The application discloses a kind of automatic measurement multi-base
photocathode film thickness method and storage medium, the method is realized using
algorithm and
software, through the form of artificial interaction, adaptive calculation model multiple parameters, and according to
model parameters and the image collected by high-definition camera to the multi-base
photocathode film thickness is calculated. Including: 1) setting the rectangular area of
light reflection color model calculation;2) input product line as sample;3) input film thickness empirical value and error range;4) whether sample point number reaches requirement is judged, if not reached, return 2);5) the
photocathode film thickness is calculated.This application can guarantee that the
working environment of sample point is consistent with the
working environment of test product, greatly enhances the robustness and universality in actual production process.