Measuring Device for Fixed Point Shot Peening, Control Method and Device for Moving Shot Peening

Through the fixed-point shot peening measurement device and the mobile shot peening control method, the problem of non-uniformity of the pellet distribution is solved, uniform coverage of the workpiece surface is achieved, and the fatigue strength and service life of the workpiece are improved.

CN115541453BActive Publication Date: 2025-08-05SUZHOU UNIV
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Patent Information

Application Number
CN202211166626.0
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2022-09-23
Publication Date
2025-08-05
Estimated Expiration
2042-09-23

AI Technical Summary

Technical Problem

In the prior art, due to the non-uniformity of the distribution of jet pellets, some areas are oversaturated and some areas are undersaturated, which affects the strengthening quality and service life of the workpiece surface.

Method used

Using a fixed-point shot peening measurement device and a control method for mobile shot peening, the pellet mass distribution is obtained through the measurement device, the pellet cover mass parameters are calculated, the optimization function is established, and the control parameters of mobile shot peening are optimized to achieve uniform coverage of the pellets.

Benefits of technology

The uniform coverage of the pellets on the surface of the workpiece is achieved, and the fatigue strength and service life of the workpiece are improved.

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Abstract

The present application discloses a measuring device for fixed-point shot peening, a control method and device for mobile shot peening. The control method includes obtaining the target pellet coverage quality; determining the fixed-point shot peening dwell time parameter of the unit area; determining the fixed-point shot peening mass distribution parameter of the unit area; determining the pellet coverage quality parameter of the unit area; establishing an optimization function, and optimizing the control parameters of the mobile shot peening based on the optimization function. The present application can calculate the pellet coverage quality parameter of the unit area during the mobile shot peening process based on the fixed-point shot peening pellet mass distribution parameter under the given parameters measured by the measuring device; based on the pellet coverage quality parameter of the unit area, it can be compared with the target pellet coverage quality parameter, so as to construct an optimization function, and obtain the optimized mobile shot peening parameters based on the optimization function, which helps to achieve uniform coverage of the pellets on the workpiece surface and is of great significance for improving the fatigue strength of the workpiece.
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Description

Technical Field

[0001] This application belongs to the technical field of material surface strengthening, and specifically relates to a measuring device for fixed-point shot peening, a control method and device for moving shot peening. Background Art

[0002] Components such as aircraft engine blades, airframe structural parts, and automotive drive train parts are in service under high-stress conditions for a long time. During service, under the action of cyclic loads, fatigue fracture is extremely likely to occur, reducing the service life of the workpiece, and further affecting the service life of aircraft, automobiles, etc., and even endangering personal safety. Shot peening, by spraying shot particles to impact the surface of the workpiece, causes plastic deformation on the surface of the workpiece and introduces a surface strengthening layer, which can effectively improve the fatigue strength of the workpiece surface and is widely used to improve the service life of workpieces under cyclic load conditions.

[0003] The coverage of shot particles is an important index for evaluating the shot peening effect and is crucial for ensuring the surface strengthening quality and the service life of the workpiece. In the prior art, when the workpiece size is large and the nozzle used is small, the sprayed shot particles are not sufficient to cover the entire surface of the workpiece. At this time, due to the non-uniform distribution of the sprayed shot particles, non-uniform coverage of the spraying area will inevitably occur, that is, some areas are oversaturatedly covered and some areas are undersaturatedly covered, thereby affecting the strengthening quality and service life of the workpiece surface. Summary of the Invention

[0004] The purpose of this application is to provide a measuring device for fixed-point shot peening, a control method and device for moving shot peening, so as to solve the problem in the prior art that due to the non-uniform distribution of the sprayed shot particles, non-uniform coverage of the spraying area will inevitably occur, that is, some areas are oversaturatedly covered and some areas are undersaturatedly covered, thereby affecting the strengthening quality and service life of the workpiece surface.

[0005] To achieve the above purpose, a technical solution adopted in this application is:

[0006] A measuring device for fixed-point shot peening is provided, including:

[0007] A receiving member having a receiving surface, the receiving surface of the receiving member is divided into a number of uniformly arranged regions by a grid structure, each of the regions is provided with a receiving hole, the receiving hole extends in a direction perpendicular to the receiving surface into the receiving member, and the aperture of the receiving hole is larger than the shot particles;

[0008] A shot peening member disposed on one side of the receiving surface of the receiving member, the shot peening member is used to spray shot particles towards the receiving surface in a direction perpendicular to the receiving surface;

[0009] A detecting member disposed at the bottom of the receiving hole, the detecting member is used to detect the mass of the shot particles sprayed into the receiving hole.

[0010] In one or more embodiments, a time acquisition unit is further included, and the time acquisition unit is signal - connected to the shot peening part to record the spraying duration.

[0011] In one or more embodiments, the detection unit is a pressure sensor.

[0012] To achieve the above object, another technical solution adopted by this application is:

[0013] Provide a control method for mobile shot peening, including:

[0014] Obtain the target pellet coverage quality to determine the target pellet coverage quality per unit area of the surface to be processed;

[0015] Based on the size of the unit area and the mobile shot peening rate, determine the fixed - point shot peening residence duration parameter of the unit area;

[0016] Based on the fixed - point shot peening residence duration parameter and the preset pellet mass distribution per unit time, determine the fixed - point shot peening mass distribution parameter of the unit area;

[0017] Based on the fixed - point shot peening mass distribution parameter and the mobile shot peening trajectory, determine the pellet coverage quality parameter of the unit area;

[0018] Based on the pellet coverage quality parameter and the target pellet coverage quality, establish an optimization function, and optimize the control parameters of the mobile shot peening based on the optimization function.

[0019] In one or more embodiments, the step of determining the pellet coverage quality parameter of the unit area based on the fixed - point shot peening mass distribution parameter and the mobile shot peening trajectory includes:

[0020] Based on the mobile shot peening trajectory, determine the sweeping information of the unit area, and the sweeping information includes the fixed - point shot peening order of the unit area in the current mobile shot peening trajectory;

[0021] Based on the fixed - point shot peening mass distribution parameter and the sweeping information of the unit area, determine the pellet coverage quality parameter of the unit area.

[0022] In one or more embodiments, the step of determining the sweeping information of the unit area based on the fixed - point shot peening mass distribution parameter and the mobile shot peening trajectory includes:

[0023] Based on the mobile shot peening trajectory, determine the fixed - point shot peening information for sweeping the unit area, and the fixed - point shot peening information includes the shot peening points of the fixed - point shot peening;

[0024] Based on the fixed - point shot peening information, determine the sweeping information of the unit area.

[0025] In one or more embodiments, the step of establishing an optimization function based on the pellet coverage quality parameter and the target pellet coverage quality and optimizing the control parameters of the mobile shot peening based on the optimization function includes:

[0026] Calculating the deviation value of the unit area, where the deviation value is the absolute value of the difference between the pellet coverage quality parameter of the unit area and the target pellet coverage quality;

[0027] Traversing the unit area to sum the deviation values of all unit areas to establish an optimization function;

[0028] Optimizing the mobile shot peening rate in the direction of minimizing the optimization function.

[0029] In one or more embodiments, the mobile shot peening trajectory includes at least two parallel and spaced one-way sweeping trajectories.

[0030] After the step of optimizing the mobile shot peening rate in the direction of minimizing the optimization function, the following steps are further included:

[0031] Optimizing the spacing of the parallel and spaced one-way sweeping trajectories in the direction of minimizing the optimization function.

[0032] To achieve the above object, another technical solution adopted by the present application is:

[0033] Providing a control device for mobile shot peening, including:

[0034] An acquisition module, configured to acquire the target pellet coverage quality to determine the target pellet coverage quality of the unit area of the surface to be processed;

[0035] A first determination module, configured to determine the fixed-point shot peening residence time parameter of the unit area based on the size of the unit area and the mobile shot peening rate;

[0036] A second determination module, configured to determine the fixed-point shot peening mass distribution parameter of the unit area based on the fixed-point shot peening residence time parameter and the preset pellet mass distribution per unit time;

[0037] A third determination module, configured to determine the pellet coverage quality parameter of the unit area based on the fixed-point shot peening mass distribution parameter and the mobile shot peening trajectory;

[0038] An optimization module, configured to establish an optimization function based on the pellet coverage quality parameter and the target pellet coverage quality, and optimize the control parameters of the mobile shot peening based on the optimization function.

[0039] To achieve the above object, another technical solution adopted by the present application is:

[0040] Provided is an electronic device, including:

[0041] at least one processor; and

[0042] a memory storing instructions, which when executed by the at least one processor, cause the at least one processor to execute the control method of mobile shot peening according to any of the above embodiments.

[0043] To achieve the above object, another technical solution adopted by this application is:

[0044] Provided is a machine-readable storage medium storing executable instructions, which when executed cause the machine to execute the control method of mobile shot peening according to any of the above embodiments.

[0045] Different from the prior art, the beneficial effects of this application are:

[0046] The measuring device for fixed-point shot peening of this application can measure the pellet mass distribution law of fixed-point shot peening under given parameters, which helps to plan the mobile shot peening rate and the mobile shot peening trajectory during the mobile shot peening process, and helps to ensure the uniform coverage of pellets during the mobile shot peening process;

[0047] This application can calculate the pellet coverage mass parameter per unit area during the mobile shot peening process based on the fixed-point shot peening pellet mass distribution parameter measured by the measuring device under given parameters; based on this pellet coverage mass parameter per unit area, it can be compared with the target pellet coverage mass parameter, thereby constructing an optimization function, and obtaining optimized mobile shot peening parameters based on the optimization function, which helps to achieve uniform coverage of pellets on the workpiece surface and is of great significance for improving the fatigue strength of the workpiece. Description of the Drawings

[0048] Figure 1 is a schematic structural diagram of an embodiment of the measuring device for fixed-point shot peening of this application;

[0049] Figure 2 is a schematic internal structural diagram of an embodiment of the measuring device for fixed-point shot peening of this application;

[0050] Figure 3 is a schematic working state structural diagram of an embodiment of the measuring device for fixed-point shot peening of this application;

[0051] Figure 4 is a schematic flowchart of an embodiment of the control method of mobile shot peening of this application;

[0052] Figure 5 is a discrete schematic diagram of the mobile shot peening process of this application;

[0053] Figure 6 isFigure 4 Flow schematic diagram of an embodiment corresponding to step S400;

[0054] Figure 7 is Figure 6 Flow schematic diagram of an embodiment corresponding to step S401;

[0055] Figure 8 is Figure 4 Flow schematic diagram of an embodiment corresponding to step S500;

[0056] Figure 9 Block diagram of an embodiment of the control device for mobile shot peening of the present application;

[0057] Figure 10 Hardware structure diagram of an embodiment of the electronic device of the present application. Specific embodiments

[0058] The present application will be described in detail below in conjunction with the various embodiments shown in the drawings. However, these embodiments do not limit the present application, and any structural, method, or functional transformation made by those of ordinary skill in the art based on these embodiments is included within the protection scope of the present application.

[0059] As described in the background art, when shot peening the surface of a workpiece, the coverage of shot pellets is an important index for evaluating the shot peening effect, and is crucial for ensuring the surface strengthening quality and the service life of the workpiece. During mobile shot peening, the shot peening head is constantly moving, and at the same time, the distribution of shot pellets is also uneven, which is very likely to cause non-uniform coverage of shot pellets during the shot peening strengthening process, that is, some areas are oversaturatedly covered and some areas are undersaturatedly covered, thereby affecting the strengthening quality and service life of the workpiece surface.

[0060] To solve the above problems, the applicant has developed a measuring device for fixed-point shot peening, a control method and device for mobile shot peening. The measuring device for fixed-point shot peening can measure the distribution of shot pellets during the fixed-point shot peening process, so as to obtain the shot pellet mass distribution in different regions under fixed-point shot peening with specific parameters.

[0061] The control method for mobile shot peening can predict the shot pellet coverage quality parameters in different regions of the surface to be processed of the workpiece during the mobile shot peening process based on the shot pellet mass distribution in different regions obtained by the measuring device, and thus optimize the control parameters for mobile shot peening based on the shot pellet coverage quality parameters, ultimately achieving the purpose of uniform coverage of shot pellets during the shot peening strengthening process.

[0062] Specifically, please refer to Figure 1 and Figure 2 , Figure 1 is a schematic structural diagram of an embodiment of the measuring device for fixed-point shot peening of the present application, Figure 2It is a schematic internal structure diagram of an embodiment of the measuring device for fixed-point shot peening of the present application.

[0063] The measuring device includes a receiving member 10, a shot peening member 20 and a detecting member 30.

[0064] The receiving member 10 has a receiving surface 100, and the receiving surface 100 is divided by a grid structure into a number of uniformly arranged regions. Each region is provided with a receiving hole 101, and the receiving hole 101 extends inwardly along a direction perpendicular to the receiving surface.

[0065] The aperture of the receiving hole 101 is larger than the shot pellets, so that the shot pellets can be sprayed into the interior of the receiving hole.

[0066] The shot peening member 20 is arranged on one side of the receiving surface 100 of the receiving member 10, and the shot peening member 202 is used to spray shot pellets towards the receiving surface 100 along a direction perpendicular to the receiving surface 100.

[0067] The detecting member 30 is arranged at the bottom of the receiving hole 101 and is used to detect the quality of the shot pellets sprayed into the interior of the receiving hole 101.

[0068] As Figure 3 shown, Figure 3 It is a schematic working state structure diagram of an embodiment of the measuring device for fixed-point shot peening of the present application.

[0069] It can be understood that when shot pellets are sprayed towards the receiving surface 100 through the shot peening member, the shot pellets sprayed towards a specific region will enter the receiving hole 101 of that region. By detecting the number of shot pellets entering the interior of the receiving hole 101, the pellet coverage quality of that region can be obtained.

[0070] It should be noted that in order to ensure the accuracy and perfection of the measurement, it is necessary to ensure that the size of the receiving surface 100 is larger than the coverage range of the shot peening.

[0071] In this embodiment, the receiving surface 100 can be divided by a grid structure into uniformly arranged square regions, and each square region can be provided with a square receiving hole 101, so as to facilitate the numbering of each receiving hole 101. For example, the receiving hole 101 located in the third row and the second column is numbered (3, 2).

[0072] In other embodiments, the receiving surface 100 can also be divided by a grid structure into uniformly arranged regions of other shapes, and other-shaped receiving holes 101 are provided in each region, which can all achieve the effects of this embodiment.

[0073] In this embodiment, the detecting member 30 can adopt a pressure sensor, and the pressure sensor can collect the pressure signal f in the receiving hole 101 i,j, where i and j are the position numbers of the receiving holes 101. The mass signal m in each receiving hole 101 can be obtained by taking the ratio of the pressure signal to the gravitational acceleration G i,j , that is:

[0074] By taking the ratio of the mass signal to time, the mass of the pellets ejected per unit time in each receiving hole 101, m i,j dt , namely Furthermore, the mass distribution of the pellets per unit time during the fixed-point shot peening of the treated surface can be obtained.

[0075] To facilitate the acquisition of the time signal, a time acquisition unit 40 is further installed on the side of the receiving member 10 in this embodiment. The time acquisition unit 40 is signal-connected to the shot peening member to record the spraying duration. The time acquisition unit 40 can be a chronometer or the like, which can be connected to the shot peening member in a wireless network or any other manner to obtain the spraying time, so as to facilitate the calculation of the mass distribution of the pellets per unit time during the fixed-point shot peening.

[0076] After obtaining the mass distribution parameter of the pellets per unit time during the fixed-point shot peening, the mass coverage parameter of the pellets in different regions of the surface to be treated of the workpiece for moving shot peening can be calculated.

[0077] It can be understood that the shot peening height h and the shot peening flow rate M of the measuring device should be the same as those of the moving shot peening to be optimized to ensure the accuracy and applicability of the data.

[0078] Specifically, please refer to Figure 4 , Figure 4 is a schematic flow chart of an embodiment of the control method for moving shot peening of the present application.

[0079] The control method includes:

[0080] S100. Obtain the target pellet coverage mass to determine the target pellet coverage mass per unit area of the surface to be treated.

[0081] The target pellet coverage mass is the ideal target coverage mass of the treated surface set in advance. According to the target pellet coverage mass, the target pellet coverage mass per unit area of the surface to be treated can be calculated.

[0082] In an application scenario, the division of the unit area can be the same as the area division of the surface of the receiving surface 100, so as to facilitate the subsequent calculation of the pellet coverage of the unit area.

[0083] Exemplarily, the surface to be processed can be divided into a number of square blocks with a side length dimension l that is the same as the cross-sectional dimension of the receiving hole 101 through a square grid, and the target pellet coverage mass per unit area S is preset to be m ave , then the target pellet coverage mass m of a single square block on the surface to be processed can be calculated x,y (i,j)mb , that is:

[0084]

[0085] where x and y are the coordinates of the nozzle movement trajectory, and i and j are the numbers of points on the specific nozzle movement trajectory for the unit area. The position of each unit area can be represented by x, y, i, and j

[0086] It can be understood that in other application scenarios, the surface to be processed may not be divided through a square grid, and the divided square blocks may not have the same cross-sectional dimension as the receiving hole 101, and the effects of this embodiment can be achieved. However, for the convenience of calculation, it is preferred that the division method of the surface to be processed is the same as that of the receiving surface 100

[0087] S200. Based on the size of the unit area and the moving shot peening rate, determine the fixed-point shot peening residence duration parameter of the unit area

[0088] Since the measuring device measures the pellet mass distribution information during the fixed-point shot peening process, the continuous moving shot peening process is discretized into multiple fixed-point shot peening processes, and the moving shot peening process is fitted by the set of multiple fixed-point shot peening processes

[0089] Specifically, please refer to Figure 5 , Figure 5 is a discrete schematic diagram of the moving shot peening process of this application

[0090] Discrete points at uniform intervals can be selected on the moving shot peening trajectory, and each discrete point is used as the shot peening point of a fixed-point shot peening, so as to calculate the fixed-point shot peening residence duration of each discrete point

[0091] In an application scenario, the distance between adjacent discrete points can be set to be the same as the side length dimension l of a single square block. The intersection points of the moving shot peening trajectory and the square network of the surface to be processed can be used as discrete points, so as to facilitate the subsequent calculation of the pellet coverage in a specific square block area during each fixed-point shot peening process. Exemplarily, the fixed-point shot peening residence duration t of each discrete point z can be

[0092] In other application scenarios, the distance between adjacent discrete points can also be set to an integer multiple of the side length dimension l of a single square block. It can be understood that the smaller the distance between adjacent discrete points, the higher the accuracy of calculating the pellet coverage mass after discretizing the moving shot peening process

[0093] Based on the dwell time t of fixed-point shot peening for each discrete point obtained z , the shot peening time t for the unit area in each fixed-point shot peening process can be obtained z , that is, the dwell time parameter of fixed-point shot peening for the unit area

[0094] S300. Determine the fixed-point shot peening mass distribution parameter for the unit area based on the fixed-point shot peening dwell time parameter and the preset pellet mass distribution per unit time

[0095] Since the shot peening time t for the unit area in each fixed-point shot peening process z is known, and at the same time, based on the above measurement device, the preset pellet mass distribution per unit time can be obtained. Therefore, the mass distribution situation of the unit area in each fixed-point shot peening process can be obtained, that is, the fixed-point shot peening mass distribution parameter for the unit area. Specifically, it can be expressed as: m x,y (i,j) = m i, j dt t z .

[0096] where x and y are the nozzle movement trajectory coordinates, and i and j are the numbers of the points on the specific nozzle movement trajectory for the unit area. The position of each unit area can be represented by x, y, i, and j

[0097] S400. Determine the pellet coverage mass parameter for the unit area based on the fixed-point shot peening mass distribution parameter and the moving shot peening trajectory

[0098] Since the moving shot peening trajectory has been determined, the shot peening points of multiple fixed-point shot peenings discrete in the moving shot peening process have been determined. At the same time, the fixed-point shot peening mass distribution parameter for the unit area corresponding to the shot peening point has been determined. Therefore, the pellet mass distribution for the specific unit area in all fixed-point shot peening processes can be calculated, that is, the pellet coverage mass parameter for the unit area is determined

[0099] Specifically, please refer to Figure 6 , Figure 6 which Figure 4 is a schematic flowchart of an implementation manner corresponding to step S400 in

[0100] The method for determining the pellet coverage mass parameter for the unit area includes:

[0101] S401. Determine the sweeping information for the unit area based on the moving shot peening trajectory

[0102] Among them, the sweeping information includes the fixed-point shot peening order of the unit area in the current moving shot peening trajectory. The fixed-point shot peening order includes the position information of the unit area for each fixed-point shot peening. It can be understood that the shot peening points in multiple discrete fixed-point shot peening processes are different. Therefore, for a specific unit area, its relative position to the shot peening point also changes, that is, the values of i and j of the unit area change.

[0103] Based on the moving shot peening trajectory, determine the position information of the unit area in each fixed-point shot peening process, that is, the sweeping information of the unit area, and then the pellet mass distribution of the unit area in each fixed-point shot peening process can be obtained based on the above-mentioned fixed-point shot peening mass distribution parameters.

[0104] Specifically, please refer to Figure 7 , Figure 7 which Figure 6 is a schematic flowchart of an implementation manner corresponding to step S401 in

[0105] The method for determining the sweeping information of the unit area includes:

[0106] S4011. Based on the moving shot peening trajectory, determine the fixed-point shot peening information of the swept unit area.

[0107] First, according to the moving shot peening trajectory, the shot peening points of each fixed-point shot peening can be obtained, that is, the fixed-point shot peening information of the unit area.

[0108] S4012. Based on the fixed-point shot peening information, determine the sweeping information of the unit area.

[0109] After obtaining the position coordinates x and y of the shot peening points of each fixed-point shot peening, the numbers i and j of any unit area relative to the shot peening point can be obtained, and then the sweeping information of the unit area can be determined.

[0110] S402. Based on the fixed-point shot peening mass distribution parameters and the sweeping information of the unit area, determine the pellet coverage mass parameter of the unit area.

[0111] Since the numbers i and j of each unit area relative to each fixed-point shot peening process have been determined, and at the same time the mass distribution parameters of each fixed-point shot peening process have been determined, the pellet mass distribution of each unit area in each fixed-point shot peening process can be determined.

[0112] It can be understood that by superimposing the pellet mass distributions of all fixed-point shot peening processes for a unit area, the pellet mass distribution of the unit area in the entire moving shot peening process can be obtained, that is, the pellet coverage mass parameter of the unit area.

[0113] Next, taking a one-way sweeping trajectory along the x direction as an example, the specific calculation process is introduced.

[0114] When the nozzle performs a single - trajectory sweep along the x - direction, during the sweep, the action process of the sprayed pellets on a specific single area of the processed surface can be understood as the superposition of fixed - point shot - peening processes where multiple shot - peening points have the same Y - coordinate. The mass distribution parameters of each fixed - point shot - peening are actually the same, and the only thing that changes is the number of the specific single area.

[0115] It can be understood that during the single - trajectory sweep along the x - direction, the number j of this single area remains unchanged, and i gradually changes, ranging from 1 to p, where p is the maximum lateral position number of the single area for fixed - point spraying. It can also be understood that the process of the nozzle performing a single - trajectory sweep along the x - direction is a relative process where the surface to be processed moves along the x - direction, and the number i of this single area for the shot - peening point gradually changes.

[0116] Therefore, the pellet coverage mass sm of a single area along the one - way sweep trajectory in the x - direction x,y (i,j) can be expressed as:

[0117] sm x,y (i,j) =m x,y (1,j) +m x,y (2,j) +…+m x,y (i,j) +m x,y (i+1,j) +…+m x,y (p,j) .

[0118] Similarly, the pellet coverage mass sm of a single area along the one - way sweep trajectory in the y - direction x,y (i,j) can be expressed as:

[0119] sm x,y (i,j) =m x,y (i,1) +m x,y (i,2) +…+m x,y (i,j) +m x,y (i,j+1) +…+m x,y (i,q) ;

[0120] where q is the maximum vertical position number of the single area for fixed - point spraying. Therefore, the pellet coverage mass parameter of the unit area can be determined.

[0121] It can be understood that when the moving shot peening trajectory includes multiple single trajectory sweeps, the pellet coverage quality parameters of each single trajectory sweep can be calculated separately, and the pellet coverage quality parameters of the entire moving shot peening trajectory can be obtained after superposition, that is:

[0122]

[0123] where n is the number of trajectory sweeps, and (x, y), (x1, y1),... are the coordinates of the shot points in a fixed-point shot peening process of multiple one-way sweep trajectories.

[0124] Specifically, as Figure 5 shown, when the moving shot peening trajectory includes two parallel and spaced single trajectory sweeps along the x direction, the superposed pellet coverage quality parameter scdm x,y (i,j) can be expressed as:

[0125]

[0126] where in the formula, x1 = x, y1 = y + l1, and l1 is the distance between the two trajectories.

[0127] It can be understood that the above expression is a function of the movement speed v and the trajectory distance l n When the trajectory distance l n is too large, the two trajectories do not overlap, and the calculation of single trajectory sweep can be used.

[0128] S500. Based on the pellet coverage quality parameter and the target pellet coverage quality, establish an optimization function, and optimize the control parameters of the moving shot peening based on the optimization function.

[0129] When the pellet coverage quality parameter scdm x,y (i,j) is obtained, by comparing it with the target pellet coverage quality, an optimization function can be obtained, and the optimized control parameters of the moving shot peening can be obtained based on the optimization function.

[0130] Specifically, please refer to Figure 8 , Figure 8 which Figure 4 is a schematic flowchart of an implementation manner corresponding to step S500 in

[0131] The method for establishing an optimization function and optimizing the control parameters of the moving shot peening based on the optimization function includes:

[0132] S501. Calculate the deviation value of the unit area.

[0133] Specifically, the deviation value is the absolute value of the difference between the pellet coverage quality parameter of the unit area and the target pellet coverage quality. That is: |scdmx,y (i,j) -m x,y (i,j)mb |。

[0134] S502. Traverse the unit regions to sum up the deviation values of all unit regions and establish an optimization function.

[0135] By summing up the deviation values of all unit regions, the gap between the pellet mass distribution and the target pellet mass distribution on the entire surface to be processed during the moving shot peening process can be obtained, which is the optimization function.

[0136] For the moving shot peening trajectory that does not include any two parallel single-track sweeps, this optimization function is only a function of the moving shot peening rate v, that is

[0137] For the moving shot peening trajectory that includes two parallel single-track sweeps, this optimization function is a function of the moving shot peening rate v and the track spacing ln, that is

[0138] S503. Optimize the moving shot peening rate in the direction of minimizing the optimization function.

[0139] Specifically, the moving shot peening rate v that makes the function f(v) or f(v, l n ) take the minimum value can be taken as the optimized moving shot peening rate, so that the pellet coverage mass parameter on the surface to be processed has a smaller deviation from the target pellet coverage mass.

[0140] S504. Optimize the track spacing in the direction of minimizing the optimization function.

[0141] Specifically, for the moving shot peening trajectory that includes two parallel single-track sweeps, the track spacing ln that makes the function f(v, l n ) take the minimum value can also be taken as the track spacing of the optimized moving shot peening trajectory, so that the pellet coverage mass parameter on the surface to be processed has a smaller deviation from the target pellet coverage mass.

[0142] This application also provides a control device for moving shot peening. Please refer to Figure 9 , Figure 9 which is the structural block diagram of an implementation manner of the control device for moving shot peening of this application.

[0143] This control device includes an acquisition module 21, a first determination module 22, a second determination module 23, a third determination module 24, and an optimization module 25.

[0144] Among them, the acquisition module 21 is configured to acquire the target pellet coverage quality to determine the target pellet coverage quality per unit area of the surface to be processed; the first determination module 22 is configured to determine the fixed-point shot peening residence duration parameter per unit area based on the size of the unit area and the moving shot peening rate; the second determination module 23 is configured to determine the fixed-point shot peening mass distribution parameter per unit area based on the fixed-point shot peening residence duration parameter and the preset pellet mass distribution per unit time; the third determination module 24 is configured to determine the pellet coverage quality parameter per unit area based on the fixed-point shot peening mass distribution parameter and the moving shot peening trajectory; the optimization module 25 is configured to establish an optimization function based on the pellet coverage quality parameter and the target pellet coverage quality, and optimize the control parameters of the moving shot peening based on the optimization function.

[0145] As described above with reference to Figures 3 to 7 , the control method for moving shot peening according to the embodiments of the present specification has been described. The details mentioned in the above description of the method embodiments also apply to the control device for moving shot peening of the embodiments of the present specification. The above control device for moving shot peening can be implemented by hardware, or can be implemented by software or a combination of hardware and software.

[0146] Please refer to Figure 10 , Figure 10 which is a hardware structure diagram of an embodiment of an electronic device of the present application. As Figure 10 shown, the electronic device 30 may include at least one processor 31, a memory 32 (such as a non-volatile memory), a memory 33, and a communication interface 34, and at least one processor 31, the memory 32, the memory 33, and the communication interface 34 are connected together via a bus 35. At least one processor 31 executes at least one computer-readable instruction stored or encoded in the memory 32.

[0147] It should be understood that the computer-executable instructions stored in the memory 32 cause at least one processor 31 to perform the various operations and functions described above in the respective embodiments of the present specification in combination with Figures 3 - 7 .

[0148] In the embodiments of the present specification, the electronic device 30 may include, but is not limited to: a personal computer, a server computer, a workstation, a desktop computer, a laptop computer, a notebook computer, a mobile electronic device, a smart phone, a tablet computer, a cellular phone, a personal digital assistant (PDA), a handheld device, a messaging device, a wearable electronic device, a consumer electronic device, and the like.

[0149] According to one embodiment, a program product such as a machine-readable medium is provided. The machine-readable medium may have instructions (i.e., the above elements implemented in software form), which when executed by the machine, cause the machine to perform the various operations and functions described above in the respective embodiments of the present specification in combination with Figures 3 - 7The various operations and functions described. Specifically, a system or device with a readable storage medium can be provided, on which software program codes for implementing the functions of any one of the above embodiments are stored, and the computer or processor of the system or device is caused to read and execute the instructions stored in the readable storage medium.

[0150] In this case, the program code read from the readable medium itself can implement the functions of any one of the above embodiments, so the machine-readable code and the readable storage medium storing the machine-readable code constitute a part of this specification.

[0151] Examples of readable storage media include floppy disks, hard disks, magneto-optical disks, optical disks (such as CD-ROM, CD-R, CD-RW, DVD-ROM, DVD-RAM, DVD-RW, DVD-RW), magnetic tapes, non-volatile memory cards, and ROMs. Alternatively, the program code can be downloaded from a server computer or a cloud via a communication network.

[0152] Those skilled in the art should understand that various modifications and variations can be made to the above disclosed embodiments without departing from the essence of the invention. Therefore, the protection scope of this specification should be defined by the appended claims.

[0153] It should be noted that not all steps and units in the above process flows and system structure diagrams are necessary, and some steps or units can be ignored according to actual needs. The execution order of each step is not fixed and can be determined according to needs. The device structures described in the above embodiments can be physical structures or logical structures. That is, some units may be implemented by the same physical entity, or some units may be implemented separately by multiple physical entities, or some components in multiple independent devices may be jointly implemented.

[0154] In the above embodiments, the hardware units or modules can be implemented mechanically or electrically. For example, a hardware unit, module, or processor can include permanent dedicated circuits or logics (such as dedicated processors, FPGAs, or ASICs) to perform corresponding operations. The hardware unit or processor can also include programmable logics or circuits (such as general-purpose processors or other programmable processors), which can be temporarily set by software to perform corresponding operations. The specific implementation method (mechanical method, or dedicated permanent circuit, or temporarily set circuit) can be determined based on cost and time considerations.

[0155] The specific embodiments described above in conjunction with the accompanying drawings describe exemplary embodiments, but do not represent all embodiments that can be implemented or fall within the scope of the claims. The term "exemplary" used throughout this specification means "serving as an example, instance, or illustration", and does not mean "preferred" or "advantageous" over other embodiments. For the purpose of providing an understanding of the described technology, the specific embodiments include specific details. However, these technologies can be implemented without these specific details. In some instances, well-known structures and devices are shown in block diagram form to avoid obscuring the concepts of the described embodiments.

[0156] The foregoing description of the present disclosure has been provided to enable any ordinary person skilled in the art to make or use the present disclosure. Various modifications to the present disclosure will be readily apparent to those of ordinary skill in the art, and the general principles corresponding thereto herein can be applied to other variations without departing from the scope of the present disclosure. Therefore, the present disclosure is not limited to the examples and designs described herein, but is consistent with the broadest scope that conforms to the principles and novel features disclosed herein.

Claims

1. A method for controlling mobile shot peening, characterized in that: include: Obtaining a target pellet coverage mass to determine a target pellet coverage mass per unit area of the surface to be treated; Determining a dwell time parameter of the fixed-point shot peening of the unit area based on the size of the unit area and the moving shot peening rate; Determining a fixed-point shot peening mass distribution parameter of the unit area based on the fixed-point shot peening residence time parameter and a preset shot mass distribution per unit time; Determining a shot coverage quality parameter of the unit area based on the fixed-point shot peening quality distribution parameter and the moving shot peening trajectory; An optimization function is established based on the shot coverage quality parameter and the target shot coverage quality, and the control parameters of the mobile shot peening are optimized based on the optimization function.

2. The control method according to claim 1, characterized in that: The step of determining the shot coverage quality parameter of the unit area based on the fixed-point shot peening quality distribution parameter and the moving shot peening trajectory includes: Determining sweep information of the unit area based on the moving shot peening trajectory, the sweep information including a fixed-point shot peening order of the unit area in the current moving shot peening trajectory; A shot coverage quality parameter of the unit area is determined based on the fixed-point shot peening quality distribution parameter and the sweep information of the unit area.

3. The control method according to claim 2, characterized in that: The step of determining the sweep information of the unit area based on the fixed-point shot peening quality distribution parameter and the moving shot peening trajectory includes: Determining fixed-point shot peening information sweeping the unit area based on the moving shot peening trajectory, the fixed-point shot peening information including shot peening points of the fixed-point shot peening; Based on the fixed-point peening information, sweep information of the unit area is determined.

4. The control method according to claim 1, wherein: The step of establishing an optimization function based on the shot coverage quality parameter and the target shot coverage quality, and optimizing the control parameters of the mobile shot peening based on the optimization function comprises: Calculating a deviation value of the unit area, where the deviation value is an absolute value of a difference between the pellet coverage quality parameter and the target pellet coverage quality of the unit area; Traversing the unit area to sum the deviation values of all unit areas and establish an optimization function; The moving shot peening rate is optimized in a direction that minimizes the optimization function.

5. The control method according to claim 4, characterized in that: The moving shot peening trajectory includes at least two parallel and spaced unidirectional sweeping trajectories, After the step of optimizing the moving shot peening rate in the direction of minimizing the optimization function, the following steps are further included: The spacing of the parallel spaced unidirectional sweeping trajectories is optimized in a direction that minimizes the optimization function.

6. A control device for mobile shot peening, characterized in that: include: an acquisition module, configured to acquire a target pellet coverage mass to determine the target pellet coverage mass per unit area of the surface to be treated; A first determining module is configured to determine a dwell time parameter of the fixed-point shot peening in the unit area based on the size of the unit area and the moving shot peening rate; A second determining module is configured to determine a fixed-point shot peening mass distribution parameter of the unit area based on the fixed-point shot peening residence time parameter and a preset shot mass distribution per unit time; a third determining module, configured to determine a shot coverage quality parameter of the unit area based on the fixed-point shot peening quality distribution parameter and the moving shot peening trajectory; An optimization module is used to establish an optimization function based on the shot coverage quality parameter and the target shot coverage quality, and optimize the control parameters of the mobile shot peening based on the optimization function.

7. An electronic device, characterized in that: include: at least one processor; as well as A memory storing instructions, which, when executed by the at least one processor, enable the at least one processor to execute the method for controlling the mobile shot peening according to any one of claims 1 to 5.

8. A machine-readable storage medium, characterized in that Executable instructions are stored, and when the instructions are executed, the machine performs the control method of mobile shot peening according to any one of claims 1 to 5.

Citation Information

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