Non-contact device applied to false pressure test

By using non-contact devices in electronic components testing, using the design of the alignment target and connection end, the pressure-free test of large-size Metal Mesh copper grid is realized, solving the damage problem of the product surface by the probe pressing test, and improving the Product yield and reduce the probability of misjudgment.

CN222365063UActive Publication Date: 2025-01-17SHENZHEN ZHILING WEIYE TECH
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Patent Information

Application Number
CN202420900984.8
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-04-27
Publication Date
2025-01-17
Estimated Expiration
2034-04-27

AI Technical Summary

Technical Problem

In the existing electronic component testing methods, the probe pressing test will cause indentation and scratches on the product surface, especially the large-size Metal Mesh copper grid, resulting in the product yield being unable to be guaranteed.

Method used

A non-contact device is designed, including a test platform, an interface IC and a computer. It uses the alignment target and the connection end to realize the precise alignment of the test product. The pulse signal is sent through the sending end and the receiving end. After the computer process, the open circuit situation is judged to be reduced. Damage to the product surface and reduce the probability of misjudgment.

Benefits of technology

The pressure-free test of electronic components is realized, which reduces surface damage, improves product yield, and effectively reduces the probability of misjudgment through computer judgment.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a non-contact device applied to a false pressure test. The non-contact device comprises a test platform, an interface IC and a computer, an alignment target and a test area are arranged on the test platform, a connecting end is arranged in the test area, and a transmitting end and a receiving end are arranged on the interface IC; a connecting end and an alignment target are arranged on a test platform, a test product is placed on the platform, a series capacitor is obtained according to overlapping of the alignment target and the connecting end, pulse signals are sequentially sent at a sending end of an interface IC according to the sequence from TX1 to TXn, a receiving end receives the signals, and the signals are displayed on a computer after being processed by the IC. If a certain path does not receive the signal or the signal is lower than a set value, it is indicated that the open circuit is poor, and software on the computer will give an alarm. According to the utility model, the damage to the surface of a tested product can be reduced, the misjudgment probability is reduced, and the product yield is improved.
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Description

Technical Field

[0001] The utility model relates to the technical field of electronic component testing, and more specifically, particularly relates to a non-contact device used for false pressure testing. Background Art

[0002] Capacitive screens, FPCs, OCs, mobile phones and other electronic components require electrical testing before production. The product testing mainly uses the probe press test method, which will cause indentations, scratches and other damages to the product surface. Especially for large-size Metal Mesh copper testing, the copper surface of the product will be punctured and scratched, resulting in the inability to guarantee the product yield. Utility Model Content

[0003] The utility model provides a non-contact device for false pressure testing to solve the problems raised in the above background technology. To achieve the above purpose, the utility model provides the following technical solutions: a non-contact device for false pressure testing, including a test platform, an interface IC and a computer; the test platform is provided with a positioning target and a test area, the test area is provided with a connection end, and the connection section is used to connect the test product; the interface IC is connected to the computer, and the interface IC is provided with a transmitting end and a receiving end, and the transmitting end is used to connect the test product; the connecting end includes a plurality of test pins, and the plurality of test pins are respectively connected to the receiving end.

[0004] Preferably, a plurality of test pins are arranged at equal intervals on the test platform.

[0005] Preferably, the test pin is a conductive contact.

[0006] Preferably, the test product comprises a plurality of functional pins, and the functional pins intersect with the test pins on the test platform to form capacitor nodes.

[0007] Preferably, the alignment target includes four marks, and the four marks are respectively arranged at the four corners of the test area.

[0008] Preferably, the mark is a cross-shaped structure or an X-shaped structure.

[0009] Preferably, the transmitting end is connected to the test product via an FPC cable.

[0010] Preferably, it also includes an LED alarm device, which is connected to the computer; the LED alarm device is provided with a plurality of LED lamp beads, the number of which is consistent with the number of the test pins and is arranged in coordination with the arrangement of the test pins.

[0011] Compared with the prior art, the beneficial effects of the utility model are as follows: the utility model sets a connection terminal and an alignment target on the test platform, places the test product on the platform and overlaps the connection terminal according to the alignment target, obtains a series capacitor, sends pulse signals in the order of TX1 to TXn at the transmitting end of the interface IC, receives the signal and presents it to the computer after being processed by the IC, if a certain path is not received or the signal is lower than the set value, it indicates that there is an open circuit, and the software on the computer will alarm. The test structure of the utility model is simple, easy to implement, can reduce damage to the surface of the test product, and judges the quality of the open circuit by the computer, which can effectively reduce the probability of misjudgment and improve the yield of the product. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] Figure 1 This is a structural schematic diagram of a non-contact device for false pressure testing according to an embodiment of the utility model;

[0013] Figure 2 This is a schematic diagram of a test state of a non-contact device for false pressure testing according to an embodiment of the utility model;

[0014] exist Figure 1 and Figure 2 In the figure, the corresponding relationship between the names of the components and the numbers of the drawings is as follows:

[0015] 1--test platform, 2--interface IC, 21--transmitter, 22--receiver, 3--computer, 4--alignment target, 5--test area, 6--connection end, 7--test product, 8--capacitor node. DETAILED DESCRIPTION

[0016] The following is a further detailed description of the implementation of the present utility model in conjunction with the accompanying drawings and examples. The following examples are used to illustrate the present utility model, but cannot be used to limit the scope of the present utility model.

[0017] In the description of the present invention, unless otherwise specified, "multiple" means two or more; the terms "upper", "lower", "left", "right", "inner", "outer", "front end", "rear end", "head", "tail" and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, which is only for the convenience of describing the present invention and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operate in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "first", "second", "third" and the like are only used for descriptive purposes and cannot be understood as indicating or implying relative importance.

[0018] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "connected" and "connection" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0019] Please refer to Figure 1 and Figure 2 The utility model provides a non-contact device for false pressure testing, including a test platform 1, an interface IC2 and a computer 3; the test platform 1 is provided with an alignment target 4 and a test area 5, the test area 5 is provided with a connection end 6, and the connection section is used to connect a test product 7; the interface IC2 is connected to the computer 3, and the interface IC2 is provided with a transmitting end 21 and a receiving end 22, and the transmitting end 21 is used to connect the test product 7; the connecting end 6 includes a plurality of test pins, and the plurality of test pins are respectively connected to the receiving end 22.

[0020] In the embodiment of the utility model, the test platform 1 is used to place the test product 7, and the test platform 1 is pre-set with a connection terminal 6, which is used to match and connect the test product 7. In order to allow the test product 7 to be accurately aligned, an alignment target 4 is set on the test platform 1 to align the test product 7. The connection terminal 6 includes a plurality of test pins, and the test pins are connected to each path of the test product 7 respectively.

[0021] When testing is required, the test product 7 is placed on the test platform 1, the test product 7 is aligned with the tail of the alignment target 4 and overlaps with the connection terminal 6 to obtain a series capacitor, and the transmitting end 21 of the interface IC2 sends pulse signals in the order of TX1 to TXn. The receiving end 22 receives the signal and presents it to the computer 3 after processing by the IC. If a certain path is not received or the signal is lower than the set value, it means that there is an open circuit, and the software on the computer 3 will alarm.

[0022] Preferably, a plurality of test pins are arranged at equal intervals on the test platform 1. In this embodiment, a plurality of test pins are arranged at equal intervals to form an array, which can better match test products 7 of various specifications.

[0023] Preferably, the test pin is a conductive contact.

[0024] Preferably, the test product 7 includes multiple functional pins, and the functional pins intersect with the test pins on the test platform 1 to form a capacitor node 8. In this embodiment, the functional pins and the test pins are in contact to form a capacitor node 8, and the computer 3 calculates the pulse signal feedback of each capacitor node 8, thereby determining the state of the capacitor node 8.

[0025] Preferably, the alignment target 4 includes four marks, which are respectively arranged at the four corners of the test area 5. By arranging marks in four directions, the accuracy of alignment can be well improved and the error of the test can be reduced.

[0026] Preferably, the mark is a cross-shaped structure or an X-shaped structure.

[0027] Preferably, the transmitting end 21 is connected to the test product 7 via an FPC cable.

[0028] Preferably, an LED alarm device is also included, and the LED alarm device is connected to the computer 3; the LED alarm device is provided with a plurality of LED lamp beads, and the number of the LED lamp beads is consistent with the number of the test pins, and is arranged in coordination with the arrangement of the test pins. Through the above structural design, when an abnormality is detected in a certain path, the detection structure can directly feedback through the LED lamp beads, and can correspond to which path has a problem, so that the detection personnel can quickly observe the result.

[0029] Compared with the prior art, the beneficial effects of the utility model are as follows: the utility model sets a connection terminal and an alignment target on the test platform, places the test product on the platform and overlaps the connection terminal according to the alignment target, obtains a series capacitor, sends pulse signals in the order of TX1 to TXn at the transmitting end of the interface IC, receives the signal and presents it to the computer after being processed by the IC, if a certain path is not received or the signal is lower than the set value, it indicates that there is an open circuit, and the software on the computer will alarm. The test structure of the utility model is simple, easy to implement, can reduce damage to the surface of the test product, and judges the quality of the open circuit by the computer, which can effectively reduce the probability of misjudgment and improve the yield of the product.

[0030] The embodiments of the present invention are provided for the purpose of illustration and description, and are not intended to be exhaustive or to limit the present invention to the disclosed forms. Many modifications and variations will be apparent to those of ordinary skill in the art. The embodiments are selected and described to better illustrate the principles and practical applications of the present invention, and to enable those of ordinary skill in the art to understand the present invention and thereby design various embodiments with various modifications suitable for specific uses.

Claims

1. A non-contact device for false pressure testing, characterized in that: The invention comprises a test platform (1), an interface IC (2) and a computer (3); the test platform is provided with an alignment target (4) and a test area (5); the test area is provided with a connection end (6), the connection end is used to connect a test product (7); the interface IC is connected to the computer, the interface IC is provided with a transmitting end (21) and a receiving end (22), the transmitting end is used to connect a test product; the connecting end comprises a plurality of test pins, the plurality of test pins are respectively connected to the receiving end.

2. The non-contact device for false pressure testing according to claim 1, characterized in that: A plurality of test pins are arranged at equal intervals on the test platform.

3. The non-contact device for false pressure testing according to claim 2, characterized in that: The test pin is a conductive contact.

4. The non-contact device for false pressure testing according to claim 1, characterized in that: The test product comprises a plurality of functional pins, wherein the functional pins intersect with the test pins on the test platform to form a capacitor node (8).

5. The non-contact device for false pressure testing according to claim 1, characterized in that: The alignment target includes four marks, and the four marks are respectively arranged at the four corners of the test area.

6. The non-contact device for false pressure testing according to claim 5, characterized in that: The mark is a cross-shaped structure or an X-shaped structure.

7. The non-contact device for false pressure testing according to claim 1, characterized in that: The transmitting end is connected to the test product via an FPC cable.

8. The non-contact device for false pressure testing according to any one of claims 1 to 7, characterized in that: It also includes an LED alarm device, which is connected to the computer; the LED alarm device is provided with a plurality of LED lamp beads, the number of which is consistent with the number of the test pins and is arranged in coordination with the arrangement of the test pins.