Power supply test circuit suitable for chip

Abstract

The utility model relates to a power supply test circuit suitable for a chip, comprising a chip to be tested and a PCB used for placing the chip to be tested, the PCB is connected with a main power supply test module, a power supply calibration module, a power supply high-precision test module and a single-ended impedance test module, the input end of the main power supply test module is connected with the power supply output end of a chip to be tested, the calibration output end of the chip to be tested is connected with the input end of the power supply calibration module through a digital channel, and the high-precision output end of the chip to be tested is connected with the input end of the power supply high-precision test module through an analog channel. The output end of the chip to be tested is connected with the input end of the single-ended impedance test module through a digital channel. According to the utility model, the test accuracy can be improved.

Description

Technical Field

[0001] The utility model relates to the field of chip testing, in particular to a power supply testing circuit suitable for chips. Background Art

[0002] Integrated Circuit (IC) is small in size and powerful in function. It is one of the indispensable electronic components of information equipment. In order to ensure the normal function of the chip, the chip must undergo rigorous testing before leaving the factory. The general testing method is to input a known test signal into the circuit in the chip, and then obtain the feedback signal of the chip circuit to determine whether the chip function is normal.

[0003] After searching, the patent: A test device and test system (CN202021791169.0), test circuit, power supply circuit, detection circuit and processing circuit, the test circuit connects the chip to be tested and the detection circuit, the processing circuit connects the detection circuit, the power supply circuit connects the test circuit, the detection circuit and the processing circuit respectively; the processing circuit controls the power supply circuit to output a first voltage to the chip to be tested through the test circuit, and the test circuit performs a system test on the chip to be tested at the first voltage; the processing circuit controls the power supply circuit to output a second voltage to the chip to be tested through the detection circuit to replace the first voltage, the test circuit performs a system test on the chip to be tested at the second voltage, the chip to be tested performs a voltage deviation limit test at the second voltage, and the detection circuit detects the electrical signal state of the chip to be tested. The above-mentioned power supply test is not highly accurate, which may lead to the accuracy of the test.

[0004] In view of the above-mentioned defects, the designers have actively carried out research and innovation in order to create a new structure of power supply test circuit suitable for chips, making it more valuable for industrial use. Utility Model Content

[0005] In order to solve the above technical problems, the purpose of the utility model is to provide a power supply test circuit suitable for a chip.

[0006] In order to achieve the above purpose, the utility model adopts the following technical solutions:

[0007] A power supply test circuit suitable for a chip comprises a chip to be tested and a PCB board for placing the chip to be tested, wherein a main power supply test module, a power supply calibration module, a power supply high-precision test module and a single-ended impedance test module are connected to the PCB board, an input end of the main power supply test module is connected to a power supply output end of the chip to be tested, a calibration output end of the chip to be tested is connected to an input end of the power supply calibration module through a digital channel, a high-precision output end of the chip to be tested is connected to an input end of the high-precision power supply test module through an analog channel, and an output end of the chip to be tested is connected to an input end of the single-ended impedance test module through a digital channel.

[0008] Preferably, in the power supply test circuit suitable for a chip, the main power supply test module includes power supply tests of AGND and DGND.

[0009] Preferably, in the power supply test circuit suitable for a chip, the chip model used by the power supply calibration module is REF5025AIDR.

[0010] Preferably, in the power supply test circuit suitable for a chip, the power supply high-precision test module includes a first voltage conversion module and a second voltage conversion module, the high-precision output end of the chip to be tested is connected to the input end of the first voltage conversion module through an analog channel, and the output end of the first voltage conversion module is connected to the input end of the second voltage conversion module.

[0011] Preferably, the power supply test circuit suitable for a chip is characterized in that the voltage range of the first voltage conversion module is 5V to 15V.

[0012] Preferably, the power supply test circuit suitable for a chip is characterized in that the chip model used by the first voltage conversion module is ADP7182AUJZ-R7.

[0013] Preferably, the power supply test circuit suitable for a chip is characterized in that the voltage of the second voltage conversion module is 10V.

[0014] By means of the above solution, the utility model has at least the following advantages:

[0015] The utility model can realize accurate testing of power supply and improve the accuracy of testing.

[0016] The above description is only an overview of the technical solution of the utility model. In order to more clearly understand the technical means of the utility model and implement it according to the contents of the specification, the following is a detailed description of the preferred embodiments of the utility model in conjunction with the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions of the embodiments of the utility model, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the utility model and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without paying creative work.

[0018] Figure 1 It is a principle block diagram of the utility model;

[0019] Figure 2It is a circuit diagram of the main power supply test module of the utility model;

[0020] Figure 3 It is a circuit diagram of the power calibration module of the utility model;

[0021] Figure 4 It is a circuit diagram of the first voltage conversion module of the utility model;

[0022] Figure 5 It is a circuit diagram of the second voltage conversion module of the utility model;

[0023] Figure 6 It is a circuit diagram of a single-ended impedance test module of the utility model. DETAILED DESCRIPTION

[0024] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, rather than all the embodiments. The components of the embodiments of the present application described and shown in the drawings here can be arranged and designed in various different configurations.

[0025] Therefore, the following detailed description of the embodiments of the present application provided in the accompanying drawings is not intended to limit the scope of the present application for which protection is sought, but merely represents selected embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the field without creative work are within the scope of protection of the present application.

[0026] Example

[0027] like Figure 1 As shown, a power supply test circuit suitable for a chip includes a chip to be tested 1, and also includes a PCB board 2 for placing the chip to be tested 1, the PCB board 2 is connected with a main power supply test module 3, a power supply calibration module 4, a power supply high-precision test module 5 and a single-ended impedance test module 6, the input end of the main power supply test module 3 is connected to the power supply output end of the chip to be tested 1, the calibration output end of the chip to be tested 1 is connected to the input end of the power supply calibration module 4 through a digital channel, the high-precision output end of the chip to be tested 1 is connected to the input end of the high-precision power supply test module 5 through an analog channel, and the output end of the chip to be tested 1 is connected to the input end of the single-ended impedance test module 6 through a digital channel.

[0028] like Figure 2 As shown, the main power supply test module 3 of the present invention includes power supply tests of AGND and DGND, which are tested separately and directly connected to a tester (an existing device known in the art).

[0029] like Figure 3 As shown, the chip model used by the power calibration module 4 in the present invention is REF5025AIDR.

[0030] like Figure 4 and Figure 5 As shown, the power supply high-precision test module 5 in the utility model includes a first voltage conversion module 51 and a second voltage conversion module 52. The high-precision output end of the chip to be tested 1 is connected to the input end of the first voltage conversion module 51 through an analog channel, and the output end of the first voltage conversion module 51 is connected to the input end of the second voltage conversion module 52;

[0031] The voltage range of the first voltage conversion module 51 is 5V to 15V, and the chip model used by the first voltage conversion module 51 is ADP7182AUJZ-R7;

[0032] In the present invention, the voltage of the second voltage conversion module 52 is 10V, which is converted through the first voltage conversion module (5V-15V) and then through the comparison chip (OP484ES) of the second voltage conversion module to achieve high-precision voltage testing.

[0033] like Figure 6 As shown, the single-ended impedance test module 6 in the present invention adopts 50 ohm single-ended impedance for testing.

[0034] The working principle of the utility model is as follows:

[0035] During the specific work, the product (chip) is tested on the different functional modules on the PCB board, and a tester is used to display the corresponding results. Finally, the product is judged based on the test results.

[0036] The chip testing operation of the present invention is an existing operation known to those skilled in the art, and no further description will be given.

[0037] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0038] In the description of this application, it should be noted that the terms "vertical", "horizontal", "inside", "outside", etc. indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, or the positions or positional relationships in which the product of the application is usually placed when in use. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on this application. In addition, the terms "first", "second", etc. are only used to distinguish the description, and cannot be understood as indicating or implying relative importance.

[0039] In addition, the terms "horizontal", "vertical" and the like do not mean that the components are required to be absolutely horizontal or vertical, but can be slightly tilted. For example, "horizontal" only means that its direction is more horizontal than "vertical", and does not mean that the structure must be completely horizontal, but can be slightly tilted.

[0040] In the description of this application, it should also be noted that, unless otherwise clearly specified and limited, the terms "set", "install", "connect", and "connect" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two elements. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0041] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. It should be pointed out that a person skilled in the art can make several improvements and modifications without departing from the technical principle of the present invention, and these improvements and modifications should also be regarded as within the protection scope of the present invention.

Claims

1. A power supply test circuit suitable for a chip, comprising a chip to be tested (1), characterized in that: The invention also comprises a PCB board (2) for placing the chip to be tested (1); a main power supply test module (3), a power supply calibration module (4), a power supply high-precision test module (5) and a single-ended impedance test module (6) are connected to the PCB board (2); the input end of the main power supply test module (3) is connected to the power supply output end of the chip to be tested (1); the calibration output end of the chip to be tested (1) is connected to the input end of the power supply calibration module (4) via a digital channel; the high-precision output end of the chip to be tested (1) is connected to the input end of the power supply high-precision test module (5) via an analog channel; and the output end of the chip to be tested (1) is connected to the input end of the single-ended impedance test module (6) via a digital channel.

2. A power supply test circuit suitable for a chip according to claim 1, characterized in that: The main power supply test module (3) includes power supply tests for AGND and DGND.

3. A power supply test circuit suitable for a chip according to claim 1, characterized in that: The chip model used by the power calibration module (4) is REF5025AIDR.

4. A power supply test circuit suitable for a chip according to claim 1, characterized in that: The power supply high-precision test module (5) comprises a first voltage conversion module (51) and a second voltage conversion module (52); the high-precision output end of the chip to be tested (1) is connected to the input end of the first voltage conversion module (51) through an analog channel; and the output end of the first voltage conversion module (51) is connected to the input end of the second voltage conversion module (52).

5. A power supply test circuit suitable for a chip according to claim 4, characterized in that: The voltage range of the first voltage conversion module (51) is 5V to 15V.

6. A power supply test circuit suitable for a chip according to claim 4, characterized in that: The chip model used by the first voltage conversion module (51) is ADP7182AUJZ-R7.

7. A power supply test circuit suitable for a chip according to claim 4, characterized in that: The voltage of the second voltage conversion module (52) is 10V.

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