fixture for electronic component performance testing according to claim 3, characterized in that: Support frames (2) are fixed to both sides of the top of the test bench (1), and both ends of the fixing plate (35) are fixed to both sides of the top of the supporting frame (2), respectively. The fixing plate (35) is in the shape of a rectangular parallelepiped.

5. A fixture for electronic component performance testing according to claim 4, characterized in that: A plurality of connecting frames (4) are fixed on both sides of the second transverse plate (34), and the outer side of the metal rod (8) movably passes through one side of the connecting frame (4).

6. A fixture for electronic component performance testing according to claim 5, characterized in that: A spring (38) is sleeved on the outer side of the sliding column (37), and two ends of the spring (38) are respectively connected to one side of the first transverse plate (33) and the second transverse plate (34).

7. A fixture for electronic component performance testing according to claim 6, characterized in that: A second limit block (9) is fixed to one end of the top of the metal rod (8), a tension spring (7) is sleeved on the outer side of the metal rod (8), and two ends of the tension spring (7) are respectively connected to the second limit block (9) and one side of the connecting frame (4).

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