Multi-station chip test fixture

Abstract

The utility model discloses a multi-station chip test fixture, which relates to the technical field of chip testing and comprises a base, a rotating motor is fixedly mounted on the upper surface of the base, a connecting plate is fixedly connected to the movable end of an electric push rod, an upper pressing plate is fixedly connected to one side of the connecting plate, a lower pressing plate is fixedly connected to one side of a fixing frame, and a clamping plate is fixedly connected to the other side of the fixing frame. A first sliding block is slidably connected into the first sliding groove, the first lead screw is driven by the first motor to rotate, so that the first sliding block drives the movable frame to move along the first sliding groove, then the y-direction position of the probe is adjusted, the second lead screw is driven by the second motor to rotate, and thus the second sliding block moves along the second sliding groove. The x-direction position of the probe is adjusted, the probe is adjusted to adapt to chips of different sizes, the adjusting block is rotated to drive the pressing block to move, the z-direction position of the pressing block is adjusted, therefore, the distance between the pressing block and the limiting switch is changed, power-on testing is conducted on the chips of different thicknesses, and use is convenient.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, in particular to a multi-station chip testing fixture. Background Art

[0002] With the advancement of integration technology, chip integration continues to increase, the requirements for integrated circuit packaging are more stringent, the number of I / O pins increases dramatically, and power consumption also increases accordingly. Before the chip is used, it is necessary to test various indicators of the chip. Therefore, a fixture is needed to clamp and fix the chip during testing.

[0003] After searching the existing public patent number: CN202222915086.3, the public patent name is: a chip test fixture, including a bottom plate, a fixed block, a top plate, a telescopic device, a sliding plate, a detection circuit board, a plurality of irradiation lamps, a ring plate and a support plate for supporting the chip; two support columns are provided at the upper end of the bottom plate; the top plate is mounted on the two support columns; the sliding plate is slidably connected to the two support columns; the two ends of the telescopic device are respectively connected to the top plate and the sliding plate; the detection circuit board is mounted on the bottom surface of the sliding plate, and the bottom surface of the detection circuit board is provided with a plurality of probes; the fixed block is mounted on the upper end surface of the top plate, and the fixed block is provided with a mounting groove; the support plate is mounted in the mounting groove; pins are provided on the chip; a limit assembly is provided in the mounting groove; the ring plate is mounted on the bottom surface of the sliding plate; a plurality of irradiation lamps are mounted on the bottom surface of the ring plate, and a plurality of irradiation lamps form plug-in position light spots on the support plate. The utility model has a simple structure, is convenient for precise positioning of the chip and is convenient for material withdrawal.

[0004] However, the above-mentioned fixture does not have an adjustment function, and is therefore not suitable for chips of different thicknesses and sizes, and the detection efficiency is low, leaving room for improvement. Utility Model Content

[0005] 1. Technical issues to be resolved

[0006] In view of the deficiencies of the prior art, the utility model provides a multi-station chip testing fixture, which solves the problem that the fixture is not suitable for chips of different thicknesses and sizes.

[0007] (II) Technical solution

[0008] To achieve the above objectives, the utility model is implemented through the following technical solutions: a multi-station chip test fixture, comprising: a base, a rotating motor is fixedly installed on the upper surface of the base, a rotating disk is fixedly connected to the output shaft end of the rotating motor, a fixing frame is arranged in a circular array on the upper surface of the rotating disk, a mounting plate is fixedly connected to one side of the fixing frame, an electric push rod is fixedly connected to the top of the mounting plate, a connecting plate is fixedly connected to the movable end of the electric push rod, an upper pressing plate is fixedly connected to one side of the connecting plate, a lower pressing plate is fixedly connected to one side of the fixing frame, a limiting slot is provided on the lower pressing plate, and a probe adjustment component is arranged on the upper pressing plate;

[0009] The probe adjustment assembly includes a first slide groove opened on the lower surface of the upper pressure plate, a first slider is slidably connected in the first slide groove, a moving frame is fixedly connected to the bottom of the first slider, a second slider is slidably connected to the lower surface of the moving frame, and a probe is arranged at the bottom of the second slider.

[0010] Preferably, a first motor is fixedly connected to one side of the upper pressure plate, a first screw rod is fixedly connected to an output shaft end of the first motor, the first screw rod is rotatably connected in a first sliding groove, and the first screw rod is threadedly connected to the first sliding block.

[0011] Preferably, a second motor is fixedly installed on one side of the movable frame, a second screw rod is fixedly connected to the output shaft end of the second motor, a second slide groove is opened at the bottom of the movable frame, the second screw rod is rotatably connected to the second slide groove, the second slider is symmetrically arranged in the second slide groove, the second screw rod is threadedly connected to the second slider, and the second screw rod is arranged as a bidirectional screw rod.

[0012] Preferably, a positioning rod is fixedly connected to the bottom of the second sliding block, a sliding rod is slidably connected to the bottom of the positioning rod, one end of the sliding rod is fixedly connected to a mounting block, the probe is fixedly connected to the lower surface of the mounting block, and a spring is fixedly connected between the bottom of the positioning rod and the upper surface of the mounting block.

[0013] Preferably, the upper pressure plate is provided with a thickness adjustment component, and the thickness adjustment component includes a limit frame, the limit frame is fixedly connected to the lower surface of the upper pressure plate, the limit frame is internally threaded with a threaded rod, the bottom of the threaded rod is fixedly connected to a pressure block, the top of the threaded rod is fixedly connected to an adjustment block, and a limit switch is provided on the upper surface of the lower pressure plate.

[0014] Preferably, the limit switch is matched with the pressing block, and the limit switch is electrically connected to the electric push rod.

[0015] Preferably, the upper pressing plate and the lower pressing plate are matched with each other, and the limiting frame and the second motor do not contact each other.

[0016] Beneficial Effects

[0017] The utility model provides a multi-station chip testing fixture, which has at least the following beneficial effects compared with the prior art:

[0018] The first motor drives the first screw rod to rotate, so that the first slider drives the moving frame to move along the first slide slot, and then the y-axis position of the probe is adjusted. The second motor drives the second screw rod to rotate, so that the second slider moves along the second slide slot, and the x-axis position of the probe is adjusted. The probe is adjusted to adapt to chips of different sizes. The rotating adjustment block drives the pressing block to move, and the z-axis position of the pressing block is adjusted, thereby changing the distance between the pressing block and the limit switch, so as to perform power-on testing for chips of different thicknesses, which is easy to use. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 It is a schematic diagram of the structure of the utility model;

[0020] Figure 2 This is a schematic diagram of the structure of the thickness adjustment component of the utility model;

[0021] Figure 3 This is a schematic diagram of the structure of the pin adjustment component of the utility model;

[0022] Figure 4 It is an enlarged schematic diagram of the structure at point A of the utility model.

[0023] In the figure: 1, base; 2, rotating motor; 3, rotating disk; 4, fixed frame; 5, mounting plate; 6, electric push rod; 7, connecting plate; 8, upper pressure plate; 9, lower pressure plate; 10, limit groove; 11, probe; 12, probe adjustment assembly; 1201, first slide groove; 1202, first motor; 1203, first screw rod; 1204, first slider; 1205, moving frame; 1206, second motor; 1207, second slide groove; 1208, second slider; 1209, positioning rod; 1210, sliding rod; 1211, mounting block; 1212, spring; 1213, second screw rod; 13, thickness adjustment assembly; 1301, limit frame; 1302, threaded rod; 1303, pressure block; 1304, limit switch; 1305, adjustment block. DETAILED DESCRIPTION

[0024] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0025] Embodiment 1:

[0026] See also Figure 1-4 The utility model provides a technical solution: a base 1, a rotating motor 2 is fixedly installed on the upper surface of the base 1, a rotating disk 3 is fixedly connected to the output shaft end of the rotating motor 2, a fixed frame 4 is arranged in a circumferential array on the upper surface of the rotating disk 3, a mounting plate 5 is fixedly connected to one side of the fixed frame 4, an electric push rod 6 is fixedly connected to the top of the mounting plate 5, a connecting plate 7 is fixedly connected to the movable end of the electric push rod 6, an upper pressing plate 8 is fixedly connected to one side of the connecting plate 7, a lower pressing plate 9 is fixedly connected to one side of the fixed frame 4, a limiting groove 10 is provided on the lower pressing plate 9, and a probe adjustment assembly 12 is arranged on the upper pressing plate 8; the probe adjustment assembly 12 includes a first slide groove 1201 provided on the lower surface of the upper pressing plate 8, a first slider 1204 is slidably connected in the first slide groove 1201, a moving frame 1205 is fixedly connected to the bottom of the first slider 1204, a second slider 1208 is slidably connected to the lower surface of the moving frame 1205, and a probe 11 is arranged at the bottom of the second slider 1208.

[0027] Analysis of the above content: Power supply test is performed on chips of different sizes by changing the position of probe 11. Setting multiple groups of probes 11 can test multiple groups of chips at the same time, thereby improving detection efficiency. The first motor 1202 drives the first screw rod 1203 to rotate, so that the first slider 1204 drives the moving frame 1205 to move along the first slide groove 1201, and then the y-axis position of the probe 11 is adjusted. The second motor 1206 drives the second screw rod 1213 to rotate, so that the second slider 1208 moves along the second slide groove 1207, and the x-axis position of the probe 11 is adjusted. The probe 11 is adjusted to adapt to chips of different sizes. Power supply test is performed for chips of different sizes.

[0028] Embodiment 2:

[0029] See also Figure 1-4 The utility model provides a technical solution based on the first embodiment: a first motor 1202 is fixedly connected to one side of the upper pressure plate 8, a first screw rod 1203 is fixedly connected to the output shaft end of the first motor 1202, the first screw rod 1203 is rotatably connected in the first slide groove 1201, and the first screw rod 1203 is threadedly connected to the first slider 1204.

[0030] Analyzing the above contents: the first motor 1202 drives the first screw rod 1203 to rotate, and the first screw rod 1203 drives the first slider 1204 to move, so as to adjust the position of the probe 11.

[0031] Embodiment three:

[0032] See also Figure 1-4The utility model provides a technical solution based on the first embodiment: a second motor 1206 is fixedly installed on one side of the movable frame 1205, and a second screw rod 1213 is fixedly connected to the output shaft end of the second motor 1206. A second slide groove 1207 is opened at the bottom of the movable frame 1205, and the second screw rod 1213 is rotatably connected to the second slide groove 1207. The second slider 1208 is symmetrically arranged in the second slide groove 1207. The second screw rod 1213 is threadedly connected to the second slider 1208, and the second screw rod 1213 is arranged as a bidirectional screw rod.

[0033] Analysis of the above content: the second motor 1206 drives the second screw rod 1213 to rotate, and the second slider 1208 is relatively moved under the action of the second screw rod 1213, thereby driving the probe 11 to adjust its position.

[0034] Embodiment 4:

[0035] See also Figure 1-4 The utility model provides a technical solution based on the first embodiment: a positioning rod 1209 is fixedly connected to the bottom of the second slider 1208, a sliding rod 1210 is slidably connected to the bottom of the positioning rod 1209, one end of the sliding rod 1210 is fixedly connected to a mounting block 1211, the probe 11 is fixedly connected to the lower surface of the mounting block 1211, and a spring 1212 is fixedly connected between the bottom of the positioning rod 1209 and the upper surface of the mounting block 1211.

[0036] Analysis of the above content: under the action of the spring 1212, the mounting block 1211 drives the probe 11 to move downward, and when the height of the pressing block 1303 is adjusted, the probe 11 can also contact the chip pin, which is not affected by the chip thickness and is easy to use.

[0037] Embodiment five:

[0038] See also Figure 1-4 The utility model provides a technical solution based on the first embodiment: a thickness adjustment component 13 is arranged on the upper pressing plate 8, and the thickness adjustment component 13 includes a limit frame 1301, the limit frame 1301 is fixedly connected to the lower surface of the upper pressing plate 8, the limit frame 1301 is internally threaded with a threaded rod 1302, the bottom of the threaded rod 1302 is fixedly connected with a pressure block 1303, the top of the threaded rod 1302 is fixedly connected with an adjustment block 1305, and a limit switch 1304 is arranged on the upper surface of the lower pressing plate 9.

[0039] Analysis of the above content: Rotating the adjustment block 1305 drives the threaded rod 1302 to rotate, so that the pressure block 1303 moves up and down along the limit frame 1301, and the distance between the pressure block 1303 and the limit switch 1304 is changed by the movement of the pressure block 1303. When the upper pressure plate 8 moves downward, the pressure block 1303 stops when it contacts the limit switch 1304. By changing the distance between the pressure block 1303 and the limit switch 1304, chips of different thicknesses can be detected.

[0040] Embodiment six:

[0041] See also Figure 1-4 The utility model provides a technical solution based on the first embodiment: the limit switch 1304 is matched with the pressing block 1303, and the limit switch 1304 is electrically connected with the electric push rod 6. The upper pressing plate 8 is matched with the lower pressing plate 9, and the limit frame 1301 and the second motor 1206 do not contact each other.

[0042] Analysis of the above content: When the limit switch 1304 is squeezed by the pressing block 1303, the electric push rod 6 stops moving downward to avoid crushing the thicker chip.

[0043] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device.

[0044] Although the embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A multi-station chip testing fixture, characterized in that: include: A base (1), wherein a rotating motor (2) is fixedly mounted on the upper surface of the base (1), a rotating disk (3) is fixedly connected to the output shaft end of the rotating motor (2), a fixing frame (4) is arranged in a circumferential array on the upper surface of the rotating disk (3), a mounting plate (5) is fixedly connected to one side of the fixing frame (4), an electric push rod (6) is fixedly connected to the top of the mounting plate (5), a connecting plate (7) is fixedly connected to the movable end of the electric push rod (6), an upper pressing plate (8) is fixedly connected to one side of the connecting plate (7), a lower pressing plate (9) is fixedly connected to one side of the fixing frame (4), a limiting groove (10) is provided on the lower pressing plate (9), and a probe adjustment component (12) is arranged on the upper pressing plate (8); The probe adjustment assembly (12) includes a first slide groove (1201) opened on the lower surface of the upper pressure plate (8), a first slider (1204) is slidably connected in the first slide groove (1201), a movable frame (1205) is fixedly connected to the bottom of the first slider (1204), a second slider (1208) is slidably connected to the lower surface of the movable frame (1205), and a probe (11) is arranged at the bottom of the second slider (1208).

2. The multi-station chip testing fixture according to claim 1, characterized in that: A first motor (1202) is fixedly connected to one side of the upper pressure plate (8); a first screw rod (1203) is fixedly connected to the output shaft end of the first motor (1202); the first screw rod (1203) is rotatably connected to the first slide groove (1201); and the first screw rod (1203) is threadedly connected to the first slider (1204).

3. The multi-station chip testing fixture according to claim 1, characterized in that: A second motor (1206) is fixedly installed on one side of the movable frame (1205), and a second screw rod (1213) is fixedly connected to the output shaft end of the second motor (1206). A second slide groove (1207) is opened at the bottom of the movable frame (1205), and the second screw rod (1213) is rotatably connected in the second slide groove (1207). The second slider (1208) is symmetrically arranged in the second slide groove (1207), and the second screw rod (1213) is threadedly connected to the second slider (1208). The second screw rod (1213) is arranged as a bidirectional screw rod.

4. The multi-station chip testing fixture according to claim 3, characterized in that: The bottom of the second sliding block (1208) is fixedly connected to a positioning rod (1209), the bottom of the positioning rod (1209) is slidably connected to a sliding rod (1210), one end of the sliding rod (1210) is fixedly connected to a mounting block (1211), the probe (11) is fixedly connected to the lower surface of the mounting block (1211), and a spring (1212) is fixedly connected between the bottom of the positioning rod (1209) and the upper surface of the mounting block (1211).

5. The multi-station chip testing fixture according to claim 1, characterized in that: The upper pressing plate (8) is provided with a thickness adjustment component (13), and the thickness adjustment component (13) comprises a limit frame (1301), the limit frame (1301) is fixedly connected to the lower surface of the upper pressing plate (8), the limit frame (1301) is internally threadedly connected to a threaded rod (1302), the bottom of the threaded rod (1302) is fixedly connected to a pressure block (1303), the top of the threaded rod (1302) is fixedly connected to an adjustment block (1305), and a limit switch (1304) is provided on the upper surface of the lower pressing plate (9).

6. The multi-station chip testing fixture according to claim 5, characterized in that: The limit switch (1304) is matched with the pressing block (1303), and the limit switch (1304) is electrically connected to the electric push rod (6).

7. The multi-station chip testing fixture according to claim 5, characterized in that: The upper pressing plate (8) and the lower pressing plate (9) are arranged in a matching manner, and the limiting frame (1301) and the second motor (1206) do not contact each other.

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