Chip automatic test machine

Abstract

The present invention relates to the technical field of detection equipment, and specifically discloses a chip automatic tester, including a storage mechanism for test pieces, a material picking robot, a test conveyor belt, a test carrier, a test robot, a test mechanism, and a qualified piece storage mechanism; the test piece storage mechanism is used to store a test material tray loaded with chips to be tested; the qualified piece storage mechanism is used to store qualified material trays; the material picking robot is used to put the chips on the test material tray into the test carrier and put the qualified chips on the test carrier into the qualified material tray; the test conveyor belt is used to transfer the test carrier between the material picking robot and the test robot; the test robot is used to transfer the chips between the test carrier and the test mechanism. The present invention provides a chip automatic tester, which can realize the assembly line operation of chip electrical testing, thereby improving the testing efficiency.

Description

Technical Field

[0001] The present invention relates to the technical field of detection equipment, and in particular to an automatic chip testing machine. Background Art

[0002] Chips need to undergo electrical testing before leaving the factory. Currently, there is no testing system on the market specifically for performing chip electrical testing. Therefore, operators can only use tools such as carts to transport chips to various workstations in turn to perform corresponding operations, resulting in low testing efficiency.

[0003] Therefore, it is necessary to develop a chip testing system to realize the assembly line operation of chip electrical testing, thereby improving the testing efficiency. Summary of the invention

[0004] An object of the present invention is to provide a chip automatic tester that can realize assembly line operation of chip electrical testing, thereby improving testing efficiency.

[0005] To achieve the above purpose, the present invention provides a chip automatic tester, including a storage mechanism for test pieces, a material taking robot, a test conveyor belt, a test carrier, a test robot, a test mechanism and a qualified piece storage mechanism;

[0006] The test piece storage mechanism is used to store the test material tray loaded with the chips to be tested;

[0007] The qualified parts storage mechanism is used to store qualified material trays;

[0008] The material taking robot is used to place the chips on the material tray to be tested into the test carrier and place the qualified chips on the test carrier into the qualified material tray;

[0009] The test delivery conveyor belt is used to transfer the test delivery carrier between the material taking robot and the test delivery robot;

[0010] The test delivery robot is used to transfer chips between the test delivery carrier and the testing mechanism.

[0011] Optionally, it also includes an NG parts storage mechanism;

[0012] The NG parts storage mechanism is used to store the NG material tray, and the material picking robot is also used to put the chips that fail the test on the test carrier into the NG material tray.

[0013] Optionally, it also includes a storage mechanism for the pieces to be retested;

[0014] The storage mechanism for the pieces to be retested is used to store the trays to be retested, and the material-retrieving robot is also used to place the chips that need to be retested on the test carrier into the trays to be retested.

[0015] Optionally, an empty disk storage mechanism is also included;

[0016] The empty tray storage mechanism is used to store empty trays, and the material picking robot is also used to transfer the empty trays on the empty tray storage mechanism to the qualified parts storage mechanism, the NG parts storage mechanism and the storage mechanism for parts to be retested.

[0017] Optionally, the empty tray storage mechanism, the to-be-tested piece storage mechanism, the qualified piece storage mechanism, the NG piece storage mechanism and the to-be-retested piece storage mechanism are arranged in parallel.

[0018] Optionally, the empty tray storage mechanism, the to-be-tested piece storage mechanism, the qualified piece storage mechanism, the NG piece storage mechanism and the to-be-retested piece storage mechanism all include a lifting platform and a linear drive mechanism for driving the lifting platform to move up and down.

[0019] Optionally, the test carrier includes an area to be tested and an area that has been tested;

[0020] The material taking robot is used to transfer the chips on the material tray to be tested to the test area of ​​the test delivery carrier;

[0021] The test sending robot is used to transfer the chip at the testing mechanism to the tested area.

[0022] Optionally, each of the material-retrieving manipulators is provided with two corresponding conveying conveyor belts;

[0023] Each of the test delivery conveyor belts is provided with a test delivery carrier and a test delivery manipulator;

[0024] Each of the test sending robots is correspondingly provided with four test mechanisms arranged along the feeding direction of the test sending conveyor belt.

[0025] Optionally, there are two material retrieving robots.

[0026] The beneficial effects of the present invention are: providing a chip automatic testing machine, using a storage mechanism for tested parts, a material picking robot, a test conveyor belt, a test carrier, a test robot, a testing mechanism and a qualified part storage mechanism to realize the same-source setting of loading and unloading when sending chips for testing, which greatly reduces the size of the equipment and can also realize the assembly line operation of chip testing, thereby improving the testing efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0028] Figure 1 A schematic top view of a chip automatic tester provided in an embodiment;

[0029] Figure 2 A schematic top view of a test carrier provided in an embodiment.

[0030] In the figure:

[0031] 101, empty tray storage mechanism; 102, test piece storage mechanism; 103, qualified piece storage mechanism; 104, NG piece storage mechanism; 105, test piece storage mechanism;

[0032] 201, empty tray; 202, tray to be tested; 203, qualified tray; 204, NG tray; 205, tray to be retested;

[0033] 3. Material taking manipulator;

[0034] 4. Test conveyor belt;

[0035] 5. Test vehicle; 501. Area to be tested; 502. Tested area;

[0036] 6. Test robot;

[0037] 7. Testing agency. DETAILED DESCRIPTION

[0038] In order to make the purpose, features and advantages of the present invention more obvious and easy to understand, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the embodiments described below are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0039] In the description of the present invention, it is to be understood that when a component is considered to be "connected" to another component, it may be directly connected to the other component or there may be a centrally disposed component. When a component is considered to be "disposed on" another component, it may be directly disposed on the other component or there may be a centrally disposed component.

[0040] In addition, terms such as "long", "short", "inside" and "outside" indicating directions or positional relationships are based on the directions or positional relationships shown in the accompanying drawings and are only used to facilitate the description of the present invention. They do not indicate or imply that the device or component referred to must have this specific direction or operate with a specific direction structure, and should not be understood as a limitation of the present invention.

[0041] The technical solution of the present invention is further described below with reference to the accompanying drawings and through specific implementation methods.

[0042] See also Figure 1 The present embodiment provides a chip automatic testing machine, including an empty tray storage mechanism 101, a test piece storage mechanism 102, a qualified piece storage mechanism 103, an NG piece storage mechanism 104, a test piece storage mechanism 105, a material picking robot 3, a test conveyor belt 4, a test carrier 5, a test robot 6 and a testing mechanism 7.

[0043] The empty tray storage mechanism 101 is used to store empty trays 201, the test piece storage mechanism 102 is used to store test trays 202 loaded with chips to be tested, the qualified piece storage mechanism 103 is used to store qualified trays 203, the NG piece storage mechanism 104 is used to store NG trays 204, and the retested piece storage mechanism 105 is used to store retested trays 205.

[0044] Optionally, the empty tray storage mechanism 101, the to-be-tested piece storage mechanism 102, the qualified piece storage mechanism 103, the NG piece storage mechanism 104 and the to-be-retested piece storage mechanism 105 all include a lifting platform and a linear drive mechanism for driving the lifting platform to move up and down.

[0045] Optionally, the linear drive mechanism is a cylinder, a hydraulic cylinder or a motor screw assembly.

[0046] See also Figure 2 The test carrier 5 includes a to-be-tested area 501 and a tested area 502 .

[0047] The working process of the chip automatic tester provided in this embodiment is as follows:

[0048] (1) The linear drive mechanism of the test piece storage mechanism 102 drives the lifting platform down to the lowest point, and the stacked test material trays 202 are manually or by using a device to be placed into the lifting platform of the test piece storage mechanism 102, and then the lifting platform of the test piece storage mechanism 102 is raised; at the same time, the linear drive mechanism of the empty tray storage mechanism 101 drives the lifting platform down to the lowest point, and the stacked empty material trays 201 are manually or by using a device to be placed into the lifting platform of the empty tray storage mechanism 101, and then the lifting platform of the empty tray storage mechanism 101 is raised;

[0049] (2) The material-retrieving robot 3 transfers the empty material tray 201 on the empty tray storage mechanism 101 to the qualified parts storage mechanism 103, the NG parts storage mechanism 104 and the parts-to-be-retested storage mechanism 105; therefore, the operator only needs to put a batch of stacked empty trays into the empty tray storage mechanism 101 at one time, and the material-retrieving robot 3 can automatically send each empty tray to each position, thereby obtaining the qualified material tray 203, the NG material tray 204 and the parts-to-be-retested storage mechanism 105; there is no need to put the empty material trays into the qualified parts storage mechanism 103, the NG parts storage mechanism 104 and the parts-to-be-retested storage mechanism 105 one by one, thereby improving the test efficiency;

[0050] (3) The material picking robot 3 places the chips on the test tray 202 into the test area 501 of the test carrier 5, and the test conveyor belt 4 conveys the test carrier 5 and the chips to be tested to the test robot 6 in the positive direction. The test robot 6 delivers the chips in the test area 501 to the test mechanism 7 for electrical testing;

[0051] (4) After the test is completed, the test robot 6 transfers the tested chips from the test mechanism 7 to the tested area 502 of the test carrier 5. Furthermore, the control system automatically records in the background which position in the tested area 502 corresponds to the chip that has passed the test, which position of the chip has failed the test, and which position of the chip needs to be retested; for example, the tested area 502 has a total of four discharge slots, the first one fails the test, the second one needs to be retested, and the third and fourth ones are qualified. This information is recorded in the control system so that the material picking robot 3 can put the chips in each discharge slot into different storage mechanisms in the subsequent steps; in order to facilitate the recording of test information, a code scanning device can also be set to scan the identification information such as the QR code on the chip;

[0052] (5) The feeding conveyor belt reversely delivers the test carrier 5 to the material picking robot 3, and the material picking robot 3 delivers each chip to a suitable tray according to the background records. For example, the qualified chips in the tested area 502 are placed in the qualified tray 203, the unqualified chips in the tested area 502 are placed in the NG tray 204, and the chips in the tested area 502 that need to be retested are placed in the to-be-retested tray 205; optionally, two to-be-retested trays 205 can be provided, and each to-be-retested tray 205 corresponds to a to-be-retested piece storage mechanism 105. The chips that fail the first test are placed in one to-be-retested tray 205, and the chips that fail the second test are placed in another to-be-retested tray 205. If all the chips fail the three tests, they are placed in the NG tray 204;

[0053] (6) At this point, a test cycle is completed. Repeating (1) to (5) can complete the test of all chips to be tested.

[0054] It should be noted that, in the present embodiment, when the linear drive mechanism of the test piece storage mechanism 102 drives the lifting platform down to the lowest point, the stacked test material trays 202 can be placed into the lifting platform of the test piece storage mechanism 102; similarly, when the linear drive mechanism of the empty tray storage mechanism 101 drives the lifting platform down to the lowest point, the stacked empty material trays 201 can be placed into the lifting platform of the empty tray storage mechanism 101.

[0055] When the qualified material tray 203 is full of qualified chips, the qualified parts storage mechanism 103 moves down a little, and the material taking robot 3 puts the new empty material tray 201 on the qualified parts storage mechanism 103, and then the qualified test chips can be stored again; when the lifting platform of the qualified parts storage mechanism 103 drops to the lowest position, the stacked qualified material trays 203 can be taken out in batches. The working principles of the NG parts storage mechanism 104 and the storage mechanism for parts to be retested 105 are the same as those of the qualified parts storage mechanism 103, and will not be repeated here.

[0056] Optionally, the empty tray storage mechanism 101, the test piece storage mechanism 102, the qualified piece storage mechanism 103, the NG piece storage mechanism 104 and the test piece storage mechanism 105 are arranged in parallel to shorten the feeding stroke of the material picking robot 3, improve the test efficiency and reduce the equipment size.

[0057] Optionally, in order to further improve the test efficiency, each of the material-retrieving manipulators 3 is provided with a storage mechanism 102 for the test pieces, a storage mechanism 103 for the qualified pieces, and two of the test conveyor belts 4. Each of the test conveyor belts 4 is provided with a test carrier 5 and a test manipulator 6. The test carrier 5 is provided with eight material discharge troughs, four of which are in the test area 501 and the other four are in the tested area 502. Each of the test conveyor belts 6 is provided with four of the test mechanisms 7 arranged along the feeding direction of the test conveyor belt 4.

[0058] Optionally, there are two material retrieving manipulators 3. Two material retrieving manipulators 3 are provided with an empty tray storage mechanism 101, an NG piece storage mechanism 104, and a piece storage mechanism to be retested 105. Of course, in some other embodiments, each material retrieving manipulator 3 may also be provided with other numbers of test conveyor belts 4 and test conveyor manipulators 6, etc., which are not limited in this embodiment.

[0059] The chip automatic testing machine provided in this embodiment realizes the same-source setting of loading and unloading by recording the test results in the background, which greatly reduces the size of the equipment. Furthermore, the dual-feeding manipulator works in conjunction with the four-feeding conveyor belts to further improve the chip testing efficiency and has great promotion value.

[0060] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A chip automatic tester, characterized in that: It comprises a storage mechanism for test pieces (102), a material taking robot (3), a test conveyor belt (4), a test carrier (5), a test robot (6), a testing mechanism (7) and a qualified piece storage mechanism (103); The test piece storage mechanism (102) is used to store the test material tray (202) loaded with the chips to be tested; The qualified parts storage mechanism (103) is used to store qualified material trays (203); The material taking robot (3) is used to place the chips on the to-be-tested material tray (202) into the test carrier (5) and to place the qualified chips on the test carrier (5) into the qualified material tray (203); The test delivery conveyor belt (4) is used to transfer the test delivery carrier (5) between the material taking robot (3) and the test delivery robot (6); The test delivery manipulator (6) is used to transfer chips between the test delivery carrier (5) and the testing mechanism (7); An NG piece storage mechanism (104), the NG piece storage mechanism (104) being used to store an NG material tray (204), the material taking robot (3) being further used to place unqualified chips on the test delivery carrier (5) into the NG material tray (204); a storage mechanism (105) for pieces to be retested, the storage mechanism (105) for pieces to be retested being used to store a tray (205) for pieces to be retested, the material taking robot (3) being further used to place the chip to be retested on the test delivery carrier (5) into the tray (205) for pieces to be retested; An empty tray storage mechanism (101), the empty tray storage mechanism (101) being used to store empty material trays (201), and the material taking robot (3) being further used to transfer the empty material trays (201) on the empty tray storage mechanism (101) to the qualified parts storage mechanism (103), the NG parts storage mechanism (104) and the to-be-retested parts storage mechanism (105); An empty tray storage mechanism (101), a storage mechanism for test pieces (102), a storage mechanism for qualified pieces (103), a storage mechanism for NG pieces (104) and a storage mechanism for test pieces to be retested (105) are arranged in parallel on the same side of the test conveyor belt (4); The test carrier (5) comprises a to-be-tested area (501) and a tested area (502); The material taking robot (3) is used to transfer the chips on the material tray (202) to be tested to the test area (501) of the test delivery carrier (5); The test sending robot (6) is used to transfer the chip at the testing mechanism (7) to the tested area (502); There are four discharge troughs in the tested area (502). The first one failed the test, the second one needs to be retested, and the third and fourth ones passed the test. All this information is recorded in the control system. After the test is completed, the test conveyor belt (4) reverses the direction of the test carrier (5) and delivers it to the material taking robot (3). The material taking robot (3) puts the chips in each material discharging slot into different storage mechanisms according to the background records; Each of the test delivery conveyor belts (4) is provided with a corresponding test delivery carrier (5) and a test delivery robot (6).

2. The chip automatic tester according to claim 1, characterized in that: The empty tray storage mechanism (101), the test piece storage mechanism (102), the qualified piece storage mechanism (103), the NG piece storage mechanism (104) and the test piece storage mechanism (105) all comprise a lifting platform and a linear drive mechanism for driving the lifting platform to move up and down.

3. The chip automatic tester according to claim 1, characterized in that: Each of the material taking manipulators (3) is provided with two corresponding delivery conveyor belts (4); Each of the test delivery manipulators (6) is provided with four test mechanisms (7) arranged along the feeding direction of the test delivery conveyor belt (4).

4. The chip automatic tester according to claim 3, characterized in that: The number of the material taking manipulators (3) is two.

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