NAND particle screening and testing device

Abstract

The utility model discloses an NAND particle screening and testing device. The NAND particle screening and testing device comprises an NAND FLASH particle screening and testing bottom plate; a control single board and a plurality of NAND particle test socket bases are arranged on the NAND FLASH particle screening test bottom board; a programmable control chip and a connector are arranged on the control single board, and the programmable control chip is connected with the NAND FLASH particle screening test bottom board through the connector to complete signal transmission; nAND FLASH storage particles to be tested are definitely arranged on the NAND particle test socket base, and connection between the NAND FLASH storage particles to be tested and the NAND FLASH particle screening test bottom plate is completed. Through the structural arrangement of the device, the application scene of the screening test device is improved.

Description

Technical Field

[0001] The utility model belongs to the field of testing technology, and in particular relates to a NAND particle screening and testing device. Background Art

[0002] Currently, NAND FLASH storage particles are widely used in information industries such as servers, automobiles, and consumer electronics. Currently, major NAND FLASH manufacturers on the market mainly rely on equipment testing of dedicated master chips for enterprise-grade, industrial-grade, and consumer-grade grading and screening of NAND FLASH particles.

[0003] Dedicated screening equipment integrates the control chip on the test equipment. The chip cannot be replaced and is highly dependent on the NAND FLASH particle model. Testing particles of different series and different packages requires replacing different test equipment, which often takes a lot of time.

[0004] The dedicated main control chip is customized in design, its functions cannot be modified later, and its portability is low, making it difficult to meet the screening and testing scenarios of particles from different manufacturers and models. Utility Model Content

[0005] The purpose of the utility model is to overcome the problems of the prior art and disclose a NAND particle screening and testing device. Through the structural setting of the device, the applicable scenarios of the screening and testing device are improved.

[0006] The purpose of this utility model is achieved through the following technical solutions:

[0007] A NAND particle screening test device, comprising: a NAND FLASH particle screening test base plate;

[0008] The NAND FLASH particle screening test base is provided with a control board and several NAND particle test socket bases;

[0009] The control board is provided with a programmable control chip and a connector, and the programmable control chip is connected to the NAND FLASH particle screening test base board via the connector to complete signal transmission;

[0010] The NAND particle test socket base is sure to have a NAND FLASH storage particle to be tested, and completes the connection between the NAND FLASH storage particle to be tested and the NAND FLASH particle screening test baseboard.

[0011] According to a preferred embodiment, the NAND FLASH particle screening test base is provided with several indicator lights, each indicator light is paired with a NAND particle test socket base, and is used to complete the test status display of the NAND FLASH storage particle to be tested on the corresponding NAND particle test socket base.

[0012] According to a preferred embodiment, the indicator light has light outputs in several colors.

[0013] According to a preferred embodiment, the NAND FLASH particle screening test baseboard is provided with a power module, and the power module is used to supply power to the NAND FLASH particle screening test baseboard and the control board.

[0014] According to a preferred embodiment, the NAND FLASH particle screening test baseboard is provided with a gigabit network port and / or a PCIE interface for accessing the control board.

[0015] According to a preferred embodiment, the control board uses 4 pcs connectors to expand 8-channel control paths, and each channel is independently controlled.

[0016] According to a preferred embodiment, the NAND chip test socket base adopts an open-close socket base.

[0017] According to a preferred embodiment, the NAND particle test socket base is fixed on the NANDFLASH particle screening test base plate by using screws.

[0018] The aforementioned main solution and its various further options can be freely combined to form multiple solutions, all of which are solutions that can be adopted and protected by this utility model. After understanding the solution of this utility model, those skilled in the art will understand that there are many combinations based on existing technology and common knowledge, all of which are technical solutions to be protected by this utility model, and these are not exhaustive here.

[0019] The beneficial effects of the present invention are:

[0020] 1. Simple structure and changeable functions.

[0021] 2. Adaptable to NAND FLASH particles with different protocols and packages.

[0022] 3. The supporting equipment is simple and can be moved to any required test scenario. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 This is a top view of the NAND particle screening test device of the present invention;

[0024] Figure 2 This is a side view of the NAND particle screening test device of the present invention;

[0025] Among them, 100-control board, 200-connector, 300-programmable control chip, 310-auxiliary circuit module, 400-NAND FLASH particle screening test baseboard, 500-NAND particle test socket base, 510-indicator light, 600-power module, 610-gigabit network port, 610B-universal PCIE interface. DETAILED DESCRIPTION

[0026] The following describes the embodiments of the present invention through specific examples. Those skilled in the art will readily understand the other advantages and benefits of the present invention from the disclosure herein. The present invention may also be implemented or applied through various other specific embodiments, and the details in this specification may be modified or altered based on different perspectives and applications without departing from the spirit of the present invention. It should be noted that the following embodiments and features within these embodiments may be combined with one another, unless they conflict.

[0027] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, it does not need to be further defined or explained in subsequent drawings.

[0028] In the description of this utility model, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer" and the like, indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings, or are the orientations or positional relationships in which the utility model product is typically placed when in use. These terms are intended solely to facilitate the description of this utility model and to simplify the description, and are not intended to indicate or imply that the device or component referred to must have a specific orientation, be constructed, or operate in a specific orientation. Therefore, they should not be construed as limitations on this utility model. Furthermore, the terms "first," "second," and "third," etc., are used solely to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0029] Furthermore, terms such as "horizontal," "vertical," and "overhanging" do not necessarily imply that a component must be absolutely horizontal or overhanging, but rather that it can be slightly tilted. For example, "horizontal" simply means that its direction is more horizontal than "vertical," and does not mean that the structure must be completely horizontal, but rather that it can be slightly tilted.

[0030] It should also be noted that, in the description of this utility model, unless otherwise expressly specified or limited, the terms "disposed," "installed," "connected," and "connected" should be understood in a broad sense. For example, they can refer to fixed connections, detachable connections, or integral connections; mechanical connections, electrical connections; direct connections, indirect connections through an intermediate medium, and internal connections between two components. Those skilled in the art will understand the specific meanings of the above terms in this utility model based on the specific circumstances.

[0031] In addition, the present invention should point out that, in the present invention, unless the specific structure, connection relationship, position relationship, power source relationship, etc. are specifically written out, the structure, connection relationship, position relationship, power source relationship, etc. involved in the present invention are all known to those skilled in the art based on the existing technology without creative work.

[0032] Example 1:

[0033] refer to Figure 1 and Figure 2 As shown in the figure, a NAND particle screening test device is shown, and the NAND particle screening test device includes: a NAND FLASH particle screening test base plate 400.

[0034] Preferably, the NAND FLASH particle screening test base plate 400 is provided with a control board 100 and a plurality of NAND particle test socket bases 500 .

[0035] The control board 100 is equipped with a programmable control chip 300 and a connector 200. The programmable control chip 300 is connected to the NAND FLASH particle screening test base 400 via the connector 200 to complete signal transmission. The NAND particle test socket base 500 is confirmed to have a NAND FLASH storage device to be tested, and the NAND FLASH storage device to be tested is connected to the NAND FLASH particle screening test base 400.

[0036] Preferably, to meet the varying access rates of NAND FLASH chips (33Mhz to 1.2Ghz), the programmable control chip 300 on the control board 100 uses a high-performance programmable device to meet different rate tests. To meet the needs of batch (1-32 pcs / time) NAND chip screening, a 4-pc high-speed connector (80-120 pins / pcs) can be used to expand the 8-channel control path. Each channel can be independently controlled, facilitating the expansion of NAND chips.

[0037] Preferably, in order to facilitate the taking and placing of NAND particles during testing, the NAND particle testing socket base 500 adopts an open and close socket base and is fixed with screws, so that the NAND particle testing socket base 500 can be easily replaced when damaged.

[0038] Preferably, the NAND FLASH particle screening test base plate 400 is provided with a plurality of indicator lights 510 , each indicator light 510 is paired with a NAND particle test socket base 500 to complete the test status display of the NAND FLASH storage particle to be tested on the corresponding NAND particle test socket base 500 .

[0039] Furthermore, in order to indicate the NAND FLASH particle test status, the indicator light 510 has a plurality of color light outputs, and intuitively displays the status through different lighting modes, which is convenient for the test personnel to perform actual operations.

[0040] Preferably, a power module 600 is provided on the NAND FLASH particle screening test base board 400 , and the power module 600 is used to supply power to the NAND FLASH particle screening test base board 400 and the control board 100 .

[0041] Preferably, the NAND FLASH particle screening test baseboard 400 is provided with a gigabit network port 610 and / or a PCIE interface for accessing the control board 100 .

[0042] Furthermore, an independently controllable power supply module 600 can be designed to independently power on and off the NAND chip test unit, allowing unneeded modules to be shut down at any time through the user interface to reduce power consumption. Remote network control is also possible through different user interfaces (Gigabit Ethernet port 600 or PCIE interface 610B), making it easy for users to update the system to adapt to different chip models.

[0043] In order to facilitate the differences in access protocols of different models of NAND particles, this application uses a programmable device chip 300 to replace the traditional dedicated main control chip, so that testers and designers can modify the control chip logic program and control chip pin definition according to different protocol scenarios to adapt to the differences between different series of particles.

[0044] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent replacements and improvements made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A NAND particle screening test device, characterized in that: The NAND particle screening test device comprises: a NANDFLASH particle screening test base plate (400); The NAND FLASH particle screening test base plate (400) is provided with a control single board (100) and a plurality of NAND particle test socket bases (500); The control single board (100) is provided with a programmable control chip (300) and a connector (200), and the programmable control chip (300) is connected to a NAND FLASH particle screening test baseboard (400) via the connector (200) to complete signal transmission; The NAND FLASH storage particles to be tested are confirmed to be present on the NAND particle test socket base (500), and the connection between the NAND FLASH storage particles to be tested and the NAND FLASH particle screening test base plate (400) is completed.

2. The NAND particle screening test device according to claim 1, wherein: The NAND FLASH particle screening test base plate (400) is provided with a plurality of indicator lights (510), each indicator light (510) being paired with a NAND particle test socket base (500) for displaying the test status of the NAND FLASH storage particle to be tested on the corresponding NAND particle test socket base (500).

3. The NAND particle screening test device according to claim 2, wherein: The indicator light (510) has a plurality of medium color light outputs.

4. The NAND particle screening test device according to claim 1, wherein: A power supply module (600) is provided on the NAND FLASH particle screening test baseboard (400), and the power supply module (600) is used to supply power to the NAND FLASH particle screening test baseboard (400) and the control single board (100).

5. The NAND particle screening test device according to claim 1, wherein: The NAND FLASH particle screening test baseboard (400) is provided with a gigabit network port (610) and / or a PCIE interface (610B) for accessing the control board (100).

6. The NAND particle screening test device according to claim 1, wherein: The control single board (100) uses 4 pcs of connectors (200) to expand 8-channel control paths, and each channel is independently controlled.

7. The NAND particle screening test device according to claim 1, wherein: The NAND particle test socket base (500) adopts an open-close type socket base.

8. The NAND particle screening test device according to claim 1, wherein: The NAND particle test socket base (500) is fixed on the NAND FLASH particle screening test base plate (400) by screws.

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