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Equipment testing method and device

A technology for equipment testing and equipment, applied in the field of testing, can solve problems such as testing difficulties, and achieve the effects of improving testing efficiency, reducing testing difficulty and improving efficiency

Active Publication Date: 2018-02-02
XIAOMI INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] The disclosure provides a device testing method and device to solve the problem of difficult testing in related technologies

Method used

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  • Equipment testing method and device
  • Equipment testing method and device
  • Equipment testing method and device

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Embodiment Construction

[0071] Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numerals in different drawings refer to the same or similar elements unless otherwise indicated. The implementations described in the following exemplary examples do not represent all implementations consistent with the present disclosure. Rather, they are merely examples of apparatuses and methods consistent with aspects of the present disclosure as recited in the appended claims.

[0072] The terminology used in the present disclosure is for the purpose of describing particular embodiments only, and is not intended to limit the present disclosure. As used in this disclosure and the appended claims, the singular forms "a", "the", and "the" are intended to include the plural forms as well, unless the context clearly dictates otherwise. It should also be understood...

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Abstract

The present disclosure relates to a device testing method and device. The method includes: acquiring a flag value of a preset flag in the device; determining the test state of the device according to the flag value; if the test state is a specified test state, Then call the preset test program to test the device. Since the present disclosure does not require the user to manually press a button to trigger the execution of the test, but automatically executes the test program according to the flag value of the flag bit, the test efficiency is improved. Especially for some electronic devices that cannot be provided with test buttons due to structural or appearance reasons, the test difficulty is reduced and the test efficiency is improved.

Description

technical field [0001] The present disclosure relates to the technical field of testing, and in particular, to a device testing method and device. Background technique [0002] In order to ensure the quality of the equipment, various tests are often performed on the equipment. For example, in order to ensure the quality of the equipment, a series of ex-factory tests are required before the equipment is officially shipped after the completion of the factory production. The device will have a built-in factory test program. During the normal operation of the device, these factory test programs will not work. Only when the test button of the device is triggered, the device will call the corresponding factory test program for testing. However, some devices cannot be equipped with test buttons due to their own structure or appearance, which increases the difficulty of testing. Contents of the invention [0003] The disclosure provides a device testing method and device to solv...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36
Inventor 孙启民侯恩星苏本昌
Owner XIAOMI INC
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