The present application relates to the technical field of module testing, and specifically relates to an IGBT testing circuit, method and device, which comprises a
power supply unit, a testing
control unit, a state indication unit and a testing docking unit; the
power supply unit is provided with an AC input end and a DC output end, and is used for outputting a constant
DC voltage; the testing docking unit is provided with a plurality of testing ports, each testing port is electrically connected with a collector, an emitter and a gate of an IGBT to be tested; the testing
control unit is electrically connected with the
power supply unit and the testing docking unit; the state indication unit is connected in series in a testing control loop and an IGBT main
current loop to be tested, and is used for directly displaying the on-off state of the loop. The present application sets four groups of testing ports and arranges them in groups, and is specially used for corresponding to three types of electrodes of IGBT, i.e. gate, collector and emitter, and does not need to repeatedly switch detection probes, the wiring mode is fixed and the operation is simple, the requirement for professional ability of operators is reduced, the wiring efficiency is effectively improved, and the present application is suitable for a fast detection scene.