Phase calibration method, device, storage medium and system for phased array

Abstract

Provided are a phase calibration method, apparatus, computer storage medium, and phased array system for a phased array. The phase calibration method includes: obtaining at least three first circuit values corresponding to a current phase modulation unit in at least one phase modulation unit, and obtaining the radiation intensity of far-field radiation at a desired angle based on each first circuit value (S101); determining first-order difference values and second-order difference values corresponding to each radiation intensity (S102); performing phase calibration on the current phase modulation unit based on the first-order difference values and second-order difference values, obtaining a next phase modulation unit, determining the next phase modulation unit as the current phase modulation unit, and executing the step of obtaining at least three first circuit values corresponding to the current phase modulation unit (S103); and determining that the phase calibration of the phased array is complete when the next phase modulation unit does not exist (S104). This method can reduce the amount of computation required during the phase calibration process and improve the efficiency of phase calibration.

Description

Technical Field

[0001] The present application relates to the field of computer technology, and in particular to a phase calibration method, device, storage medium, and system for a phased array. Background Art

[0002] Phased arrays (such as optical waveguide phased arrays) are a new type of laser scanning technology that boasts a large scanning range, high scanning speed, free addressability, zero inertia, a compact size, and low control voltage. They are applicable to military and civilian applications such as laser scanning imaging, lidar, laser displays, optical switches, and laser printing. Because the beam shape of a phased array is strictly constrained by the radiation phase of each antenna, achieving sufficiently clear and discernible beam pointing requires a highly accurate initial phase distribution in the output unit. To achieve these goals, practical applications of phased arrays require phase calibration.

[0003] Currently, in the phase calibration process of a phased array, the phase of the phased array is usually calibrated based on a gradient descent algorithm (such as a hill climbing algorithm). That is, the far-field radiation of the phased array is first obtained as feedback, and then the gradient descent algorithm is used to iteratively adjust the control circuit parameters applied to each phase modulation unit of the phased array, and finally the calibrated phase distribution is obtained, thereby achieving phase calibration of the phased array. Summary of the Invention

[0004] The embodiments of the present application provide a phase calibration method, device, storage medium, and system for a phased array, which can reduce the amount of calculation during the phase calibration process and improve the efficiency of phase calibration.

[0005] The technical solutions of the embodiments of this application are as follows:

[0006] In a first aspect, an embodiment of the present application provides a phase calibration method for a phased array, the method comprising:

[0007] In at least one phase modulation unit included, obtaining at least three first circuit values corresponding to the current phase modulation unit, and obtaining the radiation intensity of the far-field radiation at a desired angle based on each of the first circuit values;

[0008] Determining first-order difference values and second-order difference values corresponding to each of the radiation intensities;

[0009] performing phase calibration on the current phase modulation unit according to the first-order difference value and the second-order difference value, obtaining a next phase modulation unit, determining the next phase modulation unit as the current phase modulation unit, and executing the step of obtaining at least three first circuit values corresponding to the current phase modulation unit;

[0010] When there is no next phase adjustment unit, it is determined that the phase calibration of the phased array is completed.

[0011] In a second aspect, an embodiment of the present application provides a phase calibration device for a phased array, the device comprising:

[0012] a radiation intensity acquisition module, configured to acquire, from at least one phase modulation unit included therein, at least three first circuit values corresponding to a current phase modulation unit, and acquire, based on each of the first circuit values, a radiation intensity of far-field radiation at a desired angle;

[0013] A differential value determination module, configured to determine a first-order differential value and a second-order differential value corresponding to each of the radiation intensities;

[0014] a phase calibration module, configured to perform phase calibration on the current phase modulation unit according to the first-order difference value and the second-order difference value, obtain a next phase modulation unit, determine the next phase modulation unit as the current phase modulation unit, and execute the step of obtaining at least three first circuit values corresponding to the current phase modulation unit;

[0015] The phase calibration module is further configured to determine that the phase calibration of the phased array is completed when there is no next phase modulation unit.

[0016] In a third aspect, an embodiment of the present application provides a computer storage medium, wherein the computer storage medium stores a plurality of instructions, wherein the instructions are suitable for being loaded by a processor and executing the above-mentioned method steps.

[0017] In a fourth aspect, an embodiment of the present application provides a phase calibration system, which may include: a processor and a memory; wherein the memory stores a computer program, and the computer program is suitable for being loaded by the processor and executing the above-mentioned method steps.

[0018] The beneficial effects of the technical solutions provided by some embodiments of the present application include at least:

[0019] In one or more embodiments of the present application, a phased array obtains at least three first circuit values corresponding to a current phase modulation unit in at least one phase modulation unit included therein, obtains radiation intensity of far-field radiation at a desired angle based on each of the first circuit values, determines a first-order difference value and a second-order difference value corresponding to each of the radiation intensities, performs phase calibration on the current phase modulation unit based on the first-order difference value and the second-order difference value, obtains a next phase modulation unit, determines the next phase modulation unit as the current phase modulation unit, and executes the step of obtaining at least three first circuit values corresponding to the current phase modulation unit. When no next phase modulation unit exists, it is determined that the phase calibration of the phased array is completed. By using a differential calculation method to calculate the first-order differential value and the second-order differential value corresponding to the radiation intensity, continuous iterative adjustment of the circuit parameters (voltage or current) of the phase modulation unit can be achieved based on the first-order differential value and the second-order differential value, avoiding a large number of differential operations on each radiation intensity during the phase adjustment process, greatly reducing the amount of calculation during the phase calibration process; and only needing to obtain a minimum of three first circuit values corresponding to the current phase modulation unit as an iterative reference, avoiding the operation of too many circuit parameters (such as the first circuit value), thereby improving the calculation speed. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0021] Figure 1 1 is a flow chart of a phase calibration method for a phased array provided in an embodiment of the present application;

[0022] Figure 2 1 is a flow chart of another phase calibration method for a phased array provided in an embodiment of the present application;

[0023] Figure 3 1 is a schematic diagram of a far-field radiation scenario of a phased array before phase calibration, involved in the phase calibration method of the phased array provided in an embodiment of the present application;

[0024] Figure 4 1 is a schematic diagram of a far-field radiation scene after phase calibration of a phased array involved in the phase calibration method of a phased array provided in an embodiment of the present application;

[0025] Figure 5 is a far-field distribution diagram of the phased array at the initial phase of the phased array involved in the phase calibration method of the phased array provided in an embodiment of the present application;

[0026] Figure 6 is a far-field distribution diagram of the phased array at the initial phase of the phased array after normalization processing involved in the phase calibration method of the phased array provided in an embodiment of the present application;

[0027] Figure 7 is a far-field distribution diagram of a phased array after phase calibration involved in the phase calibration method of a phased array provided in an embodiment of the present application;

[0028] Figure 8 is a far-field distribution diagram of the phased array after normalization processing involved in the phase calibration method of the phased array provided in an embodiment of the present application;

[0029] Figure 9 1 is a flow chart of another phase calibration method for a phased array provided in an embodiment of the present application;

[0030] Figure 10 1 is a schematic structural diagram of a phase calibration device for a phased array provided in an embodiment of the present application;

[0031] Figure 11 is a structural diagram of a differential value determination module provided in an embodiment of the present application;

[0032] Figure 12 This is a structural diagram of a circuit value adjustment unit provided in an embodiment of the present application;

[0033] Figure 13 1 is a schematic structural diagram of another phase calibration device for a phased array provided in an embodiment of the present application;

[0034] Figure 14 Schematic diagram of the structure of a phase calibration system provided in an embodiment of the present application. DETAILED DESCRIPTION

[0035] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0036] In the description of this application, it should be understood that the terms "first", "second", etc. are used for descriptive purposes only and should not be understood to indicate or imply relative importance. In the description of this application, it should be noted that, unless otherwise expressly specified and limited, "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units that are not listed, or may optionally include other steps or units inherent to these processes, methods, products or devices. For those of ordinary skill in the art, the specific meanings of the above terms in this application can be understood according to the specific circumstances. In addition, in the description of this application, unless otherwise specified, "multiple" refers to two or more. "and / or" describes the association relationship of associated objects, indicating that three relationships can exist. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. The character " / " generally indicates that the associated objects before and after are in an "or" relationship.

[0037] In the related art, when calibrating the phase of a phased array based on a gradient descent algorithm (such as a hill climbing algorithm), the gradient descent algorithm is usually used to continuously and iteratively adjust the control circuit parameters applied to each phase modulation unit of the phased array. The iterative adjustment of the control circuit parameters usually involves a large number of complex calculations on the corresponding far-field radiation when adjusting the control circuit parameters. On the one hand, it is necessary to perform differential operations on the corresponding far-field radiation, such as calculating the first-order and second-order derivatives of the objective function (such as the radiation intensity ratio) using differential operations in each iteration; the radiation intensity ratio is the ratio of the light intensity radiation (i.e., the radiation intensity value) of the far-field radiation at a desired angle to the total light intensity radiation (i.e., the total radiation intensity value). On the other hand, in the process of calculating the first-order and second-order derivatives of the objective function (such as the radiation intensity ratio), since it is necessary to differentiate the objective function curve of the current phase modulation unit of the phased array, a polynomial fitting process of multiple objective function values is involved. Only after the polynomial fitting can the first-order and second-order derivatives of the objective function (such as the radiation intensity ratio) be obtained. Therefore, the phase calibration process will have problems such as large amount of calculation, low calculation speed, and long calculation time.

[0038] The present application is described in detail below with reference to specific embodiments.

[0039] In one embodiment, Figure 1 As shown in the figure, a phased array phase calibration method is proposed. This method can be implemented by a computer program and can be run on a phased array phase calibration device based on the von Neumann architecture. The computer program can be integrated into an application or run as a standalone tool application.

[0040] Specifically, the phase calibration method of the phased array includes:

[0041] Step S101: in at least one phase modulation unit, obtaining at least three first circuit values corresponding to the current phase modulation unit, and obtaining the radiation intensity of far-field radiation at a desired angle based on each of the first circuit values.

[0042] In an embodiment of the present application, a phased array (such as an optical phased array) may include at least an optical input unit, an optical power distribution structure, a phase modulation unit, and an output unit array. The optical input unit may couple an optical signal (such as an infrared light signal or a laser signal) into a base optical chip. The coupling may be divided into vertical coupling and horizontal coupling, corresponding to commonly used coupling methods such as grating coupling and end face coupling. The optical power distribution structure is also an optical beam splitter or a power divider. Commonly used power dividers may include a Y-branched waveguide, an MMI multimode interference device, a star coupler, and a directional coupler for power distribution. In some embodiments, the phase modulation unit may also be understood as a phase shifter comprising a waveguide layer. The phased array generally includes at least one phase modulation unit. The phase modulation unit may be a PIN electric injection structure, which changes the equivalent refractive index of the phase modulation unit material by controlling circuit parameters (current or voltage) to adjust the phase. Of course, it is also possible to heat the thermocouple of the phased array by controlling circuit parameters (current or voltage), change the equivalent refractive index of the material by changing the temperature, and thus adjust the phase, and so on. The output array unit is similar to the input coupling unit, but has higher size requirements than the input unit. It is generally expected to be smaller to facilitate dense arrangement and improve the radiation performance of the phased array. The output unit array can be a radiating unit, which can be arranged in a certain pattern to form an array. By controlling the amplitude and phase of the light beam emitted by each radiating unit, the phase pattern of the phased array antenna can be changed to achieve the purpose of beam scanning. The accuracy and variation of the amplitude and phase of the light beam emitted by each radiating unit directly affect the accuracy of the beam scanning. In actual applications, each radiating unit in the phased array is usually composed of a phase modulation unit and an antenna transmitter (or signal transmitter). As mentioned above, the optical power divider divides the optical signal coupled into multiple beams, at which point the phase of each beam is usually the same. After each beam is phase-modulated by the corresponding phase modulation unit, the phase will change, which is also called phase modulation. The phase-modulated light beam is emitted outward through the antenna generator contained in the corresponding radiating unit. Due to the phase difference characteristics of the emitted light beams in free space, the light beams will interfere with each other to form a preset far-field radiation pattern. Due to different usage environments or changes in the performance of the device itself, the phase of the light beam received by each radiation unit often shifts compared to expectations.

[0043] In an embodiment of the present application, a phase calibration method based on far-field radiation of a phased array is used to calibrate the phased array. In the application, since the distance from the signal source to each radiating element is substantially the same, the light beam emitted by the signal source and received by the phase modulation unit included in each radiating element tends to be a plane wave, and the phase of the plane wave reaching each phase modulation unit is consistent. Based on this characteristic, circuit control (such as changing the current or voltage) of each phase modulation unit in the phased array antenna is specifically performed to achieve the purpose of calibrating the phase modulation corresponding to each radiating element.

[0044] The first circuit value can be understood as the circuit parameter value referenced when the current phase modulation unit is phase modulated. The first circuit value can be a current value or a voltage value. By adjusting and controlling the current or voltage of the phase modulation unit (such as a phase shifter), the purpose of phase modulation of one or more radiating units of the phased array can be achieved.

[0045] The far-field radiation is usually used to characterize the light intensity distribution in the far field of the phased array. In some embodiments, the far-field radiation is also called a far-field radiation image, a far-field radiation result, a far-field radiation diagram, etc. In practical applications, when the phased array is completed, the phase corresponding to each radiation unit containing a waveguide layer can usually be controlled (such as phase calibration) by changing the circuit parameters of the phase modulation unit (such as a phase shifter). The light beam output phase of each radiation unit is difficult to measure directly, while the far-field radiation corresponding to the phased array is easy to obtain. Therefore, in the embodiment of the present application, the radiation intensity of the far-field radiation at the desired angle can be obtained to realize the phase calibration process of the phased array.

[0046] Among them, the far-field radiation can also be called a far-field radiation pattern. The far-field radiation pattern usually includes a main light spot and a number of regularly arranged secondary light spots. After phase modulation, the direction of the main light spot relative to the phased array can usually be changed. In an embodiment of the present application, the desired angle refers to a reference angle value or an expected angle value for the main light spot. The desired angle can be selected from any one within the field of view. When the phase-modulation unit is not calibrated when the phase-modulation unit starts working, the phase of the light beam emitted by the radiation unit is usually chaotic, and it is difficult to determine the direction or angle of the main light spot from the far-field radiation. Therefore, in practical applications, a desired main light spot direction or angle of the main light spot, that is, the expected angle, can be determined, and the phase of the phased array can be adjusted based on the expected angle, and then the actual angle of the main light spot can be optimized so that the main light spot appears at the expected angle. In some embodiments, the expected angle can usually be selected as 0° facing straight ahead.

[0047] Furthermore, the desired angle is usually a preset reference angle used to quantitatively evaluate the far-field radiation. In practical applications, the radiation intensity at the desired angle corresponding to the beam deflection angle of the far-field radiation can be obtained to achieve the phase calibration process of the phased array.

[0048] The radiation intensity may be understood as a parameter characterizing the far-field radiation of the phased array, and the specific parameter type of the radiation intensity may be determined according to a specific implementation environment.

[0049] In practical applications, factors such as rough sidewalls, non-uniform waveguides, and coupling between adjacent waveguides in phased arrays can cause phase errors, resulting in uneven phases between the output units, ultimately changing the radiation angle of the phased array or reducing the quality of the radiated beam. That is, without adding a phase difference, the beam deflection angle corresponding to the far-field radiation of the phased array is not at the desired angle, or the energy of the main lobe at the desired angle accounts for a lower proportion of the total radiation energy. Therefore, in this case, it is only necessary to execute the phase adjustment method based on the phased array described in the embodiment of the present application without adding an additional phase difference, adjust the main lobe radiation angle of the phased array back to the desired angle, and maximize the ratio of the main lobe energy to the total energy near the desired angle, or maximize the radiation intensity value near the desired angle.

[0050] Specifically, the phased array includes at least one phase modulation unit. Phase modulation of the phased array is essentially the control of circuit parameters of each phase modulation unit. Typically, the phase modulation process is performed sequentially from the first phase modulation unit corresponding to the phased array to the last phase modulation unit. For example, during each adjustment process from the first phase modulation unit corresponding to the phased array to the last phase modulation unit, the voltage or current value on the waveguide layer of the phase modulation unit is fine-tuned. In the at least one phase modulation unit included, the phased array can obtain at least three first circuit values corresponding to the current phase modulation unit, and then perform circuit control on the current phase modulation unit based on each of the first circuit values. For example, the circuit parameters of the current phase modulation unit are adjusted using the first circuit values as a reference (e.g., adjusting the circuit parameters of the current phase modulation unit to the first circuit values). During each adjustment of the current phase modulation unit according to each of the first circuit values, the radiation intensity of the far-field radiation of the phased array at a desired angle (e.g., zero degrees) is obtained during each adjustment.

[0051] In a feasible implementation, in "obtaining at least three first circuit values corresponding to the current phase modulation unit", the number of the first circuit values is at least three. In a specific implementation environment, the number of the first circuit values may be greater than 3, such as 5, 7, and so on. It should be noted that the specific number of the first circuit values may be determined based on the actual implementation environment and is not specifically limited here.

[0052] In a feasible embodiment, the radiation intensity may be the ratio of the light intensity radiation (i.e., the radiation intensity value) of the far-field radiation of the phased array at a desired angle to the total light intensity radiation (i.e., the total radiation intensity value). For example, it may be achieved by converting and calculating the grayscale value of the spot of the far-field radiation of the phased array. In this case, the radiation intensity may be expressed as:

[0053]

[0054] R(i,θ) represents the ratio of the far-field radiation intensity at angle θ to the total far-field radiation intensity (intensity ratio) when current i is applied, and θ0 is the desired angle. In this case, it is usually necessary to perform an integral operation on the far-field intensity corresponding to the far-field radiation.

[0055] In a feasible implementation, the radiation intensity may also be the light intensity radiation (i.e., the radiation intensity value) at a desired angle when the far-field radiation of the phased array is at a desired angle. In this case, the radiation intensity may be expressed as:

[0056] R(i,θ)=P(i,θ0)

[0057] Among them, as a preference, the radiation intensity can be the far-field radiation of the phased array as the light intensity radiation at a desired angle (i.e., the radiation intensity value). At this time, there is no need to involve the integration operation of the far-field intensity corresponding to the entire far-field radiation, which can reduce the amount of calculation in the phase calibration process to a certain extent and improve the calculation speed.

[0058] In a specific implementation scenario, the phased array obtains three first circuit values corresponding to the current phase-modulation unit, and obtains the radiation intensity of the far-field radiation at a desired angle based on each of the first circuit values. The process of determining each of the first circuit values may be as follows: the current phase-modulation unit of the phased array usually corresponds to an initial operating circuit value X (which may be simply referred to as the initial circuit value), such as obtaining the initial voltage V0 or initial current i0 of the current phase-modulation unit; a circuit bias value ΔX (such as ΔV or Δi) may be pre-set, and X0, X1, and X2 may be determined based on the circuit bias value ΔX. For the sake of convenience in description, the first circuit value is interpreted as a voltage-type parameter as follows:

[0059] The phased array obtains an initial voltage V0 and a circuit bias value ΔV corresponding to the current phase modulation unit. Based on the circuit bias value ΔV, V0=V0, V1=V0+ΔV, and V2=V0+2ΔV. Then, based on the first circuit values V0, V1, and V2, the voltage parameters of the current phase modulation unit are adjusted (e.g., the circuit parameters of the current phase modulation unit are adjusted to the first circuit values). During each adjustment of the current phase modulation unit according to the first circuit values, the radiation intensity of the far-field radiation of the phased array at a desired angle (e.g., zero degrees) is obtained during each adjustment. For example, the radiation intensity R0 of the far-field radiation at the desired angle (e.g., zero degrees) corresponding to the first circuit value V0 is obtained, the radiation intensity R1 of the far-field radiation at the desired angle (e.g., zero degrees) corresponding to the second circuit value V1 is obtained, and the radiation intensity R2 of the far-field radiation at the desired angle (e.g., zero degrees) corresponding to the third circuit value V2 is obtained.

[0060] In some embodiments, the at least three first circuit values corresponding to the current phase modulation unit acquired by the phased array may be in an increasing or decreasing relationship in value, such as V0>V1>V2, which is not specifically limited.

[0061] Step S102: determining the first-order difference value and the second-order difference value corresponding to each of the radiation intensities.

[0062] Specifically, after the phased array obtains the radiation intensity of the far-field radiation at the desired angle based on each of the first circuit values, the phased array then calculates the first-order differential value and the second-order differential value corresponding to each of the radiation intensities based on the set differential calculation method.

[0063] The calculation method of the first-order difference value D1 is as follows:

[0064] D1=R x+1 -R x

[0065] Where x is an integer.

[0066] For example, taking the above-mentioned radiation intensity R0, radiation intensity R1, and radiation intensity R2 as an example, the first-order difference value corresponding to each of the radiation intensities may be D1 = R1 - R0, or may be: D1 = R2 - R1.

[0067] In a feasible implementation, when there are multiple first circuit values, the number of corresponding radiation intensities obtained is related to the number of first circuit values. At this time, the phased array can select any two adjacent radiation intensities from each of the radiation intensities (which can be understood as the radiation intensities corresponding to adjacent time steps during two circuit parameter adjustments) and use the above calculation method to calculate the first-order difference value.

[0068] The second-order difference value D2 is calculated as follows:

[0069] D2=R x+2 -2R x+1 +R x

[0070] Where x is an integer.

[0071] For example, taking the above-mentioned radiation intensity R0, radiation intensity R1, and radiation intensity R2 as an example, the second-order difference value corresponding to each of the radiation intensities may be D2=R2+R0-2R1.

[0072] In a feasible embodiment, when the number of first circuit values is multiple, the number of corresponding radiation intensities obtained is related to the number of first circuit values. At this time, the phased array can randomly select three adjacent radiation intensities from each of the radiation intensities (which can be understood as the radiation intensities corresponding to adjacent time steps when the circuit parameters are adjusted three times), and use the above calculation method to calculate the second-order difference value.

[0073] In practical applications, the phased array can select a radiation intensity from multiple radiation intensities as a calculation reference point, and further calculate the first-order difference value and the second-order difference value based on the calculation reference point, such as: radiation intensity R0, radiation intensity R1, radiation intensity R2, radiation intensity R3, and radiation intensity R4. The phased array can determine the radiation intensity R2 as the calculation reference, and then take the radiation intensity R1 and radiation intensity R2 to calculate the first-order difference value, that is, the first-order difference value is: R2-R1, and take the radiation intensity R1, radiation intensity R2, and radiation intensity R3 to calculate the second-order difference value, that is, the second-order difference value is: R3-2R2+R1.

[0074] Step S103: performing phase calibration on the current phase modulation unit according to the first-order difference value and the second-order difference value, obtaining a next phase modulation unit, determining the next phase modulation unit as the current phase modulation unit, and executing the step of obtaining at least three first circuit values corresponding to the current phase modulation unit.

[0075] Specifically, after calculating the first-order difference value and the second-order difference value, the phased array further determines an adjustment circuit value corresponding to phase calibration of the current phase modulation unit based on the values of the first-order difference value and the second-order difference value. This adjustment circuit value is used to control circuit parameters of a phase shifter corresponding to the current phase modulation unit, such as increasing or decreasing the voltage or current of the current phase modulation unit, by changing the beam output phase of the current phase modulation unit. That is, based on the first-order differential value and the second-order differential value, each first circuit value after optimization of the current circuit parameter (voltage or current) can be determined, and then the circuit parameters of the phase shifter corresponding to the current phase adjustment unit are controlled, that is, the phase shifter is controlled to operate at each first circuit value respectively, so that in the process of operating at each first circuit value, the step of obtaining the radiation intensity of the far-field radiation at the desired angle based on each first circuit value is performed, thereby obtaining the radiation intensity of the far-field radiation at the desired angle corresponding to each time the first circuit value operates.

[0076] Specifically, when the radiation intensity of the far-field radiation at the desired angle satisfies the phase calibration condition, the phase calibration of the current phase modulation unit is completed, and the next phase modulation unit is acquired. The next phase modulation unit is determined as the current phase modulation unit, and the step of acquiring at least three first circuit values corresponding to the current phase modulation unit is performed. This process of calibrating each phase modulation unit included in the phased array is completed.

[0077] In a feasible embodiment, the phase calibration condition may be: the radiation intensity of the far-field radiation corresponding to the current phase modulation unit at the desired angle no longer changes, or the change in the radiation intensity compared with the historical radiation intensity of the current phase modulation unit is less than a set threshold; the phase calibration condition may be: the first-order difference value calculated based on the radiation intensity of the far-field radiation corresponding to the current phase modulation unit at the desired angle no longer changes, or the change in the radiation intensity compared with the historical first-order difference value of the current phase modulation unit is less than a set threshold; the phase calibration condition may be: the second-order difference value calculated based on the radiation intensity of the far-field radiation corresponding to the current phase modulation unit at the desired angle no longer changes, or the change in the radiation intensity compared with the historical second-order difference value of the current phase modulation unit is less than a set threshold, and so on.

[0078] Optionally, after obtaining the radiation intensity of the far-field radiation at the desired angle by obtaining the first circuit values of the current phase modulation unit, the phased array first determines whether the radiation intensity of the far-field radiation at the desired angle meets the phase calibration condition. If so, it is determined that the phase calibration process of the current phase modulation unit is completed. At this time, the next phase modulation unit is obtained, the next phase modulation unit is determined as the current phase modulation unit, and the step of obtaining at least three first circuit values corresponding to the current phase modulation unit is executed; if not, it is determined that the phase calibration process of the current phase modulation unit is not completed, and the step of performing phase calibration on the current phase modulation unit according to the first-order difference value and the second-order difference value is executed until the process of calibrating each phase modulation unit included in the phased array is completed.

[0079] In the embodiment of the present application, first-order differential values and second-order differential values corresponding to the radiation intensity are calculated by using a differential calculation method. Based on the first-order differential values and the second-order differential values, continuous iterative adjustment of various circuit parameters (voltage or current) of the phase modulation unit can be achieved. Compared with the continuous iterative adjustment of various circuit parameters (voltage or current) of the phase modulation unit based on the first-order differential values and the second-order differential values in the related art, the amount of calculation in the phase calibration process can be further reduced, saving computing resources of the phased array.

[0080] Step S104: When there is no next phase adjustment unit, it is determined that the phase calibration of the phased array is completed.

[0081] Specifically, when there is no next phase modulation unit, the phased array has usually completed phase calibration of the last phase modulation unit among at least one phase modulation unit included therein. At this time, the phased array can determine that the phase calibration of the phased array is completed.

[0082] In an embodiment of the present application, a phased array obtains at least three first circuit values corresponding to a current phase modulation unit in at least one phase modulation unit included therein, obtains radiation intensity of far-field radiation at a desired angle based on each of the first circuit values, determines a first-order difference value and a second-order difference value corresponding to each of the radiation intensities, performs phase calibration on the current phase modulation unit based on the first-order difference value and the second-order difference value, obtains a next phase modulation unit, determines the next phase modulation unit as the current phase modulation unit, and executes the step of obtaining at least three first circuit values corresponding to the current phase modulation unit. When no next phase modulation unit exists, it is determined that the phase calibration of the phased array is completed. By using a differential calculation method to calculate the first-order differential value and the second-order differential value corresponding to the radiation intensity, continuous iterative adjustment of the circuit parameters (voltage or current) of the phase modulation unit can be achieved based on the first-order differential value and the second-order differential value, avoiding a large number of differential operations on each radiation intensity during the phase adjustment process, greatly reducing the amount of calculation during the phase calibration process; and only needing to obtain a minimum of three first circuit values corresponding to the current phase modulation unit as an iterative reference, avoiding the operation of too many circuit parameters (such as the first circuit value), thereby improving the calculation speed.

[0083] See Figure 2 , Figure 2 This is a flow chart of another embodiment of a phase calibration method for a phased array proposed in this application. Specifically:

[0084] Step S201: in at least one phase modulation unit, obtaining at least three first circuit values corresponding to the current phase modulation unit, and obtaining the radiation intensity of far-field radiation at a desired angle based on each of the first circuit values.

[0085] Please refer to step S101 for details, which will not be repeated here.

[0086] Step S202: When the radiation intensity does not match the historical radiation intensity, based on the correspondence between different first-order difference values and second-order difference values and different step length coefficients, determine the step length coefficient corresponding to the first-order difference value and the second-order difference value.

[0087] The historical radiation intensity can be understood as the radiation intensity of the far-field radiation of the current phase modulation unit at a desired angle at a historical moment. For example, the historical radiation intensity can be the radiation intensity of the far-field radiation at the desired angle corresponding to the last round of phase calibration of the current phase modulation unit.

[0088] Specifically, after obtaining the radiation intensity of the far-field radiation at the desired angle by obtaining the first circuit values of the current phase modulation unit, the phased array first determines whether the radiation intensity of the far-field radiation at the desired angle meets the phase calibration condition, specifically, whether the radiation intensity matches the historical radiation intensity.

[0089] In a specific embodiment, the phased array can calculate the absolute value of the difference between the radiation intensity and the historical radiation intensity. It can be understood that the phased array obtains the absolute value of the difference between the radiation intensity and the historical radiation intensity, that is, the absolute value of the intensity, and then specifically judges the size relationship between the absolute value of the intensity and a preset absolute threshold of intensity to determine whether the radiation intensity matches the historical radiation intensity.

[0090] The threshold value refers to a threshold value for a certain field, state, or system, also known as a critical value. In this embodiment, the absolute intensity value is used to measure a threshold value corresponding to the degree of deviation in the radiation intensity of the far-field radiation at a desired angle. It is understood that when the absolute intensity value is sufficiently small, or even less than or equal to the absolute intensity threshold, the phase calibration of the phased array for the current phase modulation unit can be considered to have reached a relatively optimal state. Continuing to perform phase calibration on the current phase modulation unit, if the radiation intensity of the phased array's far-field radiation at the desired angle does not change much, the radiation intensity can be considered to match the historical radiation intensity.

[0091] Furthermore, the intensity absolute threshold is an empirical value obtained by pre-collecting a large amount of sample data and performing mathematical analysis. In some embodiments, the intensity absolute threshold may be 0.

[0092] The specific judgment is as follows:

[0093] 1. When the absolute value of the intensity is less than or equal to the absolute intensity threshold, the phased array can determine that the radiation intensity matches the historical radiation intensity. At this time, it is considered that the phase calibration of the current phase modulation unit by the phased array has reached a relatively optimal state, and the phase calibration of the current phase modulation unit continues. The radiation intensity of the far-field radiation of the phased array at the desired angle does not change much, and the phased array can execute the step of the next phase modulation unit.

[0094] 2. When the absolute value of the intensity exceeds the absolute intensity threshold, the phased array may determine that the radiation intensity does not match the historical radiation intensity. Typically, the beam deflection angle corresponding to the phased array's far-field radiation is not at the desired angle, or the main lobe energy at the desired angle is low, resulting in a relatively weak radiation intensity. The phased array then needs to continue phase calibration of the current phase modulation unit, i.e., adjusting the at least three first circuit values based on the first-order difference value and the second-order difference value to obtain at least three second circuit values.

[0095] Specifically, when adjusting the at least three first circuit values according to the first-order differential value and the second-order differential value, the phased array can determine the step coefficient corresponding to the first-order differential value and the second-order differential value based on the correspondence between different first-order differential values and second-order differential values and different step coefficients.

[0096] The “different first-order difference values and second-order difference values and different step coefficients” may be in the form of a step coefficient set, in the form of a step coefficient table (such as a truth table), and so on.

[0097] The step coefficient is used to fine-tune the circuit parameter (ie, the first circuit value) currently controlled by the phase modulation unit, such as fine-tuning the voltage or current.

[0098] In a feasible embodiment, the phased array pre-stores different sets of first-order difference values and second-order difference values and different step coefficients. The sets can be obtained by pre-acquiring a large number of sample data containing first-order difference values and second-order difference values and different step coefficients in an actual application environment. By performing mathematical analysis on the sample data, the "sets of different first-order difference values and second-order difference values and different step coefficients" after optimization processing are obtained. When determining the step coefficient of the current phase modulation unit, the phased array can determine the commonly corresponding step coefficient in the set based on the currently determined first-order difference value and second-order difference value.

[0099] In a feasible implementation, the phased array pre-stores a step coefficient table, which is a coefficient truth table. The appropriate step coefficient is comprehensively determined by judging the positive and negative values of the first-order difference value and the second-order difference value. A coefficient truth table is as follows.

[0100] D1>0 D2>0 n TRUE TRUE 2 TRUE FALSE 1 FALSE TRUE -2 FALSE FALSE -1

[0101] Among them, D1 is the first-order difference, D2 is the second-order difference, and n is the step coefficient. Furthermore, when the first-order difference value is greater than 0, the "first-order difference value" in the truth table should be "TRUE", otherwise it should be "FALSE"; when the second-order difference value is greater than 0, the "second-order difference value" in the truth table should be "TRUE", otherwise it should be "FALSE";

[0102] Specifically, the phased array can determine the corresponding step coefficient n in the above coefficient truth table based on the currently determined first-order differential value and second-order differential value, and thus determine the target step size for adjusting the first circuit value based on the step coefficient n.

[0103] Step S203: determining the product of the step coefficient and the preset reference circuit parameter as a target step, and adjusting the at least three first circuit values based on the target step to obtain at least three adjusted second circuit values.

[0104] The preset reference circuit parameters can be understood as reference parameter change steps when controlling circuit parameters of the current phase modulation unit, such as reference voltage change step ΔV and reference current change step Δi.

[0105] Specifically, the phased array can determine the target step size based on the step size coefficient and the preset reference circuit parameters. The function expression of the target step size d is as follows:

[0106] d=n*△x

[0107] Wherein, n is the step coefficient, △x is a preset reference circuit parameter, which can be the reference voltage change step △V or the reference current change step △i.

[0108] Specifically, the phased array determines the target step size based on the step size coefficient and preset reference circuit parameters, and then adjusts at least three first circuit values corresponding to the current phase modulation unit to obtain at least three adjusted second circuit values.

[0109] For example, the number of first circuit values is 3. The three first circuit values corresponding to the current phase modulation unit are V0, V1, and V2. After the phased array determines the target step size d based on the step size coefficient n and the preset reference circuit parameter △x, the three first circuit values are added to d respectively to obtain at least three adjusted second circuit values, where the second circuit values are V0=V0+d, V1=V1+d, and V2=V2+d.

[0110] For another example, the number of first circuit values is 3. The three first circuit values corresponding to the current phase modulation unit are V0, V1, and V2, respectively. After the phased array determines the target step size d based on the step size coefficient n and the preset reference circuit parameter △x, the three first circuit values are multiplied by d respectively to obtain at least three adjusted second circuit values, where the second circuit values V0 = V0*d, V1 = V1*d, and V2 = V2*d.

[0111] Among them, the phased array "determines the product of the step coefficient and the preset reference circuit parameters as the target step length, and adjusts the at least three first circuit values based on the target step length". In the actual adjustment process, each time the circuit parameters (such as the first circuit value) of the current phase adjustment unit are iterated, each first circuit value is usually at least three equidistant first circuit values. When calculating the first-order differential value and the second-order differential value, the situation where the first-order differential value and / or the second-order differential value is 0 can be avoided. Therefore, a suitable target step length can be determined based on the positive and negative values of the first-order differential value and the second-order differential value, thereby improving the stability and comprehensiveness of the phase calibration process.

[0112] Step S204: taking the radiation intensity as the historical radiation intensity, taking the second circuit value as the first circuit value, and executing the step of acquiring the radiation intensity of far-field radiation at a desired angle based on each of the first circuit values.

[0113] Specifically, after obtaining at least three adjusted second circuit values, the phased array then updates the current historical radiation intensity, that is, updates the historical radiation intensity based on the radiation intensity of this round, uses the radiation intensity as the historical radiation intensity, and uses the second circuit value as the first circuit value and performs the step of obtaining the radiation intensity of the far-field radiation at the desired angle based on each first circuit value.

[0114] Step S205: When the radiation intensity matches the historical radiation intensity, a next phase modulation unit is acquired.

[0115] In a specific embodiment, the phased array can calculate the absolute value of the difference between the radiation intensity and the historical radiation intensity. When the absolute value of the intensity is less than or equal to the absolute intensity threshold, the phased array can determine that the radiation intensity matches the historical radiation intensity. At this time, it is considered that the phase calibration of the current phase modulation unit by the phased array has reached a relatively optimal state, and the phase calibration of the current phase modulation unit continues. The radiation intensity of the far-field radiation of the phased array at the expected angle does not change much, and the phased array can execute the steps of the next phase modulation unit.

[0116] In a specific implementation scenario, during an actual optimization process, in at least one phase modulation unit included in the phased array, the phase calibration method based on the phased array described in the embodiment of the present application is performed on the current phase modulation unit. During the phase modulation process of the current phase modulation unit, as shown in FIG. Figure 3 As shown, Figure 3 This is a schematic diagram of the far-field radiation of the phased array before phase calibration. Figure 3 There are multiple frames of unoptimized scanning spots, Figure 3It can be clearly seen that the radiation performance of the phased array's far-field radiation is poor, there are more side spot signals, the interference to the main spot signal is greater, and the far-field radiation is weak; after the phase of the current phase modulation unit is calibrated, as shown in the figure, Figure 4 As shown, Figure 4 This is a schematic diagram of the far-field radiation scene after phase calibration. From the figure, it can be seen that the radiation performance corresponding to the far-field radiation of the phased array is significantly improved at this time, with fewer side spot signals and less interference from the side spot signals on the main spot signal. At this time, the radiation performance corresponding to the far-field radiation of the phased array is significantly improved.

[0117] Step S206: determining the next phase modulation unit as the current phase modulation unit and executing the step of obtaining at least three first circuit values corresponding to the current phase modulation unit.

[0118] Please refer to step S103 for details, which will not be repeated here.

[0119] Step S207: When there is no next phase adjustment unit, it is determined that the phase calibration of the phased array is completed.

[0120] Please refer to step S104 for details, which will not be repeated here.

[0121] In a specific implementation scenario, during the phase optimization process for all phase modulation units included in the phased array, the phase calibration method based on the phased array described in the embodiment of the present application is sequentially performed on all phase modulation units. During the phase modulation process of the current phase modulation unit, as shown in FIG. Figure 5 As shown, Figure 5 is the far-field distribution diagram of the phased array at the initial phase of the phased array, Figure 5 It reflects the distribution of the main lobe and miscellaneous lobes of the far-field radiation of the phased array before phase calibration. Figure 5 It can be clearly seen that there are many slave peak (noise peak) signals distributed near the main peak signal of the far-field radiation before phase calibration. The more chaotic distribution of slave peak signals will affect the main peak signal, such as Figure 6 As shown, Figure 6 is the far-field distribution diagram of the phased array at the initial phase after normalization. Figure 6 is Figure 5 Based on the normalization of the waveform, the more chaotic distribution of the secondary peak signal will interfere with the main peak signal, which is convenient for observation and analysis. Figure 6 It can be seen that the radiation intensity between the chaotic slave peak signal and the main peak signal is within 3dB, which is bound to cause greater interference to the far-field distribution of the phased array, resulting in weak far-field radiation; by executing the phase calibration method based on the phased array embodiment of the present application, after completing the phase optimization of all the phase modulation units included in the phased array, as shown in FIG. Figure 7 As shown, Figure 7is the far-field distribution diagram of the phased array after phase calibration. Figure 7 It reflects the distribution of the main lobe and miscellaneous lobes of the far-field radiation of the phased array before phase calibration. Figure 7 It can be clearly seen that after the phase calibration is completed, the radiation intensity of the main peak signal changes from Figure 5 The 300dB in the image is calibrated to 2500dB, which greatly optimizes the radiation intensity of the phased array far field distribution. Figure 8 As shown, Figure 8 is the far-field distribution diagram of the phased array after normalization and phase calibration. Figure 8 is Figure 7 Based on this, the waveform is normalized to further amplify the distribution of the slave peak signal and the main peak signal, which facilitates observation and analysis. At this time, it can be seen that the radiation performance corresponding to the far-field radiation of the phased array is significantly improved, the side spot signal interference is less, the radiation intensity between the slave peak signal and the main peak signal is about 10db, and the interference degree of the slave peak signal on the main peak signal is relatively small. At this time, the radiation performance corresponding to the far-field radiation of the phased array is significantly improved.

[0122] In an embodiment of the present application, a phased array obtains at least three first circuit values corresponding to a current phase modulation unit in at least one phase modulation unit included therein, obtains radiation intensity of far-field radiation at a desired angle based on each of the first circuit values, determines a first-order difference value and a second-order difference value corresponding to each of the radiation intensities, performs phase calibration on the current phase modulation unit based on the first-order difference value and the second-order difference value, obtains a next phase modulation unit, determines the next phase modulation unit as the current phase modulation unit, and executes the step of obtaining at least three first circuit values corresponding to the current phase modulation unit. When no next phase modulation unit exists, it is determined that the phase calibration of the phased array is completed. By using a differential calculation method to calculate the first-order differential value and the second-order differential value corresponding to the radiation intensity, continuous iterative adjustment of the circuit parameters (voltage or current) of the phase modulation unit can be achieved based on the first-order differential value and the second-order differential value, avoiding a large number of differential operations on each radiation intensity during the phase adjustment process, greatly reducing the amount of calculation during the phase calibration process; and only needing to obtain a minimum of three first circuit values corresponding to the current phase modulation unit as an iterative reference, avoiding the operation of too many circuit parameters (such as the first circuit value), thereby improving the calculation speed.

[0123] See Figure 9 , Figure 9 This is a flow chart of another embodiment of a phase calibration method for a phased array proposed in this application. Specifically:

[0124] Step S301: in at least one phase modulation unit, obtaining at least three first circuit values corresponding to the current phase modulation unit, and obtaining the radiation intensity of far-field radiation at a desired angle based on each of the first circuit values.

[0125] Please refer to step S101 for details, which will not be repeated here.

[0126] Step S302: determining the first-order difference value and the second-order difference value corresponding to each of the radiation intensities.

[0127] Please refer to step S102 for details, which will not be repeated here.

[0128] Step S303: Based on the correspondence between different first-order difference values and second-order difference values and different step length coefficients, determine the step length coefficient corresponding to the first-order difference value and the second-order difference value.

[0129] For details, please refer to step S202, which will not be repeated here.

[0130] Step S304: Determine whether the first-order difference value and / or the second-order difference value meets a preset step size correction condition, and obtain a correction value corresponding to the step size coefficient.

[0131] According to some embodiments, by determining the step coefficient corresponding to the first-order difference value and the second-order difference value, determining the target step size based on the step coefficient, and adjusting at least three first circuit values in the current phase modulation unit based on the target step size, in the above process, the target step size for adjusting the first circuit value determines, to a certain extent, the accuracy or speed of phase calibration or phase optimization of the current phase modulation unit. In practical applications, the numerical values of the first-order difference value and / or the second-order difference value determine the degree of deviation or deviation of the radiation intensity of the far-field radiation at the desired angle. It can be understood that the first-order difference value and / or the second-order difference value determine the degree of deviation or deviation of the radiation intensity of the far-field radiation at the desired angle. The absolute value of the differential value and / or the second-order differential value, the larger the absolute value, the higher the degree of deviation or bias. In order to achieve rapid convergence of the first-order differential value and the second-order differential value during the current phase calibration or phase optimization process, and further improve the accuracy or speed of phase calibration or phase optimization, in an embodiment of the present application, the step coefficient can be further corrected based on the absolute value of the first-order differential value and / or the second-order differential value, so that when the degree of deviation or bias of the radiation intensity is included in the phase calibration reference, a suitable step coefficient can be determined.

[0132] Specifically, the phased array is pre-set with corresponding differential thresholds for the first absolute value corresponding to the first-order differential value and the second absolute value corresponding to the second-order differential value. The differential threshold is used to measure the degree of deviation or disparity of the radiation intensity of the far-field radiation at the desired angle. It can be understood that when the first absolute value corresponding to the first-order differential value is less than or equal to the corresponding differential threshold, there is no need to correct the step coefficient; when the first absolute value corresponding to the first-order differential value is greater than the corresponding differential threshold, the step coefficient needs to be corrected.

[0133] The following detailed explanation is given by taking the differential threshold corresponding to the first absolute value as the first differential threshold and the differential threshold corresponding to the second absolute value as the second differential threshold.

[0134] 1. When the first absolute value corresponding to the first-order difference value is greater than a preset first difference threshold, the phased array can determine that a preset step size correction condition is met, thereby obtaining a correction value corresponding to the step size coefficient; when the first absolute value corresponding to the first-order difference value is less than or equal to the preset first difference threshold, the phased array can determine that the preset step size correction condition is not met, and in this case, no correction processing is required for the step size coefficient;

[0135] 2. When the second absolute value corresponding to the second-order difference value is greater than a preset second difference threshold, the phased array can determine that a preset step size correction condition is satisfied, thereby obtaining a correction value corresponding to the step size coefficient; when the second absolute value corresponding to the second-order difference value is less than or equal to the preset second difference threshold, the phased array can determine that the preset step size correction condition is not satisfied, and in this case, no correction processing of the step size coefficient is required;

[0136] 3. When the first absolute value corresponding to the first-order difference value is greater than a preset first difference threshold, and the second absolute value corresponding to the second-order difference value is greater than a preset second difference threshold, the phased array can determine that a preset step size correction condition is satisfied, thereby obtaining a correction value corresponding to the step size coefficient. Conversely, when the first absolute value corresponding to the first-order difference value is less than or equal to the preset first difference threshold, and / or the second absolute value corresponding to the second-order difference value is less than or equal to the preset second difference threshold, the phased array can determine that the preset step size correction condition is not satisfied, and in this case, there is no need to correct the step size coefficient.

[0137] One way to obtain the correction value corresponding to the step coefficient may be that the phased array is provided with corresponding correction values for different step coefficients, and the correction values corresponding to different step coefficients may be the same or different.

[0138] For example, a phased array may have a pre-stored step coefficient table. This table is a coefficient truth table that comprehensively determines the appropriate step coefficient and the correction value when the step correction conditions are met by judging the positive and negative values of the first-order difference value and the second-order difference value. A coefficient truth table is shown below.

[0139] D1>0 D2>0 n z TRUE TRUE 2 a TRUE FALSE 1 b FALSE TRUE -2 c FALSE FALSE -1 d

[0140] Among them, D1 is the first-order difference, D2 is the second-order difference, n is the step coefficient, and z is the correction value corresponding to the step coefficient when the correction condition is met. The correction value corresponding to the step coefficient can be obtained based on the above coefficient truth table. It can be understood that the correction value a, correction value b, correction value c, and correction value d corresponding to each step coefficient can be the same or different. The specific numbers are determined based on the actual application environment and are not specifically limited here.

[0141] One way to obtain the correction value corresponding to the step coefficient may be that the phased array is provided with parameter ranges for different step coefficients, and the phased array can determine the target parameter range within which the first-order difference D1 falls when the correction condition is met, and then obtain the correction value corresponding to the target parameter range; or the target parameter range within which the second-order difference D2 falls, and then obtain the correction value corresponding to the target parameter range; when the correction value z1 corresponding to the first-order difference D1 and the correction value z2 corresponding to the second-order difference D2 are obtained, the correction value z1 and the correction value z2 can be fitted to determine a comprehensive correction value as the correction value corresponding to the obtained step coefficient, wherein the fitting method includes but is not limited to taking the average of the correction value z1 and the correction value z2, taking the maximum value (or minimum value) of the correction value z1 and the correction value z2, and the like.

[0142] One way to obtain the correction value corresponding to the step coefficient may be that the phased array is provided with differential reference values for different step coefficients. When the correction condition is met, the phased array can obtain the quotient of the differential value (first-order or second-order differential value) and the differential reference value, and use the quotient as the correction value corresponding to the step coefficient. When the first-order difference D1 corresponds to the quotient s1, and the second-order difference D2 corresponds to the quotient s2, the quotient s1 and the quotient s2 can be fitted to determine a comprehensive correction value as the correction value corresponding to the obtained step coefficient. The fitting method includes but is not limited to taking the average of the quotient s1 and the quotient s2, taking the maximum value (or minimum value) of the quotient s1 and the quotient s2, and the like.

[0143] Step S305: Correcting the step length coefficient based on the correction value to obtain the corrected step length coefficient.

[0144] Specifically, after obtaining the correction value corresponding to the step coefficient, the phased array may perform correction processing on the step coefficient based on the correction value, and then obtain the corrected step coefficient.

[0145] One correction processing method may be: after the phased array obtains the correction value corresponding to the step coefficient, it calculates the product of the correction value and the step coefficient, and uses the product as the corrected step coefficient, thereby completing the correction processing of the step coefficient.

[0146] One correction processing method may be: after the phased array obtains the correction value corresponding to the step coefficient, it sums the correction value and the step coefficient, and uses the sum as the step coefficient after the correction processing, thereby completing the correction processing of the step coefficient.

[0147] One correction processing method may be: after the phased array obtains the correction value corresponding to the step length coefficient, it updates the step length coefficient to the correction value, thereby obtaining the corrected step length coefficient.

[0148] Step S306: determining the product of the step coefficient and the preset reference circuit parameter as a target step, and adjusting the at least three first circuit values based on the target step to obtain at least three adjusted second circuit values.

[0149] Please refer to step S203 for details, which will not be repeated here.

[0150] Step S307: taking the radiation intensity as the historical radiation intensity, taking the second circuit value as the first circuit value, and executing the step of acquiring the radiation intensity of far-field radiation at a desired angle based on each of the first circuit values.

[0151] For details, please refer to step S204, which will not be repeated here.

[0152] Step S308: When the radiation intensity matches the historical radiation intensity, a next phase modulation unit is obtained, the next phase modulation unit is determined as the current phase modulation unit, and the step of obtaining at least three first circuit values corresponding to the current phase modulation unit is performed.

[0153] For details, please refer to steps S205-S206, which will not be repeated here.

[0154] Step S309: When there is no next phase adjustment unit, it is determined that the phase calibration of the phased array is completed.

[0155] Please refer to step S104 for details, which will not be repeated here.

[0156] In a feasible embodiment, after performing a round of phase calibration on all phase modulation units included in the phased array, and completing the round of phase calibration, the phased array may further perform multiple rounds of optimization on all phase modulation units included therein based on the round of phase calibration, specifically executing steps S301 to S309. During the execution, preset reference circuit parameters may be adjusted, such as by reducing the preset reference circuit parameters to a certain set value. It is understandable that during each round of phase calibration on all phase modulation units included in the phased array, the optimized reference circuit parameters in each round may be different, such as gradually decreasing in a decreasing trend, thereby achieving a better phase calibration effect.

[0157] In an embodiment of the present application, a phased array obtains at least three first circuit values corresponding to a current phase modulation unit in at least one phase modulation unit included therein, obtains radiation intensity of far-field radiation at a desired angle based on each of the first circuit values, determines a first-order difference value and a second-order difference value corresponding to each of the radiation intensities, performs phase calibration on the current phase modulation unit based on the first-order difference value and the second-order difference value, obtains a next phase modulation unit, determines the next phase modulation unit as the current phase modulation unit, and executes the step of obtaining at least three first circuit values corresponding to the current phase modulation unit. When no next phase modulation unit exists, it is determined that the phase calibration of the phased array is completed. By using a differential calculation method to calculate the first-order differential value and the second-order differential value corresponding to the radiation intensity, continuous iterative adjustment of the circuit parameters (voltage or current) of the phase modulation unit can be achieved based on the first-order differential value and the second-order differential value, avoiding a large number of differential operations on each radiation intensity during the phase adjustment process, greatly reducing the amount of calculation during the phase calibration process; and only needing to obtain a minimum of three first circuit values corresponding to the current phase modulation unit as an iterative reference, avoiding the operation of too many circuit parameters (such as the first circuit value), thereby improving the calculation speed.

[0158] The following are device embodiments of the present application, which can be used to implement the method embodiments of the present application. For details not disclosed in the device embodiments of the present application, please refer to the method embodiments of the present application.

[0159] See Figure 10 , which shows a schematic diagram of the structure of a phased array phase calibration device provided by an exemplary embodiment of the present application. The phased array phase calibration device can be implemented as all or part of a device through software, hardware, or a combination of both. The device 1 includes a radiation intensity acquisition module 11, a differential value determination module 12, and a phase calibration module 13.

[0160] The radiation intensity acquisition module 11 is configured to acquire at least three first circuit values corresponding to the current phase modulation unit in at least one phase modulation unit included therein, and acquire the radiation intensity of the far-field radiation at a desired angle based on each of the first circuit values;

[0161] A difference value determination module 12 is used to determine a first-order difference value and a second-order difference value corresponding to each of the radiation intensities;

[0162] a phase calibration module 13, configured to perform phase calibration on the current phase modulation unit according to the first-order difference value and the second-order difference value, obtain a next phase modulation unit, determine the next phase modulation unit as the current phase modulation unit, and execute the step of obtaining at least three first circuit values corresponding to the current phase modulation unit;

[0163] The phase calibration module 13 is further configured to determine that the phase calibration of the phased array is completed when there is no next phase modulation unit.

[0164] Optionally, the difference value determination module 12 is specifically configured to:

[0165] When the radiation intensity does not match the historical radiation intensity, a differential calculation is performed on each radiation intensities to obtain a first-order differential value and a second-order differential value corresponding to each radiation intensity.

[0166] Optional, such as Figure 11 As shown, the difference value determination module 12 includes:

[0167] a circuit value adjusting unit 121, configured to adjust the at least three first circuit values according to the first-order difference value and the second-order difference value to obtain at least three second circuit values;

[0168] a radiation intensity acquiring unit 122, configured to use the radiation intensity as the historical radiation intensity, use the second circuit value as the first circuit value, and execute the step of acquiring the radiation intensity of far-field radiation at a desired angle based on each of the first circuit values;

[0169] The next phase adjustment acquisition unit 123 is configured to acquire the next phase adjustment unit when the radiation intensity matches the historical radiation intensity.

[0170] Optional, such as Figure 12 As shown, the circuit value adjustment unit 121 includes:

[0171] The step coefficient determination subunit 1211 is configured to determine the step coefficient corresponding to the first-order difference value and the second-order difference value based on the correspondence between different first-order difference values and second-order difference values and different step coefficients;

[0172] The circuit value adjustment subunit 1212 is configured to determine the product of the step coefficient and a preset reference circuit parameter as a target step size, and adjust the at least three first circuit values based on the target step size to obtain adjusted at least three second circuit values.

[0173] Optionally, the step coefficient determination subunit 121 is specifically configured to:

[0174] Determining whether the first-order difference value and / or the second-order difference value meets a preset step size correction condition, and obtaining a correction value corresponding to the step size coefficient;

[0175] The step length coefficient is corrected based on the coefficient correction value to obtain the corrected step length coefficient.

[0176] Optionally, the step coefficient determination subunit 121 is specifically configured to:

[0177] When the first absolute value corresponding to the first-order difference value is greater than a preset first difference threshold, it is determined that the preset step size correction condition is met; or,

[0178] When the second absolute value corresponding to the second-order difference value is greater than a preset second difference threshold, it is determined that the preset step size correction condition is met; or,

[0179] When the first absolute value corresponding to the first-order difference value is greater than a preset first difference threshold, and the second absolute value corresponding to the second-order difference value is greater than a preset second difference threshold, it is determined that the preset step size correction condition is met.

[0180] Optional, such as Figure 13 As shown, the device 1 further includes:

[0181] an intensity absolute value calculation module 14, configured to calculate an intensity absolute value of a difference between the radiation intensity and the historical radiation intensity;

[0182] a matching result determination module 15, configured to determine that the radiation intensity matches the historical radiation intensity when the absolute value of the intensity is less than or equal to the absolute intensity threshold;

[0183] The matching result determination module 15 is configured to determine that the radiation intensity does not match the historical radiation intensity when the absolute value of the intensity is greater than the absolute intensity threshold.

[0184] It should be noted that the phased array phase calibration device provided in the above embodiment, when performing the phased array phase calibration method, only uses the division of the above-mentioned functional modules as an example. In actual applications, the above-mentioned functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above. In addition, the phased array phase calibration device provided in the above embodiment and the phased array phase calibration method embodiment are based on the same concept. The implementation process is detailed in the method embodiment and will not be repeated here.

[0185] The serial numbers of the above embodiments of the present application are for description only and do not represent the advantages or disadvantages of the embodiments.

[0186] In an embodiment of the present application, a phased array obtains at least three first circuit values corresponding to a current phase modulation unit in at least one phase modulation unit included therein, obtains radiation intensity of far-field radiation at a desired angle based on each of the first circuit values, determines a first-order difference value and a second-order difference value corresponding to each of the radiation intensities, performs phase calibration on the current phase modulation unit based on the first-order difference value and the second-order difference value, obtains a next phase modulation unit, determines the next phase modulation unit as the current phase modulation unit, and executes the step of obtaining at least three first circuit values corresponding to the current phase modulation unit. When no next phase modulation unit exists, it is determined that the phase calibration of the phased array is completed. By using a differential calculation method to calculate the first-order differential value and the second-order differential value corresponding to the radiation intensity, continuous iterative adjustment of the circuit parameters (voltage or current) of the phase modulation unit can be achieved based on the first-order differential value and the second-order differential value, avoiding a large number of differential operations on each radiation intensity during the phase adjustment process, greatly reducing the amount of calculation during the phase calibration process; and only needing to obtain a minimum of three first circuit values corresponding to the current phase modulation unit as an iterative reference, avoiding the operation of too many circuit parameters (such as the first circuit value), thereby improving the calculation speed.

[0187] The present application also provides a computer storage medium that can store multiple instructions, which are suitable for being loaded and executed by a processor as described above. Figures 1-9 The phase calibration method of the phased array in the embodiment shown, the specific execution process can be found in Figures 1-9 The detailed description of the illustrated embodiment will not be repeated here.

[0188] The present application also provides a computer program product, which stores at least one instruction, and the at least one instruction is loaded and executed by the processor as described above. Figures 1-9 The phase calibration method of the phased array in the embodiment shown, the specific execution process can be found in Figures 1-9 The detailed description of the illustrated embodiment will not be repeated here.

[0189] See Figure 14 , is a schematic diagram of a phase calibration system 1000 based on a von Neumann system that runs the above-mentioned phase calibration method. Figure 14 As shown, the phase calibration system 1000 may include: at least one processor 1001 , at least one network interface 1004 , a user interface 1003 , a memory 1005 , and at least one communication bus 1002 .

[0190] The communication bus 1002 is used to implement the connection and communication between these components.

[0191] The user interface 1003 may include a display screen (Display) and a camera (Camera). Optionally, the user interface 1003 may also include a standard wired interface and a wireless interface.

[0192] The network interface 1004 may optionally include a standard wired interface or a wireless interface (such as a WI-FI interface).

[0193] The processor 1001 may include one or more processing cores. The processor 1001 utilizes various interfaces and circuits to connect various components within the server 1000. It executes instructions, programs, code sets, or instruction sets stored in the memory 1005, and accesses data stored in the memory 1005 to perform various server 1000 functions and process data. Optionally, the processor 1001 may be implemented using at least one of the following hardware forms: a digital signal processing (DSP), a field-programmable gate array (FPGA), or a programmable logic array (PLA). The processor 1001 may integrate one or a combination of a central processing unit (CPU), a graphics processing unit (GPU), and a modem. The CPU primarily processes the operating system, user interface, and application programs; the GPU is responsible for rendering and drawing content displayed on the display screen; and the modem handles wireless communications. It is understood that the modem may not be integrated into the processor 1001 and may be implemented as a separate chip.

[0194] Among them, the memory 1005 may include a random access memory (RAM) or a read-only memory (Read-Only Memory). Optionally, the memory 1005 includes a non-transitory computer-readable storage medium. The memory 1005 can be used to store instructions, programs, codes, code sets or instruction sets. The memory 1005 may include a program storage area and a data storage area, wherein the program storage area may store instructions for implementing an operating system, instructions for at least one function (such as a touch function, a sound playback function, an image playback function, etc.), instructions for implementing the above-mentioned various method embodiments, etc.; the data storage area may store data involved in the above-mentioned various method embodiments, etc. The memory 1005 may optionally be at least one storage device located away from the aforementioned processor 1001. As Figure 14 As shown, the memory 1005 as a computer storage medium may include an operating system, a network communication module, a user interface module, and a blockchain-based identity authentication application.

[0195] exist Figure 14 In the phase calibration system 1000 shown, the user interface 1003 is mainly used to provide an input interface for the user and obtain user input data; and the processor 1001 can be used to call the blockchain-based identity authentication application stored in the memory 1005 and specifically perform the following operations:

[0196] In at least one phase modulation unit included, obtaining at least three first circuit values corresponding to the current phase modulation unit, and obtaining the radiation intensity of the far-field radiation at a desired angle based on each of the first circuit values;

[0197] Determining first-order difference values and second-order difference values corresponding to each of the radiation intensities;

[0198] performing phase calibration on the current phase modulation unit according to the first-order difference value and the second-order difference value, obtaining a next phase modulation unit, determining the next phase modulation unit as the current phase modulation unit, and executing the step of obtaining at least three first circuit values corresponding to the current phase modulation unit;

[0199] When there is no next phase adjustment unit, it is determined that the phase calibration of the phased array is completed.

[0200] In one embodiment, when determining the first-order difference value and the second-order difference value corresponding to each radiation intensity, the processor 1001 specifically performs the following operations:

[0201] When the radiation intensity does not match the historical radiation intensity, a differential calculation is performed on each radiation intensities to obtain a first-order differential value and a second-order differential value corresponding to each radiation intensity.

[0202] In one embodiment, when the processor 1001 performs the phase calibration on the current phase modulation unit according to the first-order difference value and the second-order difference value and obtains the next phase modulation unit, the processor 1001 specifically performs the following operations:

[0203] Adjusting the at least three first circuit values according to the first-order difference value and the second-order difference value to obtain at least three second circuit values;

[0204] Taking the radiation intensity as the historical radiation intensity, taking the second circuit value as the first circuit value, and performing the step of obtaining the radiation intensity of far-field radiation at a desired angle based on each of the first circuit values;

[0205] When the radiation intensity matches the historical radiation intensity, the next phase modulation unit is acquired.

[0206] In one embodiment, when the processor 1001 performs the adjustment processing on the at least three first circuit values according to the first-order difference value and the second-order difference value to obtain at least three second circuit values, the processor 1001 specifically performs the following operations:

[0207] Determining a step coefficient corresponding to both the first-order difference value and the second-order difference value based on a correspondence between different first-order difference values and second-order difference values and different step coefficients;

[0208] The product of the step coefficient and a preset reference circuit parameter is determined as a target step length, and the at least three first circuit values are adjusted based on the target step length to obtain the adjusted at least three second circuit values.

[0209] In one embodiment, after determining the step size coefficient corresponding to the first-order difference value and the second-order difference value based on the correspondence between different first-order difference values and second-order difference values and different step size coefficients, the processor 1001 further performs the following operations:

[0210] Determining whether the first-order difference value and / or the second-order difference value meets a preset step size correction condition, and obtaining a correction value corresponding to the step size coefficient;

[0211] The step length coefficient is corrected based on the correction value to obtain the corrected step length coefficient.

[0212] In one embodiment, when the processor 1001 determines whether the first-order difference value and / or the second-order difference value satisfies a preset step size correction condition, the processor 1001 specifically performs the following operations:

[0213] When the first absolute value corresponding to the first-order difference value is greater than a preset first difference threshold, it is determined that the preset step size correction condition is met; or,

[0214] When the second absolute value corresponding to the second-order difference value is greater than a preset second difference threshold, it is determined that the preset step size correction condition is met; or,

[0215] When the first absolute value corresponding to the first-order difference value is greater than a preset first difference threshold, and the second absolute value corresponding to the second-order difference value is greater than a preset second difference threshold, it is determined that the preset step size correction condition is met.

[0216] In one embodiment, when executing the phased array-based phase calibration method, the processor 1001 specifically performs the following steps:

[0217] Calculating an absolute value of the difference between the radiation intensity and the historical radiation intensity;

[0218] When the absolute value of the intensity is less than or equal to the absolute intensity threshold, determining that the radiation intensity matches the historical radiation intensity;

[0219] When the intensity absolute value is greater than the intensity absolute threshold, it is determined that the radiation intensity does not match the historical radiation intensity.

[0220] In an embodiment of the present application, a phased array obtains at least three first circuit values corresponding to a current phase modulation unit in at least one phase modulation unit included therein, obtains radiation intensity of far-field radiation at a desired angle based on each of the first circuit values, determines a first-order difference value and a second-order difference value corresponding to each of the radiation intensities, performs phase calibration on the current phase modulation unit based on the first-order difference value and the second-order difference value, obtains a next phase modulation unit, determines the next phase modulation unit as the current phase modulation unit, and executes the step of obtaining at least three first circuit values corresponding to the current phase modulation unit. When no next phase modulation unit exists, it is determined that the phase calibration of the phased array is completed. By using a differential calculation method to calculate the first-order differential value and the second-order differential value corresponding to the radiation intensity, continuous iterative adjustment of the circuit parameters (voltage or current) of the phase modulation unit can be achieved based on the first-order differential value and the second-order differential value, avoiding a large number of differential operations on each radiation intensity during the phase adjustment process, greatly reducing the amount of calculation during the phase calibration process; and only needing to obtain a minimum of three first circuit values corresponding to the current phase modulation unit as an iterative reference, avoiding the operation of too many circuit parameters (such as the first circuit value), thereby improving the calculation speed.

[0221] Those skilled in the art will clearly understand that the technical solution of the present application can be implemented with the help of software and / or hardware. "Unit" and "module" in this specification refer to software and / or hardware that can independently complete or cooperate with other components to complete specific functions, where the hardware can be, for example, a field programmable gate array (FPGA), an integrated circuit (IC), etc.

[0222] It should be noted that for the aforementioned method embodiments, for the sake of simplicity, they are all expressed as a series of action combinations, but those skilled in the art should be aware that this application is not limited by the order of the actions described, because according to this application, certain steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily required by this application.

[0223] In the above embodiments, the description of each embodiment has its own focus. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0224] In the several embodiments provided in this application, it should be understood that the disclosed devices can be implemented in other ways. For example, the device embodiments described above are merely schematic. For example, the division of the units is merely a logical function division. In actual implementation, there may be other division methods, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some service interface, and the indirect coupling or communication connection of the device or unit can be electrical or other forms.

[0225] The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected to achieve the purpose of this embodiment according to actual needs.

[0226] In addition, the functional units in the various embodiments of the present application may be integrated into a single processing unit, or each unit may exist physically separately, or two or more units may be integrated into a single unit. The aforementioned integrated units may be implemented in the form of hardware or software functional units.

[0227] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable memory. Based on this understanding, the technical solution of the present application is essentially or the part that contributes to the prior art or all or part of the technical solution can be embodied in the form of a software product, and the computer software product is stored in a memory, including a number of instructions for enabling a computer device (which can be a personal computer, server or network device, etc.) to execute all or part of the steps of the method described in each embodiment of the present application. The aforementioned memory includes: various media that can store program codes, such as a USB flash drive, a read-only memory (ROM), a random access memory (RAM), a mobile hard disk, a magnetic disk or an optical disk.

[0228] Those skilled in the art will appreciate that all or part of the steps in the various methods of the above embodiments can be completed by instructing related hardware through a program, and the program can be stored in a computer-readable memory, which may include: a flash drive, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk, etc.

[0229] The above is only an exemplary embodiment of the present disclosure and cannot be used to limit the scope of the present disclosure. That is, any equivalent changes and modifications made according to the teachings of the present disclosure are still within the scope of the present disclosure. After considering the specification and practicing the disclosure herein, those skilled in the art will easily think of other embodiments of the present disclosure. This application is intended to cover any variations, uses or adaptations of the present disclosure, which follow the general principles of the present disclosure and include common knowledge or customary technical means in the art that are not recorded in the present disclosure. The description and examples are to be regarded as exemplary only, and the scope and spirit of the present disclosure are defined by the claims.

Claims

1. A phase calibration method for a phased array, characterized in that: The method comprises: In at least one phase modulation unit included, obtaining at least three first circuit values corresponding to the current phase modulation unit, and obtaining the radiation intensity of the far-field radiation at a desired angle based on each of the first circuit values; Determining first-order difference values and second-order difference values corresponding to each of the radiation intensities; performing phase calibration on the current phase modulation unit according to the first-order difference value and the second-order difference value, obtaining a next phase modulation unit, determining the next phase modulation unit as the current phase modulation unit, and executing the step of obtaining at least three first circuit values corresponding to the current phase modulation unit; When there is no next phase modulation unit, determining that the phase calibration of the phased array is completed; The performing phase calibration on the current phase modulation unit according to the first-order difference value and the second-order difference value includes: Determining a step coefficient corresponding to both the first-order difference value and the second-order difference value based on a correspondence between different first-order difference values and second-order difference values and different step coefficients; The product of the step coefficient and a preset reference circuit parameter is determined as a target step length, and the at least three first circuit values are adjusted based on the target step length to obtain the adjusted at least three second circuit values.

2. The method according to claim 1, characterized in that The determining of the first-order difference value and the second-order difference value corresponding to each of the radiation intensities includes: When the radiation intensity does not match the historical radiation intensity, a differential calculation is performed on each radiation intensities to obtain a first-order differential value and a second-order differential value corresponding to each radiation intensity.

3. The method according to claim 2, characterized in that After determining the product of the step size coefficient and the preset reference circuit parameter as a target step size, and adjusting the at least three first circuit values based on the target step size to obtain the adjusted at least three second circuit values, the method further includes: Taking the radiation intensity as the historical radiation intensity, taking the second circuit value as the first circuit value, and performing the step of obtaining the radiation intensity of far-field radiation at a desired angle based on each of the first circuit values; When the radiation intensity matches the historical radiation intensity, the next phase modulation unit is acquired.

4. The method according to claim 1, characterized in that After determining the step coefficient corresponding to the first-order difference value and the second-order difference value based on the correspondence between different first-order difference values and second-order difference values and different step coefficients, the method further includes: Determining whether the first-order difference value and / or the second-order difference value meets a preset step size correction condition, and obtaining a correction value corresponding to the step size coefficient; The step length coefficient is corrected based on the correction value to obtain the corrected step length coefficient.

5. The method according to claim 4, characterized in that Determining whether the first-order difference value and / or the second-order difference value satisfies a preset step size correction condition includes: When the first absolute value corresponding to the first-order difference value is greater than a preset first difference threshold, it is determined that the preset step size correction condition is met; or, When the second absolute value corresponding to the second-order difference value is greater than a preset second difference threshold, it is determined that the preset step size correction condition is met; or, When the first absolute value corresponding to the first-order difference value is greater than a preset first difference threshold, and the second absolute value corresponding to the second-order difference value is greater than a preset second difference threshold, it is determined that the preset step size correction condition is met.

6. The method according to claim 2 or 3, characterized in that The method further comprises: Calculating an absolute value of the difference between the radiation intensity and the historical radiation intensity; When the absolute value of the intensity is less than or equal to the absolute intensity threshold, determining that the radiation intensity matches the historical radiation intensity; When the intensity absolute value is greater than the intensity absolute threshold, it is determined that the radiation intensity does not match the historical radiation intensity.

7. A phase calibration device for a phased array, characterized in that: The device comprises: a radiation intensity acquisition module, configured to acquire, from at least one phase modulation unit included therein, at least three first circuit values corresponding to a current phase modulation unit, and acquire, based on each of the first circuit values, a radiation intensity of far-field radiation at a desired angle; A differential value determination module, configured to determine a first-order differential value and a second-order differential value corresponding to each of the radiation intensities; a phase calibration module, configured to perform phase calibration on the current phase modulation unit according to the first-order difference value and the second-order difference value, obtain a next phase modulation unit, determine the next phase modulation unit as the current phase modulation unit, and execute the step of obtaining at least three first circuit values corresponding to the current phase modulation unit; The phase calibration module is further configured to determine that the phase calibration of the phased array is completed when there is no next phase modulation unit; The performing phase calibration on the current phase modulation unit according to the first-order difference value and the second-order difference value includes: Determining a step coefficient corresponding to both the first-order difference value and the second-order difference value based on a correspondence between different first-order difference values and second-order difference values and different step coefficients; The product of the step coefficient and a preset reference circuit parameter is determined as a target step length, and the at least three first circuit values are adjusted based on the target step length to obtain the adjusted at least three second circuit values.

8. A computer storage medium, characterized in that The computer storage medium stores a plurality of instructions, which are suitable for being loaded by a processor and executing the method steps according to any one of claims 1 to 6.

9. A phased array system, characterized in that: include: A processor and a memory; wherein the memory stores a computer program, and the computer program is suitable for being loaded by the processor and executing the method steps according to any one of claims 1 to 6.

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