Method for multiple selection of quality inspection items for electric control panels

Abstract

The present invention discloses a method for multiple selection of quality inspection items of an electric control board, which relates to the technical field of circuit board quality inspection. According to the required inspection items, a project selection light shielding sheet can be installed at a corresponding installation position. When a cover is closed to fix the circuit board to be tested, the function selection circuit board can automatically output a signal corresponding to the required inspection item to a main control single-chip computer U11. The main control single-chip computer U11 can enter the next step of data processing according to the signal. The method can be applicable to the selection of different inspection items of multiple electric control boards and the selection of different inspection items of the same electric control board. Under the premise of reducing the response and waiting time required from frequent replacement of electric control boards to the start of quality inspection, the flexibility of quality inspection item selection is good, and the low-level signal of the project selection photoelectric switch is determined by closing the cover, which saves more time in operation and corresponding time, and greatly improves the quality inspection efficiency.

Description

Technical Field

[0001] The invention relates to the technical field of electric control board quality inspection, in particular to a method for multiple selection of quality inspection items for an electric control board. Background Art

[0002] Before a circuit board is used in a product, it is usually necessary to conduct quality inspection on the circuit board. Traditional quality inspection equipment can only conduct quality inspection on one item of the electronic control board or constantly conduct quality inspection on multiple items.

[0003] When the former quality inspection equipment is used, when multiple quality inspections need to be performed, it is necessary to switch to another quality inspection equipment after completing one quality inspection item to continue the next quality inspection item. For example, after the VDD voltage of the electric control board is tested by the quality inspection equipment for testing the VDD voltage, the voltage output by the load output end of the electric control board is tested by the quality inspection equipment for testing the load output voltage. The equipment is suitable for assembly line operations. Although the flexibility of quality inspection item selection is good, repeated removal and installation of the electric control board may cause scratches on the electric control board, and the response and waiting time required from frequent replacement of the electric control board to the start of quality inspection is one of the important factors leading to low quality inspection efficiency. When the second quality inspection equipment is used, although all quality inspection items can be completed by one quality inspection equipment, the response and waiting time required from frequent replacement of the electric control board to the start of quality inspection is reduced, but its quality inspection items are constant, and it can only be used for quality inspection of a certain electric control board, and its applicability is poor. Therefore, it is necessary to invent a method that can select optional inspection items and improve quality inspection efficiency. Summary of the invention

[0004] In order to overcome the above-mentioned shortcomings, the present invention aims to provide a technical solution that can solve the above-mentioned problems.

[0005] To achieve the above object, the present invention provides the following technical solution: a method for selecting multiple items for quality inspection of electric control panels, the method comprising:

[0006] S1, providing a test frame panel and a cover plate that can be opened relative to the test frame panel, the cover plate being used to fix the electric control board to be tested on the test frame panel when closed, and making the test terminals on the test frame panel correspond one to one with the terminals on the electric control board to be tested;

[0007] S2. Arrange a function selection circuit board on the test rack panel, weld a number of project selection photoelectric switches on the function selection circuit board, the project selection photoelectric switches correspond to the test items one by one, and the cover is provided with installation positions corresponding to the project selection photoelectric switches one by one, the installation positions are used to detachably install the project selection light shielding sheets, and when the cover is closed, the project selection light shielding sheets on the cover shield the corresponding photosensitive parts of the project selection photoelectric switches, after the photosensitive parts of the project selection photoelectric switches are blocked by the project selection light shielding sheets, a low level signal is generated to the microcontroller U18 of the function selection circuit board;

[0008] S3. Install the light shielding sheet selected by the project at the corresponding installation position according to the requirements of the test project;

[0009] S4, close the cover so that the electric control board to be tested is fixed on the test frame panel, the project selection light shield on the cover is linked to control the corresponding project selection photoelectric switch to send a low-level signal to the single-chip microcomputer U18 of the function selection circuit board, and the project selection light shield controls the project selection photoelectric switch to select the test item of the electric control board to be tested;

[0010] S5. After the cover is closed, the single-chip microcomputer U18 on the function selection circuit board receives the low-level signal of each item selection photoelectric switch. After the low-level signal is received, the data is sent to the main control single-chip microcomputer U11 of the quality inspection equipment using the two-wire communication protocol, and the main control single-chip microcomputer U11 enters the next step of data processing;

[0011] Among them, the two-wire communication protocol is composed of a clock line SCK and a data line SDA. The microcontroller U18 of the function selection circuit board confirms the arrangement of the above-mentioned low-level signals received, that is, by determining which input terminals of the microcontroller U18 of the function selection circuit board connected to the item selection photoelectric switch obtain low-level signals, thereby sorting out and determining the selected detection items, and sending a string of clock signals and data signals corresponding to the selected detection items to the main control microcontroller U11.

[0012] As a further solution of the present invention: before performing step S3, a circuit board is arranged on the test frame panel, and a closing signal photoelectric switch is welded on the circuit board. A closing light shield corresponding to the closing signal photoelectric switch is fixed on the cover plate, and when the cover plate is closed, the closing light shield on the cover plate blocks the photosensitive part of the closing signal photoelectric switch, and the closing signal photoelectric switch generates a low-level signal to the microcontroller U18 of the function selection circuit board and the main control microcontroller U11 after the closing light shield blocks its photosensitive part; when performing step S4, after closing the cover plate, the microcontroller U18 of the function selection circuit board starts to receive the low-level signal generated by the item selection photoelectric switch after receiving the low-level signal of the closing signal photoelectric switch; when performing step S5, after closing the cover plate, the main control microcontroller U11 starts to receive the clock signal and data signal sent by the function selection circuit board after receiving the low-level signal of the closing signal photoelectric switch.

[0013] As a further solution of the present invention: the process of the function selection circuit board receiving the low-level signal of the project selection photoelectric switch includes: first, reading the signal of each project selection photoelectric switch, sorting and determining the selected detection project after reading the corresponding low-level signal, and sending a series of clock signals and data signals corresponding to the selected detection project to the main control microcontroller U11; continuously reading the part where the low-level signal is not read, until the detection timeout or the main control microcontroller U11 receives the clock signal and the data signal and stops reading, during which time when a new low-level signal is read, the function selection circuit board adds the newly read part to the signal list, and after sorting and confirming the new selected detection project, sends a series of clock signals and data signals corresponding to the new selected detection project to the main control microcontroller U11; the main control microcontroller U11 activates the clock signal and data signal last received within the specified time, obtains the final selected detection project, and then performs the next step of data processing; wherein, when the clock signal and data signal received by the main control microcontroller U11 do not correspond to the data on the signal comparison table, the feedback function selection circuit board resends the clock signal and data signal.

[0014] As a further solution of the present invention: the clock signal and the data signal sent by the function selection circuit board are transmitted to the main control microcontroller U11 after being isolated by optical coupling.

[0015] As a further solution of the present invention: the clock signal output terminal SCK of the single-chip microcomputer U18 of the function selection circuit board is connected to an N-type field effect transistor Q3, wherein the gate of the N-type field effect transistor Q3 is connected to the clock signal output terminal SCK of the single-chip microcomputer U18 through a resistor R1, and the gate of the N-type field effect transistor Q3 is also connected to the ground terminal GND through a resistor R6; the source of the N-type field effect transistor Q3 is connected to the ground terminal GND; the drain of the N-type field effect transistor Q3 is connected to at least one optical coupler U2, wherein the positive electrode of the light-emitting part of each optical coupler U2 is connected to the power supply voltage terminal VCC through a pull-down resistor R9, and the negative electrode of the light-emitting part of each optical coupler U2 is connected to the drain of the N-type field effect transistor Q3, and the light-receiving parts of different optical couplers U2 are used to generate light to the clock signal receiving terminal SCK1 of different master single-chip microcomputers U11. Signal; the data signal output terminal SDA of the microcontroller U18 of the function selection circuit board is connected to an N-type field effect transistor Q2, wherein the gate of the N-type field effect transistor Q2 is connected to the data signal output terminal SDA of the microcontroller U18 through a resistor R74, and the gate of the N-type field effect transistor Q2 is also connected to the ground terminal GND through a resistor R54; the source of the N-type field effect transistor Q2 is connected to the ground terminal GND; the drain of the N-type field effect transistor Q2 is connected to at least one optical coupler U23, wherein the positive electrode of the light-emitting part of each optical coupler U23 is connected to the power supply voltage terminal VCC through a pull-down resistor R33, and the negative electrode of the light-emitting part of each optical coupler U2 is connected to the drain of the N-type field effect transistor Q2, and the light-receiving parts of different optical couplers U23 are used to send signals to the data signal receiving terminals SDA1 of different master microcontrollers U11.

[0016] As a further solution of the present invention: the project selection photoelectric switch adopts a through-beam photoelectric sensor; the cover closing signal photoelectric switch adopts a through-beam photoelectric sensor.

[0017] As a further solution of the present invention: the model of the single chip microcomputer U18 of the function selection circuit board is TM52FE8296; the model of the main control single chip microcomputer U11 is TM52FE8276.

[0018] Compared with the prior art, the beneficial effects of the present invention are as follows: a project selection light shielding sheet can be installed at the corresponding installation position according to the required inspection items, and when the cover is closed to fix the circuit board to be tested, the function selection circuit board can automatically output the signal corresponding to the required inspection item to the main control microcontroller, and the main control microcontroller can enter the next step of data processing according to the signal, such as detecting the VDD voltage of the electric control board through the VDD voltage detection circuit thereon, detecting the voltage output by the load output end of the electric control board through the load output voltage detection circuit thereon, etc., which can be applicable to the project selection of different inspection items of multiple electric control boards, and the project selection of different inspection items of the same electric control board; under the premise of reducing the response and waiting time required for frequent replacement of the electric control board to start quality inspection, the flexibility of quality inspection item selection is good, and the low-level signal of the project selection photoelectric switch is determined by closing the cover, which saves more time in operation and corresponding time, and greatly improves the quality inspection efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 is a flow chart of the present invention;

[0020] Figure 2 It is a circuit schematic diagram of the single chip microcomputer U18 of the function selection circuit board in the present invention;

[0021] Figure 3 It is a circuit schematic diagram of the project selection photoelectric switch and the cover closing signal photoelectric switch in the present invention;

[0022] Figure 4 It is a circuit principle diagram of the data signal and the clock signal transmission in the present invention;

[0023] Figure 5 It is a circuit schematic diagram of the main control microcontroller U11 in the present invention;

[0024] Figure 6 It is a schematic diagram of the positional relationship between the item selection photoelectric switch and the item selection light shielding sheet when the cover is closed in the present invention;

[0025] Figure 7 It is a schematic diagram of the positional relationship between the cover closing signal photoelectric switch and the cover closing light shielding sheet when the cover is closed in the present invention;

[0026] The reference numerals and names in the figures are as follows:

[0027] Test rack panel -100, cover plate -200, test terminal -300, function selection circuit board -400, project selection photoelectric switch -500, project selection light shield -600, circuit board -700, closing cover signal photoelectric switch -800, closing cover light shield -900. DETAILED DESCRIPTION

[0028] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0029] See also Figure 1-7 , the method of multiple selection of electric control board quality inspection items includes:

[0030] S1, a test frame panel 100 and a cover plate 200 that can be opened relative to the test frame panel 100 are provided, and the cover plate 200 is used to fix the electric control board to be tested on the test frame panel 100 when closed, and to make the test terminals 300 on the test frame panel 100 correspond one to one with the terminals on the electric control board to be tested;

[0031] S2. Arrange a function selection circuit board 400 on the test rack panel 100, and weld a plurality of project selection photoelectric switches 500 on the function selection circuit board 400. The project selection photoelectric switches 500 correspond to the test items one by one. The cover plate 200 is provided with mounting positions corresponding to the project selection photoelectric switches 500. The mounting positions are used for detachably mounting the project selection light shielding sheets 600. When the cover plate 200 is closed, the project selection light shielding sheets 600 on the cover plate 200 shield the corresponding photosensitive part of the project selection photoelectric switch 500. After the photosensitive part of the project selection photoelectric switch 500 is blocked by the project selection light shielding sheet 600, a low level signal is generated to the microcontroller U18 of the function selection circuit board 400.

[0032] S3. Install the project selection light shielding sheet 600 at the corresponding installation position according to the requirements of the detection project;

[0033] S4, closing the cover 200 so that the electric control board to be tested is fixed on the test rack panel 100, the project selection light shielding sheet 600 on the cover 200 is linked to control the corresponding project selection photoelectric switch 500 to send a low level signal to the single chip microcomputer U18 of the function selection circuit board 400, and the project selection light shielding sheet 600 controls the project selection photoelectric switch 500 to select the detection item of the electric control board to be tested;

[0034] S5. After the cover 200 is closed, the single-chip microcomputer U18 on the function selection circuit board 400 receives the low-level signal of each item selection photoelectric switch 500. After receiving the low-level signal, the data is sent to the main control single-chip microcomputer U11 of the quality inspection equipment using the two-wire communication protocol, and the main control single-chip microcomputer U11 enters the next step of data processing;

[0035] Among them, the two-wire communication protocol is composed of a clock line SCK and a data line SDA. The microcontroller U18 of the function selection circuit board 400 confirms the arrangement of the above-mentioned low-level signals received, that is, by determining which input terminals of the microcontroller U18 on the function selection circuit board 400 connected to the project selection photoelectric switch obtain low-level signals, thereby sorting out and determining the selected detection items, and sending a string of clock signals and data signals corresponding to the selected detection items to the main control microcontroller U11.

[0036] The cover plate 200 can be closed relative to the test rack panel 100 in the following manner: Figure 6 and Figure 7 Flip cover shown.

[0037] The project selection light blocking sheet 600 can be installed at the corresponding installation position according to the required inspection items. When the cover is closed to fix the circuit board to be tested, the function selection circuit board 400 can automatically output the signal corresponding to the required inspection item to the main control microcontroller U11, and the main control microcontroller U11 can enter the next step of data processing according to the signal: such as detecting the VDD voltage of the electric control board through the VDD voltage detection circuit thereon, detecting the voltage output by the load output end of the electric control board through the load output voltage detection circuit thereon, sending a signal to the signal acquisition board and then the signal acquisition board performs the corresponding inspection items, and so on; it can be applied to the project selection of different inspection items of multiple electric control boards, and the project selection of different inspection items of the same electric control board; under the premise of reducing the response and waiting time required for frequent replacement of the electric control board to start quality inspection, the flexibility of quality inspection item selection is good, and the low-level signal of the project selection photoelectric switch is determined by closing the cover, which saves more time in operation and corresponding time, and greatly improves quality inspection efficiency.

[0038] Preferably, the process of the function selection circuit board 400 receiving the low level signal of the item selection photoelectric switch includes:

[0039] First, the signal of each item selection photoelectric switch 500 is read, and after the corresponding low-level signal is read, the selected detection item is determined, and a series of clock signals and data signals corresponding to the selected detection item are sent to the main control microcontroller U11;

[0040] The part where the low-level signal is not read continues to be read until the detection times out or the main control microcontroller U11 receives the clock signal and the data signal and stops reading. During this period, when a new low-level signal is read, the function selection circuit board 400 adds the newly read part to the signal list, and after sorting out and confirming the new selected detection item, sends a series of clock signals and data signals corresponding to the new selected detection item to the main control microcontroller U11;

[0041] The main control microcontroller U11 activates the clock signal and data signal received last within the specified time, obtains the final selected detection item, and then proceeds to the next step of data processing;

[0042] When the clock signal and the data signal received by the main control microcontroller U11 do not correspond to the data on the signal comparison table, the feedback function selects the circuit board 400 to resend the clock signal and the data signal.

[0043] Effectively ensure the accuracy of the selection of test items, making quality inspection more accurate.

[0044] Preferably, the clock signal and data signal sent by the function selection circuit board 400 are transmitted to the main control microcontroller U11 after being isolated by optical coupling.

[0045] Please refer to Figure 2 , 4 5. The clock signal output terminal SCK of the single-chip microcomputer U18 is connected to the N-type field effect transistor Q3, and the data signal output terminal SDA of the single-chip microcomputer U18 is connected to the N-type field effect transistor Q2, wherein:

[0046] The gate of the N-type field effect transistor Q3 is connected to the clock signal output terminal SCK of the single-chip computer U18 through the resistor R1, and the gate of the N-type field effect transistor Q3 is also connected to the ground terminal GND through the resistor R6; the source of the N-type field effect transistor Q3 is connected to the ground terminal GND; the drain of the N-type field effect transistor Q3 is connected to at least one optical coupler U2, wherein the positive electrode of the light-emitting part of each optical coupler U2 is connected to the power supply voltage terminal VCC through a pull-down resistor R9, and the negative electrode of the light-emitting part of each optical coupler U2 is connected to the drain of the N-type field effect transistor Q3, and the light-receiving parts of different optical couplers U2 are used to send signals to the clock signal receiving terminals SCK1 of different master single-chip computers U11;

[0047] The gate of the N-type field effect transistor Q2 is connected to the data signal output terminal SDA of the microcontroller U18 through a resistor R74, and the gate of the N-type field effect transistor Q2 is also connected to the ground terminal GND through a resistor R54; the source of the N-type field effect transistor Q2 is connected to the ground terminal GND; the drain of the N-type field effect transistor Q2 is connected to at least one optocoupler U23, wherein the positive electrode of the light-emitting part of each optocoupler U23 is connected to the power supply voltage terminal VCC through a pull-down resistor R33, and the negative electrode of the light-emitting part of each optocoupler U2 is connected to the drain of the N-type field effect transistor Q2, and the light-receiving parts of different optocouplers U23 are used to send signals to the data signal receiving terminals SDA1 of different master microcontrollers U11.

[0048] The clock signal emitted by the microcontroller U18 controls the N-type field effect transistor Q3, thereby controlling the optocoupler U2 to output a clock signal to the main microcontroller U11 that is the same as the clock signal emitted by the microcontroller U18 and isolated from the microcontroller U18; the data signal emitted by the microcontroller U18 controls the N-type field effect transistor Q2, thereby controlling the optocoupler U23 to output a data signal to the main microcontroller U11 that is the same as the data signal emitted by the microcontroller U18 and isolated from the microcontroller U18. On the one hand, the signal is less susceptible to interference. On the other hand, clock signals and data signals can be sent to multiple master microcontrollers U11 through a function selection circuit board 400. Correspondingly, the clock signal receiving end SCK1 of each master microcontroller U11 is connected to the corresponding photoreceiver of the optocoupler U2, and the data signal receiving end SDA1 of each master microcontroller U11 is connected to the corresponding photoreceiver of the optocoupler U23. Only one function selection circuit board 400 is required to simultaneously confirm the inspection items of multiple electronic control boards, further improving the quality inspection efficiency and effectively reducing the quality inspection cost. The design of N-type field effect transistor Q3, optocoupler U2, N-type field effect transistor Q2, and optocoupler U23 makes it possible to isolate the signals sent to each master microcontroller U11 from each other, prevent interference, and ensure safety.

[0049] Each optocoupler U2 is controlled by a pull-down resistor R9, and each optocoupler U23 is controlled by a pull-down resistor R33. When it is necessary to improve the driving capability of the corresponding optocoupler and the speed of transmitting signals, it can be achieved by adjusting the resistance values ​​of the pull-down resistors R9 and R33, which has better applicability.

[0050] Further, before performing step S3, a circuit board 700 is arranged on the test rack panel 100, a closing signal photoelectric switch 800 is welded on the circuit board 700, a closing light shielding sheet 900 corresponding to the closing signal photoelectric switch 800 is fixed on the cover plate 200, and when the cover plate 200 is closed, the closing light shielding sheet 900 on the cover plate 200 shields the photosensitive part of the closing signal photoelectric switch 800, and the closing signal photoelectric switch 800 generates a low-level signal to the single-chip microcomputer U18 of the function selection circuit board 400 and the main control single-chip microcomputer U11 after the closing light shielding sheet 900 shields its photosensitive part;

[0051] When performing step S4, after closing the cover 200, the single chip microcomputer U18 of the function selection circuit board 400 starts to receive the low level signal generated by the item selection photoelectric switch 500 after receiving the low level signal of the cover closing signal photoelectric switch 800;

[0052] During step S5 , after the cover 200 is closed, the main control microcontroller U11 starts receiving the clock signal and data signal sent by the function selection circuit board 400 after receiving the low level signal of the cover closing signal photoelectric switch 800 .

[0053] By adding the cover closing signal photoelectric switch 800 and the cover closing light shielding film 900, on the one hand, it can be used to assist in identifying that the electric control board to be tested has been placed in place and fixed by the cover, that is, to ensure that the cover 200 has been closed before the circuit board to be tested is quality inspected; on the other hand, it can reduce the situation where the project selection photoelectric switch 500 is falsely triggered and causes the function selection circuit board 400 and the main control microcontroller U11 to operate invalidly, thereby effectively reducing the energy consumption of the function selection circuit board 400 and the main control microcontroller U11.

[0054] like Figure 2 As shown, the single chip microcomputer U18 of the function selection circuit board 400 receives the low level signal of the cover closing signal photoelectric switch 800 through the J2 terminal.

[0055] When the cover 200 is opened, the project selection light shielding sheet 600 does not block the photosensitive part of the project selection photoelectric switch 500, and the cover closing light shielding sheet 900 does not block the photosensitive part of the cover closing signal photoelectric switch 800. The signal output end of the project selection photoelectric switch 500 and the signal output end of the cover closing signal photoelectric switch 800 maintain a high voltage through the built-in pull-up signal of the microcontroller U18 of the function selection circuit board; when the cover is closed, the project selection light shielding sheet 600 blocks the photosensitive part of the project selection photoelectric switch 500, and the cover closing light shielding sheet 900 blocks the photosensitive part of the cover closing signal photoelectric switch 800. In the optical part, the signal output end of the project selection photoelectric switch 500 and the signal output end of the cover-closing signal photoelectric switch 800 output low-level signals, and the microcontroller U18 of the function selection circuit board 400 starts receiving the signal of the project selection photoelectric switch 500 after receiving the low-level signal of the cover-closing signal photoelectric switch 800; the cooperation method between the cover-closing signal photoelectric switch 800 and the main control microcontroller U11 is the same as described above, wherein the main control microcontroller U11 starts receiving the signal sent by the function selection circuit board 400 after receiving the low-level signal of the cover-closing signal photoelectric switch 800.

[0056] In the embodiment of the present invention, the project selection photoelectric switch 500 preferably adopts a through-beam photoelectric sensor; the cover closing signal photoelectric switch 800 preferably adopts a through-beam photoelectric sensor. The model of the single-chip microcomputer U18 of the function selection circuit board 400 is preferably TM52FE8296; the model of the main control single-chip microcomputer U11 is preferably TM52FE8276. Before performing the above steps, the corresponding program is burned in. TM52FE8276 has a 14.7456MHz fast clock integrated inside. TM52FE8276 uses a new and fast 8051 architecture. Under normal circumstances, TM52 executes instructions six times faster than the traditional 8051 architecture.

[0057] It will be apparent to those skilled in the art that the invention is not limited to the details of the exemplary embodiments described above and that the invention can be implemented in other specific forms without departing from the spirit or essential features of the invention. Therefore, the embodiments should be considered exemplary and non-limiting in all respects, and the scope of the invention is defined by the appended claims rather than the foregoing description, and it is intended that all variations falling within the meaning and scope of the equivalent elements of the claims be included in the invention. Any reference numeral in a claim should not be considered as limiting the claim to which it relates.

Claims

1. A method for selecting multiple items for quality inspection of electric control panels, characterized in that: Methods include: S1, providing a test frame panel and a cover plate that can be opened relative to the test frame panel, the cover plate being used to fix the electric control board to be tested on the test frame panel when closed, and making the test terminals on the test frame panel correspond one to one with the terminals on the electric control board to be tested; S2. Arrange a function selection circuit board on the test rack panel, weld a number of project selection photoelectric switches on the function selection circuit board, the project selection photoelectric switches correspond to the test items one by one, and the cover is provided with installation positions corresponding to the project selection photoelectric switches one by one, the installation positions are used to detachably install the project selection light shielding sheets, and when the cover is closed, the project selection light shielding sheets on the cover shield the corresponding photosensitive parts of the project selection photoelectric switches, after the photosensitive parts of the project selection photoelectric switches are blocked by the project selection light shielding sheets, a low level signal is generated to the microcontroller U18 of the function selection circuit board; S3. Install the light shielding sheet selected by the project at the corresponding installation position according to the requirements of the test project; S4, close the cover so that the electric control board to be tested is fixed on the test frame panel, the project selection light shield on the cover is linked to control the corresponding project selection photoelectric switch to send a low-level signal to the single-chip microcomputer U18 of the function selection circuit board, and the project selection light shield controls the project selection photoelectric switch to select the test item of the electric control board to be tested; S5. After the cover is closed, the single-chip microcomputer U18 on the function selection circuit board receives the low-level signal of each item selection photoelectric switch. After the low-level signal is received, the data is sent to the main control single-chip microcomputer U11 of the quality inspection equipment using the two-wire communication protocol, and the main control single-chip microcomputer U11 enters the next step of data processing; Among them, the two-wire communication protocol is composed of a clock line SCK and a data line SDA. The microcontroller U18 of the function selection circuit board confirms the arrangement of the above-mentioned low-level signals received, that is, by determining which input terminals of the microcontroller U18 of the function selection circuit board connected to the item selection photoelectric switch obtain low-level signals, thereby sorting out and determining the selected detection items, and sending a string of clock signals and data signals corresponding to the selected detection items to the main control microcontroller U11.

2. The method for selecting multiple items for quality inspection of electric control panels according to claim 1, characterized in that: Before performing step S3, a circuit board is arranged on the test frame panel, a cover closing signal photoelectric switch is welded on the circuit board, a cover closing light shield corresponding to the cover closing signal photoelectric switch is fixed on the cover plate, and when the cover plate is closed, the cover closing light shield on the cover plate blocks the photosensitive part of the cover closing signal photoelectric switch, and the cover closing signal photoelectric switch generates a low level signal to the single-chip microcomputer U18 of the function selection circuit board and the main control single-chip microcomputer U11 after the cover closing light shield blocks its photosensitive part; When performing step S4, after closing the cover, the single chip microcomputer U18 of the function selection circuit board starts to receive the low level signal generated by the item selection photoelectric switch after receiving the low level signal of the cover closing signal photoelectric switch; When performing step S5, after closing the cover, the main control microcontroller U11 starts the receiving function to select the clock signal and data signal sent by the circuit board after receiving the low level signal of the cover closing signal photoelectric switch.

3. The method for selecting multiple items for quality inspection of electric control panels according to claim 2, characterized in that: The cover closing signal photoelectric switch adopts a through-beam photoelectric sensor.

4. The method for selecting multiple items for quality inspection of electric control panels according to claim 1, characterized in that: The process of the function selection circuit board receiving the low level signal of the project selection photoelectric switch includes: First, read the signal of each item selection photoelectric switch, sort out and determine the selected detection item after reading the corresponding low-level signal, and send a series of clock signals and data signals corresponding to the selected detection item to the main control microcontroller U11; The part where the low-level signal is not read continues to be read until the detection times out or the main control microcontroller U11 receives the clock signal and the data signal and stops reading. During this period, when a new low-level signal is read, the function selection circuit board adds the newly read part to the signal list, and after sorting out and confirming the new selected detection item, sends a series of clock signals and data signals corresponding to the new selected detection item to the main control microcontroller U11; The main control microcontroller U11 activates the clock signal and data signal received last within the specified time, obtains the final selected detection item, and then proceeds to the next step of data processing; Among them, when the clock signal and data signal received by the main control microcontroller U11 do not correspond to the data on the signal comparison table, the feedback function selects the circuit board to resend the clock signal and data signal.

5. The method for selecting multiple items for quality inspection of electric control panels according to claim 1, characterized in that: The clock signal and data signal sent by the function selection circuit board are transmitted to the main control microcontroller U11 after being isolated by optical couplers.

6. The method for selecting multiple items for quality inspection of electric control panels according to claim 5, characterized in that: The clock signal output terminal SCK of the microcontroller U18 of the function selection circuit board is connected to an N-type field effect transistor Q3, wherein: The gate of the N-type field effect transistor Q3 is connected to the clock signal output terminal SCK of the single-chip computer U18 through the resistor R1, and the gate of the N-type field effect transistor Q3 is also connected to the ground terminal GND through the resistor R6; the source of the N-type field effect transistor Q3 is connected to the ground terminal GND; the drain of the N-type field effect transistor Q3 is connected to at least one optical coupler U2, wherein the positive electrode of the light-emitting part of each optical coupler U2 is connected to the power supply voltage terminal VCC through a pull-down resistor R9, and the negative electrode of the light-emitting part of each optical coupler U2 is connected to the drain of the N-type field effect transistor Q3, and the light-receiving parts of different optical couplers U2 are used to send signals to the clock signal receiving terminals SCK1 of different master single-chip computers U11; The data signal output terminal SDA of the microcontroller U18 of the function selection circuit board is connected to the N-type field effect transistor Q2, wherein: The gate of the N-type field effect transistor Q2 is connected to the data signal output terminal SDA of the microcontroller U18 through a resistor R74, and the gate of the N-type field effect transistor Q2 is also connected to the ground terminal GND through a resistor R54; the source of the N-type field effect transistor Q2 is connected to the ground terminal GND; the drain of the N-type field effect transistor Q2 is connected to at least one optocoupler U23, wherein the positive electrode of the light-emitting part of each optocoupler U23 is connected to the power supply voltage terminal VCC through a pull-down resistor R33, and the negative electrode of the light-emitting part of each optocoupler U2 is connected to the drain of the N-type field effect transistor Q2, and the light-receiving parts of different optocouplers U23 are used to send signals to the data signal receiving terminals SDA1 of different master microcontrollers U11.

7. The method for selecting multiple items for quality inspection of electric control panels according to claim 1, characterized in that: The project selected photoelectric switches using through-beam photoelectric sensors.

8. The method for selecting multiple items for quality inspection of electric control panels according to claim 1, characterized in that: The model of the microcontroller U18 of the function selection circuit board is TM52FE8296.

9. The method for selecting multiple items for quality inspection of electric control panels according to claim 1, characterized in that: The model of the main control microcontroller U11 is TM52FE8276.

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