A battery control box high temperature aging test device and combined structure

Abstract

The present invention relates to the field of testing devices, and provides a battery control box high temperature aging testing device and a combined structure, wherein the testing device includes a frame and a plurality of layers for placing a test piece, the plurality of layers are respectively connected to the side walls of the frame and are sequentially arranged in the frame at intervals; a test piece for testing whether the test piece meets the use requirements is installed on the bottom surface of the layer, and the test piece and the test piece are electrically connected through a circuit. The present invention is used to perform a high temperature aging test on a battery control box, and can detect a large number of battery control boxes at one time, facilitates the disassembly and assembly of the test piece and the test piece, saves space, and improves air circulation so that the test piece is heated evenly.

Description

Technical Field

[0001] The invention relates to the field of testing devices, and in particular to a high-temperature aging testing device for a battery control box and a combined structure. Background Art

[0002] As the core component of pure electric vehicles, the safety of the battery system will directly affect the performance and driving safety of the electric vehicle. In order to ensure that the battery system can supply power safely, the master control BMS system and the slave control BMU system must have strong stability and anti-aging capabilities; to avoid failures in the control system, causing dangers, major losses, and even threatening the personal safety of drivers and passengers. Therefore, the master control box and the slave control box are generally subjected to aging tests before use. If the control box is placed on a trolley for testing in a limited space, on the one hand, the efficiency is low, and it takes up more time and resources; on the other hand, the ventilation is poor, and the heated air cannot evenly heat each control box, making the test results inaccurate. A structure with a simple structure, easy implementation, and no impact on the test results is needed.

[0003] The commonly used high temperature aging test is to place a large number of test pieces and tested pieces on the desktop to check whether the test pieces meet the use requirements, where the tested piece is the battery control box. The test efficiency is low, the workload is large, and the ventilation is poor, so the master control BMU or the slave control BMS is heated unevenly, resulting in inaccurate test results. Summary of the invention

[0004] The first technical problem to be solved by the present invention is to provide a battery control box high-temperature aging test device, which can detect a large number of battery control boxes at one time, facilitate the disassembly and assembly of the test piece and the tested piece and save space, improve air circulation so that the tested piece is heated evenly.

[0005] The technical solution of the present invention to solve the above-mentioned technical problems is as follows: a battery control box high-temperature aging test device, comprising a frame and a plurality of layer plates for placing the test piece, the plurality of layer plates are respectively connected to the side walls of the frame and are arranged in the frame in sequence and at intervals; a test piece for testing whether the test piece meets the use requirements is installed on the bottom surface of the layer plate, and the test piece and the test piece are electrically connected through a circuit.

[0006] The beneficial effects of the present invention are as follows: by placing the test piece on the layer board and installing the test piece on the bottom surface of the layer board, a rapid high-temperature aging test of the test piece can be achieved by replacing the test piece during the test process, thereby testing a large number of test pieces at one time, saving test space, improving ventilation effect so that the test pieces are heated evenly, and improving test efficiency while saving manpower and material resources.

[0007] Based on the above technical solution, the present invention can also be improved as follows.

[0008] Furthermore, in the battery control box high temperature aging test device, the layer plate is horizontally arranged, and two baffles are formed on its upper surface, and the two baffles and the layer plate form a groove for placing the test piece.

[0009] The beneficial effect of adopting the above further solution is that a groove is formed on the layer plate, and the tested piece is placed in the groove, so as to facilitate the fixation of the tested piece.

[0010] Furthermore, in the battery control box high temperature aging test device, the layer plate and the test piece are connected by bolts.

[0011] The beneficial effects of adopting the above further solution are that it is convenient to disassemble and assemble the test piece, can save space and facilitate the testing of the test piece.

[0012] Furthermore, in the battery control box high temperature aging test device, the peripheral edge of the layer plate extends to form a plug-in board, and a plug-in slot body is formed on the side wall of the frame, and the plug-in board is adapted to be plugged into the plug-in slot body.

[0013] The beneficial effect of adopting the above further solution is that it facilitates the disassembly and assembly of the layer boards.

[0014] Furthermore, in the battery control box high temperature aging test device, the frame is a cubic structure surrounded by a plurality of cross beams, a plurality of columns and a plurality of connecting beams, the layer plate is located in the cubic structure, and its peripheral side edges are vertically connected to the columns.

[0015] The beneficial effect of adopting the above further solution is that the frame structure is simple and stable.

[0016] Furthermore, in the battery control box high-temperature aging test device, there are four crossbeams, four columns and four connecting beams, and every two crossbeams and every two columns are connected end to end to form a square frame. The four crossbeams and the four columns form two parallel square frames, and the two square frames are detachably connected by the connecting beam.

[0017] The beneficial effect of adopting the above further solution is that the ventilation effect can be improved through the structural arrangement of the beams and columns.

[0018] Furthermore, the battery control box high temperature aging test device also includes a support beam, which includes a support rod and a plurality of support plates connected to the support rod, and the plurality of support plates are arranged along the length direction of the support rod, and the two ends of the support rod are respectively installed on the frame, and the upper surface of the support plate is in conflict with the bottom surface of the corresponding layer plate.

[0019] The beneficial effect of adopting the above further solution is that the support beam can support the layer plate.

[0020] According to the second aspect of the present invention, a battery control box high-temperature aging test device combination structure includes multiple test devices and multiple fixed beams according to the first aspect of the present invention, the multiple test devices include a plurality of first test devices and a plurality of second test devices arranged in parallel and spaced apart, and two adjacent second test devices are connected by the fixed beam; a first test device is arranged between each two adjacent second test devices, and the first test device is detachably connected to the fixed beam between two adjacent second test devices.

[0021] The beneficial effect of the present invention is that the high-temperature aging test device for a battery control box according to the present invention has the advantages of saving test space, improving test efficiency and allowing the tested pieces to be heated evenly. Therefore, by setting up the high-temperature aging test device for a battery control box, a large number of tested pieces can be tested at one time, test space can be saved, and test efficiency can be improved.

[0022] Based on the above technical solution, the present invention can also be improved as follows.

[0023] Furthermore, in the combined structure of the high-temperature aging test device for a battery control box, two second test devices are used and are arranged parallel to each other on both sides of the first test device, the upper ends of the two second test devices are connected by the fixed beam, and the first test device is located below the fixed beam and is detachably connected to the fixed beam.

[0024] The beneficial effect of adopting the above further solution is that by arranging the second test device on both sides of the first test device, the placement of the test piece and the tested piece can be increased while saving space.

[0025] Furthermore, in the combined structure of a high-temperature aging test device for a battery control box, a first card slot is formed on the fixed beam, a second card slot is formed on the upper side of the frame of the first test device, the first card slot and the second card slot are arranged correspondingly, and the first card slot and the second card slot are detachably connected by an insert block embedded therein.

[0026] The beneficial effect of adopting the above further solution is that the disassembly and assembly of the high temperature aging test device of the battery control box located below the fixed beam is facilitated by the provision of the plug block and the slot. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Figure 1 It is a schematic diagram of the three-dimensional structure of the testing device of the present invention;

[0028] Figure 2 For the present invention Figure 1 A partial enlarged schematic diagram of part A;

[0029] Figure 3 It is a schematic diagram of the structure of the present invention in which the tested piece and the testing piece are arranged on the upper and lower sides of the layer respectively;

[0030] Figure 4 It is a top view schematic diagram of the layer plate of the present invention;

[0031] Figure 5 This is a schematic diagram of the three-dimensional structure of the support beam of the present invention;

[0032] Figure 6 It is a schematic diagram of the combined structure of the testing device of the present invention;

[0033] Figure 7 For the present invention Figure 6 A partial enlarged schematic diagram of part B in the middle.

[0034] In the accompanying drawings, the components represented by the reference numerals are listed as follows:

[0035] 10. Test piece, 20. Test piece, 1. Frame, 2. Shelf, 3. Support beam, 11. Plug-in slot, 12. Cross beam, 13. Column, 14. Connecting beam, 15. Second slot, 21. Plug-in plate, 22. Front baffle, 23. Rear baffle, 24. Nut, 31. Support rod, 32. Support plate, 100. Test device, 200. Fixed beam, 201. First slot, 300. Insert block. DETAILED DESCRIPTION

[0036] The principles and features of the present invention are described below in conjunction with the accompanying drawings. The examples given are only used to explain the present invention and are not used to limit the scope of the present invention.

[0037] It should be noted here that “inward” refers to the direction toward the center of the accommodating space, and “outward” refers to the direction away from the center of the accommodating space.

[0038] See also Figures 1 to 5 The present invention provides a high temperature aging test device for a battery control box, comprising a frame 1 and a plurality of layers 2 for placing a test piece 10. The plurality of layers 2 are respectively connected to the side walls of the frame 1 and are sequentially arranged in the frame 1 at intervals. A test piece 20 for testing whether the test piece 10 meets the use requirements is installed on the bottom surface of the layer 2. The test piece 20 and the test piece 10 are electrically connected through a line.

[0039] Specifically, Figure 1As shown, the frame 1 is surrounded by side walls to form an internal accommodating space, and the layer plate 2 is located in the accommodating space. The layer plates 2 can be arranged in the frame 1 at equal intervals from top to bottom, and of course other arrangements can also be used. The left and right side ends of the layer plate 2 can be fixedly connected to the side walls of the frame 1 or detachably connected. The test piece 10 is a battery control box, and can also be other containers for placing battery control components. The test piece 20 and the bottom surface of the layer plate 2 can be detachably installed.

[0040] During the test, the entire battery control box high temperature aging test device is located in a high temperature space. The test piece 20 and the tested piece 10 are located on the upper surface and the bottom surface of the layer plate 2 respectively, and are electrically connected through lines and transmit data. The test piece 20 obtains the test result from the data transmitted by the tested piece 10, so as to know whether the tested piece 10 meets the use requirements.

[0041] Through the implementation of the present invention, the test piece 10 is placed on the layer board 2, and the test piece 20 is installed on the bottom surface of the layer board. Since the test piece 10 is directly placed on the upper surface of the layer board 2, the test piece 10 can be directly replaced during the test process to achieve a rapid high-temperature aging test of the test piece 10, so that a large number of test pieces 10 can be tested at one time, saving test space, improving ventilation effect so that the test piece 10 is heated evenly, and while saving manpower and material resources, improving test efficiency.

[0042] In one embodiment, the layer plate 2 is arranged horizontally, and two baffles are formed on the upper surface of the layer plate. The two baffles and the layer plate 2 form a groove for placing the tested piece 10 .

[0043] Specifically, Figure 2 and Figure 3 As shown, the tested piece 10 is placed in the groove, which facilitates the fixation of the tested piece 10 so that the tested piece 10 will not slide off the layer board 2.

[0044] A front baffle 22 and a rear baffle 23 may be arranged vertically relative to the layer plate 2 on the front and rear end side walls of the layer plate 2. The front baffle 22 and the rear baffle 23 may be formed integrally with the layer plate 2. The lower end of the rear baffle 23 is connected to the layer plate 2, and the upper end of the rear baffle 23 is bent forward to form a horizontal plate, so that the rear baffle 23 forms an inverted "L"-shaped structure. Furthermore, the upper surfaces of the front baffle 22, the rear baffle 23 and the layer plate 2 are surrounded to form a groove for placing the test piece 10.

[0045] In one embodiment, the layer plate 2 and the test piece 20 are connected by bolts.

[0046] Specifically, Figure 2 , Figure 3 and Figure 4As shown, a nut 24 can be riveted on the bottom surface of the layer plate 2, so that the test piece 20 can be threadedly connected to the nut 24 by bolts or screws, and then connected to the bottom surface of the layer plate 2. Of course, when the layer plate 2 has a certain thickness, a threaded hole can be started on the bottom surface of the layer plate 2, and the test piece 20 can be directly threadedly connected to the layer plate 2 by bolts or screws.

[0047] In one embodiment, the peripheral edge of the layer plate 2 extends to form a plug-in board 21. A plug-in slot 11 is formed on the side wall of the frame 1. The plug-in board 21 is adapted to be plugged into the plug-in slot 11.

[0048] Specifically, Figure 2 , Figure 3 and Figure 4 As shown, the left and right edges of the layer board 2 extend downward to form a plug-in board 21. In order to better fix the layer board 2 on the frame 1, the plug-in board 21 is set to an "L" shape, including a bend and a horizontal part perpendicular to each other. The front side wall and the rear side wall of the frame 1 are respectively protruded outward to form a plug-in slot body 11. The bend of the plug-in board 21 is plugged into the plug-in slot body on the front side wall of the frame 1, and the horizontal part of the plug-in board 21 is plugged into the plug-in slot body on the rear side wall of the frame 1. The plug-in slot body 11 can be set as a cubic structure with a built-in space, wherein the cubic structure has an upper opening and a side opening, and the upper opening and the side opening are connected to the built-in space. The plug-in board 21 is inserted into the plug-in slot body 11 through the upper opening and the side opening. Thereby facilitating the installation of the layer board 2. During installation, it is only necessary to insert the plug-in board 21 of the layer board 2 into the plug-in slot body 11 of the frame 1 from top to bottom, and install it in sequence from bottom to top along the frame 1.

[0049] In one embodiment, the frame 1 is a cubic structure surrounded by a plurality of cross beams 12, a plurality of columns 13 and a plurality of connecting beams 14. The layer plate 2 is located in the cubic structure, and its peripheral edges are vertically connected to the columns 13.

[0050] Specifically, Figure 1 As shown, the crossbeam 12, the column 13 and the connecting two 14 are arranged perpendicularly to each other to form three perpendicular sides of the cubic structure. The crossbeam 12 can be arranged horizontally, and the column 13 can be arranged vertically. The left and right edges of the layer 2 are vertically connected to the column 13, so that the layer 2 is arranged horizontally, which is convenient for placing the test piece 10.

[0051] In one embodiment, there are four cross beams 12, four columns 13 and four connecting beams 14. Every two cross beams 12 and every two columns 13 are connected end to end to form a square frame. Four cross beams 12 and four columns 13 form two parallel square frames. The two square frames are detachably connected by the connecting beam 14.

[0052] Specifically, Figure 1As shown, the two crossbeams 12 are respectively an upper crossbeam and a lower crossbeam arranged horizontally and in parallel. The two uprights are respectively a left upright and a right upright arranged vertically and in parallel. The two ends of the upper crossbeam are respectively connected with the upper end bolts of the left upright and the right upright, and the two ends of the lower crossbeam are respectively connected with the lower end bolts of the left upright and the right upright, thereby forming a square frame. The two square frames are respectively a front square frame and a rear square frame arranged in parallel, and the upper ends and the lower ends of the front square frame and the rear square frame are respectively connected by connecting beams, so as to facilitate ventilation, thereby making the tested piece 10 evenly heated.

[0053] In one embodiment, a support beam 3 is further included. The support beam 3 includes a support rod 31 and a plurality of support plates 32 connected to the support rod 31. The plurality of support plates 32 are arranged along the length direction of the support rod 31. Both ends of the support rod 31 are respectively mounted on the frame 1. The upper surface of the support plate 32 is in conflict with the bottom surface of the corresponding layer plate 2.

[0054] Specifically, Figure 1 and Figure 5 As shown, the upper and lower ends of the support rod 31 are respectively bolted to the upper and lower side walls of the frame 1. The support plate 32 is used to support the layer board 2, thereby increasing the firmness of the layer board 2 in the frame 1. A plurality of test pieces 20 are provided, and the plurality of test pieces 20 are installed on the bottom surface of the layer board 2 along the left and right length direction of the layer board 2 at a certain distance from each other. The support plate 32 is located in the gap between two adjacent test pieces 20 and contacts the bottom surface of the layer board 2.

[0055] The embodiment of the second aspect of the present invention is a battery control box high temperature aging test device combination structure, including multiple test devices 100 and multiple fixed beams 200 of the first aspect of the present invention. The multiple test devices 100 include a plurality of first test devices 101 and a plurality of second test devices 102 arranged in parallel and spaced apart. Two adjacent second test devices 102 are connected by a fixed beam 200. A first test device 101 is arranged between each two adjacent second test devices 102. The first test device 101 is detachably connected to the fixed beam 200 between the two adjacent second test devices 102.

[0056] Specifically, the number of "multiple" may be more than two, and the number of "several" may be more than one. The fixing beam 200 may be located at any position in the up-down and front-back directions of two adjacent second test devices 102, so as to facilitate the fixing of the two adjacent second test devices 102. The first test device 101 may be located under the fixing beam 200, so as to facilitate the fixing of the first test device 101.

[0057] In one embodiment, two second test devices 102 are used and are arranged parallel to each other on both sides of the first test device 101. The upper ends of the two second test devices 102 are connected by a fixed beam 200. The first test device 101 is located below the fixed beam 200 and is detachably connected to the fixed beam 200.

[0058] Specifically, Figure 6 As shown, three test devices 100 and two fixed beams 200 are used. Among them, one first test device 101 is used, and two second test devices 102 are used and arranged in parallel, and are respectively located on the left and right sides of the first test device 101. The two fixed beams 200 are respectively a front fixed beam and a rear fixed beam. The upper ends of the two second test devices 102 are respectively connected to the front fixed beam and the rear fixed beam. Of course, the front fixed beam and the rear fixed beam can be located at any position in the front-to-back direction between the two second test devices 102. The first test device 101 is located under the rear fixed beam and is detachably connected to the rear fixed beam. Of course, the number of the first test devices 101 can also be increased. For example, two first test devices 101 are used, so that two first test devices 101 can be arranged at any position in the front-to-back direction between the two second test devices 102. Due to the similar composition structure, the number of other test devices 100 is not listed here one by one. The combined structure of the test device can increase the number of test pieces 10 and test pieces 20 placed, save placement space and heat evenly.

[0059] In one embodiment, a first slot 201 is formed on the fixed beam 200. A second slot 15 is formed on the upper side of the frame 1 of the first testing device 101. The first slot 201 and the second slot 15 are arranged correspondingly. The first slot 201 and the second slot 15 are detachably connected by inserting a plug 300 therein.

[0060] Specifically, Figure 7 As shown, the first card slot 201 and the second card slot 15 can adopt a "U"-shaped structure, and the plug block 300 can adopt an inverted "L"-shaped structure. The plug block 300 includes a horizontal portion and a vertical portion perpendicular to each other, wherein the vertical portion is inserted into the first card slot 201 and the second card slot 15, and the horizontal portion is located at the upper end surface of the first card slot 201 and extends outward from the upper end surface of the first card slot 201, so that the plug block 300 can be limited to the first card slot 201 and the second card slot 15. The detachable connection between the first test device 101 and the fixed beam 200 is achieved by plugging and unplugging the plug block 300.

[0061] In the description of the present invention, it is to be understood that the terms “center”, “longitudinal”, “lateral”, “length”, “width”, “thickness”, “up”, “down”, “front”, “back”, “left”, “right”, “vertical”, “horizontal”, “top”, “bottom”, “inside”, “outside”, “clockwise”, “counterclockwise”, “axial”, “radial”, “circumferential”, etc., indicating orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the present invention.

[0062] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In the description of the present invention, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0063] In the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0064] In the present invention, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, a first feature being "above", "above" or "above" a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being "below", "below" or "below" a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0065] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine the different embodiments or examples described in this specification and the features of the different embodiments or examples, without contradiction.

[0066] Although the embodiments of the present invention have been shown and described above, it is to be understood that the above embodiments are exemplary and are not to be construed as limitations of the present invention. A person skilled in the art may change, modify, replace and vary the above embodiments within the scope of the present invention.

Claims

1. A battery control box high temperature aging test device, characterized in that: It comprises a frame (1) and a plurality of layers (2) for placing a test piece (10), The plurality of layer plates (2) are respectively connected to the side walls of the frame (1) and are sequentially arranged in intervals within the frame (1); A test piece (20) for testing whether the tested piece (10) meets the use requirements is installed on the bottom surface of the layer plate (2), and the test piece (20) and the tested piece (10) are electrically connected via a circuit; The peripheral edge of the layer plate (2) extends to form a plug-in board (21), and a plug-in slot body (11) is formed on the side wall of the frame (1), and the plug-in board (21) is adapted to be plugged into the plug-in slot body (11); wherein the left and right edges of the layer plate (2) extend downward to form the plug-in board (21), and the plug-in board (21) is L-shaped and comprises a bent portion and a horizontal portion perpendicular to each other, and the plug-in slot body (11) is formed by protruding outwards on the front side wall and the rear side wall of the frame (1), respectively, the bent portion is plugged into the plug-in slot body (11) on the front side wall of the frame (1), and the horizontal portion is plugged into the plug-in slot body (11) on the rear side wall of the frame (1); The layer plate (2) is arranged horizontally, and two baffles are formed on its upper surface, and the two baffles and the layer plate (2) form a groove for placing the tested object (10); The layer plate (2) and the test piece (20) are connected via bolts.

2. A battery control box high temperature aging test device according to claim 1, characterized in that: The frame (1) is a cubic structure surrounded by a plurality of cross beams (12), a plurality of columns (13) and a plurality of connecting beams (14); the layer plate (2) is located in the cubic structure, and its peripheral edges are vertically connected to the columns (13).

3. A battery control box high temperature aging test device according to claim 2, characterized in that: There are four cross beams (12), four columns (13) and four connecting beams (14). Every two cross beams (12) and every two columns (13) are connected end to end to form a square frame. The four cross beams (12) and the four columns (13) form two parallel square frames. The two square frames are detachably connected via the connecting beam (14).

4. A battery control box high temperature aging test device according to claim 1, characterized in that: It also includes a support beam (3), the support beam (3) including a support rod (31) and a plurality of support plates (32) connected to the support rod (31), the plurality of support plates (32) are arranged along the length direction of the support rod (31), the two ends of the support rod (31) are respectively mounted on the frame (1), and the upper surface of the support plate (32) is in contact with the bottom surface of the corresponding layer plate (2).

5. A battery control box high temperature aging test device combined structure, characterized in that: The invention comprises a plurality of test devices (100) and a plurality of fixed beams (200) according to any one of claims 1 to 4, wherein the plurality of test devices (100) comprises a plurality of first test devices (101) and a plurality of second test devices (102) arranged in parallel and spaced apart, and two adjacent second test devices (102) are connected via the fixed beam (200); a first test device (101) is arranged between every two adjacent second test devices (102), and the first test device (101) and the fixed beam (200) between two adjacent second test devices (102) are detachably connected.

6. A battery control box high temperature aging test device combined structure according to claim 5, characterized in that: Two second test devices (102) are used and are arranged in parallel on both sides of the first test device (101), the upper ends of the two second test devices (102) are connected via the fixed beam (200), and the first test device (101) is located below the fixed beam (200) and is detachably connected to the fixed beam (200).

7. The battery control box high temperature aging test device combined structure according to claim 5, characterized in that: A first card slot (201) is formed on the fixed beam (200), a second card slot (15) is formed on the upper side of the frame (1) of the first test device (101), the first card slot (201) and the second card slot (15) are arranged correspondingly, and the first card slot (201) and the second card slot (15) are detachably connected by means of an insert block (300) inserted therein.

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