Testing device

Abstract

The utility model discloses a testing device. The testing device comprises a clamping part, a testing part and a driving part, wherein the clamping part is provided with a plurality of clamping spaces which are arranged according to a preset direction, and each clamping space is used for clamping a to-be-tested element; the testing part is arranged on one side of the clamping part and can move in the preset direction, and when the testing part is aligned with the to-be-tested element, the performance of the to-be-tested element is tested; the driving part is connected with the testing part and used for driving the testing part to move. According to the testing device, the multiple ray probes can be clamped at the same time, and performance testing can be conducted on the multiple ray probes at the same time; meanwhile, manual operation of the testing device is not needed when the performance of the ray probe is tested, the testing efficiency is high, the automation degree and the intelligent degree are high, and the testing precision is high.

Description

Technical Field

[0001] The present application relates to the technical field of ray probes, and in particular to a testing device. Background Art

[0002] With the maturity and development of radiation technology, radiation probes have been widely used in homeland security, anti-terrorism, nuclear science and technology, industrial flaw detection, food safety testing, environmental monitoring, medical monitoring, etc. In practice, due to production and other reasons, the performance of each radiation probe will have deviations. Therefore, it is necessary to screen out radiation probes with excellent performance before use.

[0003] In the prior art, a test device is used to screen the ray probes. During the screening, the ray probes are installed on the test device, and the performance of the ray probes is tested by the test device after the installation is completed. Then, the ray probes are screened according to the performance test results of all the ray probes.

[0004] However, in the above method, only the performance of one ray probe can be tested at a time, and batch testing is not possible; at the same time, when the performance of the ray probe is tested by the test device, the test device needs to be manually operated throughout the process, the test efficiency is low, the degree of automation and intelligence is low, and the error is large. Utility Model Content

[0005] The purpose of the present application is to provide a testing device with high testing efficiency, high automation and intelligence, and high testing accuracy.

[0006] The embodiment of the present application is implemented as follows:

[0007] The present application provides a testing device, which includes a clamping component, a testing component and a driving component; wherein the clamping component is provided with a plurality of clamping spaces arranged in a preset direction, and each clamping space is used to clamp a component to be tested; the testing component is arranged on one side of the clamping component and can move along a preset direction, and when the testing component is aligned with the component to be tested, a performance test is performed on the component to be tested; the driving component is connected to the testing component, and the driving component is used to drive the testing component to move.

[0008] In one embodiment, the clamping component includes a base and a cover body; wherein, the base is provided with a plurality of first clamping parts; the cover body is provided with a plurality of second clamping parts; when the cover body is covered on the base, the plurality of first clamping parts and the plurality of second clamping parts are connected one by one to form a plurality of clamping spaces.

[0009] In one embodiment, the test component includes a moving part and a fixed frame; wherein the moving part is connected to the driving part; the fixed frame is installed on the moving part, and a radiation source is placed in the fixed frame; when the test component is aligned with the component to be tested, the radiation source is aligned with the component to be tested.

[0010] In one embodiment, the test component further includes an adjusting member, wherein the adjusting member is mounted on the moving member, the fixing frame is mounted on the adjusting member, and the adjusting member is used to adjust the distance between the fixing frame and the clamping member.

[0011] In one embodiment, the fixing frame is detachably mounted on the adjusting member.

[0012] In one embodiment, the driving component includes a driving assembly and a transmission assembly; wherein the transmission assembly is connected to the driving assembly and the testing component; the driving assembly is used to drive the transmission assembly to operate, and the transmission assembly drives the testing component to move after the operation.

[0013] In one embodiment, the driving component includes a controller and a driving motor; wherein the driving motor is connected to the controller.

[0014] In one embodiment, the transmission assembly includes a screw rod.

[0015] In one embodiment, the testing device further includes a limiting component; the limiting component is used to limit the testing component.

[0016] In one embodiment, the testing device further includes a control component, wherein the control component is connected to the driving component.

[0017] The beneficial effects of this application compared with the prior art are:

[0018] The present application provides a testing device, which includes a clamping component, a testing component and a driving component. The working principle of the testing device is as follows: a plurality of clamping spaces are provided on the clamping component, each of which is used to clamp a ray probe, and the testing component can be driven by the driving component to move in the arrangement direction of the clamping space, and when the testing component is aligned with the component to be tested during the movement, the performance test can be performed on the component to be tested; then, the ray probes are screened according to the results of the performance test, and the ray probes with better performance are screened out.

[0019] From the above content, it can be seen that the testing device in the present application can clamp multiple radiation probes at the same time, so as to realize performance testing of multiple radiation probes at the same time; at the same time, there is no need to manually operate the testing device when performing performance testing on the radiation probes, and the testing efficiency is high, the degree of automation and intelligence is high, and the testing accuracy is high. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0021] Figure 1 This is a schematic diagram of the structure of a testing device according to an embodiment of the present application;

[0022] Figure 2 This is a schematic structural diagram of a clamping component according to an embodiment of the present application;

[0023] Figure 3 This is a schematic diagram of the structure of a test component shown in an embodiment of the present application;

[0024] Figure 4 This is a schematic diagram of the structure of a driving component shown in an embodiment of the present application.

[0025] Reference numerals:

[0026] 1-test device; 2-ray probe; 10-clamping part; 11-cover; 12-base; 20-test part; 21-moving part; 22-fixed frame; 23-adjusting part; 30-driving part; 31-screw rod; 32-driving motor; 40-control box; 50-control part; 60-bracket; 61-first protrusion; 70-placing platform; 80-limiting part; 90-mounting frame; 110-clamping space. DETAILED DESCRIPTION

[0027] The terms “first”, “second”, “third”, etc. are only used for distinguishing descriptions and do not indicate the order of arrangement, nor can they be understood as indicating or implying relative importance.

[0028] In addition, the terms "horizontal", "vertical", "overhanging" and the like do not mean that the components are required to be absolutely horizontal or overhanging, but can be slightly tilted. For example, "horizontal" only means that its direction is more horizontal than "vertical", and does not mean that the structure must be completely horizontal, but can be slightly tilted.

[0029] In the description of the present application, it should be noted that the terms "inside", "outside", "left", "right", "up", "down", etc. indicate directions or positional relationships based on the directions or positional relationships shown in the accompanying drawings, or are directions or positional relationships in which the products of the present application are usually placed when in use. They are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore should not be understood as a limitation on the present application.

[0030] In the description of this application, unless otherwise clearly specified and limited, the terms "set", "installed", "connected" and "connected" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, and it can be the internal connection of two elements.

[0031] The technical solution of the present application will be described clearly and completely below in conjunction with the accompanying drawings.

[0032] Please refer to Figure 1 , which is a schematic diagram of the structure of a test device 1 shown in an embodiment of the present application. Figure 1 As shown, the test device 1 includes a clamping component 10, a test component 20 and a driving component 30; wherein, the clamping component 10 is provided with a plurality of clamping spaces 110 arranged in a preset direction, and each clamping space 110 is used to clamp a component to be tested; the test component 20 is provided on one side of the clamping component 10, and can move along a preset direction, and when the test component 20 is aligned with the component to be tested, the performance test is performed on the component to be tested; the driving component 30 is connected to the test component 20, and the driving component 30 is used to drive the test component 20 to move. Exemplarily, the above-mentioned component to be tested can be a ray probe 2.

[0033] In practice, the above-mentioned test device 1 can be used to screen the ray probe 2. The specific screening principle is: a ray probe 2 is installed in each clamping space 110, and the test device 1 is started after the installation is completed. After the test device 1 is started, the driving component 30 drives the test component 20 along the Figure 1 The drive unit 30 runs in the preset direction shown in the figure, and when it runs to align with the first ray probe, it stays for a preset time to perform a performance test on the first ray probe; when the test is completed, the drive unit 30 continues to drive the test unit 20 along the Figure 1 The control device 1 runs in the preset direction shown, and when it is aligned with the second ray probe, it stays for a preset time to perform a performance test on the second ray probe, and the above process is continuously repeated; when all installed ray probes 2 have undergone performance tests, the control test device 1 stops running. Furthermore, after the ray probes 2 have undergone performance tests, corresponding test data will be generated, and the ray probes 2 can be screened according to the test data to select test probes with better performance.

[0034] From the above content, it can be seen that the test device 1 in the present application can clamp multiple radiation probes 2 at the same time, so as to realize performance testing of multiple radiation probes 2 at the same time; at the same time, when testing the radiation probe 2, it is only necessary to manually start the test device 1, and after starting, the test device 1 automatically tests the radiation probe 2. During the entire test process, there is no need for manual operation of the test device 1, and the test efficiency is high, the degree of automation and intelligence is high, and the test accuracy is high.

[0035] In one embodiment, the material of the clamping component 10, the testing component 20 and the driving component 30 is a high temperature resistant material. For example, the material of the clamping component 10, the testing component 20 and the driving component 30 can be bakelite, metal or the like.

[0036] Because the ray probe 2 is sometimes tested in a high temperature environment, in this embodiment, high temperature resistant materials are used to make corresponding components, which effectively avoids deformation of the corresponding components.

[0037] Please refer to Figure 2 , which is a schematic diagram of the structure of the clamping component 10 shown in an embodiment of the present application. Figure 3 , which is a schematic diagram of the structure of the test component 20 shown in an embodiment of the present application. Figure 4 , which is a schematic diagram of the structure of the driving component 30 shown in an embodiment of the present application. Figure 2 As shown, the clamping component 10 includes a base 12 and a cover 11; wherein the base 12 is provided with a plurality of first clamping portions; the cover 11 is provided with a plurality of second clamping portions; when the cover 11 is covered on the base 12, the plurality of first clamping portions and the plurality of second clamping portions are connected one by one to form a plurality of clamping spaces 110. For example, Figure 2 As shown, both the first clamping portion and the second clamping portion can be semicircular grooves. When the cover 11 is covered on the base 12, the two semicircular grooves are connected to form a clamping space 110. For example, the cover 11 and the base 12 can be connected by bolts and buckles. When the radiation probe 2 is actually clamped, the radiation probe 2 can be placed in the first clamping portion first, and then the cover 11 is connected to the base 12 so that the base 12 is covered on the base 12. After the covering is completed, the radiation probe 2 is clamped in the clamping space 110.

[0038] In this embodiment, the first clamping portion and the second clamping portion are connected to form a clamping space 110 , so that when the radiation probe 2 is located in the clamping space 110 , it can be more stably fixed in the clamping space 110 .

[0039] like Figure 3 As shown, the test component 20 includes a moving part 21 and a fixed frame 22; wherein the moving part 21 is connected to the driving component 30; the fixed frame 22 is installed on the moving part 21, and a radiation source is placed in the fixed frame 22; the driving component 30 drives the test component 20 along Figure 1 When moving in the preset direction shown, if the test component 20 is aligned with the radiation probe 2, the radiation source is aligned with the radiation probe 2, and after the alignment, the performance test of the radiation probe 2 can be performed.

[0040] In one embodiment, if Figure 3 As shown, the test component 20 further includes an adjusting member 23, which is mounted on the moving member 21, and the fixed frame 22 is mounted on the adjusting member 23. That is, in this embodiment, the fixed frame 22 is mounted on the moving member 21 through the adjusting member 23; the adjusting member 23 is used to adjust the distance between the fixed frame 22 and the clamping member 10. Specifically, when the adjusting member 23 is mounted on the moving member 21, the adjusting member 23 can adjust the distance between the fixed frame 22 and the clamping member 10 according to the adjustment member 23. Figure 4, the first direction is Figure 1 The preset direction is substantially vertical; when the adjustment member 23 is adjusted according to Figure 4 When the first direction shown in the figure is moved, the distance between the fixing frame 22 and the clamping component 10 and the radiation probe 2 changes; in practice, when testing radiation probes 2 of different specifications, the required distance between the fixing frame 22 and the clamping component 10 is different; the adjusting member 23 can be adjusted according to the specifications of the tested radiation probe 2, so that the adjusting member 23 moves a preset distance along the first direction, so that the distance between the adjusting member 23 and the radiation probe 2 meets the test requirements. After the adjusting member 23 moves a preset distance, the adjusting member 23 can be locked by the locking structure on the moving member 21, so that the adjusting member 23 can be fixed on the moving member 21.

[0041] In one embodiment, the fixing frame 22 is detachably mounted on the adjusting member 23. Specifically, the fixing frame 22 can be mounted on the adjusting member 23 by means of snap connection, bolt connection, etc.; or, the adjusting member 23 can be provided with a snap-fit ​​groove, and the fixing frame 22 is snap-fitted into the above snap-fit ​​groove. In practice, when testing different specifications of the ray probe 2, the type or size of the radiation source to be used will be different. In this case, multiple types of fixing frames 22 can be provided, and each type of fixing frame 22 is used to place radiation sources of different sizes or types; the corresponding type of fixing frame 22 can be installed on the adjusting member 23 according to the size or type of the radiation source used.

[0042] In one embodiment, the driving component 30 includes a driving assembly and a transmission assembly; the transmission assembly is connected to the driving assembly and the testing component 20; the driving assembly is used to drive the transmission assembly to operate, and after the transmission assembly operates, it drives the testing component 20 to move, and after the testing component 20 moves, the radiation probe 2 can be tested.

[0043] In one embodiment, the driving assembly includes a controller and a driving motor 32, and the driving motor 32 is connected to the controller and the transmission assembly; Figure 4 As shown, the transmission assembly includes a screw 31, in which one end of a driving motor 32 is connected to the controller, and the other end of the driving motor 32 is connected to the screw 31; the moving part 21 of the test component 20 is sleeved on the screw 31. The controller stores a test program, which can control the operation of the driving motor 32. After the driving motor 32 is running, the screw 31 and the test component 20 are driven to move. After the test component 20 moves, the performance of the ray probe 2 can be tested.

[0044] In one embodiment, if Figure 4 As shown, the testing device 1 further includes a bracket 60 , a first protrusion 61 and a driving motor 32 are spaced apart on the bracket 60 , one end of the screw rod 31 is mounted on the first protrusion 61 , and the other end of the screw rod 31 is connected to the driving motor 32 .

[0045] In one embodiment, if Figure 4 As shown, the testing device 1 further includes a placement platform 70; the clamping component 10 and the bracket 60 are placed on the placement platform 70. Figure 4 As shown, the testing device 1 further includes a limiting component 80, which is used to limit the testing component 20, and the limiting component 80 is located in the moving direction of the testing component 20. Specifically, as Figure 4 As shown, a mounting frame 90 is provided on the outer periphery of the driving motor 32 , the bottom surface of the mounting frame 90 is fixed on the placement platform 70 , and the limiting component 80 is installed on the top surface of the mounting frame 90 .

[0046] In one embodiment, if Figure 4 As shown, the testing device 1 further includes a control box 40 , and the controller is disposed in the control box 40 .

[0047] In one embodiment, the testing device 1 further includes a control component 50, and the control component 50 is connected to the driving component 30. Specifically, the control component 50 is connected to the controller. Figure 4 As shown, the control component 50 includes a first control component and a second control component. The first control component is arranged on the box and connected to the controller by wire; the second control component is remotely connected to the controller. The first control component and the second control component may be provided with a touch screen, and the touch screen may be provided with a plurality of touch buttons; or the first control component and the second control component may be provided with a plurality of hardware buttons.

[0048] The working principle of the test device 1 in this application is explained below:

[0049] The ray probe 2 to be tested for performance is installed in the clamping space 110, and a corresponding type of fixing frame 22 is installed on the adjusting member 23 according to the size or specification of the radiation source required for the test. After the installation is completed, the radiation source is placed in the fixing frame 22. Further, the adjusting member 23 is adjusted so that the adjusting member 23 moves along the Figure 4 The adjusting member 23 moves in the first direction shown, and drives the fixing frame 22 to move. When the distance between the fixing frame 22 and the clamping component 10 meets the test requirements, the adjusting member 23 is controlled to stop moving and is locked so that the adjusting member 23 is fixed on the moving member 21.

[0050] The test device 1 is started by pressing the start button on the first control component or the second control component. After starting, the controller controls the drive motor 32 to run in the first rotation direction according to the test program stored therein. After the drive motor 32 runs, it drives the screw 31 and the test component 20 to move. During the movement of the test component 20, it gradually approaches the limit component 80. When the test component 20 touches the limit component 80, the controller controls the drive motor 32 to stop running, and the reset operation is performed in this way. After that, the controller controls the drive motor 32 to run in the second rotation direction according to the test program stored therein. After the drive motor 32 runs, it drives the test component 20 to move away from the limit component 80. When the test component 20 moves a specified distance, the radiation source is aligned with the first ray probe. At this time, the controller controls the test component 20 to stay for a preset time and perform a performance test on the first ray probe. In the process of the performance test, the radiation source is aligned with the first ray probe, and the first ray probe will output performance data such as the energy spectrum to the microprocessor, and the first ray probe is connected to the microprocessor. After completing the performance test of the first ray probe, the controller controls the test component 20 to move a specified distance away from the limiting component 80, and then performs a performance test on the second ray probe. After the test, the second ray probe outputs performance data such as the energy spectrum to the microprocessor; the above process is repeated until the performance test of all installed ray probes 2 is completed. Further, the performance of the ray probes 2 is analyzed based on the energy spectrum data of multiple ray probes 2, and the ray probes 2 with excellent performance are screened out after the analysis.

[0051] In another embodiment, if Figure 4 As shown, the first control component and the second control component may be provided with an up key, a down key and a start key. When the start key on the first control component or the second control component is pressed, the controller controls the test component to perform a reset operation; after the reset is completed, when the up key on the first control component or the second control component is pressed, the controller controls the test component 20 to move a specified distance in the direction away from the limiting component 80, and after the movement is completed, the performance test of the first ray probe is performed. After the first ray probe outputs performance data such as energy spectrum, the up key on the first control component or the second control component is pressed again, and the controller controls the test component 20 to move a specified distance in the direction away from the limiting component 80, and after the movement is completed, the performance test of the second ray probe is performed, and the above process is repeated to perform performance tests on each ray probe 2 in turn. After all the installed ray probes 2 are tested, the down key on the first control component or the second control component is pressed, and the controller controls the test component 20 to move a specified distance in the direction close to the limiting component 80, and after the movement is completed, the test device 1 is controlled to stop running.

[0052] It is worth noting that when the performance of the X-ray probe 2 is tested in a high and low temperature environment, the test device 1 can be placed in a high and low temperature environment test experimental box. After placement, the test device 1 can be controlled by operating the second control component to enable the test device 1 to perform a performance test on the X-ray probe 2. In this way, the accuracy of the test is ensured. The specific test principle is detailed in the above embodiment and will not be repeated here.

[0053] It can be seen from the above content that the test device 1 in the present application has the characteristics of remote control operation, being able to adjust the distance between the radiation source and the radiation probe 2, being able to be tested in batches and being able to be directly used in a high and low temperature environment test chamber, and being efficient and convenient. In addition, in the prior art, when testing the radiation probe 2, the radiation source is manually aligned with the radiation probe 2. This method cannot align the longitudinal axis of the radiation source with the radiation probe 2, and the alignment accuracy is low, resulting in low test accuracy for the radiation probe 2, and at the same time, differences in test results for different batches of radiation probes 2. In the present application, the controller controls the movement of the drive motor 32 through the test program stored therein, and after the drive motor 32 moves, the radiation source is driven to move a specified distance, and after the movement is completed, the radiation source can be aligned with the longitudinal axis of the radiation probe 2, and the alignment accuracy is high, which improves the test accuracy of the radiation probe 2, and at the same time alleviates the problem of differences in test results for different batches of radiation probes 2.

[0054] The above description is only the preferred embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A testing device, characterized in that: The testing device comprises: A clamping component, wherein the clamping component is provided with a plurality of clamping spaces arranged in a preset direction, each clamping space being used to clamp a component to be tested; A testing component, which is disposed on one side of the clamping component and can move along the preset direction, and performs a performance test on the component to be tested when the testing component is aligned with the component to be tested; A driving component is connected to the testing component, and is used for driving the testing component to move.

2. The testing device according to claim 1, characterized in that: The clamping member comprises: A base, wherein a plurality of first clamping parts are provided on the base; A cover body, wherein a plurality of second clamping parts are provided on the cover body; When the cover is covered on the base, a plurality of first clamping parts and a plurality of second clamping parts are connected one by one to form a plurality of clamping spaces.

3. The testing device according to claim 1, characterized in that: The test components include: A moving part connected to the driving part; A fixed frame is installed on the moving part, and a radiation source is placed in the fixed frame; when the test component is aligned with the component to be tested, the radiation source is aligned with the component to be tested.

4. The testing device according to claim 3, characterized in that: The test component also includes: An adjusting member is installed on the moving member, the fixing frame is installed on the adjusting member, and the adjusting member is used to adjust the distance between the fixing frame and the clamping member.

5. The testing device according to claim 4, characterized in that: The fixing frame is detachably mounted on the adjusting member.

6. The testing device according to claim 1, characterized in that: The driving component comprises: Drive components; A transmission assembly, the transmission assembly being connected to the drive assembly and the test component; The driving assembly is used to drive the transmission assembly to operate, and the transmission assembly drives the test component to move after the operation.

7. The testing device according to claim 6, characterized in that: The drive assembly comprises: Controller; A drive motor is connected to the controller and the transmission assembly.

8. The testing device according to claim 6, characterized in that: The transmission assembly includes a screw rod.

9. The testing device according to claim 1, characterized in that: The testing device also includes: A limiting component is used to limit the test component.

10. The testing device according to claim 1, characterized in that: The testing device also includes: A control component is connected to the driving component.

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