Chip electrical testing device
By designing adjustable clamping and locking components, the problem of poor universality of existing chip testing mechanisms for chips of different sizes is solved, achieving stable clamping and accurate electrical testing of chips of different sizes.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHENZHEN YIGUANG INTELLIGENT MANUFACTURING CO LTD
- Filing Date
- 2025-05-26
- Publication Date
- 2026-05-15
AI Technical Summary
Existing chip testing institutions have poor versatility for chips of different sizes, requiring the replacement of chip substrates of different specifications, which leads to poor versatility of the testing institutions.
A chip electrical testing device is designed, comprising a detachable electrical testing component, a height-adjustable clamping component, and a pressing component. The clamping component consists of adjustable first and second clamping members, which are fixed by a locking component to ensure stable clamping and precise alignment of chips of different sizes.
It enables flexible and adaptable clamping of chips of different sizes, ensuring precise alignment between the electrical testing components and chip pins, improving the accuracy and versatility of testing, and avoiding poor contact or testing errors caused by height deviation.
Smart Images
Figure CN224247869U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the technical field of chip testing, and in particular to a chip electrical testing device. Background Technology
[0002] Electrical testing devices can measure various electrical parameters of a chip, such as voltage, current, resistance, or capacitance, which helps to evaluate whether the chip's performance meets requirements.
[0003] In some related technologies, such as patent publication number CN222232617U, a chip testing mechanism is disclosed, including a raised-character base. The raised-character base has a test board mounting cavity on one side, and mounting openings are evenly distributed on both sides above the base. The mounting openings communicate with the test board mounting cavity. A chip test board is fixedly mounted in the test board mounting cavity of the raised-character base, and chip bases are fixedly mounted in each of the mounting openings. This solution has some technical problems. For example, the chip under test needs to be fixedly mounted in the mounting opening via chip bases. This fixing method has certain requirements on the size and shape of the chip. For chips of different sizes, different specifications of chip bases need to be replaced, resulting in poor versatility of this type of testing mechanism. Utility Model Content
[0004] To overcome the shortcomings of existing technical solutions, this utility model provides a chip electrical testing device.
[0005] The technical solution adopted by this utility model to solve its technical problem is:
[0006] A chip electrical testing device, the chip electrical testing device comprising:
[0007] The base has a hollow cavity through which a clearance chamber is formed.
[0008] An electrical testing component, wherein the electrical testing component is detachably disposed within the clearance cavity;
[0009] A clamping assembly includes a support base, two first clamping members, and two second clamping members. The support base is vertically and movably mounted on the top of a base, and has a hollow clamping cavity extending through it. The cavity wall includes two opposing first cavity walls and two opposing second cavity walls. Both ends of each first clamping member are movably mounted on their respective first cavity walls. Both ends of each second clamping member are movably mounted on their respective second cavity walls. Each first clamping member and each second clamping member are perpendicularly arranged.
[0010] A pressing component is disposed on top of the base.
[0011] As a preferred technical solution of this utility model, each of the first cavity walls passes through the first limiting cavity, and the two ends of each of the first clamping members are slidably inserted into each of the first limiting cavities; each of the second cavity walls passes through the second limiting cavity, and the two ends of each of the second clamping members are slidably inserted into each of the second limiting cavities.
[0012] As a preferred technical solution of this utility model, a locking component is provided at one end of each of the first clamping members and at one end of each of the second clamping members.
[0013] As a preferred technical solution of this utility model, one end of each of the first clamping members and one end of each of the second clamping members are provided with an anti-detachment block, and each of the anti-detachment blocks is provided with a through hole.
[0014] Each locking component includes a movable rod and a locking rubber block disposed at one end of the movable rod; the movable rod moves through the through hole.
[0015] In a preferred embodiment of this invention, the through hole is a threaded hole; the movable rod is a screw.
[0016] As a preferred technical solution of this utility model, each of the first clamping members is provided with a clamping block, and each clamping block has a groove recessed on one side, and the grooves are arranged opposite to each other.
[0017] As a preferred technical solution of this utility model, the top of the base is provided with multiple guide rods, and the bottom of the support body is provided with multiple lifting holes that correspond one-to-one with each of the guide rods; each guide rod passes through each of the lifting holes.
[0018] As a preferred technical solution of this utility model, each of the guide rods is provided with a limit shaft.
[0019] As a preferred technical solution of this utility model, a plurality of elastic elements are provided between the top of the base and the bottom of the support body.
[0020] As a preferred technical solution of this utility model, the pressing assembly includes a base, a pressing block, a driver, and a lead screw; the base is provided with a lifting cavity, and the lead screw is vertically built into the lifting cavity; the driver is located on the top of the base and its power output shaft is connected to one end of the lead screw; the pressing block is provided with a nut seat, and the nut seat is movably sleeved on the lead screw.
[0021] Compared with the prior art, the beneficial effects of this utility model are:
[0022] Since each of the first and second clamping components can be movable, the operator can flexibly adjust the position of each of the first and second clamping components according to the length and width of the chip under test, so that it can stably clamp the chip under test. Then, the pressing component is used to press the support body to move down until the support body is lowered to the point where the electrical testing component can perform electrical testing on the chip under test. In this way, there is no need to customize multiple chip positioning bases suitable for different chip specifications. Attached Figure Description
[0023] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0024] Figure 1 This is an overall structural diagram of an embodiment of the present utility model.
[0025] Figure 2 This is a structural diagram of the clamping assembly according to an embodiment of the present invention.
[0026] Figure 3 yes Figure 2 A magnified view of a portion of point A in the middle.
[0027] Figure 4 This is a structural diagram of the pressing component according to an embodiment of the present invention.
[0028] Numbers in the diagram
[0029] 1. Base; 11. Clearance cavity; 12. Guide rod; 121. Limiting shaft;
[0030] 2. Clamping assembly; 21. Support base; 22. Clamping cavity; 221. First limiting cavity; 222. Second limiting cavity; 23. First clamping member; 231. Clamping block; 232. Clamping groove; 24. Second clamping member; 25. Anti-detachment block;
[0031] 3. Pressing assembly; 31. Base; 32. Pressing block; 33. Driver; 34. Lead screw;
[0032] 4. Locking assembly; 41. Movable rod; 42. Locking rubber block. Detailed Implementation
[0033] To make the technical problems, technical solutions and beneficial effects to be solved by this application clearer, the following describes this application in further detail with reference to the accompanying drawings and embodiments.
[0034] It should be understood that the specific embodiments described herein are merely illustrative of this application and are not intended to limit this application.
[0035] It should be noted that when a component is referred to as "fixed to" or "set on" another component, it can be directly on the other component or indirectly on that other component.
[0036] When a component is said to be "connected to" another component, it can be directly connected to the other component or indirectly connected to that other component.
[0037] It should be understood that the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application.
[0038] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined with "first" or "second" may explicitly or implicitly include one or more of that feature.
[0039] In the description of this application, "multiple" means two or more, unless otherwise expressly and specifically defined.
[0040] To address the technical problem that existing testing mechanisms require different chip bases 31 for different sizes of chips, resulting in poor versatility, this invention provides a chip electrical testing device.
[0041] The following describes in detail the specific structure of a chip electrical testing device provided by an embodiment of this utility model, according to the appendix. Figure 1-4 As shown, the specific structure of the chip electrical testing device includes a base 1, a clamping assembly 2, an electrical testing assembly, and a pressing assembly 3.
[0042] according to Figure 1 and Figure 2As shown, the clamping assembly 2 includes a support base 21, two first clamping members 23, and two second clamping members 24. The support base 21 is vertically mounted on the top of the base, and a clamping cavity 22 is hollowly formed in the support base 21. The cavity wall of the clamping cavity 22 includes two opposing first cavity walls and two opposing second cavity walls. The two ends of each first clamping member 23 are movably mounted on the respective first cavity wall. The two ends of each second clamping member 24 are movably mounted on the respective second cavity wall. Each first clamping member 23 and each second clamping member 24 are perpendicularly arranged.
[0043] Specifically, the vertical position adjustment of the support base 21 ensures precise alignment between the clamped chip under test (DUT) and the electrical testing components (or other electrical testing elements), avoiding poor contact or testing errors due to height deviation. The clamping cavity 22 provides space for the chip, and its dimensions must be larger than the external dimensions (e.g., length and width) of the DUT. The first and second cavity walls of the clamping cavity 22 provide installation guides and movement tracks for the first clamping members 23 and 24, respectively, ensuring that the first clamping members 23 and 24 can move in a specified direction. The two ends of the first clamping member 23 are movably disposed on the opposite first cavity walls. The horizontal sliding of the first clamping member 23 provides a lateral (left-right) clamping force on the chip, and it forms an orthogonal clamping structure with the second clamping member 24, applying constraint forces to the DUT from two mutually perpendicular directions (e.g., X and Y axes), thereby achieving precise fixation of the DUT in the plane. The two ends of the second clamping member 24 are respectively movably disposed on the opposite second cavity wall. Through the horizontal sliding of the first clamping member 23, it is ensured that it and the first clamping member 23 cooperate to form an orthogonal clamping system, jointly realizing the clamping force on the outer periphery of the chip, forming an enclosure around the chip under test, and preventing the chip under test from translating or rotating during the test. That is, according to the chip under test of different lengths, by adjusting the positions of the first clamping member 23 and the second clamping member 24, pressure can be applied to the front, back, left and right sides of the chip under test, so as to fix and clamp the chip under test of different shapes such as square, rectangle, etc., and ensure that the electrical test component can perform electrical test on the connection point of the chip under test.
[0044] Furthermore, once the chip under test is fixed and clamped, the positions of each first clamping member 23 and each second clamping member 24 can be adjusted according to the specific position of the electrical testing component. This can also adjust the position of the chip under test until the chip pins (or pads) of the chip under test are directly above the probes of the electrical testing component. This ensures that when the pressing component 3 presses down on the support body 21, the chip pins (or pads) of the chip under test can contact the probes of the electrical testing component to perform the electrical testing process.
[0045] according to Figure 1As shown, the seat body is hollow and has a clearance cavity 11 running through it; the electrical measurement component (not shown in the figure) is detachably installed in the clearance cavity 11.
[0046] Specifically, the hollow interior of the base 1 forms a clearance cavity 11 to accommodate the electrical testing component. When the support body 21 is in the initial position, the electrical testing component is located below the support body 21 and maintains a certain distance from the chip. As the entire support body 21 descends, the bottom of the chip under test gradually approaches the electrical testing component, eventually bringing the chip into contact with the electrical testing component and completing the electrical testing.
[0047] For example, the chip under test is placed in the clamping cavity 22 of the support body 21, and is adaptively positioned by the first clamping member 23 and the second clamping member 24 (horizontal / vertical). When the support body 21 is descending, the bottom of the clamping cavity 22 gradually enters the clearance cavity 11 of the base 1, and is simultaneously moved downward by the chip under test until the electrical testing component extends into the clamping cavity 22 from below. When the entire support body 21 descends to the set position, the probe module of the electrical testing component is precisely aligned and in contact with the chip pins (or pads). At this time, the electrical testing component acquires the electrical signal of the chip through the probe, and transmits it to the test instrument through the connection circuit for testing parameters such as continuity, voltage, and current.
[0048] according to Figure 1 As shown, the pressing component 3 is located on the top of the base 1.
[0049] Specifically, the pressing component 3 is used to press the entire support body 21 to move downwards. Since the chip under test has been clamped by each of the first clamping members 23 and each of the second clamping members 24 beforehand, when the support body 21 is pressed down and moved downwards, the chip under test follows it downwards until the support body 21 moves downwards until the probe module of the electrical testing component can accurately align and contact the chip pins (or pads) of the chip under test, and the electrical testing process is completed.
[0050] according to Figure 2 As shown, in some specific embodiments, each first cavity wall passes through the first limiting cavity 221, and the two ends of each first clamping member 23 are slidably inserted into each first limiting cavity 221; each second cavity wall passes through the second limiting cavity 222, and the two ends of each second clamping member 24 are slidably inserted into each second limiting cavity 222.
[0051] Specifically, each first cavity wall extends through the first limiting cavity 221, and each second cavity wall extends through the second limiting cavity 222. This arrangement provides a designated track and limiting effect for the sliding of the first clamping member 23 and the second clamping member 24, ensuring the stability and accuracy of each first clamping member 23 and each second clamping member 24 during movement. Specifically, by sliding both ends of each first clamping member 23 through each first limiting cavity 221, and both ends of each second clamping member 24 through each second limiting cavity 222, the movement of each first clamping member 23 and each second clamping member 24 is respectively restricted within the first limiting cavity 221 and the second limiting cavity 222, preventing the first clamping member 23 and each second clamping member 24 from shifting or shaking during movement.
[0052] During operation, the position of the first clamping member 23 is manually adjusted according to the size of the chip under test. Specifically, both ends of the first clamping member 23 slide within each of the first limiting cavities 221, moving towards both sides of the chip under test until the two first clamping members 23 can tightly contact the edges of the chip under test. Correspondingly, the position of the second clamping member 24 is adjusted according to the size of the chip under test. For example, both ends of the second clamping member 24 slide within each of the second limiting cavities 222, moving towards the upper and lower sides of the chip under test until both the first clamping members 23 and the second clamping members 24 can tightly contact the edges of the chip under test. The first limiting cavities 221 ensure the linearity and stability of the first clamping member 23 during movement, preventing it from shifting. The second limiting cavities 222 function similarly to the first limiting cavities 221, ensuring the linearity and stability of the second clamping member 24 during movement.
[0053] according to Figure 2 As shown, in some specific embodiments, a locking component 4 is provided at one end of each first clamping member 23 and at one end of each second clamping member 24.
[0054] Specifically, once the first clamping members 23 and the second clamping members 24 are adjusted to their appropriate positions, the locking assembly 4 can fix them in place, ensuring that neither the first clamping members 23 nor the second clamping members 24 will move due to external forces or vibrations. This prevents inaccurate test results from even the slightest movement during high-precision electrical testing. Furthermore, during testing, unexpected external forces may act on the clamping assembly 2, such as operator error or equipment vibration. Therefore, the locking assembly 4 prevents the clamping members from moving accidentally due to external forces, thus protecting the chip from damage.
[0055] according to Figure 3As shown, specifically, one end of each first clamping member 23 and one end of each second clamping member 24 are provided with an anti-detachment block 25, and each anti-detachment block 25 has a through hole; the locking assembly 4 includes a movable rod 41 and a locking rubber block 42 provided at one end of the movable rod 41; the movable rod 41 is movably inserted through the through hole.
[0056] Specifically, anti-detachment blocks 25 are disposed at one end of the first clamping member 23 and the second clamping member 24. Their function is to prevent the clamping members from detaching from the limiting cavity during movement. Each anti-detachment block 25 has a through hole, the diameter of which matches the diameter of the movable rod 41, allowing the movable rod 41 to slide axially within it. One end of the movable rod 41 is connected to a locking rubber block 42, which abuts against the side wall of the support base 21, thereby fixing the first clamping member 23 and the second clamping member 24. Specifically, if the movable rod 41 is in the unlocked state, that is, the locking rubber block 42 is not in contact with the side wall of the support base 21, then the first clamping member 23 and the second clamping member 24 can move. According to the size of the chip under test, the positions of the first clamping member 23 and the second clamping member 24 are adjusted so that they can tightly clamp the chip under test. After the clamping member is adjusted to the appropriate position, the movable rod 41 is manually pushed to move along the outside of the support base 21. As the movable rod 41 moves, the locking rubber block 42 gradually approaches the side wall of the support base 21. When the locking rubber block 42 abuts against the side wall of the support base 21, the elastic deformation of the locking rubber block 42 generates friction, fixing the movable rod 41 in the current position. Since the movable rod 41 passes through the through hole of the anti-detachment block 25, the abutment of the locking rubber block 42 against the side wall of the support base 21 prevents the movable rod 41 from moving further, thereby firmly fixing the first clamping member 23 and the second clamping member 24 in the current position. At this time, if the first clamping member 23 cannot move in the first limiting cavity 221, the stability of the first clamping member 23 during the test is ensured. After the test is completed, when the chip under test needs to be removed, the movable rod 41 is manually moved in the opposite direction along the outside of the support body 21. As the movable rod 41 moves in the opposite direction, the locking rubber block 42 gradually separates from the side wall of the support body 21 until the locking rubber block 42 separates from the side wall of the support body 21. At this time, the first clamping member 23 can move along the length of the first limiting cavity 221 again.
[0057] It is understood that the locking rubber block 42 in this embodiment of the present invention is made of a wear-resistant and elastic material, such as rubber or polyurethane, and the specific type is not limited herein.
[0058] In a further embodiment, the through hole is a threaded hole; the movable rod 41 is a screw; with this configuration, it is only necessary to manually twist the screw to rotate so that the screw can move through the threaded hole and move along the axial direction of the threaded hole.
[0059] according to Figure 2As shown, in some specific embodiments, each first clamping member 23 is provided with a clamping block 231, and each clamping block 231 has a recessed clamping groove 232 on one side, and the clamping grooves 232 are arranged opposite to each other.
[0060] Specifically, to ensure secure clamping of the chip under test, each of the first clamping members 23 has a clamping block 231 at its bottom. The clamping block 231 is at the same height as the second clamping member 24, extending the clamping function of the first clamping member 23 to the same height as the second clamping member 24, thereby enabling clamping of the chip under test from two directions. Each clamping block 231 has a recessed groove 232 on one side, with the grooves 232 facing each other. Each groove 232 is used to accommodate both sides of the chip under test. That is, the relative arrangement of the grooves 232 ensures that the chip under test is stably clamped between the clamping block 231 and the second clamping member 24. With this configuration, by providing clamping blocks 231 at the bottom of each first clamping member 23, the first clamping member 23 and the second clamping member 24 can clamp the chip under test at the same height, solving the coordination problem between clamping members at different heights. The relative arrangement of the clamping groove 232 on the clamping block 231 and the second clamping member 24 ensures that the chip under test can be stably clamped, preventing the chip under test from shaking or shifting during the test.
[0061] according to Figure 1 As shown, in some specific embodiments, the top of the base 1 is provided with multiple vertically oriented guide rods 12, and the support body 21 has multiple lifting holes that correspond one-to-one with each guide rod 12; each guide rod 12 passes through each lifting hole.
[0062] Specifically, guide rods 12 are vertically mounted on the top of the base 1, and their number and position correspond one-to-one with the lifting holes on the support body 21. They are used to guide and support the lifting of the support body 21, ensuring that the support body 21 maintains a stable and precise position during the lifting process. When the support body 21 is being lifted, each guide rod 12 passes through its respective lifting hole, providing guidance for the lifting and lowering movement of the support body 21. In other words, the vertical mounting of the guide rods 12 ensures the precise vertical movement of the support body 21, preventing the support body 21 from shifting or swaying during the lifting process.
[0063] according to Figure 1 As shown, in a further embodiment, each guide rod 12 is provided with a limit shaft 121.
[0064] Specifically, the limiting shaft 121 is located on the guide rod 12, which can be understood as not being located in the lower middle part of the guide rod 12 (the specific position is set according to the size of the chip under test and the requirements of the electrical testing components). The function of the limiting shaft 121 is to limit the descent position of the support body 21, preventing the support body 21 from descending excessively, thereby ensuring that the chip under test is in the optimal testing position of the electrical testing components. When the support body 21 descends to the point where its bottom contacts the top of the limiting shaft 121, the limiting shaft 121 prevents the support body 21 from continuing to descend, ensuring that the support body 21 reaches a precise stop position during the descent, so that the chip under test is accurately positioned in the optimal testing position of the electrical testing components, at which point electrical testing of the chip can begin.
[0065] In some specific embodiments, a plurality of elastic elements (not shown in the figure) are provided between the top of the base 1 and the bottom of the support body 21.
[0066] Specifically, elastic elements are positioned between the top of the base 1 and the bottom of the support body 21, and are typically evenly distributed to ensure that the support body 21 is subjected to uniform force in all directions. The function of the elastic elements is to provide an upward thrust when the pressing component 3 is not pressing the support body 21, allowing the support body 21 to automatically return to its initial position. When the pressing component 3 no longer applies a downward force to the support body 21, the elastic elements generate elastic force during the recovery process, pushing the support body 21 upward to return to its initial position. This achieves the separation of the chip pins (or pads) of the chip under test from the pins or probe module of the electrical testing component. This process requires no manual intervention, improving the overall convenience and efficiency of the operation.
[0067] according to Figure 4 As shown, in some specific embodiments, the pressing assembly 3 includes a base 31, a pressing block 32, a driver 33, and a lead screw 34; the base 31 is provided with a lifting cavity, and the lead screw 34 is vertically built into the lifting cavity; the driver 33 is located on the top of the base 31 and its power output shaft is connected to one end of the lead screw 34; the pressing block 32 is provided with a nut seat, and the nut seat is movably sleeved on the lead screw 34.
[0068] Specifically, when electrical testing is required, the driver 33 is activated, causing its power output shaft to rotate. This rotation drives the lead screw 34 to rotate. Since the lead screw 34 engages with the nut seat on the pressing block 32, the rotation of the lead screw 34 causes the pressing block 32 to move downwards along the lead screw 34. The pressing block 32 gradually descends under the influence of the lead screw 34 until it contacts the top surface of the support body 21. Then, the pressing block 32 continues to descend, pressing the support body 21 to a designated position; for example, to ensure that the chip pins (or pads) of the chip under test are in close contact with the pins or probe module of the electrical testing component. Conversely, after the test is completed, the driver 33's power output shaft is reversed, causing it to rotate in the opposite direction. This reverse rotation of the driver 33's power output shaft drives the lead screw 34 to rotate in the opposite direction. Since the lead screw 34 is engaged with the nut seat on the pressing block 32, the reverse rotation of the lead screw 34 will cause the pressing block 32 to move upward along the lead screw 34. The pressing block 32 gradually rises under the drive of the lead screw 34 until the pressing block 32 is completely separated from the support body 21. As the pressing block 32 rises, it pushes the support body 21 to reset through the elastic force of the elastic element, so that the pin (or pad) of the chip under test is separated from the pin or probe module of the electrical test component.
[0069] The above description is merely a specific embodiment of this utility model, but the protection scope of this utility model is not limited thereto. Any person skilled in the art can easily conceive of various equivalent modifications or substitutions within the technical scope disclosed in this utility model, and these modifications or substitutions should all be covered within the protection scope of this utility model. Therefore, the protection scope of this utility model should be determined by the scope of the claims.
Claims
1. A chip electrical testing device, characterized in that, The chip electrical testing device includes: The base has a hollow cavity through which a clearance chamber is formed. An electrical testing component, wherein the electrical testing component is detachably disposed within the clearance cavity; A clamping assembly includes a support base, two first clamping members, and two second clamping members. The support base is vertically and movably mounted on the top of a base, and has a hollow clamping cavity extending through it. The cavity wall includes two opposing first cavity walls and two opposing second cavity walls. Both ends of each first clamping member are movably mounted on their respective first cavity walls. Both ends of each second clamping member are movably mounted on their respective second cavity walls. Each first clamping member and each second clamping member are perpendicularly arranged. A pressing component is disposed on the top of the base.
2. The chip electrical testing device according to claim 1, characterized in that, Each of the first cavity walls passes through the first limiting cavity, and the two ends of each of the first clamping members slide through each of the first limiting cavities respectively; each of the second cavity walls passes through the second limiting cavity, and the two ends of each of the second clamping members slide through each of the second limiting cavities respectively.
3. The chip electrical testing device according to claim 1, characterized in that, A locking component is provided at one end of each of the first clamping members and at one end of each of the second clamping members.
4. The chip electrical testing device according to claim 3, characterized in that, One end of each of the first clamping members and one end of each of the second clamping members are provided with an anti-detachment block, and each of the anti-detachment blocks has a through hole. Each locking component includes a movable rod and a locking rubber block disposed at one end of the movable rod; the movable rod moves through the through hole.
5. The chip electrical testing device according to claim 4, characterized in that, The through hole is a screw hole; the movable rod is a screw.
6. The chip electrical testing device according to claim 1, characterized in that, Each of the first clamping members is provided with a clamping block, and each clamping block has a recessed groove on one side, with the clamping grooves arranged opposite to each other.
7. The chip electrical testing device according to claim 1, characterized in that, The top of the base is provided with multiple guide rods, and the bottom of the support body is provided with multiple lifting holes that correspond one-to-one with each of the guide rods; each guide rod passes through each of the lifting holes.
8. The chip electrical testing device according to claim 7, characterized in that, Each of the guide rods is equipped with a limit shaft.
9. The chip electrical testing device according to claim 1, characterized in that, Multiple elastic elements are provided between the top of the base and the bottom of the support body.
10. The chip electrical testing device according to claim 1, characterized in that, The pressing assembly includes a base, a pressing block, a driver, and a lead screw; the base has a lifting cavity, and the lead screw is vertically built into the lifting cavity; the driver is located on the top of the base and its power output shaft is connected to one end of the lead screw; the pressing block has a nut seat, and the nut seat is movably sleeved on the lead screw.