Scintillator performance test system and calibration method thereof

Abstract

The present application discloses a scintillator performance test system and a calibration method thereof, wherein the system comprises a first probe, the first probe comprises a first scintillator probe and a second scintillator probe, and the first scintillator probe is placed on the first layer, the second scintillator probe is placed on the second layer, and the first layer and the second layer are parallel to each other; at least one test channel, at least one test channel is parallel to each other and is located between the first layer and the second layer, each test channel is used to place the scintillator to be tested, and a light detection device is respectively arranged at one end of each test channel; a data acquisition module, the first scintillator probe, the second scintillator probe and each test channel are respectively provided with a data acquisition module, which is used to process the signal and transmit it to a computer. The test system disclosed in the present invention has a simple structure, does not require a radiation source, is safe and stable, realizes batch testing of multiple scintillators, and improves test efficiency.

Description

Technical Field

[0001] The present invention generally relates to the field of nuclear detection technology, and in particular to a scintillator performance testing system and a calibration method thereof. Background Art

[0002] At present, nuclear radiation detectors are devices that record and detect nuclear radiation events. Nuclear radiation detectors have been widely used in many fields, such as nuclear physics experiments, particle astrophysics, nuclear medicine, geological exploration and industrial detection, etc. Plastic scintillator belongs to organic scintillator. When charged particles or gamma rays are incident on the scintillator, the atoms (molecules) in the scintillator are ionized and excited, and emit fluorescence during the de-excitation process. Scintillator is combined with photodetection devices (such as photomultiplier tubes, etc.) to detect charged particles or neutral particles. Plastic scintillator has the advantages of being easy to prepare into a large volume, non-deliquescent, radiation-resistant, short luminescence decay time, low price, stable performance and little environmental impact. In the field of high-energy particle physics, it is widely used in field ground cosmic ray particle detector arrays. Scintillator detectors are one of the most commonly used nuclear radiation detectors. Scintillator detectors are generally composed of scintillators, photodetection devices and electronic components. Scintillator is an important component of scintillator detectors. Its luminous light output and other properties are directly related to the performance of the detector. When developing and producing scintillator detectors, it is crucial to measure the performance of the scintillator used. In some applications, the field detector array is used in large quantities at one time, and the same type of scintillator, different pieces of scintillator or scintillator produced in different batches will have certain differences in light yield and transparency, which is specifically manifested in the different numbers of photons (light output) emitted from the scintillator surface.

[0003] Therefore, the light output and other properties of a large number of scintillators are measured to select scintillators that meet the use requirements. How to conveniently, quickly and accurately measure the light output of a large number of scintillators or the light output of each scintillator in a scintillator array becomes a technical difficulty.

[0004] The existing technical solution can only test the performance of one scintillator at a time. If a large number of scintillators need to be measured, the work efficiency is very low. Summary of the invention

[0005] In view of the above-mentioned defects or deficiencies in the prior art, it is desirable to provide a scintillator performance testing system and a calibration method thereof, so as to realize batch testing of scintillator light output and monitor transparency at the same time.

[0006] In a first aspect, a scintillator performance test system is characterized by comprising:

[0007] A first probe, the first probe includes a first scintillator probe and a second scintillator probe, the first scintillator probe is placed on the first layer, the second scintillator probe is placed on the second layer, and the first layer and the second layer are parallel to each other;

[0008] At least one test channel, the at least one test channel is parallel to each other and is located between the first layer and the second layer, each test channel is used to place a scintillator to be tested, and one end of each test channel is respectively provided with a light detection device;

[0009] Data acquisition module: the first scintillator probe, the second scintillator probe and each test channel are respectively provided with a data acquisition module for processing the signal and transmitting it to the computer.

[0010] As an optional scheme, it also includes: a second probe, the second probe includes a third scintillator probe and a fourth scintillator probe, the third scintillator probe and the fourth scintillator probe are respectively connected to a data acquisition module, wherein the third scintillator probe and the first scintillator probe are located on the same layer and are respectively located at the two ends of the tested scintillator, and the fourth scintillator probe and the second scintillator probe are located on the same layer and are respectively located at the two ends of the tested scintillator.

[0011] As an optional solution, a dark box is also included, and the first probe, the second probe, at least one test probe and the data acquisition module are all located in the dark box.

[0012] As an optional scheme, an assembly bracket is also included, and the assembly bracket includes at least three layers, wherein the first scintillator probe and the third scintillator probe are placed on the top layer of the assembly bracket, and the second scintillator probe and the fourth scintillator probe are placed on the bottom layer of the assembly bracket, and a test channel is placed on each of the remaining layers, and the optical detection device is fixed at the end of the assembly bracket, and the first scintillator probe, the second scintillator probe, the third scintillator probe, the fourth scintillator probe and the data acquisition modules corresponding to the test channels are placed on the corresponding layers of the assembly bracket, respectively.

[0013] As an optional solution, a slide rail is provided at the connection between the assembly bracket and the test channel, and the test channel can move along the slide rail.

[0014] As an optional solution, a mounting groove is provided on the test channel, which extends along the length direction of the test channel. The size of the mounting groove is consistent with the size of the tested scintillator, and when the tested scintillator is installed in the mounting groove, the tested scintillator is air-coupled with the photodetection device.

[0015] As an optional solution, the first scintillator probe, the second scintillator probe, the third scintillator probe and the fourth scintillator probe respectively include a scintillator, a groove is provided on the surface of the scintillator, at least one wavelength-shifting optical fiber is placed in the groove, and the scintillator is coupled to the photomultiplier tube through the wavelength-shifting optical fiber.

[0016] As an optional solution, the surface of the scintillator is coated with a reflective film, and the reflective film is any one of tyvek paper, aluminum film or zinc sulfide.

[0017] In a second aspect, the present invention provides a calibration method for the test system according to the first aspect, comprising:

[0018] Use standard scintillators to determine whether the test system is stable;

[0019] If yes, test the light output value of the same scintillator under test in different test channels;

[0020] The correction coefficient is obtained by calculating the ratio of the light output values ​​of the same scintillator under test in different test channels, and the test channel is corrected according to the correction coefficient.

[0021] As an optional solution, the process of using a standard scintillator to determine whether the test system is stable includes:

[0022] Placing a plurality of standard scintillators in each test channel respectively, and testing the light output value of the standard scintillators;

[0023] Calculate the ratio of the current light output value of each test channel to the preset light output value;

[0024] If the ratio is 1, the test system is stable;

[0025] If the ratio is not equal to 1, the stability of the test system is corrected according to the ratio, and then the process of correcting the test channel is executed.

[0026] The test system disclosed in the present invention eliminates the influence of other stray photons when muons pass through the first scintillator probe, the tested scintillator and the second scintillator probe through the design of the first probe and the second probe, and sets at least one layer of test channels, on which the tested scintillator is placed, thereby realizing simultaneous testing of multiple scintillators. There is no crosstalk or interference between each tested scintillator, thereby improving test efficiency and test accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Other features, objects and advantages of the present application will become more apparent by reading the detailed description of non-limiting embodiments made with reference to the following drawings:

[0028] Figure 1 A schematic diagram of the structure of a scintillator performance test system according to an embodiment of the present invention;

[0029] Figure 2 A structural principle diagram of a scintillator performance testing system according to an embodiment of the present invention;

[0030] Figure 3 A schematic diagram of a partial structure of the connection between a test channel and an assembly bracket in a scintillator performance test system according to an embodiment of the present invention;

[0031] Figure 4 A schematic flow chart of a correction method of a scintillator performance test system according to an embodiment of the present invention;

[0032] Figure 5 This is a light output distribution diagram measured by repeatedly placing the same channel 10 times in one embodiment of the present invention;

[0033] Figure 6 The light output counts obtained by testing the same standard scintillator at the eighth layer for 18 months in one embodiment of the present invention;

[0034] Figure 7 This is a distribution diagram of the light output measurement results of a batch of scintillators in an embodiment of the present invention. DETAILED DESCRIPTION

[0035] The present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It is to be understood that the specific embodiments described herein are only used to explain the relevant invention, rather than to limit the invention. It is also necessary to explain that, for ease of description, only the parts related to the invention are shown in the accompanying drawings.

[0036] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present application can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0037] Since the amount of data collected for each piece of plastic scintillator is greater than 10,000 cases, the single μ case rate at sea level is no more than 160 Hz in an area of ​​1 square meter. If the probe area is too large, it will affect the uniformity of the position response. If the probe area is 25 cm*25 cm, the case rate is no more than 10 Hz (related to the probe spacing, the larger the spacing, the lower the case rate). Therefore, it takes at least 17 minutes to accumulate 10,000 cases. However, in the existing test process, in order to make the PMT photomultiplier tube enter a stable working state, the test system needs to be preheated for 30 minutes. It takes one hour to complete a test. For thousands of scintillators, and only one can be tested at a time, the test efficiency is very low.

[0038] Based on the above problems, the embodiments of the present application provide a scintillator performance testing system, such as Figure 1 As shown, the test system includes:

[0039] A first probe 10, the first probe 10 includes a first scintillator probe 11 and a second scintillator probe 12, wherein the first scintillator probe 11 is placed on a first layer, and the second scintillator probe 12 is placed on a second layer, and the first layer and the second layer are parallel to each other;

[0040] At least one test channel 30, at least one test channel 30 is parallel to each other and is located between the first layer and the second layer, each test channel 30 is used to place a scintillator 31 to be tested, and one end of each test channel 30 is respectively provided with a light detection device 32;

[0041] Data acquisition module 40 : The first scintillator probe 11 , the second scintillator probe 12 and each test channel 30 are respectively provided with a data acquisition module 40 for processing the signal and transmitting it to the computer 60 .

[0042] The cosmic ray muons sequentially pass through the first scintillator probe 11 , the tested scintillator 31 , and the second scintillator probe 21 , and are excited in the tested scintillator to generate photons, and the optical output signals are detected by the optical detection device 32 .

[0043] It should be noted that

[0044] In order to eliminate the interference of photons in the external environment, the entire test process must be carried out in a dark or light-proof environment, so the entire test system can be placed in a dark box 50 that is completely light-proof.

[0045] The present invention uses cosmic ray muons as incident charged particles, does not require the use of radioactive sources, and is safe and stable. Muons are generated by π mesons in cosmic rays, which decay when passing through the atmosphere. The static lifetime of muons is only 2.2 microseconds, and they will quickly decay into an electron, an anti-electron neutrino and a muon neutrino. Muons move at high speeds, and the time dilation effect of special relativity prolongs the decay time of muons, so that they have a chance to reach the ground. Cosmic ray muons have high energy and strong penetrating power. When muons pass through a scintillator, atoms (molecules) in the scintillator are ionized and excited, and photons are emitted during the deexcitation process. The photons hit the photomultiplier tube (PMT) coupled to the side of the scintillator, and after photoelectric conversion and multiplication, an electrical signal is output. The electrical signal is digitally recorded by the electronics system to record the charge amount and time information, thereby obtaining the light output performance of the scintillator.

[0046] In the present disclosure, the test channel 30 is located between the first layer and the second layer, the first layer is provided with a first scintillator probe 11, and the second layer is provided with a second scintillator probe 12. It can be understood that the tested scintillator is placed between the first scintillator probe 11 and the second scintillator probe 12, and the muon can pass through the first scintillator probe 11, the tested scintillator and the second scintillator probe 12. When the first scintillator probe 11 and the second scintillator probe 12 detect signals at the same time, it means that the muon has completely passed through the tested scintillator and the second scintillator probe 12. Through the design of the first scintillator probe 11 and the second scintillator probe 12, it is beneficial to use the signal generated when the muon passes through the first scintillator probe 11 and the second scintillator probe 12 as a coincidence signal, and to open the gate for the signal generated by the tested scintillator, so as to select the signal of the muon case from many stray signals, thereby obtaining the signal output amplitude of each plastic scintillator.

[0047] The present disclosure includes at least one test channel 30, each of which is used to place the scintillator to be tested. Each test channel 30 can only hold one scintillator, or can also hold a scintillator array consisting of a certain number of scintillators. By testing multiple test channels 30 at the same time, multiple scintillators can be tested at the same time, batch testing is achieved, and test efficiency is improved.

[0048] Placing the tested scintillator in the test channel 30 is beneficial to prevent crosstalk between each tested scintillator, ensuring that the photomultiplier tube set at one end of each channel only detects the tested scintillator corresponding to the channel. For example: a scintillator B1 is placed in the first channel, and a photomultiplier tube PMT1 is installed at the end; a scintillator B2 is placed in the second channel, and a photomultiplier tube PMT2 is installed at the end; a scintillator B3 is placed in the third channel, and a photomultiplier tube PMT3 is installed at the end. It can be understood that without the influence of crosstalk, the light output of the scintillator B2 corresponds to the light detection of the PMT2 one by one, and the PMT2 will not detect the scintillator B1 and the scintillator B3.

[0049] Each test channel 30 is parallel to each other, which helps to avoid interference between the tested scintillators in different channels and affect the accuracy of the test.

[0050] In order to more clearly collect the output signals of the first scintillator probe 11, the second scintillator probe 12 and the scintillator under test, as shown in FIG. Figure 2As shown, each layer is connected to a data acquisition module 40. The data acquisition module 40 is mainly used to measure the signals of each layer for analog-to-digital conversion, integrate the digital signal, find the peak in real time and complete the integration, and transmit the signal to the computer for display, so as to observe the monitoring results more intuitively. The data acquisition module 40 generally includes an electronics system 41 and a power supply system 42. The electronics system and the power supply system are connected to the clock system 43 through optical fiber to achieve signal synchronization and upload data to the computer 60. Specifically, the power supply system 42 provides voltage to the optical detection device 32 and the electronics system 41 respectively, and the optical detection device 32 outputs the signal to the electronics system 41. The electronics system 41 is connected to the clock system 42 so that the test signal of each test channel can be synchronously transmitted to the computer, wherein the clock system 42 can adopt the Little White Rabbit clock system, and its signal synchronization time accuracy is less than 1ns.

[0051] The test system disclosed in the present invention eliminates the influence of other stray photons when muons pass through the first scintillator probe, the tested scintillator and the first scintillator probe through the design of the first scintillator probe and the first scintillator probe, and at least one layer of test channels is provided, on which the tested scintillator is placed, thereby realizing simultaneous testing of multiple scintillators. There is no crosstalk or interference between each tested scintillator, thereby improving test efficiency and test accuracy.

[0052] As an achievable method, an assembly bracket 33 is included, the assembly bracket 33 is installed in the dark box 50, the assembly bracket 33 includes at least three layers, wherein the first scintillator probe 11 is placed on the top layer of the assembly bracket 33, the second scintillator probe 12 is placed on the bottom layer of the assembly bracket 33, and a test channel 30 is placed on each of the remaining layers, the light detection device 32 is fixed to the end of the assembly bracket 33, and the first scintillator probe 11, the second scintillator probe 12 and the data acquisition module 40 corresponding to each test channel 30 are respectively placed on the corresponding layers of the corresponding assembly bracket 33. This embodiment is conducive to the neat structure of the entire test system and easy operation.

[0053] In a preferred embodiment, a second probe 20 is also included, and the second probe 20 includes a third scintillator probe 21 and a fourth scintillator probe 22, wherein the third scintillator probe 21 and the first scintillator probe 11 are located in the same layer and are respectively located at the two ends of the tested scintillator, and the fourth scintillator probe 22 and the second scintillator probe 12 are located in the same layer and are respectively located at the two ends of the tested scintillator. In this embodiment, through the synergistic effect of the first probe 10 and the second probe 20, since the tested scintillator 31 has a certain length, the distances between the first probe 10 and the second probe 20 relative to the photodetector 32 are inconsistent. For example, the distance from the first probe 10 to the photodetector 32 is greater than the distance from the second probe 20 to the photodetector 32. Therefore, the cosmic ray muons passing through the first probe 10 will be emitted in the scintillator, resulting in a certain degree of attenuation of the photons. Therefore, the cosmic ray muon signal of the first probe 10 received by the photodetector 32 will be smaller than the signal of the second probe 20. Therefore, by comparing the signal of the first probe 20 with the signal of the second probe 20, the attenuation length of the tested scintillator can be obtained, thereby reflecting the transparency of the tested scintillator. That is, when the attenuation length is short, the transparency of the tested scintillator is high. On the contrary, the transparency of the tested scintillator is poor.

[0054] The scintillator to be tested is placed between the upper and lower layers of probes, and the size of a single probe is 25cm×25cm×2cm. Since the muon counting rate at sea level is about 160Hz / m 2 The area of ​​the scintillator unit detector 100cm×25cm×2cm is 0.25m 2 , the probability of more than two muons hitting the scintillator at the same time in the coincidence time window is very small. The probability of two events coincidentally in a 200ns time window is 2×10-7Hz.

[0055] As an achievable method, Figure 3 A slide rail 34 is provided at the connection between the assembly bracket 33 and the test channel 30, and the test channel 30 moves along the slide rail 34. This embodiment is conducive to the assembly of the scintillator to be tested.

[0056] In a specific embodiment, the test channel 30 is provided with a mounting groove 35, which extends along the length direction of the test channel. The size of the mounting groove 35 is consistent with the size of the scintillator 31 to be tested, and when the scintillator 31 to be tested is installed in the mounting groove 35, the scintillator 31 to be tested is air-coupled with the photodetector 32. This embodiment is mainly used for light isolation and prevention of light crosstalk. Adjusting the size of the mounting groove 35 can meet the scintillator test of different specifications; the cross-sectional size of the mounting groove 35 is consistent with the scintillator to be tested, and the depth is less than the height of the scintillator to be tested. When installed on the scintillator 31 to be tested, the test channel 30 is pulled out along the slide rail 34 of the assembly bracket 33, the scintillator 31 to be tested is placed in the mounting groove 35, and then the test channel 30 is pushed in along the slide rail 34 of the assembly bracket 33, so that the scintillator 31 to be tested is just in contact with the photodetector 32. The design of the mounting groove 35 is conducive to ensuring that the tested scintillator is stably fixed on the test channel, so that the distance between the tested scintillator 31 and the photodetector 32 remains consistent, and the distance between the tested scintillator 31 and the photodetector 32 will not change due to the movement of the test channel, thereby affecting the light output test of the tested scintillator 31 by the photodetector 32.

[0057] As an achievable method, the first scintillator probe 11, the second scintillator probe 12, the third scintillator probe 21 and the fourth scintillator probe 22 respectively include scintillators, a groove (fiber installation groove) is provided on the surface of the scintillator, at least one wavelength-shifting optical fiber is placed in the optical fiber installation groove, and the scintillator is coupled to the photomultiplier tube through the wavelength-shifting optical fiber. In order to increase the light collection efficiency so that the fluorescence generated by the scintillator is emitted from the side and enters the photomultiplier tube, the surface of the scintillator is coated with a reflective film, and the reflective film here can be tyvek paper, aluminum film or zinc sulfide, etc.

[0058] As an implementable manner, the light detection device 32 can be implemented in various ways, for example, it can be a single-channel photomultiplier tube, a position-sensitive photomultiplier tube, a photodiode, or a silicon photodiode.

[0059] As a feasible method, in order to ensure that the data acquisition module 40 is stably installed and convenient for disassembly and maintenance, a fixing plate is further provided on one side of the assembly bracket 33 for fixing the data acquisition module 40, wherein the fixing plate can be provided on the side of the assembly bracket opposite to the photomultiplier tube, or on the side adjacent to the photomultiplier tube.

[0060] The present invention is specifically described below through an example.

[0061] According to the number of scintillators to be tested, 10 channels 30 to be tested are designed, so a 12-layer assembly bracket 33 needs to be designed, and the assembly bracket 33 is placed in a dark box 50 for light protection. Among them, the assembly bracket 33 is placed on the first and twelfth layers from top to bottom, and the first probe 10 and the second probe 20 are placed, and the middle ten layers are respectively connected to the 10 test channels 30. One end of each test channel 30 is provided with a light detection device 32. The light detection device 32 uses a 1.5-inch double-base XP3960 model photomultiplier tube with a diameter of 1.5 inches, and the shell is made of glass; one end of the test channel 30 is pulled out from the assembly bracket, and the scintillator to be tested is assembled on the test channel 30. The maximum size of each scintillator to be tested is 100cm*25cm*3.0cm (length*width*thickness), and the material is polystyrene. Then one end of the test channel 30 is pushed in so that the scintillator to be tested is coupled with the photomultiplier tube. The first probe 10, the second probe 20 and the photomultiplier tubes corresponding to the scintillator to be tested are all connected to a data acquisition module 40 through signal lines, wherein the data acquisition module 40 includes an electronics module 41 and a power module 42. In this embodiment, the size of the electronics module is 17*11*4cm, and the chip dissipates heat during operation, and the temperature is about 40°C higher than the room temperature; the size of the power module is 18*12*7cm.

[0062] In summary, the present disclosure can realize batch testing of the performance of multiple scintillators by designing multiple test channels. Each scintillator being tested will not have crosstalk or interference with each other, thereby improving the test efficiency. The design of the first probe and the second probe can not only test the light output performance of the scintillator, but also the transparency of the scintillator. The first probe and the second probe can distinguish and include two scintillator probes, thereby eliminating the influence of other stray photons when muons pass through the first scintillator probe, the tested scintillator and the first scintillator probe, thereby improving the test accuracy. The present disclosure uses natural cosmic rays to batch measure the light output of plastic scintillators, does not require a radiation source, and is safe and stable.

[0063] Secondly, during a single scintillator test, the average number of events recorded by each plastic scintillator unit exceeds 10,000, and the relative statistical error of the average value is less than 1%. Therefore, the test system error is the main part affecting the measurement accuracy, and the relative system error is generally required to be less than 3%.

[0064] However, since the photomultiplier tubes, power supplies and electronic modules used in different layers are different, there will be differences in the light output of the same scintillator in different test channels. Therefore, all test channels need to be corrected to eliminate the differences.

[0065] An embodiment of the present invention provides a correction method for a scintillator performance test device, such as Figure 4 As shown, specifically including:

[0066] S100, using a standard scintillator to determine whether the test system is stable;

[0067] S200: If yes, test the light output values ​​of the same scintillator in different test channels;

[0068] S300, calculating the ratio of light output values ​​of the same scintillator in different test channels to obtain a correction coefficient, and correcting the test channel according to the correction coefficient.

[0069] Wherein, in S100, using a standard scintillator to determine whether the test system is stable specifically includes:

[0070] Place multiple standard scintillators in each test channel, test the light output value of the standard scintillators, and calculate the ratio of the current light output value of each test channel to the preset light output value. If the ratio is 1, the test system is stable; if the ratio is not equal to 1, the stability of the test system is corrected according to the ratio. For the corrected test system, for the same test channel, if Figure 5 As shown in the figure, Entries is the number of tests, 10 times, Mean is the average value, which is equal to 60.7, and RMS is the root mean square, which is equal to 0.6824. It can be seen that the relative error of the light output obtained by repeatedly placing the same scintillator 10 times is recorded as σ1, σ1 is equal to (RMS (root mean square) / Mean (average value)) about 1.4, and the relative error introduced by the correction coefficient is σ2. According to the error transfer formula, σ2 is 2 to the power of 1 / 2 multiplied by σ1, which is 2.0%. Therefore, the relative error of the measured value of each test channel after correction is known. The preset light output value is the light output value obtained when the standard scintillator was tested when the stability of the test system was corrected last time.

[0071] The stability of the test system is corrected, and then the light output values ​​of the same scintillator in different test channels are tested and recorded, and the ratio of the light output values ​​of the same scintillator in different test channels is calculated to obtain the correction coefficient, and the test system is corrected according to the correction coefficient.

[0072] It should be noted that the stability of the test system needs to be corrected before testing each batch of scintillators to ensure long-term stable operation of the test system.

[0073] Example:

[0074] A test system including 10 test channels, 18 months of monitoring stability such as Figure 6 As shown, Figure 6 The horizontal axis is the number of test months, and the vertical axis is the average light output count. For the 8th layer test channel, its stability is monitored for a long time through 10 standard scintillators. The stability of the 8th layer remains stable within the system error range.

[0075] For 10 test channels, the light output value of the same scintillator is tested to obtain the proportional correction coefficients between different layers, as shown in Table 1:

[0076] Table 1 Correction coefficients for calibration of 10 channels

[0077]

[0078] The test system was modified according to the above method, and the same 240 scintillators were sampled and the light output was measured using the above measurement system. Figure 7 As shown, the horizontal axis in the figure is the light output value. The light output meets the ED design requirements and the consistency is ≤5%.

[0079] The above description is only a preferred embodiment of the present application and an explanation of the technical principles used. Those skilled in the art should understand that the scope of the invention involved in the present application is not limited to the technical solution formed by a specific combination of the above technical features, but should also cover other technical solutions formed by any combination of the above technical features or their equivalent features without departing from the inventive concept. For example, the above features are replaced with (but not limited to) technical features with similar functions disclosed in the present application.

Claims

1. A scintillator performance test system, characterized in that: include: A first probe, the first probe comprising a first scintillator probe and a second scintillator probe, wherein the first scintillator probe is placed on a first layer, the second scintillator probe is placed on a second layer, and the first layer and the second layer are parallel to each other; At least one test channel, wherein the at least one test channel is parallel to each other and is located between the first layer and the second layer, each of the test channels is used to place a scintillator to be tested, and a light detection device is disposed at one end of each of the test channels; A data acquisition module, wherein the first scintillator probe, the second scintillator probe and each test channel are respectively provided with a data acquisition module, and are used to process the signal and transmit it to a computer; A second probe, wherein the second probe includes a third scintillator probe and a fourth scintillator probe, wherein the third scintillator probe and the fourth scintillator probe are respectively connected to one of the data acquisition modules, wherein the third scintillator probe and the first scintillator probe are located on the same layer and are respectively located at two ends of the scintillator under test, and the fourth scintillator probe and the second scintillator probe are located on the same layer and are respectively located at two ends of the scintillator under test; The first scintillator probe, the second scintillator probe, the third scintillator probe and the fourth scintillator probe respectively include a scintillator, a groove is provided on the surface of the scintillator, at least one wavelength shifting optical fiber is placed in the groove, and the scintillator is coupled to the photomultiplier tube through the wavelength shifting optical fiber; It also includes: a dark box, in which the first probe, the second probe, the at least one test channel and the data acquisition module are all located.

2. The test system according to claim 1, characterized in that: It also includes an assembly bracket, which includes at least three layers, wherein the first scintillator probe and the third scintillator probe are placed on the top layer of the assembly bracket, the second scintillator probe and the fourth scintillator probe are placed on the bottom layer of the assembly bracket, and one of the test channels is placed on each of the remaining layers, and the optical detection device is fixed at the end of the assembly bracket, and the first scintillator probe, the second scintillator probe, the third scintillator probe, the fourth scintillator probe and the data acquisition modules corresponding to the test channels are placed on the corresponding layers of the assembly bracket.

3. The test system according to claim 2, characterized in that: A slide rail is provided at the connection between the assembly bracket and the test channel, and the test channel can move along the slide rail.

4. The test system according to claim 1, characterized in that: The test channel is provided with a mounting groove, which extends along the length direction of the test channel. The size of the mounting groove is consistent with the size of the tested scintillator. When the tested scintillator is installed in the mounting groove, the tested scintillator is air-coupled with the photodetection device.

5. The test system according to claim 1, characterized in that: The surface of the scintillator is coated with a reflective film, and the reflective film is any one of tyvek paper, aluminum film or zinc sulfide.

6. A calibration method for a test system according to any one of claims 1 to 5, characterized in that: include: Using a standard scintillator to determine whether the test system is stable; If so, testing the light output values ​​of the same scintillator under test in the different test channels; The ratio of the light output values ​​of the same tested scintillator in the different test channels is calculated to obtain a correction coefficient, and the test channel is corrected according to the correction coefficient.

7. The calibration method according to claim 6, characterized in that: The process of using a standard scintillator to determine whether the test system is stable includes: Placing a plurality of the standard scintillators in each of the test channels respectively, and testing the light output value of the standard scintillators; Calculating the ratio of the current light output value of each test channel to the preset light output value; If the ratio is 1, the test system is stable; If the ratio is not equal to 1, the stability of the test system is corrected according to the ratio, and then the process of correcting the test channel is executed.

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