Gateway scene leakage rate detection device, method, system and electronic equipment

Abstract

The present invention discloses a gateway scene leakage control rate detection device, method, system and electronic device. The gateway to be tested is connected to multiple sub-devices, and the device includes: a first counting circuit connected to the multiple sub-devices, used to count once every time the multiple sub-devices output a first signal, and obtain a first number; a second counting circuit connected to the multiple sub-devices, used to count once every time the multiple sub-devices output a second signal, and obtain a second number; a detection circuit connected to the first counting circuit and the second counting circuit, used to periodically send scene instructions, and forward the scene instructions to the gateway to be tested through the cloud, and obtain the number of times the scene instructions are sent, the first number and the second number, and obtain the scene leakage control rate of the gateway to be tested according to the number of times the scene instructions are sent, the first number and the second number. The leakage control rate of the gateway scene stress test is effectively obtained, which greatly reduces the labor cost.

Description

Technical Field

[0001] The present invention relates to the field of gateway detection, and in particular to a gateway scene leakage rate detection device, method, system and electronic equipment. Background Art

[0002] With the development of the smart home industry, smart homes are becoming more and more popular, and users have higher and higher expectations for the stability of smart devices. As one of the core hubs of wireless devices, gateway devices must meet the needs of the majority of users and achieve stable device control, low leakage control rate or even zero leakage control. This is an urgent performance improvement for the gateway. Since the scene control is required to be continuously issued in a short period of time, the time for the device to report may be short or long. Currently, there is no good test solution that can automatically test and output the scene leakage control rate results. Summary of the invention

[0003] The present invention aims to solve one of the technical problems in the related art to at least a certain extent. To this end, one purpose of the present invention is to propose a gateway scene leakage rate detection device, which reduces labor costs, improves detection efficiency, and improves the accuracy of gateway scene leakage rate detection.

[0004] The second objective of the present invention is to provide a gateway scenario leakage rate detection method.

[0005] A third objective of the present invention is to provide an electronic device.

[0006] A fourth objective of the present invention is to provide a gateway scenario leakage rate detection system.

[0007] To achieve the above-mentioned purpose, an embodiment of the first aspect of the present invention proposes a gateway scene leakage rate detection device, wherein the gateway to be tested is connected to multiple sub-devices, and the device includes: a first counting circuit, connected to the multiple sub-devices, and used to count once each time the multiple sub-devices output a first signal to obtain a first number; a second counting circuit, connected to the multiple sub-devices, and used to count once each time the multiple sub-devices output a second signal to obtain a second number; a detection circuit, connected to the first counting circuit and the second counting circuit, and used to periodically send scene instructions, and forward the scene instructions to the gateway to be tested through the cloud, and obtain the number of times the scene instructions are sent, the first number and the second number, and obtain the scene leakage rate of the gateway to be tested based on the number of times the scene instructions are sent, the first number and the second number.

[0008] According to the gateway scenario leakage control rate detection device of the embodiment of the present invention, it is realized from manual testing to automatic testing, and from manual observation of device actions to automatic calculation of device actions, without the need for human input, thus reducing labor costs and improving detection efficiency. In addition, from previous working hours testing to 24-hour uninterrupted testing, the accuracy of leakage control rate detection of gateway scenarios is improved, and the leakage control rate statistics of gateway scenarios can be truly and objectively output.

[0009] In addition, the gateway scenario leakage rate detection device proposed in the above embodiment of the present invention may also have the following additional technical features:

[0010] According to an embodiment of the present invention, the scene instructions include a full-on scene instruction and a full-off scene instruction.

[0011] According to an embodiment of the present invention, the first counting circuit includes a first logic subcircuit and a first counter, wherein the first logic subcircuit is connected to the first counter and the plurality of the sub-devices respectively, and is used to trigger the first counter to count once whenever the plurality of the sub-devices output the first signal;

[0012] The second counting circuit includes a second logic subcircuit and a second counter. The second logic subcircuit is connected to the second counter and the plurality of sub-devices, respectively, and is used to trigger the second counter to count once each time the plurality of sub-devices output a second signal.

[0013] According to one embodiment of the present invention, the scene instruction is a full-on scene instruction, and the first signal is an on signal. When the scene instruction is a full-on scene instruction and the outputs of all the sub-devices are on signals, the first counter counts once, and when the output of any of the sub-devices is not an on signal, the first counter does not count.

[0014] According to one embodiment of the present invention, the scene instruction is a full-off scene instruction, and the second signal is an off signal. When the scene instruction is a full-off scene instruction and the outputs of all the sub-devices are off signals, the second counter counts once. When the output of any of the sub-devices is not off, the second counter does not count.

[0015] According to an embodiment of the present invention, the scenario leakage rate=(number of transmissions-(first number+second number)) / number of transmissions.

[0016] According to one embodiment of the present invention, the first logic circuit includes a normally open AC contactor, and the second logic circuit includes a normally closed AC contactor; or, the first logic circuit includes an AND gate, and the second logic circuit includes an AND gate and a NOT gate connected in sequence, and the plurality of NOT gates correspond one-to-one to the plurality of sub-devices.

[0017] To achieve the above-mentioned purpose, the second aspect of the present invention proposes a gateway scene leakage control rate detection method, which is used for the gateway scene leakage control rate detection device proposed in the first aspect of the present invention. The method includes: periodically sending scene instructions, and forwarding the scene instructions to the gateway to be tested through the cloud; obtaining the number of times the scene instructions are sent, the first number counted by the first counting circuit, and the second number counted by the second counting circuit; according to the number of times the scene instructions are sent, the first number and the second number, the scene leakage control rate of the gateway to be tested is obtained.

[0018] To achieve the above-mentioned purpose, the third aspect of the present invention proposes an electronic device, including a memory and a processor, wherein a computer program is stored in the memory, and when the computer program is executed by the processor, the gateway scenario leakage rate detection method proposed in the second aspect of the present invention is implemented.

[0019] To achieve the above-mentioned purpose, the fourth aspect of the present invention proposes a gateway scene leakage rate detection system, including: a gateway, a cloud, multiple sub-devices and a gateway scene leakage rate detection device as proposed in the first aspect of the present invention.

[0020] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 is a schematic diagram of a gateway scenario leakage rate detection device according to an embodiment of the present invention;

[0022] Figure 2 is a schematic diagram of a first counting circuit and a second counting circuit according to a specific embodiment of the present invention;

[0023] Figure 3 is a schematic diagram of a gateway scenario leakage rate detection method according to an embodiment of the present invention;

[0024] Figure 4 Schematic diagram of a gateway scenario leakage rate detection system according to an embodiment of the present invention. DETAILED DESCRIPTION

[0025] Embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended to be used to explain the present invention, and should not be construed as limiting the present invention.

[0026] The following describes in detail the gateway scenario leakage rate detection device, method, system and electronic device of the embodiments of the present invention in combination with instructions 1-4 and specific implementation methods.

[0027] In an embodiment of the present invention, the gateway to be tested is connected to a plurality of sub-devices.

[0028] Specifically, multiple sub-devices and a gateway, control signals are used to control multiple sub-devices through the gateway. When testing the leakage control rate of a gateway, multiple sub-devices are connected to the gateway to be tested, so as to detect the leakage control rate of the gateway to be tested by sending control signals to the gateway and detecting the response of multiple sub-devices.

[0029] Figure 1 Schematic diagram of a gateway scene leakage control rate detection device according to an embodiment of the present invention. The gateway scene leakage control rate detection device 100 may include: a first counting circuit 10, connected to a plurality of sub-devices, for counting once each time a first signal is outputted from a plurality of sub-devices to obtain a first number; a second counting circuit 20, connected to a plurality of sub-devices, for counting once each time a second signal is outputted from a plurality of sub-devices to obtain a second number; a detection circuit 30, connected to the first counting circuit 10 and the second counting circuit 30, for periodically sending scene instructions, forwarding the scene instructions to the gateway to be tested through the cloud, and obtaining the number of times the scene instructions are sent, the first number, and the second number, and obtaining the scene leakage control rate of the gateway to be tested according to the number of times the scene instructions are sent, the first number, and the second number.

[0030] In order to solve the problem that the automated test results of the gateway leakage control rate are not objective, the embodiment of the present invention changes the automated test tool for testing the gateway leakage control rate from generating a leakage control rate test report to monitoring the actual actions of the actual sub-devices, automatically and truly counting whether the sub-devices respond, so as to determine the gateway leakage control rate.

[0031] Specifically, an automated tool platform is used to periodically send scene instructions, which are forwarded to the gateway to be tested through the cloud, so that the sub-devices connected to the gateway to be tested execute the corresponding scene instructions. The first counting circuit 10 and the second counting circuit 20 are used to count the execution of the corresponding scene instructions by the sub-devices connected to the gateway to be tested, and the scene leakage control rate of the gateway to be tested is obtained.

[0032] In one embodiment of the present invention, the scene instructions may include a full-on scene instruction and a full-off scene instruction.

[0033] Specifically, create a sub-device full-on scene instruction and a sub-device full-off scene instruction on the automation tool platform. Edit the automation test script so that the automation tool platform sends a scene instruction every 10 seconds: full-on scene instruction → full-off scene instruction → full-on scene instruction → full-off scene instruction…

[0034] To be more specific, after the cloud receives the scene instruction (full-on scene instruction or full-off scene instruction) issued by the automation tool platform, it forwards the scene instruction to the gateway, thereby triggering the sub-device connected to it to execute the corresponding scene.

[0035] It should be noted that, in the absence of leakage control, when the scene instruction is a fully open scene instruction, the sub-devices connected to the gateway to be tested should output an open signal; when the scene instruction is a fully closed scene instruction, the sub-devices connected to the gateway to be tested should output an off signal.

[0036] In one embodiment of the present invention, Figure 2 As shown, the first counting circuit 10 may include a first logic sub-circuit and a first counter, the first logic sub-circuit is respectively connected to the first counter and multiple sub-devices, and is used to trigger the first counter to count once whenever the first signal is output in the multiple sub-devices; the second counting circuit 20 may include a second logic sub-circuit and a second counter, the second logic sub-circuit is respectively connected to the second counter and multiple sub-devices, and is used to trigger the second counter to count once whenever the second signal is output in the multiple sub-devices.

[0037] In one embodiment of the present invention, the first logic circuit includes a normally open AC contactor, and the second logic circuit includes a normally closed AC contactor; or, the first logic circuit includes an AND gate, and the second logic circuit includes an AND gate and a NOT gate connected in sequence, and multiple NOT gates correspond one-to-one to multiple sub-devices.

[0038] In some embodiments, in order to detect the leakage control rate of the gateway to be tested, corresponding to the full-open scene instruction and the full-close scene instruction, the first logic circuit may be a normally open AC contactor, and the second logic subcircuit may be a normally closed AC contactor, so as to serialize the output of the sub-device connected to the gateway to be tested. Thus, when the scene instruction is a full-open scene instruction, it is detected whether the output of the sub-device connected to the gateway to be tested is all open signals. When all are open signals, the normally open AC contactor is closed, and the first counter counts once. When the scene instruction is a full-close scene instruction, it is detected whether the output of the sub-device connected to the gateway to be tested is all off signals. When all are off signals, the normally closed AC contactor is closed, and the second counter counts once.

[0039] In other embodiments, in order to detect the leakage control rate of the gateway to be tested, corresponding to the fully open scene instruction and the fully closed scene instruction, the first logic circuit is an AND gate, and multiple sub-devices connected to the gateway to be tested are connected to the AND gate. The second logic circuit includes an AND gate and a NOT gate connected in sequence, and multiple sub-devices connected to the gateway to be tested are connected to the AND gate through a NOT gate respectively. Therefore, when the scene instruction is a fully open scene instruction, it can be detected whether the outputs of the sub-devices connected to the gateway to be tested are all open signals. When all are open signals, the AND gate output is true, and the first counter counts once. When the scene instruction is a fully closed scene instruction, it can be detected whether the outputs of the sub-devices connected to the gateway to be tested are all closed signals. When all are closed signals, the closed signal is converted to an open signal through a NOT gate, the open signal is input into the AND gate, the AND gate output is true, and the second counter counts once.

[0040] The embodiment of the present invention does not limit the specific forms of the first logic sub-circuit and the second logic sub-circuit.

[0041] In one embodiment of the present invention, the scene instruction is a full-on scene instruction, and the first signal is an on signal. When the scene instruction is a full-on scene instruction and the outputs of all sub-devices are on signals, the first counter counts once. When the output of any sub-device is not an on signal, the first counter does not count.

[0042] Specifically, when the scene instruction is a full-on scene instruction, and the outputs of all sub-devices are on signals, the first counter counts once, and as long as the output of one sub-device is not an on signal, the first counter does not count.

[0043] In one embodiment of the present invention, the scene instruction is a full-off scene instruction, and the second signal is an off signal. When the scene instruction is a full-off scene instruction and the outputs of all sub-devices are off signals, the second counter counts once. When the output of any sub-device is not off, the second counter does not count.

[0044] Specifically, when the scene instruction is a full-off scene instruction, and the outputs of all sub-devices are on signals, the first counter counts once, and the second counter does not count as long as the output of one sub-device is not an off signal.

[0045] In one embodiment of the present invention, the scene leakage rate=(number of transmissions-(first number+second number)) / number of transmissions.

[0046] Specifically, when calculating the scene leakage rate, the first number and the second number are obtained, and the sum of the first number and the second number is calculated to obtain the output number, and then the difference between the sending number and the output number is calculated, and then divided by the sending number, so as to obtain the scene leakage rate of the gateway to be tested.

[0047] The gateway scenario leakage rate detection device of the embodiment of the present invention can effectively obtain the leakage rate of the gateway scenario stress test, greatly reducing the labor cost. The first counting circuit and the second counting circuit are combined with the automated script to perform the gateway scenario stress test. The embodiment of the present invention realizes the transition from manual testing to automated testing, and changes from manually observing the device action to automatically calculating the device action, without the need for human input, reducing labor costs, and improving detection efficiency. In addition, from the previous working hours test to 24-hour uninterrupted testing, the accuracy of the leakage rate detection of the gateway scenario is improved, and the leakage rate statistics of the gateway scenario can be truly and objectively output.

[0048] An embodiment of the present invention provides a gateway scenario leakage rate detection method.

[0049] In this embodiment, the gateway scenario leakage control rate detection method is used in the gateway scenario leakage control rate detection device 100 as described above.

[0050] Figure 3 Schematic diagram of a gateway scenario leakage rate detection method according to an embodiment of the present invention. Figure 3 As shown, the gateway scenario leakage rate detection method may include:

[0051] S1, periodically sends scene instructions and forwards them to the gateway under test through the cloud;

[0052] S2, obtaining the number of times the scene instruction is sent, the first number counted by the first counting circuit, and the second number counted by the second counting circuit;

[0053] S3, obtaining the scenario leakage rate of the gateway to be tested according to the number of transmissions, the first number and the second number.

[0054] The gateway scenario leakage control rate detection method of the embodiment of the present invention is based on the above-mentioned gateway scenario leakage control rate detection device 100, and realizes the transition from manual testing to automated testing, and from manual observation of device actions to automated calculation of device actions, without the need for human input, thereby reducing labor costs and improving detection efficiency. In addition, the previous working hours testing is changed to 24-hour uninterrupted testing, and the accuracy of gateway scenario leakage control rate detection is improved, and the leakage control rate statistics of the gateway scenario can be truly and objectively output.

[0055] An embodiment of the present invention provides an electronic device.

[0056] In this embodiment, the electronic device may include a memory and a processor, and a computer program is stored in the memory, wherein when the computer program is executed by the processor, the gateway scenario leakage rate detection method as described above is implemented.

[0057] The electronic device of the embodiment of the present invention realizes the transition from manual testing to automated testing, and from manual observation of device actions to automated calculation of device actions, without the need for human input, thereby reducing labor costs and improving detection efficiency. In addition, the previous working hours testing is changed to 24-hour uninterrupted testing, and the accuracy of leakage control rate detection in gateway scenarios is improved, and leakage control rate statistics of gateway scenarios can be output truly and objectively.

[0058] An embodiment of the present invention provides a gateway scenario leakage rate detection system.

[0059] Figure 4 Schematic diagram of a gateway scenario leakage rate detection system according to an embodiment of the present invention. Figure 4 As shown, the gateway scene leakage control rate detection system 200 may include a gateway, a cloud, multiple sub-devices and the gateway scene leakage control rate detection device 100 as described above.

[0060] The gateway scenario leakage rate detection system of the embodiment of the present invention realizes the transition from manual testing to automated testing, and from manual observation of device actions to automated calculation of device actions. It does not require human input, reduces labor costs, and improves detection efficiency. It also changes from previous working hours testing to 24-hour uninterrupted testing, and also improves the accuracy of leakage rate detection of gateway scenarios, and can truly and objectively output leakage rate statistics of gateway scenarios.

[0061] It should be noted that the logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as a sequenced list of executable instructions for implementing logical functions, and can be specifically implemented in any computer-readable medium for use by an instruction execution system, device or apparatus (such as a computer-based system, a system including a processor, or other system that can fetch instructions from an instruction execution system, device or apparatus and execute instructions), or in combination with these instruction execution systems, devices or apparatuses. For the purposes of this specification, "computer-readable medium" can be any device that can contain, store, communicate, propagate or transmit a program for use by an instruction execution system, device or apparatus, or in combination with these instruction execution systems, devices or apparatuses. More specific examples of computer-readable media (a non-exhaustive list) include the following: an electrical connection portion with one or more wirings (electronic device), a portable computer disk box (magnetic device), a random access memory (RAM), a read-only memory (ROM), an erasable and programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disk read-only memory (CDROM). In addition, the computer-readable medium may even be paper or other suitable medium on which the program is printed, since the program may be obtained electronically, for example, by optically scanning the paper or other medium and then editing, interpreting or processing in other suitable ways if necessary, and then stored in a computer memory.

[0062] It should be understood that the various parts of the present invention can be implemented by hardware, software, firmware or a combination thereof. In the above-mentioned embodiments, a plurality of steps or methods can be implemented by software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented by hardware, as in another embodiment, it can be implemented by any one of the following technologies known in the art or their combination: a discrete logic circuit having a logic gate circuit for implementing a logic function for a data signal, a dedicated integrated circuit having a suitable combination of logic gate circuits, a programmable gate array (PGA), a field programmable gate array (FPGA), etc.

[0063] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.

[0064] In the description of the present invention, it is to be understood that the terms “center”, “longitudinal”, “lateral”, “length”, “width”, “thickness”, “up”, “down”, “front”, “back”, “left”, “right”, “vertical”, “horizontal”, “top”, “bottom”, “inside”, “outside”, “clockwise”, “counterclockwise”, “axial”, “radial”, “circumferential”, etc., indicating orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the present invention.

[0065] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In the description of the present invention, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0066] In the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0067] In the present invention, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, a first feature being "above", "above" or "above" a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being "below", "below" or "below" a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0068] Although the embodiments of the present invention have been shown and described above, it is to be understood that the above embodiments are exemplary and are not to be construed as limitations of the present invention. A person skilled in the art may change, modify, replace and vary the above embodiments within the scope of the present invention.

Claims

1. A gateway scene leakage rate detection device, characterized in that: The gateway to be tested is connected to multiple sub-devices, and the device includes: A first counting circuit is connected to the plurality of sub-devices and is used for counting once to obtain a first count each time the plurality of sub-devices output a first signal; A second counting circuit is connected to the plurality of sub-devices, and is used for counting once to obtain a second number each time the plurality of sub-devices output a second signal; A detection circuit, connected to the first counting circuit and the second counting circuit, for periodically sending a scene instruction, forwarding the scene instruction to the gateway to be tested through the cloud, and obtaining the number of times the scene instruction is sent, the first number of times, and the second number of times, and obtaining the scene leakage control rate of the gateway to be tested according to the number of times the scene instruction is sent, the first number of times, and the second number of times; Among them, the scene instruction is a full-on scene instruction, and the first signal is an on signal. When the scene instruction is a full-on scene instruction and the outputs of all the sub-devices are on signals, the first counting circuit counts once. When the output of any of the sub-devices is not an on signal, the first counting circuit does not count; the scene instruction is a full-off scene instruction, and the second signal is an off signal. When the scene instruction is a full-off scene instruction and the outputs of all the sub-devices are off signals, the second counting circuit counts once. When the output of any of the sub-devices is not off, the second counting circuit does not count; the scene leakage control rate = (number of transmissions - (first number + second number)) / number of transmissions.

2. The gateway scene leakage rate detection device according to claim 1, characterized in that: The first counting circuit includes a first logic subcircuit and a first counter, wherein the first logic subcircuit is connected to the first counter and the plurality of sub-devices respectively, and is used to trigger the first counter to count once whenever the plurality of sub-devices output the first signal; The second counting circuit includes a second logic subcircuit and a second counter. The second logic subcircuit is connected to the second counter and the plurality of sub-devices, respectively, and is used to trigger the second counter to count once each time the plurality of sub-devices output a second signal.

3. The gateway scene leakage rate detection device according to claim 2, characterized in that: The first logic circuit includes a normally open AC contactor, and the second logic circuit includes a normally closed AC contactor; or The first logic circuit includes an AND gate, and the second logic circuit includes an AND gate and a NOT gate connected in sequence, and a plurality of the NOT gates correspond one to one to a plurality of the sub-devices.

4. A gateway scene leakage rate detection method, characterized in that: A gateway scenario leakage rate detection device according to any one of claims 1 to 3, the method comprising: Periodically sending a scene instruction, and forwarding the scene instruction to the gateway to be tested through the cloud, wherein the gateway to be tested is connected to a plurality of sub-devices; Acquire the number of times the scene instruction is sent, the first number counted by the first counting circuit, and the second number counted by the second counting circuit; Obtaining a scenario leakage rate of the gateway to be tested according to the number of sending times, the first number of times, and the second number of times; Among them, when the scene instruction is a fully open scene instruction, and the outputs of all the sub-devices are open signals, the first counting circuit counts once, and when the output of any of the sub-devices is not an open signal, the first counting circuit does not count; when the scene instruction is a fully closed scene instruction, and the outputs of all the sub-devices are off signals, the second counting circuit counts once, and when the output of any of the sub-devices is not off, the second counting circuit does not count; the scene leakage control rate = (number of transmissions - (first number + second number)) / number of transmissions.

5. An electronic device comprising a memory and a processor, wherein a computer program is stored in the memory, wherein: When the computer program is executed by the processor, the gateway scenario leakage rate detection method as claimed in claim 4 is implemented.

6. A gateway scene leakage rate detection system, characterized in that: include: A gateway, a cloud, multiple sub-devices, and a gateway scenario leakage rate detection device as described in any one of claims 1-3.

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