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Test case generation method and test case generation device

A test case generation and test case technology, applied in the testing field, can solve problems such as low test quality, low test case coverage, redundancy, etc., to reduce a lot of redundancy, improve test coverage and test quality, and reduce redundancy Effect

Inactive Publication Date: 2017-10-24
ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a test case generation method and device, the purpose is to solve the problem of low test quality caused by the low coverage of existing test cases and a large number of redundancy

Method used

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  • Test case generation method and test case generation device
  • Test case generation method and test case generation device
  • Test case generation method and test case generation device

Examples

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specific Embodiment approach

[0059] As a specific implementation, the above streamlined module may include:

[0060] The redundancy removal unit is used to remove redundant test cases to be selected according to simplification rules including coverage of only a single test case for invalid equivalence classes, mutual exclusion of valid equivalence classes, and business requirements, and obtain final test cases.

[0061] As a specific implementation manner, the above acquisition module may include:

[0062] The obtaining unit is used to obtain test dimension items including valid equivalence classes and invalid equivalence classes obtained by classifying the test dimension into equivalence classes according to the preset equivalence classifying rules;

[0063] Wherein, the above preset equivalence division rule is a rule for determining the number of valid equivalence classes and the number of invalid equivalence classes of each test dimension item according to the input conditions of each test dimension. ...

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Abstract

The invention discloses a test case generation method and a test case generation device. The method includes: acquiring test dimensional items which are collections containing valid equivalence classes and invalid equivalence classes, acquired by partitioning test dimensions in advance with an equivalence partition method; generating to-be-selected test cases according to the test dimension items by mean of a Cartesian product method; according to a preset simplification rule, removing the redundant to-be-selected test cases to acquire the final test cases. The test dimensions are partitioned by the aid of the equivalence partition method, a great deal of redundancy in the test cases can be reduced, the to-be-selected test cases are further simplified according to the simplification rule, and less redundancy in the final test case is achieved; the to-be-selected test case collections are generated by the aid of the Cartesian product method, and cover degree of the test cases can be guaranteed; less redundancy and high cover degree of the test cases are achieved, and test coverage and test quality can be improved on the basis of limited case cost.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a method and device for generating test cases. Background technique [0002] In the testing work, the coverage verification of basic functions is a basic and important testing activity, and it is necessary to improve the test coverage as much as possible, that is, to cover the basic function test points to the greatest extent and avoid the omission of test points. [0003] Before testing, it is generally necessary to design test cases according to business requirements. The coverage of the test cases designed by the existing test case design methods is generally low, and there are a lot of redundancy in the test cases, which reduces the test quality. Contents of the invention [0004] The purpose of the present invention is to provide a method and device for generating test cases, aiming at solving the problems of low test quality caused by low coverage of existing test cases ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3684
Inventor 刘勇
Owner ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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