Test socket

Abstract

The present invention relates to a test seat, comprising a plurality of conductive parts, which are arranged at positions corresponding to terminals of a component to be tested, a plurality of conductive particles are arranged and aligned in a vertical direction in an elastic insulating material to exhibit conductivity in the vertical direction; and an insulating part, which is arranged around the above-mentioned conductive parts to support each conductive part and insulate the conductive parts from each other, wherein each conductive particle comprises: a cylindrical body, which is long in one direction and has an open upper end and a lower end and an internal penetration space; and a protrusion, which protrudes in one direction from the end of the above-mentioned cylindrical body, wherein the protrusion of the conductive particle has a size that can be inserted into the penetration space of the cylindrical body of another conductive particle, so that when the conductive part is compressed during the detection process, the protrusion in the conductive particle is stuck on the other conductive particle and is not separated from the other conductive particle.

Description

Technical Field

[0001] The present invention relates to a test socket, and more particularly, to a test socket whose electrical characteristics will not deteriorate during frequent electrical inspections. Background Art

[0002] In the related art, a test socket is used for electrically detecting components, and to achieve this purpose, such a test socket is brought into contact with a component to be detected (component to be tested) and a detection device so that the component to be tested and the detection device are electrically connected to each other. The test socket transmits an electrical signal of the detection device to the component to be tested, and transmits an electrical signal of the component to be tested to the detection element. As a test socket, a spring-type ejector pin socket and a conductive rubber sheet are known in the related art.

[0003] The spring-loaded ejector seat includes a spring-loaded ejector pin that is vertically compressed in response to an external force applied to the device to be tested. The spring-loaded ejector seat requires a component for accommodating the spring-loaded ejector pin, and thus it is difficult to provide a spring-loaded ejector seat with a small thickness and to apply to terminals of the device to be tested having a small pitch.

[0004] The conductive rubber sheet can be elastically deformed in response to an external force applied to the element to be tested. The conductive rubber sheet includes: a plurality of conductive parts for electrically connecting the element to be tested to the detection device; and an insulating part separating the conductive parts from each other. The insulating part may include cured silicone rubber. Compared with the spring-type ejector seat, the conductive rubber sheet is advantageous in terms of lower manufacturing cost, no damage to the element to be tested, and extremely small thickness. Therefore, attempts have been made in the related art to replace the spring-type ejector test seat with a conductive rubber sheet.

[0005] This type of conductive rubber sheet has a plurality of conductive parts, each of which is formed by vertically aligning a plurality of conductive particles in a soft elastic insulating material. During the detection process, when the terminal of the component to be tested is brought into contact with the conductive part and pressure is applied to the conductive part, the conductive part is compressed and becomes conductive in the vertical direction, and then the detection device applies an electrical signal to the terminal of the component to be tested through the conductive part to perform an electrical test.

[0006] During frequent testing, the conductive portion of such a conductive rubber sheet is repeatedly compressed and expanded, thereby destroying the alignment of the conductive particles distributed in the soft elastic insulating material. In order to prevent the alignment of the conductive particles from being destroyed, Korean Patent No. 10-1339166 has proposed Figure 1 and Figure 2 However, although the perforation is formed in the center of the conductive particle, when the conductive portion is compressed, the conductive particles are in contact with each other and the contact surfaces of the conductive particles slide against each other to affect the alignment state of the conductive particles, so the problem of deterioration of electrical characteristics has not been solved. Summary of the invention

[0007] Problems to be solved by the invention

[0008] The embodiment of the present disclosure provides a test socket which can maintain the alignment state of the conductive particles when repeatedly pressed. The embodiment of the present disclosure provides a test socket which can prevent the sliding between the contact surfaces of the conductive particles.

[0009] Solutions for solving problems

[0010] In order to achieve the above-described purpose, a test socket is provided, which is arranged between a device to be tested and a detection device for electrically connecting the terminals of the device to be tested to the terminals of the detection device, characterized in that the test socket comprises:

[0011] A plurality of conductive portions, which are arranged at positions corresponding to the terminals of the device to be tested, and a plurality of conductive particles are arranged and aligned in the elastic insulating material in a vertical direction to exhibit conductivity in the vertical direction; and

[0012] an insulating portion, which is disposed around the conductive portion to support the conductive portion and insulate the conductive portion from each other,

[0013] Wherein, each of the above-mentioned conductive particles comprises:

[0014] a cylindrical body which is long in one direction and has open upper and lower ends and an internal through space; and

[0015] a protrusion protruding from the end of the cylindrical body in the one direction,

[0016] Among them, the above-mentioned protrusion of the above-mentioned conductive particle has a size that can be inserted into the above-mentioned penetration space of the above-mentioned cylindrical body of another conductive particle, so that when the above-mentioned conductive part is compressed during the detection process, the above-mentioned protrusion in the above-mentioned conductive particle is stuck on the other conductive particle and is not separated from the above-mentioned other conductive particle.

[0017] In the test socket, the protrusion may protrude from the upper end and the lower end of the cylindrical body along edges of the upper end and the lower end of the cylindrical body.

[0018] In the test socket, the cylindrical body may be made of a metal sheet material.

[0019] In the test socket, the protrusion may be made of a metal sheet material and bent to have the same center of curvature as the above-mentioned cylindrical body.

[0020] In the test socket, the cylindrical body and the protruding portion may be made of sheet materials having the same thickness.

[0021] In the test socket, the distal end of the protrusion may be in a sharp shape.

[0022] In the test socket, the protrusion may have a first portion having a constant width from the cylindrical body; and a second portion having a width that decreases from the first portion to the distal end.

[0023] In the test socket, the protrusion may have a third portion having a reduced width from the cylindrical body, a fourth portion having an increased width from the third portion, and a fifth portion having a reduced width from the fourth portion to the end.

[0024] In the test socket, the maximum cross-sectional area of ​​the protrusion may be smaller than the opening area of ​​the cylindrical body.

[0025] In the test socket, the cylindrical body may be formed with a through hole passing through the outer surface and the inner surface, and the through hole is filled with the elastic insulating material.

[0026] In the test socket, a recessed portion may be formed in at least one of the outer surface and the inner surface of the cylindrical body, and the recessed portion is filled with the elastic insulating material.

[0027] In the test socket, a cutout portion extending in a vertical direction may be formed on one side of the cylindrical body.

[0028] In the test socket, the cutout portion may extend from the upper end to the lower end of the cylindrical body.

[0029] In the test socket, the resilient insulating material may include silicone rubber.

[0030] In order to achieve the above-described purpose, a test socket is provided, wherein the test socket is disposed between a device to be tested and a detection device for electrically connecting a terminal of the device to be tested to a terminal of the detection device, and wherein the test socket comprises:

[0031] A plurality of conductive portions, which are arranged at positions corresponding to the terminals of the device to be tested, and a plurality of conductive particles are arranged and aligned in the elastic insulating material in a vertical direction to exhibit conductivity in the vertical direction; and

[0032] an insulating portion, which is disposed around the conductive portion to support the conductive portion and insulate the conductive portion from each other,

[0033] Wherein, the above-mentioned conductive particles include:

[0034] A cylindrical body, the upper and lower ends of which are open and form a through space inside; and

[0035] a communicating hole passing through the inner and outer surfaces of the cylindrical body,

[0036] Wherein, the above-mentioned connecting hole is filled with the above-mentioned elastic insulating material.

[0037] In the test socket, a plurality of the communication holes may be provided at intervals along the circumferential direction of the cylindrical body.

[0038] In the test seat, a cutout portion formed by cutting from the upper end to the lower end of the cylindrical body may be provided on one side of the cylindrical body.

[0039] In the test socket, the cut portion may pass through one of the plurality of communicating holes.

[0040] In the test socket, a protrusion may be formed on at least one of the upper end and the lower end of the cylindrical body.

[0041] In order to achieve the above-described purpose, a test socket is provided, wherein the test socket is disposed between a device to be tested and a detection device for electrically connecting a terminal of the device to be tested to a terminal of the detection device, and wherein the test socket comprises:

[0042] A plurality of conductive portions, which are arranged at positions corresponding to the terminals of the device to be tested, and a plurality of conductive particles are arranged and aligned in the elastic insulating material in a vertical direction to exhibit conductivity in the vertical direction; and

[0043] an insulating portion, which is disposed around the conductive portion to support the conductive portion and insulate the conductive portion from each other,

[0044] Wherein, the above-mentioned conductive particles include:

[0045] A cylindrical body, the upper and lower ends of which are open and form a through space inside; and

[0046] A recessed portion is formed on the inner surface or the outer surface of the cylindrical body.

[0047] Wherein, the above-mentioned recess is filled with the above-mentioned elastic insulating material.

[0048] Effects of the Invention

[0049] In the test socket of the present invention, the conductive particles have a cylindrical body and a protrusion is formed at the end of the cylindrical body, so that the conductive particles can be prevented from sliding on their contact surfaces and separating from each other. Therefore, the alignment state of the conductive particles can be maintained even during repeated testing.

[0050] In particular, the conductive particles having a cylindrical body are filled with an elastic insulating material, so that the conductive particles can be coupled with adjacent conductive particles through the protrusions when integrated in the conductive part, thereby preventing the conductive particles from moving out of the conductive part and maintaining the alignment of the conductive particles for a long time. BRIEF DESCRIPTION OF THE DRAWINGS

[0051] Figure 1 FIG. 1 is a view schematically showing a test socket of the related art.

[0052] Figure 2 To show the Figure 1 A three-dimensional view of the conductive particles of the related art in the test socket.

[0053] Figure 3 FIG. 1 is a view schematically showing a test socket according to an embodiment.

[0054] Figure 4 To illustrate the use Figure 1 Figure 2. A view of a test socket in Figure 2 performing electrical testing.

[0055] Figure 5 To show the Figure 3 A three-dimensional image of the conductive particles of the test socket.

[0056] Figure 6 For along Figure 5 A cross-sectional view taken along line VI-VI.

[0057] Figure 7 FIG. 1 is a view showing conductive particles coupled to each other according to an embodiment.

[0058] Figure 8 2 is a view showing conductive particles according to a second embodiment.

[0059] Fig. 9 2 is a view showing conductive particles according to a third embodiment.

[0060] Fig.10 2 is a view showing conductive particles according to a fourth embodiment.

[0061] Fig.11 2 is a view showing conductive particles according to a fifth embodiment.

[0062] Fig.12 2 is a view showing conductive particles according to a sixth embodiment.

[0063] Fig.13 2 is a view showing conductive particles according to a seventh embodiment.

[0064] Fig.14 2 is a view showing conductive particles according to an eighth embodiment. DETAILED DESCRIPTION

[0065] The embodiments of the present disclosure are used to illustrate the technical concept of the present disclosure. The scope of the present disclosure is not limited to the embodiments or detailed descriptions of the embodiments presented below.

[0066] Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as those commonly understood by those with ordinary knowledge in the art related to the present disclosure. All terms used in the present disclosure are selected for the purpose of more clearly describing the present disclosure, rather than for limiting the scope of the present disclosure.

[0067] Terms used in this disclosure such as “including,” “comprising,” or “having” should be understood as open-ended terms that imply the possibility of including other embodiments, unless otherwise stated in the phrase or sentence in which the term is used.

[0068] Unless otherwise specified, singular forms used herein may also include plural forms, and the same applies to singular forms recited in the claims.

[0069] Expressions such as “first” and “second” used in the present disclosure are used to distinguish various components, which do not limit the order or importance of the components.

[0070] It should be understood that when the present disclosure mentions that a component is “coupled” or “connected” to another component, the component may be directly coupled or connected to the other component, or any other component may be interposed between the two components.

[0071] In the present disclosure, terms such as "upper" are used to refer to the direction in which the test seat is disposed relative to the detection device, and terms such as "lower" are used to refer to the relative direction thereof. In the present disclosure, terms such as "vertical direction" include both the upward direction and the downward direction, and thus should not be understood to refer to only one of the upward direction and the downward direction.

[0072] The embodiments are described with reference to the accompanying drawings. In the drawings, similar reference numerals refer to similar components. In the following description of the embodiments, overlapping descriptions of similar components may be omitted. However, even when the description of such components is omitted, it is not intended that the components are not included in any embodiment.

[0073] The embodiments described below and the examples shown in the accompanying drawings are about a test socket for electrically connecting two electronic components. In the application example of the test socket according to the embodiment, one of the two electronic components may be a detection device, and the other of the two electronic components may be a component to be tested detected by the detection device. Therefore, in an embodiment, during the electrical test for the component to be tested, the test socket can be used for the electrical connection between the test device and the component to be tested. For example, in an embodiment, in the post-process of the manufacturing process of the component to be tested, the test socket can be used at the final electrical characteristics of the component to be tested. However, the example of using the test socket for testing in the embodiment is not limited to this.

[0074] According to an embodiment of the present invention, the test socket may be disposed between two electronic components to electrically connect the two electronic components to each other. Figure 3 As shown, one of the two electronic components can be a detection device, and the other of the two electronic components can be a component to be tested that is detected by the detection device. When the component to be tested is electrically tested, the test socket contacts the detection device and the component to be tested respectively, so that the component to be tested is electrically connected to the detection device.

[0075] The device to be tested may be a semiconductor package, but is not limited thereto. The semiconductor package may be a semiconductor device in which a semiconductor IC chip, a plurality of lead frames, and a plurality of terminals are packaged in a hexahedral shape using resin. The semiconductor IC chip may be a memory IC chip or a non-memory IC chip. The terminals may be pins, solder balls, and the like. Figure 3 The component under test shown in FIG. 1 has a plurality of hemispherical terminals on its underside.

[0076] The detection device can detect electrical characteristics, functional characteristics or operating speed of the component to be tested. The detection device can include a plurality of terminals to output electrical test signals to the circuit board to be tested and receive response signals via the terminals.

[0077] According to an embodiment of the present invention, the test socket 100 may include a conductive rubber sheet 110 and a frame 140 supporting the conductive rubber sheet 110 from a periphery of the conductive rubber sheet 110 .

[0078] Terminals 151 of the DUT 150 are electrically connected to corresponding terminals 161 of the detection device 160 via the test socket 100. The test socket 100 vertically connects the terminals 151 of the DUT 150 to the corresponding terminals 161 of the detection device 160, thereby detecting the DUT 150 using the detection device 160.

[0079] The conductive rubber sheet 110 of the test socket 100 includes a plurality of conductive portions 120 and an insulating portion 130 that supports the conductive portions 120 and insulates the conductive portions 120 from each other.

[0080] The conductive part 120 is disposed at a position corresponding to the terminal 151 of the DUT 150, and a plurality of conductive particles 121 are disposed and aligned in the vertical direction in the elastic insulating material. Since the conductive particles 121 are in contact with each other at points, lines or surfaces, the conductive part 120 is electrically conductive.

[0081] Preferably, the elastic insulating material constituting the conductive part 120 is a polymer material having a cross-linked structure. To obtain such an elastic polymer material, various curable polymer forming materials can be used, and silicone rubber is preferably used in terms of formability and electrical properties.

[0082] Preferably, the silicone rubber is obtained by crosslinking or condensing a liquid silicone rubber. Preferably, the liquid silicone rubber is -1 sec. at a shear rate of 10 5 The liquid silicone rubber may have a viscosity of less than 100 poise, and may be one of condensation-cured silicone rubber, addition-cured silicone rubber, and silicone rubber having vinyl or hydroxyl groups. Specifically, the liquid silicone rubber may be dimethyl silicone raw rubber, methyl vinyl silicone raw rubber, methyl phenyl vinyl silicone raw rubber, and the like.

[0083] Among them, liquid silicone rubber having a vinyl group (polydimethylsiloxane having a vinyl group) is generally obtained by the following method: hydrolyzing and condensing dimethyldichlorosilane or dimethyldialkoxysilane in the presence of dimethylvinylchlorosilane or dimethylvinylalkoxysilane, for example, continuing to repeatedly dissolve-precipitate for fractionation. In addition, liquid silicone rubber having vinyl groups at both ends is obtained by the following method: anion polymerization of a cyclic siloxane such as octamethylcyclotetrasiloxane in the presence of a catalyst, using, for example, dimethyldivinylsiloxane as a polymerization terminator, and appropriately selecting other reaction conditions (for example, the amount of the cyclic siloxane and the amount of the polymerization terminator). Here, as a catalyst for anionic polymerization, a base such as tetramethylammonium hydroxide and n-butylphosphonium hydroxide or a silicon alkoxide solution thereof can be used, and the reaction temperature of the anionic polymerization is, for example, in the range of 80°C to 130°C. Preferably, the molecular weight Mw of such polydimethylsiloxane having a vinyl group is 10,000 to 40,000 (referring to the weight average molecular weight converted to a polystyrene standard, the same below). In addition, in terms of heat resistance of the conductive path element, it is preferred that the molecular weight distribution index (Mw / Mn value, i.e., the ratio of the weight average molecular weight Mw converted to a polystyrene standard / the number average molecular weight Mn converted to a polystyrene standard, the same below) is 2 or less.

[0084] In addition, the liquid silicone rubber having a hydroxyl group (polydimethylsiloxane having a hydroxyl group) is generally obtained by the following method: hydrolyzing and condensing dimethyldichlorosilane or dimethyldialkoxysilane in the presence of dimethylvinylchlorosilane or dimethylhydrogenalkoxysilane, for example, continuing to dissolve-precipitate repeatedly for fractionation. In addition, it can also be obtained by the following method: anion polymerization of cyclic siloxane in the presence of a catalyst, using, for example, dimethylhydrogenchlorosilane, methyldihydrogenchlorosilane, or dimethylhydrogenalkoxysilane as a polymerization terminator, and appropriately selecting other reaction conditions (for example, the amount of cyclic siloxane and the amount of polymerization terminator). Here, as a catalyst for anionic polymerization, a base such as tetramethylammonium hydroxide and n-butylphosphonium hydroxide or a silicon alkoxide solution thereof can be used, and the reaction temperature of the anionic polymerization is, for example, in the range of 80°C to 130°C. Preferably, the molecular weight Mw of such polydimethylsiloxane having a vinyl group is 10,000 to 40,000. In addition, in terms of heat resistance of the conductive portion 120 , the molecular weight distribution index is preferably not more than 2. In the present invention, any one of the polydimethylsiloxane having a vinyl group and the polydimethylsiloxane having a hydroxyl group may be used, or both may be used in combination.

[0085] The plurality of conductive particles 121 disposed in the elastic insulating material of the conductive portion 120 are arranged and aligned in the vertical direction, forming a conductive path while maintaining a contact state in the vertical direction. Since the conductive particles 121 are contained in the elastic insulating material such as silicone rubber, the contact area between the conductive particles 121 increases as pressure is applied, thereby increasing the conductivity of the conductive particles 121.

[0086] The conductive particle 121 includes a cylindrical body 122 and a protrusion 123 .

[0087] The cylindrical body 122 forming the overall shape of the conductive particles 121 is long in one direction and has an open upper end and a lower end, and the interior is penetrated to form a through space. The cylindrical body 122 is preferably cylindrical, but is not limited thereto, and may have a triangular shape, a rectangular shape, or a polygonal shape.

[0088] Since the conductive particles 121 are cylindrical in shape as a whole and are filled with elastic insulating material, the coupling strength between the conductive particles 121 and the elastic insulating material can be extremely high in the conductive portion 120. In particular, the conductive particles 121 are longer in one direction, and the length in the direction is greater than the width of the upper and lower parts of the conductive particles 121, so that the conductive particles 121 and the elastic insulating material have a larger contact area, further preventing the conductive particles 121 from separating from the elastic insulating material.

[0089] These cylindrical bodies 122 are formed of thin metal sheet material and may be filled with a large amount of elastic insulating material.

[0090] The cylindrical body 122 has a shape in which the vertical length is greater than the width of the upper and lower ends thereof, so that the cylindrical body 122 can be easily oriented by a magnetic field, and the cylindrical body 122 preferably uses a magnetic material so that it can be easily oriented in a vertical direction by a magnetic field. In order to enable the cylindrical body 122 to be easily erected and aligned by a magnetic field, the cylindrical body 122 can be made of a magnetic metal sheet such as iron, cobalt or nickel, or a sheet made of an alloy thereof, or a sheet containing such metal, or these materials as a substrate, and a metal having high conductivity such as gold, silver, palladium or rhodium is electroplated on the surface of the above-mentioned substrate; or a non-magnetic metal sheet is used as a substrate, and a conductive magnet such as nickel, cobalt, etc. is electroplated on the surface of the above-mentioned non-magnetic metal sheet to be made; or a conductive magnet and a metal having high conductivity are electroplated on the metal sheet. Among them, preferably, nickel is used as the substrate, and metals such as gold, silver, rhodium, palladium, ruthenium, tungsten, molybdenum, platinum or iridium are electroplated on the surface. Preferably, a nickel sheet is coated with multiple different metals (for example, gold-plated particles on the surface of electroplated silver, etc.).

[0091] The method of coating the surface of the thin metal sheet with a conductive metal is not particularly limited, and for example, chemical plating or electrolytic plating may be used.

[0092] The protrusion 123 protrudes in one direction from the terminal end of the cylindrical body 122. Specifically, the protrusion 123 may include: a first protrusion 1231 extending upward from the upper end of the cylindrical body 122; and a second protrusion 1232 extending downward from the lower end of the cylindrical body 122. The first protrusion 1231 is formed along the upper edge of the cylindrical body 122 and protrudes upward. The first protrusion 1231 is made of a metal sheet material and may have the same thickness as the cylindrical body 122.

[0093] The first protrusion 1231 can be bent to have the same center of curvature as the cylindrical body 122. Specifically, the first protrusion 1231 can be bent to have the same curvature and curvature center (central axis) as the cylindrical body 122 formed by the sheet. Therefore, even if an axial load is applied, the protrusion is not easily deformed and can maintain its original shape even with a small thickness.

[0094] The first protrusion 1231 has a sharp tip and has a triangular shape whose width gradually decreases along the tip side of the cylindrical body 122 .

[0095] The second protrusion 1232 can be bent to have the same center of curvature as the cylindrical body 122. Specifically, the second protrusion 1232 can be bent to have the same curvature and curvature center (central axis) as the cylindrical body 122 formed by the sheet. Therefore, even if an axial load is applied, the protrusion is not easily deformed and can maintain its original shape when having a small thickness.

[0096] The second protrusion 1232 has a sharp tip and has a triangular shape whose width gradually decreases along the tip side of the cylindrical body 122 .

[0097] The protrusion 123 of the conductive particle 121 has a size that can be inserted into the penetration space of the cylindrical body 122 of another conductive particle 121, so even if the conductive portion 120 is compressed during detection, the protrusion 123 of the conductive particle 121 is stuck on the other conductive particle 121 and cannot be separated from the other conductive particle 121. The maximum cross-sectional area of ​​the protrusion 123 is smaller than the upper end opening and the lower end opening of the cylindrical body 122, so that the protrusion 123 can be inserted through the opening between the upper end and the lower end.

[0098] Therefore, when the conductive particles 121 are vertically aligned and the upper ends of the conductive particles 121 are coupled with the lower ends of the other conductive particles 121, or the lower ends of the conductive particles 121 are coupled with the upper ends of the other conductive particles 121, even if the conductive portion 120 is pressed and compressed by the component to be tested 150, the protrusion 123 can be stuck on the cylindrical body 122 or the protrusion 123 of the other conductive particle 121 and cannot be separated from the other conductive particle 121, thereby preventing the vertical alignment of the conductive particles 121 from being destroyed.

[0099] In addition, since the protrusion 123 has a sharp shape, a high contact pressure can be obtained when the protrusion 123 contacts the terminal 151 of the device to be tested 150, thereby easily removing the oxide layer formed on the terminal 151 and preventing the electrical contact performance from being degraded.

[0100] The insulating portion 130 is disposed around the conductive portion 120 to support the conductive portion 120 and insulate the conductive portions 120 from each other. The insulating portion 130 is formed as an elastic body and has elasticity in the vertical direction and the horizontal direction. The insulating portion 130 maintains the shape of the conductive portion 120 and keeps the conductive portion 120 in the vertical direction.

[0101] The insulating portion 130 includes an elastic insulating material. In this case, the insulating portion 130 can be formed by curing a liquid insulating material. For example, after the liquid elastic insulating material in which the conductive particles 121 are dispersed is injected into a mold for forming the conductive rubber sheet 110, the conductive particles 121 are vertically arranged at positions corresponding to the conductive portion 120 by a magnetic field to form the conductive portion 120, and then the liquid elastic insulating material is cured to form the insulating portion 130. In another example, the liquid insulating material not containing the conductive particles 121 is cured to form a through hole at a position corresponding to the conductive portion 120 in a material having the shape of the conductive rubber sheet 110, the through hole is filled with a liquid elastic insulating material in which conductive metal particles are dispersed, and the conductive metal particles filled in the through hole are vertically aligned by a magnetic force to form the conductive portion 120.

[0102] The test socket 100 of the present invention has the following effects.

[0103] First, according to an embodiment of the present invention, the test socket 100 is mounted on the detection device 160 , so that the conductive parts 120 are in contact with the terminals 161 of the detection device 160 , respectively.

[0104] At this time, if Figure 3 and Figure 7 As shown in , a plurality of conductive particles 121 are vertically aligned with the conductive portion 120 , and a protrusion 123 of a conductive particle 121 is inserted into an opening of another conductive particle 121 .

[0105] Then, if Figure 4 As shown in FIG. 1 , the terminal 151 of the device to be tested 150 applies pressure to the conductive part 120, so that the conductive particles 121 are in close contact with another conductive particle 121, and the conductive part 120 is in a conductive state. In particular, even if the conductive part 120 expands in a horizontal direction perpendicular to the vertical direction when the conductive part 120 is pressed, the conductive particle 121 inserted into another conductive particle 121 can still maintain a coupled state without destroying the vertical alignment of the conductive particles 121, and in addition, the conductive particles 121 can be prevented from moving out of the conductive part 120.

[0106] Subsequently, when the pressing force applied by the terminal 151 of the device under test 150 is released, the conductive portion 120 returns to its original state, and the conductive particles 121 also return to their original positions.

[0107] According to an embodiment of the present invention, when the elastic insulating material is filled in the cylindrical body 122 of the conductive particles 121, the conductive particles 121 are combined with the elastic insulating material arranged around the conductive particles 121, so even if the conductive part 120 is pressed, the conductive particles 121 can be prevented from moving out of the conductive part 120.

[0108] In addition, the cylindrical body 122 of the conductive particle 121 stands upright due to the magnetic field, and since the protrusion 123 of the conductive particle 121 is inserted into another conductive particle 121, even if the conductive portion 120 is pressed, the conductive particle 121 will be stuck on another conductive particle 121, thereby preventing separation from another conductive particle 121.

[0109] In addition, since the protrusion 123 of the conductive particle 121 has a sharp triangular shape and is bent around the central axis of the conductive particle 121, the protrusion 123 can easily remove foreign matter attached to the device to be tested 150, and can prevent the protrusion 123 from breaking during frequent testing. In addition, since the protrusion 123 has a triangular shape, when the depth of contact increases, the contact area increases, so the contact pressure can be reduced.

[0110] Although the test socket has been described according to the embodiment, the test socket is not limited to the embodiment and may be modified as follows.

[0111] First, in the above-described embodiment, the protrusion 123 of the conductive particle 121 has a triangular shape whose width decreases in a direction toward the distal end of the cylindrical body 122 , but the test socket is not limited thereto.

[0112] For example, you can set Figure 8 In this case, the protrusion 223 may include: a first portion 223a having a constant width from the cylindrical body 222; and a second portion 223b having a width that decreases from the first portion 223a to its end.

[0113] according to Figure 8 The protrusion 223 shown in FIG. 1 can prevent the contact pressure from decreasing when the first portion 223 a is inserted into the foreign object formed on the terminal 151 after the second portion 223 a is inserted into the foreign object formed on the terminal 151 .

[0114] In addition, you can set Fig. 9 In this case, the protrusion 323 may include: a third portion 323a having a width reduced from the cylindrical body 322; a fourth portion 323b having a width increased from the third portion 323a; and a fifth portion 323c having a width reduced from the fourth portion 323b to its end.

[0115] even though Fig. 9 The contact depth of the protrusion 323 shown in FIG. 3 increases, and the contact pressure cannot be reduced at the third portion 323 a and the fourth portion 323 b.

[0116] Fig.10 Show Figure 5The conductive particle 121 shown in FIG. 1 has a cylindrical body 422 in which a communication hole 422 a is formed.

[0117] Specifically, the cylindrical body 422 includes a connecting hole 422a penetrating the outer surface and the inner surface of the cylindrical body 422, and the elastic insulating material can be filled in the connecting hole 422a. Since these connecting holes 422a integrally connect the elastic insulating material filled in the penetration space of the cylindrical body 422 to the elastic insulating material filling the connecting holes 422a, the separation of the conductive particles 421 can be more reliably prevented.

[0118] In particular, the conductive particles 421 are connected to the elastic insulating material arranged around the conductive particles 421 in the vertical direction, and at the same time, the conductive particles 421 are integrally connected to the elastic insulating material arranged on the lateral surface of the cylindrical body 522, so that the movement of the conductive particles 421 in the vertical and horizontal directions can be suppressed to the greatest extent.

[0119] Therefore, the conductive particles 421 can maintain the vertical alignment state by the protrusions 423 , and foreign matter formed on the terminals of the device to be tested can be removed more reliably.

[0120] Fig.11 The conductive particles 521 are shown with the communicating holes 522a formed on the outer surface and the inner surface of the cylindrical body 522. In this case, the protrusions may not be formed on the upper and lower ends of the cylindrical body 522. Fig.11 These conductive particles 521 shown in FIG. 5 integrally connect the elastic insulating material filled in the penetration space of the cylindrical body 522 to the elastic insulating material filling the communicating hole 522 a , so that separation of the conductive particles 521 can be more reliably prevented.

[0121] Fig.12 It is shown in Figure 5 A cutout portion 622 b is also formed on one side of the cylindrical body 622 of the conductive particle 621 shown in FIG.

[0122] Specifically, when the protrusions 623 are formed at the upper and lower ends of the cylindrical body 622 , a cutout portion 622 b that cuts the upper and lower ends of the cylindrical body 622 may be formed on one side of the cylindrical body 622 .

[0123] Such cutout portion 622b can increase the integration between the conductive particles 621 and the elastic insulating material disposed around the conductive particles 621, and because the width of the cutout portion 622b can be expanded or reduced, the pressing force applied by the terminal can be flexibly absorbed. Fig.12 The conductive particles 621 will not separate from other conductive particles 621 during the terminal pressing process, and the elasticity imparted can further improve the electrical connection capability.

[0124] Fig.13 It is shown in Fig.10 A cutout portion 722 b is also formed on one side of the cylindrical body 722 of the conductive particle shown in FIG.

[0125] Specifically, when the protrusion 723 is formed at the upper and lower ends of the cylindrical body 722 and the connecting hole 722a is formed on the side of the cylindrical body 722, a cut portion 722b that cuts the upper and lower ends of the cylindrical body 722 can be formed on one side of the cylindrical body 722.

[0126] This cutout portion 722b can pass through one of the connecting holes 722a. Fig.10 The conductive particles shown in the figure are additionally provided with cutouts, which not only prevent the conductive particles from falling off during the pressing process, but also impart elasticity, thereby improving the electrical connection capability and fixation of the conductive particles.

[0127] Fig.14 FIG. 110 shows that a cutout portion 822 b is further formed on one side of the cylindrical body 822 of the conductive particle 821 shown in FIG. 110 .

[0128] Specifically, when the connecting hole 822a is formed at the upper and lower ends of the center of the cylindrical body 822, a cut portion 822b is formed on one side, which not only prevents the conductive particles from detaching during pressing, but also imparts elasticity, thereby improving the electrical connection ability and fixity of the conductive particles.

[0129] In the embodiment described above, a plurality of projections are formed on the upper end and the lower end of the cylindrical body, but the present invention is not limited thereto. The projection can be formed on any one of the upper end and the lower end of the cylindrical body, and a plurality of projections are not required, and only one projection can be formed on the terminal end of the cylindrical body.

[0130] In the above-described embodiment, the communication hole is formed in the cylindrical body, but the present invention is not limited thereto. The recess may be concavely formed in at least one of the outer surface and the inner surface of the cylindrical body, and the elastic insulating material may be filled in the recess.

[0131] Although the technical ideas of the present disclosure have been described with reference to some embodiments and examples shown in the accompanying drawings, it will be understood by those with ordinary knowledge in the relevant technical field of the present disclosure that various substitutions, modifications and changes can be made without departing from the spirit and scope of the present disclosure. In addition, such substitutions, modifications and changes are considered to be included in the scope of the attached patent applications.

Claims

1. A test socket, arranged between a component to be tested and a detection device, for electrically connecting a terminal of the component to be tested to a terminal of the detection device, characterized in that: The test socket comprises: a plurality of conductive portions disposed at positions corresponding to the terminals of the device to be tested, the plurality of conductive portions comprising conductive particles and an elastic insulating material, the plurality of conductive particles being arranged and aligned in the elastic insulating material in a vertical direction, the plurality of conductive portions being in contact with the plurality of conductive particles to exhibit conductivity in the vertical direction; and an insulating portion, which is arranged around the conductive portion to support the conductive portion and insulate the conductive portions from each other, The plurality of conductive particles are arranged and aligned in the elastic insulating material of the conductive part along the vertical direction, forming a conductive path while maintaining a contact state in the vertical direction. Wherein, each of the conductive particles comprises: a cylindrical body which is long in one direction and has open upper and lower ends and an internal through space; and a protrusion protruding from an end of the cylindrical body toward the one direction, wherein the protrusions of the conductive particles protrude from the upper end and the lower end of the cylindrical body along the edges of the upper end and the lower end of the cylindrical body, In which, the protrusion of the conductive particle has a size that can be inserted into the penetration space of the cylindrical body of another conductive particle, so that when the conductive part is compressed during the detection process, the protrusion in the conductive particle is stuck on the other conductive particle and is not separated from the other conductive particle, and the protrusion is stuck on the cylindrical body or protrusion of the other conductive particle and cannot be separated from the other conductive particle, thereby preventing alignment destruction in the vertical direction.

2. The test socket according to claim 1, wherein: The cylindrical body is made of metal sheet material.

3. The test socket according to claim 1, wherein: The protrusion is made of a metal sheet material and is bent to have the same center of curvature as that of the cylindrical body.

4. The test socket according to claim 2 or claim 3, wherein: The cylindrical body and the protrusion are made of sheet material having the same thickness.

5. The test socket according to claim 1, wherein: The distal end of the protrusion is sharp.

6. The test socket according to claim 5, wherein: The protrusion has a triangular shape whose width gradually decreases from the cylindrical body toward the distal end.

7. The test socket according to claim 5, wherein: The protrusion comprises: a first portion having a constant width from the cylindrical body; and A second portion has a width that decreases from the first portion to the end.

8. The test socket according to claim 5, wherein: The protrusion comprises: a third portion having a width reduced from the cylindrical body; a fourth portion having an increased width from the third portion, and A fifth portion has a width that decreases from the fourth portion to the end.

9. The test socket according to claim 1, wherein: The maximum cross-sectional area of ​​the protrusion is smaller than the opening area of ​​the cylindrical body.

10. The test socket according to claim 1, wherein: The cylindrical body is formed with a penetration hole passing through the outer surface and the inner surface, and the penetration hole is filled with the elastic insulating material.

11. The test socket according to claim 1, wherein: A recessed portion is formed in at least one of the outer surface and the inner surface of the cylindrical body, and the elastic insulating material is filled in the recessed portion.

12. The test socket according to any one of claims 1, 10 and 11, wherein: A cutout portion extending in a vertical direction is formed on one side of the cylindrical body.

13. The test socket according to claim 12, wherein: The cutout portion extends from the upper end to the lower end of the cylindrical body.

14. The test socket according to claim 1, wherein: The elastic insulating material includes silicone rubber.

15. A test socket, arranged between a component to be tested and a detection device, for electrically connecting a terminal of the component to be tested to a terminal of the detection device, characterized in that: The test socket comprises: a plurality of conductive portions disposed at positions corresponding to the terminals of the device to be tested, the plurality of conductive portions comprising conductive particles and an elastic insulating material, the plurality of conductive particles being arranged and aligned in the elastic insulating material in a vertical direction, the plurality of conductive portions being in contact with the plurality of conductive particles to exhibit conductivity in the vertical direction; and an insulating portion, which is arranged around the conductive portion to support the conductive portion and insulate the conductive portions from each other, The plurality of conductive particles are arranged and aligned in the elastic insulating material of the conductive part along the vertical direction, forming a conductive path while maintaining a contact state in the vertical direction. Wherein, the conductive particles include: A cylindrical body, the upper and lower ends of which are open and form a through space inside; and a communicating hole passing through the inner surface and the outer surface of the cylindrical body, Wherein, the connecting hole is filled with the elastic insulating material, The communicating holes are provided in plurality along the circumferential direction of the cylindrical body. The conductive particles are arranged such that the elastic insulating material filled inside the penetration space of the cylindrical body and the elastic insulating material filled in the communication hole are integrally connected to each other, thereby more reliably preventing the conductive particles from being separated.

16. The test socket according to claim 15, in, A cutout portion formed by cutting from the upper end to the lower end of the cylindrical body is provided on one side of the cylindrical body.

17. The test socket according to claim 16, wherein: The cutout portion passes through one of the plurality of communication holes.

18. The test socket according to any one of claims 15 to 17, wherein: A protrusion is formed on at least one of the upper end and the lower end of the cylindrical body.

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