High temperature resistance detection equipment for electronic component
By setting up a motor drive screw and slider in a high-temperature resistance detection device, the sliding of the placement plate can be controlled so that it can slide out from the inside of the heating box during the detection process, which facilitates observation of electronic components, solves the problem of inconvenient observation in existing equipment, and improves the convenience and efficiency of detection.
Patent Information
- Application Number
- CN202421032026.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-13
- Publication Date
- 2025-03-14
- Estimated Expiration
- 2034-05-13
AI Technical Summary
The existing high temperature resistance detection equipment for electronic components is not convenient for taking out the electronic components for observation during the detection process.
A high temperature resistance detection device is designed. By setting up a motor to drive the lead screw to rotate, the slider is driven to slide in the slide groove of the heating box, thereby controlling the sliding of the placement plate so that it can slide out from the inside of the heating box during the detection process, making it easy to observe the electronic components on the placement plate.
It enables easy observation of electronic components during the detection process, and improves the convenience and efficiency of detection.
Smart Images

Figure CN222618719U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of electronic component detection, in particular to a high temperature resistance detection device for electronic components. Background Art
[0002] High temperature resistance test is used for high and low temperature reliability test. It is used to test the performance indicators of parts and materials of electronic and electrical, automobile and motorcycle, aerospace, rubber, plastic, metal, ship weapons, colleges and universities, scientific research institutions and other related products under high and low temperature changes.
[0003] In actual use, it is not convenient to take out the electronic components for observation during the detection process of the existing high temperature resistance detection equipment for electronic components. Therefore, we propose a high temperature resistance detection equipment for electronic components. Utility Model Content
[0004] The purpose of this section is to summarize some aspects of the embodiments of the utility model and briefly introduce some preferred embodiments. Some simplifications or omissions may be made in this section and the abstract of the specification and the name of the utility model of this application to avoid blurring the purpose of this section, the abstract of the specification and the name of the utility model, and such simplifications or omissions cannot be used to limit the scope of the utility model.
[0005] In view of the above problems and / or the problems existing in the existing electronic component high temperature resistance detection equipment, the present utility model is proposed.
[0006] Therefore, the purpose of the utility model is to provide a high temperature resistance testing device for electronic components, by which a motor is set to drive the lead screw to rotate, thereby driving the slider to slide in the slide groove of the heating box, thereby controlling the sliding of the placement plate, so that the placement plate can be slid out from the inside of the heating box during the testing process, thereby facilitating the observation of the electronic components on the placement plate.
[0007] In order to solve the above technical problems, according to one aspect of the present invention, the present invention provides the following technical solutions:
[0008] A high temperature resistance testing device for electronic components, comprising:
[0009] The detection assembly comprises a heating box, four bases fixed at the lower end of the heating box, an operating table arranged at the upper end of the heating box, and an opening and closing door hinged at the front end of the heating box through a hinge, a slide groove is provided inside the heating box, a plurality of heating wires are arranged inside the heating box, and the heating wires are electrically connected to an external power supply through an external heating wire switch;
[0010] The sliding assembly comprises a motor fixed to the lower side of the rear end of the heating box, a lead screw fixed to the output end of the motor and located in the slide groove, a slider with threads arranged outside the lead screw and an outer wall in contact with the inner wall of the slide groove, and a placement plate arranged at the upper end of the slider;
[0011] As a preferred solution of the high temperature resistance detection device for electronic components described in the utility model, a heat insulation layer is provided on the inner wall of the heating box.
[0012] As a preferred solution of the high temperature resistance testing device for electronic components described in the utility model, an observation window is provided in the middle of the opening and closing door.
[0013] As a preferred solution of the high temperature resistance testing equipment for electronic components described in the utility model, the bottom of the placement plate is fitted with the top of the inner wall of the heating box, and the relative outer wall of the placement plate is fitted with the relative inner wall of the heating box.
[0014] As a preferred solution of the high temperature resistance testing device for electronic components described in the utility model, a plurality of placement grooves are provided at the upper end of the placement plate.
[0015] As a preferred solution of the high temperature resistance testing device for electronic components described in the utility model, a plurality of the placement grooves are evenly and equidistantly arranged on the placement plate.
[0016] As a preferred solution of the high temperature resistance testing device for electronic components described in the utility model, a card slot is provided at the lower end of the placement plate, and the card slot is card-connected with the slider.
[0017] Compared with the prior art, the utility model has the following beneficial effects: this high temperature resistance testing equipment for electronic components drives the lead screw to rotate through a set motor, thereby driving the slider to slide in the slide groove of the heating box, thereby controlling the sliding of the placement plate, so that the placement plate can be slid out of the heating box during the testing process, thereby facilitating the observation of the electronic components on the placement plate. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] In order to more clearly illustrate the technical solution of the implementation of the utility model, the utility model will be described in detail below in combination with the drawings and detailed implementation. Obviously, the drawings described below are only some implementations of the utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative labor. Among them:
[0019] Figure 1 This is a schematic diagram of a three-dimensional structure from a first-view perspective of a high temperature resistance testing device for electronic components in the present invention;
[0020] Figure 2 This is a schematic diagram of the second perspective stereoscopic structure of a high temperature resistance testing device for electronic components in the present invention;
[0021] Figure 3 This is a schematic diagram of the three-dimensional structure of a sliding assembly of a high temperature resistance testing device for electronic components in the present invention;
[0022] Figure 4 This is a cross-sectional structural diagram of a sliding assembly of a high temperature resistance testing device for electronic components;
[0023] In the figure: 100, detection component; 110, heating box; 111, insulation layer; 120, base; 130, operating table; 140, opening and closing door; 141, observation window; 200, sliding component; 210, motor; 220, lead screw; 230, slider; 240, placement plate; 241, placement slot; 242, card slot. DETAILED DESCRIPTION
[0024] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and understandable, the specific implementation methods of the present invention are described in detail below with reference to the accompanying drawings.
[0025] Secondly, the present invention is described in detail with reference to the schematic diagram. When describing the implementation of the present invention, for the sake of convenience, the cross-sectional diagram showing the device structure will not be partially enlarged according to the general proportion, and the schematic diagram is only an example, which should not limit the scope of protection of the present invention. In addition, in actual production, the three-dimensional dimensions of length, width and depth should be included.
[0026] In order to make the purpose, technical solution and advantages of the present invention more clear, the implementation mode of the present invention will be further described in detail below with reference to the accompanying drawings.
[0027] The utility model provides a high temperature resistance testing device for electronic components, which drives a lead screw to rotate through a motor, thereby driving a slider to slide in a slide groove of a heating box, thereby controlling the sliding of a placement plate, so that the placement plate can be slid out of the heating box during the testing process, thereby facilitating the observation of the electronic components on the placement plate.
[0028] Figure 1-Figure 4 The structure diagram of an embodiment of a high temperature resistance testing device for electronic components according to the present invention is shown in FIG. Figure 1-Figure 4 In this embodiment, a high temperature resistance detection device for electronic components includes a detection component 100 and a sliding component 200.
[0029] The detection assembly 100 includes a heating box 110, four bases 120 fixed at the lower end of the heating box 110, an operating table 130 arranged at the upper end of the heating box 110, and an opening and closing door 140 hinged at the front end of the heating box 110 by a hinge, a slide groove is provided inside the heating box 110, a plurality of heating wires are provided inside the heating box 110, and the heating wires are electrically connected to an external power supply through an external heating wire switch. Preferably, in this embodiment, the inner wall of the heating box 110 is provided with a heat preservation layer 111, and the heat preservation layer 111 arranged in the heating box 110 can keep the inside of the heating box 110 warm and reduce heat loss, and an observation window 141 is provided in the middle of the opening and closing door 140, and the observation window 141 arranged on the opening and closing door 140 is convenient for the operator to observe the inside of the heating box 110 through the observation window 141.
[0030] The sliding assembly 200 includes a motor 210 fixed to the lower side of the rear end of the heating box 110, a screw 220 fixed to the output end of the motor 210 and located in a slide groove, a slider 230 with threads arranged on the outside of the screw 220 and the outer wall fitting with the inner wall of the slide groove, and a placement plate 240 arranged at the upper end of the slider 230. Preferably, in the present embodiment, the bottom of the placement plate 240 is in contact with the top of the inner wall of the heating box 110, and the relative outer wall of the placement plate 240 is in contact with the relative inner wall of the heating box 110. The placement plate 240 in contact with the inner wall of the heating box 110 generates a certain friction force with the inner wall of the heating box 110 during sliding, thereby ensuring the stability of the placement plate 240 during sliding. A plurality of placement grooves 241 are provided at the upper end of the placement plate 240. The plurality of placement grooves 241 are evenly and equidistantly arranged on the placement plate 240. The placement grooves 241 evenly and equidistantly arranged on the placement plate 240 are used to place electronic components to be tested to prevent the electronic components from sliding when placed directly on the placement plate 240. A clamping groove 242 is provided at the lower end of the placement plate 240. The clamping groove 242 is clamped with the slider 230. The placement plate 240 is clamped on the slider 230 under the action of the clamping groove 242, which is convenient for the operator to disassemble and replace the placement plate 240 in the later stage.
[0031] Combination Figure 1-Figure 4, a high temperature resistance testing device for electronic components in this embodiment is specifically used as follows: the electronic components to be tested for high temperature resistance are placed in the placement groove 241 of the placement plate 240, the opening and closing door 140 is closed, and the heating box 110 is used to test the high temperature resistance performance of the electronic components. During the testing process, the operator can observe the interior of the heating box 110 through the observation window 141 on the opening and closing door 140. If it is necessary to observe the electronic components, the operator opens the opening and closing door 140 and starts the motor 210. The motor 210 drives the lead screw 220 to rotate. The rotating lead screw 220 drives the slider 230 to slide, and then drives the placement plate 240 to slide like the front end, and slides the placement plate 240 to the outside of the heating box 110, so as to facilitate the observation of the electronic components on the placement plate 240 during the testing process. The placement plate 240 is clamped on the slider 230 under the action of the clamping groove 242, which is convenient for the operator to disassemble and replace the placement plate 240 in the later stage.
[0032] Although the present invention has been described above with reference to the embodiments, various modifications may be made thereto and parts thereof may be replaced with equivalents without departing from the scope of the present invention. In particular, as long as there is no structural conflict, the various features in the embodiments disclosed in the present invention may be used in combination with each other in any manner, and the fact that these combinations are not exhaustively described in this specification is only for the sake of omitting space and saving resources. Therefore, the present invention is not limited to the specific embodiments disclosed herein, but includes all technical solutions falling within the scope of the claims.
Claims
1. A high temperature resistance testing device for electronic components, characterized in that: include: The detection assembly (100) comprises a heating box (110), four bases (120) fixed at the lower end of the heating box (110), an operating table (130) arranged at the upper end of the heating box (110), and an opening and closing door (140) hinged to the front end of the heating box (110) through a hinge, wherein a slide groove is provided inside the heating box (110), a plurality of heating wires are provided inside the heating box (110), and the heating wires are electrically connected to an external power source through an external heating wire switch; The sliding assembly (200) comprises a motor (210) fixed to the lower side of the rear end of the heating box (110), a lead screw (220) fixed to the output end of the motor (210) and located in a slide groove, a slider (230) with threads arranged on the outside of the lead screw (220) and the outer wall of which is in contact with the inner wall of the slide groove, and a placement plate (240) arranged at the upper end of the slider (230).
2. A high temperature resistance testing device for electronic components according to claim 1, characterized in that: The inner wall of the heating box (110) is provided with a heat-insulating layer (111).
3. The high temperature resistance testing device for electronic components according to claim 1, characterized in that: An observation window (141) is provided in the middle of the opening and closing door (140).
4. The high temperature resistance testing device for electronic components according to claim 1, characterized in that: The bottom of the placement plate (240) fits with the top of the inner wall of the heating box (110), and the opposite outer wall of the placement plate (240) fits with the opposite inner wall of the heating box (110).
5. The high temperature resistance testing device for electronic components according to claim 1, characterized in that: The upper end of the placement plate (240) is provided with a plurality of placement grooves (241).
6. The high temperature resistance testing device for electronic components according to claim 5, characterized in that: The plurality of placement grooves (241) are evenly and equidistantly arranged on the placement plate (240).
7. The high temperature resistance testing device for electronic components according to claim 1, characterized in that: A clamping groove (242) is provided at the lower end of the placement plate (240), and the clamping groove (242) is clamped with the sliding block (230).