Detection device

Abstract

To provide a detection device capable of more easily settling a range of lightness / darkness of light passing a detection target within a dynamic range of lightness / darkness of detection in the detection device.SOLUTION: A detection device comprises: a sensor panel including a detection region in which a plurality of sensor parts each detecting light and generating an output corresponding to a degree of detected light is disposed in a two-dimensional manner; and a light source part including a plurality of point light sources disposed in a light-emitting region which is provided correspondingly to the detection region. There are generated first detection processing in which the point light sources are turned on and outputs from the plurality of sensor parts are obtained and second detection processing in which the point light sources are turned on with luminance different from that of the first detection processing and outputs from the plurality of sensor parts are obtained. The luminance of the point light sources in the second detection processing is based on a relation between the luminance of the point light sources in the first detection processing and the outputs from the plurality of sensor parts.SELECTED DRAWING: Figure 13

Description

[Technical field]

[0001] The present disclosure relates to a detection device. [Background technology]

[0002] 2. Description of the Related Art There is known a detection device that detects the state of a biological tissue or a culture environment of a microorganism using an optical sensor as a detection target (eg, Patent Document 1). [Prior art documents] [Patent documents]

[0003] [Patent Document 1] JP 2005-87005 A Summary of the Invention [Problem to be solved by the invention]

[0004] In order to detect the above-mentioned state of the detection target more accurately, it is desirable to adjust the dynamic range so that the range of brightness of the light passing through the detection target falls within the dynamic range of brightness detected by the detection device. Conventionally, such adjustment has been performed manually by an administrator of the detection device, which has been cumbersome.

[0005] The present disclosure has been made in consideration of the above-mentioned problems, and aims to provide a detection device in which the range of brightness of light passing through an object to be detected can more easily be kept within the dynamic range of brightness detected by the detection device. [Means for solving the problem]

[0006] A detection device according to one embodiment of the present disclosure comprises a sensor panel having a detection area in which multiple sensor units are arranged two-dimensionally, each of which detects light and generates an output according to the degree of the detected light, and a light source unit having multiple point light sources arranged in a light-emitting area provided corresponding to the detection area, and a first detection process is performed in which the point light sources are turned on to obtain outputs from the multiple sensor units, and a second detection process is performed in which the point light sources are turned on at a brightness different from that of the first detection process to obtain outputs from the multiple sensor units, and the brightness of the point light sources in the second detection process is based on the relationship between the brightness of the point light source in the first detection process and the outputs from the multiple sensor units. [Brief description of the drawings]

[0007] [Figure 1] FIG. 1 is a diagram showing the main configuration of the detection device. [Diagram 2] FIG. 2 is a diagram showing an example of the configuration of a detection area and a wiring area. [Diagram 3] FIG. 3 is a circuit diagram showing the circuit configuration of the sensor unit. [Figure 4] FIG. 4 is a circuit diagram for explaining the behavior of a circuit related to the output of a signal to a signal line and the transmission of the output to a detection circuit. [Diagram 5] FIG. 5 is a schematic diagram showing an embodiment of the detection device during operation. [Figure 6] FIG. 6 is a graph showing the relationship between the signal strength recognized by the AFE and the coordinates of the detection area. [Figure 7] FIG. 7 is a schematic diagram showing the mechanism of signal synthesis processing. [Figure 8] FIG. 8 is a timing chart showing an example of main signal control in the first period F1 and the second period F2 when the bias current is changed when the bias current reaches a ceiling. [Figure 9] FIG. 9 is a timing chart showing an example of main signal control in the first period F1 and the second period F2 when the initial potential is changed in the case where the potential has reached a ceiling. [Figure 10]FIG. 10 is a schematic diagram showing the relative relationship between the signal strength level assumed in the first detection process and the signal strength level assumed in the second detection process. [Figure 11] FIG. 11 is a schematic diagram showing the relative difference between the distribution of signal intensities obtained in the first detection process and the distribution of signal intensities obtained in the second detection process in relation to the dynamic range. [Figure 12] FIG. 12 is a schematic diagram showing the relationship between the dynamic range and the amount of shift due to the difference between the luminance level in the first detection process and the luminance level in the second detection process. [Figure 13] FIG. 13 is a flowchart showing the flow of processing performed in the embodiment. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0008] Hereinafter, each embodiment of the present disclosure will be described with reference to the drawings. Note that the disclosure is merely an example, and those who are skilled in the art can easily come up with appropriate modifications while maintaining the gist of the invention are naturally included in the scope of the present disclosure. In addition, in order to make the explanation clearer, the drawings may be schematic in terms of the width, thickness, shape, etc. of each part compared to the actual embodiment, but they are merely examples and do not limit the interpretation of the present disclosure. In addition, in this specification and each figure, elements similar to those described above with respect to the previous figures may be given the same reference numerals, and detailed explanations may be omitted as appropriate.

[0009] 1 is a diagram showing the main configuration of a detection device 1. The detection device 1 includes a sensor panel 10 and a light source unit 20. The sensor panel 10 and the light source unit 20 are connected to a host 30.

[0010] The sensor panel 10 has a detection area SA (see FIG. 2) provided on a substrate 11. A reset circuit 13, a scanning circuit 14, and a wiring area VA are also mounted on the substrate 11. The configuration on the detection area SA, the reset circuit 13, and the scanning circuit 14 are connected to a detection circuit 15 via the wiring area VA.

[0011] The light source unit 20 has a light emitting area LA that irradiates light onto the detection area SA. The light source unit 20 has a point light source 22 provided on a substrate 21. The point light source 22 is a light emitting element such as an LED (Light Emitting Diode), and is arranged within the light emitting area LA. In the example shown in FIG. 1, a plurality of point light sources 22 are arranged in a matrix on the substrate 21.

[0012] The plurality of point light sources 22 are provided so that their light emission can be controlled individually. The light source unit 20 is provided with a light source drive circuit 23. Under the control of the host 30, the light source drive circuit 23 controls whether each of the plurality of point light sources 22 is turned on and the luminance when turned on.

[0013] The host 30 performs various controls related to the operation of the detection device 1. Specifically, the host 30 is, for example, a microcontroller corresponding to the configuration of the detection device 1 or an information processing device that functions similarly to a microcontroller. The host 30 is connected to the detection circuit 15 via a standardized interface such as a Serial Peripheral Interface (SPI) and obtains an output from the detection circuit 15. The host 30 is also connected to the light source driving circuit 23 via the standardized interface and performs processes related to the lighting of the point light source 22, such as determining the lighting pattern of the point light source 22.

[0014] Fig. 2 is a diagram showing an example of the configuration of the detection area SA and wiring area VA. A plurality of sensor units WA (Fig. 3) are provided in the detection area SA. In the embodiment, as shown in Fig. 2, the plurality of sensor units WA are arranged in a matrix along the first direction Dx and the second direction Dy. The first direction Dx and the second direction Dy are orthogonal. In the following description, the third direction Dz refers to a direction orthogonal to the first direction Dx and the second direction Dy.

[0015] The reset circuit 13 is connected to the reset signal transmission lines 51, 52, ..., 5n. Hereinafter, when the reset signal transmission line 5 is described, it refers to any one of the reset signal transmission lines 51, 52, ..., 5n. The reset signal transmission line 5 is wiring along the first direction Dx. In the example shown in FIG. 2, n reset signal transmission lines 5 are arranged in the second direction Dy. n is a natural number equal to or greater than 2. The n reset signal transmission lines 5 are connected to the reset circuit 13 at one end side in the first direction Dx.

[0016] The scanning circuit 14 is connected to the scanning lines 61, 62, . . . , 6n. Hereinafter, when a scanning line 6 is described, it refers to any one of the scanning lines 61, 62, . . . , 6n. The scanning lines 6 are wirings along the first direction Dx. In the example shown in FIG. 2, n scanning lines 6 are arranged in the second direction Dy. The n reset signal transmission lines 5 are connected to the scanning circuit 14 at the other end side in the first direction Dx.

[0017] 2, the reset signal transmission lines 5 and the scanning lines 6 are arranged alternately in the second direction Dy within the detection area SA. Note that, although the reset circuit 13 and the scanning circuit 14 illustrated in Fig. 1 and Fig. 2 are arranged at positions facing each other with the detection area SA in between, the layout of the reset circuit 13 and the scanning circuit 14 is not limited to this and can be changed as appropriate.

[0018] Furthermore, signal lines 71, 72, ..., 7m are provided within the detection area SA. Hereinafter, when the signal line 7 is described, it refers to any one of the signal lines 71, 72, ..., 7m. The signal line 7 is a wiring that extends along the second direction Dy.

[0019] 2, m signal lines 7 are arranged in a first direction Dx, where m is a natural number equal to or greater than 2. Each of the m signal lines 7 is connected at one end in the second direction Dy to one of a plurality of switches (for example, switch SW1, switch SW2, switch SW3, or switch SW4) included in the selector circuit 40.

[0020] The selector circuit 40 is provided in the wiring area VA. The selector circuit 40 has a plurality of switches. In the example shown in FIG. 2, the switches SW1, SW2, SW3, and SW4 are shown as the plurality of switches. The plurality of switches in one selector circuit 40 are turned ON (connected state) at different timings. Among the plurality of switches in one selector circuit 40, while one switch is ON (connected state), the other switches are OFF (disconnected state). The number of selector circuits 40 corresponds to the number (m) of signal lines 7. If the number of switches is p, the number of selector circuits 40 needs to be m / p. When there are a plurality of selector circuits 40, the plurality of selector circuits 40 are connected to the detection circuit 15 via individual wirings 401, 402, . . . , 40p.

[0021] Note that the connection between the signal line 7 and the detection circuit 15 via the selector circuit 40 is merely an example and is not limiting, and the signal line 7 may be directly connected to the detection circuit 15 individually within the wiring area VA. Within the wiring area VA, the reset circuit 13 is connected to the detection circuit 15 via a wiring 131. Within the wiring area VA, the scanning circuit 14 is connected to the detection circuit 15 via a wiring 141.

[0022] The detection circuit 15 is involved in the detection of light by the PD 82 (see FIG. 3) provided in the sensor unit WA, and controls the operation timing of the reset circuit 13 and the scanning circuit 14. In this way, the detection circuit 15 controls the timing of the reset period RT, the exposure period EX, and the readout period RD of the sensor unit WA, which will be described later with reference to FIG. 8 and FIG. 9. The detection circuit 15 also receives an output from the sensor unit WA. The detection circuit 15 converts the signal input from the sensor unit WA into data that can be interpreted by the host 30, and outputs the converted data to the host 30. The detection circuit 15 in the embodiment is a ROIC (Read Out Integrated Circuit) of the multiple sensor units WA in the sensor panel 10.

[0023] Fig. 3 is a circuit diagram showing the circuit configuration of the sensor unit WA. Note that the first direction Dx and the second direction Dy in Fig. 3 merely correspond to the directions of the reset signal transmission line 5, the scanning line 6, and the signal line 7, and do not strictly indicate the relative positional relationship of the circuit configuration in the sensor unit WA.

[0024] 3, the sensor unit WA includes a switching element 81, a PD 82, a transistor element 83, and a switching element 85. The PD 82 is a photodiode (PD: PhotoDiode). The switching elements 81, 83, and 85 are MOSFETs (Metal Oxide Semiconductor Field Effect Transistors).

[0025] The gate of the switching element 81 is connected to the reset signal transmission line 5. A reset potential VReset is applied to one of the source or drain of the switching element 81. The cathode of PD82 and the gate of the transistor element 83 are connected to the other of the source or drain of the switching element 81. Hereinafter, when the connection part CP is described, it refers to the point where the other, that is, the cathode of PD82 and the gate of the transistor element 83 are connected. In addition, a reference potential VCOM is applied from the anode side of PD82. The potential difference between the reset potential VReset and the reference potential VCOM is predetermined, but the potentials of the reset potential VReset and the reference potential VCOM may be variable. Incidentally, the reset potential VReset is a potential higher than the reference potential VCOM.

[0026] The reset potential VReset and the reference potential VCOM are supplied to the detection area SA by the detection circuit 15 based on, for example, power supplied via a power supply circuit (not shown) connected to the detection circuit 15, but are not limited to this and can be changed as appropriate.

[0027] An output source potential VPP2 is applied to the drain of the transistor element 83 functioning as a source follower. One of the source or drain of the switching element 85 is connected to the source of the transistor element 83. The other of the source or drain of the switching element 85 is connected to the signal line 7. The gate of the switching element 85 is connected to the scanning line 6.

[0028] The reset potential VReset, the reference potential VCOM, and the output source potential VPP2 are supplied to the detection area SA by the detection circuit 15 based on, for example, power supplied via a power supply circuit (not shown) connected to the detection circuit 15, but this is not limited to this and can be changed as appropriate.

[0029] The output source potential VPP2 is determined in advance. The potential on the source side of the transistor element 83 is a potential that is lower than the output potential of PD82 by the gate-source voltage (Vth) of the transistor element 83. In this case, the potential on the source side of the transistor element 83 depends on the strength of the output of PD82, the potential of the reset potential VReset, and the potential of the reference potential VCOM. The potential of the output of PD82 depends on the photoelectromotive force generated by PD82 in response to the light detected by PD82 during an exposure period EX, which will be described later.

[0030] When the gate of the switching element 85 is turned ON by a signal provided from the scanning circuit 14 via the scanning line 6, the source and drain of the switching element 85 are connected. As a result, the signal (electric potential) transmitted to the switching element 85 via the transistor element 83 is transmitted to the signal line 7 through the switching element 85. In this manner, an output is generated from the sensor unit WA. Hereinafter, the term "scanning signal" refers to the signal (electric potential) provided from the scanning circuit 14 via the scanning line 6. The scanning circuit 14 is a circuit that outputs the scanning signal.

[0031] The output of one PD82 provided on one sensor unit WA corresponds to the intensity of light detected by that PD82 within a predetermined exposure period EX (see Figures 8 and 9). The output of PD82 is reset in response to a signal provided from the reset circuit 13 via the reset signal transmission line 5. When the signal turns on the gate of the switching element 81, the source and drain of the switching element 81 are connected. This resets the potential of the connection part CP to the reset potential VReset. Hereinafter, the term "initial potential" refers to the reset potential VReset. Furthermore, the term "reset signal" refers to the signal provided from the reset circuit 13 via the reset signal transmission line 5. The reset circuit 13 is a circuit that outputs a reset signal.

[0032] Hereinafter, the output of a signal to the signal line 7 and the transmission of the output to the detection circuit 15 will be described in detail with reference to FIG.

[0033] FIG. 4 is a circuit diagram for explaining the behavior of the circuit related to the output of a signal to the signal line 7 and the transmission of the output to the detection circuit 15. As described above, once the output of PD82 is reset, the potential of the connection part CP becomes the initial potential. The charge accumulated in the capacitance C1 is discharged from PD82 according to the intensity of the light detected by PD82 until the output of PD82 is reset again, so that the potential of the connection part CP drops. In FIG. 4, the capacitance corresponding to the potential at the connection part CP is indicated by capacitance C1. Therefore, it can be said that the source potential of the transistor element 83 corresponds to the capacitance C1. If PD82 does not detect any light, then substantially no current flows through PD82, so the potential across the capacitance C1 does not change from the initial potential. Depending on the degree to which PD82 detects light, the capacitance C1 changes in a direction lower than the initial potential.

[0034] Here, the capacitance at the connection point between the source of the transistor element 83 and one of the source or drain of the switching element 85 is defined as capacitance C2. Also, the capacitance corresponding to the potential on the other side of the source or drain of the switching element 85 is defined as capacitance C3. The source and drain of the switching element 85 are connected by outputting a scanning signal.

[0035] The signal line 7 interposed between the other of the source or drain of the switching element 85 and the AFE 31 provided in the detection circuit 15 has an electric resistance ER according to its extension length. Here, a current source 32 is provided so as to branch off from the signal line 7. The current source 32 causes a constant current to flow out of the signal line 7, so that a voltage according to the current value flowing through the electric resistance ER is generated between the other of the source or drain of the switching element 85 and the AFE 31. The capacitance C4 is, for example, a capacitance that stabilizes the potential of the signal line 7. Hereinafter, when the term "bias current" is used, it refers to a current that is provided (flowed out) from the current source 32 to the signal line 7. The current source 32 is a current source that provides a bias current, and is provided, for example, in the detection circuit 15.

[0036] As shown in FIG. 4, the capacitance C1 can be regarded as a capacitance element having one end connected to a signal line (connection part CP) and the other end to which a reference potential (GND) is applied. The capacitance C2 can be regarded as a capacitance element having one end connected to a signal transmission path between the transistor element 83 and the switching element 85 and the other end to which a reference potential (GND) is applied. The capacitance C3 can be regarded as a capacitance element having one end connected to a signal transmission path between the switching element 85 and the detection circuit 15 and the other end to which a reference potential (GND) is applied. The capacitance C4 can be regarded as a capacitance element having one end connected to a signal transmission path between the switching element 85 and the detection circuit 15 and the other end to which a reference potential (GND) is applied. The capacitances C1 to C4 may not be capacitance elements, but may be parasitic capacitances of the respective elements.

[0037] Furthermore, when the potential of the connection part CP is changed from the initial potential, the potential of the transistor element 83 is also changed. That is, when the initial potential is changed, the potential of the signal line 7 is changed accordingly. Therefore, the potential of the signal line 7 can be controlled by controlling the initial potential. Furthermore, when the bias current is changed, the potential difference across the electrical resistance ER is also changed, and therefore the potential of the signal line 7 can also be changed.

[0038] The AFE 31 is a circuit that functions as an analog front end. The AFE 31 generates a signal according to an input given via a signal line 7 and outputs the signal to the host 30.

[0039] Next, the operation of the detection device 1 will be described with reference to FIG.

[0040] FIG. 5 is a schematic diagram showing the state of the detection device 1 during operation. In the detection device 1, the light source unit 20 and the sensor panel 10 are provided so as to face each other in the third direction Dz with the detection object SUB in between. The detection object SUB is, for example, a petri dish in which a medium such as an agar medium is formed, but is not limited thereto and may have another configuration that transmits light from the light source unit 20. In addition, a radiation limiting member 50 is interposed between the detection object SUB and the sensor panel 10. The radiation limiting member 50 is a member that limits the path of light that can reach the sensor panel 10 out of the light LV irradiated from the light source unit 20 toward the sensor panel 10. Specifically, the radiation limiting member 50 is, for example, a plate-shaped member having a plurality of through holes in the third direction Dz. The light that can pass through the radiation limiting member 50 is limited to the light that passes through the through holes. The through holes correspond to the arrangement of the point light sources 22 provided in the sensor panel 10. The through holes are provided so that each PD82 does not simultaneously detect light from two or more point light sources 22. That is, in the embodiment, the light detected by one PD82 is light from one point light source 22. The through holes are not provided individually for each PD82, but are shared by multiple PD82. Therefore, light from one point light source 22 is shared by multiple PD82. The object to be detected SUB is placed on the ray limiting member 50 and in the detection area SA. The light source unit 20 irradiates light from above the object to be detected SUB toward the sensor panel 10 by turning on the point light source 22. Of the light emitted from the point light source 22 and traveling toward the object to be detected SUB, the light that passes through the object to be detected SUB and the ray limiting member 50 is detected by the PD82 (see FIGS. 3 and 4) in the detection area SA. Hereinafter, when the term "sensor scan" is used, it refers to a process in which the sensor panel 10 detects light from the light source unit 20 when the positional relationship between the light source unit 20, the object to be detected (e.g., the object to be detected SUB), the ray limiting member 50, and the sensor panel 10 is established as shown in FIG.

[0041] Under the setting conditions described with reference to Fig. 5, a detection process is performed in which the PD82 detects light from the point light source 22. In the embodiment, a first detection process FA and a second detection process FB (see Fig. 12) described below are performed. Note that the intensities of light detected by each of the multiple PD82 sharing the through-hole provided in the ray limiting member 50 may differ. Hereinafter, the intensities of light detected by each of the multiple PD82 will be described with reference to Fig. 6.

[0042] FIG. 6 is a graph showing the relationship between the signal intensity recognized by the AFE31 and the coordinates of the detection area SA. Hereinafter, when simply described as signal intensity, it refers to the signal intensity recognized by the AFE31 unless otherwise specified. The signal intensity corresponds to the intensity of light detected by the PD82. In addition, among the coordinates of the detection area SA shown on the horizontal axis of the graph shown in FIG. 6, "E1" is one end side of the detection area SA along one of the first direction Dx and the second direction Dy. In addition, "E2" is the other end side of the detection area SA along the one direction. The graph between E1 and E2 shown in FIG. 6 shows the distribution of signal intensity indicating the detection result of a plurality of PD82 arranged at a position where the light from one point light source 22 reaches, corresponding to the distribution of light emitted from one point light source 22 and passing through the ray limiting member 50. In the description with reference to FIG. 6, the one direction is the first direction Dx in accordance with FIG. 5. The graph in FIG. 6 is assumed to show the signal intensity according to the illumination range 220 shown in FIG. 5. FIG. 6 also shows a graph of a first period F1 and a graph of a second period F2 included in the first detection process FA.

[0043] As shown in the graph of the first period F1 in FIG. 6, the signal intensity may vary depending on the coordinates of the detection area SA. However, as shown as a peak range WH, the signal intensity remains high in the middle between the coordinates E1 and E2 and in the vicinity of the middle. This is due to the dynamic range DR of the AFE31. The dynamic range DR is determined by the lower limit (Dmin) and upper limit (Dmax) of the signal that the AFE31 can process. The peak range WH occurs due to the upper limit (Dmax) of the dynamic range DR. If there is no limit on the signal intensity due to the upper limit (Dmax), the distribution of the signal intensity according to the intensity of light detected by each of the multiple PDs 82 arranged along the horizontal axis (coordinate) shows a sinusoidal distribution formed by the solid curve W1 and the dashed curve WM in the graph of the first period F1 in FIG. 6. This is because the PDs 82 that are closer relative to the lit point light source 22 detect stronger light.

[0044] Conversely, in the first period F1, the output corresponding to the solid line graph formed by the solid line curve W1 and the peaking range WH is treated as "the output of one sensor scan corresponding to the lighting pattern of a certain point light source 22" corresponding to the outputs from the multiple sensor units WA. In other words, the combined output of each of the multiple sensor units WA at a certain point in time (for example, a readout period RD described later) is treated as the output from the detection area SA.

[0045] As described with reference to Fig. 4, the signal strength (potential of the signal line 7) can be changed by changing at least one of the bias current and the initial potential. Therefore, when an output corresponding to the upper limit (Dmax) of the dynamic range DR occurs, such as the peaking range WH in the graph of the first period F1 in Fig. 6, the signal discrimination limit caused by the upper limit (Dmax) can be eliminated by lowering the signal strength.

[0046] The graph for the second period F2 in Fig. 6 shows that the signal intensity is lowered by the shift amount SH compared to the graph for the first period F1. As a result, in the second period F2, the AFE31 can recognize the signal intensity distribution corresponding to the solid curve W2 including the portion of the dashed curve WM that the AFE31 could not recognize in the first period F1. On the other hand, in the second period F2, the portion shown as the dashed curve WB falls below the lower limit (Dmin), and the AFE31 cannot recognize the signal or distinguish the signal intensity. In this way, by changing the signal intensity, the relationship between the distribution of signal intensity according to the light intensity detected by each of the multiple PDs 82 and the dynamic range DR can be changed.

[0047] When the difference between the lower limit and the upper limit of the signal strength in the distribution of the signal strength according to the light strength detected by each of the multiple PDs 82 exceeds the dynamic range DR, simply operating the AFE 31 cannot identify the distribution of the signal strength according to the light strength detected by each of the multiple PDs 82. In this case, by using two detection results in which the signal strength is changed, such as the first period F1 and the second period F2 described with reference to FIG. 6, the distribution of the signal strength according to the light strength detected by each of the multiple PDs 82 can be more reliably identified. Here, the shift amount (shift amount SH) of the signal strength when changing the signal strength from the first period F1 to the second period F2 is equal to or less than the difference (upper and lower difference) between the upper limit (Dmax) and the lower limit (Dmin) of the dynamic range DR. In the example shown in FIG. 6, the shift amount SH is less than the upper and lower difference. The overlap range Di shown in FIG. 6 is the difference obtained by subtracting the shift amount SH from the upper limit difference. In other words, the signal included in the overlap range Di is recognized in both the first period F1 and the second period F2. Therefore, when using the results of two detections, a signal synthesis process is performed in which measures are taken to prevent overlapping of the portions included in the overlap range Di.

[0048] FIG. 7 is a schematic diagram showing the mechanism of signal synthesis processing. In FIG. 7, the signal obtained in the first period F1 shown in FIG. 6 is shown as the first signal P1. Also, in FIG. 7, the signal obtained in the second period F2 shown in FIG. 6 is shown as the second signal P2. In the signal synthesis processing, the first signal P1 and the second signal P2 are added together, and the signal strength of the portion included in the overlap range Di is subtracted once. This makes it possible to obtain a synthetic signal WS that reflects measures against both the distribution of signal strength exceeding the dynamic range DR and the overlap of the portion included in the overlap range Di.

[0049] In the embodiment, the determination of whether a signal input corresponding to the upper limit (Dmax) of the dynamic range DR has occurred in the AFE 31 and the change of the signal intensity when such an input has occurred are performed, for example, by the detection circuit 15. In addition, the signal synthesis process is performed, for example, by the host 30, but the detection circuit 15 may have a function of performing the signal synthesis process. In addition, in the embodiment, when the peak is not reached, the light emission intensity of the point light source 22 is increased once so that the peak is forcibly generated. That is, the light emission intensity of the point light source 22 is set and the dynamic range DR is changed so that the first period F1 and the second period F2 always occur. The peak here refers to the signal intensity reaching the upper limit (Dmax) of the dynamic range DR at one or more coordinates. When the peak is reached, it is impossible to distinguish whether the signal intensity is equal to or exceeds the upper limit of the dynamic range DR, so detection corresponding to the second period F2 for the signal synthesis process is performed.

[0050] In this embodiment, the signal strength is set in advance so that the signal strength when the PD 82 does not detect any light exceeds the lower limit (Dmin) of the dynamic range DR. This limits the signal strength distribution outside the dynamic range DR to those exceeding the upper limit (Dmax) of the dynamic range DR.

[0051] Next, as specific methods for changing the signal strength, a case where the bias current is changed and a case where the initial potential is changed will be described in turn. Hereinafter, when the term "signal level shift processing" is used, it refers to a processing for changing the signal strength by changing the bias current or the initial potential.

[0052] Fig. 8 is a timing chart showing an example of main signal control in the first period F1 and the second period F2 when the bias current is changed when the bias current reaches a ceiling. CL1 in Fig. 8 and Fig. 9 described later indicates a reset signal. CL2 in Fig. 8 and Fig. 9 indicates a scanning signal. Vo in Fig. 8 indicates a bias current.

[0053] The light detection process, which is performed multiple times, such as the first period F1 and the second period F2, is performed in a unit time cycle. That is, the time length of the first period F1 and the time length of the second period F2 are substantially the same. In addition, the ratio of the time lengths allocated to the reset period RT, the exposure period EX, and the readout period RD included in each unit time is also substantially the same in the first period F1 and the second period F2. The start timing control of the reset period RT and the readout period RD is performed by the detection circuit 15.

[0054] Common to the first period F1 and the second period F2, first, during the reset period RT, a reset signal is provided from the reset circuit 13 to the reset signal transmission line 5. This causes the connection point CP (electric potential at one end of the capacitance C1) to become the initial electric potential. Thereafter, the electric potential at one end of the capacitance C1 and the electric potential at one end of the capacitance C2 vary according to the intensity of the light detected by the PD 82 during the exposure period EX. Then, during the readout period RD, a scanning signal is provided from the scanning circuit 14 to the scanning line 6, and the signal (electric potential) input via the signal line 7 becomes a signal intensity (electric potential) according to the electric potential at one end of the capacitance C2.

[0055] The bias current is changed at the boundary timing between the first period F1 and the second period F2. In the example shown in Fig. 8, the bias current is increased to decrease the potential level at one end of the capacitance C4. This allows the signal strength in the second period F2 to be lower than that in the first period F1, as described with reference to Fig. 6.

[0056] Fig. 9 is a timing chart showing an example of main signal control in the first period F1 and the second period F2 when the initial potential is changed when the potential reaches a ceiling. VReset in Fig. 9 indicates the reset potential VReset described with reference to Fig. 3 and Fig. 4. VCOM in Fig. 9 indicates the reference potential VCOM described with reference to Fig. 3 and Fig. 4.

[0057] The example shown in FIG. 9 differs from FIG. 8 in that the initial potential, not the bias current, is changed at the boundary timing between the first period F1 and the second period F2. Specifically, the reset potential VReset and the reference potential VCOM are lowered at the boundary timing between the first period F1 and the second period F2. This lowers the potential level at one end of the capacitance C4, so that the signal strength in the second period F2 can be lowered compared to the first period F1. As described above, FIG. 9 is the same as FIG. 8, except for the points noted above. Note that if the characteristics of the photodiode do not change regardless of the reverse bias voltage between the anode and cathode of PD82, only the reset potential VReset may be changed without changing the potential of the reference potential VCOM.

[0058] The shape of the graph showing the relationship between the coordinates and the signal intensity described with reference to FIG. 6 is that when the point light source 22 located near the center of the light-emitting area LA is turned on, as described with reference to FIG. 5. The peak of the distribution of the signal intensity corresponding to the sinusoidal graph corresponds to the arrangement of the turned-on point light sources 22. In the sensor scan, a part (one or more) of the multiple point light sources 22 is turned on, and a process of obtaining an output from the sensor unit WA according to the turning-on is repeated. The host 30 integrates the output obtained by such repetition, and the sensing result of the object to be detected (for example, the object to be detected SUB) is derived. In such repetition, all of the multiple point light sources 22 are turned on at least once. In the embodiment, the relationship between the point light source 22, the ray limiting member 50, and the PD82 is taken into consideration, and the turning-on of the point light source 22 is controlled so that one PD82 does not receive light from two or more point light sources 22 that are turned on at the same time.

[0059] Although the signal strength may be changed by changing both the bias current and the initial potential, changing the signal strength by changing the bias current or the initial potential can further simplify the process of changing the signal strength.

[0060] The first detection process FA has been described above. Next, the second detection process FB will be described. In the embodiment, the first detection process FA includes the first period F1 and the second period F2 described above. After the first detection process FA, the second detection process FB is further performed.

[0061] Fig. 10 is a schematic diagram showing the relative relationship between the signal intensity level SETB assumed in the first detection process FA and the signal intensity level SETA assumed in the second detection process FB. As shown in Fig. 10, in the second detection process FB, control is applied to relatively lower the signal intensity level compared to the first detection process FA. Specifically, in the second detection process FB, the emission intensity of the point light source 22 is lowered compared to the first detection process FA. In Fig. 10, the difference between the signal intensity level SETB assumed in the first detection process FA and the signal intensity level SETA assumed in the second detection process FB corresponds to the shift amount SH2.

[0062] 11 is a schematic diagram showing the difference between the signal intensity distribution obtained in the first detection process FA and the signal intensity distribution obtained in the second detection process FB in relation to the dynamic range DR. As described with reference to Figs. 6 and 7, the composite signal WS obtained in the first detection process FA may exceed the dynamic range DR. For this reason, it is expected that the peak TV1 in the composite signal WS obtained in the first detection process FA will exceed the upper limit Dmax.

[0063] On the other hand, in the second detection process FB, as described above, the emission intensity of the point light source 22 is lowered by the shift amount SH2 compared to the first detection process (see FIG. 12). As a result, the peak TV2 in the signal WT obtained in the second detection process FB falls below the upper limit Dmax. In other words, the luminance level BL2 (see FIG. 12) of the light brought about by the emission intensity of the point light source 22 in the second detection process FB is set so that the peak TV2 in the second detection process FB falls below the upper limit Dmax. Here, the difference between the peak TV1 in the composite signal WS obtained in the first detection process FA and the peak TV2 in the second detection process FB corresponds to the shift amount SH2. Also, the peak TV1 corresponds to the peak TV1 of the dashed curve WM in the first period F1 shown in FIG. 6.

[0064] 12 is a schematic diagram showing the relationship between the shift amount SH2 due to the difference between the brightness level TV1 of the first detection process FA and the brightness level TV2 of the second detection process FB, and the dynamic range DR. As shown in FIG. 12, it is assumed that the signal intensity of PD82 generated according to the brightness level of light brought about by the emission intensity of the point light source 22 in the first period F1 of the first detection process FA is a peak TV1. In this case, in the second detection process performed after the first detection process FA, the emission intensity of the point light source 22 is lowered, so that the signal intensity of PD82 generated in the second detection process FB becomes a peak TV2.

[0065] In addition, between the first period F1 and the second period F2, the relative relationship between the dynamic range DR and the "emission intensity of the point light source 22 corresponding to the peak TV1" changes according to the shift amount (shift amount SH) of the signal intensity. Specifically, the level of the dynamic range DR increases by the shift amount SH with respect to the emission intensity of the point light source 22 (peak TV1 occurring according to the emission intensity) that does not change during the first detection process FA. FIG. 12 shows that, by increasing the level of the dynamic range DR by the shift amount SH, the upper limit Dmax and the lower limit Dmin of the dynamic range DR in the first period F1 become the upper limit Dmax2 and the lower limit Dmin2 in the second period F2 with the peak TV1 as the reference. As a result, the "emission intensity of the point light source 22 corresponding to the peak TV1" that exceeded the upper limit Dmax of the dynamic range DR during the first period F1 falls within the range between the upper limit Dmax2 and the lower limit Dmin2 of the dynamic range DR during the second period F2. That is, during the first period F1, it is known that the "emission intensity of the point light source 22 corresponding to the peak TV1" exceeds the upper limit Dmax, but it is unclear to what extent it exceeds the upper limit Dmax. However, during the second period F2, the "emission intensity of the point light source 22 corresponding to the peak TV1" becomes clear. Therefore, the shift amount SH that puts the peak TV1 within the dynamic range DR can be specified during the first detection process FA. In the second detection process F2, based on the shift amount SH, the emission intensity, not the dynamic range DR, is relatively lowered by the shift amount SH2, so that the peak TV2 corresponding to the lowered emission intensity is put within the dynamic range DR. A specific method for calculating the shift amount SH2 from the shift amount SH is shown in the flowchart of FIG. 13 and the explanation with reference to FIG. 13, particularly in formulas (1) and (2), which will be described later. Note that the upper limit Dmax and lower limit Dmin of the dynamic range DR in the second detection process F2 are the same as those in the first period F1.

[0066] In this way, between the first period F1 and the second period F2, the emission intensity of the point light source 22 remains at the luminance level TV1, but a change in the relative relationship with the dynamic range DR is realized. In contrast, between the first detection process FA and the second detection process FB, the emission intensity of the point light source 22 is lowered by a degree corresponding to the shift amount SH2, thereby realizing control to keep the peak TV2 in the second detection process FB within the dynamic range DR.

[0067] Hereinafter, the process flow including the method of determining the luminance level and the two detection processes will be described with reference to the flowchart in Fig. 13. Fig. 13 is a flowchart showing the process flow performed in the embodiment. First, the luminance level is initially set (step S11). Hereinafter, when x is written, it refers to a variable used for managing the luminance level, unless otherwise specified.

[0068] Next, a sensor scan is performed (step S12). As a result of the sensor scan in step S12, it is determined whether there is a sensor unit WA that has generated an output of a signal corresponding to (or exceeding) the upper limit (Dmax) of the dynamic range DR (step S13). For example, if an output corresponding to the luminance level TV1 is obtained by the light emission intensity of the point light source 22 corresponding to the luminance level set in the process of step S11 or the process of step S14 described later, it is determined that there is a sensor unit WA that has generated an output of a signal corresponding to the upper limit (Dmax) of the dynamic range DR. Here, if it is determined in step S13 that there is no sensor unit WA that has generated an output of a signal corresponding to the upper limit (Dmax) of the dynamic range DR (step S13; No), a process of increasing the luminance level is performed (step S14). That is, a process of further increasing the light emission intensity of the point light source 22 in the sensor scan is performed. In the description of step S14 shown in FIG. 13, "x=x+h" indicates that the value of x is updated to be larger by h than the value (x) before the process of step S14 (x+h). After the process of step S14, the process proceeds to the process of step S12.

[0069] If it is determined in step S13 that there is a sensor unit WA that has generated a signal output corresponding to (or exceeding) the upper limit (Dmax) of the dynamic range DR (step S13; Yes), the latest scan data may be regarded as the scan data for the first period F1. The scan data here refers to data obtained from the AFE 31 corresponding to the output from the multiple PDs 82 resulting from the sensor scan. Using FIG. 6 as an example, data corresponding to a signal represented by a sinusoidal distribution formed by the solid curve W1 and the dashed curve WM in the graph for the first period F1 is regarded as the latest scan data, i.e., the scan data for the first period F1.

[0070] Furthermore, if it is determined in step S13 that there is a sensor unit WA that has generated a signal output that corresponds to (or exceeds) the upper limit (Dmax) of the dynamic range DR (step S13; Yes), a variable (a) used to manage the amount of signal level shift for subsequent processing is set to a predetermined initial value (z) (step S15). Also, a variable (Rawdata) used to derive the luminance level to be adopted in the second detection process FB is set (step S16). The processing of step S15 and the processing of step S16 are in no particular order.

[0071] The initial value of the variable (Rawdata) set by the process of step S16 is the dynamic range (b) of the sensor unit WA indicated by the latest scan data at the time of the process of step S16. More specifically, b is the signal level in a state before the signal level shift process by the process of step S17 described later. In other words, b corresponds to the dynamic range DR at the time when the scan data that can be used as the scan data of the first period F1 is obtained, and corresponds to the dynamic range DR that has not undergone any change in the bias current or the initial potential since that time. The b included in the formula (1) of step S22 described later is the same as the b described here.

[0072] After the process of step S16, a signal level shift process is performed (step S17). In the process of step S17, the bias current is changed as described with reference to FIG. 8, or the initial potential is changed as described with reference to FIG. 9. Of course, both the bias current and the initial potential may be changed. In the embodiment, the amount of change in the signal intensity applied by performing the process of step S17 once is a fixed amount of change (e.g., z), but the amount of change may decrease depending on the number of times the process of step S17 is repeated. Here, the fixed amount of change z is the same as the value substituted as the initial value of the variable (a) set in the process of step S15.

[0073] After the process of step S17, a sensor scan is performed (step S18). As a result of the sensor scan in step S17, it is determined whether there is a sensor unit WA that has generated an output of a signal corresponding to the upper limit (Dmax) of the dynamic range DR (step S19).

[0074] If it is determined in step S19 that there is a sensor unit WA that has generated an output of a signal corresponding to the upper limit (Dmax) of the dynamic range DR (step S19; Yes), the value of the variable (Rawdata) set in the process of step S16 is updated (step S20). In the description of step S20 shown in FIG. 13, "Rawdata=Rawdata+a" indicates that the value of the variable (Rawdata) is updated so as to shift by a from the value before the process of step S14 (Rawdata+a). In other words, the degree of shift of the dynamic range DR by the process of step S17 is reflected in the variable (Rawdata).

[0075] After the process of step S20, the value of the variable (a) set in the process of step S15 is updated (step S21). In the description of step S21 shown in FIG. 13, "a=a+h" indicates that the value of a is updated to be larger by z than the value before the process of step S21 (a+z). This z is substituted as the initial value of the variable (a) set in the process of step S15, and is the same as the value of z that is changed by a certain amount in the process of step S17. After the process of step S21, the process proceeds to the process of step S17.

[0076] If it is determined in step S19 that there is no sensor unit WA that has produced a signal output corresponding to the upper limit (Dmax) of the dynamic range DR (step S19; No), the latest scan data (Rawdata) at that time may be used as the scan data for the second period F2. Therefore, at this point in time, a composite signal WS (see FIG. 7) is obtained by combining the scan data in the first period F1 and the scan data in the second period F2.

[0077] Furthermore, if the scan data obtained by performing the process of step S18 n times is raw(n), the variable (Rawdata) set in the process of step S16 is updated according to the following formula (1) (step S22). The description "Max(raw(n)-(ba),0)" in the following formula (1) indicates that if the value (ba) obtained by subtracting the value of a from b from "raw(n)" exceeds 0, that value is reflected, and otherwise 0 is reflected. After the process of step S22, Rawdata is updated so that the value of the variable (Rawdata) is shifted by "Max(raw(n)-(ba),0)" from the value before the process of step S22. Rawdata=Rawdata+Max(raw(n)-(ba),0)…(1)

[0078] After the process of step S22, a calculation process is performed according to the following formula (2) to set the luminance level BL2 in the second detection process FB (step S23). In formula (2), y is a target value, which will be described later. In formula (2), Rawdata is the left side of formula (1). BL2 = x × y / Rawdata…(2)

[0079] The target value (y) is determined in advance so as to establish the relationship between the peak TV2 and the upper limit Dmax described with reference to Figures 11 and 12. As a specific example, the target value (y) is set as a value corresponding to about 90% when the upper limit Dmax is 100% and the lower limit Dmin is 0%, but is not limited thereto and may be set appropriately between the upper limit Dmax and the lower limit Dmin.

[0080] After the process of step S23, the sensor scan for the second detection process FB is performed using a combination of the luminance level BL2 determined in the process of step S23 and the default bias current and reset potential settings (step S24). That is, in the second detection process FB, as in the first detection process FA, the signal intensity is set in advance so that the signal intensity when PD82 does not detect any light exceeds the lower limit (Dmin) of the dynamic range DR. More specifically, the process of step S17 may cause the signal intensity when PD82 does not detect any light to fall below the lower limit (Dmin) of the dynamic range DR, but at the time of step S24, the effect of the process of step S17 is eliminated. Then, in the second detection process FB, the detection process is performed at a luminance level (BL2) lower than the luminance level of the first detection process FA.

[0081] Note that the subject of the processing according to the flowchart described with reference to FIG. 13 is, for example, the host 30, but a circuit or the like that performs part or all of the processing may be provided in another configuration (for example, the detection circuit 15, etc.).

[0082] As described above, according to the embodiment, a sensor panel 10 is provided having a detection area SA in which a plurality of sensor units WA are arranged two-dimensionally, each of which detects light and generates an output according to the degree of the detected light, and a light source unit 20 having a plurality of point light sources 22 arranged in a light-emitting area LA provided corresponding to the detection area SA. A first detection process FA is performed in which the point light sources 22 are turned on to obtain outputs from the plurality of sensor units WA, and a second detection process FB is performed in which the point light sources 22 are turned on at a brightness different from that of the first detection process FA to obtain outputs from the plurality of sensor units WA, and the brightness of the point light sources in the second detection process FB is based on the relationship between the brightness of the point light sources 22 in the first detection process FA and the outputs from the plurality of sensor units WA.

[0083] That is, how the outputs from the multiple sensor units WA, which are caused by the luminance of the point light source 22 in the first detection process FA, are handled by the input target of the outputs (for example, the detection circuit 15) (for example, whether or not it is equal to or greater than the upper limit Dmax) is reflected in the second detection process FB. Therefore, by making an adjustment based on the correspondence between the luminance of the point light source 22 and the outputs from the sensor units WA in the first detection process FA (for example, the processing from step S20 to step S22 described with reference to FIG. 13), the range of brightness of the light passing through the target to be detected in the second detection process FB can be more easily accommodated within the dynamic range of brightness of detection in the detection device.

[0084] In addition, the multiple sensor units WA are connected to a detection circuit 15 that obtains the output of the sensor units, the sensor unit WA has a PD82, the anode of which is supplied with a reference potential VCOM and the cathode of which is supplied with a reset potential Vreset, and the process of determining the luminance of the point light source 22 in the first detection process FA in order to bring the output of the multiple sensor units WA in the second detection process FB within the range between the lower limit (Dmin) and upper limit (Dmax) of the input that can be recognized by the detection circuit 15 includes a process of changing both the reference potential VCOM and the reset potential Vreset, thereby enabling a process (for example, a process following the flow of the flowchart described with reference to Figure 13) to be performed in order to bring the output from the multiple sensor units WA within the dynamic range DR of the detection circuit 15 to which the output from the multiple sensor units WA is input.

[0085] Further, the multiple sensor units WA are connected to a detection circuit 15 which obtains the output of the sensor units, the sensor unit WA has a PD82, the PD82 has an anode to which a reference potential VCOM is applied and a cathode to which a reset potential Vreset is applied, a configuration (signal line 7) which functions as an electrical resistance (electrical resistance ER) is interposed between the sensor unit WA and the detection circuit 15, a current source 32 which applies a bias current is connected to the connection path between the electrical resistance and the detection circuit 15, and the process of determining the luminance of the point light source 22 in the first detection process FA in order to bring the output of the multiple sensor units WA in the second detection process FB within the range between the lower limit (Dmin) and the upper limit (Dmax) of the input recognizable by the detection circuit 15 includes a process of changing the bias current, whereby a process for bringing the output from the multiple sensor units WA within the dynamic range DR of the detection circuit 15 to which the output from the multiple sensor units WA is input (for example, a process following the flow of the flowchart described with reference to FIG. 13) can be performed.

[0086] In addition, the multiple sensor units WA are connected to a detection circuit 15 which obtains the output of the sensor units WA, and the brightness of the point light source 22 in the second detection process FB is set based on an output (for example, an output indicated by the value of the brightness level BL2 calculated in the processing of step S23) reflecting the amount of shift (for example, the amount of shift indicated by the value of variable a) between the case where the output of the multiple sensor units WA in the first detection process FA is set to a state above the upper limit (Dmax) of input recognizable by the detection circuit 15 and the case where the output of the multiple sensor units WA is set to less than the upper limit, so that the second detection process FB can be more reliably set within the dynamic range of brightness of the detection device.

[0087] In addition, the first detection process FA includes a first period F1 in which the output of the multiple sensor units WA is equal to or greater than the upper limit (Dmax) of input that can be recognized by the detection circuit 15, and a second period F2 in which the output of the multiple sensor units WA is less than the upper limit (Dmax) of input that can be recognized by the detection circuit 15. By combining the output of the sensor units WA in the first period F1 and the output of the sensor units WA in the second period F2, sensing with a resolution exceeding the dynamic range DR can be achieved.

[0088] Furthermore, in the first detection process FA, if the outputs of the multiple sensor units WA are not equal to or greater than the upper limit (Dmax) of the input that can be recognized by the detection circuit 15 before the second period F2, the luminance of the point light source 22 is increased so that the outputs of the multiple sensor units WA become equal to or greater than the upper limit, as described in the processing of step S14 shown in Figure 13, thereby making it possible to more reliably make the outputs of the multiple sensor units WA equal to or greater than the upper limit in the first period F1.

[0089] Furthermore, by removing the overlapping portion (e.g., within the overlap range Di) of the first output (e.g., first signal P1) which is the output of the sensor unit WA in the first period F1 and the second output (e.g., second signal P2) which is the output of the sensor unit WA in the second period F2 from the first output or the second output and combining them, the sensor output obtained through two sensing operations in the first period F1 and the second period F2 can be used as an output indicating the result of sensing that fully utilizes the potential of PD82 provided in the sensor unit WA.

[0090] In addition, multiple sensor units WA are arranged in a matrix, and each of the multiple sensor units WA is connected to a scanning line for transmitting a scanning signal that generates an output in the sensor unit WA and a signal line for transmitting the output from the sensor unit WA, thereby making it possible to arrange the multiple sensor units WA more efficiently.

[0091] Furthermore, when the sensor panel 10, which includes a ray limiting member 50 that limits the path of light reaching the sensor unit WA from the point light source 22 and has a detection area SA in which a plurality of sensor units WA are arranged, and the point light source 22 face each other across a culture medium (for example, a detection target SUB), the ray limiting member 50 is disposed between the culture medium and the sensor panel 10, so that the light emitted from the point light source 22 and passing through the culture medium can be detected in the detection area SA. In other words, the state of the culture medium can be sensed.

[0092] In addition, other advantageous effects brought about by the aspects described in this embodiment that are obvious from the description in this specification or that can be appropriately thought of by a person skilled in the art are naturally understood to be brought about by the present disclosure. [Explanation of symbols]

[0093] 1. Detection device 6 Scan Lines 7 Signal Line 10 Sensor Panel 15 Detection circuit 22 point light source 31 AFE 32 Current source 50 Radiation Limiting Materials 82 Photodiode F1 1st Period F2 2nd Period VReset Reset potential VCOM reference potential WA Sensor section

Claims

1. a sensor panel having a detection area in which a plurality of sensor units are arranged two-dimensionally to detect light and generate an output according to the intensity of the detected light; a light source unit having a plurality of point light sources arranged in a light-emitting region provided corresponding to the detection region, a first detection process in which the point light source is turned on to obtain outputs from the plurality of sensor units, and a second detection process in which the point light source is turned on at a luminance different from that of the first detection process to obtain outputs from the plurality of sensor units, the luminance of the point light source in the second detection process is based on a relationship between the luminance of the point light source in the first detection process and outputs from the plurality of sensor units; Detection device.

2. the plurality of sensor units are connected to a detection circuit that obtains outputs from the sensor units; the sensor unit has a photodiode, a reference potential is applied to the anode of the photodiode, and a reset potential higher than the reference potential is applied to the cathode of the photodiode; the process of determining the luminance of the point light source in the first detection process so that the outputs of the plurality of sensor units in the second detection process fall within a range between a lower limit and an upper limit of an input recognizable by the detection circuit includes a process of changing both the reference potential and the reset potential. The detection device according to claim 1 .

3. the plurality of sensor units are connected to a detection circuit that obtains outputs from the sensor units; the sensor unit has a photodiode, a reference potential is applied to the anode of the photodiode, and a reset potential higher than the reference potential is applied to the cathode of the photodiode; a configuration functioning as an electrical resistor is interposed between the sensor unit and the detection circuit, a current source that applies a bias current is connected to a connection path between the electrical resistor and the detection circuit; the process of determining the luminance of the point light source in the first detection process so that the outputs of the plurality of sensor units in the second detection process fall within a range between a lower limit and an upper limit of an input recognizable by the detection circuit includes a process of changing the bias current. The detection device according to claim 1 .

4. the plurality of sensor units are connected to a detection circuit that obtains outputs from the sensor units; the luminance of the point light source in the second detection process is set based on a shift amount between a case where the outputs of the plurality of sensor units in the first detection process are set to a state equal to or greater than an upper limit of an input that can be recognized by the detection circuit, and a case where the outputs of the plurality of sensor units are set to a state less than an upper limit of an input that can be recognized by the detection circuit.

4. A detection device according to any one of claims 1 to 3.

5. The first detection process is a first period in which outputs of the plurality of sensor units are equal to or greater than an upper limit of input that can be recognized by the detection circuit; a second period in which the outputs of the plurality of sensor units are made less than an upper limit of the input that can be recognized by the detection circuit, an output of the sensor unit in the first period and an output of the sensor unit in the second period are combined; The detection device according to claim 4.

6. If the outputs of the plurality of sensor units are not equal to or greater than the upper limit of the input that can be recognized by the detection circuit before the second period in the first detection process, the luminance of the point light source is increased so that the outputs of the plurality of sensor units become equal to or greater than the upper limit of the input that can be recognized by the detection circuit. The detection device according to claim 5 .

7. an overlapping portion of a first output, which is the output of the sensor unit in the first period, and a second output, which is the output of the sensor unit in the second period, is removed from the first output or the second output and combined; The detection device according to claim 5 .

8. The plurality of sensor units are arranged in a matrix, Each of the plurality of sensor units is connected to a scanning line for transmitting a scanning signal that causes the sensor unit to generate an output, and a signal line for transmitting an output from the sensor unit.

4. A detection device according to any one of claims 1 to 3.

9. a member that limits a path of light that reaches the sensor unit from the point light source; When a sensor panel having a detection area in which a plurality of the sensor units are arranged and the point light source face each other across a culture medium, the member is disposed between the culture medium and the sensor panel.

4. A detection device according to any one of claims 1 to 3.

Images