Mounting machine and method for determining pickup state

Abstract

This mounting machine comprises: a head that has a suction nozzle, suctions a component with a tip of the suction nozzle, and mounts the component on a substrate; a sensor having a light source that irradiates the tip of the suction nozzle with light and a light-receiving element that receives the light emitted from the light source, the sensor outputting the light intensity of the light received by the light-receiving element; and a control unit that calculates a first derivative value by differentiating the light intensity of the light output from the sensor, and that determines, on the basis of the calculated first derivative value, whether the suction state of a component suctioned to the tip of the suction nozzle is defective when the suction nozzle passes through the light. The control unit determines that the suction state of the component is not defective when the first derivative value is determined to be at least a first threshold value but less than a second threshold value greater than the first threshold value.

Description

[Technical field]

[0001] The present disclosure relates to a mounter and a pickup state determination method. [Background technology]

[0002] Patent Document 1 discloses a component mounting method in which a suction nozzle holding a component at its tip is positioned at a predetermined position on an object to be mounted according to component mounting device information, the suction nozzle is lowered from the predetermined position to mount the component at the component mounting position, and the suction nozzle is released from its hold on the component and then raised. The component mounting method sets a measurement position at a predetermined height on the lift path of the suction nozzle, measures the time it takes for the component or suction nozzle to reach the measurement position from the predetermined position when the suction nozzle is lowered and / or raised, and judges whether the state of holding and / or mounting of the component by the suction nozzle is good or bad based on the measured time. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] JP 2002-208800 A Summary of the Invention

[0004] The present disclosure has been devised in consideration of the above-mentioned conventional circumstances, and aims to provide a mounting machine and a pickup state determination method that obtains with higher accuracy the pickup state of a component picked up by a nozzle.

[0005] The mounting machine according to the present disclosure includes a head having a suction nozzle, suctioning a component at a tip of the suction nozzle and mounting the component on a board, a sensor having a light source that irradiates a light beam to the tip of the suction nozzle and a light receiving element that receives the light beam irradiated from the light source and outputs a light intensity of the light beam received by the light receiving element, and a control unit that calculates a first differential value by differentiating the light intensity of the light beam output from the sensor and determines whether or not a suction state of the component sucked to the tip of the suction nozzle when the suction nozzle passes through the light beam is defective based on the calculated first differential value. When the control unit determines that the first differential value is equal to or greater than a first threshold value and less than a second threshold value that is greater than the first threshold value, it determines that the suction state of the component is not defective.

[0006] Furthermore, the suction state determination method disclosed herein is an suction state determination method executed by a terminal device including one or more computers communicatively connected to a mounting machine that picks up a component at the tip of a suction nozzle and mounts it on a board, the method comprising: acquiring the light intensity of a light beam irradiated to the tip of the suction nozzle and received by a light receiving element; calculating a differential value by differentiating the light intensity of the acquired light beam; and if it is determined that the calculated differential value is greater than or equal to a first threshold value and less than a second threshold value greater than the first threshold value, it is determined that the suction state of the component adsorbed at the tip of the suction nozzle when the suction nozzle passes through the light beam is not defective.

[0007] According to the present disclosure, the suction state of a component picked up by a nozzle can be determined with higher accuracy. [Brief description of the drawings]

[0008] [Figure 1] FIG. 1 is a block diagram showing an example of the internal configuration of a mounting machine according to a first embodiment. [Diagram 2] FIG. 1 is a diagram for explaining an example of a partial configuration of a mounting machine according to a first embodiment; [Diagram 3] Enlarged view of the main parts of the mounting machine [Figure 4] FIG. 1 is a diagram for explaining an example of IV conversion processing; [Diagram 5] FIG. 1 is a diagram for explaining an example of a process for determining the pickup state of a component in a mounting machine according to the first embodiment; [Figure 6] FIG. 1 is a diagram for explaining an example of a process for determining a component pickup attitude (angle) of a mounter according to the first embodiment; [Figure 7] FIG. 1 is a diagram for explaining a comparison example of an IV conversion graph and a differential graph with and without disturbance. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0009] (Background to this disclosure) Conventionally, there is a mounting machine that uses an optical sensor to detect an electronic component (hereinafter referred to as a "component") that is picked up at the tip of a suction nozzle and judges whether the component is picked up properly. The component mounting method and device (hereinafter referred to as a "mounting machine") of Patent Document 1 calculates the descent passage time during which light is blocked by the suction nozzle and the component using an optical sensor arranged to be able to detect the suction nozzle and the component in a range corresponding to the component mounting position on a circuit board (hereinafter referred to as a "board"). In addition, the mounting machine calculates a theoretical value of the descent passage time based on the descent speed of the suction nozzle, the thickness of the component, and the offset amount of the suction nozzle that are stored in advance, and judges that the component is normally picked up if it is determined that (descent passage time) ≒ (theoretical value of descent passage time).

[0010] However, in the component mounting method described above, the theoretical value of the descending passage time is calculated using a previously stored offset amount of the suction nozzle, so if the mounting machine has deterioration of the suction nozzle due to wear or the like, the descending passage time becomes shorter, which may result in a decrease in the accuracy of the determination of the component suction posture.

[0011] Another method of using an optical sensor to determine whether a component is properly picked up is to use an optical sensor provided on the component transport path from the component supply position to the component mounting position to determine the pick-up state of a component being transported by a suction nozzle. The mounting machine determines the pick-up state of the component by calculating the thickness of the component based on the amount of light blocked, as the light from the light source is blocked by the suction nozzle and the component passing through the optical sensor. However, with this method, the amount of light blocked varies depending on individual differences in the lifting and lowering direction of the suction nozzle (e.g., nozzle length), so the mounting machine may have a lower accuracy in measuring the thickness of the picked-up component and a lower accuracy in determining the pick-up attitude of the component.

[0012] Hereinafter, with reference to the drawings as appropriate, each embodiment that specifically discloses the configuration and operation of the mounting machine and the suction state determination method according to the present disclosure will be described in detail. However, more detailed explanation than necessary may be omitted. For example, detailed explanation of already well-known matters and duplicate explanation of substantially the same configuration may be omitted. This is to avoid the following explanation becoming unnecessarily redundant and to facilitate understanding by those skilled in the art. Note that the attached drawings and the following explanation are provided to enable those skilled in the art to fully understand the present disclosure, and are not intended to limit the subject matter described in the claims.

[0013] In the following drawings, the X and Y directions are perpendicular to each other in a horizontal plane, and the Z direction is the height direction (up-down direction) perpendicular to the X and Y directions.

[0014] (Embodiment 1) First, the internal configuration of a mounting machine 100 according to the first embodiment will be described with reference to Fig. 1 to Fig. 3. Fig. 1 is a diagram illustrating an example of the internal configuration of the mounting machine 100 according to the first embodiment. Fig. 2 is a diagram illustrating an example of a partial configuration of the mounting machine 100 according to the first embodiment. Fig. 3 is an enlarged view of a main part of the mounting machine 100.

[0015] In the example shown in Fig. 1, the number of mounting machines connected to management computer 21 is one, but multiple machines may be connected at the same time. Also, in Fig. 1, illustration of X-axis rail 10A, Y-axis rail 10B, component supply unit 12, and board rail 16 is omitted.

[0016] The mounting machine 100 according to the first embodiment drives each of a pair of board rails 16 to carry in the board 13. The mounting machine 100 drives the head 11 equipped with one or more suction nozzles 15, and picks up the components P (see FIG. 3) supplied by the component supply unit 12 with each of the suction nozzles 15. After picking up the components P with the suction nozzles 15, the mounting machine 100 moves the head 11 onto the board 13, transports the components P onto the board 13, and then mounts the components P at each component mounting position on the board 13. The mounting machine 100 produces a mounted board by mounting (attaching) all the components P to be mounted on the board 13, and then drives each of the pair of board rails 16 to carry out the produced mounted board.

[0017] The mounting machine 100 includes a head 11, a component supply unit 12, a measurement system 14, one or more suction nozzles 15, a pair of board rails 16, a processor 17, a memory 18, and an output unit 19. Note that the communication unit 20 is not a required component and may be omitted. Furthermore, when the mounting machine 100 includes the communication unit 20, it may be communicatively connected to a management computer 21 (i.e., an external device) and capable of transmitting and receiving data.

[0018] Each of the pair of X-axis rails 10A is coupled to a Y-axis rail 10B and supports the Y-axis rail 10B so as to be movable in the X and -X directions. The Y-axis rail 10B is coupled to the head 11 and supports the head 11 so as to be movable in the Y and -Y directions. Each of the pair of X-axis rails 10A and the Y-axis rail 10B constitute a movement mechanism that moves the head 11.

[0019] Head 11 is controlled by a movement mechanism to drive (move) in each of the X-axis, Y-axis, and Z-axis directions. Head 11 is coupled to a Y-axis rail 10B and transports components P between component supply unit 12 and a predetermined component mounting position on board 13.

[0020] Head 11 is equipped with one or more suction nozzles 15. Head 11 causes each of suction nozzles 15 to pick up and release the suction of components P, using processor 17. Head 11 picks up components P supplied by component supply unit 12 at the tips of suction nozzles 15, transports the components P to a predetermined component mounting position on board 13, and then releases suction of the components P to mount the components on board 13.

[0021] Here, after suctioning the component P, the head 11 moves so that the component P sucked at the tip of the suction nozzle 15 passes through the light beam 14B irradiated from the light source 14A, which is disposed between the component supply unit 12 and the board 13. In this way, the mounting machine 100 measures the thickness of the component P sucked at the tip of each suction nozzle 15 based on the amount of light shading of the light beam 14B, and determines the suction state of the component P. In one example, as shown in FIG. 3, the multiple suction nozzles 15 are aligned in a direction perpendicular to the direction in which the light source 14A irradiates the light beam 14B. The head 11 is also configured to move in the direction in which the multiple suction nozzles 15 are aligned.

[0022] The component supply unit 12 is controlled by the processor 17 to supply the components P to be mounted on the board 13. Note that the component supply unit 12 may be capable of simultaneously supplying a plurality of different types of components P. Also, the arrangement of the component supply unit 12 shown in FIG. 2 is one example and is not limited to this.

[0023] Measurement system 14, which is an example of a sensor, includes light source 14A, slit 14C, photoelectric conversion element 14D, and current-voltage conversion unit 14E. Slit 14C is disposed on the surface facing light source 14A. Note that the arrangement positions of measurement system 14 shown in each of Figs. 1 to 3 are merely examples and are not limited thereto.

[0024] The photoelectric conversion element 14D, which is an example of a light receiving element, converts light (light beam 14B) irradiated from a light source 14A such as an LED (Light Emitting Diode) or an LD (Laser Diode) and passing through a slit 14C into an electric signal and outputs the electric signal to the current-voltage conversion unit 14E. The current-voltage conversion unit 14E outputs a conversion value (hereinafter referred to as an "IV conversion value") obtained by converting the electric signal (current) output from the photoelectric conversion element 14D into a voltage to a differential processing unit 17A in the processor 17. The current-voltage conversion unit 14E outputs the IV conversion value to the differential processing unit 17A at a predetermined period (for example, a period on the order of kHz). That is, the current-voltage conversion unit 14E outputs the IV conversion value at a frequency (first frequency) of 1 kHz or more and less than 1 MHz.

[0025] The processor 17, which is an example of a control unit, is configured using, for example, a CPU (Central Processing Unit), a DSP (Digital Signal Processor) or an FPGA (Field Programmable Gate Array), and controls the operation of each part of the processor 17. The processor 17 performs various processes and controls in cooperation with the memory 18. Specifically, the processor 17 refers to the programs and data stored in the memory 18 and executes the programs to realize the functions of each part. Note that the parts referred to here are the differential processing unit 17A and the determination unit 17B.

[0026] The differential processing unit 17A calculates the differential (difference) between each of two consecutive IV converted values ​​output from the current-voltage conversion unit 14E. The differential processing unit 17A outputs each of the calculated differential values ​​of the IV converted values ​​to the determination unit 17B.

[0027] The determination unit 17B measures the thickness (height) in the Z direction, the width in the X direction, the attitude (angle) and the like of the component P picked up at the tip of the suction nozzle 15 based on the time series change of the differential value output from the differential processing unit 17A, and executes a determination process regarding the suction state or suction attitude of the component P. Based on the differential value output from the differential processing unit 17A and the threshold value 18A stored in the memory 18, the determination unit 17B determines whether or not the thickness of the component P picked up by each suction nozzle 15 is the thickness of the component P when the component P is normally picked up. Based on the differential value output from the differential processing unit 17A and the threshold value 18A stored in the memory 18, the determination unit 17B also determines whether or not the suction attitude (angle) of the component P picked up by each suction nozzle 15 is the suction attitude of the component P when the component P is normally picked up.

[0028] The determination unit 17B outputs the determination result to the output unit 19. Note that the determination unit 17B may output the determination result to the output unit 19 only when it is determined that the component P is not normally picked up or is not in a normal pick-up posture. The determination unit 17B may also store the determination result in the memory 18. Furthermore, when the mounting machine 100 is connected to the management computer 21 via the communication unit 20 so as to be able to communicate with the management computer 21, the determination unit 17B may output the determination result to the management computer 21 via the communication unit 20.

[0029] If the determining unit 17B determines that the component P has been normally picked up and that the pickup posture is not normal, it may calculate the angle difference between the measured pickup angle of the component P and the normal pickup angle, and rotate the corresponding pickup nozzle 15 based on the calculated angle difference. This allows the mounting machine 100 to correct the pickup posture (angle) of the component P to the normal pickup posture.

[0030] Memory 18 has, for example, a RAM (Random Access Memory) as a work memory used when executing each process of processor 17, and a ROM (Read Only Memory) that stores programs and data that define the operation of processor 17. Data or information generated or acquired by processor 17 is temporarily stored in the RAM. Programs that define the operation of processor 17 are written in the ROM. Memory 18 stores threshold values ​​18A that are used for various judgments executed by judgment unit 17B. Memory 18 also stores production data for producing mounting boards that are the production targets.

[0031] The production data here is information used for producing mounted boards by the mounting machine 100. The production data includes, for example, the size of the board 13, the size and shape of the component P, information on the suction nozzle, the number of boards produced, etc. Note that the production data is not limited to the data on the items described above. The production data may also include information on a threshold value 18A for each component P, which will be described later.

[0032] Threshold value 18A is set for each type of component P, and is a threshold value for determining whether or not component P is normally picked up by suction nozzle 15. Specifically, threshold value 18A stored in memory 18 includes threshold values ​​for determining whether or not component P is normally picked up based on the thickness of component P (e.g., a first threshold value, a second threshold value, a third threshold value, and a fourth threshold value, etc.), threshold values ​​for determining whether or not the suction posture (angle) of component P is normal (e.g., a fifth threshold value and a sixth threshold value, etc.) It is sufficient that at least one threshold value is set as the threshold value used for each determination.

[0033] The output unit 19 is configured using a display such as an LCD (Liquid Crystal Display) or an organic EL (Electroluminescence) display. The output unit 19 displays the determination result regarding the suction state or suction posture of the component P output from the determination unit 17B, and outputs the result as sound.

[0034] The communication unit 20 is connected to the management computer 21 so as to be able to communicate wirelessly or by wire to transmit and receive data. The communication unit 20 transmits to the management computer 21 the determination result on the suction state or suction posture of the component P output from the determination unit 17B. The communication unit 20 also acquires production data of the board 13, production data for each component P, or a threshold value for each component P transmitted from the management computer 21, and outputs the data to the processor 17. Note that the wireless communication referred to here is communication via a wireless LAN (Local Area Network) such as Wi-Fi (registered trademark).

[0035] The determination process regarding the suction state or suction attitude (angle) of the component P may be executed by the management computer 21. In such a case, the processor 17 in the mounting machine 100 may associate the IV conversion value output from the current-voltage conversion unit 14E with identification information capable of identifying the mounting machine 100 and the suction nozzle 15 and transmit them to the management computer 21, or may associate the differential value calculated by the differential processing unit 17A with identification information capable of identifying the mounting machine 100 and the suction nozzle 15 and transmit them to the management computer 21. In such a case, the mounting machine 100 may obtain the determination result regarding the suction state or suction attitude of the component P transmitted from the management computer 21, store it in the memory 18, and output it to the output unit 19.

[0036] The management computer 21 is, for example, a PC (Personal Computer), a notebook PC, a tablet terminal, etc., and is operated by an operator. The management computer 21 is communicably connected to one or more mounting machines, and generates production information related to the production process of the mounting board input or set in advance by the operator, and an execution command for executing the production process, and transmits the information to each mounting machine.

[0037] Next, the IV (current-voltage) conversion process executed by the current-voltage converter 14E will be described with reference to Fig. 4. Fig. 4 is a diagram for explaining an example of the IV conversion process. Note that in Fig. 4, the head 11 is omitted from illustration in order to make the description easier to understand.

[0038] Each of the multiple suction nozzles 15 equipped in the head 11 may have individual differences in the length to the tip that picks up the component P, the shape of the tip, etc. due to manufacturing errors, deterioration over time, etc. Below, a specific description will be given of changes in the IV conversion output value caused by individual differences in the suction nozzles 15.

[0039] 4 shows an example in which two suction nozzles 15A, 15B that have picked up the same component P are arranged side by side along the irradiation direction (Y direction) of light beam 14B for ease of understanding. However, each of the actual multiple suction nozzles 15 is arranged in a direction different from the irradiation direction (Y direction) of light beam 14B as shown in FIGS. 2 and 3 so that two or more suction nozzles are not detected simultaneously by measurement system 14. This enables mounting machine 100 to detect the suction state (or suction posture) of component P for each suction nozzle 15.

[0040] 4, suction nozzle 15A picks up component P at height HA. Suction nozzle 15B picks up component P at height HB. The amount of light beam 14B blocked by suction nozzle 15A is greater than the amount of light beam 14B blocked by suction nozzle 15B.

[0041] The IV conversion graph Op1 is a graph showing the time series change of the IV conversion value obtained when the suction nozzle 15A passes the light beam 14B. The IV conversion graph Op2 is a graph showing the time series change of the IV conversion value obtained when the suction nozzle 15B passes the light beam 14B. The vertical axis of each of the IV conversion graphs Op1 and Op2 indicates the IV conversion value output from the current-voltage conversion unit 14E. The horizontal axis of each of the IV conversion graphs Op1 and Op2 indicates time. The IV conversion values ​​of each of the IV conversion graphs Op1 and Op2 increase in proportion to the amount of light blocking of the light beam 14B. The light blocking level LV0A is an IV conversion value indicating that the light beam 14B is not blocked by the suction nozzle.

[0042] In such a case, the IV conversion graph Op1 corresponding to the suction nozzle 15A has a maximum amount of light blocking in time period T11 when the suction nozzle 15A and the component P pass through the light ray 14B, and the IV conversion value becomes the maximum value V11. Similarly, the IV conversion graph Op2 has a maximum amount of light blocking in time period T12 when the suction nozzle 15A and the component P pass through the light ray 14B, and the IV conversion value becomes the maximum value V12. In this way, when the amount of light blocking of the light ray 14B differs due to individual differences between the suction nozzles 15A and 15B, it becomes difficult for the mounting machine 100 to more accurately determine the suction state of the component P because the IV conversion values ​​at the time of suction of the component P indicated by each of the IV conversion graphs Op1 and Op2 differ.

[0043] Therefore, the mounter 100 according to the first embodiment differentiates each of two consecutive IV conversion values ​​output from the current-voltage conversion unit 14E by the differential processing unit 17A. This enables the mounter 100 to generate time-series data of differential values ​​(differences) indicating the amount of change in the IV conversion value obtained by excluding the individual difference between the suction nozzles from the IV conversion value (for example, differential graphs Df11, Df12, Df13, Df14, etc. shown in FIG. 5). Hereinafter, with reference to FIG. 5, an example of a process for measuring the thickness of the component P using the time-series data of the generated differential values ​​and a process for determining the suction state of the component P will be described.

[0044] Next, an example of a process for determining the suction state of a component P executed by the mounting machine 100 according to the first embodiment will be described with reference to Fig. 5. Fig. 5 is a diagram for explaining an example of a process for determining the suction state of a component P by the mounting machine 100 according to the first embodiment. Note that in the example shown in Fig. 5, the suction nozzle 15 is omitted. Also, in the example shown in Fig. 5, the irradiation direction of the light beam 14B is the same as the direction of the arrow.

[0045] The differential processing unit 17A differentiates each of the two consecutive IV converted values ​​output from the current-voltage conversion unit 14E to obtain a differential value indicating the amount of change in these IV converted values. The differential processing unit 17A outputs the obtained differential value to the determination unit 17B.

[0046] The determination unit 17B determines whether or not the component P is normally adsorbed to the tip of the suction nozzle 15 based on the time series change (differential graph) of the differential value output from the differential processing unit 17A. Here, the amount of light blocked by the light beam 14B increases as the thickness of the component P increases. Also, the obtained differential value increases as the amount of light blocked by the light beam 14B increases. Therefore, the determination unit 17B can measure the thickness of the component P based on the differential value. Note that in the explanations from FIG. 5 onwards, the process of determining the adsorption state of the component P will be explained using the differential graph showing the time series change of the differential value, but the process of generating the differential graph is not essential and may be omitted.

[0047] The determination unit 17B determines whether the differential value is equal to or greater than a first threshold value ThA and less than a second threshold value ThB. Here, the first threshold value ThA is a threshold value related to the differential value (i.e., the thickness of the component P) and is a threshold value for determining whether the component P is adsorbed to the tip of the suction nozzle 15. The second threshold value ThB is a threshold value related to the differential value (i.e., the thickness of the component P), is a value greater than the first threshold value ThA, and is a threshold value for determining whether the component P is normally adsorbed to the tip of the suction nozzle 15.

[0048] When the determination unit 17B determines that the differential value is less than the first threshold value ThA, it determines that the component P is not picked up at the tip of the suction nozzle 15. When the determination unit 17B determines that the differential value is equal to or greater than the first threshold value ThA and less than the second threshold value ThB, it determines that the component P is picked up at the tip of the suction nozzle 15 and that the component P is picked up normally. When the determination unit 17B determines that the differential value is equal to or greater than the second threshold value ThB, it determines that the component P is not picked up normally at the tip of the suction nozzle 15.

[0049] The determination unit 17B may perform a process of determining the pickup state of the component P based on the positive peak (maximum value) and the negative peak (minimum value) of the differential value, as will be described later with reference to FIG.

[0050] The determination unit 17B outputs the determination result to the output unit 19 or the management computer 21, and stores it in the memory 18. Note that the various functions realized by the differential processing unit 17A or the determination unit 17B described above may be executed by the management computer 21.

[0051] An example of the process of determining the suction state of the component P by the determination unit 17B will be specifically described below by comparing the differential graphs Df11 to Df14 shown in Fig. 5. Note that normal suction in the example shown in Fig. 5 is, as an example, a state in which the surface P11 of the component P is picked up by the suction nozzle 15 and the thickness H1 (height) of the component P is detected by the measurement system 14. The differential graph Df11 is an example of a differential graph when the component P is not picked up by the suction nozzle 15. The differential graph Df12 is an example of a differential graph when the component P is normally picked up by the suction nozzle 15. Each of the differential graphs Df13 and Df14 is an example of a differential graph when the component P is not normally picked up by the suction nozzle 15.

[0052] The vertical axis of each of the differential graphs Df11 to Df14 indicates the differential value output from the differential processing unit 17A. The horizontal axis of each of the differential graphs Df11 to Df14 indicates time. Furthermore, level LV0B indicates that the differential value output from the differential processing unit 17A is 0 (zero). Note that, for ease of explanation, in FIG. 5, an example will be described in which the suction nozzle 15 is detected between time t11 and time t14, and the component P is detected between time t12 and time t13. Note that the period between time t11 and time t14 is also referred to as a predetermined period.

[0053] The differential graph Df11 is a differential graph when the suction nozzle 15 is not able to pick up the component P. In the differential graph Df11, only the tip of the suction nozzle 15 is detected between time t12 and time t13, and the differential value is approximately equal to level LV0B. In such a case, the determination unit 17B determines, based on the differential graph Df11, that the differential value output from the differential processing unit 17A is less than the first threshold value ThA, and determines that the tip of the suction nozzle 15 is not picking up the component P.

[0054] Moreover, the differential graph Df12 is a differential graph in the case where the suction nozzle 15 can pick up the component P and the component P is normally picked up by the suction nozzle 15. The differential value of the differential graph Df12 is equal to or greater than the first threshold value ThA and less than the second threshold value ThB between time t12 and time t13. In such a case, the determination unit 17B determines, based on the differential graph Df12, that the differential value is equal to or greater than the first threshold value ThA and less than the second threshold value ThB, and determines that the component P is picked up at the tip of the suction nozzle 15 and that the component P is normally picked up.

[0055] Specifically, when the determination unit 17B determines that the differential value corresponding to the thickness of the component P is equal to or greater than the first threshold value ThA and less than the second threshold value ThB, it determines that it has detected the thickness H1 of the component P when the surface P11 of the component P is being picked up by the suction nozzle 15. Therefore, when the determination unit 17B determines that the differential value is equal to or greater than the first threshold value ThA and less than the second threshold value ThB, it determines that the component P is normally picked up.

[0056] Moreover, each of differential graphs Df13 and Df14 is a differential graph when suction nozzle 15 is able to pick up component P, but component P is not being picked up normally by suction nozzle 15. Each of differential graphs Df13 and Df14 has a differential value that is equal to or greater than second threshold value ThB between time t12 and time t13. In such a case, based on each of differential graphs Df13 and Df14, determination unit 17B determines that the differential value is equal to or greater than second threshold value ThB, and determines that component P is being picked up at the tip of suction nozzle 15, but is not being picked up normally.

[0057] Specifically, when the determination unit 17B determines that the differential value corresponding to the thickness of the component P is equal to or greater than the second threshold value ThB, it determines that the thicknesses H2 and H3 of the component P have been detected when a face (e.g., faces P12, P13, etc.) other than face P11 of the component P is being picked up by the suction nozzle 15. In the example shown in Fig. 5, the magnitude relationship between the thicknesses of the component P is H2, H3>H1.

[0058] For example, when the suction nozzle 15 picks up face P12 of the component P, the differential graph becomes like differential graph Df13A indicated by a solid line, and the differential value becomes equal to or greater than the second threshold value ThB. Also, when the suction nozzle 15 picks up face P13 of the component P, the differential graph becomes like differential graph Df13B indicated by a dashed line, and the differential value becomes equal to or greater than the second threshold value ThB. Therefore, when the determination unit 17B determines that the differential value is equal to or greater than the second threshold value ThB, it determines that the component P is picked up at the tip of the suction nozzle 15, and that the component P is not picked up normally (i.e., the suction nozzle 15 has picked up the wrong face).

[0059] As a result, the determination unit 17B can determine whether or not the component P is normally picked up by the suction nozzle 15 based on the differential value of the differential graph. Note that the first threshold value ThA and the second threshold value ThB used in the process of determining the suction state of the component P are merely examples and are of course not limited to these.

[0060] For example, the first threshold value ThA and the second threshold value ThB are each adaptively set in response to the shape and size of the component P and the surface of the component P picked up by the suction nozzle 15 (i.e., the thickness of the component P based on the tip of the suction nozzle 15). For example, when picking up the surface P13 of the component P is normal pick-up, the second threshold value used in the process of determining the suction state of the component P may be the threshold value ThAA shown in Fig. 5. Also, when picking up the surface P13 of the component P is normal pick-up and when determining only whether the component P is normally picked up by the suction nozzle 15, the mounting machine 100 may be set with at least one threshold value (for example, the second threshold value ThB).

[0061] As a result, the mounting machine 100 according to the first embodiment can detect the component P picked up at the tip of the suction nozzle 15 based on the generated differential graph, and can determine (measure) whether the thickness of the component P is the thickness H1 of the component P when normally picked up based on the differential value. This allows the mounting machine 100 according to the first embodiment to more accurately determine the suction state of the component P even if there are individual differences between the suction nozzles as shown in FIG.

[0062] Next, an example of a process for determining the suction posture (angle) of a component P executed by the mounting machine 100 according to the first embodiment will be described with reference to Fig. 6. Fig. 6 is a diagram for explaining an example of a process for determining the suction posture (angle) of a component P by the mounting machine 100 according to the first embodiment. Note that in the example shown in Fig. 6, the suction nozzle 15 and the light source 14A are omitted from illustration. Also, in the example shown in Fig. 6, the irradiation direction of the light beam 14B is the same as the direction of the arrow.

[0063] The determination unit 17B generates a differential graph by plotting the differential values ​​output from the differential processing unit 17A in a time series manner. Based on the generated differential graph, the determination unit 17B determines whether the component P is adsorbed to the tip of the suction nozzle 15 in a normal posture (angle).

[0064] The normal posture (angle) referred to here is data related to the posture (angle) of component P set corresponding to the orientation of component P to be mounted on board 13, and is included in, for example, the production data. Based on the posture (angle) of component P included in the production data, mounting machine 100 picks up component P from component supply unit 12 by suction, transports it onto board 13, and mounts it.

[0065] In each of the examples of differential graphs Df21 to Df23 shown in FIG. 6, the judgment unit 17B performs a judgment process of the adsorption state of the component P by judging whether or not the positive peak of the differential value output from the differential processing unit 17A (i.e., the maximum value of the differential value (first differential value)) is greater than or equal to a first threshold value ThA1 and less than a second threshold value ThB1, based on each of the differential graphs Df21 to Df23.

[0066] The determination unit 17B may execute the process of determining the adsorption state of the component P using a third threshold ThA2, which is equal to the absolute value of the first threshold ThA1 and is used to determine the detection of the component P based on the negative value of the differential value, and a fourth threshold ThB2, which is equal to the absolute value of the second threshold ThB1 and is used to determine the detection of the component P based on the negative value of the differential value. In other words, the third threshold ThA2 is greater than the fourth threshold ThB2.

[0067] Specifically, when the judgment unit 17B judges that the negative peak of the differential value output from the differential processing unit 17A (i.e., the minimum value of the differential value (second differential value)) is equal to or greater than the third threshold value ThA2, it judges that the component P is not adsorbed to the tip of the suction nozzle 15. When the judgment unit 17B judges that the negative peak of the differential value is less than the third threshold value ThA2 and equal to or greater than the fourth threshold value ThB2, it judges that the component P is adsorbed to the tip of the suction nozzle 15 and that the component P is normally adsorbed. When the judgment unit 17B judges that the negative peak of the differential value is less than the fourth threshold value ThB2, it judges that the component P is not normally adsorbed to the tip of the suction nozzle 15.

[0068] Note that the determination unit 17B may determine that the component P is not normally picked up by the tip of the suction nozzle 15 only when it determines that the positive peak of the differential value output from the differential processing unit 17A is equal to or greater than the first threshold value ThA1 and less than the second threshold value ThB1, and the negative peak of the differential value is less than the third threshold value ThA2 and equal to or greater than the fourth threshold value ThB2. This allows the mounting machine 100 according to the first embodiment to measure with higher accuracy the thickness of the component P picked up by the suction nozzle 15 based on the generated differential graph, and therefore to determine with higher accuracy whether the component P is picked up in a normal suction posture.

[0069] Furthermore, the determination unit 17B measures the detection time of the detected component P, and determines whether or not the detection time of the component P is less than a fifth threshold value ThC. Here, the detection time of the component P is the time during which the component P continues to block the light beam 14B. The fifth threshold value ThC is a threshold value related to the detection time of the component P, and is a threshold value for determining whether or not the component P is picked up by the suction nozzle 15 in a normal suction posture. The detection time of the component P is, for example, the time between a time t12 (first time) corresponding to the maximum value of the differential value (first differential value) and a time t13 (second time) corresponding to the minimum value of the differential value (second differential value) (see FIG. 5).

[0070] Specifically, the determination unit 17B can measure (calculate) the width of the component P based on the movement speed of the head 11 and the detection time T21 of the component P. Here, the predetermined width when the component P is picked up in a normal pickup posture is defined by the movement speed of the head 11 and a fifth threshold value ThC (time). Therefore, the determination unit 17B can determine whether the component P is picked up in a normal pickup posture by determining whether the measured width W1 of the component P is less than the fifth threshold value ThC.

[0071] When the determination unit 17B determines that the detection time is less than the fifth threshold value ThC, it determines that the component P is picked up in a normal suction posture by the suction nozzle 15. On the other hand, when the determination unit 17B determines that the detection time is not less than the fifth threshold value ThC, it determines that the component P is not picked up in a normal suction posture by the suction nozzle 15.

[0072] The determination unit 17B outputs the determination result to the output unit 19 or the management computer 21, and stores it in the memory 18. Note that the various functions realized by the differential processing unit 17A or the determination unit 17B described above may be executed by the management computer 21.

[0073] An example of the process of determining the suction posture (angle) of component P by determination unit 17B will be specifically described below by comparing each of differential graphs Df21 to Df23 shown in Fig. 6. Note that normal suction in the example shown in Fig. 6 is, as an example, a state in which face P21 of component P is picked up by suction nozzle 15 and face P21A is detected by measurement system 14. Differential graph Df21 is an example of a differential graph when component P is picked up by suction nozzle 15 in a normal suction posture. Differential graphs Df22 and Df23 are each an example of a differential graph when component P is not picked up by suction nozzle 15 in a normal suction posture.

[0074] The vertical axis of each of differential graphs Df21 to Df23 indicates the differential value output from differential processing unit 17A. The horizontal axis of each of differential graphs Df21 to Df23 indicates time. Furthermore, level LV0C indicates that the differential value output from differential processing unit 17A is 0 (zero).

[0075] In differential graph Df21, which is an example of a differential graph when component P is normally picked up by suction nozzle 15, detection time T21 of component P is less than fifth threshold value ThC. In such a case, determination unit 17B determines that detection time T21 of component P is less than fifth threshold value ThC based on differential graph Df21, and determines that component P is picked up by suction nozzle 15 in a normal suction posture. Specifically, when determination unit 17B determines that detection time T21 of component P is less than fifth threshold value ThC, it determines that component P is picked up in an angle (posture) where surface P21A of component P faces light source 14A.

[0076] Moreover, in each of differential graphs Df22 and Df23, which are examples of differential graphs when component P is normally picked up by suction nozzle 15, detection times T22 and T23 of component P are equal to or greater than the fifth threshold value ThC. In such a case, based on each of differential graphs Df22 and Df23, determination unit 17B determines that detection times T22 and T23 of component P are not less than the fifth threshold value ThC, and determines that component P is not picked up by suction nozzle 15 in a normal suction posture. Specifically, when determination unit 17B determines that detection times T22 and T23 of component P are not less than the fifth threshold value ThC, it determines that component P is not picked up in an angle (posture) facing light source 14A.

[0077] Furthermore, the determination unit 17B may measure the suction attitude (angle) of the component P with respect to the light source 14A based on information about the component P (e.g., shape, size, etc.), the moving speed of the head 11, and the detection time T22 of the component P. In such a case, the determination unit 17B calculates the width W2 of the component P based on the moving speed of the head 11 and the detection time T22 of the component P. The determination unit 17B measures the suction attitude (angle) of the component P with respect to the light source 14A based on the calculated width W2 of the component P and information about the component P (e.g., shape, size, etc.). Furthermore, the determination unit 17B measures the thickness of the component P, and can estimate that the surface P22A is detected by the measurement system 14 based on the measured thickness of the component P and the suction attitude (angle) of the component P with respect to the light source 14A.

[0078] Similarly, determination unit 17B calculates width W3 of component P based on the moving speed of head 11 and detection time T23 of component P. Determination unit 17B measures the suction attitude (angle) of component P with respect to light source 14A based on the calculated width W3 of component P and information about component P (e.g., shape, size, etc.). Furthermore, determination unit 17B measures the thickness of component P, and can estimate that each of surfaces P23A and P23B has been detected by measurement system 14 based on the measured thickness of component P and the suction attitude (angle) of component P with respect to light source 14A.

[0079] As a result, the mounting machine 100 according to the first embodiment can determine whether or not the component P is picked up by the suction nozzle 15 in a normal suction posture, based on the generated differential graph.

[0080] In the example shown in FIG. 6, the number of thresholds for determining whether the component P is picked up by the suction nozzle 15 in a normal suction posture is one (the fifth threshold ThC), but is not limited thereto. For example, when the normal suction posture is a state in which the surface P22 of the component P is picked up by the suction nozzle 15 and the surface P22A is detected by the measurement system 14, the above-mentioned thresholds may be set to the fifth threshold ThC and the sixth threshold ThD, respectively. In such a case, when the determination unit 17B determines that the detection time of the detected component P is equal to or greater than the fifth threshold ThC and less than the sixth threshold ThD, the determination unit 17B determines that the component P is picked up in a normal suction posture. That is, in this case, the determination unit 17B determines that the suction posture of the component P is not defective. On the other hand, when the determination unit 17B determines that the detection time of the detected component P is less than the fifth threshold ThC or equal to or greater than the sixth threshold ThD, the determination unit 17B determines that the component P is not picked up in a normal suction posture.

[0081] The differential processing unit 17A in the first embodiment may generate a differential graph in which the absolute values ​​of the differential values ​​of the calculated IV conversion values ​​are taken, and output the graph to the determination unit 17B. In such a case, the determination unit 17B may execute a process of determining the suction state of the component P based on the absolute differential values ​​and each of the first threshold value ThA1 and the second threshold value ThB1. For example, when the determination unit 17B determines that the two peaks of the absolute differential values ​​are equal to or greater than the first threshold value ThA1 and less than the second threshold value ThB1, the determination unit 17B determines that the component P is not normally suctioned to the tip of the suction nozzle 15.

[0082] Next, differences between an IV conversion graph and a differential graph depending on whether or not a disturbance is present will be described with reference to Fig. 7. Fig. 7 is a diagram for explaining a comparative example of an IV conversion graph and a differential graph depending on whether or not a disturbance is present.

[0083] The IV conversion graph Op31 and the differential graph Df31 shown in FIG. 7 are examples of graphs generated when there is a disturbance. The IV conversion graph Op32 and the differential graph Df32 are examples of graphs generated when there is no disturbance. Here, the light blocking level LV0D indicates an IV conversion value obtained when the light beam 14B is not blocked by the suction nozzle 15. The detection level LVNA indicates an IV conversion value corresponding to the thickness (height) of the component P picked up by the suction nozzle 15. The level LV0E indicates a differential value obtained when the light beam 14B is not blocked by the suction nozzle 15. The detection levels LVNB1 and LVNB2 indicate differential values ​​corresponding to the thickness (height) of the component P picked up by the suction nozzle 15.

[0084] The disturbance is, for example, vibration when the head 11 is driven (moved). This vibration appears, for example, as a sine wave having a period on the order of kHz on the electrical signal generated by the photoelectric conversion element 14D. Therefore, it has been difficult for the mounting machine 100 to measure the thickness of the component P picked up at the tip of the suction nozzle 15 based on the IV conversion graph Op31 generated by plotting the IV conversion values ​​converted by the current-voltage conversion unit 14E in a time series.

[0085] Therefore, the mounting machine 100 according to the first embodiment differentiates the IV conversion value by the differential processing unit 17A, and generates a differential graph Df31 by plotting the differentiated differential value in a time series. Note that here, the differential processing unit 17A executes differentiation processing in units (MHz order) smaller than the unit (kHz order) of the period of the disturbance (vibration). That is, the differential processing unit 17A differentiates the IV conversion value at a frequency (second frequency) equal to or higher than 1 MHz and lower than 1 GHz. In this way, the mounting machine 100 according to the first embodiment can generate a differential graph Df31 excluding the disturbance (vibration). Note that in the example shown in FIG. 7, the differential graph Df31 has a differential value Va during the time period when the component P passes through the light ray 14B.

[0086] Similarly, even in the absence of disturbance, the mounting machine 100 according to the first embodiment differentiates the IV conversion value at a period on the order of MHz, which is shorter than the period of disturbance (vibration), which is on the order of kHz, and generates a differential graph Df32 by plotting the differentiated differential value in a time series. Note that in the example shown in Fig. 7, the differential graph Df32 has a differential value Vb during the time period when the component P passes through the light ray 14B.

[0087] In the differential graphs Df31 and Df32 generated as described above, the differential values ​​Va and Vb in the time period when the component P passes through the light beam 14B are approximately equal to each other. Therefore, the mounter 100 according to the first embodiment can obtain the differential graphs Df31 and Df32 from which the variation in the IV conversion value due to the disturbance (vibration) is removed by differentiating the IV conversion value output from the current-voltage conversion unit 14E at a period of the order of MHz, which is smaller than the period of the disturbance (vibration) of the order of kHz. As a result, the mounter 100 according to the first embodiment can measure the thickness of the component P picked up at the tip of the suction nozzle 15 with high accuracy even when there is a disturbance, and can determine the suction state of the component P with high accuracy.

[0088] As described above, the mounting machine 100 according to the first embodiment is equipped with a head 11 that picks up components P at the tips of multiple suction nozzles 15 and mounts them on a substrate 13, a measurement system 14 (an example of a sensor) that has a light source 14A and a photoelectric conversion element 14D (an example of a light receiving element) that receives light beam 14B irradiated from the light source 14A, irradiates light beam 14B at the tips of the suction nozzles 15 and outputs an IV conversion value (light intensity) of the light beam 14B received by the photoelectric conversion element 14D, and a processor 17 (an example of a control unit) that differentiates the IV conversion value of light beam 14B output from the measurement system 14 and determines whether the suction state of the component P picked up at the tips of the suction nozzles 15 through which the light beam 14B passes is poor based on the differentiated differential value. When the processor 17 determines that the differential value is equal to or greater than the first threshold value ThA and less than the second threshold value ThB that is greater than the first threshold value ThA, it determines that the pickup state of the component P is not defective (i.e., the pickup state is normal).

[0089] As a result, even if there are individual differences among the multiple suction nozzles 15 provided in the head 11 and there is variation in the suction height of the component P, the mounter 100 according to the first embodiment can determine the suction state of the component P by differentiating the IV conversion value and using a differential value that excludes these individual differences, while excluding the individual differences between the suction nozzles 15. Therefore, the mounter 100 can determine the suction state of the component P with higher accuracy. Here, the magnitude of the differential value corresponds to the thickness of the component P in the Z direction. Therefore, the mounter 100 can determine whether the thickness of the component P picked up by the suction nozzle 15 is the thickness of the component P in the correct suction posture, which is indicated by the differential value being equal to or greater than the first threshold value ThA and less than the second threshold value ThB.

[0090] Furthermore, as described above, when the processor 17 in the mounting machine 100 according to the first embodiment determines that the differential value is less than the first threshold value ThA, it determines that the component P is not picked up at the tip of the suction nozzle 15, and generates and outputs a notification that the suction state of the component P is poor (i.e., not in a normal suction state). This allows the mounting machine 100 according to the first embodiment to determine whether or not the component P has been detected based on the differential value. When the mounting machine 100 determines that the component P is not detected, it determines that the component P has not been picked up by the suction nozzle 15, and generates and outputs a notification that the suction state of the component P is not normal.

[0091] Furthermore, as described above, when the processor 17 in the mounting machine 100 according to the first embodiment determines that the differential value is equal to or greater than the second threshold value ThB, it generates and outputs a notification that the suction state of the component P is poor (i.e., not in a normal suction state). This allows the mounting machine 100 according to the first embodiment to determine the suction state of the component P based on the height of the component P, which is based on the differential value. When the mounting machine 100 determines that the differential value is equal to or greater than the second threshold value ThB, it determines that the suction surface of the component P picked up by the suction nozzle 15 is incorrect, and can generate and output a notification that the suction state of the component P is poor.

[0092] As a result, the processor 17 in the mounting machine 100 according to the first embodiment measures the detection time (an example of a time period, such as detection times T21, T22, T23, etc. shown in FIG. 6) during which the differential value is equal to or greater than the first threshold value ThA and less than the second threshold value ThB, and determines the pickup posture of the component P based on the measured detection time. This allows the mounting machine 100 according to the first embodiment to determine the pickup posture of the component P based on the width of the component P corresponding to the detection time.

[0093] Furthermore, as described above, when the processor 17 in the mounting machine 100 according to the first embodiment determines that the length of the detection time is less than a predetermined time (an example of the fifth threshold value ThC), it determines that the pickup posture of the component P is not defective. This allows the mounting machine 100 according to the first embodiment to determine whether or not the detection time is equal to or less than the upper limit of the width of the component P in the correct pickup posture indicated by the fifth threshold value ThC. When the mounting machine 100 determines that the detection time is less than the fifth threshold value ThC, it can determine that the pickup posture of the component P is not defective (i.e., the pickup posture is normal).

[0094] Furthermore, as described above, when the processor 17 in the mounting machine 100 according to the first embodiment determines that the length of the detection time is not less than a predetermined time (an example of the fifth threshold value ThC), it determines that the pickup posture of the component P is defective, and generates and outputs a notification that the pickup state of the component P is defective. This allows the mounting machine 100 according to the first embodiment to determine whether or not the detection time is equal to or less than the upper limit of the width of the component P in the correct pickup posture indicated by the fifth threshold value ThC. When the mounting machine 100 determines that the detection time is not less than the fifth threshold value ThC, it determines that there is an error in the pickup surface or pickup angle, etc., and that the pickup posture of the component P is defective, and generates and outputs a notification that the pickup posture of the component P is defective (i.e., not a normal pickup posture).

[0095] As a result, in the mounting machine 100 according to the first embodiment, the second period in which the processor 17 differentiates the light intensity is smaller than the first period in which the light intensity is output from the measurement system 14. As a result, even if the IV conversion value changes due to a disturbance (e.g., vibration) when the head 11 is driven, the mounting machine 100 according to the first embodiment can determine the pickup state of the component P based on the differential value excluding the change in the IV conversion value due to the disturbance by differentiating the IV conversion value.

[0096] As a result, in the mounting machine 100 according to the first embodiment, the first period is on the order of kHz, and the second period is on the order of MHz. This allows the mounting machine 100 according to the first embodiment to more effectively eliminate changes in the IV conversion value caused by disturbances when the head 11 is driven.

[0097] As described above, the suction state determination method is executed by the management computer 21 (an example of a terminal device) configured to include one or more computers (e.g., a processor provided in the management computer 21) communicatively connected to the mounting machine 100 that picks up components P at the tips of multiple suction nozzles 15 and mounts them on the board 13, and the IV conversion value (an example of light intensity) of the light beam 14B that is irradiated to the tip of the suction nozzle 15 and received by the photoelectric conversion element 14D (an example of a light receiving element) is obtained, the IV conversion value of the obtained light beam 14B is differentiated, and if it is determined that the differentiated differential value is greater than or equal to a first threshold value ThA and less than a second threshold value ThB that is greater than the first threshold value ThA, it is determined that the suction state of the component P picked up at the tip of the suction nozzle 15 passing through the light beam 14B is not defective (i.e., it is in a normal suction posture).

[0098] This allows the management computer 21 according to the first embodiment to execute a process of determining the pickup state of the component P, excluding individual differences between the pickup nozzles 15, based on the IV conversion value output from the mounting machine 100.

[0099] Although various embodiments have been described above with reference to the accompanying drawings, the present disclosure is not limited to such examples. It is clear that a person skilled in the art can conceive of various modifications, corrections, substitutions, additions, deletions, and equivalents within the scope of the claims, and it is understood that these also belong to the technical scope of the present disclosure. In addition, the components in the various embodiments described above may be arbitrarily combined within the scope of the invention. [Industrial Applicability]

[0100] The present disclosure is useful as providing a mounter and a pickup state determination method that can determine with higher accuracy the pickup state of a component picked up by a nozzle. [Explanation of symbols]

[0101] 11 Head 12 Parts Supply Department 13 Substrate 14 Measurement System 14A light source 14B Ray 14C Slit 14D Photoelectric conversion element 14E Current-to-voltage converter 15, 15A, 15B Suction nozzle 17 Processors 17A Differential Processing Section 17B Judgment section 18 Memory 18A threshold 19 Output section 21 Management Computer 100 Mounting Machine P parts

Claims

1. a head having a suction nozzle, which picks up a component at a tip of the suction nozzle and mounts the component on a board; a sensor including a light source that irradiates a light beam onto the tip of the suction nozzle and a light receiving element that receives the light beam irradiated from the light source, the sensor outputting a light intensity of the light beam received by the light receiving element; a control unit that calculates a first differential value by differentiating the light intensity of the light beam output from the sensor, and determines whether or not a suction state of a component sucked up to the tip of the suction nozzle when the suction nozzle passes through the light beam is poor based on the calculated first differential value, when the control unit determines that the first differential value is equal to or greater than a first threshold value and less than a second threshold value that is greater than the first threshold value, the control unit determines that the suction state of the component is not defective; The control unit calculates a second differential value by differentiating the light intensity; the first differential value is a maximum value of the differential value of the light intensity in a predetermined period of time, the second differential value is a minimum value of the differential value of the light intensity in the predetermined period, The control unit is measuring a detection time between a first time corresponding to the first derivative and a second time corresponding to the second derivative; determining a pickup posture of the component based on the measured detection time; Mounting machine.

2. when it is determined that the first differential value is less than the first threshold value, the control unit determines that the component is not picked up by the tip of the suction nozzle, and generates and outputs a notification that the suction state of the component is poor. The mounting machine according to claim 1 .

3. when it is determined that the first differential value is equal to or greater than the second threshold value, the control unit generates and outputs a notification that the suction state of the component is poor. The mounting machine according to claim 1 .

4. When the control unit determines that the length of the detection time is less than a predetermined time, the control unit determines that the suction posture of the component is not defective. The mounting machine according to claim 1 .

5. when it is determined that the length of the detection time is not shorter than a predetermined time, the control unit determines that the suction posture of the component is defective, and generates and outputs a notification that the suction state of the component is defective. The mounting machine according to claim 1 .

6. the control unit determines that the suction posture of the component is not defective when it determines that the length of the detection time is equal to or longer than a first predetermined time and shorter than a second predetermined time. The mounting machine according to claim 1 .

7. the sensor outputs the light intensity at a first frequency; The control unit differentiates the light intensity at a second frequency higher than the first frequency. The mounting machine according to claim 1 .

8. the first frequency is equal to or greater than 1 kHz and less than 1 MHz; The second frequency is equal to or greater than 1 MHz and less than 1 GHz. The mounting machine according to claim 7.

9. The head has a plurality of the suction nozzles. The mounting machine according to claim 1 .

10. the plurality of suction nozzles are arranged in a direction perpendicular to a direction in which the light source irradiates the light beam, The head moves in a direction in which the plurality of suction nozzles are arranged. The mounting machine according to claim 9.

11. A method for determining a suction state executed by a terminal device including one or more computers communicably connected to a mounting machine that picks up a component at a tip of a suction nozzle and mounts it on a board, the method comprising: acquiring a light intensity of a light beam irradiated onto the tip of the suction nozzle and received by a light receiving element; calculating a first differential value, which is a maximum value of a differential value of the light intensity in a predetermined period, and a second differential value, which is a minimum value of a differential value of the light intensity in the predetermined period, by differentiating the light intensity of the acquired light beam; if it is determined that the calculated first differential value is equal to or greater than a first threshold value and less than a second threshold value that is greater than the first threshold value, it is determined that a suction state of the component picked up at the tip of the suction nozzle when the suction nozzle passes through the light beam is not defective, measuring a detection time between a first time corresponding to the first derivative and a second time corresponding to the second derivative; determining a pickup posture of the component based on the measured detection time; Method for determining the adsorption state.

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