Dynamic calibration method based on API and database

Abstract

The present invention discloses a dynamic calibration method based on API and database, wherein an external service interface API is designed on the MPU side, and the calibration parameters on the MCU side are converted into the external interface API on the MPU side, so that the external system can obtain and modify the calibration parameters; on the MPU side, the parameters provided by the external system are converted into the calibration parameters in the database through a specific configuration service; after the calibration parameters in the MPU side database are modified by the external interface API, the corresponding calibration parameters on the MCU side are modified at the same time. The external system provides dynamic writing and verification functions through an external host computer or file to realize the modification of the calibration parameters by the external system. The technical solution of the present invention can be easily expanded and upgraded, supports more calibration parameter types and formats, supports multiple databases and API interfaces, and supports more external systems and platforms.

Description

Technical Field

[0001] The present invention relates to a parameter dynamic calibration technology, and in particular to a dynamic calibration method based on an API and a database. Background Art

[0002] The calibration parameters of traditional MCUs are generally stored in non-volatile memory NVM, such as flash memory, EEPROM, FRAM, etc. It is difficult for external systems to directly obtain and modify these parameters, making the calibration process cumbersome and difficult to perform version control and management. The traditional MCU calibration process is a relatively complex, time-consuming and labor-intensive process that requires experienced engineers and appropriate tools to achieve high-quality calibration results.

[0003] Its main problems and shortcomings include:

[0004] 1. Complicated manual operation: The traditional MCU calibration process requires a lot of manual code writing, debugging, configuration file creation, variable assignment and other operations. These operations are prone to errors and require a lot of time and effort.

[0005] 2. High cost: The traditional MCU-side calibration process requires professional development tools and hardware platforms, which has high development costs;

[0006] 3. Slow development speed: The traditional MCU-side calibration process requires a long time of debugging and verification, and it takes multiple iterations to get the final calibration result, which may extend the development cycle;

[0007] 4. Difficult to maintain: Once the calibration code is written, it will become difficult to understand and maintain;

[0008] 5. Hardware limitations: The traditional MCU-side calibration process may be subject to hardware limitations, such as the storage capacity, processor speed, communication bandwidth, etc. of the microcontroller. These limitations may affect the quality of the calibration results.

[0009] These problems and shortcomings are mainly caused by the storage location of the calibration parameters and the limitations of the calibration process on the traditional MCU side. Storing the calibration parameters in an external database can facilitate version control, backup and recovery operations, thereby improving calibration efficiency and accuracy. Summary of the invention

[0010] In order to solve the deficiencies in the prior art, the purpose of the present invention is to provide a dynamic calibration method based on API and database. Through a specific configuration service, the parameters provided by the external system are converted into calibration parameters in the database. At the same time, API calls of these parameters are provided to the external host computer, which can conveniently modify and test the calibration parameters, making the calibration process more convenient and flexible, and greatly improving the efficiency and accuracy of the calibration.

[0011] To achieve the purpose of the present invention, the technical solution adopted by the present invention is:

[0012] A dynamic calibration method based on API and database, the method comprising: designing an external service interface API on the MPU side, converting the calibration parameters on the MCU side into the MPU side external interface API, allowing an external system to obtain and modify the calibration parameters;

[0013] On the MPU side, the parameters provided by the external system are converted into calibration parameters in the database through specific configuration services; after the calibration parameters in the MPU database are modified by the external interface API, the corresponding calibration parameters on the MCU side are modified at the same time.

[0014] Furthermore, the method also includes: deploying a calibration parameter function on the MCU side, designing a DDS topic and RTE interface related to the database calibration parameters, and realizing data communication between the MCU side DDS and the MPU side DDS.

[0015] Furthermore, the method also includes: the external system provides dynamic writing and verification functions through an external host computer or file, so as to enable the external system to modify the calibration parameters.

[0016] Furthermore, the configuration service on the MPU side provides an interface for querying, modifying and deleting calibration parameters.

[0017] Furthermore, the calibration parameter function on the MCU side provides query, modification and deletion operations on the calibration parameters.

[0018] Furthermore, the method comprises the following specific steps:

[0019] (1) The ServiceAPIs layer on the MPU side provides data read and write APIs; the external device calibration app reads and writes calibration parameters by calling the ServiceAPIs;

[0020] (2) MCU-side DDS and MPU-side DDS perform data communication;

[0021] (3) The calibration parameter management on the MCU side is located in the NVM module. The data is called by the MCU side to complete the modification of the calibration parameters on the MCU side.

[0022] Furthermore, the NVM module converts the NVM interface into a standard RTE interface. On the RTE, the NVM SWC converts the NVM C / S type interface into an NVM S / R type interface. The above NVM S / R type interface performs topic packaging and unpacking via DDS.

[0023] The beneficial effects of the present invention are that, compared with the prior art, the present invention has the following advantages and effects:

[0024] 1. Low technical requirements: The external system does not need to understand the calibration procedures and parameter storage methods inside the MCU. It only needs to use the API interface to read and modify the calibration parameters, which reduces the technical requirements and difficulty for technicians.

[0025] 2. Easy operation: The modification and testing process of calibration parameters becomes simple and easy. You only need to use the configuration service interface to configure, avoiding the tedious operation of manually writing and debugging the calibration program.

[0026] 3. Convenient management: The calibration parameters are saved in the database, which can be easily used for version control, backup and recovery, greatly reducing the workload of manual operation and management and reducing the difficulty of management.

[0027] 4. Improve efficiency: The implementation of functions such as calibration parameter conversion module, configuration service and API interface makes it easier for external systems to obtain and modify calibration parameters, greatly improving the efficiency and accuracy of calibration.

[0028] 5. Strong scalability: The technical solution of the present invention can be easily expanded and upgraded, for example, supporting more calibration parameter types and formats, supporting multiple databases and API interfaces, and supporting more external systems and platforms. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] Figure 1 It is a schematic diagram of the dynamic calibration method based on API and database described in the present invention. DETAILED DESCRIPTION

[0030] The technical solution of the present invention is further described below in conjunction with the accompanying drawings and embodiments. The following embodiments are only used to more clearly illustrate the technical solution of the present invention, and cannot be used to limit the protection scope of this application.

[0031] The API and database-based dynamic calibration method described in the present invention is based on the current mainstream domain controller electronic and electrical architecture and is composed of a central controller (MPU) and a domain controller (MCU).

[0032] The present invention converts the calibration parameters of the MCU end into the external interface API of the MPU end, so as to realize the function that the external system can easily obtain and modify the calibration parameters. Through a specific configuration service on the MPU end, the calibration parameters provided by the system are converted into calibration parameters in the database, and a query and modification interface for these calibration parameters in the database is provided, so that operations such as version control, backup and recovery can be conveniently performed. After the calibration parameters in the MPU end database are modified by the external API, the corresponding calibration parameters on the MCU end are modified at the same time. The dynamic writing and verification functions provided by the external host computer or file make the modification and testing of the calibration parameters more convenient and flexible, thereby improving the efficiency and accuracy of the calibration. The present invention can improve and optimize the calibration process of the traditional MCU end, and greatly improve the efficiency of the calibration.

[0033] The API and database-based dynamic calibration method of the present invention comprises the following steps:

[0034] Step 1: Design an external service interface API on the MPU side, convert the calibration parameters on the MCU side into the external interface API on the MPU side, and allow the external system to obtain and modify the calibration parameters;

[0035] According to the calibration parameters of the traditional MCU, the corresponding external interface API is designed to facilitate the external system to obtain and modify the calibration parameters. When designing the API, the ease of use and flexibility of the interface should be considered, so that the external system can easily access and modify the calibration parameters without knowing the details of the internal implementation of the MCU.

[0036] Step 2: On the MPU side, the parameters provided by the external system are converted into calibration parameters in the database through a specific configuration service;

[0037] The parameters provided by the external system are converted into calibration parameters in the database through a specific configuration service, and interfaces such as query, modification and deletion of calibration parameters are provided. The parameters are designed through the configuration service interface, and the background will add, delete, modify and query the corresponding parameters in the database by calling the configuration service API. The configuration service API can also be used to modify the parameter value when the subsequent code is running. When providing configuration services, database version control, backup and recovery operations should be considered to ensure the security and stability of calibration parameters.

[0038] Step 3: Deploy the calibration parameter function on the MCU side, and design the DDS topic and RTE interface related to the database calibration parameters; the MCU-side DDS and the MPU-side DDS perform data communication. After the calibration parameters in the MPU-side database are modified by the external interface API, the corresponding calibration parameters on the MCU side are also modified at the same time;

[0039] When designing DDS topic and RTE interfaces related to database calibration parameters, the universality and scalability of the topic and RTE interfaces should be considered to facilitate developers to query, modify and delete calibration parameters, ensuring the maintainability and scalability of calibration parameters.

[0040] Step 4: The external system provides dynamic writing and verification functions through an external host computer or file to enable the external system to modify the calibration parameters;

[0041] Through the dynamic writing and verification function provided by the external host computer or file, that is, by querying and modifying the parameters in the database, the parameters modified in real time on the MPU side can be dynamically transmitted to the MCU side through DDS to directly affect the RTE interface of the corresponding parameters. The results generated by the operation on the MCU side are transmitted to the host computer again through DDS to verify whether the parameter modification is effective. The above method makes it more convenient and flexible for the external system to modify and test the calibration parameters. When implementing the dynamic writing and verification functions, the correctness and reliability of the data should be considered to ensure the efficiency and accuracy of the calibration.

[0042] Step 5: According to the above steps, implement the technical solution to convert the calibration parameters of the traditional MCU side into an external interface API, and provide specific configuration services and dynamic writing and verification functions to improve the efficiency and accuracy of the calibration, thereby improving and optimizing the calibration process of the traditional MCU side and improving the reliability and performance of the system.

[0043] like Figure 1 As shown, the technical solution implementation includes the steps of:

[0044] (1) As shown in the figure, path ①②, the development tool Classic Autosar is deployed on the MCU side. Its calibration parameter management is located in the NVM module, and the NVM interface is converted to a standard RTE interface. On the RTE, the NVM SWC converts the NVM C / S type interface to the NVM S / R type interface.

[0045] As shown in path ③, the above NVM S / R type interface performs topic packaging and unpacking through DDS;

[0046] (2) As shown in path ④, the MCU-side DDS and the MPU-side DDS perform data communication;

[0047] (3) As shown in the path ⑥->⑤, the ServiceAPIs layer on the MPU side provides data read and write APIs; the MPU APP itself can use ServiceAPIs to interact with the MCU side.

[0048] As shown in the path ⑦->⑤, the external device (such as a computer host) calibration app can read and write calibration parameters by calling ServiceAPIs;

[0049] (4) As shown in the path ④->③->②->①, the data is finally transferred from the MCU to the NVM module to complete the modification of the calibration parameters on the MCU.

[0050] The beneficial effects of the present invention are that, compared with the prior art, the present invention converts the calibration parameters of the traditional MCU end into an external interface API to facilitate the external system to obtain and modify the calibration parameters; through specific configuration services and dynamic writing and verification functions, the management of calibration parameters is made more convenient and flexible; by saving the calibration parameters in a database, version control, backup and recovery operations can be easily performed, thereby improving the stability and reliability of the calibration.

[0051] The applicant of the present invention has made a detailed explanation and description of the implementation examples of the present invention in conjunction with the drawings in the specification. However, those skilled in the art should understand that the above implementation examples are only preferred implementation schemes of the present invention, and the detailed description is only to help readers better understand the spirit of the present invention, but not to limit the scope of protection of the present invention. On the contrary, any improvements or modifications based on the inventive spirit of the present invention should fall within the scope of protection of the present invention.

Claims

1. A dynamic calibration method based on API and database, characterized in that: The method comprises: designing an external service interface API on the MPU side, designing a corresponding external interface API according to calibration parameters on the MCU side, converting the calibration parameters on the MCU side into the external interface API on the MPU side, and allowing an external system to obtain and modify the calibration parameters; The parameters provided by the external system are converted into calibration parameters in the database through the configuration service on the MPU side; after the calibration parameters in the MPU database are modified by the external interface API, the corresponding calibration parameters on the MCU side are modified at the same time; Deploy the calibration parameter function on the MCU side, design the DDS topic and RTE interface related to the database calibration parameters, and implement data communication between the MCU-side DDS and the MPU-side DDS; The external system provides dynamic writing and verification functions through an external host computer or file, so that the external system can modify the calibration parameters; By querying and modifying the parameters in the database, the parameters modified in real time on the MPU side are dynamically transmitted to the MCU side through DDS, which directly affects the RTE interface of the corresponding parameters. The results generated by the operation on the MCU side are again transmitted to the host computer through DDS to verify whether the parameter modification is effective; The ServiceAPIs layer on the MPU side provides data read and write APIs; the external device calibration App reads and writes calibration parameters by calling ServiceAPIs; the MCU-side DDS and the MPU-side DDS communicate data; the MCU-side calibration parameter management is located in the NVM module, and the data is called by the MCU side NVM module to complete the modification of the MCU-side calibration parameters; The NVM module converts the NVM interface to the standard RTE interface. On the RTE, the NVM SWC converts the NVM C / S type interface to the NVM S / R type interface. The NVM S / R type interface performs topic packaging and unpacking via DDS.

2. The dynamic calibration method based on API and database according to claim 1, characterized in that: The configuration service on the MPU side provides an interface for querying, modifying, and deleting calibration parameters.

3. The dynamic calibration method based on API and database according to claim 1, characterized in that: The calibration parameter function on the MCU side provides query, modification and deletion operations for calibration parameters.

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