Chip test fixture structure with temperature control function

Abstract

The utility model discloses a chip test fixture structure with a temperature control function, which comprises a test seat, a PCB (printed circuit board), a spring needle assembly, a PCB bonding pad and a contact plate, the test seat is vertically arranged above the PCB and is connected onto the PCB, the spring needle assembly is positioned on one side of the test seat and is connected with the test seat, the spring needle assembly is connected with the PCB bonding pad and the contact plate, and the PCB bonding pad is connected with the contact plate. The PCB bonding pad is located below the spring needle assembly and connected to the PCB, the contact plate is located above the spring needle assembly and connected to the test seat, the PCB bonding pad and the contacts on the contact plate are connected with the spring needles in a needle contact mode, and compared with a connector connection mode, the PCB bonding pad and the contacts on the contact plate are more reliable and safer, the service life of hardware is prolonged, and the maintainability of the hardware is improved.

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, specifically a chip testing fixture structure with temperature control function. Background Technology

[0002] The existing chip test socket works by placing the chip in the chip placement position of the test socket, covering the chip placement position with a cover, and clamping the chip between the bottom socket and the upper cover, so that the chip pins can make full contact with the spring pins, and the chip can be controlled to perform specific functions.

[0003] However, the fan, heating rod and temperature sensor inside the test fixture are usually led out by cables, which has problems such as messy cables, space occupation, poor contact, short service life and difficulty in maintenance. Utility Model Content

[0004] The present invention aims to overcome the shortcomings of the prior art, such as messy cables, space occupation, poor contact, short service life, and difficulty in maintenance.

[0005] A chip test fixture structure with temperature control function is proposed, including a test base, a PCB board, a spring pin assembly, PCB pads, and a contact plate. The test base is vertically arranged above the PCB board and connected to the PCB board. The spring pin assembly is located on one side of the test base and connected to the test base. The spring pin assembly is connected to the PCB pads and the contact plate. The PCB pads are located below the spring pin assembly and connected to the PCB board. The contact plate is located above the spring pin assembly and connected to the test base.

[0006] In this utility model, the cables of the fan, heating rod, and temperature sensor inside the test holder are all connected to the contact plate. The contact plate has multiple contacts and a spring pin assembly below it. The PCB board has multiple PCB pads located at the position of the spring pin assembly. When the upper and lower ends of the spring pin inside the spring pin assembly abut against the contacts and PCB pads respectively, the circuit between the PCB board, the spring pin assembly, and the contact plate is connected. Therefore, the operator can start or stop the fan, heating rod, and temperature sensor at this time. Thus, the cables of the fan, heating rod, and temperature sensor do not need to be connected to the PCB board through connectors, thereby solving the shortcomings mentioned in the technical background, such as messy cables, space occupation, poor contact, short service life, and difficulty in maintenance.

[0007] In a preferred embodiment of the present invention, the contact plate is a PCB motherboard. PCB motherboards are small in size, lightweight, and highly reliable, thus they are more durable and easier to maintain.

[0008] In a preferred embodiment of the present invention, the contact plate is electrically connected to the heating rod, fan, and temperature sensor inside the test holder. The wires of the heating rod, fan, and temperature sensor are all connected to the contact plate, eliminating the cables and connectors on the heating rod, fan, and temperature sensor used for connecting to the PCB board, thus making the test holder simpler and more reliable overall.

[0009] In a preferred embodiment of the present invention, the contact plate is provided with multiple contacts below it, and the spring pin assembly is connected to the contact plate through the contacts. The contacts are made of copper. Therefore, when the spring pin assembly comes into contact with the contacts, the spring pin assembly can connect the heating rod, the fan, and the temperature sensor to the circuit of the spring pin assembly through the contact plate.

[0010] In a preferred embodiment of the present invention, the spring pin assembly includes a housing, a fixing box, a locking block, a first spring, a drawstring, a spring pin, and a locking assembly. The housing is connected to the test base. There are two locking blocks, both of which are located inside the housing. The fixing box is located on one side of the housing and is connected to the housing via the locking blocks. The first spring is horizontally positioned between the two locking blocks. The drawstring is located at the lower end of the first spring, and both ends of the drawstring are connected to the two locking blocks respectively. There are multiple spring pins, all of which are vertically positioned on one side of the fixing box. The spring pins are connected to the fixing box via the locking assembly. After the upper and lower ends of the spring pin abut against the PCB pad and the contact plate respectively, the circuit between the PCB pad and the contact plate can be connected through the spring pin.

[0011] In a preferred embodiment of the present invention, the fixing box is provided with two connecting blocks, each of which is provided with a first slot. When the slot is inserted into the slot, the fixing box can be connected to the shell.

[0012] In a preferred embodiment of the present invention, the snap-fit ​​assembly includes a clamp, a guide cylinder, a fixing cylinder, a second spring, and a stop block. The clamp is fitted onto the spring pin, the fixing cylinder is vertically mounted on the fixing box, the guide cylinder is vertically mounted below the clamp and connected to the fixing cylinder, the second spring is mounted inside the fixing box and fitted onto the fixing cylinder, and the stop block is located on one side of the clamp and connected to the clamp. The fixing box has a second slot corresponding to the stop block. When a spring pin is damaged, the damaged spring pin can be removed from the fixing box using the clamp, thus eliminating the need for complete replacement and saving resources.

[0013] In a preferred embodiment of the present invention, the clamp includes a first clamp body, a second clamp body, a bolt, and a nut. One end of the first clamp body and the second clamp body are hinged together. The bolt is located at the other end of the first clamp body, and one end of the bolt is hinged to the first clamp body. The nut is threadedly connected to the other end of the bolt. When the clamp is closed, the nut is rotated forward until the end of the nut abuts against the second clamp body, and the clamp can be closed, thereby preventing the clamp from being accidentally opened during use.

[0014] In a preferred embodiment of the present invention, a rubber pad is adhered to the inner wall of the first hoop and the second hoop. The rubber pad is made of insulating material and is in contact with the outer wall of the spring needle. Therefore, leakage can be avoided when transmitting current through the spring needle.

[0015] The advantages of this utility model compared with the prior art are:

[0016] In this invention, the heating rod, fan, and temperature sensor inside the test holder are electrically connected to the contact plate. Therefore, when the upper end of the spring pin abuts against the contact point, the circuit between the PCB board, the spring pin, and the contact plate is connected. At this time, the operator can start or stop the heating rod, fan, and temperature sensor through the PCB board. This replaces the previous method of connecting the cables of the heating rod, fan, and temperature sensor to the PCB board using connectors. This makes the test holder simpler and more reliable, eliminating the need for cables and connectors, saving materials such as cables and connectors, reducing costs, reducing the space occupied on the PCB board, and improving the rationality of the board layout. The PCB pads and the contacts on the contact plate are connected to the spring pin through pin contact, which is more reliable and safer than the connector connection method, improving the service life and maintainability of the hardware. Attached Figure Description

[0017] Figure 1 A schematic diagram of a chip testing fixture with temperature control function;

[0018] Figure 2 A schematic diagram showing the connection between a spring pin assembly and a contact plate in a chip testing fixture structure with temperature control function;

[0019] Figure 3 A schematic diagram of the contact plate of a chip testing fixture structure with temperature control function;

[0020] Figure 4 A schematic diagram of a spring pin assembly structure for a chip testing fixture with temperature control function;

[0021] Figure 5 A schematic diagram of the housing structure of a spring pin assembly for a chip testing fixture with temperature control function;

[0022] Figure 6 A schematic diagram of a connecting block for a chip testing fixture structure with temperature control function;

[0023] Figure 7 Left view schematic diagram of the housing structure of a chip testing fixture with temperature control function;

[0024] Figure 8 for Figure 7A schematic diagram of the AA half section;

[0025] Figure 9 A schematic diagram of a fixed box structure for a chip testing fixture with temperature control function;

[0026] Figure 10 A top view schematic diagram of a fixed box for a chip testing fixture structure with temperature control function;

[0027] Figure 11 for Figure 10 BB half-section diagram;

[0028] Figure 12 A schematic diagram showing the connection between the fixing box and the snap-fit ​​assembly of a chip test fixture structure with temperature control function;

[0029] Figure 13 for Figure 12 CC half-section diagram;

[0030] Figure 14 A schematic diagram of the snap-fit ​​assembly and fixing box structure of a chip test fixture with temperature control function;

[0031] Figure 15 for Figure 14 A schematic diagram of point D;

[0032] Figure 16 A schematic diagram of a clamp structure for a chip testing fixture with temperature control function;

[0033] Figure 17 A schematic diagram of the clamp opening structure of a chip testing fixture with temperature control function;

[0034] In the diagram: 1-Test base, 2-PCB board, 3-Spring pin assembly, 31-Housing, 32-Fixing box, 33-Card block, 34-First spring, 35-Drawstring, 36-Spring pin, 37-Second slot, 4-PCB pad, 5-Contact plate, 6-Contact point, 7-Card assembly, 71-Guide cylinder, 72-Fixing cylinder, 73-Second spring, 74-Stop block, 8-Connecting block, 81-First slot, 9-Clamp, 91-First clamp body, 92-Second clamp body, 93-Bolt, 94-Nut, 10-Rubber pad. Detailed Implementation

[0035] The following will refer to the appendix in the embodiments of this utility model. Figure 1-17 The technical solutions in the embodiments of this utility model will be described in detail below.

[0036] like Figure 1-3As shown, a chip test fixture structure with temperature control function includes a test base 1, a PCB board 2, a spring pin assembly 3, a PCB pad 4 and a contact plate 5. The test base 1 is vertically arranged above the PCB board 2 and is connected to the PCB board 2.

[0037] like Figure 1-3 As shown, when it is necessary to test the chip, the test socket 1 is opened and the chip is placed inside the test socket 1. Then the test socket 1 can be closed to measure the chip through the test socket 1.

[0038] like Figure 1-3 As shown, the spring pin assembly 3 is horizontally arranged on one side of the test socket 1 and connected to the test socket 1. After the chip is placed inside the test socket 1, the spring pin assembly 3 can supply power to the heating rod, fan and temperature sensor inside the test socket 1, thereby starting or stopping the heating rod, fan and temperature sensor.

[0039] like Figure 1-3 As shown, the contact plate 5 is positioned above the spring pin assembly 3 and connected to the test base 1. The contact plate 5 is electrically connected to components such as the heating rod, fan, and temperature sensor inside the test base 1. The spring pin assembly 3 is electrically connected to the contact plate 5.

[0040] like Figure 1-3 As shown, after the spring pin assembly 3 comes into contact with the contact plate 5, the spring pin assembly 3 can supply power to the heating rod, fan and temperature sensor through the contact plate 5. There are multiple PCB pads 4, all of which are located below the spring pin assembly 3, and the PCB pads 4 are soldered onto the PCB board 2.

[0041] like Figure 1-3 As shown, PCB pad 4 is electrically connected to PCB board 2, and spring pin assembly 3 abuts against PCB pad 4. Therefore, when spring pin assembly 3 abuts against PCB pad 4 and contact plate 5, the circuit between PCB board 2, spring pin assembly 3 and contact plate 5 will be connected.

[0042] like Figure 1-3 As shown, at this time, the staff can supply power to the heating rod, fan and temperature sensor through PCB pad 4, and the data measured by the temperature sensor and other devices can also be transmitted to PCB board 2 through contact plate 5 and spring pin assembly 3, and then transmitted out through PCB board 2.

[0043] like Figure 1-3 As shown, the contact plate 5 is horizontally arranged on one side of the test base 1. The contact plate 5 is a PCB motherboard. The contact plate 5 is bonded to the test base 1. The wires of the heating rod, fan and temperature sensor are all connected to the contact plate 5.

[0044] like Figure 1-3As shown, the contact plate 5 is provided with multiple contacts 5. The contacts 5 are welded to the contact plate 5 and are all located below the contact plate 5. The material of the contacts 5 is copper. Therefore, when the spring pin assembly 3 comes into contact with the contacts 5...

[0045] like Figure 1-3 As shown, the spring pin assembly 3 can connect the heating rod, fan and temperature sensor to the circuit through the contact plate 5, so the heating rod, fan and temperature sensor do not need to be connected to the PCB board 2 through cables and connectors.

[0046] like Figure 4-10 As shown, the spring needle assembly 3 includes a housing 31, a fixing box 32, a locking block 33, a first spring 34, a drawstring 35, a spring needle 36, and a locking assembly 7. The housing 31 is disposed on one side of the test base 1 and is bonded to the test base 1.

[0047] like Figure 4-10 As shown, there are two locking blocks 33, both of which are disposed inside the housing 31 and respectively at both ends of the housing 31. Both locking blocks 33 are slidably connected to the housing 31, and both ends of the locking blocks 33 are provided with inclined surfaces.

[0048] like Figure 4-10 As shown, the fixing box 32 is located on one side of the housing 31. The fixing box 32 has multiple second slots 37 that cooperate with the locking blocks 33. A connecting block 8 is provided on the back of the fixing box 32 at the position of each of the two locking blocks 33.

[0049] like Figure 4-10 As shown, both connecting blocks 8 are bonded to the fixed box 32, and the two connecting blocks 8 are provided with inclined surfaces corresponding to the inclined surfaces of the card block 33. The housing 31 is provided with grooves at the positions of the two connecting blocks 8, and the connecting blocks 8 are provided with first slots 81 for connecting the card blocks 33.

[0050] like Figure 4-10 As shown, when it is necessary to connect the fixing box 32 to the housing 31, simply insert the connecting block 8 into the groove of the housing 31. During this process, the connecting block 8 will press the two locking blocks 33 synchronously toward the middle position of the housing 31 through the locking block 33 and the inclined surface on the connecting block 8.

[0051] like Figure 4-10 As shown, the first spring 34 is located inside the fixed box 32 and is positioned horizontally in the middle of the two locking blocks 33. The two ends of the first spring 34 are connected to the two locking blocks 33 respectively. Therefore, when the two locking blocks 33 move synchronously towards the middle position of the housing 31, the two locking blocks 33 will squeeze the first spring 34.

[0052] like Figure 4-10As shown, this causes the first spring 34 to deform and store force. Then, after the end of the locking block 33 moves to the position of the first locking groove 81 on the connecting block 8, the first spring 34 will use the stored force to pop the two locking blocks 33 outward until the locking blocks 33 are inserted into the interior of the first locking groove 81, thereby connecting the fixing box 32 and the housing 31 together.

[0053] like Figure 4-10 As shown, the drawstring 35 is located below the housing 31, and both ends of the drawstring 35 are respectively attached to two locking blocks 33. Therefore, when it is necessary to separate the fixing box 32 from the housing 31, simply pull the drawstring 35 downwards.

[0054] like Figure 4-10 As shown, when the draw rope 35 moves downward, it will drive the two synchronously towards the middle position of the housing 31 until the locking block 33 is pulled out from the inside of the first locking slot 81, at which point the fixing box 32 can be removed from the housing 31.

[0055] like Figure 4-10 As shown, when the drawstring 35 is released, the first spring 34 will pop the two locking blocks 33 outward until the two locking blocks 33 return to their original positions. There are multiple spring pins 36, which are vertically arranged on one side of the fixing box 32 according to the length direction of the fixing box 32.

[0056] like Figure 4-10 As shown, each spring pin 36 is connected to the fixing box 32 via the snap-fit ​​assembly 7. Each spring pin 36 has a PCB pad 4 below it. When the fixing box 32 is connected to the housing 31, the lower end of each spring pin 36 abuts against the PCB pad 4.

[0057] like Figure 11-15 As shown, the snap-fit ​​assembly 7 includes a clamp 9, a guide cylinder 71, a fixing cylinder 72, a second spring 73, and a stop block 74. The clamp 9 is sleeved on the spring pin 36, and the fixing cylinder 72 is vertically arranged on the fixing box 32, with the lower end of the fixing cylinder 72 slidably connected to the fixing box 32.

[0058] like Figure 11-15 As shown, the fixed box 32 has a through hole vertically located at the position of the guide cylinder 71, and the second spring 73 is vertically arranged inside the fixed box 32, and the second spring 73 is located below the fixed cylinder 72 and sleeved on the fixed cylinder 72.

[0059] like Figure 11-15 As shown, the two ends of the second spring 73 are connected to the fixed box 32 and the fixed cylinder 72 respectively. Therefore, when the fixed cylinder 72 moves downward, the second spring 73 will deform and store force. The guide cylinder 71 is vertically arranged below the clamp 9, and the top end of the guide cylinder 71 is attached to the clamp 9.

[0060] like Figure 11-15As shown, the bottom end of the guide cylinder 71 is inserted into the inside of the fixed cylinder 72. The stop block 74 is located on one side of the clamp 9, and one end of the stop block 74 is connected to the clamp 9. Therefore, after the spring pin 36 is inserted into the inside of the clamp 9 and fixed to the clamp 9,

[0061] like Figure 11-15 As shown, the guide cylinder 71 can be vertically inserted into the interior of the fixed cylinder 72, and then the clamp 9 and the fixed cylinder 72 can be pressed down. After the stop block 74 moves to the preset rotating groove of the fixed box 32, the clamp 9 and the spring pin 36 are rotated in the forward direction until the other end of the stop block 74 is rotated into the interior of the fixed box 32, and then the clamp 9 can be released.

[0062] like Figure 11-15 As shown, the second spring 73 then pushes the fixed cylinder 72, clamp 9 and spring pin 36 upwards simultaneously. As the clamp 9 moves upwards, it will drive the stop block 74 to move upwards simultaneously until the end of the stop block 74 is inserted into the second slot 37 preset on the fixed box 32. Then the spring pin 36 can be connected to the fixed box 32 through the clamp 9 and the stop block 74.

[0063] like Figure 16-17 As shown, the clamp 9 includes a first clamp body 91, a second clamp body 92, a bolt 93 and a nut 94. One end of the first clamp body 91 and the second clamp body are hinged together, and rubber pads 10 are glued to the inner walls of both the first clamp body 91 and the second clamp body, and multiple grooves are opened on both rubber pads 10.

[0064] like Figure 16-17 As shown, after opening the first clamp 91 and the second clamp 92, the spring pin 36 can be placed vertically inside the clamp 9. Then, the first clamp 91 and the second clamp 92 are closed, at which point the two rubber pads 10 will come into contact with the outer wall of the spring pin 36.

[0065] like Figure 16-17 As shown, the rubber pad 10 is made of insulating material, so leakage can be avoided. The bolt 93 is located at the other end of the first hoop 91 and is set in the groove in the middle of the first hoop 91, and one end of the bolt 93 is hinged to the first hoop 91.

[0066] like Figure 16-17 As shown, the nut 94 is threaded onto the other end of the bolt 93. Therefore, after the spring pin 36 is placed vertically inside the clamp 9, the bolt 93 is rotated forward until the end of the bolt 93 with the nut 94 is rotated into the groove preset in the middle position of the second clamp 92.

[0067] like Figure 16-17As shown, once the nut 94 is located outside the second hoop 92, the nut 94 can be rotated forward until the end of the nut 94 abuts against the second hoop 92, thus closing the second hoop 92 and the first hoop 91.

[0068] The movement process of this embodiment is as follows: After the clamp 9 is opened and the spring pin 36 is placed inside the clamp 9, the clamp 9 can be closed and the guide cylinder 71 can be vertically inserted into the fixed cylinder 72. Then, the fixed cylinder 72 and the clamp 9 are pressed down. After the stop block 74 moves down to the position of the rotating groove, the clamp 9 and the spring pin 36 are rotated in the forward direction.

[0069] Once the end of the stop 74 is inserted into the second slot 37 pre-set on the fixed box 32, the fixed cylinder 72 is released, so that the second spring 73 pops the fixed cylinder 72, guide cylinder 71 and clamp 9 upward. As the clamp 9 moves upward, it will simultaneously drive the stop 74 and spring pin 36 to move upward until the stop 74 is completely inserted into the second slot 37.

[0070] After all the spring pins 36 are connected to the fixed box 32 by the clamps 9 and the stop blocks 74, the connecting block 8 on the back of the fixed cylinder 72 can be inserted into the preset groove of the housing 31. When the card block 33 is inserted into the first card slot 81.

[0071] The upper and lower ends of the spring pin 36 will also abut against the PCB pad 4 and the contact 5 respectively. Therefore, the circuit between the PCB board 2, the spring pin 36 and the contact plate 5 will be connected at this time. The heating rod, fan and temperature sensor wires inside the test socket 1 are all connected to the contact plate 5.

[0072] The solder joint is electrically connected to the contact plate 5. Therefore, the upper and lower ends of the spring pin 36 abut against the PCB solder pad 4 and the contact 5 respectively. After the circuit between the PCB board 2, the spring pin 36 and the contact plate 5 is connected, the operator can open the test socket 1 and put the chip into the test socket 1.

[0073] Then, test chamber 1 is shut down. After that, the staff can start and stop the heating rod, fan and temperature sensor inside test chamber 1 to control the fan speed and transmit the temperature sensor monitoring information.

[0074] The above embodiments are only for illustrating the technical concept of this utility model and should not be used to limit the protection scope of this utility model. Any modifications made to the technical solution based on the technical concept proposed by this utility model shall fall within the protection scope of this utility model.

Claims

1. A chip testing fixture structure with temperature control function, characterized in that: The test fixture includes a test stand (1), a PCB board (2), a spring pin assembly (3), a PCB pad (4), and a contact plate (5). The test stand (1) is vertically positioned above the PCB board (2) and connected to the PCB board (2). The spring pin assembly (3) is located on one side of the test stand (1) and connected to the test stand (1). The spring pin assembly (3) is connected to the PCB pad (4) and the contact plate (5). The PCB pad (4) is located below the spring pin assembly (3) and connected to the PCB board (2). The contact plate (5) is located above the spring pin assembly (3) and connected to the test stand (1).

2. The chip testing fixture structure with temperature control function according to claim 1, characterized in that: The contact plate (5) is a PCB motherboard.

3. The chip testing fixture structure with temperature control function according to claim 2, characterized in that: The contact plate (5) is electrically connected to the heating rod, fan and temperature sensor inside the test seat (1).

4. The chip test fixture structure with temperature control function according to claim 3, characterized in that: The contact plate (5) has multiple contacts (6) below it, and the spring pin assembly (3) is connected to the contact plate (5) through the contacts (6).

5. The chip test fixture structure with temperature control function according to claim 4, characterized in that: The spring needle assembly (3) includes a housing (31), a fixing box (32), a locking block (33), a first spring (34), a drawstring (35), a spring needle (36), and a snap-fit ​​assembly (7). The housing (31) is connected to the test base (1). There are two locking blocks (33), both of which are located inside the housing (31). The fixing box (32) is located on one side of the housing (31) and is connected to the housing (31) through the locking blocks (33). The first spring (34) is horizontally positioned in the middle of the two locking blocks (33). The drawstring (35) is located at the lower end of the first spring (34), and both ends of the drawstring (35) are connected to the two locking blocks (33) respectively. There are multiple spring needles (36), all of which are vertically positioned on one side of the fixing box (32), and the spring needles (36) are connected to the fixing box (32) through the snap-fit ​​assembly (7).

6. The chip test fixture structure with temperature control function according to claim 5, characterized in that: The fixed box (32) is provided with two connecting blocks (8), and each of the two connecting blocks (8) is provided with a first slot (81).

7. A chip testing fixture structure with temperature control function according to claim 5, characterized in that: The snap-fit ​​assembly (7) includes a clamp (9), a guide cylinder (71), a fixing cylinder (72), a second spring (73), and a stop (74). The clamp (9) is sleeved on the spring pin (36). The fixing cylinder (72) is vertically arranged on the fixing box (32). The guide cylinder (71) is vertically arranged below the clamp (9) and connected to the fixing cylinder (72). The second spring (73) is arranged inside the fixing box (32) and sleeved on the fixing cylinder (72). The stop (74) is located on one side of the clamp (9) and connected to the clamp (9). The fixing box (32) has a second slot (37) corresponding to the stop (74).

8. The chip test fixture structure with temperature control function according to claim 7, characterized in that: The clamp (9) includes a first clamp body (91), a second clamp body (92), a bolt (93) and a nut (94). One end of the first clamp body (91) and the second clamp body (92) are hinged together. The bolt (93) is located at the other end of the first clamp body (91), and one end of the bolt (93) is hinged to the first clamp body (91). The nut (94) is threadedly connected to the other end of the bolt (93).

9. A chip testing fixture structure with temperature control function according to claim 8, characterized in that: Rubber pads (10) are adhered to the inner walls of the first hoop (91) and the second hoop (92).

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