A fixture board inspection table for pre-assembling semiconductor test probes

Abstract

This utility model relates to the field of test probe pre-assembly technology and discloses a fixture plate inspection table for semiconductor test probe pre-assembly, including a base, an arc-shaped slide rail on the base, the arc-shaped opening of the slide rail facing upward, an arc-shaped gear slidably disposed in the slide rail, the arc-shaped gear meshing with a drive gear, a swing plate disposed on the arc-shaped gear, a slot for accommodating the insertion of the fixture plate on the upper surface of the swing plate, a cover plate covering the slot on the swing plate, a plurality of strip grooves disposed on the cover plate, the plurality of strip grooves being parallel to the swing plane of the swing plate, the bottom of each strip groove extending to the surface of the fixture plate, and each strip groove corresponding to a row of holes on the fixture plate, the replenishment process does not require manual operation, the operation is simple and convenient, and the efficiency is high.

Description

Technical Field

[0001] This utility model relates to the field of test probe pre-assembly technology, specifically to a fixture board inspection table for semiconductor test probe pre-assembly. Background Technology

[0002] Semiconductor testing equipment combines software and hardware, typically consisting of a large number of testing functions controlled by a computer to test the functionality of semiconductor chips. The equipment requires a large number of test probes.

[0003] like Figure 4 As shown, the test probe mainly consists of four parts: syringe, needle head, spring, and needle tail. During the production process, these four parts need to be pre-assembled. The needle tail, spring, and needle head are inserted into the syringe in sequence. After the pre-assembly is completed, rivet holes are made on the outer wall of the syringe to complete the assembly.

[0004] To improve pre-assembly efficiency and achieve batch assembly, the following methods are currently widely used: Figure 5 The jig plate shown has multiple holes for accommodating probe components. The probe components are first loaded onto the jig plate, and then the jig plate containing the needle tail, spring and needle tip is sequentially fastened onto the jig plate containing the syringe, so that the needle tail, spring and needle tip fall into the syringe in sequence for pre-assembly.

[0005] When loading the probe parts into the fixture plate, multiple probe parts are first scattered into the fixture plate, and then the plate is shaken to allow the probe parts to fall into the holes on the fixture plate. Since this process cannot guarantee that all holes are loaded with parts, the fixture plate needs to be inspected after shaking, and parts need to be added to the holes that have not been loaded. The addition of parts needs to be done manually, which is not only inconvenient to operate, but also inefficient. Utility Model Content

[0006] To address the shortcomings of existing technologies, the purpose of this utility model is to provide a pre-assembly fixture board inspection station for semiconductor test probes, which eliminates the need for manual filling during the replenishment process, making it simple, convenient, and highly efficient.

[0007] To solve the above-mentioned technical problems, this utility model provides the following technical solution:

[0008] A fixture inspection table for pre-assembling semiconductor test probes includes a base with an arc-shaped slide rail. The arc-shaped opening of the slide rail faces upward. An arc-shaped gear is slidably disposed within the slide rail and meshes with a drive gear. A swing plate is disposed on the arc-shaped gear. The upper surface of the swing plate has a slot for accommodating the insertion of the fixture plate. The depth of the slot is the same as the thickness of the fixture plate. After the fixture plate is inserted into the slot, the upper surface of the fixture plate is aligned with the upper surface of the swing plate. A cover plate covering the slot is disposed on the swing plate. The cover plate has several strip-shaped grooves, all of which are parallel to the swing plane of the swing plate. The bottom of each strip-shaped groove extends to the surface of the fixture plate, and each strip-shaped groove corresponds to a row of holes on the fixture plate.

[0009] Preferably, one side of the slot extends to the outside of one side of the swing plate, so that the side of the swing plate forms an insertion port for the jig plate to pass through.

[0010] Preferably, the width of the strip groove is equal to the diameter of the hole on the fixture plate.

[0011] Preferably, each of the strip grooves has a receiving groove at both ends, and the width of the receiving groove is greater than the width of the strip groove.

[0012] Preferably, each of the receiving slots is provided with a photoelectric sensor.

[0013] Preferably, the base is provided with a gooseneck tube, and the gooseneck tube is provided with a magnifying glass.

[0014] Compared with the prior art, the beneficial effects achieved by this utility model are:

[0015] In use, the fixture plate with the inserted parts is placed into the slot, and a cover plate is placed on the surface of the fixture plate. The strip groove on the cover plate and the upper surface of the fixture plate together form a slide for the probe parts to slide. Each slide covers a row of holes on the fixture plate. The number of probe parts that are not inserted in the corresponding row of holes are inserted into the slide. The oscillating plate swings back and forth, causing the probe parts to slide back and forth in the strip groove until they fall into the holes that are not inserted. This completes the process of inserting parts into the holes that are not inserted. The filling process does not require manual operation, making it simple, convenient and efficient.

[0016] The photoelectric sensor determines whether there are any unfilled parts in the slot. When the photoelectric sensor detects that there are still unfilled parts in the slot, the controller controls the drive gear to continue driving the swing plate to swing back and forth. When the photoelectric sensor detects that there are no unfilled parts in the slot, the controller controls the drive gear to stop, so that the swing plate stops swinging. This makes it easier for workers to determine whether the filling process is complete, thereby further improving work efficiency. Attached Figure Description

[0017] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0018] Figure 2 This is a schematic diagram of the structure of the swing plate of this utility model;

[0019] Figure 3 This is a schematic diagram of the cross-sectional structure of the swing plate of this utility model;

[0020] Figure 4 This is a schematic diagram of the test probe structure;

[0021] Figure 5 This is a structural schematic diagram of the fixture plate.

[0022] The components include: 1. base; 2. slide; 3. arc gear; 4. drive gear; 5. swing plate; 6. slot; 7. cover plate; 8. strip groove; 9. receiving groove; 10. photoelectric sensor; 11. gooseneck tube; 12. magnifying glass. Detailed Implementation

[0023] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0024] This utility model provides the following technical solution:

[0025] Combination Figures 1 to 3As shown in this embodiment, a semiconductor test probe pre-assembly fixture inspection table includes a base 1. An arc-shaped slide 2 is provided on the base 1, with the arc-shaped opening of the slide 2 facing upwards. An arc-shaped gear 3 is slidably disposed within the slide 2, and the arc-shaped gear 3 is meshed with a drive gear 4. A swing plate 5 is provided on the arc-shaped gear 3. The upper surface of the swing plate 5 is provided with a slot 6 for accommodating the insertion of the fixture plate. The depth of the slot 6 is the same as the thickness of the fixture plate. After the fixture plate is inserted into the slot 6, the upper surface of the fixture plate is aligned with the upper surface of the swing plate 5. A cover plate 7 is provided on the swing plate 5 to cover the slot 6. The cover plate 7 is provided with a plurality of strip grooves 8, all of which are parallel to the swing plane of the swing plate 5. The bottom of each strip groove 8 extends to the surface of the fixture plate, and each strip groove 8 corresponds to a row of holes on the fixture plate.

[0026] By placing the fixture plate with the inserted parts into the slot 6, and covering the surface of the fixture plate with a cover plate 7, the strip groove 8 on the cover plate 7 and the upper surface of the fixture plate together form a sliding groove for the probe parts to slide. Each sliding groove covers a row of holes on the fixture plate. The number of probe parts that are not inserted into the corresponding row of holes are inserted into the sliding groove. The drive gear 4 rotates back and forth, causing the arc gear 3 to slide back and forth in the slide 2, which in turn drives the swing plate 5 to swing back and forth, causing the probe parts to slide back and forth in the strip groove 8 until they fall into the holes that are not inserted. This achieves the replenishment of parts into the holes that are not inserted. The replenishment process does not require manual operation, and the operation is simple, convenient and efficient.

[0027] Specifically, in combination Figure 2 and Figure 3 As shown, one side of the slot 6 extends to the outside of one side of the swing plate 5, so that the side of the swing plate 5 forms an insertion port for the jig plate to pass through.

[0028] The jig plate can be easily inserted into slot 6 via the socket, and after refilling, the jig plate can be directly removed from the socket.

[0029] Specifically, in combination Figure 2 and Figure 3 As shown, the width of the strip groove 8 is equal to the diameter of the hole on the fixture plate.

[0030] The vertical movement of the part is restricted by the strip groove 8, so that the trajectory of the part sliding left and right is on the hole, making it easier for the part to fall into the hole.

[0031] Specifically, in combination Figure 2 As shown, each of the strip grooves 8 has a receiving groove 9 at both ends, and the width of the receiving groove 9 is greater than the width of the strip groove 8.

[0032] The larger receiving groove 9 can hold more parts, and at the same time makes it easier to put the parts into the strip groove 8.

[0033] Specifically, in combination Figure 2 As shown, each of the receiving slots 9 is provided with a photoelectric sensor 10.

[0034] The photoelectric sensor 10 can detect whether there are still parts in the receiving slot 9, and then determine whether there are still unfilled parts in the strip slot 8. When the photoelectric sensor 10 detects that there are still unfilled parts in the strip slot 8, the controller controls the drive gear 4 to continue driving the swing plate 5 to swing back and forth. When the photoelectric sensor 10 detects that there are no unfilled parts in the strip slot 8, the controller controls the drive gear 4 to stop, so that the swing plate 5 stops swinging. This makes it easier for the staff to judge whether the replenishment process is completed, thereby further improving work efficiency.

[0035] Specifically, in combination Figure 1 As shown, a gooseneck tube 11 is provided on the base 1, and a magnifying glass 12 is provided on the gooseneck tube 11.

[0036] The magnifying glass 12 facilitates observation of the surface of the fixture plate, thereby determining the location and number of holes where parts have not been installed, and making it easier to confirm the location of the strip groove 8 where parts need to be installed and the number of parts to be installed.

[0037] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations may be made to these embodiments without departing from the principles and spirit, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A fixture board inspection table for pre-assembling semiconductor test probes, comprising a base (1), characterized in that: The base (1) is provided with an arc-shaped slide (2), the arc-shaped opening of the slide (2) is facing upward, an arc-shaped gear (3) is slidably arranged in the slide (2), the arc-shaped gear (3) is meshed with a drive gear (4), a swing plate (5) is provided on the arc-shaped gear (3), and a slot (6) for accommodating the insertion of the jig plate is provided on the upper surface of the swing plate (5), the depth of the slot (6) is the same as the thickness of the jig plate, and in the slot (6) After the fixture plate is inserted, the upper surface of the fixture plate is aligned with the upper surface of the swing plate (5). The swing plate (5) is provided with a cover plate (7) covering the slot (6). The cover plate (7) is provided with a number of strip grooves (8). The number of strip grooves (8) are all arranged parallel to the swing plane of the swing plate (5). The bottom of each strip groove (8) extends to the surface of the fixture plate, and each strip groove (8) is corresponding to a row of holes on the fixture plate.

2. The inspection table for a semiconductor test probe pre-assembly fixture as described in claim 1, characterized in that: One side of the slot (6) extends to the outside of one side of the swing plate (5), so that the side of the swing plate (5) forms an insertion port for the jig plate to pass through.

3. The inspection table for a pre-assembled semiconductor test probe according to claim 1, characterized in that: The width of the groove (8) is equal to the diameter of the hole on the fixture plate.

4. The inspection table for a semiconductor test probe pre-assembly fixture as described in claim 1, characterized in that: Each of the strip grooves (8) has a receiving groove (9) at both ends, and the width of the receiving groove (9) is greater than the width of the strip groove (8).

5. The inspection table for a semiconductor test probe pre-assembly fixture as described in claim 4, characterized in that: Each of the accommodating slots (9) is provided with a photoelectric sensor (10).

6. The inspection table for a pre-assembled semiconductor test probe according to claim 1, characterized in that: A gooseneck tube (11) is provided on the base (1), and a magnifying glass (12) is provided on the gooseneck tube (11).

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