Testing device for square sheet type ceramic sensor

Abstract

The utility model discloses a testing device for a square sheet type ceramic sensor. Comprising an upper baffle, a lower baffle, a clamping groove plate, a clamping test mechanism and a lifting mechanism, the upper baffle is arranged on the lifting mechanism, the lower baffle is provided with a clamping groove plate, a chip containing groove is formed in the clamping groove plate, the size of the chip containing groove is matched with that of a chip, the clamping testing mechanisms are arranged in the upper baffle and the lower baffle respectively, and the clamping testing mechanisms are aligned with the chip containing groove. The clamping test mechanisms of the upper baffle plate and the lower baffle plate form a test station in the chip holding groove, and the test station is in a suspended state. The clamping test mechanism serves as a support of the chip and is electrically connected with a pin of the chip function test area. According to the utility model, the chip is clamped by the upper striker and the lower striker, so that the chip is suspended in the chip accommodating groove and is not in contact with the clamping groove plate, and normal work of the chip is not influenced due to too fast temperature loss when the chip works. And the chip function test area is uniformly stressed, so that the test effect is ensured.

Description

Technical field:

[0001] The utility model belongs to the technical field of ceramic sensors, and in particular relates to a testing device for square-plate ceramic sensors. Background technology:

[0002] The single-layer ceramic sheet with a thickness of 10um-1000um is punched by mechanical or laser technology, and the functional graphics are printed on the ceramic sheet. Then the ceramic sheets are stacked in position and laminated into one by warm isostatic pressing and other methods. After cutting, they are sintered into square ceramic sensor chips. The formed chips need to be tested and packaged after passing the test.

[0003] The products tested by existing test devices are generally large in size. Small-sized chips are not convenient to fix. The functional test area of ​​the chip is even smaller, so existing test devices are not convenient for testing performance. The chip will generate high temperature when working, so the parts of the test device that contact the chip are usually made of high-temperature resistant materials. Since the functional test area of ​​small-sized chips is very small, the test device is prone to excessive heat absorption during testing, causing the chip temperature to lose too quickly, affecting the normal operation of the chip. In addition, since the functional test area of ​​small-sized chips is very small, when the test device fixes the chip, it is easy to cause uneven force on the chip functional test area, affecting the test effect.

[0004] The information disclosed in this background technology section is only intended to increase the understanding of the overall background of the present invention, and should not be regarded as acknowledging or suggesting in any form that the information constitutes the prior art already known to a person skilled in the art. Utility model content:

[0005] The purpose of the utility model is to provide a testing device for a square-plate ceramic sensor, thereby overcoming the defects in the above-mentioned prior art.

[0006] To achieve the above-mentioned purpose, the utility model provides a testing device for square-chip ceramic sensors, including an upper baffle, a lower baffle, a slot plate, a clamping test mechanism, and a lifting mechanism; the upper baffle is arranged on the lifting mechanism, the lower baffle is provided with a slot plate, the slot plate is provided with a chip holding slot, the chip holding slot size matches the chip, the clamping test mechanism is respectively arranged in the upper baffle and the lower baffle, the clamping test mechanism is aligned with the chip holding slot, the clamping test mechanism of the upper baffle and the lower baffle forms a test station in the chip holding slot, and the test station is in a suspended state; the clamping test mechanism serves as a support for the chip and is electrically connected to the pins of the chip function test area.

[0007] Preferably, in the technical solution, the clamping test mechanism includes an upper striker and a lower striker, the upper striker is fixed in the upper baffle, the lower striker is fixed in the lower baffle, the front end of the lower striker passes through the card slot plate, the front end of the lower striker extends into the chip holding slot, and the upper striker and the lower striker are arranged opposite to each other; each chip holding slot corresponds to a group of upper strikers and lower strikers, and the gap between each group of upper strikers and lower strikers forms a test station, and the test station is suspended in the chip holding slot.

[0008] Preferably, in the technical solution, each of the upper striker and the lower striker is composed of four unit strikers, so that when the chip is clamped, the force on the chip is more uniform.

[0009] Preferably, in the technical solution, the unit striker is a retractable structure, and the chip in the chip holding slot is lifted up by the unit striker to form a suspended state.

[0010] Preferably, in the technical solution, the lifting mechanism includes a bracket, a fixed seat, a crank mechanism, a lifting rod and a guide rod. The bracket is provided with a fixed seat and a guide rod, the upper baffle is mounted on the guide rod, the fixed seat is provided with a crank mechanism, the fixed seat is movably provided with a lifting rod, the crank mechanism is connected to the lifting rod, the lifting rod is connected to the upper baffle, and the lifting rod is driven to rise and fall by the crank mechanism, thereby driving the upper baffle to rise and fall.

[0011] Preferably, in the technical solution, an adjustment slot is provided on the bracket, the fixing seat is fixed in the adjustment slot, and the starting position of the upper baffle lifting is adjusted by adjusting the position of the fixing seat in the adjustment slot.

[0012] Preferably, in the technical solution, an anti-scalding baffle is provided at the front end of the upper baffle.

[0013] Preferably, in the technical solution, the slot plate is made of synthetic stone, which is insulated and high temperature resistant.

[0014] Compared with the prior art, the utility model has the following beneficial effects:

[0015] The small-sized chip is tested by setting a striker. The size of the striker is adapted to the small-sized chip, which is convenient for testing. The chip is clamped by the upper and lower strikers, so that the chip is suspended in the chip holding slot and does not contact the card slot board, so that the chip will not lose temperature too quickly when working, affecting the normal operation of the chip. The chip is clamped by four unit strikers on each side of the upper and lower sides, and the chip function test area is evenly stressed, ensuring the test effect. Description of the drawings:

[0016] Figure 1 This is a schematic diagram of the structure of a test device for a square ceramic sensor of the utility model;

[0017] Figure 2 This is a front view of the test device for square ceramic sensors of the utility model;

[0018] Figure 3 It is a schematic diagram of the clamping state of the clamping test mechanism of the utility model. Specific implementation method:

[0019] The specific implementation modes of the present invention are described in detail below, but it should be understood that the protection scope of the present invention is not limited by the specific implementation modes.

[0020] Unless explicitly stated otherwise, throughout the specification and claims, the term “comprise” or variations such as “include” or “comprising”, etc., will be understood to include the stated elements or components but not to exclude other elements or components.

[0021] like Figure 1-3 As shown, a test device for a square ceramic sensor includes an upper baffle 1, a lower baffle 2, a slot plate 3, a clamping test mechanism 4, and a lifting mechanism 5; the lifting mechanism 5 and the lower baffle 2 are arranged on the table 6, and the lifting mechanism 5 includes a bracket 50, a fixing seat 51, a crank mechanism 52, a lifting rod 53, and a guide rod 54. The bracket 50 is arranged on the table 6, and the bracket 50 is provided with an adjustment groove 55 and a guide rod 54. The upper baffle 1 is sleeved on the guide rod 54, and the fixing seat 51 is fixed in the adjustment groove 55. The seat 51 is provided with a crank mechanism 52, and a lifting rod 53 is movably provided on the fixed seat 51. The crank mechanism 52 is connected to the lifting rod 53, and the lifting rod 53 is connected to the upper baffle 1. The lifting rod 53 is driven to rise and fall by the crank mechanism 52, thereby driving the upper baffle 1 to rise and fall. By adjusting the position of the fixed seat 51 in the adjustment slot 55, the starting position of the upper baffle 1 is adjusted. The front end of the upper baffle 1 is provided with an anti-scalding baffle 7 to prevent the operator from being burned by the high temperature of the chip and the upper and lower strikers 40 and 41. The lower baffle 1 The plate 2 is provided with a card slot plate 3, which is made of synthetic stone, insulated and high temperature resistant, and the card slot plate 3 is provided with a chip holding slot 30, the size of which matches the chip, and the clamping test mechanism 4 includes an upper striker 40 and a lower striker 41, the upper striker 40 is fixed in the upper baffle 1, the lower striker 41 is fixed in the lower baffle 2, the front end of the lower striker 41 passes through the card slot plate 3, and the front end of the lower striker 41 extends to the chip holding slot 30, and the upper striker 40 and the lower striker 41 are arranged opposite to each other; each chip holding slot 30 is provided with a chip holding slot 30, and the ... The slot 30 corresponds to a group of upper strikers 40 and lower strikers 41. The gap between each group of upper strikers 40 and lower strikers 41 forms a test station, and the test station is suspended in the chip holding slot 30; each upper striker 40 and lower striker 41 is composed of four unit strikers, and when the chip is clamped, the force on the chip is more uniform; the unit striker is a retractable structure, and the chip in the chip holding slot 30 is lifted by the unit striker to form a suspended state; the upper striker 40 and lower striker 41 serve as supports for the chip and are electrically connected to the pins of the chip function test area.

[0022] During the test, the upper baffle 1 is adjusted to a suitable starting position according to the size of the square ceramic sensor 7 in advance, the square ceramic sensor 7 is placed in the chip holding groove 30, and the crank mechanism 52 is pulled downward to drive the upper baffle 1 to descend, and the upper striker 40 descends and contacts the square ceramic sensor 7. When the upper striker 40 applies pressure to the square ceramic sensor 7, the square ceramic sensor 7 applies pressure to the lower striker 41, and the front end of the lower striker 41 extends after being pressed, and the lower striker 41 lifts the square ceramic sensor 7. The upper striker 40 and the lower striker 41 clamp the square ceramic sensor 7 in a suspended state, and the power supply is connected through the upper striker 40 and the lower striker 41 to test the functional test area of ​​the square ceramic sensor 7. Since the square ceramic sensor 7 does not contact the card slot plate 3, the temperature of the square ceramic sensor 7 will not be lost too quickly during operation, ensuring the normal operation of the square ceramic sensor 7. The sizes of the upper striker 40 and the lower striker 41 are adapted to the square ceramic sensor 7, which is convenient for testing. The square ceramic sensor 7 is clamped by four unit impact pins on each upper and lower side, so that the functional test area of ​​the square ceramic sensor is evenly stressed, thereby ensuring the test effect.

[0023] The foregoing description of specific exemplary embodiments of the utility model is for the purpose of illustration and illustration. These descriptions are not intended to limit the utility model to the precise form disclosed, and it is clear that many changes and variations can be made based on the above teachings. The purpose of selecting and describing the exemplary embodiments is to explain the specific principles of the utility model and its practical application, so that those skilled in the art can realize and utilize various different exemplary embodiments of the utility model and various different options and changes. The scope of the utility model is intended to be defined by the claims and their equivalents.

Claims

1. A testing device for a square ceramic sensor, characterized in that: It includes an upper baffle, a lower baffle, a slot plate, a clamping test mechanism, and a lifting mechanism; the upper baffle is arranged on the lifting mechanism, the lower baffle is provided with a slot plate, the slot plate is provided with a chip holding slot, the chip holding slot size matches the chip, the clamping test mechanism is respectively arranged in the upper baffle and the lower baffle, the clamping test mechanism is aligned with the chip holding slot, the clamping test mechanism of the upper baffle and the lower baffle forms a test station in the chip holding slot, and the test station is in a suspended state; the clamping test mechanism serves as a support for the chip and is electrically connected to the pins of the chip function test area.

2. The testing device for square ceramic sensors according to claim 1, characterized in that: The clamping test mechanism includes an upper striker and a lower striker. The upper striker is fixed in the upper baffle, and the lower striker is fixed in the lower baffle. The front end of the lower striker passes through the card slot plate, and the front end of the lower striker extends into the chip holding slot. The upper striker and the lower striker are arranged opposite to each other; each chip holding slot corresponds to a group of upper strikers and lower strikers, and the gap between each group of upper strikers and lower strikers forms a test station, and the test station is suspended in the chip holding slot.

3. The testing device for square ceramic sensors according to claim 2, characterized in that: Each of the upper firing pin and the lower firing pin is composed of four unit firing pins.

4. The testing device for square ceramic sensors according to claim 3, characterized in that: The unit firing pin is a retractable structure.

5. The testing device for square ceramic sensors according to claim 1, characterized in that: The lifting mechanism includes a bracket, a fixed seat, a crank mechanism, a lifting rod and a guide rod. The bracket is provided with a fixed seat and a guide rod, and the upper baffle is mounted on the guide rod. The fixed seat is provided with a crank mechanism, and the fixed seat is movably provided with a lifting rod. The crank mechanism is connected to the lifting rod, and the lifting rod is connected to the upper baffle. The lifting rod is driven to rise and fall through the crank mechanism, thereby driving the upper baffle to rise and fall.

6. The testing device for square ceramic sensors according to claim 5, characterized in that: The bracket is provided with an adjustment slot, the fixing seat is fixed in the adjustment slot, and the starting position of the upper baffle lifting is adjusted by adjusting the position of the fixing seat in the adjustment slot.

7. The testing device for square ceramic sensors according to claim 1, characterized in that: An anti-scalding baffle is arranged at the front end of the upper baffle.

8. The testing device for square ceramic sensors according to claim 1, characterized in that: The card slot panels are made of synthetic stone.

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