Board-level test probe

Abstract

The utility model relates to a board-level test probe, belongs to the technical field of chip testing, and aims to solve the problems that the existing chip test probe with a four-component structure is difficult to process and assemble and high in manufacturing cost due to the fact that the number of components is large, the structure is tedious and the connection relation of the components is complex. And during testing, the problem of low testing precision caused by large deflection of the needle tail and long signal transmission path is solved. The device comprises a needle cylinder and a probe, wherein the needle cylinder is of a hollow cylindrical structure with an opening in one side; one end of the probe extends from the opening of the needle cylinder to form an extending end, the other end of the probe extends to the outer side of the needle cylinder to form a test needle head, and the extending end of the probe is connected with the inner wall of the needle cylinder in a sliding fit manner. The needle cylinder and the needle tail are combined into a whole, the probe only comprises the probe body, the elastic piece and the needle cylinder, the number of components is reduced, the component assembly error is reduced, the probe precision can be improved, and signal transmission loss between the components is reduced.

Description

Technical Field

[0001] This utility model relates to a board-level test probe, belonging to the field of chip testing technology. Background Technology

[0002] Test probes can be used to evaluate the electrical characteristics of chips, semiconductor components, integrated circuits, flat panel displays, etc., specifically to perform power-on and insulation checks.

[0003] In existing technologies, most chip test probes employ a four-component structure. (See [reference]) Figure 1 Specifically, the test probe consists of a syringe (1), an elastic element (2), an upper needle (3), and a lower needle (4). The syringe is a cylindrical structure with openings on both sides and a continuous interior. The upper and lower needles are respectively installed on the openings on both sides of the syringe, with parts of the needle bodies of the upper and lower needles disposed inside the syringe and connected by the elastic element. Existing four-component test probes suffer from low production efficiency due to the large number of components during assembly. After assembly, during testing, the needle tail (i.e., the lower needle) exhibits significant deflection, resulting in a long signal transmission path and unstable operation. Therefore, a test probe is needed to address the problems of existing four-component chip test probes, which suffer from difficulties in processing and assembly due to the large number of components, complex structure, and intricate connections, leading to high manufacturing costs. Furthermore, the large needle tail deflection and long signal transmission path during testing result in low testing accuracy. Utility Model Content

[0004] The purpose of this invention is to provide a board-level test probe to solve the problems mentioned in the background art.

[0005] To achieve the above objectives, the present invention provides the following technical solution: a plate-level test probe, comprising a syringe and a probe, wherein the syringe is a cylindrical structure with an opening on one side and a hollow interior; one end of the probe extends from the opening of the syringe to form an insertion end, and the other end extends to the outside of the syringe to form a test needle, and the insertion end of the probe is slidably connected to the inner wall of the syringe.

[0006] Specifically, the probe's insertion end is connected to the inner wall of the syringe by an elastic element that slides between the probe and the inner wall of the syringe.

[0007] Specifically, an elastic element is provided between the end of the syringe furthest from the opening and the insertion end of the probe.

[0008] Specifically, the elastic element is a spring, and the probe insertion end and the end of the syringe barrel away from the opening side are tightly fitted and fixed by a locking point.

[0009] Specifically, the probe has an inwardly recessed guide portion in the needle body area near the insertion end.

[0010] Specifically, the probe is located on the needle body outside the syringe barrel and has an outwardly protruding boss structure. The probe stops at the opening of the syringe barrel through the boss structure to restrict the probe from sliding towards the inside of the syringe barrel.

[0011] Specifically, the cylindrical body at the opening of the syringe extends outward to form a limiting part whose shape matches the boss.

[0012] Specifically, the probe's test needle tip is equipped with a cone-shaped needle.

[0013] Specifically, there are several cone-shaped needles, and these cone-shaped needles are evenly distributed at the end of the test needle.

[0014] Specifically, an vent is provided at the end of the syringe furthest from the opening. This design allows gas to be expelled from the syringe as the probe slides towards the inside, preventing obstruction of the probe's movement.

[0015] Compared with the prior art, the beneficial effects of this utility model are:

[0016] 1. This application designs the syringe as a hollow cylindrical structure with an opening on one side. One end of the probe extends into the syringe to form an insertion end, which is slidably connected to the opening of the syringe. The other end of the syringe is a semi-closed structure with a vent hole. An elastic element is placed between the insertion end and the semi-closed end of the syringe. Compared to existing chip test probes, this application integrates the syringe and the probe tail into one unit. The probe consists only of the probe, the elastic element, and the syringe, reducing the number of components, lowering assembly errors, improving probe accuracy, and reducing signal transmission loss between components. Furthermore, because one end of the syringe in this application is a closed structure, and the probe is only slidably positioned at the syringe opening, errors due to probe tail wobbling are avoided compared to existing test probes, ensuring the accuracy of probe component installation. The test probe of this application adopts a three-component structure, reducing assembly time and the number of components, thereby lowering product costs. In a three-component test probe, the probe tip contacts the chip, and the syringe barrel contacts the circuit board of the test equipment. Compared to a four-component test probe, this reduces the signal transmission path and improves the probe's testing accuracy. The test current passes through the probe and syringe barrel to the circuit board, resulting in lower impedance. Reducing the current transmission path allows the test probe of this application to carry a larger test current.

[0017] 2. Based on the foregoing, the probe of this application has an inwardly recessed guide portion in the needle body area near the insertion end. When the test probe of this application is used for testing, the guide portion of the insertion end of the probe does not contact the syringe, so as to reduce the sliding resistance between the insertion end and the syringe, so that the probe slides smoothly and will not cause the probe to wear off, so that the probe can slide stably along the axis of the syringe.

[0018] 3. Building upon the foregoing, the test probe of this application has an outwardly protruding boss structure on the needle body located outside the syringe barrel. The probe abuts against the opening of the syringe barrel through the boss structure to restrict the probe's sliding movement towards the inside of the syringe barrel. This boss structure prevents the probe from completely sliding into the syringe barrel. Furthermore, during testing, to prevent the boss structure of the probe from repeatedly impacting the opening of the syringe barrel and causing deformation of the syringe barrel opening, this application provides an outwardly extending limiting part at the opening of the syringe barrel, forming a shape adapted to the boss. This reduces the direct impact of the probe's boss structure on the syringe barrel opening and extends the service life of the test probe.

[0019] 4. Building upon the foregoing, the probe of this application has a conical needle tip at its end. Furthermore, there are several conical needle tips evenly distributed at the end of the probe tip. This ensures effective contact between the probe tip and the chip during testing, improving the contact stability of the needle tip. Attached Figure Description

[0020] Figure 1 This is a schematic diagram of a test probe with a four-component structure in the prior art.

[0021] Figure 2 This is a schematic diagram of the board-level test probe in this embodiment. Detailed Implementation

[0022] To make the objectives and advantages of this utility model clearer, the following detailed description is provided in conjunction with embodiments. It should be understood that the following text is merely used to describe one or more specific embodiments of this utility model and does not strictly limit the scope of protection specifically claimed by this utility model.

[0023] Please see Figure 2 This embodiment discloses a plate-level test probe, including a syringe 5 and a probe 6. The syringe 5 is a cylindrical structure with an opening on one side and a hollow interior. One end of the probe extends from the opening of the syringe to form an insertion end 7, and the other end extends to the outside of the syringe to form a test needle 8. The insertion end of the probe is slidably connected to the inner wall of the syringe.

[0024] In this embodiment, the probe's insertion end is slidably connected to the inner wall of the syringe via an elastic element 9. Specifically, an elastic element is provided between the inner end of the syringe away from the opening and the probe's insertion end. A vent hole is also provided on the inner end of the syringe away from the opening. In this embodiment, the elastic element is a spring, and the probe's insertion end and the inner end of the syringe away from the opening are tightly fitted and fixed together by a locking point.

[0025] In this embodiment, the probe has an inwardly recessed guide portion 70 in the needle body region near the insertion end.

[0026] In this embodiment, the probe is located on the needle body outside the syringe barrel and has an outwardly protruding boss structure 71. The probe abuts against the opening of the syringe barrel through the boss structure to restrict the probe from sliding towards the inside of the syringe barrel. In order to improve the service life of the syringe barrel at the opening, the syringe barrel at the opening of this embodiment extends outward to form a limiting part 72 whose shape is adapted to the boss.

[0027] In addition, the end of the probe of this embodiment is provided with a plurality of evenly distributed cone-shaped needles 73.

[0028] Working Principle: The test probe in this embodiment uses a cylindrical structure with an opening on one side and a hollow interior. One end of the probe extends into the syringe to form an insertion end. In this embodiment, the insertion end is slidably connected to the opening of the syringe by a dotting method on the outer side of the needle body at the syringe opening. The other end of the syringe is a semi-closed structure with an exhaust hole. An elastic element is placed between the insertion end and the semi-closed end of the syringe. Compared to existing chip test probes, this application integrates the syringe and needle tail into one unit. The probe consists only of the probe, the elastic element, and the syringe, reducing the number of components, lowering assembly errors, improving probe accuracy, and reducing signal transmission loss between components. Furthermore, since one end of the syringe in this application is a closed structure, and the probe is only slidably positioned at the syringe opening, errors due to needle tail swaying are avoided compared to existing test probes, ensuring the installation accuracy of the probe components. The test probe of this application adopts a three-component structure, which reduces assembly time and the number of components, thereby reducing product costs. In a three-component test probe, the probe tip contacts the chip, and the syringe barrel contacts the circuit board of the test equipment. Compared to a four-component test probe, this reduces the signal transmission path and improves the probe's testing accuracy. The test current passes through the probe and syringe barrel to the circuit board, resulting in lower impedance. Reducing the current transmission path allows the test probe of this application to carry a larger test current.

[0029] During testing, the cone-shaped test tip of the probe contacts the chip, and the probe body retracts into the syringe. Under the action of spring force, the test tip remains connected to the chip, while the syringe transmits the signal to the circuit board for testing.

[0030] The embodiments of the present invention have been described in detail above. However, the present invention is not limited to the above embodiments. For those skilled in the art, after learning the contents of the present invention, several equivalent changes and substitutions can be made without departing from the principle of the present invention. These equivalent changes and substitutions should also be considered to fall within the protection scope of the present invention.

Claims

1. A plate-level test probe, comprising a syringe and a probe, characterized in that: The syringe is a cylindrical structure with an opening on one side and a hollow interior; one end of the probe extends from the opening of the syringe to form an insertion end, and the other end extends to the outside of the syringe to form a test needle, and the insertion end of the probe is slidably connected to the inner wall of the syringe.

2. The board-level test probe according to claim 1, characterized in that: The probe's insertion end is slidably connected to the inner wall of the syringe by an elastic element.

3. A plate-level test probe according to claim 2, characterized in that: An elastic element is provided between the end of the syringe furthest from the opening and the insertion end of the probe.

4. A plate-level test probe according to claim 3, characterized in that: The elastic element is a spring, and the probe insertion end and the end of the syringe barrel away from the opening side are tightly fitted and fixed by a locking point.

5. A plate-level test probe according to claim 1, characterized in that: The probe has an inwardly recessed guide portion in the needle body area near the insertion end.

6. A plate-level test probe according to claim 1, characterized in that: The probe is located on the needle body outside the syringe barrel and has an outwardly protruding boss structure. The probe abuts against the opening of the syringe barrel through the boss structure to restrict the probe from sliding towards the inside of the syringe barrel.

7. A plate-level test probe according to claim 6, characterized in that: The cylindrical body at the opening of the syringe extends outward to form a limiting part whose shape matches the boss.

8. A board-level test probe according to claim 1, characterized in that: The probe has a cone-shaped needle tip at the end of its test needle.

9. A board-level test probe according to claim 8, characterized in that: The number of cone-shaped needles is several, and the several cone-shaped needles are evenly distributed at the end of the test needle.

10. A plate-level test probe according to claim 3, characterized in that: An exhaust hole is provided at the end of the syringe furthest from the opening.

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