Methods for expanding ATE test resources for multi-station testing requirements

Abstract

The present invention provides an ATE test resource expansion method for multi-station test requirements, S1, determining test parameters to perform a daughterboard site test; S2, setting a first extension site based on the daughterboard site, and the first extension site also has the following settings: setting the 2nd-nth extension sites respectively in the progressive position of the sequence number; S3, setting calibration channels for the daughterboard site and the first extension site, and setting calibration channels between any of the extension sites; S4, performing calibration tests on the calibration channels. By adding a calibration test, the present invention can test the site mainboard through an extension interface without directly connecting to a test motherboard, thereby improving test performance and scalability, and can achieve accurate test results of a device under test through the calibration test.

Description

Technical Field

[0001] The invention belongs to the technical field of ATE test expansion equipment, and in particular relates to an expansion method of ATE test resources for multi-station test requirements. Background Art

[0002] Automated test equipment is an essential device for integrated circuit testing and is usually used for IC testing. It generally includes computer and software systems, system bus control systems, graphic controllers, timing generators, and precision measurement units.

[0003] The commonly used ATE parallel test solution has high requirements on the test resources of the ATE itself. The number of channels of the machine's own DPS, PPMU.PMU, ALPG and other resources must be greater than all site channels in actual use. In addition, the test cannot be expanded according to demand, and it depends on the actual site channel position in the motherboard.

[0004] In view of this, it is urgent to propose a method for expanding ATE test resources for multi-station testing requirements. Summary of the invention

[0005] To this end, the present invention provides a method for expanding ATE test resources for multi-station test requirements.

[0006] In a first aspect, a method for expanding ATE test resources for multi-station test requirements is provided, comprising the following steps:

[0007] S1. Determine test parameters and perform sub-board site test;

[0008] S2, setting a first extension site based on the daughterboard site, and the first extension site also has the following settings: setting the 2nd to nth extension sites respectively in the progressive position of the sequence number;

[0009] S3, setting a calibration channel between the daughter board site and the first extension site, and setting a calibration channel between any of the extension sites;

[0010] S4. Perform calibration test of the calibration channel.

[0011] Furthermore, the step S4 is specifically as follows:

[0012] Set the test mother station channel to connect to the calibration channel;

[0013] Connecting the calibration channel to the first expansion site;

[0014] Set all the mother station channels and power supplies to 0V, set the preset voltage to the calibration channel, calculate the relay on resistance and record it in the file.

[0015] Furthermore, the step S4 further includes the following steps:

[0016] An intermediate relay and a register are arranged at a preset position of each calibration channel, that is, each calibration channel includes a first sub-channel and a second sub-channel;

[0017] Set up stable test channels between the intermediate relays;

[0018] Writing the resistance and current values ​​of the adjacent extended site into the register;

[0019] Apply voltage to any extended site in a non-targeted manner;

[0020] The current response distribution rate of the intermediate relay is calculated to obtain a first Poisson distribution rate, and the distribution of the first Poisson distribution rate within the confidence interval is calculated.

[0021] Furthermore, the step S4 further includes the following steps:

[0022] The resistance ratio of the first sub-channel to the second sub-channel is the current ratio in the calibration test of two adjacent extended sites.

[0023] Furthermore, the step S4 further includes the following steps:

[0024] If the current response distribution rate of the intermediate relay is outside the confidence threshold;

[0025] Disconnect any adjacent calibration channel and calculate the current response distribution ratio again.

[0026] In a second aspect, a method for expanding ATE test resources for multi-station test requirements is provided, comprising:

[0027] include:

[0028] ATE test machine;

[0029] Multi-site test daughter board;

[0030] Test main board, the test main board is connected to the ATE machine through the ATE dedicated interface, the interface signals include: test mother station channel, site board control module, site board calibration signal;

[0031] The test motherboard is connected to the multi-site daughterboard through the test machine cable. The interface signals include: test mother station channel, site board control module, site board calibration signal.

[0032] The third aspect of the present invention provides an electronic device, comprising a memory and a computer program stored in the memory and executable on a processor, wherein when the processor executes the program, it is suitable for implementing the method provided by the second aspect of the present invention.

[0033] The fourth aspect of the present invention provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, it is suitable for implementing the method provided by the second aspect of the present invention.

[0034] The above technical solution of the present invention has the following advantages compared with the prior art:

[0035] By adding a calibration test, the present invention can test the site mainboard through an expansion interface without directly connecting to a test motherboard, thereby improving test performance and scalability.

[0036] The present invention solves the problem of the current path time being too long due to the continuous extension of the extension position, and the resistance causing the current to attenuate. The intermediate relay is used as a known value of the participating value in the calibration channel, so the double-blind information between the two adjacent sites can be determined, and multiple groups of current values ​​about the intermediate relay and the adjacent sites can be obtained through non-targeted testing, and the current response distribution of the current value in multiple tests is judged, and the preset probability of the current change (the first Poisson distribution rate) is determined, thereby determining the aging degree and aging probability, so as to perform more accurate calibration during the calibration test, and also calculate the stability of the mesh network formed between multiple sites. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] Figure 1 is a structural block diagram of a system provided by Embodiment 1 of the present invention;

[0038] Figure 2 It is a structural block diagram of an electronic device provided in Embodiment 2 of the present invention. DETAILED DESCRIPTION

[0039] In order to be able to understand the features and technical contents of the embodiments of the present disclosure in more detail, the implementation of the embodiments of the present disclosure is described in detail below in conjunction with the accompanying drawings. The attached drawings are for reference only and are not used to limit the embodiments of the present disclosure. In the following technical description, for the convenience of explanation, a full understanding of the disclosed embodiments is provided through multiple details. However, one or more embodiments can still be implemented without these details. In other cases, to simplify the drawings, well-known structures and devices can be simplified for display. Embodiment 1

[0040] The present disclosure provides a method for expanding test resources for multi-station test requirements, including the following steps:

[0041] S1. Determine test parameters and perform sub-board site test;

[0042] S2, setting a first extension site based on the daughterboard site, and the first extension site also has the following settings: setting the 2nd to nth extension sites respectively in the progressive position of the sequence number;

[0043] S3, setting a calibration channel between the daughter board site and the first extension site, and setting a calibration channel between any of the extension sites;

[0044] S4. Perform calibration test of the calibration channel.

[0045] Furthermore, the step S4 is specifically as follows:

[0046] Set the test mother station channel to connect to the calibration channel;

[0047] Connecting the calibration channel to the first expansion site;

[0048] Set all the mother station channels and power supplies to 0V, set the preset voltage to the calibration channel, calculate the relay on resistance and record it in the file.

[0049] Furthermore, the step S4 further includes the following steps:

[0050] An intermediate relay and a register are arranged at a preset position of each calibration channel, that is, each calibration channel includes a first sub-channel and a second sub-channel;

[0051] Set up stable test channels between the intermediate relays;

[0052] Writing the resistance and current values ​​of the adjacent extended site into the register;

[0053] Apply voltage to any extended site in a non-targeted manner;

[0054] Calculate the current response distribution rate of the intermediate relay to obtain the first Poisson distribution rate, and calculate the distribution of the first Poisson distribution rate within the confidence interval. Through the above means, the embodiment of the present disclosure realizes that the current path time caused by the continuous expansion of the extension position is too long, and its resistance causes the current to attenuate. The intermediate relay is used as a known value of the participating value in the calibration channel, so the double-blind information between its two adjacent sites can be determined, and multiple groups of current values ​​about the intermediate relay and the adjacent site can be obtained through non-targeted testing, and the current response distribution of the current value in multiple tests is judged, and the preset probability of its current change (first Poisson distribution rate) is determined, thereby determining its aging degree and aging probability, so as to perform more accurate calibration during calibration testing, and also calculate the stability of the mesh network formed between multiple sites.

[0055] Furthermore, the step S4 further includes the following steps:

[0056] The resistance ratio between the first sub-channel and the second sub-channel is the current ratio in the calibration test of two adjacent extension sites, so as to more concisely calculate from which adjacent site the intermediate relay obtains the current.

[0057] Furthermore, the step S4 further includes the following steps:

[0058] If the current response distribution rate of the intermediate relay is outside the confidence threshold;

[0059] Disconnect any adjacent calibration channel and calculate the current response distribution ratio again. If an error occurs in the data of a site, disconnect one of the calibration channels with the preset current ratio and check the problem site step by step to obtain more direct error correction and test data.

[0060] In the second aspect, a system for expanding ATE test resources for multi-station test requirements is provided, such as Figure 1 As shown, including:

[0061] Test main board, the test main board is connected to the ATE machine through the ATE dedicated interface, the interface signals include: test mother station channel, site board control module, site board calibration signal;

[0062] The test motherboard and the daughterboard site are connected through the test machine cable.

[0063] The interface signals include: test mother station channel, site board control module, site board calibration signal.

[0064] As a preferred method of the embodiment of the present disclosure, each sub-board site corresponds to connecting the first expansion site to the Nth expansion site, a calibration channel is set between the expansion sites, and a calibration channel is set between the expansion site and the main board, and an intermediate relay and a register are set at a preset position of each calibration channel, that is, each of the calibration channels includes a first sub-channel and a second sub-channel, and a stable test channel is set between each intermediate relay. In this embodiment, a stable test channel is also set between the intermediate relay and the main board and the expansion site. Embodiment 2

[0065] Combination Figure 2As shown, an embodiment of the present disclosure provides an electronic device, including a processor 30 and a memory 31. Optionally, the electronic device may also include a communication interface 32 and a bus 33. The processor 30, the communication interface 32, and the memory 31 may communicate with each other through the bus 33. The communication interface 32 may be used for information transmission. The processor 30 may call the logic instructions in the memory 31 to execute the method of the above embodiment.

[0066] An embodiment of the present disclosure provides a storage medium storing computer executable instructions, wherein the computer executable instructions are configured to execute the method of the above embodiment.

[0067] The above-mentioned storage medium may be a transient computer-readable storage medium or a non-transient computer-readable storage medium. Non-transient storage media include: USB flash drives, mobile hard disks, read-only memories (ROMs), random access memories (RAMs), magnetic disks or optical disks, and other media that can store program codes, which may also be transient storage media.

[0068] The above description and the accompanying drawings fully illustrate the embodiments of the present disclosure so that those skilled in the art can practice them. Other embodiments may include structural, logical, electrical, process and other changes. The embodiments represent only possible changes. Unless explicitly required, separate components and functions are optional, and the order of operations may vary. Parts and features of some embodiments may be included in or replace parts and features of other embodiments. Moreover, the words used in this application are only used to describe the embodiments and are not used to limit the claims. As used in the description of the embodiments and the claims, unless the context clearly indicates, the singular forms of "a", "an" and "the" are intended to include plural forms as well. Similarly, the term "and / or" as used in this application refers to any and all possible combinations of one or more associated listings. In addition, when used in this application, the term "comprise" and its variants "comprises" and / or comprising refer to the presence of stated features, wholes, steps, operations, elements, and / or components, but do not exclude the presence or addition of one or more other features, wholes, steps, operations, elements, components and / or groups thereof. In the absence of further restrictions, the elements defined by the sentence "including one..." do not exclude the presence of other identical elements in the process, method or device including the elements. In this article, each embodiment may focus on the differences from other embodiments, and the same and similar parts between the embodiments may refer to each other. For the methods, products, etc. disclosed in the embodiments, if they correspond to the method part disclosed in the embodiments, then the relevant parts can refer to the description of the method part.

Claims

1. A method for expanding ATE test resources for multi-station test requirements, comprising the following steps: S1. Determine test parameters and perform sub-board site test; S2, setting a first extension site based on the daughterboard site, and the first extension site also has the following settings: setting the 2nd to nth extension sites respectively in the progressive position of the sequence number; S3, setting a calibration channel between the daughter board site and the first extension site, and setting a calibration channel between any of the extension sites; S4, performing a calibration test of the calibration channel; The step S4 further comprises the following steps: An intermediate relay and a register are arranged at a preset position of each calibration channel, that is, each calibration channel includes a first sub-channel and a second sub-channel; Set up stable test channels between the intermediate relays; Writing the resistance and current values ​​of the adjacent extended site into the register; Apply voltage to any extended site in a non-targeted manner; Calculate the current response distribution rate of the intermediate relay to obtain a first Poisson distribution rate, and calculate the distribution of the first Poisson distribution rate within a confidence interval; The resistance ratio of the first sub-channel to the second sub-channel is the current ratio in the calibration test of two adjacent extended sites.

2. The method for expanding ATE test resources for multi-station test requirements according to claim 1, characterized in that: The step S4 is specifically as follows: Set the test mother station channel to connect to the calibration channel; Connecting the calibration channel to the first expansion site; Set all mother station channels and power supplies to 0V, set the preset voltage to the calibration channel, calculate the relay on resistance and record it in the file.

3. According to the method for expanding ATE test resources for multi-station test requirements as claimed in claim 1, the step S4 further comprises the following steps: If the current response distribution rate of the intermediate relay is outside the confidence threshold; Disconnect any adjacent calibration channel and calculate the current response distribution ratio again.

4. An expansion system for ATE test resources for multi-station test requirements, suitable for implementing any of the methods described in claims 1-3, characterized in that: include: ATE test machine; Multi-site test daughter board; Test main board, the test main board is connected to the ATE machine through the ATE dedicated interface, the interface signals include: test mother station channel, site board control module, site board calibration signal; The test main board and the multi-site daughter board are connected via the test machine cable; Interface signals include: test mother station channel, site board control module, site board calibration signal; And setting calibration channels between any of the extended sites, with intermediate relays and registers set at the preset position of each calibration channel.

5. An electronic device, characterized in that: The invention comprises a memory and a computer program stored in the memory and executable on a processor. When the processor executes the program, it is suitable for implementing the method for expanding ATE test resources for multi-station test requirements as described in any one of claims 1 to 3.

6. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, it is suitable for implementing the method for expanding ATE test resources for multi-station test requirements as described in any one of claims 1-3.

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