Impedance debugging system

Abstract

The utility model provides an impedance debugging system, and relates to the technical field of radio frequency. The impedance debugging system comprises a first impedance adjusting device, a test device and a controller, the first impedance adjusting device is connected in series between a first circuit unit and a second circuit unit in an impedance matching circuit to be debugged, a control end of the first impedance adjusting device is connected with a first output end of the controller, and a control end of the test device is connected with a second output end of the controller. The input end of the test device is connected with a preset impedance detection point between the first circuit unit and the second circuit unit, and the output end of the test device is connected with the input end of the controller. By adopting the impedance debugging system provided by the invention, the impedance debugging of the impedance matching circuit to be debugged can be realized, the reactance element welded on the printed circuit board does not need to be replaced for multiple times, and the problem that the printed circuit board is easy to damage due to multiple welding is avoided.

Description

Technical Field

[0001] The present application relates to the field of radio frequency technology, and in particular to an impedance debugging system. Background Art

[0002] In RF circuit design and testing, impedance matching refers to a working state in which the internal impedance of the RF excitation source and the load impedance are adapted to each other to obtain maximum power output. Impedance matching debugging is of great significance to the performance of RF circuits.

[0003] Currently, when performing impedance matching debugging on RF circuits, in order to adjust the internal impedance of the RF excitation source, the staff needs to replace the reactance components welded on the printed circuit board multiple times, which is time-consuming and labor-intensive, and multiple welding carries the risk of damaging the printed circuit board. Utility Model Content

[0004] The purpose of this application is to provide an impedance debugging system to solve the problems existing in the prior art in view of the deficiencies in the prior art.

[0005] To achieve the above purpose, the technical solution adopted in the embodiment of the present application is as follows:

[0006] An embodiment of the present application provides an impedance debugging system, including: a first impedance adjustment device, a test device and a controller, wherein the first impedance adjustment device is connected in series between a first circuit unit and a second circuit unit in an impedance matching circuit to be debugged, a control end of the first impedance adjustment device is connected to a first output end of the controller, an input end of the test device is connected to a preset impedance detection point between the first circuit unit and the second circuit unit, and an output end of the test device is connected to an input end of the controller.

[0007] In one embodiment, the impedance debugging system further includes: a second impedance adjustment device;

[0008] The second impedance adjusting device is connected in parallel with the first circuit unit, and a control end of the second impedance adjusting device is connected to a second output end of the controller.

[0009] In one embodiment, the impedance debugging system further includes: a third impedance adjustment device;

[0010] The third impedance adjustment device is connected in parallel with the second circuit unit, and a control end of the third impedance adjustment device is connected to a third output end of the controller.

[0011] In one embodiment, the first impedance adjustment device comprises: a plurality of first switch units, a plurality of first impedance units and a plurality of second switch units, and the impedance values ​​of the plurality of first impedance units are different;

[0012] One ends of the plurality of first switch units are connected to the first circuit unit, the other ends of the plurality of first switch units are connected to one ends of the plurality of second switch units through the plurality of first impedance units, and the other ends of the plurality of second switch units are connected to the second circuit unit;

[0013] The control ends of the first switch units and the control ends of the second switch units are both connected to the first output end of the controller.

[0014] In one embodiment, each of the first impedance units includes: a capacitor unit, an inductor unit, or a capacitor-inductor unit, wherein the capacitor-inductor unit is a series or parallel structure of a capacitor unit and an inductor unit.

[0015] In one embodiment, the second impedance adjustment device comprises: a plurality of third switch units and a plurality of second impedance units, wherein the impedance values ​​of the plurality of second impedance units are different;

[0016] One ends of the plurality of third switch units are connected to the first circuit unit, and the other ends of the plurality of third switch units are grounded through the plurality of second impedance units respectively;

[0017] The control ends of the plurality of third switch units are connected to the second output end of the controller.

[0018] In one embodiment, each of the second impedance units includes: a capacitor unit, an inductor unit, or a capacitor-inductor unit, wherein the capacitor-inductor unit is a series or parallel structure of a capacitor unit and an inductor unit.

[0019] In one embodiment, the third impedance adjustment device comprises: a plurality of fourth switch units and a plurality of third impedance units, wherein the impedance values ​​of the plurality of third impedance units are different;

[0020] One ends of the plurality of fourth switch units are connected to the second circuit unit, and the other ends of the plurality of fourth switch units are grounded through the plurality of third impedance units respectively;

[0021] The control ends of the plurality of fourth switch units are connected to the third output end of the controller.

[0022] In one embodiment, each of the third impedance units includes: a capacitor unit, an inductor unit, or a capacitor-inductor unit, wherein the capacitor-inductor unit is a series or parallel structure of a capacitor unit and an inductor unit.

[0023] In one embodiment, both the first circuit unit and the second circuit unit are active circuit units; or both the first circuit unit and the second circuit unit are passive circuit units.

[0024] The beneficial effect of the present application is as follows: the present application provides an impedance debugging system. By adopting the impedance debugging system provided by the present application, the impedance debugging of the impedance matching circuit to be debugged can be achieved by changing the impedance value of the impedance adjusting device, without the need to repeatedly replace the reactance elements welded on the printed circuit board, thus avoiding the problem of multiple welding easily damaging the printed circuit board. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0026] Figure 1 This is one of the structural schematic diagrams of the impedance debugging system provided in one embodiment of the present application;

[0027] Figure 2 A schematic diagram of the structure of a first impedance adjustment device provided in an embodiment of the present application;

[0028] Figure 3 The second structural diagram of the impedance debugging system provided in one embodiment of the present application;

[0029] Figure 4 A schematic diagram of the structure of a second impedance adjustment device provided in one embodiment of the present application;

[0030] Figure 5 The third structural diagram of the impedance debugging system provided in one embodiment of the present application;

[0031] Figure 6 A schematic structural diagram of a third impedance adjustment device provided in one embodiment of the present application.

[0032] Explanation of the accompanying drawings: 1. First impedance adjustment device; 2. Test equipment; 11. First switch unit; 12. First impedance unit; 13. Second switch unit; 3. Controller; 4. Second impedance adjustment device; 41. Third switch unit; 42. Second impedance unit; 5. Third impedance adjustment device; 51. Fourth switch unit; 52. Third impedance unit. DETAILED DESCRIPTION

[0033] In order to make the purpose, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below in combination with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments.

[0034] Therefore, the following detailed description of the embodiments of the present application provided in the accompanying drawings is not intended to limit the scope of the present application for which protection is sought, but merely represents selected embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the field without creative work are within the scope of protection of the present application.

[0035] In the description of the present application, it should be noted that if the terms "upper", "lower", etc. appear, the orientation or position relationship indicated is based on the orientation or position relationship shown in the drawings, or is the orientation or position relationship in which the product of the application is usually placed when used. It is only for the convenience of describing the present application and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present application.

[0036] In addition, the terms "first", "second", etc. in the specification and claims of the present application and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequential order. It should be understood that the data used in this way can be interchangeable where appropriate, so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any of their variations are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device comprising a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0037] In the description of this application, it should also be noted that, unless otherwise clearly specified and limited, the terms "disposed" and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection, it can be a direct connection, it can be an indirect connection through an intermediate medium, and it can be the internal communication of two elements. For those skilled in the art, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0038] It should be noted that, in the absence of conflict, the features in the embodiments of the present application may be combined with each other.

[0039] Impedance matching is a part of microwave electronics, which refers to a state in which all high-frequency microwave signals can be transmitted to the load point, and almost no signal is reflected back to the source point, which is energy-efficient. Taking the RF circuit as an example, when the load impedance is conjugate with the impedance of the excitation source under the condition of a given excitation source, the maximum transmission of RF circuit power can be achieved. If the load impedance does not meet the conjugate matching conditions, it is necessary to replace the inductive element between the load and the excitation source, and transform the load impedance into the conjugate of the excitation source impedance to achieve impedance matching of the RF circuit. In the existing scheme, during the impedance matching debugging process, the staff needs to manually replace the inductive elements welded on the printed circuit board many times, which is time-consuming and laborious, and there is a risk of damaging the printed circuit board due to multiple welding.

[0040] Therefore, the present application provides an impedance debugging system, which can be used to achieve impedance debugging of an impedance matching circuit to be debugged by changing the impedance value of an impedance adjustment device, thereby solving the problems existing in the prior art.

[0041] The impedance debugging system provided by the present application is specifically described below through multiple examples in conjunction with the accompanying drawings.

[0042] Figure 1 A schematic diagram of the structure of an impedance debugging system provided in an embodiment of the present application is shown in FIG. Figure 1 As shown, the impedance debugging system includes: a first impedance adjusting device 1, a test device 2 and a controller 3, wherein the first impedance adjusting device is connected in series between a first circuit unit and a second circuit unit in an impedance matching circuit to be debugged, a control end of the first impedance adjusting device is connected to a first output end of the controller, an input end of the test device is connected to a preset impedance detection point between the first circuit unit and the second circuit unit, and an output end of the test device is connected to an input end of the controller.

[0043] Among them, the controller can be, for example, a computer, a server or other device with processing and computing capabilities. The controller can receive test data obtained by the test equipment through the connection between its input terminal and the test equipment; the preset impedance detection point is any position between the first circuit unit and the second circuit unit. As long as the test equipment can obtain the impedance value on the connection path between the first circuit unit and the second circuit unit through the preset impedance detection point (that is, the impedance value of the first impedance adjustment device), no specific restriction is made on the position of the preset impedance detection point.

[0044] The first circuit unit of this embodiment may be, for example, a load circuit in an impedance matching circuit to be debugged, and the second circuit unit may be, for example, an excitation source circuit in the impedance matching circuit to be debugged. The first impedance adjustment device is connected in series between the first circuit unit and the second circuit unit in the impedance matching circuit to be debugged, and the impedance value of the first impedance adjustment device is adjustable. By adjusting the impedance value of the first impedance adjustment device, the impedance of the first circuit unit can be conjugate with the impedance of the second circuit unit, thereby achieving impedance matching of the impedance matching circuit to be debugged.

[0045] Specifically: the control end of the first impedance adjusting device is connected to the first output end of the controller, and the controller can adjust the impedance value of the first impedance adjusting device through the connection between its first output end and the control end of the first impedance adjusting device; the input end of the test equipment is connected to the preset impedance detection point between the first circuit unit and the second circuit unit, through which the test equipment can test and obtain the impedance value on the connection path between the first circuit unit and the second circuit unit (that is, the impedance value of the first impedance adjusting device); the output end of the test equipment is connected to the input end of the controller, through which the test equipment can send the impedance value of the first impedance adjusting device to the controller.

[0046] In actual operation, the controller continuously adjusts the impedance value of the first impedance adjustment device, the test equipment obtains the impedance value of the first impedance adjustment device in real time, and sends the obtained test data to the controller. When the controller confirms that the impedance value obtained by the test equipment matches the target value, it is considered that the impedance matching circuit to be debugged has achieved impedance matching, and stops adjusting the impedance value of the first impedance adjustment device to keep the first impedance adjustment device in the current state and the impedance matching circuit maintains the impedance matching state.

[0047] Among them, the target value is a preset impedance value, which can transform the load impedance into the conjugate of the excitation source impedance; the test equipment can be a comprehensive tester, a vector network analyzer or other equipment. For example, when the impedance matching circuit to be debugged is an active circuit, the first circuit unit and the second circuit unit are both active circuit units, and the test equipment is a comprehensive tester; or, when the impedance matching circuit to be debugged is a passive circuit, the first circuit unit and the second circuit unit are both passive circuit units, and the test equipment is a vector network analyzer.

[0048] In summary, this embodiment provides an impedance debugging system. By adopting the impedance debugging system of this embodiment, the impedance debugging of the impedance matching circuit to be debugged can be achieved by changing the impedance value of the impedance adjustment device. There is no need to replace the inductive elements welded on the printed circuit board multiple times, thus avoiding the problem of multiple welding easily damaging the printed circuit board.

[0049] Figure 2A schematic diagram of the structure of a first impedance adjustment device provided in an embodiment of the present application is shown in FIG. Figure 2 As shown, the first impedance adjustment device may include a plurality of first switch units 11 , a plurality of first impedance units 12 and a plurality of second switch units 13 .

[0050] exist Figure 2 In the first impedance adjustment device shown, the impedance values ​​of the plurality of first impedance units are different, and the first impedance unit may include a capacitor unit, an inductor unit, or a capacitor-inductor unit, wherein the capacitor-inductor unit is a series or parallel structure of a capacitor unit and an inductor unit.

[0051] One end of the plurality of first switch units is connected to the first circuit unit, the other end of the plurality of first switch units is respectively connected to one end of the plurality of second switch units through the plurality of first impedance units, the other end of the plurality of second switch units is connected to the second circuit unit, and the control end of the plurality of first switch units and the control end of the plurality of second switch units are both connected to the first output end of the controller. The controller can control the conduction or closing of the first switch unit and the second switch unit corresponding to each first impedance unit through the connection between its first output end and the control end of the switch unit, thereby realizing the connection or disconnection of the first impedance unit in the circuit. Since the impedance values ​​of the plurality of first impedance units are different, the combination of the plurality of first impedance units can be realized through the connection or disconnection of the plurality of first impedance units in the circuit, thereby realizing the adjustment of the impedance value of the element between the first circuit unit and the second circuit unit connected in series in the impedance matching circuit to be debugged, so that the impedance matching circuit to be debugged achieves impedance matching.

[0052] Since impedance matching is also related to the impedance value of the parallel element, the present application also provides an implementation method for debugging the impedance value of the parallel element. Figure 3 and Figure 5 shown.

[0053] Figure 3 The second structural diagram of the impedance debugging system provided in one embodiment of the present application is as follows: Figure 3 As shown, the impedance debugging system may further include a second impedance adjusting device 4, which is connected in parallel with the first circuit unit, and a control end of the second impedance adjusting device is connected to a second output end of the controller, and the impedance value of the second impedance adjusting device is adjustable. By adjusting the impedance value of the second impedance adjusting device, the impedance value of the element connected in parallel with the first circuit unit can be adjusted.

[0054] Specifically, Figure 4 This is a schematic diagram of the structure of a second impedance adjustment device provided in an embodiment of the present application, such as Figure 4 As shown, the second impedance adjustment device includes a plurality of third switch units 41 and a plurality of second impedance units 42. Figure 4In the second impedance adjustment device shown, the impedance values ​​of the plurality of second impedance units are different, and the second impedance unit may include a capacitor unit, an inductor unit, or a capacitor-inductor unit, wherein the capacitor-inductor unit is a series or parallel structure of a capacitor unit and an inductor unit.

[0055] In specific operations, one end of the multiple third switch units is connected to the first circuit unit, the other ends of the multiple third switch units are grounded through the multiple second impedance units respectively, and the control ends of the multiple third switch units are connected to the second output end of the controller. The controller can control the conduction or disconnection of the third switch units through the connection between its second output end and the control end of the third switch unit, thereby realizing the adjustment of the impedance value of the element connected in parallel with the first circuit unit. When performing impedance matching debugging on the impedance matching circuit to be debugged, the first impedance adjustment device and the second impedance adjustment device can be adjusted at the same time, so that the impedance debugging system of the present application is more perfect.

[0056] exist Figure 3 and Figure 4 In the illustrated embodiment, the test device obtains the impedance value on the connection path between the first circuit unit and the second circuit unit, which means that the test device obtains the impedance value after the first impedance adjustment device and the second impedance adjustment device are connected in parallel.

[0057] Figure 5 The third structural diagram of the impedance debugging system provided in one embodiment of the present application is as follows: Figure 5 As shown, the impedance debugging system may further include a third impedance adjusting device 5, which is connected in parallel with the second circuit unit, wherein the control end of the third impedance adjusting device is connected to the third output end of the controller, and the impedance value of the third impedance adjusting device is adjustable. By adjusting the impedance value of the third impedance adjusting device, the impedance value of the element connected in parallel with the second circuit unit can be adjusted.

[0058] Specifically, Figure 6 This is a structural schematic diagram of a third impedance adjustment device provided in an embodiment of the present application, wherein the third impedance adjustment device includes a plurality of fourth switch units 51 and a plurality of third impedance units 52, wherein the impedance values ​​of the plurality of third impedance units are different, and the third impedance unit may include a capacitor unit, an inductor unit, or a capacitor-inductor unit, wherein the capacitor-inductor unit is a series or parallel structure of a capacitor unit and an inductor unit.

[0059] In specific operations, one end of the multiple fourth switch units is connected to the second circuit unit, the other ends of the multiple fourth switch units are grounded through multiple third impedance units respectively, and the control ends of the multiple fourth switch units are connected to the third output end of the controller. The controller can control the conduction or disconnection of the fourth switch units through the connection between its third output end and the control end of the fourth switch unit, thereby realizing the adjustment of the impedance value of the element in parallel with the second circuit unit. When performing impedance matching debugging on the impedance matching circuit to be debugged, the first impedance adjustment device, the second impedance adjustment device and the third impedance adjustment device can be adjusted at the same time, so that the impedance debugging system of the present application is more perfect.

[0060] exist Figure 5 and Figure 6 In the illustrated embodiment, the test device obtains the impedance value on the connection path between the first circuit unit and the second circuit unit, which means that the test device obtains the impedance value after the first impedance adjustment device is connected in parallel with the second impedance adjustment device and the third impedance adjustment device.

[0061] The above are only specific implementations of the present application, but the protection scope of the present application is not limited thereto. Any changes or substitutions that can be easily thought of by a person skilled in the art within the technical scope disclosed in the present application should be included in the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.

Claims

1. An impedance debugging system, characterized in that: include: A first impedance adjustment device, a test device and a controller, wherein the first impedance adjustment device is connected in series between a first circuit unit and a second circuit unit in an impedance matching circuit to be debugged, a control end of the first impedance adjustment device is connected to a first output end of the controller, an input end of the test device is connected to a preset impedance detection point between the first circuit unit and the second circuit unit, and an output end of the test device is connected to an input end of the controller.

2. The impedance debugging system according to claim 1, characterized in that: The impedance debugging system further includes: a second impedance adjustment device; The second impedance adjusting device is connected in parallel with the first circuit unit, and a control end of the second impedance adjusting device is connected to a second output end of the controller.

3. The impedance debugging system according to claim 2, characterized in that: The impedance debugging system further includes: a third impedance adjustment device; The third impedance adjustment device is connected in parallel with the second circuit unit, and a control end of the third impedance adjustment device is connected to a third output end of the controller.

4. The impedance debugging system according to claim 1, characterized in that: The first impedance adjustment device comprises: a plurality of first switch units, a plurality of first impedance units and a plurality of second switch units, wherein the impedance values ​​of the plurality of first impedance units are different; One ends of the plurality of first switch units are connected to the first circuit unit, the other ends of the plurality of first switch units are connected to one ends of the plurality of second switch units through the plurality of first impedance units, and the other ends of the plurality of second switch units are connected to the second circuit unit; The control ends of the first switch units and the control ends of the second switch units are both connected to the first output end of the controller.

5. The impedance debugging system according to claim 4, characterized in that: Each of the first impedance units includes: a capacitor unit, an inductor unit, or a capacitor-inductor unit, wherein the capacitor-inductor unit is a series or parallel structure of a capacitor unit and an inductor unit.

6. The impedance debugging system according to claim 2, characterized in that: The second impedance adjustment device comprises: a plurality of third switch units and a plurality of second impedance units, wherein the impedance values ​​of the plurality of second impedance units are different; One ends of the plurality of third switch units are connected to the first circuit unit, and the other ends of the plurality of third switch units are grounded through the plurality of second impedance units respectively; The control ends of the plurality of third switch units are connected to the second output end of the controller.

7. The impedance debugging system according to claim 6, characterized in that: Each of the second impedance units includes: a capacitor unit, an inductor unit, or a capacitor-inductor unit, wherein the capacitor-inductor unit is a series or parallel structure of a capacitor unit and an inductor unit.

8. The impedance debugging system according to claim 3, characterized in that: The third impedance adjustment device comprises: a plurality of fourth switch units and a plurality of third impedance units, wherein the impedance values ​​of the plurality of third impedance units are different; One ends of the plurality of fourth switch units are connected to the second circuit unit, and the other ends of the plurality of fourth switch units are grounded through the plurality of third impedance units respectively; The control ends of the plurality of fourth switch units are connected to the third output end of the controller.

9. The impedance debugging system according to claim 8, characterized in that: Each of the third impedance units includes: a capacitor unit, an inductor unit, or a capacitor-inductor unit, wherein the capacitor-inductor unit is a series or parallel structure of a capacitor unit and an inductor unit.

10. The impedance debugging system according to any one of claims 1 to 9, characterized in that: The first circuit unit and the second circuit unit are both active circuit units; or, the first circuit unit and the second circuit unit are both passive circuit units.

Images