Device for testing current bearing capacity of single conductive microsphere

Abstract

The utility model relates to a device for testing the current bearing capacity of a single conductive microsphere, and belongs to the technical field of conductive microsphere detection. Comprising a probe station for clamping a conductive microsphere, an adjustable constant current device electrically connected with the probe station and used for loading current to the conductive microsphere, and a voltage testing device electrically connected with the probe station and used for testing the voltage drop between two electrodes of the conductive microsphere, the probe station comprises a lower loading platform fixed at the lower end, an upper loading platform capable of vertically moving up and down at the upper end of the lower loading platform, and upper and lower probe electrodes fixedly connected with the upper loading platform and the lower loading platform respectively, different currents are provided for the single conductive microsphere through the adjustable constant current device, and the voltage V of the single conductive microsphere is tested by using the voltage testing device; a sudden change point is found through the resistance of a single conductive microsphere, the current bearing capacity range of the conductive microsphere is determined, the conductive microsphere with good current bearing capacity is developed and screened at the initial stage of ACF development by using the equipment, and the development efficiency of ACF can be remarkably improved.

Description

Technical Field

[0001] The utility model belongs to the technical field of conductive microsphere detection, and relates to a device for testing the current carrying capacity of a single conductive microsphere, in particular to a device for testing the current carrying capacity of a single conductive microsphere in an ACF. Background Art

[0002] ACF is widely used in the display industry as a bonding and conducting material for interfaces such as panels and FPC (Film On Glass), panels and chips (Chip On Glass), and circuit boards and FPC (Film On Board). In the traditional display industry, the current carried by a single conduction electrode is very small, at the microampere level, not exceeding 1 mA. However, with the rise of the Mini LED industry, the operating voltage and current of the module have increased significantly, and the conduction current on a single conduction electrode has increased hundreds of times, reaching the level of 100-200 mA. This places high demands on the current carrying capacity of ACF.

[0003] At present, when developing ACF products with high current carrying capacity, the module lighting test is mainly used to evaluate whether the ACF product can meet the application requirements. However, there are many interference factors related to the module lighting test, which cannot provide clear guidance for ACF product development. There is an urgent need for a device that can quantify the current carrying capacity of a single conductive microsphere, so as to calculate the density of conductive microspheres required in the ACF. Utility Model Content

[0004] In view of this, in order to solve the problem that when developing ACF products with high current carrying capacity, there are many interference factors related to module lighting testing and it is impossible to provide clear guidance for ACF product development, the utility model provides a device for testing the current carrying capacity of a single conductive microsphere.

[0005] In order to achieve the above object, the utility model provides the following technical solutions:

[0006] A device for testing the current carrying capacity of a single conductive microsphere, comprising a probe station for clamping the conductive microsphere, an adjustable constant current device electrically connected to the probe station and for loading current on the conductive microsphere, and a voltage test device electrically connected to the probe station and for measuring the voltage drop between two electrodes of the conductive microsphere;

[0007] The probe station includes a downloading station fixed at the lower end, an upper loading station capable of vertically moving up and down at the upper end of the downloading station, and upper and lower probe electrodes respectively fixedly connected to the upper loading station and the downloading station.

[0008] Furthermore, the adjustable constant current device is connected to the upper and lower probe electrodes respectively through metal wires.

[0009] Furthermore, the voltage test device is connected to the upper and lower probe electrodes by welding through a metal wire, and the length of the metal wire is short. Beneficial effect: The length of the metal wire is short, so that the resistance of the metal wire is close to infinitely small.

[0010] Furthermore, the upper and lower probe electrodes are respectively fixed on the upper and lower platforms by means of bayonets and screws.

[0011] Furthermore, the diameters of the upper and lower probe electrodes are 0.5 μm-200 μm. Beneficial effect: It can adapt to conductive microspheres of different diameters.

[0012] Furthermore, the current loaded by the adjustable constant current device is I, the voltage of the voltage test device is V, and the resistance of the metal wires connected to the upper and lower probe electrodes by welding the voltage test device is R 3 and R 4 , the resistance of the conductive microsphere itself is R 球 , R 球＝ V / IR 3 -R 4 , where R 3 and R 4 is small enough to be ignored, then R 球 ≈V / I.

[0013] Furthermore, the resistances of the metal wires connecting the adjustable constant current device and the upper and lower probe electrodes are R 1 and R 2 .

[0014] A method for testing a device for testing the current carrying capacity of a single conductive microsphere comprises the following steps:

[0015] S1: Provide different currents I to a single conductive microsphere through an adjustable constant current device;

[0016] S2: Test the voltage V of a single conductive microsphere by a voltage test device;

[0017] S3: Load different currents I, test the changes in V, find the mutation point through resistance, and determine the current carrying capacity range of the conductive microspheres.

[0018] The beneficial effects of the utility model are:

[0019] 1. The device for testing the current carrying capacity of a single conductive microsphere disclosed in the utility model provides different currents to the single conductive microsphere through an adjustable constant current device, tests the voltage V of the single conductive microsphere using a voltage testing device, finds the mutation point through the resistance of the single conductive microsphere, and determines the current carrying capacity range of the conductive microsphere. By using the device, conductive microspheres with good current carrying capacity can be screened out in the early stage of ACF development, which can significantly improve the development efficiency of ACF.

[0020] 2. The device for testing the current carrying capacity of a single conductive microsphere disclosed in the utility model, the adjustable constant current device and the voltage testing device are connected to the probe station through metal wires. The probe station clamps a single conductive microsphere to measure and determine the current carrying capacity range of the conductive microsphere. The device has low manufacturing cost, simple operation and wide application range.

[0021] Other advantages, objectives and features of the present invention will be described in the following description to some extent, and will be apparent to those skilled in the art based on the following examination and research, or can be taught from the practice of the present invention to some extent. The objectives and other advantages of the present invention can be achieved and obtained through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to make the purpose, technical solution and advantages of the utility model clearer, the utility model will be described in detail below in conjunction with the accompanying drawings, in which:

[0023] Figure 1 It is a schematic diagram of the structure of a device for testing the current carrying capacity of a single conductive microsphere according to the utility model;

[0024] Figure 2 This is a circuit structure diagram of a device for testing the current carrying capacity of a single conductive microsphere according to the utility model;

[0025] Figure 3 (a) is a graph showing the change in test voltage of a conductive microsphere in a device for testing the current carrying capacity of a single conductive microsphere of the utility model;

[0026] Figure 3 (b) is a graph showing the change in resistance of a conductive microsphere in a device for testing the current carrying capacity of a single conductive microsphere according to the present invention.

[0027] Reference numerals: upper loading platform 1, unloading platform 2, upper probe electrode 3, lower probe electrode 4, conductive microsphere 5, R 球 51, voltage test device 6, voltage 61, adjustable constant current device 7, current 71, R 3 8. R 4 81. R 1 9. R 2 91. DETAILED DESCRIPTION

[0028] The following describes the implementation of the present invention through specific examples. Those skilled in the art can easily understand other advantages and effects of the present invention from the contents disclosed in this specification. The present invention can also be implemented or applied through other different specific implementations, and the details in this specification can also be modified or changed in various ways based on different viewpoints and applications without departing from the spirit of the present invention. It should be noted that the illustrations provided in the following embodiments only illustrate the basic concept of the present invention in a schematic manner. The following embodiments and the features in the embodiments can be combined with each other without conflict.

[0029] Among them, the drawings are only used for illustrative explanations, and they only represent schematic diagrams rather than actual pictures, and should not be understood as limitations on the present utility model. In order to better illustrate the embodiments of the present utility model, some parts of the drawings may be omitted, enlarged or reduced, and do not represent the size of the actual product. For those skilled in the art, it is understandable that some well-known structures and their descriptions in the drawings may be omitted.

[0030] The same or similar numbers in the drawings of the embodiments of the present invention correspond to the same or similar parts; in the description of the present invention, it should be understood that if the terms "upper", "lower", "left", "right", "front", "back" and the like indicate directions or positional relationships, they are based on the directions or positional relationships shown in the drawings, which are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operated in a specific direction. Therefore, the terms describing the positional relationship in the drawings are only used for illustrative purposes and cannot be understood as a limitation on the present invention. For ordinary technicians in this field, the specific meanings of the above terms can be understood according to specific circumstances.

[0031] like Figure 1 The device shown is for testing the current carrying capacity of a single conductive microsphere, comprising a probe station for clamping a conductive microsphere 5, an adjustable constant current device 7 electrically connected to the probe station and for loading a current 71 on the conductive microsphere 5, and a voltage testing device 6 electrically connected to the probe station and for measuring the voltage drop between two electrodes of the conductive microsphere 5.

[0032] The probe station is fixed to the downloading platform 2 at the lower end, the upper loading platform 1 located at the upper end of the downloading platform 2 and capable of moving up and down, and the upper probe electrode 3 and the lower probe electrode 4 fixedly connected to the upper loading platform 1 and the downloading platform 2, respectively. The diameters of the upper probe electrode 3 and the lower probe electrode 4 are 0.5 μm-200 μm, which can adapt to the conductive microspheres 5 of different diameters. The upper probe electrode 3 and the lower probe electrode 4 are respectively fixed to the upper loading platform 1 and the downloading platform 2 by means of bayonet and screws, the adjustable constant current device 7 is respectively connected to the upper probe electrode 3 and the lower probe electrode 4 by means of metal wire, the voltage test device 6 is connected to the upper probe electrode 3 and the lower probe electrode 4 by means of metal wire welding, and the length of the metal wire is short, so that the resistance of the metal wire is close to infinitely small.

[0033] Reference Figure 2 The current 71 loaded by the adjustable constant current device 7 is I, the voltage 61 of the voltage test device 6 is V, and the resistance of the metal wires connected by welding the voltage test device 6 with the upper probe electrode 3 and the lower probe electrode 4 are R 3 8 and R 4 81, the resistances of the metal wires connecting the adjustable constant current device 7 and the upper probe electrode 3 and the lower probe electrode 4 are R 1 9 and R 2 91, the resistance of the conductive microsphere itself is R 球 51, R 球 51 ＝ V / IR 3 8-R 4 81, of which R 3 8 and R 4 81 is small enough to be ignored, then R 球 51≈V / I.

[0034] A method for testing a device for testing the current carrying capacity of a single conductive microsphere comprises the following steps:

[0035] S1: providing different currents 71I to the single conductive microsphere 5 through the adjustable constant current device 7;

[0036] S2: Testing the voltage of a single conductive microsphere 61V by means of a voltage testing device 6;

[0037] S3: Load different currents 71I, test the change of V, find the mutation point through resistance, and determine the current 71 carrying capacity range of the conductive microsphere 5, refer to Figure 3 (a) shows the voltage 61 variation diagram and Figure 3 (b) Resistance variation diagram, the current 71 carrying capacity of the conductive microsphere 5 is 5-10 mA.

[0038] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of the utility model rather than to limit it. Although the utility model has been described in detail with reference to the preferred embodiments, ordinary technicians in the field should understand that the technical solution of the utility model can be modified or replaced by equivalents without departing from the purpose and scope of the technical solution, which should be included in the scope of the claims of the utility model.

Claims

1. A device for testing the current carrying capacity of a single conductive microsphere, characterized in that: It includes a probe station for clamping a conductive microsphere, an adjustable constant current device electrically connected to the probe station and for loading current on the conductive microsphere, and a voltage test device electrically connected to the probe station and for measuring the voltage drop between two electrodes of the conductive microsphere; The probe station comprises a downloading station fixed at the lower end, an upper loading station capable of vertically moving up and down at the upper end of the downloading station, and upper and lower probe electrodes respectively fixedly connected to the upper loading station and the downloading station.

2. The device for testing the current carrying capacity of a single conductive microsphere as claimed in claim 1, characterized in that: The adjustable constant current device is connected to the upper and lower probe electrodes respectively through metal wires.

3. The device for testing the current carrying capacity of a single conductive microsphere as claimed in claim 2, characterized in that: The voltage testing device is connected to the upper and lower probe electrodes by welding through a metal wire, and the length of the metal wire is short.

4. The device for testing the current carrying capacity of a single conductive microsphere as claimed in claim 1, characterized in that: The upper and lower probe electrodes are respectively fixed on the upper and lower platforms by means of bayonet holes and screws.

5. The device for testing the current carrying capacity of a single conductive microsphere as claimed in claim 4, characterized in that: The diameters of the upper and lower probe electrodes are 0.5 μm-200 μm.

6. The device for testing the current carrying capacity of a single conductive microsphere as claimed in claim 3, characterized in that: The current loaded by the adjustable constant current device is I, the voltage of the voltage test device test system is V, the resistances of the metal wires connected to the upper and lower probe electrodes by welding of the voltage test device are R3 and R4 respectively, and the resistance of the conductive microsphere itself is R 球 , R 球＝ V / I-R3-R4.

7. The device for testing the current carrying capacity of a single conductive microsphere as claimed in claim 2, characterized in that: The resistances of the metal wires connecting the adjustable constant current device and the upper and lower probe electrodes are R1 and R2 respectively.

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