Cloth defect processing method and cloth inspection and cutting system
By using machine vision and artificial intelligence to locate fabric defects in textile production and plotting them on the raw material pattern, combined with a cutting system to optimize the cutting scheme, the problems of low efficiency and high cost of traditional manual inspection have been solved, thereby improving fabric utilization and finished product quality.
Patent Information
- Application Number
- CN202110454898.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2021-04-26
- Publication Date
- 2025-12-23
- Estimated Expiration
- 2041-04-26
AI Technical Summary
In current textile production, fabric defect detection relies on manual inspection, which is inefficient, labor-intensive, and results are highly subjective. It is impossible to assess the impact of defects before garment production, resulting in high production costs, high quality risks, and limited improvements in automated equipment.
This paper provides a method for handling fabric defects. The defects are located by machine vision and artificial intelligence, drawn on the fabric pattern, and matched with the cutting plan to optimize the cutting method to reduce the waste ratio. Combined with the fabric inspection and cutting system, the defect assessment and cutting are automated.
It enables objective assessment and optimized cutting of fabric defects, reduces waste ratio, improves fabric utilization and finished product quality assurance, reduces production costs, and improves textile production efficiency.
Smart Images

Figure CN115249224B_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application belongs to the technical field of textile production process and equipment, and particularly relates to a fabric flaw processing method and a corresponding cloth inspection and cutting system. BACKGROUND
[0002] China is one of the world's textile industry bases, and the textile industry plays an important role in the country's economic development. At present, on the one hand, China is facing the pressure of poor domestic sales of textile and garment and significant decline in textile and garment exports; on the other hand, the labor cost is rising at a faster rate than the productivity improvement, and the survival pressure of enterprises is increasing. In the new stage of industrial transformation, major textile enterprises are striving to improve their product quality, and high standards mean higher fabric detection and cutting costs. How to reduce manual participation, improve fabric raw material utilization, optimize cutting methods, and accelerate production automation is the challenge currently faced.
[0003] The textile industry has clear divisions, and its industry chain includes the production and processing of raw materials, textile processing, garment manufacturing, and finally the consumer. Taking a garment manufacturing enterprise as an example, a cloth inspection line is generally set up at different production sites to perform a fabric flaw inspection process; a fabric office performs fabric pattern management and input; and a cutting line performs cutting control according to the fabric pattern and fabric raw material.
[0004] The garment manufacturing enterprise has found in production that if a flaw appears in an important area such as the neckline or chest (in this application, the area on the fabric corresponding to these important areas is referred to as a sub-block of the fabric. The sub-block of the fabric has a huge impact on the quality of the entire garment.), i.e., the flaw is located on the sub-block of the fabric, then the garment needs to be abandoned as a whole; and a flaw appearing in an unimportant location such as the pant leg has a smaller impact on the quality of the entire garment. In the existing production mode, the garment manufacturing enterprise can only judge the fabric quality according to the fabric raw material grade provided by the cloth factory, and the final garment effect can only be understood after cutting, and once the fabric is cut, it is assumed that the fabric is accepted, which increases the quality risk and increases the production cost of the enterprise.
[0005] In the traditional fabric flaw processing method, the main process is fabric flaw inspection, which has been manually inspected for a long time, and the efficiency is low, the labor intensity is high, and the inspection result is subjective and not reliable. Based on the development of science and technology, machine vision and artificial intelligence have been applied to fabric flaw detection, and some defects in manual detection have been improved. However, fabric flaw processing is still an independent quality inspection process, and its result is mainly used for quality standard evaluation. The production space layout and process stage time sequence limit the optimization of overall production efficiency even if automatic intelligent manufacturing equipment is invested to improve fabric flaw detection, which is not conducive to the further development of textile enterprises.
[0006] Therefore, it is very necessary to study a cloth defect processing method and a corresponding cloth inspection and cutting system, which can be applied to textile production, especially clothing enterprises, can inspect and evaluate cloth defects before clothing production, combines cloth defects with cloth cutting blank map, provides an optimized cutting scheme, reduces quality risk, saves cost, strengthens enterprise competitiveness, and further promotes the in-depth development of textile production industry and the improvement of industry level.
[0007] The above information disclosed in the background section is only for the purpose of strengthening the understanding of the background of the present application, and therefore it can include information that does not constitute the prior art known to those of ordinary skill in the art. The content of the background section is only the known technology of the discloser, and does not necessarily represent the prior art in the art. SUMMARY
[0008] To solve all or part of the problems of the prior art, the present application provides a cloth defect processing method, which is suitable for cloth defect inspection and positioning, and matches with a blank map to guide cutting optimization. Another aspect of the present application provides a cloth inspection and cutting system, which can realize the cloth defect processing method of the present application.
[0009] The cloth defect processing method provided by the present application comprises the following steps: S1. positioning defects, obtaining defect coordinates and recording defect levels; S2. obtaining cutting cloth contour information in the blank map and basic information of the blank map; S3. drawing defects on the blank map according to the defect coordinates and the cutting cloth contour information; and S4. selecting cloth for cutting according to the blank map with defects drawn.
[0010] In the step S1, basic information of the cloth is also collected, and the basic information includes cylinder number and match number. The positioning of the defects is based on the defect labels marked by the cloth inspector.
[0011] In the step S2, the basic information of the blank map includes the length and width of the blank map. In the step S2, the obtained cutting cloth contour information and the basic information of the blank map are displayed, and based on the display content, the blank map is labeled, and the labeling content includes the tolerable defect level of the cutting cloth and the sub-block of the cutting cloth. The sub-block is an important area that cannot accept defects when the cutting cloth is used to make clothes.
[0012] In the step S4, if there is a defect with a defect level higher than the tolerable defect level of the sub-block falling into the sub-block or a defect with a defect level higher than the tolerable defect level of the cutting cloth falling into the cutting cloth, the cutting cloth is determined as waste. The area of the waste and the proportion of the waste area to the area of the whole cloth, i.e. the waste ratio, are calculated.
[0013] In the step S4, the designated blank drawing with the defect is matched with the multiple pieces of cloth, the number of patterns for making clothes and the length of the remaining cloth are calculated, the cloth suitable for the blank drawing is selected according to the matching result of each piece of cloth, the matching result includes the number of patterns for making clothes and the length of the remaining cloth, and the waste area and / or the waste ratio.
[0014] In the step S4 or after the step S4, the quality of the cloth is evaluated, and the evaluation standard includes the waste area and / or the waste ratio.
[0015] In the step S4 or after the step S4, the optimal offset distance is obtained, and the offset distance is adjusted according to the optimal offset distance to reduce the waste ratio.
[0016] The optimal offset distance is obtained by presetting the maximum offset distance and the step length for each increase, and searching from the preset offset distance value, and traversing the search according to the preset step length. The adjustment refers to automatic adjustment or manual adjustment according to the optimal offset distance. The optimal waste ratio is obtained by adjustment, so as to save the cloth.
[0017] Another aspect of the present application provides a cloth inspection and cutting system, which comprises a defect collection module, a blank drawing processing module, a defect matching module and a database module. The defect collection module, the blank drawing processing module and the defect matching module are in communication connection with the database module. The defect collection module collects the basic information of the cloth, locates the defect, obtains the defect coordinates and records the defect grade. The blank drawing processing module obtains the cutting cloth contour information in the blank drawing and the basic information of the blank drawing. The defect matching module draws the defect on the blank drawing and calculates the matching result. The database module is used for saving and sharing data.
[0018] In general, at least four computers are included, the defect collection module, the blank drawing processing module, the defect matching module and the database module each include different computers. The computers are connected through an internal local area network. The computers store computer programs and perform operations according to the computer program instructions. The computers can be ordinary computers, servers or workstations, which are configured according to the actual application needs of enterprise production, and are not limited
[0019] The flaw collection module includes a first computer, a metering assembly and an image collection module which are respectively connected with the first computer in communication; the metering assembly is used for acquiring cloth length information; the image collection module includes an industrial camera assembly and an illuminating device; the illuminating device is used for providing light source required by the industrial camera assembly for acquiring images; the first computer receives information acquired by the metering assembly and the image collection module and processes the information.
[0020] The embryo picture processing module includes a second computer; the flaw matching module includes a third computer; the database module includes a fourth computer; the second computer processes input cloth embryo pictures, and uploads processing results to the fourth computer; the third computer reads the processing results of the fourth computer, operates according to the processing results, and uploads operation results to the fourth computer.
[0021] The flaw matching module further includes a display device which is used for displaying matching results through display controls.
[0022] Compared with the prior art, the main beneficial effects of the present application are:
[0023] 1. The cloth flaw processing method of the present application draws flaws on an embryo picture, matches the flaws with cloth, obtains applicable embryo pictures of the cloth in advance, evaluates different influences of flaws at different positions on finished clothes in advance, and objectively evaluates the quality of the cloth; the method is more conducive to selecting cloth with high matching degree with the embryo picture for cutting; the method further obtains an optimal offset distance, adjusts according to the optimal offset distance to reduce the waste ratio, improves cloth utilization efficiency, and guarantees the quality of finished clothes.
[0024] 2. The cloth inspection and cutting system of the present application can realize the cloth flaw processing method of the present application, changes the traditional production process that cannot obtain applicable embryo pictures of each piece of cloth in advance, realizes the combination of flaws and embryo pictures, and can match the flaws with cloth, further obtains matching results for guiding production and quality inspection, is conducive to saving cloth cost, reducing quality risk, realizing objective quality prediction and effective optimization of cutting mode, and is conducive to the optimization or improvement of clothing production technology. BRIEF DESCRIPTION OF DRAWINGS
[0025] Figure 1 The figure is a cloth inspection and cutting system of the first embodiment of the present application.
[0026] Figure 2 The figure is a communication format diagram of the metering assembly and the first computer in the first embodiment of the present application.
[0027] Figure 3A cloth defect processing method schematic diagram for the embodiment one of the present application.
[0028] Figure 4 A matching result schematic diagram for the embodiment one of the present application.
[0029] Figure 5 An image processing flow schematic diagram for the embodiment two of the present application.
[0030] Figure 6 A matching result schematic diagram for the embodiment two of the present application. DETAILED DESCRIPTION
[0031] The technical solutions in the specific embodiments of the present application will be described clearly and completely below. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all the other embodiments obtained by those skilled in the art without creative work fall within the protection scope of the present application.
[0032] The above and / or additional aspects and advantages of the present application will become apparent and be readily understood from the following description, taken in conjunction with the following drawings. In the drawings, similar reference characters denote similar elements throughout the several views, but the use of these reference characters in not intended to limit the scope of the application. The figures shown in the drawings are not necessarily drawn to scale.
[0033] The operations of the embodiments are described in the following embodiments in a specific order, and the description of the order is for better understanding of the details in the embodiments to fully understand the present application, but the description of the order does not necessarily correspond to the method of the present application, and cannot limit the scope of the present application.
[0034] It should be noted that the flowcharts and block diagrams in the drawings illustrate the operation processes that can be implemented according to the method of the embodiments of the present application. It should also be noted that in some alternative implementations, the functions marked in the blocks can also occur in a different order from that marked in the drawings. For example, two blocks represented in succession can actually be executed substantially in parallel, and they can also be executed in an interleaved manner, depending on the purpose to be achieved by the steps involved. It should also be noted that each block in the block diagram and / or flowchart, and the combination of blocks in the block diagram and / or flowchart, can be implemented by a dedicated hardware-based system that performs the specified functions or operations, or can be implemented by a combination of dedicated hardware and manual operation.
[0035] Embodiment one
[0036] In the embodiment one of the present application, as shown in the following, Figure 1As shown, the cloth inspection and cutting system comprises a defect collection module 1, a blank map processing module 2, a defect matching module 3 and a database module 4; the defect collection module 1, the blank map processing module 2, the defect matching module 3 are respectively in communication connection with the database module 4, can share the data of the database module 4, and can upload respective data to the database module 4 for storage; the defect collection module 1 collects basic information of cloth, locates defects, obtains defect coordinates and records defect levels; the blank map processing module 2 obtains cutting cloth contour information in the blank map and basic information of the blank map; the defect matching module 3 draws defects on the blank map and calculates to obtain a matching result; the database module 4 is used for saving and sharing data, data in the production process can be saved and is convenient for other production links to summarize and analyze data in the cloth inspection and cutting process, which is beneficial to improvement of subsequent production processes. In the embodiment, the defect collection module 1 is arranged in the cloth inspection assembly line A, the blank map processing module 2 is arranged in the blank office B, and the defect matching module 3 is arranged on the cutting assembly line C. The database module 4 is arranged in the enterprise according to actual factory space layout. In the embodiment, the cloth inspection and cutting system based on the C / S architecture further comprises four computers in communication connection through an enterprise internal local area network, which are respectively a first computer 11 of the defect collection module 1, a second computer 21 of the blank map processing module 2, a third computer 31 of the defect matching module 3 and a fourth computer of the database module 4. In the embodiment, the first computer 11, the second computer 21 and the third computer 31 are ordinary computers, i.e. conventional PC machines. The fourth computer is a database server. The computers can all be servers or different types of computers respectively, such as workstations, mobile intelligent devices and the like; the computers can also be more than four, configured according to production needs, and are not limited. In some cases, the database module 4 can also not be arranged in the enterprise, but for example, an internet-connected cloud database and the like, and is not limited. Communication connection through the enterprise internal local area network is beneficial to security and confidentiality of enterprise production data.
[0037] The display device of the defect matching module 3, i.e. the display of the third computer 31, displays the matching result on the interface through display controls. In other specific applications, the display device can also be a separate large screen or a movable tablet display convenient for an operator to carry; the display device can also be in communication connection with the database module 4 only for displaying the matching result saved by the database module 4, and is not limited. The display device can comprise one display screen or multiple display screens, when there are multiple display screens, display contents of the display controls can be synchronous or different contents can be displayed on different display screens according to actual application scene needs or not all screens display contents at the same time, and are not limited.
[0038] In the embodiment, the flaw collecting module 1 further comprises a metering assembly 12 and the image collecting module, which are respectively in communication connection with the first computer 11. The image collecting module comprises an industrial camera assembly 131 and the lighting device (not shown). The lighting device is used to provide the light source required by the industrial camera assembly 131 to acquire images. The industrial camera assembly 131 is in communication connection with the first computer 11 to input the acquired images into the first computer 11 for subsequent image processing. In the embodiment, the metering assembly 12 comprises a single-chip microcomputer and a meter. The meter can be a commonly used meter in the art. The single-chip microcomputer receives the pulse signal of the meter and converts it into the length information of the cloth, and is connected with the PC through the RS485 interface. In the embodiment, the communication format between the metering assembly and the first computer 11 (PC) is as shown in Figure 2 In the embodiment, the industrial camera assembly 131 is composed of two area array cameras and lenses. The cameras adopt two Hikvision MV-CA060-11GM cameras, and the lenses are Hikvision MVL-HF0628M-6MP, the lens size is 2 / 3 inch, and the focal length is 8 mm. The cameras are in communication connection with the first computer 11 through a PoE switch.
[0039] In the embodiment, as shown in Figure 3The cloth defect processing method shown includes: step S1. locating the defect, obtaining the defect coordinates and recording the defect level; step S2. obtaining the cutting cloth contour information in the blank picture and the basic information of the blank picture; step S3. according to the defect coordinates and the cutting cloth contour information, the defect is drawn on the blank picture; step S4. according to the blank picture with the defect drawn, the cloth is selected for cutting. The basic information of the cloth is also collected in step S1, and the basic information includes cylinder number and match number; the "defect positioning" is based on the defect label marked by the cloth inspector. The basic information of the blank picture in step S2 includes the length and width of the blank picture; the obtained cutting cloth contour information and the basic information of the blank picture are also displayed in step S2, based on the display content, the blank picture is labeled, and the labeling content includes the tolerable defect level of the cutting cloth and the sub-block of the cutting cloth; the sub-block is the important area that cannot accept defects when the cutting cloth is used to make clothes. In step S4, if there is a defect with a defect level higher than the tolerable defect level of the sub-block falling into the sub-block or a defect with a defect level higher than the tolerable defect level of the cutting cloth falling into the cutting cloth, the cutting cloth is determined as waste; the area of the waste and the proportion of the waste area to the area of the whole cloth, i.e. the waste ratio, are calculated. In this embodiment, the defect level is divided into multiple levels according to the severity of the defect, and the tolerable defect level of the sub-block is lower than the tolerable defect level of the corresponding cutting cloth.
[0040] In this embodiment, after step S4, the cloth quality is also evaluated, and the evaluation standard includes the waste area and the waste ratio. In this embodiment, the area and the proportion of the discarded cloth after cutting and making clothes are used to measure the quality of the cloth, and the traditional cloth quality evaluation standard only relies on the type of defect to deduct points, often ignoring the influence of the position of the defect on the overall quality. The evaluation standard of this embodiment also considers the different influence degrees of defects at different positions on the finished clothes on the basis of the traditional method, and the evaluation standard is more objective and comprehensive. The evaluation standard can also select one of the waste area and the waste ratio, and the quality evaluation can also be performed in step S4, and is not limited.
[0041] This embodiment further includes obtaining the best offset distance after step S4, and adjusting according to the best offset distance to reduce the waste ratio. The best offset distance includes a preset maximum offset distance and an increasing step each time, and the search starts from the preset offset distance value and traverses the search according to the preset step. In this embodiment, the adjustment refers to manual adjustment according to the best offset distance. The final single cloth matching result is as follows Figure 4As shown, the black area represents fabric defects, the X area represents waste, the Y and Z areas represent different tolerable defect levels of the cut fabric, and the Q1 and Q2 areas in the Z cut fabric represent sub-blocks with different tolerable defect levels.
[0042] Embodiment Two
[0043] In Embodiment Two, the processing of the image acquisition module 1 is specifically an image processing software realized by using HALCON machine vision software in combination with QT programming. The operation flow of the image processing software is as shown in Figure 5 As shown, the main parts include image splicing, image cutting, edge extraction, label classification, and result screening. In this embodiment, the original file of the fabric image is in pdf format, and the parts to be extracted include text and cutting fabric coordinate information. The above work can be completed by using pdfminer3k in python. The extracted coordinates first need to remove the inner contour of the fabric. The inner contour in the original contour array is an even index, and only the odd index points need to be extracted to obtain the result. In addition, since the extracted points use the Cartesian coordinate system, and the QT program uses the image coordinate system, the coordinates need to be converted according to the height of the display control. The formula is as follows:
[0044]
[0045] In this embodiment, the image obtained can be displayed on the PC display of the first computer 11, or on any PC, and of course can also be displayed through the display device of the defect matching module 3, and is not limited.
[0046] In this embodiment, QT is a graphical user program framework, which is an object-oriented encapsulation of the underlying application programming interface API. It is a class library based on C++ language, focusing on but not limited to the development of graphical user interface, and can also be used for system call, network programming, database, 2D / 3D graphics processing. The QT program in this embodiment uses QT programming. Since it is based on C++ language, it is simple, easy to use, object-oriented (for GTK), has excellent cross-platform characteristics, and is easy to extend. The flow and specific software in this embodiment are for the purpose of facilitating the understanding of this embodiment, but they cannot limit the specific ways and methods of image processing in other actual cases.
[0047] In this embodiment, the specific method for calculating the area of the waste is realized by integrating the defect matching software in the defect matching module 3. When the defect matching software is running, the operation is first performed according to the length information of the fabric and the width of the fabric cutting fabric image to calculate the number of times of repeated expansion Then the labeled cutting material map is combined with the defect position information. If there is a defect falling into the sub-block or a defect falling into the cutting material itself which is higher than the tolerable level, it is calculated as waste, and finally the area of the waste is calculated. The polygon area calculation uses the Gauss area formula. Suppose the number of vertices of a polygon is n, and its area is , the coordinates of any vertex are The formula is as follows:
[0048]
[0049] Wherein
[0050] In this embodiment, the maximum offset distance of the search and the step length of each increase are configured in advance in the defect matching software. The search starts from the offset distance preset value of 0 cm, the best offset distance is automatically obtained, and the adjustment is automatically made according to the best offset distance. The optimal waste ratio is obtained through the adjustment, so as to save the cloth.
[0051] In this embodiment, in the step S4, a cloth with a drawn defect is matched with multiple cloths, and the number of clothing patterns and the remaining cloth length of each cloth are calculated. According to the matching result of each cloth, the cloth suitable for the specified material is selected for cutting. The matching result includes the number of clothing patterns and the remaining cloth length, and also includes the waste area and / or the waste ratio. The matching result of multiple cloths is shown in Figure 6 , which shows the information such as the length loss (remaining cloth length), waste ratio, and number of clothing patterns of each cloth after the specified material map is matched with multiple cloths. According to the matching result, the most suitable cloth for the specified material can be selected manually or automatically according to the preset rule for cutting, which optimizes the cutting method.
[0052] Some common English names or letters used for the convenience of clear description in the present application are only used for exemplary reference and are not limited to the protection scope of the present application. It should be noted that in the present application, the relationship terms such as "first" and "second" are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between the entities or operations. Moreover, the terms "include", "contain" or any other variants are intended to cover non-exclusive inclusion, so that the process, method, article or equipment including a series of elements not only includes those elements, but also includes other elements not explicitly listed or inherent to such process, method, article or equipment. The data and graphics in the schematic diagram of the present application are a kind of schematic or example, and cannot be limited to the present application due to the data or graphics shown in the schematic diagram.
[0053] The present application has been described in detail above, and specific examples have been applied in the present application to describe the structure and working principle of the present application. The above examples are only used to help understand the method and core idea of the present application. It should be pointed out that for ordinary skilled persons in the technical field, some improvements and modifications can be made to the present application without departing from the principles of the present application, and these improvements and modifications also fall within the scope of protection of the claims of the present application.
Claims
1. A fabric defect processing method characterized by comprising: The method comprises the following steps: S1. Locating the defects, obtaining the coordinates of the defects and recording the defect levels; S2. Obtaining the cutting cloth contour information in the blank map and the basic information of the blank map; S3. Drawing the defects on the blank map according to the defect coordinates and the cutting cloth contour information; S4. Selecting the cloth for cutting according to the blank map with the defects drawn thereon. The basic information of the blank map in the step S2 includes the length and width of the blank map. In the step S2, the obtained cutting cloth contour information and the basic information of the blank map are displayed, and the blank map is labeled based on the display content. The labeling content includes the defect levels that the cutting cloth can tolerate, the sub-blocks of the cutting cloth and the defect levels that the sub-blocks can tolerate. The sub-blocks are important areas that cannot accept defects when clothes are made from the cutting cloth. In the step S4, if the defects higher than the defect levels that the sub-blocks can tolerate fall into the sub-blocks or the defects higher than the defect levels that the cutting cloth can tolerate fall into the cutting cloth, the cutting cloth is determined as waste.
2. The fabric defect processing method according to claim 1, wherein: In the step S1, the basic information of the cloth is also collected, and the basic information includes the cylinder number and the match number. The locating of the defects is performed according to the defect labels marked by the cloth inspectors.
3. The fabric defect processing method according to claim 1, wherein: The area of the waste and the proportion of the waste area to the area of the whole cloth, i.e. the waste ratio, are calculated.
4. The fabric defect processing method according to claim 3, wherein: In the step S4, a specified blank map with the defects drawn thereon is matched with multiple pieces of cloth, and the number of the cutting patterns and the remaining cloth length for making clothes from the specified blank map are calculated. According to the matching results of each piece of cloth, the cloth suitable for the blank map is selected for cutting. The matching results include the number of the cutting patterns and the remaining cloth length, and also include the waste area and / or the waste ratio.
5. The fabric defect processing method according to claim 3, wherein: In the step S4 or after the step S4, the quality of the cloth is also evaluated, and the evaluation standard includes the waste area and / or the waste ratio.
6. The fabric defect processing method according to claim 3, wherein: In the step S4 or after the step S4, the best offset distance is obtained, and the waste ratio is reduced by adjusting according to the best offset distance.
7. A cloth inspection and cutting system characterized by: A cloth defect processing method for realizing any one of claims 1-6 comprises a defect collection module, a blank map processing module, a defect matching module and a database module. The defect collection module, the blank map processing module and the defect matching module are respectively in communication connection with the database module. The defect collection module collects the basic information of the cloth, locates the defects, obtains the coordinates of the defects and records the defect levels. The blank map processing module obtains the cutting cloth contour information in the blank map and the basic information of the blank map. The defect matching module draws the defects on the blank map and calculates the matching results. The database module is used for saving and sharing data.
8. A cloth inspecting and cutting system according to claim 7, characterized in that: The method comprises the following steps: The flaw collection module comprises a first computer, a metering assembly and an image collection module which are respectively connected with the first computer in communication; the metering assembly is used for acquiring cloth length information; the image collection module comprises an industrial camera assembly and an illuminating device; the illuminating device is used for providing a light source required by the industrial camera assembly for acquiring images; the first computer receives information acquired by the metering assembly and the image collection module and processes the information; The embryo picture processing module comprises a second computer; the flaw matching module comprises a third computer; the database module comprises a fourth computer; the second computer processes input cloth embryo pictures and uploads processing results to the fourth computer; the third computer reads the processing results of the fourth computer, operates according to the processing results and uploads operation results to the fourth computer.
9. A cloth sampling and cutting system according to claim 7 or 8, wherein: The flaw matching module further comprises a display device which is used for displaying matching results through display controls.