Testing device

Abstract

The invention provides a testing device, and relates to the technical field of electronic equipment. The problem that TLP testing efficiency is low is solved. The testing device comprises a testing platform, a moving mechanism, a probe and an adapter plate. The test platform has a working surface. The moving mechanism is arranged on the test platform. And the probe is fixed on the moving mechanism. The adapter plate is arranged on the working face, the surface, away from the working face, of the adapter plate is provided with a plurality of first electric connection areas and a plurality of second electric connection areas, and the first electric connection areas and the second electric connection areas are in one-to-one correspondence and are electrically connected; the plurality of first electric connection areas are used for being electrically connected with an electronic device, and the second electric connection areas are used for abutting against probes. In a plane parallel to the working surface, the area of the second electric connection region is larger than that of the first electric connection region.

Description

Technical Field

[0001] The present application relates to the technical field of electronic equipment, and in particular to a testing device. Background Art

[0002] Transmission Line Pulse (TLP) testing is one of the important means to control the quality of electrostatic protection of electronic devices. The current TLP testing is based on manual testing, which requires connecting the pins to be tested of the electronic device to the test instrument, and then testing and recording the test results, which has low testing efficiency. Summary of the invention

[0003] The embodiment of the present application provides a testing device for solving the problem of low TLP testing efficiency.

[0004] To achieve the above objectives, the embodiments of the present application adopt the following technical solutions:

[0005] In a first aspect, a test device is provided, which includes a test platform, a moving mechanism, a probe, and an adapter plate. The test platform has a working surface. The moving mechanism is arranged on the test platform. The probe is fixed on the moving mechanism. The adapter plate is arranged on the working surface, and the surface of the adapter plate away from the working surface has a plurality of first electrical connection areas and a plurality of second electrical connection areas, and the plurality of first electrical connection areas correspond to and are electrically connected to the plurality of second electrical connection areas one by one; the plurality of first electrical connection areas are used to electrically connect to electronic devices, and the second electrical connection areas are used to abut against the probe; in a plane parallel to the working surface, the area of ​​the second electrical connection area is larger than the area of ​​the first electrical connection area.

[0006] The test device provided in the first aspect of the present application is provided with a transfer plate on the test platform, and the transfer plate has a first electrical connection area and a second electrical connection area which are electrically connected to each other, and the first electrical connection area can be used to connect with the electronic device to be tested, for example, welding. The second electrical connection area is used to abut with the probe, so as to achieve the test of the electronic device. Since the area of ​​the second electrical connection area is larger than the area of ​​the first electrical connection area in the plane parallel to the working surface, it is easier for the probe to contact the second electrical connection area with a larger area, that is, the connection difficulty between the test device and the electronic device to be tested is reduced, which is conducive to reducing the difficulty of testing the electronic device and improving the test efficiency.

[0007] In a possible implementation of the first aspect of the present application, the moving mechanism includes a first moving mechanism, a second moving mechanism and a third moving mechanism, the first moving mechanism is used to drive the probe to move in a first direction, the second moving mechanism is used to drive the probe to move in a second direction, and the third moving mechanism is used to drive the probe to move in a third direction, and any two of the first direction, the second direction and the third direction are perpendicular to each other. In this way, the probe is driven to move in three directions respectively by three sets of moving mechanisms, and the three directions are perpendicular to each other, so that the probe can move to any position in space, thereby facilitating the control of the probe to abut against different second electrical connection areas in sequence.

[0008] In a possible implementation of the first aspect of the present application, the first direction and the third direction are parallel to the working surface, and the second direction is perpendicular to the working surface. In this way, with the working surface as the reference plane, the moving mechanism can control the probe to move in directions perpendicular to and parallel to the working surface, which is conducive to further reducing the control difficulty, so that the probe can abut against the second electrical connection area more accurately.

[0009] In a possible implementation of the first aspect of the present application, the first motion mechanism includes a first track portion, a first sliding portion and a first driving portion, the first track portion is arranged on the working surface and extends along the first direction, the first sliding portion is slidably arranged on the first track portion, the first driving portion is used to drive the first sliding portion to slide, and the second motion mechanism and the third motion mechanism are arranged on the first sliding portion. Exemplarily, the first track portion may include a slide rail or a transmission belt, etc. The first sliding portion may include a slider or a roller, etc. The first driving portion may include a motor or a motor, etc. The first track portion and the first sliding portion may be connected by transmission means such as a gear and a rack, a sprocket and a chain, a screw and a nut, etc.

[0010] In a possible implementation of the first aspect of the present application, the second motion mechanism includes a second track portion, a second sliding portion and a second driving portion, the second track portion is fixed to the first sliding portion and extends along the second direction, the second sliding portion is slidably arranged on the second track portion, the second driving portion is used to drive the second sliding portion to slide, and the third motion mechanism is arranged on the second sliding portion. Exemplarily, the second track portion may include a slide rail or a transmission belt, etc. The second sliding portion may include a slider or a roller, etc. The second driving portion may include a motor or a motor, etc. The second track portion and the second sliding portion may be connected by transmission means such as a gear and a rack, a sprocket and a chain, a screw and a nut, etc.

[0011] In a possible implementation of the first aspect of the present application, the third motion mechanism includes a third rail portion, a third sliding portion and a third driving portion, the third rail portion is fixed on the second sliding portion and extends along the third direction, the third sliding portion is slidably arranged on the third rail portion, the third driving portion is used to drive the third sliding portion to slide, and the probe is arranged on the third sliding portion. Exemplarily, the third rail portion may include a slide rail or a transmission belt, etc. The third sliding portion may include a slider or a roller, etc. The third driving portion may include a motor or a motor, etc. The third rail portion and the third sliding portion may be connected by transmission means such as a gear and a rack, a sprocket and a chain, a screw and a nut, etc.

[0012] In a possible implementation of the first aspect of the present application, two first motion mechanisms and two second motion mechanisms are provided, the two second rail parts are fixed to the two first sliding parts respectively, and the third rail part is fixedly connected to the two second sliding parts. In this way, it is helpful to ensure that the third rail part is parallel to the working surface and the force on the third rail part is balanced, thereby reducing the risk of the movement trajectory of the probe being offset due to the inclination of the third rail part, which is helpful to improve the test accuracy of the test equipment.

[0013] In a possible implementation of the first aspect of the present application, a plurality of third sliding parts are provided, and the plurality of third sliding parts are all slidably provided on the third track part, and a probe is provided on each third sliding part. Under this structure, the number of probes can be flexibly set based on actual test needs or test standards.

[0014] In a possible implementation of the first aspect of the present application, the test device includes a pressure sensor, which is disposed on the moving mechanism and moves synchronously with the probe. In this structure, the pressure sensor can monitor the magnitude of the contact force between the probe and the second electrical connection area in real time, thereby ensuring that the probe is in stable contact with the second electrical connection area to improve test efficiency.

[0015] In a possible implementation of the first aspect of the present application, the test device includes a control module, the control module is electrically connected to the mobile mechanism, and the control module is electrically connected to the probe. Under this structure, the control module can realize the automated test of the test device, that is, the electronic device to be tested is manually connected to the first electrical connection area, and then the mobile mechanism is controlled by the control module so that the probe traverses each second electrical connection area in turn, that is, traverses each pin of the electronic device in turn, and then the test instrument obtains the test data and uploads the data through the control module.

[0016] In a possible implementation of the first aspect of the present application, the control module includes an industrial computer.

[0017] In a possible implementation of the first aspect of the present application, in a plane parallel to the working surface, a ratio of an area of ​​the second electrical connection region to an area of ​​the first electrical connection region is in a range of 10:1-20:1.

[0018] In a possible implementation of the first aspect of the present application, the test device further includes a first connector, the first connector is welded to the first electrical connection area, a second connector is provided on the electronic device, and the first connector and the second connector are plugged into each other so that the electronic device is electrically connected to the second electrical connection area. Exemplarily, the first connector and the second connector can be male and female heads of a board-to-board connector, and before testing, it is only necessary to plug the second connector into the first connector, which is conducive to further reducing the difficulty of testing and improving the test efficiency.

[0019] In addition, due to the normalized development trend of electronic devices, a first connector is provided on the adapter board so that it can be matched with different electronic devices, thereby being able to test a variety of electronic devices, which is conducive to further improving the test efficiency.

[0020] In a possible implementation of the first aspect of the present application, the test device includes a positioning structure, and the positioning structure is arranged between the adapter plate and the test platform. Under this structure, when installing the adapter plate, it is easy to position and install, which is conducive to reducing the difficulty of installation. In addition, when replacing the adapter plate, it is conducive to shortening the operation time to improve the test efficiency.

[0021] In a possible implementation of the first aspect of the present application, the positioning structure includes a positioning column and a positioning hole, one of the positioning column and the positioning hole is arranged on the adapter plate, and the other of the positioning column and the positioning hole is arranged on the test platform. Under this structure, the cross-sectional shapes of the positioning column and the positioning hole are the same, so as to facilitate the formation of a limit. Exemplarily, when only one group of positioning columns and positioning holes is provided, the cross-sectional shapes of the positioning columns and the positioning holes are non-circular, for example, a triangle, a square, a diamond, etc. When multiple groups of positioning columns and positioning holes are provided, the cross-sectional shapes of the positioning columns and the positioning holes can be any shape. Thereby, the adapter plate can be prevented from rotating around the axis of the positioning column.

[0022] In a possible implementation of the first aspect of the present application, the positioning structure includes a clamping fixture, which is fixed to a working surface of the test platform, and the clamping fixture is used to clamp the adapter plate. In this structure, the adapter plate is clamped by the clamping fixture so that the adapter plate is fixed relative to the working surface, thereby ensuring that the position of each second electrical connection area on the adapter plate can be accurately located during the test.

[0023] In a possible implementation of the first aspect of the present application, the testing device includes a first camera module, which is disposed on a moving mechanism and is used to locate the adapter plate. In this structure, the first camera module can locate the position of the adapter plate so that the moving mechanism can drive the probe to move above the adapter plate.

[0024] In a possible implementation of the first aspect of the present application, the first camera module includes an industrial camera.

[0025] In a possible implementation of the first aspect of the present application, the testing device further includes a second camera module, which is disposed on the moving mechanism and is used to locate the second electrical connection area. Under this structure, the second camera module can accurately locate each second electrical connection area, so that the moving mechanism can drive the probe to abut against the second electrical connection area, and can detect that the probe abuts against the center point of the second electrical connection area, thereby ensuring that the probe abuts stably against the second electrical connection area.

[0026] In a possible implementation of the first aspect of the present application, the second camera module includes an endoscopic camera.

[0027] In a possible implementation manner of the first aspect of the present application, the testing device includes a testing instrument, and the testing instrument is electrically connected to the probe. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 A structural diagram of a test device provided in an embodiment of the present application;

[0029] Figure 2 A structural diagram of an adapter board provided in an embodiment of the present application;

[0030] Figure 3 A structural diagram of another adapter board provided in an embodiment of the present application;

[0031] Figure 4 A structural diagram of another adapter board provided in an embodiment of the present application;

[0032] Figure 5 A top view of a testing device provided in an embodiment of the present application;

[0033] Figure 6 A structural diagram of a mobile mechanism provided in an embodiment of the present application;

[0034] Figure 7 An enlarged structural diagram of the moving mechanism provided in an embodiment of the present application;

[0035] Figure 8 A structural diagram of some components of a testing device provided in an embodiment of the present application;

[0036] Fig. 9for Figure 8 A magnified view of the structure of region A;

[0037] Fig.10 A control flow chart of a test device provided in an embodiment of the present application;

[0038] Fig.11 A schematic diagram of the control system interface of the test device provided in an embodiment of the present application.

[0039] Reference numerals: 10-test device; 100-test platform; 110-frame; 120-workbench; 121-work surface; 200-moving mechanism; 210-first motion mechanism; 211-first rail portion; 212-first sliding portion; 213-first driving portion; 220-second motion mechanism; 221-second rail portion; 222-second sliding portion; 223-second driving portion; 230-third motion mechanism; 231-third rail portion; 232-third sliding portion; 23 3-third driving unit; 300-probe; 400-test instrument; 500-adapter board; 510-first electrical connection area; 511-first connector; 520-second electrical connection area; 600-control module; 700-positioning structure; 710-positioning column; 720-positioning hole; 730-clamping tool; 800-pressure sensor; 810-first camera module; 811-support frame; 811a-first support rod; 811b-second support rod; 820-second camera module. DETAILED DESCRIPTION

[0040] The technical solutions in the embodiments of the present application will be described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all of the embodiments.

[0041] In the following, the terms "first", "second", etc. are used for descriptive purposes only and are not to be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first", "second", etc. may explicitly or implicitly include one or more of the features.

[0042] In addition, in the present application, directional terms such as "upper" and "lower" are defined relative to the orientation of the components in the drawings. It should be understood that these directional terms are relative concepts. They are used for relative description and clarification, and they can change accordingly according to the changes in the orientation of the components in the drawings.

[0043] In the present application, unless otherwise clearly specified and limited, the term "connection" should be understood in a broad sense. For example, "connection" can be a fixed connection, a detachable connection, or an integral connection; it can be a direct connection or an indirect connection through an intermediate medium.

[0044] Electronic devices are indispensable terminal devices in daily life. Specifically, the electronic device can be a portable electronic device or other types of electronic devices. For example, the electronic device can be a mobile phone, a tablet personal computer, a laptop computer, a personal digital assistant (PDA), a monitor, a camera, a personal computer, a notebook computer, a wearable device, etc.

[0045] The above electronic devices need to undergo a variety of tests during the manufacturing process. After passing the tests, they are qualified products. Among them, TLP test is one of the important means to control the electrostatic protection quality of electronic devices. Devices that need to undergo TLP test include but are not limited to display modules, fingerprint modules, camera modules, etc.

[0046] Moreover, the purpose of TLP testing of electronic devices is to evaluate the performance of ESD (Electro-Static discharge) protection devices by simulating ESD time to measure the voltage and current response of electronic devices under different stress conditions.

[0047] In some embodiments, the TLP test is performed by a tester connecting the pins of the electronic device to be tested to the test instrument 400, applying a current of a specified waveform to the pins to be tested through the test instrument, and obtaining electrical characteristic data (e.g., voltage, current, etc.) between the pins. By comparing and analyzing these data, it is determined whether the electrostatic protection quality of the electronic device is qualified.

[0048] However, the above TLP test is performed manually, and the electronic devices are generally fixed with tape, which has low positioning accuracy. In addition, the pins of electronic devices are small and numerous, and the tester needs to use a microscope to manually connect the pins of the electronic devices and the test instrument. Manual connection is difficult and requires high proficiency in operation. It is also necessary to manually record and organize the test data, resulting in low test efficiency.

[0049] Based on this, a test device 10 provided in an embodiment of the present application is used to perform TLP test on some electronic components of an electronic device. Figure 1 and Figure 2 , Figure 1 This is a structural diagram of a testing device 10 provided in an embodiment of the present application. Figure 2 A structural diagram of an adapter plate 500 provided in an embodiment of the present application.

[0050] Specifically, the test device 10 may include a test platform 100, a moving mechanism 200, and a probe 300. The test platform 100 may include a frame 110 and a workbench 120, the workbench 120 is fixed on the frame 110, the upper surface of the workbench 120 (i.e., the surface of the workbench 120 away from the frame 110) is a work surface 121, the moving mechanism 200 is arranged on the workbench 120, the probe 300 is fixed on the moving mechanism 200, so that the position of the moving mechanism 200 to move the probe 300 can be controlled, and a test instrument 400 for detection may also be arranged in the frame 110.

[0051] In some examples, the test platform 100 may further include a vibration isolation component (not shown in the figure), and the workbench 120 is connected to the frame 110 bracket through the vibration isolation component. For example, the vibration isolation component may be a vibration isolation adjustment bearing, and shock absorption is achieved by the spring of the vibration isolation adjustment bearing, thereby providing a stable testing environment for electrical devices, reducing the influence of bending vibration on the contact force of the probe 300, and helping to improve the accuracy of the test results.

[0052] In addition, the test device 10 further includes an adapter plate 500, which is disposed on the working surface 121. The adapter plate 500 has a plurality of first electrical connection areas 510 and a plurality of second electrical connection areas 520 on a surface away from the working surface 121. The plurality of first electrical connection areas 510 and the plurality of second electrical connection areas 520 correspond to each other and are electrically connected. The plurality of first electrical connection areas 510 are used to connect with electronic devices, and the plurality of second electrical connection areas 520 are used to abut against the probe 300. In a plane parallel to the working surface 121, the area of ​​the second electrical connection area 520 is larger than the area of ​​the first electrical connection area 510.

[0053] Exemplarily, the first electrical connection area 510 and the corresponding second electrical connection area 520 may be electrically connected based on an electrical connection line disposed inside the adapter board 500 , that is, the first electrical connection area 510 and the corresponding second electrical connection area 520 are used to transmit the same signal.

[0054] Also, please read Figure 1 and Figure 2 The test device 10 may further include a control module 600 , for example, the control module 600 may be an industrial computer. The control module 600 is electrically connected to the moving mechanism 200 and the probe 300 , and the control module 600 is electrically connected to the test instrument 400 .

[0055] In this way, the test device 10 provided in the embodiment of the present application can amplify the pins of the electronic device through the adapter plate 500, that is, the probe 300 abuts against the second electrical connection area 520 to achieve electrical connection with the electronic device, thereby reducing the difficulty of testing and operation, which is conducive to improving the test efficiency. In addition, automatic control is achieved through the industrial computer, that is, automatic testing is achieved, and the test data can be automatically recorded and generated based on the industrial computer, which is conducive to further improving the test efficiency and test accuracy.

[0056] In some embodiments, in a plane parallel to the working surface 121 , the ratio of the area of ​​the second electrical connection region 520 to the area of ​​the first electrical connection region 510 may be in the range of 10:1-20:1, that is, the area of ​​the second electrical connection region 520 is 10-20 times that of the first electrical connection region 510 .

[0057] Exemplarily, since the first electrical connection area 510 is used for connection with an electronic device, that is, the size of the first electrical connection area 510 is similar to the size of the electronic device, for example, the pins of the electronic device are generally 3mm*1.5mm in size. After the area of ​​the pin to be tested is enlarged by 10-20 times through the adapter plate 500, the size of the second electrical connection area 520 can be 3cm*1.5cm to 6cm*3cm in size. Therefore, in the plane parallel to the working surface 121, the area of ​​the second electrical connection area 520 can be clearly distinguished by the naked eye, so that the difficulty of the probe 300 abutting against the second electrical connection area 520 is reduced, which is conducive to further reducing the difficulty of testing.

[0058] In other embodiments, please refer to Figure 1 and Figure 2 The adapter board 500 may be provided with a plurality of first electrical connection areas 510 and a plurality of second electrical connection areas 520, such as Figure 2 The dotted lines shown in the figure are divided into three groups of first electrical connection areas 510 and second electrical connection areas 520. In this structure, one group of first electrical connection areas 510 can be connected to an electronic device to be tested, so that multiple electronic devices to be tested can be set on the adapter board 500 at the same time, and the multiple electronic devices can be tested separately, which is conducive to further improving the test efficiency.

[0059] Also, see Figure 3 , Figure 3A structural diagram of another adapter board 500 provided in an embodiment of the present application. The above-mentioned test device 10 may also include a first connector 511, which is fixed on the adapter board 500 and electrically connected to the first electrical connection area 510. That is, multiple pins of the first connector 511 are welded and fixed to multiple first electrical connection areas 510 to achieve electrical connection. The first connector 511 is used to be plugged into the second connector on the electronic device to achieve electrical connection between the pins of the electronic device and the second electrical connection area 520 of the adapter board 500.

[0060] For example, the first connector 511 and the second connector may both be part of a board-to-board connector (BTB connector), that is, the first connector 511 and the second connector form a board-to-board connector. One of the first connector 511 and the second connector is a male connector of the board-to-board connector, and the other of the first connector 511 and the second connector is a female connector of the board-to-board connector.

[0061] It is understandable that the first connector 511 and the second connector may also be other types of connectors, and the board-to-board connector is only an example. Therefore, this application does not make any special limitation on this.

[0062] Based on this, when testing the above electronic device, it is only necessary to plug the second connector on the electronic device into the first connector 511 on the adapter board 500 to achieve electrical connection between the pins of the electronic device and the second electrical connection area 520 on the adapter board 500. This can reduce the difficulty of connecting the electronic device to the test device 10, which is conducive to further improving the test efficiency.

[0063] Moreover, with the normalization trend of electronic devices, many different types of electronic devices use connectors of the same specification. Therefore, all electronic devices provided with the second connector can be tested through the first connector 511, which is conducive to further reducing the difficulty of testing and improving the testing efficiency.

[0064] In order to enable the above-mentioned test device 10 to test more electronic devices, it can also be realized based on replacing the adapter plate 500. That is, the adapter plate 500 and the workbench 120 can be detachably connected, so that by replacing different adapter plates 500, that is, replacing different first connectors 511, different types of electronic devices can be adapted, which is conducive to improving the versatility of the test device 10.

[0065] Specifically, see Figure 4 , Figure 4A structural diagram of another adapter plate 500 provided in an embodiment of the present application. A positioning structure 700 may be provided between the adapter plate 500 and the workbench 120, and the positioning structure 700 is used to prevent the adapter plate 500 from moving in a direction parallel to the work surface 121, thereby preventing the position of the adapter plate 500 from moving during testing, resulting in inaccurate test results.

[0066] In some examples, the positioning structure 700 may include a positioning column 710 and a positioning hole 720, one of which is disposed on the adapter plate 500, and the other of which is disposed on the workbench 120, and the positioning column 710 is inserted into the positioning hole 720. For example, the positioning column 710 may be fixed on the working surface 121 of the workbench 120, and the positioning hole 720 may be provided on the adapter plate 500. Thus, by plugging the positioning column 710 and the positioning hole 720 into each other, the adapter plate 500 can be restricted from moving relative to the workbench 120 and in a direction parallel to the working surface 121.

[0067] In addition, the above-mentioned positioning column 710 and positioning hole 720 can be provided with only one group. In this case, the cross-section of the positioning column 710 and the positioning hole 720 can be non-circular. For example, the cross-section of the positioning column 710 and the positioning hole 720 can be positive, rectangular, rhombus, trapezoidal, etc. Alternatively, the positioning column 710 and the positioning hole 720 can also be provided with multiple groups, and the multiple groups of positioning columns 710 and positioning holes 720 are distributed at intervals, and the positioning columns 710 are respectively inserted into the corresponding positioning holes 720. In this case, the cross-sectional shape of the positioning column 710 and the positioning hole 720 can be any shape. Thereby, while limiting the transfer plate 500 from moving in a direction parallel to the working surface 121, it can also limit the transfer plate 500 from rotating around the limit column.

[0068] It is understandable that the cross-section of the positioning column 710 and the positioning hole 720 refers to the cross-section parallel to the working surface 121. In addition, the cross-sections of the positioning column 710 and the corresponding positioning hole 720 have the same shape, and the cross-sectional areas of the two are adapted to each other, so that the positioning column 710 can be inserted into the corresponding positioning hole 720 and can play a limiting role. Therefore, this application does not make any special limitation on this.

[0069] In other embodiments, see Figure 5 , Figure 5 The positioning structure 700 may include a clamping fixture 730 fixed on the working surface 121 , and the adapter plate 500 is mounted on the clamping fixture 730 . The clamping fixture 730 can clamp the adapter plate 500 , thereby limiting the position of the adapter plate 500 .

[0070] Based on this, the testing device 10 provided in the embodiment of the present application drives the probe 300 to move through the moving mechanism 200, thereby testing the multiple second electrical connection areas 520 in sequence, that is, testing the multiple pins of the electronic device in sequence. Figure 6 and Figure 7 , Figure 6 This is a structural diagram of the mobile mechanism 200 provided in an embodiment of the present application. Figure 7 This is an enlarged structural diagram of the moving mechanism 200 provided in an embodiment of the present application.

[0071] The moving mechanism 200 may include a first moving mechanism 210, a second moving mechanism 220 and a third moving mechanism 230. The first moving mechanism 210 is used to drive the probe 300 to move along a first direction ( Figure 6 and Figure 7 The second motion mechanism 220 is used to drive the probe 300 to move along the second direction ( Figure 6 and Figure 7 The third motion mechanism 230 is used to drive the probe 300 to move along the third direction ( Figure 6 and Figure 7 The probe 300 is moved in the X-axis direction. Any two of the first direction, the second direction and the third direction are perpendicular to each other. For example, the first direction and the third direction can be parallel to the working surface 121, and the second direction can be perpendicular to the working surface 121. In this way, the probe 300 can be controlled to move to different positions through the moving mechanism 200, so that the probe 300 can abut against each second electrical connection area 520, thereby completing the test of the electronic device.

[0072] In some embodiments, please refer to Figure 6 and Figure 7 The first motion mechanism 210 may include a first rail portion 211, a first sliding portion 212, and a first driving portion 213. The first rail portion 211 is disposed on the working surface 121 and extends along the first direction. The first sliding portion 212 is slidably disposed on the first rail portion 211. The first driving portion 213 is used to drive the first sliding portion 212 to slide along the first direction. The second motion mechanism 220 and the third motion mechanism 230 are both disposed on the first sliding portion 212.

[0073] The structure of the first rail part 211 includes but is not limited to a slide rail or a conveyor belt. The structure of the first sliding part 212 includes but is not limited to a slider or a roller. The first driving part 213 may include a motor or a motor. Moreover, the structure of the transmission connection between the first rail part 211 and the first sliding part 212 includes but is not limited to a gear and a rack, a sprocket and a chain, a nut and a screw rod, etc.

[0074] Exemplarily, the first rail portion 211 can be a slide rail, the first sliding portion 212 can be a slider, and the first driving portion 213 can be a motor. The first rail portion 211 and the first sliding portion 212 can be connected via a screw and a nut, that is, the screw is arranged on the first rail portion 211, and the nut is fixedly connected to the first sliding portion 212. The first driving portion 213 can drive the screw to rotate so that the nut drives the first sliding portion 212 to move along the axial direction of the screw, that is, the axial direction of the screw is parallel to the first direction, so that the first sliding portion 212 drives the second motion mechanism 220 and the third motion mechanism 230 to move along the first direction.

[0075] Please continue reading Figure 6 and Figure 7 The second motion mechanism 220 may include a second rail portion 221, a second sliding portion 222 and a second driving portion 223. The second rail portion 221 is fixed to the first sliding portion 212 and extends along the second direction. The second sliding portion 222 is slidably disposed on the second rail portion 221. The second driving portion 223 is used to drive the second sliding portion 222 to slide along the second direction. The third motion mechanism 230 is disposed on the second sliding portion 222.

[0076] The second rail portion 221 includes, but is not limited to, a slide rail or a conveyor belt. The second sliding portion 222 includes, but is not limited to, a slider or a roller. The second driving portion 223 may include a motor or a motor. Furthermore, the transmission connection between the second rail portion 221 and the second sliding portion 222 includes, but is not limited to, a gear and a rack, a sprocket and a chain, a nut and a screw, etc.

[0077] Exemplarily, the second rail portion 221 can be a slide rail, the second sliding portion 222 can be a slider, and the second driving portion 223 can be a motor. The second rail portion 221 and the second sliding portion 222 can be connected by a gear and a rack, that is, the gear is arranged on the second rail portion 221, and the rack is fixedly connected to the second sliding portion 222. The second driving portion 223 drives the gear to rotate so that the rack drives the second sliding portion 222 to move in the second direction, that is, the rack is arranged along the second direction, so that the second sliding portion 222 drives the third motion mechanism 230 to move in the second direction.

[0078] Please continue reading Figure 6 and Figure 7 The third motion mechanism 230 may include a third rail portion 231, a third sliding portion 232 and a third driving portion 233. The third rail portion 231 is fixed to the second sliding portion 222 and extends along the third direction. The third sliding portion 232 is disposed on the third rail portion 231, the third driving portion 233 is used to drive the third sliding portion 232 to slide along the third direction, and the probe 300 is disposed on the third sliding portion 232.

[0079] The structure of the third rail part 231 includes but is not limited to a slide rail or a conveyor belt. The structure of the second sliding part 222 includes but is not limited to a slider or a roller. The third driving part 233 may include a motor. Moreover, the structure of the transmission connection between the third rail part 231 and the third sliding part 232 includes a gear and a rack, a sprocket and a chain, a nut and a screw rod, etc.

[0080] Exemplarily, the third rail portion 231 can be a slide rail, the third sliding portion 232 can be a slider, and the third driving portion 233 can be a motor. The third rail portion 231 and the third sliding portion 232 can be connected by a chain and a sprocket, that is, the sprocket is arranged on the third rail portion 231, and the chain is fixedly connected to the third sliding portion 232. The third driving portion 233 drives the sprocket to rotate so that the chain drives the third sliding portion 232 to move along the third direction, that is, at least part of the chain is arranged along the third direction, so that the third sliding portion 232 drives the probe 300 to move along the third direction.

[0081] Based on this, the moving mechanism 200 can realize the movement of the probe 300 along the first direction, the second direction and the third direction, so that the probe 300 can move to each second electrical connection area 520 accordingly and abut against the second electrical connection area 520, thereby realizing the test of the electronic device.

[0082] It is understandable that the first motion mechanism 210, the second motion mechanism 220 and the third motion mechanism 230 can adopt the same structure. For example, the first motion mechanism 210, the second motion mechanism 220 and the third motion mechanism 230 can all adopt sliders and rails, and a screw nut transmission structure is adopted between the sliders and rails. Alternatively, the first motion mechanism 210, the second motion mechanism 220 and the third motion mechanism 230 can also adopt different structures. Therefore, this application does not make any special limitation on this.

[0083] In other embodiments, please refer to Figure 6 and Figure 7 , the first motion mechanism 210 and the second motion mechanism 220 may be provided with two, the two second rail parts 221 are respectively fixed on the two first sliding parts 212, and the third rail part 231 is fixedly connected with the two second sliding parts 222. In this way, the third rail part 231 is supported by the two second sliding parts 222, which is conducive to ensuring the balance of the third rail part 231, that is, ensuring that the third rail part 231 is parallel to the working surface 121, so as to ensure that the probe 300 and the third sliding part 232 will not tilt when sliding along the third rail part 231, so as to ensure that the probe 300 can accurately abut against the second electrical connection area 520, which is conducive to improving the test accuracy.

[0084] The third rail portion 231 may also be provided with a plurality of third sliding portions 232, and each of the third sliding portions 232 may be provided with a probe 300. For example, two third sliding portions 232 may be provided, that is, two probes 300 may also be provided. When testing an electronic device, one of the two probes 300 may abut against the grounded second electrical connection area 520, and the other of the two probes 300 may abut against the non-grounded second electrical connection area 520, thereby testing multiple pins of the electronic device in sequence.

[0085] It is understandable that the structures of the first motion mechanism 210, the second motion mechanism 220 and the third motion mechanism 230 are only examples and are not specific limitations of the present application. The specific structures can be flexibly changed based on actual needs. The number of probes 300 can also be flexibly set based on the needs of the actual test method. Therefore, the present application does not make any special limitations on this.

[0086] Furthermore, the probe 300 can be directly fixed on the third sliding part 232, or the probe 300 can also be rotatably connected to the third sliding part 232, so that the probe 300 can rotate relative to the third sliding part 232, thereby facilitating the adjustment of the angle of the probe 300 to adapt to different test scenarios. For example, a probe 300 tooling can be provided on the third sliding part 232, the probe 300 is rotatably connected to the third sliding part 232, and the probe 300 tooling can clamp the probe 300, so that the angle of the probe 300 can be adjusted by rotating the probe 300 tooling.

[0087] On this basis, see Figure 8 and Fig. 9 , Figure 8 A structural diagram of some components of the testing device 10 provided in an embodiment of the present application, Fig. 9 for Figure 8 A magnified view of the structure of area A. To ensure that the probe 300 is in stable contact with the second electrical connection area 520. The test device 10 may also include a pressure sensor 800, which is disposed on the third sliding portion 232, connected to the probe 300, and electrically connected to the industrial computer. Under this structure, when the probe 300 abuts against the second electrical connection area 520, the pressure sensor 800 can detect the magnitude of the force between the two. Therefore, whether the probe 300 is in stable contact with the second electrical connection area 520 can be detected based on the pressure sensor 800.

[0088] For example, a threshold value can be set for the pressure sensor 800. When the probe 300 contacts the second electrical connection area 520, if the pressure value detected by the pressure sensor 800 does not reach the threshold value, the contact is judged to be unstable. If the pressure value detected by the pressure sensor 800 reaches the threshold value, the contact is judged to be stable. In this way, on the one hand, the test instrument 400 can be guaranteed to be stably electrically connected to the pins of the electronic device, and on the other hand, the consistency of the contact pressure between the probe 300 and each second electrical connection area 520 can be guaranteed to ensure the consistency of the contact impedance when testing each pin of the electronic device, which is conducive to improving the accuracy of the test results.

[0089] Also, please read Figure 8 and Fig. 9 , in order to improve the accuracy and test efficiency of the test device 10. The test device 10 provided in the embodiment of the present application may also include a first camera module 810. The first camera module 810 may be arranged on the workbench 120 through a support frame 811, and the specific position of the adapter plate 500 may be accurately located through the first camera module 810, so as to facilitate testing of the electronic devices connected to the adapter plate 500.

[0090] For example, the first camera module 810 may be an industrial camera. In addition, the support frame 811 may include a first support rod 811a and a second support rod 811b that are rotatably connected, one end of the first support rod 811a is fixedly connected to the workbench 120, the other end of the first support rod 811a is rotatably connected to one end of the second support rod 811b, and the first camera module 810 is fixed to the other end of the second support rod 811b.

[0091] In this way, the position of the first camera module 810 can be adjusted by rotating the second support rod 811b. For example, during the process of testing electronic devices, the second support rod 811b can be rotated to make the first camera module 810 located directly above the adapter plate 500. When installing or removing electronic devices, the second support rod 811b can be rotated to make the first camera module 810 and the adapter plate 500 staggered, so as to facilitate the installation or removal of electronic devices on the adapter plate 500.

[0092] In some other possible examples, a driving member, such as a motor, may also be provided on the support frame 811. The driving member is used to drive the second support rod 811b to rotate relative to the first support rod 811a. The driving member may be connected to the control module 600, so as to control the rotation of the second support rod 811b through the control module 600, so as to realize automatic adjustment of the position of the first camera module 810, which is conducive to improving the automation effect of the testing device 10.

[0093] To further improve the accuracy and test efficiency of the test device 10, the test device 10 provided in the embodiment of the present application may further include a second camera module 820, which may be fixed on the third sliding portion 232, and the second camera module 820 may accurately locate the position of the second electrical connection area 520. For example, the second camera module 820 may be an endoscope camera.

[0094] In this way, during the testing of electronic devices, the second camera module 820 can accurately locate the position of the second electrical connection area 520, so that the probe 300 can accurately abut against the center area of ​​the second electrical connection area 520, thereby helping to further ensure that the probe 300 is stably abutted against the second electrical connection area 520, reducing the risk of inaccurate test results due to unstable contact, and helping to improve test accuracy and test efficiency.

[0095] Based on this, the test device 10 provided in the present application can realize the automated test of electronic devices, thereby facilitating the improvement of the accuracy of the test results and the test efficiency. The test logic of the test device 10 is described below. Fig.10 , Fig.10 A control flow chart of the test device 10 provided in an embodiment of the present application.

[0096] First, prepare an adapter plate 500 that matches the electronic device to be tested, that is, the second connector on the electronic device matches the first connector 511 on the adapter plate 500. The tester connects the electronic device to be tested to the adapter plate 500. Next, the control module 600 issues a test task and starts the test. The control module 600 controls the first camera module 810 to locate the position of the adapter plate 500, and controls the second camera module 820 to locate the position of the second electrical connection area 520. Next, the control module 600 controls the moving mechanism 200 to drive the probe 300 to traverse the pins to be tested, that is, the second electrical connection area 520 corresponding to the pins to be tested. In addition, the abutment position of the probe 300 on the second electrical connection area 520 and the contact force between the two are monitored and calibrated in real time through the pressure sensor 800 and the second camera module 820. Finally, the test ends and the test data is transmitted back.

[0097] It can be seen that the test device 10 provided in the embodiment of the present application can perform automated testing, and can ensure test accuracy and test efficiency. In addition, in conjunction with the software system of the control module 600, it is possible to perform automated testing on electronic devices. The software system of the control module 600 is described below.

[0098] See also Fig.11 , Fig.11 This is a schematic diagram of the control system interface of the test device 10 provided in the embodiment of the present application. Fig.11It can be seen that the system interface of the control module 600 may include task creation, user interface, execution process, basic components and hardware devices.

[0099] The steps of task creation include adding solutions, selecting devices, selecting use cases, submitting tasks, and issuing tasks.

[0100] The user interface includes receiving tasks or manually creating execution tasks. Then basic configuration and device configuration are performed, including test case association, case parameter configuration, environment configuration, and execution case selection. The steps after starting the task include device initialization, traversing case, sending case parameters, device presetting, instrument presetting, and test execution.

[0101] The execution process includes starting, device initialization, case parameter analysis, moving to the specified pin, case execution, obtaining test data, test data analysis, automatic generation of test report, traversing all pins, and ending. If all pins are not traversed, the step "moving to the specified pin" is continued to be executed in sequence.

[0102] The basic components include test equipment, framework interface components and algorithm services. The test equipment includes an automatic probe station (test device 10) and a test instrument 400. The framework interface component may include different types of interfaces, such as a GRPC interface, an HTTP interface and a task manager. The algorithm service includes an automatic pin identification algorithm.

[0103] The hardware equipment includes the test device 10 provided in the embodiment of the present application, a test instrument 400 and an electronic device to be tested.

[0104] In the description of this specification, specific features, structures, materials or characteristics may be combined in an appropriate manner in any one or more embodiments or examples.

[0105] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art who is familiar with the present technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

Claims

1. A testing device, characterized in that: include: A test platform having a working surface; A mobile mechanism, arranged on the test platform; A probe, fixed on the moving mechanism; An adapter plate is arranged on the working surface, and has a plurality of first electrical connection areas and a plurality of second electrical connection areas on a surface of the adapter plate away from the working surface, the plurality of first electrical connection areas correspond to the plurality of second electrical connection areas one by one and are electrically connected; the plurality of first electrical connection areas are used to electrically connect to electronic devices, and the second electrical connection areas are used to abut against the probes; in a plane parallel to the working surface, the area of ​​the second electrical connection area is larger than the area of ​​the first electrical connection area.

2. The testing device according to claim 1, characterized in that: The moving mechanism includes a first motion mechanism, a second motion mechanism and a third motion mechanism. The first motion mechanism is used to drive the probe to move along a first direction, the second motion mechanism is used to drive the probe to move along a second direction, and the third motion mechanism is used to drive the probe to move along a third direction. Any two of the first direction, the second direction and the third direction are perpendicular to each other.

3. The testing device according to claim 2, characterized in that: The first direction and the third direction are both parallel to the working surface, and the second direction is perpendicular to the working surface.

4. The testing device according to claim 2, characterized in that: The first motion mechanism includes a first rail portion, a first sliding portion and a first driving portion. The first rail portion is arranged on the working surface and extends along the first direction. The first sliding portion is slidably arranged on the first rail portion. The first driving portion is used to drive the first sliding portion to slide along the first direction. The second motion mechanism and the third motion mechanism are arranged on the first sliding portion.

5. The testing device according to claim 4, characterized in that: The second motion mechanism includes a second rail portion, a second sliding portion and a second driving portion. The second rail portion is fixed on the first sliding portion and extends along the second direction. The second sliding portion is slidably disposed on the second rail portion. The second driving portion is used to drive the second sliding portion to slide along the second direction. The third motion mechanism is disposed on the second sliding portion.

6. The testing device according to claim 5, characterized in that: The third motion mechanism includes a third rail portion, a third sliding portion and a third driving portion. The third rail portion is fixed on the second sliding portion and extends along the third direction. The third sliding portion is slidably arranged on the third rail portion. The third driving portion is used to drive the third sliding portion to slide along the third direction. The probe is arranged on the third sliding portion.

7. The testing device according to claim 6, characterized in that: The first motion mechanism and the second motion mechanism are both provided with two, the two second rail parts are respectively fixed on the two first sliding parts, and the third rail part is fixedly connected to the two second sliding parts.

8. The testing device according to claim 7, characterized in that: There are multiple third sliding parts, and the multiple third sliding parts are all slidably arranged on the third track part, and the probe is arranged on each of the third sliding parts.

9. The testing device according to any one of claims 1 to 8, characterized in that: The testing device comprises a pressure sensor, which is arranged on the moving mechanism and connected to the probe.

10. The testing device according to any one of claims 1 to 8, characterized in that: The testing device comprises a control module, wherein the control module is electrically connected to the moving mechanism, and the control module is electrically connected to the probe.

11. The testing device according to claim 10, characterized in that: The control module includes an industrial computer.

12. The testing device according to any one of claims 1 to 8, characterized in that: In a plane parallel to the working surface, a ratio of an area of ​​the second electrical connection region to an area of ​​the first electrical connection region is in a range of 10:1-20:

1.

13. The testing device according to any one of claims 1 to 8, characterized in that: The testing device further comprises a first connector, which is welded to the first electrical connection area. The electronic device is provided with a second connector, which is plugged into the second connector to electrically connect the electronic device to the second electrical connection area.

14. The testing device according to any one of claims 1 to 8, characterized in that: The testing device comprises a positioning structure, which is arranged between the adapter plate and the testing platform, and is used to prevent the adapter plate from moving in a direction parallel to the working direction.

15. The testing device according to claim 14, characterized in that: The positioning structure includes a positioning column and a positioning hole, one of the positioning column and the positioning hole is arranged on the adapter plate, the other of the positioning column and the positioning hole is arranged on the test platform, and the positioning column is inserted into the positioning hole.

16. The testing device according to claim 14, characterized in that: The positioning structure includes a clamping tool, which is fixed on the working surface of the test platform and is used to clamp the adapter plate.

17. The testing device according to any one of claims 1 to 8, characterized in that: The testing device includes a first camera module, which is arranged on the moving mechanism and is used to position the adapter plate.

18. The testing device according to claim 17, characterized in that: The first camera module includes an industrial camera.

19. The testing device according to claim 17, characterized in that: The testing device further includes a second camera module, which is disposed on the moving mechanism and is used to locate the second electrical connection area.

20. The testing device according to claim 19, characterized in that The second camera module includes an endoscope camera.

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