Novel IC chip test fixture

Abstract

The utility model relates to the technical field of chip testing, in particular to a novel IC chip testing jig which comprises a main body, a fixing plate lifting mechanism is arranged on the inner wall of the main body, the upper end of the main body is adjacent to a fixing plate, a chip fixing mechanism is arranged on the inner wall of a shell, and the upper surface of the fixing plate is connected with a clamping plate in a sliding mode through a sliding groove. Through cooperation of the main body and the fixing plate lifting mechanism, the first rotating disc drives the rotating rod to rotate, and the sliding block drives the supporting rod to move, the fixing plate can drive the chip to move to a proper height through the mode, so that the working quality of the chip testing jig is improved, through cooperation of the shell and the chip fixing mechanism, the second rotating disc drives the worm to rotate, and the working efficiency is improved. The worm drives the worm wheel to rotate, the worm wheel drives the second gear to rotate, and the second rack drives the clamping plate to move, so that the clamping plate is attached to the chip through the soft cushion, the chip is prevented from falling off, and the working cost of the chip test fixture is reduced.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, in particular to a novel IC chip testing fixture. Background Art

[0002] IC chips are integrated circuits formed by a large number of microelectronic components placed on a plastic substrate to form a chip. IC chips include wafer chips and packaged chips. The corresponding IC chip production line consists of two parts: wafer production line and package production line. IC chips need to be tested after processing.

[0003] For example, an IC chip test fixture with the authorization announcement number "CN207742087U" has a threaded fine-tuner set on the fixture's legs. When testing chip samples, only the threaded fine-tuner needs to be adjusted to make the sample image in the observation field clear. Not only does it not require glue, it can also avoid damage to the chip sample, greatly improving the test efficiency and effectively improving the accuracy of chip sample analysis. However, when the height of the support plate of the IC chip test fixture is adjusted by the threaded fine-tuner, the three threaded fine-tuners cannot work synchronously, which results in the support plate not being placed horizontally after the threaded fine-tuner fine-tunes the support plate, which reduces the working quality of the chip test fixture. At the same time, when the height of the support plate is adjusted after the chip is placed on the support plate, the chip is not fixed, which causes the chip to fall from the support plate, causing damage to the chip, which increases the working cost of the chip test fixture. Utility Model Content

[0004] The purpose of the utility model is to solve the problem that when the height of the support plate is adjusted by the thread fine-tuner, the three thread fine-tuners cannot work synchronously, which leads to the situation that the support plate is not placed horizontally after the thread fine-tuner fine-tunes the support plate, which reduces the working quality of the chip test fixture and after the chip is placed on the support plate, when the height of the support plate is adjusted, the chip is not fixed, which causes the chip to fall from the support plate, causing damage to the chip, which increases the working cost of the chip test fixture, and a new IC chip test fixture is proposed.

[0005] In order to achieve the above purpose, the utility model provides the following technical solutions:

[0006] A novel IC chip testing fixture is designed, including a main body, the inner wall of the main body is provided with a fixed plate lifting mechanism, the upper end of the main body is adjacent to the fixed plate, the upper surface of the fixed plate is fixedly connected to the shell, the inner wall of the shell is provided with a chip fixing mechanism, and the upper surface of the fixed plate is slidably connected to the clamping plate through a slide groove.

[0007] Preferably, the fixed plate lifting mechanism includes a first turntable, an outer wall of the first turntable is adjacent to the main body, the outer wall of the first turntable is fixedly connected to the rotating rod, the other end of the rotating rod is fixedly connected to the stud, the other end of the stud is rotatably connected to the inner wall of the main body through a pin and a bracket, the outer wall of the stud is threadedly connected to two nuts, the outer walls of the two nuts are fixedly connected to the first rack, the outer walls of the two first racks are meshedly connected to the two first gears, the outer walls of the two first gears are rotatably connected to the main body through a pin, the upper ends of the two first gears are fixedly connected to the roller, and the outer wall of the roller is slidably connected to the slider through a slide groove.

[0008] Preferably, the chip fixing mechanism includes a second turntable, the outer wall of the second turntable is adjacent to the outer wall of the shell, the outer wall of the second turntable is fixedly connected to the worm, the outer wall of the worm is meshingly connected to the worm wheel, the outer wall of the worm wheel is rotatably connected to the shell through a pin shaft, the outer wall of the worm wheel is fixedly connected to the second gear, the outer wall of the second gear is meshingly connected to two second racks, and the outer walls of the two second racks are fixedly connected to the clamping plate.

[0009] Preferably, the outer walls of the two clamping plates are slidably connected to the shell through a sliding groove, and the outer walls of the two clamping plates penetrate the shell through the sliding groove.

[0010] Preferably, the upper ends of the two sliding blocks are fixedly connected to one ends of the two supporting rods, and the other ends of the two supporting rods are fixedly connected to the fixing plate.

[0011] Preferably, the outer walls of the two clamping plates are provided with soft pads, and the outer walls of the two clamping plates are fitted to the chip through the soft pads.

[0012] The utility model proposes a novel IC chip testing fixture, which has the beneficial effect that: through the cooperation of the main body and the fixed plate lifting mechanism, the first turntable drives the rotating rod to rotate, the rotating rod drives the stud to rotate, the stud drives the nut to rotate, the nut drives the first rack to move, the first rack drives the first gear to rotate, the first gear drives the roller to rotate, the roller drives the slider to move, the slider drives the support rod to move, and the support rod drives the fixed plate to move. Through the above method, the fixed plate can drive the chip to move to a suitable height, which improves the working quality of the chip testing fixture.

[0013] Through the cooperation of the shell and the chip fixing mechanism, the second turntable drives the worm to rotate, the worm drives the worm wheel to rotate, the worm wheel drives the second gear to rotate, the second gear drives the second rack to move, and the second rack drives the clamping plate to move. Through the above method, the clamping plate is fitted with the chip through the soft pad to prevent the chip from falling, which reduces the working cost of the chip testing fixture. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 It is a schematic diagram of the structure of the utility model;

[0015] Figure 2 for Figure 1 A schematic front cross-sectional view of

[0016] Figure 3 for Figure 2 A schematic top view of the cross-section of the middle shell;

[0017] Figure 4 for Figure 1 A top cross-sectional schematic diagram of ;

[0018] Figure 5 for Figure 3 A side cross-sectional schematic diagram of .

[0019] In the figure: 1. main body, 2. fixed plate lifting mechanism, 201. first turntable, 202. rotating rod, 203. stud, 204. nut, 205. first rack, 206. first gear, 207. roller, 208. slider, 3. fixed plate, 4. shell, 5. chip fixing mechanism, 501. second turntable, 502. worm, 503. worm wheel, 504. second gear, 505. second rack, 6. clamping plate, 7. cushion, 8. support rod. DETAILED DESCRIPTION

[0020] The utility model is further described below in conjunction with the accompanying drawings:

[0021] Refer to the attached Figure 1-5 : In this embodiment, a new type of IC chip testing fixture includes a main body 1, the inner wall of the main body 1 is provided with a fixed plate lifting mechanism 2, the upper end of the main body 1 is adjacent to the fixed plate 3, the upper surface of the fixed plate 3 is fixedly connected to the shell 4, the fixed plate 3 fixes the position of the shell 4, and the inner wall of the shell 4 is provided with a chip fixing mechanism 5, the upper surface of the fixed plate 3 is slidably connected to the clamping plate 6 through a slide groove, the clamping plate 6 moves on the fixed plate 3, the outer walls of the two clamping plates 6 are slidably connected to the shell 4 through the slide groove, the clamping plate 6 slides on the shell 4, the outer walls of the two clamping plates 6 pass through the shell 4 through the slide groove, the upper ends of the two sliders 208 are fixedly connected to one end of the two support rods 8, the slider 208 drives the support rod 8 to move, the other ends of the two support rods 8 are fixedly connected to the fixed plate 3, the support rod 8 drives the fixed plate 3 to move, the outer walls of the two clamping plates 6 are installed with soft pads 7, the outer walls of the two clamping plates 6 are in contact with the chip through the soft pads 7, and the clamping plates 6 clamp the chip to prevent the chip from moving.

[0022] Refer to the attached Figure 2 and Figure 4: In this embodiment, a new type of IC chip testing fixture, the fixed plate lifting mechanism 2 includes a first turntable 201, the outer wall of the first turntable 201 is adjacent to the main body 1, the first turntable 201 rotates on the main body 1, the outer wall of the first turntable 201 is fixedly connected to the rotating rod 202, the first turntable 201 drives the rotating rod 202 to rotate, the other end of the rotating rod 202 is fixedly connected to the stud 203, the rotating rod 202 drives the stud 203 to rotate, the other end of the stud 203 is rotatably connected to the inner wall of the main body 1 through a pin and a bracket, the stud 203 rotates in the main body 1, the outer wall of the stud 203 is threadedly connected to two nuts 204, the stud The column 203 drives the nut 204 to move, the outer walls of the two nuts 204 are fixedly connected to the first rack 205, the nut 204 drives the first rack 205 to move, the outer walls of the two first racks 205 are meshed and connected with the two first gears 206, the first rack 205 drives the first gear 206 to move, the outer walls of the two first gears 206 are rotatably connected to the main body 1 through the pin shaft, the first gear 206 rotates on the main body 1, the upper ends of the two first gears 206 are fixedly connected to the roller 207, the first gear 206 drives the roller 207 to rotate, the outer wall of the roller 207 is slidably connected to the slider 208 through the slide groove, and the roller 207 drives the slider 208 to move.

[0023] See attached Figure 3 and Figure 5 : In this embodiment, a new type of IC chip testing fixture is provided, and the chip fixing mechanism 5 includes a second turntable 501, the outer wall of the second turntable 501 is adjacent to the outer wall of the shell 4, the second turntable 501 rotates on the shell 4, the outer wall of the second turntable 501 is fixedly connected to the worm 502, the second turntable 501 drives the worm 502 to rotate, the outer wall of the worm 502 is meshed and connected with the worm wheel 503, the worm 502 drives the worm wheel 503 to rotate, the outer wall of the worm wheel 503 is rotationally connected to the shell 4 through a pin shaft, the worm wheel 503 rotates on the shell 4, the outer wall of the worm wheel 503 is fixedly connected to the second gear 504, the worm wheel 503 drives the second gear 504 to rotate, the outer wall of the second gear 504 is meshed and connected with two second racks 505, the second gear 504 drives the second rack 505 to move, the outer walls of the two second racks 505 are fixedly connected to the clamping plate 6, and the second rack 505 drives the clamping plate 6 to move.

[0024] Working principle:

[0025] When using this new IC chip test fixture:

[0026] Chip fixing stage:

[0027] The operator first places the chip to be tested on the fixed plate 3, and then rotates the second turntable 501, the second turntable 501 drives the worm 502 to rotate, the worm 502 drives the worm wheel 503 to rotate, the worm wheel 503 drives the second gear 504 to rotate, the second gear 504 drives the second rack 505 to move, the second rack 505 drives the clamping plate 6 to move, and after the clamping plate 6 is fitted with the chip through the soft pad 7, the operator stops rotating the second turntable 501.

[0028] Adjustment phase:

[0029] After the chip is fixed, the operator tests the IC chip. When the height of the chip needs to be tested, the operator rotates the first turntable 201, the first turntable 201 drives the rotating rod 202 to rotate, the rotating rod 202 drives the stud 203 to rotate, the stud 203 drives the nut 204 to rotate, the nut 204 drives the first rack 205 to move, the first rack 205 drives the first gear 206 to rotate, the first gear 206 drives the roller 207 to rotate, the roller 207 drives the slider 208 to move, the slider 208 drives the support rod 8 to move, the support rod 8 drives the fixed plate 3 to move, and after the fixed plate 3 drives the chip to move to a suitable height, the operator stops rotating the first turntable 201 to complete the height adjustment of the chip, thereby completing the detection of the IC chip.

[0030] Although the present invention has been shown and described with reference to the preferred embodiments, it will be understood by those skilled in the art that various changes in form and details may be made therein within the scope of the claims.

Claims

1. A novel IC chip testing fixture, comprising a main body (1), characterized in that: The inner wall of the main body (1) is provided with a fixed plate lifting mechanism (2), the upper end of the main body (1) is adjacent to the fixed plate (3), the upper surface of the fixed plate (3) is fixedly connected to the shell (4), the inner wall of the shell (4) is provided with a chip fixing mechanism (5), the upper surface of the fixed plate (3) is slidably connected to the clamping plate (6) through a sliding groove, and the fixed plate lifting mechanism (2) includes a first turntable (201), the outer wall of the first turntable (201) is adjacent to the main body (1) The outer wall of the first rotating disk (201) is fixedly connected to the rotating rod (202), the other end of the rotating rod (202) is fixedly connected to the stud (203), the other end of the stud (203) is rotatably connected to the inner wall of the main body (1) through a pin shaft and a bracket, the outer wall of the stud (203) is threadedly connected to two nuts (204), the outer walls of the two nuts (204) are fixedly connected to the first rack (205), the outer walls of the two first racks (205) are meshedly connected to the two first gears (206), the outer walls of the two first gears (206) are rotatably connected to the main body (1) through a pin shaft, the upper ends of the two first gears (206) are fixedly connected to the roller (207), the outer wall of the roller (207) is slidably connected to the slider (208) through a sliding groove, the chip fixing mechanism (5) comprises a second rotating disk (501), the outer wall of the second rotating disk (501) is adjacent to the outer wall of the shell (4), the The outer wall of the second rotating disk (501) is fixedly connected to the worm (502), the outer wall of the worm (502) is meshedly connected to the worm wheel (503), the outer wall of the worm wheel (503) is rotationally connected to the housing (4) via a pin shaft, the outer wall of the worm wheel (503) is fixedly connected to the second gear (504), the outer wall of the second gear (504) is meshedly connected to two second racks (505), and the outer walls of the two second racks (505) are fixedly connected to the clamping plate (6).

2. A novel IC chip test fixture according to claim 1, characterized in that: The outer walls of the two clamping plates (6) are slidably connected to the housing (4) via a sliding groove, and the outer walls of the two clamping plates (6) penetrate the housing (4) via the sliding groove.

3. A novel IC chip testing fixture according to claim 2, characterized in that: The upper ends of the two sliding blocks (208) are fixedly connected to one end of the two support rods (8), and the other ends of the two support rods (8) are fixedly connected to the fixing plate (3).

4. A novel IC chip testing fixture according to claim 3, characterized in that: The outer walls of the two clamping plates (6) are provided with soft pads (7), and the outer walls of the two clamping plates (6) are fitted to the chip via the soft pads (7).

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