USB interface function test fixture with simplified operation

Abstract

The utility model relates to the technical field of USB (Universal Serial Bus) function testing, in particular to a USB interface function testing jig with simplified operation. The device comprises a power supply module, a voltage stabilization module, a main control module, a test module and a display module, the main control module comprises a control chip and a storage unit, the test module comprises a load resistor unit and a USB interface, the power supply module is connected with the voltage stabilization module, the voltage stabilization module is connected with the main control module, and the test module is in bidirectional connection with the main control module. The display module is bidirectionally connected with the test module. According to the utility model, the control chip enumerates as corresponding equipment according to the highest protocol supported by the USB interface, enumerates downwards according to the highest protocol, and tests step by step, so that the USB equipment is prevented from being plugged and unplugged for many times, and voltage, current and power tests are carried out on the USB interface by using the load resistor; the test mode and each function of the to-be-tested USB device are tested according to the power supply capability, and comprehensive test of the USB function is realized.

Description

Technical Field

[0001] The utility model relates to the technical field of USB function testing, in particular to a USB interface function testing fixture with simplified operation. Background Art

[0002] Electronic products like PCs typically have several USB ports. These ports are typically USB 3.0, and before shipment, they undergo testing to ensure proper functionality. For backward compatibility, USB 3.0 ports must be tested not only for proper operation with USB 3.0 devices, but also for proper operation with USB 2.0 and USB 1.1 devices.

[0003] The current testing method is to use USB2.0 devices and USB3.0 devices to test the USB interfaces of electronic products for USB2.0 and USB3.0 functions respectively. Therefore, different USB devices need to be used during the test, and two plugging and unplugging operations are required. USB devices have four transmission modes: large-volume data transmission, such as USB flash drives, data stream devices such as monitoring devices, high-synchronous timing devices, keyboard and mouse devices, and basic control transmission. Most devices can only test one of these functions. For example, USB flash drives can only test control transmission and block transmission. This does not fully cover the full functions of the interface chip. If full coverage is required, more dedicated USB devices are required.

[0004] The above test method requires many plugging and unplugging times, which makes the test process cumbersome, time-consuming, and prone to damage. At the same time, testing the full function of the interface chip requires multiple devices, which is wasteful. Therefore, we propose a USB interface function test fixture with simplified operation. Utility Model Content

[0005] The purpose of the present invention is to provide a USB interface function test fixture with simplified operation to solve the problems raised in the above background technology.

[0006] To achieve the above objectives, the present invention provides a USB interface function test fixture with simplified operation, comprising a power supply module, a voltage stabilizing module, a main control module, a test module, and a display module. The main control module comprises a control chip and a storage unit, the test module comprises a load resistance unit and a USB interface, the power supply module is connected to the voltage stabilizing module, the voltage stabilizing module is connected to the main control module, the test module is bidirectionally connected to the main control module, and the display module is bidirectionally connected to the test module.

[0007] The power supply unit of the power supply module provides a current source for the control chip. The LDO step-down circuit of the voltage regulator module performs two-stage voltage reduction to power the control chip. The control chip controls the load resistance unit to test the power supply capacity of the USB interface. Based on the power supply capacity of the USB interface, the control chip detects each function of the USB interface and displays the results on the display module.

[0008] As a further improvement of the present technical solution, the voltage stabilizing module includes an LDO buck circuit, wherein the LDO buck circuit includes an operational amplifier A, a transistor VT1 and a voltage stabilizing diode VD;

[0009] Pin 2 of the operational amplifier A is connected to the cathode of the voltage-stabilizing diode VD, to one end of the inductor L1 and to the collector of the transistor VT1, the anode of the voltage-stabilizing diode VD is connected to one end of the capacitor C1, the other end of the capacitor C1 is connected to the other end of the inductor L1, pin 1 of the operational amplifier A is connected to the base of the transistor VT1, the emitter of the transistor VT1 is connected to the resistor R1 and to the inductor L2, the other end of the inductor L2 is connected to the capacitor C2, pin 3 of the operational amplifier A is connected to the other end of the resistor R1 and to the resistor R2, the other end of the resistor R2 is connected to the other end of the capacitor C2 and to ground.

[0010] As a further improvement of the present technical solution, both the input terminal UI and the output terminal UO of the LDO step-down circuit are connected to an LC filter circuit to achieve input filtering and output filtering of the current.

[0011] As a further improvement of the present technical solution, the control chip tests the function of the USB interface by means of a control function test, an interrupt function test, a synchronization function test and a block transfer function test.

[0012] As a further improvement of the present technical solution, the load resistance unit uses a load resistance to perform voltage, current and power tests on the USB interface, and tests the test mode and various functions of the USB device to be tested according to its power supply capacity.

[0013] As a further improvement of the present technical solution, when testing the USB interface, the test module enumerates the corresponding device according to the highest protocol supported by the USB interface, and enumerates downwards with the highest protocol until all devices are tested.

[0014] Compared with the prior art, the present invention has the following beneficial effects:

[0015] 1. This simplified USB interface function test fixture, when testing the USB interface function of a PC, enumerates the corresponding device according to the highest protocol supported by the USB interface through the control chip, and then enumerates downward from the highest protocol, gradually testing the corresponding functions of the USB2.0 protocol and USB1.1 protocol, thus avoiding the need to repeatedly plug and unplug the USB device and reducing trouble;

[0016] 2. Use the load resistor unit to test the voltage, current and power of the USB interface. Test the test mode and various functions of the USB device to be tested according to its power supply capacity. Test the function of the USB interface using the control function test, interrupt function test, synchronization function test and block transfer function test to achieve a comprehensive test of the USB function. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 This is a schematic diagram of the overall process of the utility model 1;

[0018] Figure 2 This is the LDO step-down circuit diagram of the utility model 1. DETAILED DESCRIPTION

[0019] The following will be combined with the drawings in the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0020] Electronic products such as PCs usually have several USB ports. Currently, the USB ports on electronic products are usually USB 3.0 ports. Before the product leaves the factory, it is tested to ensure that the functions of each port are qualified. For USB 3.0 ports, in order to ensure backward compatibility, it is necessary to test whether they can work properly when connected to USB 3.0 devices, as well as whether they can work properly when connected to USB 2.0 and USB 1.1 devices. Figure 1-Figure 2 As shown, the utility model provides a USB interface function test fixture with simplified operation, including a power supply module, a voltage stabilizing module, a main control module, a test module and a display module. The main control module includes a control chip and a storage unit, the test module includes a load resistance unit and a USB interface, the power supply module is connected to the voltage stabilizing module, the voltage stabilizing module is connected to the main control module, the test module is bidirectionally connected to the main control module, and the display module is bidirectionally connected to the test module;

[0021] The power supply unit of the power supply module provides a current source for the control chip. The LDO step-down circuit of the voltage regulator module performs two-stage voltage reduction to power the control chip. The control chip controls the load resistance unit to test the power supply capacity of the USB interface. Based on the power supply capacity of the USB interface, the control chip detects each function of the USB interface and displays the results on the display module.

[0022] Principle: The LDO step-down circuit of the voltage regulator module performs two-stage step-down to power the control chip, ensuring that the control chip works under regulated constant current. When testing the USB interface function of the PC, the control chip enumerates the corresponding device according to the highest protocol supported by the USB interface, and enumerates downward from the highest protocol to gradually test the corresponding functions of the USB2.0 protocol and USB1.1 protocol. The load resistor unit uses the load resistor to test the voltage, current and power of the USB interface. The test method and various functions of the USB device to be tested are tested according to its power supply capacity. The function of the USB interface is tested by means of control function test, interrupt function test, synchronization function test and block transfer function test, so as to achieve a comprehensive test of the USB function.

[0023] In order to provide the control chip with a constant voltage and current to ensure its normal operation, the voltage stabilization module includes an LDO step-down circuit, wherein the LDO step-down circuit includes an operational amplifier A, a transistor VT1 and a voltage stabilizing diode VD;

[0024] Pin 2 of operational amplifier A is connected to the cathode of Zener diode VD, to one end of inductor L1 and to the collector of transistor VT1, the anode of Zener diode VD is connected to one end of capacitor C1, the other end of capacitor C1 is connected to the other end of inductor L1, pin 1 of operational amplifier A is connected to the base of transistor VT1, the emitter of transistor VT1 is connected to resistor R1 and to inductor L2, the other end of inductor L2 is connected to capacitor C2, pin 3 of operational amplifier A is connected to the other end of resistor R1 and to resistor R2, the other end of resistor R2 is connected to the other end of capacitor C2 and to ground.

[0025] In this circuit, resistors R1 and R2 form a voltage-divider resistor sampling network. When the input voltage UI increases or the output load resistance increases, the output voltage UO will increase instantaneously, and the voltage obtained by voltage-divider sampling through resistors R1 and R2 will also increase. Since the reverse terminal input of the operational amplifier A is used, the output of the operational amplifier A will decrease accordingly, and the difference between the emitter voltage and the base voltage of the transistor VT1 will decrease, thereby reducing the output current and UO, thereby achieving the purpose of voltage reduction.

[0026] In order to ensure the stability and reliability of the input voltage and output voltage and reduce the change and fluctuation of the signal, the input terminal UI and the output terminal UO of the LDO buck circuit are both connected to the LC filter circuit. The simple LC filter circuit is mainly composed of inductors and capacitors. When filtering the signal, the energy loss is small, ensuring that the energy loss is reduced when the signal is input filtered and output filtered.

[0027] In order to test all the functions of the USB interface, the control chip tests the functions of the USB interface by means of control function test, interrupt function test, synchronization function test and block transfer function test;

[0028] Control function test: The control chip sends various control commands, such as open, close, start, and stop, and observes the device's response to confirm whether the commands are executed correctly. Intentionally send incorrect control commands to observe the device's error handling mechanism. The device should be able to correctly identify incorrect commands and return appropriate error codes or status information.

[0029] Interrupt function test: The control chip simulates interrupt events, such as sending specific data and triggering device status changes. Observe whether the device can respond to interrupt events in a timely manner and generate interrupt signals. The USB device should be able to correctly handle the interrupt service routine and perform corresponding operations, such as reading data, processing events, and updating status. The test module verifies the execution results of the interrupt service routine;

[0030] Synchronization function test: The control chip sets synchronization parameters, such as synchronization clock frequency, synchronization signal polarity, synchronization data format, etc. Ensure that the synchronization parameters are set correctly, use the test module to send synchronization data to the USB device, and observe whether the device can correctly receive and process the synchronization data. Verify whether the data transmission is accurate and stable and meets the synchronization requirements;

[0031] Block transfer functionality test: Set the USB device's block transfer parameters, such as block size, transfer rate, and transfer mode. Ensure that the block transfer parameters are set correctly. Use test software or tools to send block transfer requests to the USB device to observe whether the device can correctly receive and process the block transfer requests. Verify that data is transferred completely and accurately, meeting block transfer requirements. Measure block transfer performance indicators, such as transfer rate, throughput, and latency. Analyze the performance indicators to evaluate the device's block transfer capabilities.

[0032] In order to more conveniently test the various modules of the USB interface under the corresponding device, the load resistance unit uses a load resistor to test the voltage, current and power of the USB interface, and tests the test mode and various functions of the USB device under test according to its power supply capacity;

[0033] USB2.0 usually provides a maximum current output capability of 500mA, with a supply voltage of 5V. USB3.0 can provide a higher current output, up to 900mA, with the same supply voltage of 5V.

[0034] The USB interface is tested for voltage, current, and power using a load resistor. The current level determines the USB interface device type. The test results reflect the USB interface's power supply capacity. Insufficient power supply can lead to unstable, interrupted, or failed data transmission. For example, errors or unusually slow transfer speeds when transferring large files may be due to insufficient power. Under normal power supply conditions, USB 2.0 should be able to perform stable data transmission at speeds of up to 480Mbps. USB 3.0 offers even higher data transfer speeds and, with adequate power supply, can fully utilize its high-speed transmission advantages.

[0035] In order to select the USB3.0, USB2.0 and USB1.1 test ports of USB interface devices during testing, the test module enumerates the corresponding devices according to the highest protocol supported by the USB interface when testing the USB interface, and enumerates downwards from the highest protocol until all are tested;

[0036] The moment the PC is connected, the corresponding device is enumerated according to the highest protocol supported by the interface (for example, if the PC interface is USB3.0, the USB3.0 device is enumerated). After the enumeration is completed, it communicates with the PC host computer to confirm the type that needs to be re-enumerated and perform the corresponding test. If the PC only needs to test USB2.0, the firmware switches the USB2.0 device to mount and re-enumerate the PC connection, and configures the corresponding endpoint and channel. Before the test, use a USB3.0 cable to connect the USB3.0 interface of the electronic product with the USB interface to be tested to the USB3.0 interface of the USB3.0 test fixture. Open the host computer test software and click the Start Test button. The software automatically starts the test.

[0037] The above shows and describes the basic principles, main features, and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The above embodiments and descriptions are merely preferred examples of the present invention and are not intended to limit the present invention. Various changes and improvements may be made to the present invention without departing from the spirit and scope of the present invention, and such changes and improvements fall within the scope of the present invention. The scope of protection claimed in the present invention is defined by the appended claims and their equivalents.

Claims

1. A USB interface functional test fixture with simplified operation, characterized by: It includes a power supply module, a voltage stabilizing module, a main control module, a test module and a display module. The main control module includes a control chip and a storage unit. The test module includes a load resistance unit and a USB interface. The power supply module is connected to the voltage stabilizing module, the voltage stabilizing module is connected to the main control module, the test module is bidirectionally connected to the main control module, and the display module is bidirectionally connected to the test module. The power supply unit of the power supply module provides a current source for the control chip. The LDO step-down circuit of the voltage regulator module performs two-stage voltage reduction to power the control chip. The control chip controls the load resistance unit to test the power supply capacity of the USB interface. Based on the power supply capacity of the USB interface, the control chip detects each function of the USB interface and displays the results on the display module.

2. The simplified operation USB interface functional test fixture according to claim 1, characterized in that: The voltage stabilizing module includes an LDO step-down circuit, wherein the LDO step-down circuit includes an operational amplifier A, a transistor VT1 and a voltage stabilizing diode VD; Pin 2 of the operational amplifier A is connected to the cathode of the voltage-stabilizing diode VD, to one end of the inductor L1 and to the collector of the transistor VT1, the anode of the voltage-stabilizing diode VD is connected to one end of the capacitor C1, the other end of the capacitor C1 is connected to the other end of the inductor L1, pin 1 of the operational amplifier A is connected to the base of the transistor VT1, the emitter of the transistor VT1 is connected to the resistor R1 and to the inductor L2, the other end of the inductor L2 is connected to the capacitor C2, pin 3 of the operational amplifier A is connected to the other end of the resistor R1 and to the resistor R2, the other end of the resistor R2 is connected to the other end of the capacitor C2 and to ground.

3. The simplified operation USB interface functional test fixture according to claim 2, characterized in that: The input terminal UI and the output terminal UO of the LDO step-down circuit are both connected to an LC filter circuit to achieve input filtering and output filtering of the current.

4. The simplified operation USB interface functional test fixture according to claim 1, characterized in that: The control chip tests the function of the USB interface by means of a control function test, an interrupt function test, a synchronization function test and a block transfer function test.

5. The simplified operation USB interface functional test fixture according to claim 1, characterized in that: The load resistance unit uses a load resistance to perform voltage, current and power tests on the USB interface, and tests the test mode and various functions of the USB device to be tested according to its power supply capacity.

6. The simplified operation USB interface functional test fixture according to claim 1, characterized in that: When testing the USB interface, the test module enumerates the corresponding device according to the highest protocol supported by the USB interface, and enumerates downwards with the highest protocol until all devices are tested.

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