Pin testing device
By connecting the pins with a probe and adjusting the distance of the fixture, the pin test device cannot control the pressure, ensuring pin flatness and reducing damage, achieving compatibility with products of different thicknesses.
Patent Information
- Application Number
- CN202422401718.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-30
- Publication Date
- 2025-08-19
- Estimated Expiration
- 2034-09-30
AI Technical Summary
Existing pin test devices cannot control the pressure of the pin, resulting in the pin flatness being affected and prone to damage.
The probe is used to connect the pins and adjust the distance between the fixture base and the fixture cover through the adjusting member to control the pin pressure of the product to be tested and is compatible with the product to be tested of different thicknesses.
The pins are avoided lateral pressure, ensure the coplanar flatness of the pins, reduce the possibility of pin damage, and improve the stability and reliability of the test.
Smart Images
Figure CN223244662U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of testing equipment, in particular to a pin testing device. Background Art
[0002] Pins, also known as pins, are the connections between the internal circuitry of an integrated circuit (chip) and the peripheral circuitry. Together, these pins form the chip's interface. Dual In-line Package Testing Equipment (DIPTE) is used to test the packaged (pinned) integrated circuits (ICs).
[0003] At present, conventional pin testing devices use standard test sockets. Workers need to place the pins of the product to be tested into the standard test socket and press the button of the test socket to make the connection part in the standard test socket apply pressure to the pins of the product to be tested for testing. The lateral pressure in the standard test socket can easily cause the pins of the product to be tested to deform or bend, especially in SMD products, which often causes problems with the flatness of the pins due to testing, and it is very difficult to rework and inspect the products. At the same time, the existing pin testing device is not good at controlling the pressure when applying pressure to the pins and the connection part in the standard test socket. If the pressure on the pins of the product to be tested is too small, they may fall off from the connection part in the standard test socket, or if the pressure on the pins of the product to be tested is too large, the pins of the product to be tested may be damaged.
[0004] Therefore, there is an urgent need for a pin testing device that can adjust the pressure applied to the pin during pin testing. Summary of the Invention
[0005] The technical problem to be solved by the utility model is to solve the problem that the existing pin testing device cannot control the pressure exerted on the pin by the pin testing device during the pin testing and the problem that the flatness of the pin is affected during the pin testing.
[0006] In order to solve the above technical problems, the utility model provides a pin testing device comprising: a test fixture, the test fixture comprising a fixture base and a fixture cover, the top side of the fixture base is provided with a first groove, the top side of the fixture base is provided with a fixing piece, the first groove is provided with a through hole, the fixture cover is movably connected to the fixture base, the fixture cover is provided with a second groove, the second groove corresponds to the position of the first groove, the second groove is located on a side close to the top side of the fixture base, the fixture cover is provided with an adjusting piece, and the adjusting piece is movably connected to the fixing piece;
[0007] A test circuit is connected to the bottom side of the test fixture, and the test circuit includes a test circuit board and a probe. One end of the probe is connected to the test circuit board, and the other end of the probe passes through the through hole. The other end of the probe is provided with a pin interface.
[0008] Furthermore, the probe is provided with a height adjustment mechanism.
[0009] Furthermore, the adjusting member is a screw, and the fixing member is a nut.
[0010] Furthermore, the clamp cover and the clamp base are connected via a hinge.
[0011] Furthermore, an anti-slip column is provided on the bottom side of the clamp base.
[0012] Furthermore, the area of the second groove is larger than the area of the first groove.
[0013] Furthermore, a detachable protective cover is provided outside the test circuit.
[0014] Compared with the prior art, the pin testing device according to the embodiment of the present invention has the following advantages:
[0015] The embodiment of the present invention replaces the connection part of the traditional standard test socket with a probe. When performing pin testing, the staff can directly insert the pins of the product to be tested into the probe for testing. Since the pin testing device uses a probe to connect the pins, the problem of the pins being subjected to lateral pressure due to the traditional standard test socket clamping the pins is avoided, the coplanar flatness of multiple pins is ensured, and the possibility of damage to the pins of the product to be tested is reduced; the embodiment of the present invention provides an adjustment member on the test fixture, and the adjustment member can be used to adjust the distance between the fixture base and the fixture cover. The distance between the fixture base and the fixture cover can be changed to adjust the pressure of the fixture cover on the product to be tested. Since the pins of the product to be tested are connected to the probes in the pin testing device, the adjustment member can adjust the pressure on the pins of the product to be tested, and provides the ability to control the pressure of the pins of the product to be tested. The adjustment member of the fixture cover can also be compatible with products of different thicknesses to further ensure the normal operation of the pin testing device. BRIEF DESCRIPTION OF THE DRAWINGS
[0016] Figure 1 It is a structural diagram of a pin testing device provided by an embodiment of the utility model;
[0017] Figure 2 This is another structural diagram of the pin testing device provided by an embodiment of the present utility model;
[0018] Figure 3 This is a structural diagram of the first groove and the test circuit in the pin testing device provided by an embodiment of the present utility model;
[0019] In the figure, 100, test fixture; 110, fixture base; 111, first groove; 112, fixing member; 113, through hole; 120, fixture cover; 121, second groove; 122, adjusting member; 130, anti-slip column; 200, test circuit; 210, test circuit board; 220, probe. DETAILED DESCRIPTION
[0020] The following is a further detailed description of specific embodiments of the present invention in conjunction with the accompanying drawings and examples. The following examples are intended to illustrate the present invention but are not intended to limit the scope of the present invention. It should be noted that unless otherwise specifically stated, the relative arrangement of components and steps, and numerical values described in these examples do not limit the scope of the present invention.
[0021] The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the present invention, its application, or uses.
[0022] Technologies, methods, and equipment known to ordinary technicians in the relevant art may not be discussed in detail, but where appropriate, the technologies, methods, and equipment should be considered part of the specification.
[0023] In all examples shown and discussed herein, any specific values should be interpreted as merely exemplary and not limiting. Therefore, other examples of the exemplary embodiments may have different values.
[0024] It should be noted that like reference numerals and letters refer to like items in the following figures, and therefore, once an item is defined in one figure, it need not be further discussed in subsequent figures.
[0025] like Figure 1 、 Figure 2 and Figure 3 As shown, a pin testing device of an optional embodiment of the present utility model embodiment includes:
[0026] A test fixture 100 includes a fixture base 110 and a fixture cover 120. The top side of the fixture base 110 is provided with a first groove 111, and the top side of the fixture base 110 is provided with a fixing member 112. The first groove 111 is provided with a through hole 113. The fixture cover 120 is movably connected to the fixture base 110. The fixture cover 120 is provided with a second groove 121. The second groove 121 is located on a side close to the top side of the fixture base 110. The fixture cover 120 is provided with an adjusting member 122, and the adjusting member 122 is movably connected to the fixing member 112.
[0027] The test circuit 200 is connected to the bottom side of the test fixture 100. The test circuit includes a test circuit board 200 and a probe 220. One end of the probe 220 is connected to the test circuit board 200, and the other end of the probe 220 passes through the through hole 113. The other end of the probe 220 is provided with a pin interface.
[0028] The second groove 121 corresponds to the first groove 111 in that when the fixture cover 120 is closed, the position of the second groove 121 corresponds to the position of the first groove 111, and the product to be tested is placed in the space defined by the second groove 121 and the first groove 111. The first groove 111 is used to place the product to be tested. Since the test fixture 100 needs to press the product to be tested by the fixture cover 120 after the product to be tested is placed in the first groove 111, the depth of the first groove 111 should be less than the height of the product to be tested. Otherwise, the fixture cover 120 will not be able to generate pressure on the product to be tested when the product to be tested is located in the first groove 111. When the fixture cover 120 is closed, the second groove 121 corresponds to the first groove 111. Adapting the shape and size of the second groove 121 to the shape of the product to be tested also helps to evenly distribute the pressure applied by the fixture cover 120 to the product to be tested. This ensures that the fixture cover 120 can evenly apply pressure to the product to be tested when closed, thereby ensuring good contact between the pins and the probe 220 during testing. The probe 220 is a conductive tool used for electrical testing. In this pin testing device, one end of the probe 220 is connected to the test circuit board 200, and the other end is connected to the pin of the product to be tested by insertion, and is responsible for transmitting the test signal to the test circuit board 200. Preferably, the probe 220 can be provided with a height adjustment mechanism to accommodate different pin heights. Selecting an elastic and retractable probe 220 can ensure that the pins are not crushed or damaged. In addition, the present invention arranges the test circuit board 200 on the bottom side of the test fixture 100, so that the PCB and the pads in the test circuit board 200 can be easily connected to the power supply, thereby improving the reliability of the welding between them.
[0029] Specifically, the working process of the pin testing device is as follows: first, the staff puts the product to be tested into the first groove 111 and connects the probe 220 to the pin of the product to be tested; then, the fixture cover 120 and the fixture base 110 are closed; finally, the adjusting member 122 is adjusted by observing the working condition of the test circuit 200 to change the pressure between the pin of the product to be tested and the probe 220 for testing. Among them, observing the working condition of the test circuit 200 here refers to observing whether the test circuit 200 is working normally, whether there is poor contact, etc. Among them, the effect of the adjusting member 122 is: when the adjusting member 122 adjusts the distance between the fixture base 110 and the fixture cover 120 to become smaller, the pressure on the pin of the product to be tested increases; when the adjusting member 122 adjusts the distance between the fixture base 110 and the fixture cover 120 to become larger, the pressure on the pin of the product to be tested decreases.
[0030] In an embodiment of the present invention, the connection portion of a conventional standard test socket is replaced with a probe 220. When performing a pin test, a worker can directly insert the pin of the product under test into the probe 220 for testing. Since the pin test device uses the probe 220 to connect the pin, the problem of the pin being subjected to lateral pressure caused by the conventional standard test socket clamping the pin is avoided, thereby ensuring the coplanar flatness of multiple pins and reducing the possibility of damage to the pins of the product under test. In an embodiment of the present invention, an adjustment member 122 is provided on the test fixture 100. The adjustment member 122 can be used to adjust the distance between the fixture base 110 and the fixture cover 120. By changing the distance between the fixture base 110 and the fixture cover 120, the pressure exerted by the fixture cover 120 on the product under test can be adjusted. Since the pin of the product under test is connected to the probe 220 in the pin test device, the adjustment member 122 can adjust the pressure exerted on the pin of the product under test, providing the ability to control the pressure of the pin of the product under test. The adjustment member of the fixture cover can also be compatible with products under test of different thicknesses, further ensuring the normal operation of the pin test device.
[0031] In an optional embodiment of the present invention, the probe 220 is provided with a height adjustment mechanism.
[0032] Among them, the probe 220 is a tool used for electrical testing, which is conductive. In this pin testing device, one end of the probe 220 is connected to the test circuit board 200, and the other end is connected to the pin of the product to be tested by insertion, and is responsible for transmitting the test signal to the test circuit board 200. However, different products to be tested may have different pin heights or spacings. The height adjustment mechanism allows the probe 220 to be fine-tuned according to actual needs to ensure that the probe 220 can accurately contact the pin regardless of its height. If the probe 220 cannot adapt to the height difference of the pins of the product to be tested, poor contact may result, which will affect the normal operation of the pin testing device.
[0033] Specifically, in this embodiment, a threaded mechanism can be used to precisely adjust the height of the probe 220 , and a spring can be used to enable the probe 220 to move within a certain range, thereby adapting to different pin heights.
[0034] In the embodiment of the present invention, the probe 220 with the height adjustment mechanism can ensure good contact between the probe and the pin, thereby improving the stability and reliability of the pin testing device.
[0035] In an optional embodiment of the present invention, the adjusting member 122 is a screw, and the fixing member 112 is a nut.
[0036] Among them, the screw is located on the fixture cover 120, and the nut is located on the fixture base 110. When the fixture cover 120 and the fixture base 110 are closed, the screw and the nut correspond to each other. The staff can rotate the screw to adjust the relationship between the screw and the nut to adjust the distance between the fixture base 110 and the fixture cover 120, and then adjust the pressure between the pin of the product to be tested and the probe 220. Preferably, a screw with a larger thread density can be selected. A screw with a larger thread density will produce a smaller displacement each time it is rotated, so that the adjustment amount between the pin of the product to be tested and the probe 220 can be more accurately controlled.
[0037] In an embodiment of the present invention, using a screw as the adjusting member 122 allows for finer displacement adjustment each time the screw is rotated, thereby precisely controlling the pressure between the pin and the probe 220. This design not only improves the accuracy of adjusting the pressure between the pin and the probe 220, but also enhances the operational stability of the pin testing device.
[0038] In an optional embodiment of the present invention, the clamp cover 120 is connected to the clamp base 110 via a hinge.
[0039] A hinge is a mechanical component used to connect two objects and allow them to rotate relative to each other. It typically consists of two blades (the blades are fixed to the objects) and a shaft (the shaft allows the objects to rotate around an axis). Hinges are widely used in devices that require opening and closing, such as doors and lids.
[0040] Specifically, when the fixture cover 120 and the fixture base 110 are closed, the hinge allows the fixture cover 120 and the fixture base 110 to close more smoothly. The use of hinges to connect the fixture cover 120 and the fixture base 110 can maintain a consistent gap and alignment between the fixture cover 120 and the fixture base 110, thereby ensuring that there is no uneven gap between the fixture cover 120 and the fixture base 110, and ensuring that the contact between the pins of the product to be tested and the probe 220 is evenly pressurized by the fixture cover 120 and the fixture base 110.
[0041] In the present invention, the method of connecting the fixture cover 120 and the fixture base 110 through hinges ensures that the contact pressure between the pins of the product to be tested and the probe 220 is uniform, which facilitates the pin testing device to adjust the pressure between the pins of the product to be tested and the probe 220.
[0042] like Figure 2 As shown, in an optional embodiment of the present invention, an anti-slip column 130 is provided on the bottom side of the clamp base 110 .
[0043] The anti-slip column 130 refers to a small protrusion or columnar structure provided on the bottom side of the fixture base 110, which has a certain friction force. The anti-slip column 130 generally uses a material with a high friction coefficient, such as rubber, silicone or synthetic rubber, which can provide a good anti-slip effect. Preferably, silicone material can be used as the anti-slip column 130 of the pin test device. Compared with other materials, the use of silicone material as the anti-slip column 130 of the pin test device has stronger chemical corrosion resistance and better elasticity and recovery.
[0044] In an optional embodiment of the present invention, an anti-slip column 130 is provided on the bottom side of the fixture base 110, which can effectively prevent the pin testing device from sliding during operation and enhance the stability of the pin testing device during testing.
[0045] In an optional embodiment of the present invention, an anti-slip column 130 is provided on the bottom side of the fixture base 110, which can effectively prevent the pin testing device from sliding during operation and enhance the stability of the pin testing device during testing.
[0046] In an optional embodiment of the present invention, the area of the second groove 121 is greater than the area of the first groove 111 .
[0047] When performing a pin test, the staff member needs to close the fixture cover 120 and the fixture base 110 and place the product to be tested in the space defined by the first groove 111 and the second groove 121. Before the fixture cover 120 and the fixture base 110 are closed, the product to be tested is placed in the first groove 111. When the fixture cover 120 is closed, the product to be tested should also be placed in the second groove 121. If the area of the second groove 121 is smaller than the area of the product to be tested, the fixture cover 120 will not be able to close, resulting in the pin test device not being able to test normally. Preferably, the length and width of the second groove 121 can be made larger than the length and width of the first groove 111, so as to ensure that the fixture cover 120 can be smoothly closed when the product to be tested is placed in the first groove 111.
[0048] In the embodiment of the present invention, the larger area of the second groove 121 can accommodate products to be tested of different sizes, thereby increasing the applicable range of the pin testing device for the products to be tested.
[0049] In an optional embodiment of the present invention, a detachable protective cover is provided on the outside of the test circuit 200 .
[0050] The term "protective cover" refers to a protective covering used to shield and protect the external components of a device or circuit. The protective cover prevents dust, dirt, or other environmental factors from affecting the test circuit 200, protecting the circuit from external contamination and physical damage. In an embodiment of the present invention, a removable protective cover is provided on the exterior of the test circuit 200 to extend the service life of the pin test device and the reliability of the test process.
[0051] The above is only a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and replacements can be made without departing from the technical principles of the present invention. These improvements and replacements should also be regarded as the scope of protection of the present invention.
Claims
1. A pin testing device, characterized in that: The pin testing device comprises: A test fixture, the test fixture comprising a fixture base and a fixture cover, the top side of the fixture base being provided with a first groove, the top side of the fixture base being provided with a fixing piece, the first groove being provided with a through hole, the fixture cover being movably connected to the fixture base, the fixture cover being provided with a second groove, the second groove being located on a side close to the top side of the fixture base, the second groove corresponding to the position of the first groove, the fixture cover being provided with an adjusting piece, the adjusting piece being movably connected to the fixing piece; A test circuit is connected to the bottom side of the test fixture, and the test circuit includes a test circuit board and a probe. One end of the probe is connected to the test circuit board, and the other end of the probe passes through the through hole. The other end of the probe is provided with a pin interface.
2. The pin testing device according to claim 1, wherein: The probe is provided with a height adjustment mechanism.
3. The pin testing device according to claim 1, wherein: The adjusting member is a screw, and the fixing member is a nut.
4. The pin testing device according to claim 1, wherein: The clamp cover and the clamp base are connected via a hinge.
5. The pin testing device according to claim 1, wherein: The bottom side of the clamp base is provided with an anti-skid column.
6. The pin testing device according to claim 1, wherein: An area of the second groove is greater than an area of the first groove.
7. The pin testing device according to claim 1, wherein: A detachable protective cover is provided outside the test circuit.