Imaging device focusing method and imaging system

Abstract

The present invention discloses a focusing method for an imaging device, wherein a sample to be tested is placed on a preset surface, a second light source is controlled to emit light, the position of the first lens group along the axial direction is changed, the reflected light formed by the emitted light of the second light source on the preset surface, the position of the light spot formed on the imaging surface, and the position of the first lens group are obtained, and the relationship between the position of the first lens group and the light spot position is obtained, and then the position of the first lens group can be adjusted according to the relationship and the pre-calibrated position of the clearest imaging light spot, so that the first lens group is in the first lens group position corresponding to the position of the clearest imaging light spot, so that a clear image can be obtained when the sample to be tested is imaged by irradiating the sample to be tested with light emitted by the first light source. The present invention can improve the working efficiency of focusing, avoid occupying system memory, and does not need to set up a detection module separately, and the cost is relatively low. The present invention also discloses an imaging system.

Description

Technical Field

[0001] The present invention relates to the technical field of optical systems, and in particular to a focusing method of an imaging device. The present invention also relates to an imaging system. Background Art

[0002] In the field of fluorescent molecule detection, the accuracy of autofocus directly affects the quality of imaging. The size of fluorescent molecules is generally in the micron range, the depth of field of the optical system is also in the micron range, and the sample surface is not absolutely flat, so it is necessary to accurately control the position of the objective lens so that the sample is in the optimal focal plane position of the objective lens in order to obtain a clear fluorescent image.

[0003] The motor can be connected to the objective lens, and the objective lens can be moved by controlling the motor. However, it takes a long time to manually control the motor to complete the focusing, which is not conducive to the rapid realization of fluorescence detection. At present, there are two automatic focusing schemes used. One is to stop the objective lens at the clearest image position by real-time detection of image quality when the objective lens position is automatically moved. One of the disadvantages of this method is that the light source needs to irradiate the fluorescent molecules for a long time, which can easily cause the fluorescent molecules to bleach, which is not conducive to fluorescence imaging; the second is that the automatic focusing time is too long, which greatly reduces the working efficiency of the system; the third is that the image processing process requires a large amount of memory, which affects the smoothness of the system. Another automatic focusing scheme is to measure the distance between the objective lens and the sample through a distance sensor, so that the objective lens is always in a fixed position above the sample to ensure image clarity. However, a separate detection module is required, which is costly, and the high-power objective lens has a short working distance, making it difficult to measure the distance between the objective lens and the sample, and the focusing accuracy is low, which is difficult to meet the needs of fluorescence imaging. Summary of the invention

[0004] In view of the above, an object of the present invention is to provide a focusing method for an imaging device, which can improve the working efficiency of focusing, avoid occupying system memory, and avoid increasing costs. The present invention also provides an imaging system.

[0005] To achieve the above object, the present invention provides the following technical solutions:

[0006] A focusing method for an imaging device, the imaging device comprising a first light source, a second light source, a first lens group, a second lens group and an imaging surface, and a sample to be tested is placed on a preset surface;

[0007] The first light source is used to emit light to illuminate the sample to be tested, the first lens group is used to converge the light emitted by the first light source or the light emitted by the second light source to the sample to be tested, the second lens group is used to image the light emitted by the sample to be tested or the light reflected by the preset surface to the imaging surface after passing through the first lens group, and the optical axis of the light emitted by the second light source when incident on the first lens group deviates from the optical axis of the first lens group;

[0008] The method comprises:

[0009] Control the second light source to emit light, change the position of the first lens group along the axial direction, obtain the reflected light formed by the light emitted by the second light source on the preset surface, the spot position formed on the imaging surface, and obtain the position of the first lens group;

[0010] According to the obtained multiple first lens group positions and the corresponding spot positions formed by the preset surface reflected light, the relationship between the first lens group position and the spot position is obtained, so as to adjust the first lens group position according to the relationship and the pre-calibrated clearest imaging spot position, so that the first lens group is at the first lens group position corresponding to the clearest imaging spot position.

[0011] Preferably, calibrating the clearest spot position for imaging includes:

[0012] Controlling the first light source to emit light, irradiating the sample to be tested with the light emitted by the first light source to form an image of the sample to be tested, and adjusting the position of the first lens group along the axial direction to make the formed image clearest;

[0013] Keep the position of the first lens group unchanged, control the first light source not to emit light, control the second light source to emit light, obtain the reflected light formed by the light emitted by the second light source on the preset surface, and use the spot position formed on the imaging surface as the clearest spot position for imaging.

[0014] Preferably, the imaging device also includes a first optical element, which is used to collimate the light emitted by the second light source, and the incident position of the light emitted by the second light source on the first optical element deviates from the center position of the first optical element, so that the optical axis of the light emitted by the second light source deviates from the optical axis of the first lens group when it is incident on the first lens group after being collimated by the first optical element.

[0015] Preferably, the imaging device further comprises an aperture, and a line connecting a through-hole center of the aperture and a light-emitting center of the second light source is not parallel to a main light ray of the second light source.

[0016] Preferably, the lateral distance between the center of the through hole of the aperture and the light emitting center of the second light source can be changed.

[0017] Preferably, the first optical element is also used to collimate the light emitted by the first light source, and the imaging device also includes a second optical element, which is used to transmit the light emitted by the first light source and reflect the light emitted by the second light source, so that the light emitted by the first light source or the light emitted by the second light source is incident on the first optical element.

[0018] Preferably, the imaging device also includes a third optical element, which is used to reflect the light emitted by the first light source and the light emitted by the second light source, so that the light emitted by the first light source or the light emitted by the second light source is incident on the first lens group, and transmits the light emitted by the sample to be tested or the light reflected by the preset surface, so that this part of light is incident on the second lens group.

[0019] Preferably, the imaging device further comprises a first filter element arranged on a side of the second lens group close to the first lens group, the first filter element being used to allow the light emitted by the sample to be tested to pass through and prevent the light emitted by the first light source from passing through;

[0020] Alternatively, the imaging device further comprises a second filter element disposed on a side of the first light source close to the first lens group, the second filter element being used for allowing light emitted by the first light source to pass through and preventing light emitted by the sample to be tested from passing through.

[0021] Preferably, it further comprises a driving device connected to the first lens group, wherein the driving device is used to drive the first lens group to move along the axial direction;

[0022] The method specifically comprises:

[0023] By changing the axial position of the first lens group through the driving device, the reflected light formed by the light emitted by the second light source on the preset surface, the light spot position formed on the imaging surface, and the position of the driving device are obtained;

[0024] According to the obtained positions of the multiple driving devices and the corresponding spot positions formed by the preset surface reflected light, the relationship between the position of the driving device and the spot position is obtained, and according to the relationship and the pre-calibrated clearest imaging spot position, the first lens group is driven by the driving device to move axially, so that the first lens group is at the first lens group position corresponding to the clearest imaging spot position.

[0025] An imaging system is used to execute the above-mentioned imaging device focusing method.

[0026] It can be seen from the above technical solution that the present invention provides a focusing method for an imaging device, wherein a sample to be tested is placed on a preset surface. A first light source emits light to illuminate the sample to be tested, a first lens group converges light emitted by the first light source or light emitted by the second light source to the sample to be tested, and a second lens group forms an image on an imaging surface after the light emitted by the sample to be tested or reflected by the preset surface passes through the first lens group, and optical imaging of the sample to be tested is achieved through the first light source, the first lens group, and the second lens group.

[0027] In the focusing method of the imaging device, the second light source is controlled to emit light, the position of the first lens group along the axial direction is changed, the reflected light formed by the emitted light of the second light source on the preset surface, the spot position formed on the imaging surface, and the position of the first lens group are obtained, and the relationship between the position of the first lens group and the spot position is obtained, and then the position of the first lens group can be adjusted according to the relationship and the pre-calibrated clearest imaging spot position, so that the first lens group is in the first lens group position corresponding to the clearest imaging spot position, so that a clear image can be obtained when the sample to be tested is imaged by irradiating the sample to be tested with light emitted by the first light source.

[0028] Compared with the prior art, the focusing method of the imaging device of the present invention can improve the working efficiency of focusing, avoid occupying system memory, and does not need to set up an additional detection module, and the cost is relatively low.

[0029] The imaging system provided by the present invention can achieve the above beneficial effects. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0031] Figure 1 A schematic diagram of an imaging device provided by an embodiment of the present invention;

[0032] Figure 2 A flowchart of a focusing method for an imaging device provided by an embodiment of the present invention;

[0033] Figure 3 is a schematic diagram of propagation of light emitted by a second light source incident on a preset surface in a specific example;

[0034] Figure 4 for Figure 3 Schematic diagram of imaging spots formed on the imaging surface by the reflected light corresponding to each surface shown;

[0035] Figure 5 is a relationship curve between the position of the driving device and the position of the reflected light spot on the imaging surface obtained in a specific example;

[0036] Figure 6 A schematic diagram of an imaging device provided by another embodiment of the present invention;

[0037] Figure 7 A schematic diagram of an imaging device provided by yet another embodiment of the present invention. DETAILED DESCRIPTION

[0038] In order to enable those skilled in the art to better understand the technical solutions in the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0039] Please refer to Figure 1 , Figure 1 A schematic diagram of an imaging device provided for the present embodiment. As can be seen from the figure, the imaging device to which the imaging device focusing method of the present embodiment is applied includes a first light source 10, a second light source 11, a first lens group 12, a second lens group 13 and an imaging surface 15, and a sample 25 to be tested is placed on a preset surface 14.

[0040] The first light source 10 is used to emit light to illuminate the sample to be tested, the first lens group 12 is used to converge the light emitted by the first light source 10 or the light emitted by the second light source 11 to the sample to be tested 25, the second lens group 13 is used to image the light emitted by the sample to be tested 25 or the light reflected by the preset surface 14 onto the imaging surface 15 after passing through the first lens group 12, and the optical axis of the light emitted by the second light source 11 deviates from the optical axis of the first lens group 12 when the light emitted by the second light source 11 is incident on the first lens group 12.

[0041] After the light emitted by the first light source 10 passes through the first lens group 12, it can converge to the sample to be tested 25, irradiating the sample to be tested so that the sample to be tested emits light. After the light emitted by the sample to be tested 25 passes through the first lens group 12, it is imaged to the imaging surface 15 through the second lens group 13. Thus, optical imaging of the sample to be tested is achieved through the first light source 10, the first lens group 12 and the second lens group 13.

[0042] The light emitted by the second light source 11 can be converged to the sample 25 or the preset surface 14 after passing through the first lens group 12 . After being reflected by the preset surface 14 , the reflected light passes through the first lens group 12 and the second lens group 13 to form a light spot on the imaging surface 15 .

[0043] Since the optical axis of the light emitted from the second light source 11 in the imaging device deviates from the optical axis of the first lens group 12 when it is incident on the first lens group 12, the light emitted from the second light source 11 is not vertically incident on the preset surface 14 after passing through the first lens group 12. Therefore, when the position of the first lens group 12 along the axial direction is changed, that is, the focal plane position of the imaging device is changed, the position of the light spot formed by the reflected light of the preset surface 14 on the imaging surface 15 by the light emitted from the second light source 11 will change.

[0044] Please refer to Figure 2 , Figure 2 This is a flow chart of a focusing method for an imaging device provided in this embodiment. As can be seen from the figure, the focusing method for an imaging device in this embodiment includes the following steps:

[0045] S20: Control the second light source to emit light, change the axial position of the first lens group, obtain the reflected light formed by the light emitted by the second light source on the preset surface, the spot position formed on the imaging surface, and obtain the position of the first lens group.

[0046] The first light source 10 can be controlled not to emit light, and the second light source 11 can be controlled to emit light. The light emitted by the second light source 11 passes through the first lens group 12 and is incident on the preset surface 14. After being reflected by the preset surface 14, a light spot is formed on the imaging surface 15, and the position of the light spot corresponding to the reflected light of the preset surface on the imaging surface 15 is obtained.

[0047] The axial position of the first lens group 12 is changed, and the position of the light spot formed by the reflected light of the preset surface 14 on the imaging surface 15 is obtained at each position, and the axial position of the first lens group 12 is recorded accordingly.

[0048] S21: Obtain a relationship between the first lens group position and the light spot position according to the obtained multiple first lens group positions and the corresponding light spot positions formed by the preset surface reflected light, and adjust the first lens group position according to the relationship and the pre-calibrated clearest imaging light spot position, so that the first lens group is at the first lens group position corresponding to the clearest imaging light spot position.

[0049] According to the multiple positions of the first lens group 12 obtained in the previous process and the corresponding positions of the light spots formed by the reflected light from the preset surface 14, the relationship between the position of the first lens group 12 and the light spot position is obtained.

[0050] The clearest imaging spot position refers to the spot position formed on the imaging surface 15 by the reflected light of the second light source 11 on the preset surface when the first lens group 12 is in the position at this time when the clearest image is obtained by irradiating the sample 25 with light emitted by the first light source 10 to image the sample 25. The clearest imaging spot position can be calibrated by the following process, including the following steps:

[0051] S30: Control the first light source to emit light, illuminate the sample to be tested by the light emitted by the first light source to form an image of the sample to be tested, and adjust the position of the first lens group along the axial direction to make the formed image clearest.

[0052] The first light source 10 can be controlled to emit light, and the second light source 11 can be controlled not to emit light. The first light source 10 emits light to illuminate the sample 25 to form an image of the sample 25, and the position of the first lens group 12 along the axial direction is adjusted to make the image clearest.

[0053] S31: Keep the position of the first lens group unchanged, control the first light source not to emit light, control the second light source to emit light, obtain the reflected light formed by the light emitted by the second light source on the preset surface, and use the spot position formed on the imaging surface as the clearest spot position for imaging.

[0054] By keeping the position of the first lens group 12 unchanged, the first light source 10 can be controlled not to emit light, and the second light source 11 can be controlled to emit light. The reflected light formed by the emitted light of the second light source 11 on the preset surface 14 forms a light spot on the imaging surface 15. The light spot position at this time is used as the clearest imaging light spot position.

[0055] When optical imaging is performed on the sample to be tested, the first light source 10 can be controlled not to emit light, and the second light source 11 can be controlled to emit light. According to the relationship between the position of the first lens group 12 and the light spot position obtained above and the pre-calibrated position of the clearest imaging light spot, the position of the first lens group 12 can be adjusted according to the reflected light of the current second light source 11 on the preset surface 14, and the light spot position formed on the imaging surface 15, and the first lens group 12 can be adjusted to the first lens group position corresponding to the position of the clearest imaging light spot. Thus, the first light source 10 can be used to emit light to image the sample to be tested, and a clear image can be obtained.

[0056] When optical imaging is performed on a sample to be tested in practical applications, it is necessary to irradiate different positions of the sample to be tested for optical imaging. When the lens group is moved to change the irradiation position, the focal plane of the imaging device is not necessarily at the clearest imaging position. The focal plane position of the imaging device is adjusted by the focusing method to obtain a clear image at the current irradiation position of the sample to be tested.

[0057] Compared with the prior art, the focusing method of the imaging device of this embodiment can improve the working efficiency of focusing, reduce the amount of image processing, avoid occupying system memory, and does not require the additional setting of a detection module, and is relatively low in cost.

[0058] In addition, in the focusing method of the imaging device of this embodiment, focusing is achieved through a second light source. The second light source can use a wavelength band light that has no excitation effect on the sample to be measured, which can avoid bleaching of the sample to be measured and help improve image quality.

[0059] In practical applications, the sample to be tested is usually placed between two glass sheets for observation, and the surface of the upper glass sheet or the lower glass sheet in contact with the sample to be tested is used as the preset surface. If the fluorescent molecules to be imaged in the sample to be tested are located on the surface of the upper glass sheet, the surface of the upper glass sheet is used as the preset surface, and the focus is performed according to the position of the reflected light spot on the surface; if the fluorescent molecules to be imaged in the sample to be tested are located on the surface of the lower glass sheet, the surface of the lower glass sheet is used as the preset surface for focusing.

[0060] Please refer to Figure 3 and Figure 4 , Figure 3 is a schematic diagram of propagation of light emitted by a second light source incident on a preset surface in a specific example, Figure 4 for Figure 3 Schematic diagram of imaging spots formed on the imaging surface by the reflected light corresponding to each surface shown, wherein surface S1 and surface S2 are two surfaces of the upper glass sheet, and surface S3 and surface S4 are two surfaces of the lower glass sheet.

[0061] refer to Figure 4 As shown, spot a1 is the spot corresponding to surface S1, spot a2 is the spot corresponding to surface S2, spot a3 is the spot corresponding to surface S3, and spot a4 is the spot corresponding to surface S4. For spot a2 and spot a3, if spot a2 is clearer than spot a3, it indicates that the focal plane of the imaging device is near surface S2. If spot a3 is clearer than spot a2, it indicates that the focal plane of the imaging device is near surface S3. Spot A is clearer than spot B, which means that the brightness of spot A is higher than that of spot B, and the size of spot A is smaller than that of spot B.

[0062] Optionally, the relationship between the position of the first lens group 12 and the position of the reflected light spot on the imaging surface 15 can be a linear relationship. It can be expressed as: y = K*x + b, where y represents the position of the first lens group, x represents the position of the reflected light spot on the imaging surface, and K and b are coefficients. In this embodiment, the position of the spot centroid is used to represent the spot position.

[0063] Optionally, the imaging device may further include a driving device connected to the first lens group 12, wherein the driving device is used to drive the first lens group 12 to move axially.

[0064] Specifically, step S20 may specifically include: changing the axial position of the first lens group by the driving device, obtaining the reflected light formed by the light emitted by the second light source on the preset surface, the spot position formed on the imaging surface, and obtaining the position of the driving device.

[0065] Correspondingly, step S21 may specifically include: obtaining the relationship between the position of the driving device and the spot position according to the obtained positions of the multiple driving devices and the corresponding spot positions formed by the preset surface reflected light, and driving the first lens group to move axially through the driving device according to the relationship and the pre-calibrated clearest imaging spot position, so that the first lens group is at the first lens group position corresponding to the clearest imaging spot position.

[0066] In this embodiment, if the relationship between the position of the driving device and the position of the light spot on the imaging surface is a linear relationship, it can be expressed as: y=K*x+b, where y represents the position of the driving device, x represents the position of the light spot on the imaging surface, and K and b are coefficients respectively.

[0067] For example, please refer to Figure 5 , Figure 5 It is a relationship curve between the position of the driving device and the position of the reflected light spot on the imaging surface obtained in a specific example. As shown in the figure, the relationship between the position of the driving device and the position of the reflected light spot on the imaging surface is a linear relationship. The two linear equations in the figure are respectively the relationship between the position of the driving device and the position of the reflected light spot obtained based on the surface of the upper glass sheet and the surface of the lower glass sheet. When focusing, according to the current position of the reflected light spot on the imaging surface, the difference between the current spot position and the position of the clearest imaging spot can be obtained, expressed as △x=x-x0, x represents the current spot position, and x0 represents the clearest imaging spot position. According to the linear equation satisfied by the position of the driving device and the reflected light spot position, △y can be obtained, and then the driving device △y can be directly moved to drive the first lens group 12 to move so that the focal plane of the imaging device reaches the clearest imaging position.

[0068] The specific implementation of the imaging device of this embodiment is described in detail below. The imaging device may also include a first optical element, the first optical element is used to collimate the light emitted by the second light source 11, the incident position of the light emitted by the second light source 11 on the first optical element deviates from the center position of the first optical element, so that the optical axis of the light emitted by the second light source 11 deviates from the optical axis of the first lens group 12 when it is incident on the first lens group 12 after being collimated by the first optical element.

[0069] Please refer to Figure 6 , Figure 6 A schematic diagram of an imaging device is provided for another embodiment. As shown in the figure, the imaging device further includes a first optical element 17, and the first optical element 17 collimates the light emitted by the first light source 10 and the light emitted by the second light source 11. The light emitted by the first light source 10 is incident on the first lens group 12 after being collimated by the first optical element 17, and its optical axis coincides with the optical axis of the first lens group 12. The light emitted by the second light source 11 is incident on the first lens group 12 after being collimated by the first optical element 17, and its optical axis deviates from the optical axis of the first lens group 12. The deviation of the optical axis of the light emitted by the second light source 11 from the optical axis of the first lens group 12 when it is incident on the first lens group 12 can be specifically that when the light emitted by the second light source 11 is incident on the first lens group 12, the optical axis is parallel to the optical axis of the first lens group 12 but does not coincide.

[0070] Optionally, the imaging device may further include an aperture, and the line connecting the through hole center of the aperture and the light emission center of the second light source is not parallel to the main light of the second light source, so that the light emitted by the second light source 11 is intercepted by the aperture and passes through the through hole thereof, and is obliquely incident on the first optical element 17 .

[0071] Preferably, the lateral distance between the through hole center of the aperture and the luminous center of the second light source can be changed. The lateral distance between the through hole center and the luminous center of the second light source refers to the distance between the through hole center and the luminous center of the second light source in a plane perpendicular to the axis of the luminous center of the second light source. By changing the lateral distance between the through hole center of the aperture and the luminous center of the second light source 11, the position where the outgoing light of the second light source 11 is incident on the first optical element 17 can be changed, and the deviation distance between the optical axis and the optical axis of the first lens group 12 when the outgoing light of the second light source 11 is incident on the first lens group 12 can be changed accordingly, and the incident angle of the outgoing light of the second light source 11 when it is obliquely incident on the preset surface 14 can be adjusted, so that the focusing accuracy can be adjusted to achieve different precision automatic focusing requirements.

[0072] In addition, the size of the light beam emitted by the second light source 11 can be changed by the size of the aperture through hole, which can meet the use of objective lenses with different entrance pupil diameters and increase the compatibility of the autofocus system. By adopting the method of setting an eccentric through hole on the aperture to control the focus beam, the accuracy of the autofocus system can be accurately controlled by only changing the size and position of the aperture through hole, which greatly reduces the difficulty of assembling and adjusting the autofocus system.

[0073] For further optional information, please refer to Figure 6 The first optical element 17 is also used to collimate the light emitted by the first light source 10. The imaging device may further include a second optical element 19, which is used to transmit the light emitted by the first light source 10 and reflect the light emitted by the second light source 11, so that the light emitted by the first light source 10 or the light emitted by the second light source 11 is incident on the first optical element 17. Figure 6 As shown, the light emitted by the second light source 11 passes through the aperture 18 and then enters the second optical element 19 . The light beam is reflected by the second optical element 19 to the edge of the first optical element 17 , and the first optical element 17 collimates the light beam.

[0074] Further references Figure 1 and Figure 6The imaging device may further include a third optical element 16, wherein the third optical element 16 is used to reflect the light emitted by the first light source 10 and the light emitted by the second light source 11, so that the light emitted by the first light source 10 or the light emitted by the second light source 11 is incident on the first lens group 12, and transmits the light emitted by the sample 25 to be tested or the light reflected by the preset surface 14, so that this part of the light is incident on the second lens group 13.

[0075] The third optical element 16 can reflect a part of the light emitted by the second light source 11 and transmit the other part. The third optical element 16 can be an optical element that has a semi-transmissive and semi-reflective effect on the light emitted by the second light source 11.

[0076] Please refer to the preferred Figure 7 , Figure 7 This is a schematic diagram of an imaging device provided in another embodiment. The imaging device may further include a first filter element 20. The first filter element 20 is disposed on the side of the second lens group 13 close to the first lens group 12, and is used to allow the light emitted by the sample to be tested to pass through, and prevent the light emitted by the first light source 10 from passing through. The illumination light is filtered out by the first filter element 20 to prevent the illumination light from being incident on the imaging surface 15.

[0077] The imaging device may further include a second filter element 21, which is disposed on the side of the first light source 10 close to the first lens group 12, and is used to allow the light emitted by the first light source 10 to pass through, and prevent the light emitted by the sample to be tested from passing through.

[0078] Optionally, the third optical element 16 may be, but not limited to, a dual-bandpass dichroic mirror. The second optical element 19 may be, but not limited to, a dichroic mirror. The first filter element 20 or the second filter element 21 may be, but not limited to, a dual-bandpass filter.

[0079] Preferably, the first light source 10 includes at least a first sub-light source and a second sub-light source that emit light of different wavelength bands respectively. In practical applications, the first sub-light source or the second sub-light source can be selected according to the detection requirements of the sample to be tested. Figure 7 As shown, the imaging device may further include a fourth optical element 22, which is used to transmit the light emitted by the first sub-light source 100 and reflect the light emitted by the second sub-light source 101. When testing the sample to be tested, the first sub-light source 100 or the second sub-light source 101 can be selected and switched. The fourth optical element 22 can be a dichroic mirror but is not limited to it.

[0080] The first light source 10 may be, but not limited to, a light emitting diode or a laser. The second light source 11 may be, but not limited to, a laser diode or a light emitting diode.

[0081] like Figure 7As shown, the imaging device may further include a driving device 23, which is connected to the first lens group 12, and the axial position of the first lens group 12 is changed by the driving device 23. Optionally, the driving device 23 may be a motor but is not limited to one.

[0082] The imaging device of this embodiment can be applied to fluorescence imaging of substances.

[0083] Correspondingly, this embodiment also provides an imaging system for executing the above-mentioned imaging device focusing method.

[0084] The imaging system of this embodiment controls the second light source to emit light, changes the position of the first lens group along the axial direction, obtains the reflected light formed by the second light source emitted light on the preset surface, the spot position formed on the imaging surface, and obtains the position of the first lens group, and obtains the relationship between the position of the first lens group and the spot position. Then, according to the relationship and the pre-calibrated clearest imaging spot position, the position of the first lens group can be adjusted so that the first lens group is at the first lens group position corresponding to the clearest imaging spot position, so that a clear image can be obtained when the sample to be tested is imaged by irradiating the sample to be tested with light emitted by the first light source. Compared with the prior art, this imaging system can improve the working efficiency of focusing, avoid occupying system memory, and does not need to set up a detection module separately, and the cost is relatively low.

[0085] The above is a detailed introduction to an imaging device focusing method and an imaging system provided by the present invention. Specific examples are used herein to illustrate the principles and implementation methods of the present invention. The description of the above embodiments is only used to help understand the method of the present invention and its core idea. It should be pointed out that for ordinary technicians in this technical field, without departing from the principles of the present invention, several improvements and modifications can be made to the present invention, and these improvements and modifications also fall within the scope of protection of the claims of the present invention.

Claims

1. A focusing method for an imaging device, characterized in that: The imaging device comprises a first light source, a second light source, a first lens group, a second lens group and an imaging surface, and the sample to be tested is placed on a preset surface; The first light source is used to emit light to illuminate the sample to be tested, the first lens group is used to converge the light emitted by the first light source or the light emitted by the second light source to the sample to be tested, the second lens group is used to image the light emitted by the sample to be tested or the light reflected by the preset surface to the imaging surface after passing through the first lens group, and the optical axis of the light emitted by the second light source when incident on the first lens group deviates from the optical axis of the first lens group; The method comprises: Control the second light source to emit light, change the position of the first lens group along the axial direction, obtain the reflected light formed by the light emitted by the second light source on the preset surface, the spot position formed on the imaging surface, and obtain the position of the first lens group; According to the obtained multiple first lens group positions and the corresponding spot positions formed by the reflected light from the preset surface, the relationship between the first lens group position and the spot position is obtained, so as to adjust the first lens group position according to the relationship and the pre-calibrated clearest imaging spot position so that the first lens group is at the first lens group position corresponding to the clearest imaging spot position, wherein the clearest imaging spot position refers to the spot position formed on the imaging surface by the reflected light of the emitted light from the second light source on the preset surface when the clearest image is obtained by irradiating the sample to be tested with light emitted by the first light source.

2. The focusing method of an imaging device according to claim 1, characterized in that: The clearest spot positions for calibration imaging include: Controlling the first light source to emit light, irradiating the sample to be tested with the light emitted by the first light source to form an image of the sample to be tested, and adjusting the position of the first lens group along the axial direction to make the formed image clearest; Keep the position of the first lens group unchanged, control the first light source not to emit light, control the second light source to emit light, obtain the reflected light formed by the light emitted by the second light source on the preset surface, and use the spot position formed on the imaging surface as the clearest spot position for imaging.

3. The focusing method of an imaging device according to claim 1, characterized in that: The imaging device also includes a first optical element, which is used to collimate the light emitted by the second light source. The incident position of the light emitted by the second light source on the first optical element deviates from the center position of the first optical element, so that the optical axis of the light emitted by the second light source deviates from the optical axis of the first lens group when it is incident on the first lens group after being collimated by the first optical element.

4. The focusing method of an imaging device according to claim 1, characterized in that: The imaging device further comprises an aperture, wherein a line connecting a through hole center of the aperture and a light emitting center of the second light source is not parallel to a main light ray of the second light source.

5. The focusing method of an imaging device according to claim 4, characterized in that: The lateral distance between the center of the through hole of the aperture and the light emission center of the second light source can be changed.

6. The focusing method of an imaging device according to claim 3, characterized in that: The first optical element is also used to collimate the light emitted by the first light source. The imaging device also includes a second optical element, which is used to transmit the light emitted by the first light source and reflect the light emitted by the second light source, so that the light emitted by the first light source or the light emitted by the second light source is incident on the first optical element.

7. The focusing method of an imaging device according to claim 1, characterized in that: The imaging device also includes a third optical element, which is used to reflect the light emitted by the first light source and the light emitted by the second light source, so that the light emitted by the first light source or the light emitted by the second light source is incident on the first lens group, and transmit the light emitted by the sample to be tested or the light reflected by the preset surface, so that this part of the light is incident on the second lens group.

8. The focusing method of an imaging device according to claim 1, characterized in that: The imaging device further comprises a first filter element disposed on a side of the second lens group close to the first lens group, the first filter element being used to allow the light emitted by the sample to be tested to pass through and prevent the light emitted by the first light source from passing through; Alternatively, the imaging device further comprises a second filter element disposed on a side of the first light source close to the first lens group, the second filter element being used for allowing light emitted by the first light source to pass through and preventing light emitted by the sample to be tested from passing through.

9. The focusing method of an imaging device according to any one of claims 1 to 8, characterized in that: Also includes a driving device connected to the first lens group, the driving device is used to drive the first lens group to move along the axial direction; The method specifically comprises: By changing the axial position of the first lens group through the driving device, the reflected light formed by the light emitted by the second light source on the preset surface, the light spot position formed on the imaging surface, and the position of the driving device are obtained; According to the obtained positions of the multiple driving devices and the corresponding spot positions formed by the preset surface reflected light, the relationship between the position of the driving device and the spot position is obtained, and according to the relationship and the pre-calibrated clearest imaging spot position, the first lens group is driven by the driving device to move axially, so that the first lens group is at the first lens group position corresponding to the clearest imaging spot position.

10. An imaging system, characterized in that: Used to execute the imaging device focusing method described in any one of claims 1-9.

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