Measuring head mechanism of film thickness gauge

Abstract

The utility model discloses a measuring head mechanism of a film thickness gauge, which comprises a sensor, a plane measuring head, a large arc measuring head, a mounting seat, a fixing block assembly and a sensor shell, and is characterized in that the plane measuring head is mounted at the bottom of the sensor, the sensor shell is fixed above an instrument measuring table through a fixing block, and the large arc measuring head is mounted above the mounting seat and fixed; the upper and lower measuring heads are concentrically arranged. During measurement, the plane measuring head is lifted along with the sensor, the thin film passes through the space between the plane measuring head and the large arc measuring head, the plane measuring head falls to be in contact with the thin film, one-time measurement reading is completed, and the steps are repeated during multi-point measurement. The device is simple in working principle and convenient to operate, and can furthest avoid interference of dust on measurement when the measuring head is in contact with a film, so that the stability of continuous multi-point measurement data is realized.

Description

Technical Field

[0001] The utility model relates to the technical field of film and sheet thickness testing, in particular to a film thickness gauge probe mechanism. Background Art

[0002] At present, in the process of film thickness measurement, dust interference occurs, resulting in poor repeatability of the test process data. Continuous multi-point testing is not possible, and frequent manual intervention is required to clean the dust. The test process is time-consuming and the labor cost is too high. The test work efficiency is low, which seriously affects the production efficiency of film companies. Therefore, the structure of the probe is designed to address the dust problem. Utility Model Content

[0003] The utility model aims to provide a probe mechanism for a film thickness gauge to solve the problems raised in the above-mentioned background technology.

[0004] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a thin film thickness gauge probe mechanism, comprising a sensor, a plane probe, a large arc probe, a mounting seat, and a fixing block, wherein the plane probe is mounted to the bottom of the sensor, the sensor is fixed above the thickness gauge table by the fixing block, and the large arc probe is mounted above the mounting seat and fixed.

[0005] Preferably, the present application provides a thin film thickness gauge probe mechanism, wherein the plane probe and the large arc probe are respectively fixed at the bottom of the sensor and above the mounting seat, and the plane probe and the large arc probe are arranged concentrically up and down.

[0006] Preferably, the present application provides a film thickness gauge probe mechanism, wherein the planar probe is lifted as the sensor, and the film or sheet passes between the planar probe and the large arc probe, and the measurement is completed once the planar probe falls and contacts the film or sheet, and the above steps are repeated for multi-point measurement.

[0007] Preferably, the present application provides a thin film thickness gauge probe mechanism, wherein, because the upper part of the mechanism is a plane and the lower part is a spherical arc surface, dust is not easy to remain on the highest contact point of the large arc probe, and the dust will be carried away due to sliding when the film passes by. The probe contact point can avoid dust and wrinkles stuck on the film to the greatest extent.

[0008] Compared with the prior art, the beneficial effects of the utility model are: the utility model has a simple working principle and is easy to operate. The use of dual probes allows the probes to avoid dust and wrinkles stuck on the film to the greatest extent. In addition, when the film is moved, the dust on the probes can also be taken away, further reducing the impact of dust retention on the probes. More than 100 measurement points can be measured continuously and the authenticity and repeatability of the measurement data can still be guaranteed, achieving the accuracy and stability of continuous multi-point measurement data, and manual intervention to clean the probes is no longer required during the measurement process, thereby improving labor efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0009] Figure 1 It is a schematic diagram of the structure of the utility model;

[0010] Figure 2 This is a schematic diagram of the structure of the probe mechanism of the utility model;

[0011] Figure 3 This is a schematic diagram of the arrangement of the dual probes of the utility model;

[0012] In the figure: sensor 1, plane probe 2, large arc probe 3, mounting base 4, fixing block 5, sensor housing 6, film 7, measuring table 8 DETAILED DESCRIPTION

[0013] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0014] In the description of the present invention, it should be noted that the terms "above", "below", "between", "upper", "bottom" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific position, be constructed and operated in a specific position, and therefore cannot be understood as limiting the present invention. In addition, the terms "first" and "second" are used for descriptive purposes only and cannot be understood as indicating or implying relative importance.

[0015] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installation", "fixed", "through", etc. should be understood in a broad sense. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0016] See also Figure 1-3The utility model provides a technical solution: a thin film thickness gauge probe mechanism, comprising: a sensor 1, a plane probe 2, a large arc probe 3, a mounting seat 4, a fixing block 5, a sensor housing 6, and a measuring table 8, wherein the plane probe 2 is installed to the bottom of the sensor 1, the sensor housing 6 is fixed above the instrument through the fixing block 5, and the large arc probe 3 is installed above the mounting seat 4 and fixed.

[0017] In the present invention, the plane probe 2 and the large arc probe 3 are respectively fixed at the bottom of the sensor 1 and above the mounting seat 4, and the plane probe 2 and the large arc probe 3 are arranged concentrically up and down.

[0018] In the present invention, the plane probe 2 is lifted as the sensor 1 is lifted, and the film 7 passes between the plane probe 2 and the large arc probe 3. The plane probe 2 falls and contacts the film 7, and the measurement is completed once. For multi-point measurement, the above steps are repeated.

[0019] In the utility model, since the upper part of the mechanism is a plane and the lower part is a spherical arc surface, dust is not easy to remain on the highest contact point of the probe, and the dust will be taken away when the film passes by. The probe can avoid the dust and wrinkles stuck on the film to the greatest extent, thereby achieving continuous measurement of more than 100 measurement points without manual intervention and still ensuring the repeatability stability of the data, thereby achieving the accuracy and stability of the continuous measurement data.

[0020] Working principle: The method of using the utility model includes the following steps:

[0021] A. First, after installing the plane probe and the large arc probe, adjust the two probes to be concentrically arranged up and down;

[0022] B. During the measurement process, the plane probe is kept lifted, and the film / sheet needs to pass between the plane probe and the large arc probe, and the measuring point is located directly below the plane probe;

[0023] C. The sensor reading after the flat probe falls and contacts the film / sheet is a measurement.

[0024] The measurement is completed; D. Repeat the above BC steps for multi-point measurement.

[0025] To sum up, the utility model has a simple working principle and is easy to operate. The upper and lower probes are used at the same time, which can avoid dust and wrinkles stuck on the film to the greatest extent. The special structure of the double probes can also take away some dust by moving the film, thereby reducing the influence of dust without manual intervention, achieving a state in which more than 100 measurement points can be continuously measured and the repeatability and stability of the data can still be guaranteed, thereby achieving the accuracy and stability of the continuous measurement data.

[0026] It should be noted that, in this article, terms such as "maximum limit", "maximum limit" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also includes other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of more restrictions, the elements defined by the sentence "maximum limit ..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.

[0027] It is obvious to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the present invention can be implemented in other specific forms without departing from the spirit or essential features of the present invention. Therefore, the embodiments should be regarded as exemplary and non-restrictive from any point of view, and the scope of the present invention is defined by the appended claims rather than the above description, and it is intended that all changes falling within the meaning and scope of the equivalent elements of the claims are included in the present invention. Any reference numerals in the claims should not be regarded as limiting the claims involved.

Claims

1. A film thickness gauge probe mechanism, comprising: A sensor (1), a plane probe (2), a large arc probe (3), a mounting seat (4), a fixing block (5), and a sensor housing (6), wherein the plane probe (2) is mounted to the bottom of the sensor (1), the sensor housing (6) is fixed above the instrument measuring table by the fixing block (5), the large arc probe (3) is mounted above the mounting seat (4) and fixed, and placed below the measuring table, so that two upper and lower probes are formed and used simultaneously.

2. The probe mechanism of a thin film thickness gauge according to claim 1, characterized in that: The plane probe (2) and the large arc probe (3) are arranged concentrically up and down.

3. A film thickness gauge probe mechanism according to claim 1, characterized in that As the plane probe (2) is lifted up by the sensor (1), the film (7) passes between the plane probe (2) and the large arc probe (3). After the plane probe (2) falls and contacts the film (7), one measurement is completed. The above steps are repeated for multi-point measurement.

4. A film thickness gauge probe mechanism according to claim 1, characterized in that Because the upper probe of this mechanism is a flat surface and the lower probe is a spherical arc surface, dust is not easy to remain on the highest contact point of the probe, and the dust will be taken away when the film passes by. The probe can avoid the dust and wrinkles on the film to the greatest extent, and realize the accuracy and stability of continuous multi-point measurement data.

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