Sample box for testing silicon chip
By designing a sample box for silicon chip testing including storage box disk and storage column, the problem that existing silicon chip sample boxes cannot effectively separate and store different silicon chips is solved, and secure storage and convenient management of silicon chips are achieved.
Patent Information
- Application Number
- CN202421393859.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-06-18
- Publication Date
- 2025-03-28
- Estimated Expiration
- 2034-06-18
AI Technical Summary
Existing silicon wafer sample boxes cannot effectively separate and store different silicon wafer chips, resulting in frictional damage between silicon wafers and it is difficult for staff to find specific chips.
A sample box for silicon chip testing is designed, including the first sample card box and the second sample card box. Through the design of the storage box disk and the storage column, separate storage and fixing of the silicon chip are realized to prevent displacement damage.
This sample box can effectively protect the silicon chip, prevent frictional damage, and facilitate staff to store and find different silicon chips separately, improving the safety and management convenience of the chip.
Smart Images
Figure CN222683058U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of sample boxes, in particular to a sample box for testing silicon wafer chips. Background Art
[0002] Silicon wafers generally refer to thin slices cut from single crystal silicon. Silicon wafers have diameters of 2 inches, 3 inches, 4 inches, 6 inches, 8 inches, etc., and are mainly used to produce integrated circuits. Silicon wafers are only raw materials, and chips are finished products. Silicon wafers are an important material for making integrated circuits. Various semiconductor devices can be made by photolithography, ion implantation, etc.
[0003] The existing silicon wafer sample box has the following defects:
[0004] The existing silicon wafer sample box cannot effectively separate and store different silicon wafer chips, which leads to friction and damage between silicon wafers, and it is inconvenient for staff to find different silicon wafers. Therefore, a solution is needed. Utility Model Content
[0005] 1. Technical issues to be resolved
[0006] In view of the deficiencies of the prior art, the utility model provides a sample box for testing a silicon wafer chip to solve the problems raised in the above background technology.
[0007] (II) Technical solution
[0008] To achieve the above objectives, the utility model is implemented through the following technical solutions: a sample box for silicon wafer chip testing, including a device body, the device body including a first sample card box and a second sample card box, the first sample card and the card are connected to the top of the first sample card box; the first sample card box and the second sample card box both include a storage box disk and a storage column, the storage column is located at the bottom of the storage box disk, the storage box disk and the storage column are both smooth transition and integrally processed structures, the storage box disk is a circular structure, the storage box disk and the top of the storage column are both provided with storage bins, and the storage bins are cylindrical structures.
[0009] Preferably, an anti-skid pad is placed at the bottom of the storage bin, the anti-skid pad has a circular structure and is made of rubber, and a plurality of groups of anti-skid grooves are provided on the surface of the anti-skid pad.
[0010] Preferably, an embedded outer ring block is provided on the outer side of the storage box disk, the storage box disk and the embedded outer ring block are a smooth transition and integrally processed structure, and the embedded outer ring block is a circular ring structure.
[0011] (III) Beneficial effects
[0012] The utility model provides a sample box for testing silicon wafer chips, which has the following beneficial effects:
[0013] This type of silicon wafer chip testing sample box can store silicon wafer chips separately and can also fix silicon wafer chips to prevent them from shifting and being damaged, thereby greatly ensuring the safety of silicon wafer chips. This type of device can also perform stacking storage, further facilitating the separate storage and use of silicon wafer chips. BRIEF DESCRIPTION OF THE DRAWINGS
[0014] Figure 1 It is a schematic diagram of the overall structure of the utility model;
[0015] Figure 2 It is a schematic structural diagram of the first sample card box of the utility model.
[0016] In the figure, 1, device body; 2, first sample card box; 3, second sample card box; 4, storage box plate; 5, storage column; 6, storage bin; 7, anti-skid gasket; 8, anti-skid pattern; 9, embedded outer ring block. DETAILED DESCRIPTION
[0017] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.
[0018] See also Figure 1-2 , the embodiment of the utility model provides a technical solution: a sample box for silicon chip testing, comprising a device body 1, the device body 1 comprises a first sample card box 2 and a second sample card box 3, the first sample card and 2 are clamped on the top of the first sample card box 2;
[0019] The problem is that the first sample card box 2 and the second sample card box 3 both include a storage box disk 4 and a storage column 5, and the storage column 5 is located at the bottom of the storage box disk 4. The storage box disk 4 and the storage column 5 are both smooth transition and integrally processed structures. The storage box disk 4 is a circular structure, and the storage box disk 4 and the storage column 5 are both provided with a storage bin 6 on the top. The storage bin 6 is a cylindrical structure. When storing the chip, the staff puts the silicon wafer chip into the storage bin 6 of the storage column 5 in the second sample card box 3. The staff embeds the first sample card box 2 into the top of the second sample card box 3. In this way, the bottom of the storage column 5 in the first sample card box 2 can be inserted into the storage bin 6 of the second sample card box 3, so that the silicon wafer chip in the storage bin 6 can be individually stored, limited and fixed.
[0020] Furthermore, an anti-skid pad 7 is placed at the bottom of the storage bin 6. The anti-skid pad 7 is circular and made of rubber. A plurality of anti-skid grooves 8 are provided on the surface of the anti-skid pad 7. The anti-skid pad 7 in the storage bin 6 can protect the silicon wafer, prevent the silicon wafer from shifting, and improve the firmness of the silicon wafer.
[0021] Differently, an embedded outer ring block 9 is provided on the outer side of the storage box disk 4. The storage box disk 4 and the embedded outer ring block 9 are a smooth transition and integrally processed structure. The embedded outer ring block 9 is a circular ring structure. When in use, the embedded outer ring block 9 in the first sample card box 2 can be clamped on the top of the embedded outer ring block 9 of the second sample card box 2, thereby further clamping the first sample card box 2 on the first sample card box 3.
[0022] Working principle: During operation, when storing the chip, the staff puts the silicon wafer into the storage bin 6 of the storage column 5 in the second sample card box 3. The anti-slip pad 7 in the storage bin 6 can protect the silicon wafer to prevent the silicon wafer from shifting and improve the firmness of the silicon wafer. The staff embeds the first sample card box 2 into the top of the second sample card box 3 (the embedded outer ring block 9 in the first sample card box 2 can be snapped into the top of the embedded outer ring block 9 of the second sample card box 2, further making the first sample card box 2 snapped onto the first sample card box 3). In this way, the bottom of the storage column 5 in the first sample card box 2 can be snapped into the storage bin 6 of the second sample card box 3, so that the silicon wafer chip in the storage bin 6 can be individually stored, limited and fixed.
[0023] The utility model comprises 1. a device body; 2. a first sample card box; 3. a second sample card box; 4. a storage box plate; 5. a storage column; 6. a storage bin; 7. an anti-skid pad; 8. an anti-skid pattern; and 9. an embedded outer ring block. All components are universal standard parts or components known to technical personnel in the field, and their structures and principles can be known to technical personnel in the field through technical manuals or conventional experimental methods. The utility model solves the problem that the existing silicon wafer sample box cannot effectively separate different silicon wafer chips for storage, resulting in friction and damage between silicon wafers, and it is inconvenient for staff to find different silicon wafers. The utility model can separate and store silicon wafer chips separately through the combination of the above components, and can also fix the silicon wafer chips to prevent the silicon wafer chips from displacement and damage, thereby greatly ensuring the safety of the silicon wafer chips.
[0024] The above shows and describes the basic principles and main features of the utility model and the advantages of the utility model. For those skilled in the art, it is obvious that the utility model is not limited to the details of the above exemplary embodiments, and can be implemented in other specific forms without departing from the spirit or basic features of the utility model. Therefore, no matter from which point of view, the embodiments should be regarded as exemplary and non-restrictive. The scope of the utility model is limited by the attached claims rather than the above description, and it is intended to include all changes within the meaning and scope of the equivalent elements of the claims. Any figure mark in the claims should not be regarded as limiting the claims involved.
[0025] In addition, it should be understood that although the present specification is described according to implementation modes, not every implementation mode contains only one independent technical solution. This description of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment may also be appropriately combined to form other implementation modes that can be understood by those skilled in the art.
Claims
1. A sample box for silicon chip testing, characterized in that: The device comprises a device body (1), wherein the device body (1) comprises a first sample card box (2) and a second sample card box (3), wherein the first sample card box (2) is clamped on the top of the first sample card box (2); The first sample card box (2) and the second sample card box (3) both comprise a storage box plate (4) and a storage column (5), wherein the storage column (5) is located at the bottom of the storage box plate (4), and the storage box plate (4) and the storage column (5) are both smoothly transitioned and integrally processed structures, and the storage box plate (4) is a circular structure, and the tops of the storage box plate (4) and the storage column (5) are both provided with a storage bin (6), and the storage bin (6) is a cylindrical structure.
2. A sample box for silicon chip testing according to claim 1, characterized in that: An anti-skid pad (7) is placed at the bottom of the storage bin (6); the anti-skid pad (7) is circular in structure and made of rubber; and a plurality of groups of anti-skid patterns (8) are provided on the surface of the anti-skid pad (7).
3. The sample box for silicon chip testing according to claim 1, characterized in that: An embedded outer ring block (9) is provided on the outer side of the storage box disc (4); the storage box disc (4) and the embedded outer ring block (9) are a smoothly transitioned and integrally processed structure; the embedded outer ring block (9) is a circular ring structure.