System integration test method and device, electronic equipment and storage medium
A system integration and testing method technology, applied in the computer field, can solve problems such as long time and affect application testing efficiency, and achieve the effect of improving efficiency and improving testing efficiency.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0033] Embodiments of the present disclosure are described in detail below, examples of which are illustrated in the drawings, in which the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present disclosure and should not be construed as limiting the present disclosure.
[0034] The system integration testing method, device, electronic equipment, and storage medium of the embodiments of the present disclosure are described below with reference to the accompanying drawings.
[0035] figure 1 It is a flowchart of a system integration testing method according to an embodiment of the present disclosure. Wherein, it should be noted that the execution subject of the system integration testing method provided in this embodiment is a system integration testing device, which can be implemented by s...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com