Examination condition analysis method and device, storage medium and system

Abstract

The embodiment of the invention discloses an examination condition analysis method and system for the college entrance examination, senior high school entrance examination and midterm and final examinations. The method comprises the steps of: obtaining a to-be-analyzed target examination paper set, and screening out to-be-analyzed aggregated contents; for each piece of test paper / each year / each city, calculating index data of all questions corresponding to each knowledge point; generating a trend index according to the gradual change condition of the index data; aggregating the knowledge points, the examination years, the examination types, the examination paper types and the trend indexes according to a knowledge graph to obtain an aggregation result; and storing the aggregation result ina search server. The knowledge graph and the big data technology are adopted, the efficient and accurate examination condition analysis method and system are provided, teachers can be endowed with energy to improve the pertinence and efficiency of the teachers in lesson preparation and teaching, and manpower and material resources are saved. When the method and the system are used for online education, the pertinence and teaching efficiency of knowledge point explanation in class can be remarkably improved.

Description

technical field [0001] The invention relates to the technical field of intelligent teaching, research and teaching, and in particular to a test situation analysis method, device, storage medium and system. Background technique [0002] In teaching practice, the establishment of test analysis of various examinations and the preparation of targeted learning plans have always been the curriculum planning methods that have been widely valued by students and teachers. However, the existing test situation analysis often needs to manually establish understanding of a large number of test questions, and analyze the relationship between the test syllabus and propositions between different years. The test situation analysis for one region / one test cannot be extended to other test items in other regions, which is time-consuming. It is laborious and subject to the teacher's teaching experience, and it may not be possible to establish a comprehensive understanding based on global data. ...

AI Technical Summary

Problems solved by technology

However, the existing test situation analysis often needs to manually establish an understanding of a large number of test questions, and analyze the relationship between the test syllabus and propositions between different years. The test situation analysis for one region / one test cannot be extended to other test items in other regions, which is time-consuming. It is laborious and subject to the teacher's teaching experience, it may not be possible to establish a comprehensive understanding based on global data

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