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121results about How to "Test coherence" patented technology

Preparation method of perovskite type SrIrO3 single crystal film material

The invention provides a preparation method of a perovskite type SrIrO3 single crystal film material. The preparation method of the perovskite type SrIrO3 single crystal film material comprises the following steps: S1, providing a perovskite type substrate; S2, cleaning the perovskite type substrate; S3, annealing the perovskite type substrate; S4, adopting a Ir simple substance target evaporator source, a Sr simple substance target evaporator source and an oxygen source in an oxide molecular beam epitaxy system, and growing the perovskite type SrIrO3 single crystal film material at epitaxy of the surface of the perovskite type substrate. The preparation method of the perovskite type SrIrO3 single crystal film material is characterized in that an oxide molecular beam epitaxy technology is utilized, ultrahigh vacuum equipment hardware and a simple substance evaporator source are selected, an evaporator source beam flow is stably controlled, the substrate is selected and treated, and thin film synthesis parameters are stably controlled, so that a high-quality perovskite type SrIrO3 single crystal film material is prepared. Compared with a bulk material, the single crystal film material has great advantages and is of a stable-state perovskite type structure, an epitaxial film surface is a natural smooth cleavage surface, testing of an electronic structure can be facilitated, and testing can be carried out more smoothly due to high cleanliness of sample surface.
Owner:SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI

Test structure for dielectric breakdown reliability analysis in integrated circuit and test method thereof

The invention discloses a test structure of dielectric breakdown reliability analysis in an integrated circuit. The test structure comprises a lower layer metal wire structure, an upper layer metal wire structure, a through hole structure and a dielectric medium, wherein the lower layer metal wire structure comprises a first metal wire structure and a second metal wire structure which are arranged at intervals. The invention further discloses a test method of the test structure. The test method comprises the steps of providing a substrate, and forming an actual structure to be tested on the substrate according to the test structure; and measuring the dielectric breakdown reliability between adjacent metal wires of the lower layer metal wire structure in the actual structure to be tested, the dielectric breakdown reliability between the upper layer metal wire structure and the upper layer metal wire structure in the actual structure to be tested, and the dielectric breakdown reliability between a through hole and the adjacent second metal wire structure in the actual structure to be tested. The test structure disclosed by the invention can accurately evaluate places which require to be evaluated in dielectric medium voltage resistance of an actual circuit, thereby ensuring the accuracy of interconnecting wire reliability analysis.
Owner:SEMICON MFG INT (SHANGHAI) CORP

Automatic startup and shutdown device of mobile phone

ActiveCN103905591AReduce labor costsSolve the problem that the mobile phone cannot be controlled to switch on and offSubstation equipmentKey pressingEngineering
The invention provides an automatic startup and shutdown device of a mobile phone. The device comprises a base (1), a transverse sliding rail (2), a longitudinal sliding rail (8) and a key control device, wherein the transverse sliding rail (2) is parallel with the longitudinal sliding rail (8), so that a sliding block (6) of a fixture freely moves in the X direction and the Y direction; the key control device comprises the longitudinal sliding rail (8), a lifting guide rail (11) and a horizontal guide rail (14). Because of the structure, a horizontal key (16) can move in the X direction and the Z direction, a vertical key (17) can move in the X direction, the Y direction and the Z direction, the device is matched with the fixture of the mobile phone to move in the X direction and the Y direction, and startup motion testing is completed. The fixture is flexible to modulate according to the size and applicable to mobile phones of various sizes (including ultrathin large sizes) and types (flip phones and bar phones), and the mobile phone can be placed horizontally and vertically. A manipulator moves in the X direction, the Y direction and the Z direction through an electromagnet, and the requirements for mobile phone sizes and key positions are met.
Owner:CHINA ACADEMY OF INFORMATION & COMM +1

Automatic terminal voltage resistance and insulation test system and control method

The invention relates to an automatic terminal voltage resistance and insulation test system. The automatic terminal voltage resistance and insulation test system comprises a test device. The test device comprises a machine frame, wherein the machine frame is composed of an upper supporting plate, a lower supporting plate and an unthreaded shaft supporting pillar, the upper supporting plate and the lower supporting plate are arranged in parallel with the upper supporting plate above the lower supporting plate, the unthreaded supporting pillar is connected between the upper supporting plate and the lower supporting plate, a terminal installing plate is installed on the upper end face of the lower supporting plate, a plurality of terminal sleeving rods are distributed on the upper end face of the terminal installing plate side by side in the long axis direction of the terminal installing plate, every two adjacent terminal sleeving rods are separated by a separating plate, a probe plate which can move vertically is movably hung below the upper supporting plate, and a plurality of probe sets are distributed on the probe plate in the long axis direction of the probe plate. The automatic terminal voltage resistance and insulation test system has the advantages that the test device is simple in structure and sequentially tests a plurality of terminals automatically at the same time, the test efficiency of the terminals is improved, and labor cost is reduced.
Owner:NAN TONG HUAGUAN ELECTRIC CO LTD

Bending and anti-cracking performance testing device and testing method

PendingCN109490096AAvoid breakageReduces the effects of bending fracturesMaterial strength using steady bending forcesTest fixtureTraining set
The invention discloses a bending and anti-cracking performance testing device and a testing method. The testing device comprises a base, clamping mechanisms, force application mechanisms and a bending guiding mechanism, wherein the clamping mechanism is used for clamping a test piece; the force application mechanisms are used for supporting and driving the clamping mechanism; when one pair of theforce application mechanisms get close to each other, the test piece is bent and the clamping mechanisms located at the end parts of the force application mechanisms are driven to rotate in the forceapplication mechanisms; and the bending guiding mechanism is used for limiting the test piece to be bent in the direction of the bending guiding mechanism. According to the bending and anti-crackingperformance testing device, the clamping mechanisms rotate in the force application mechanisms so as to prevent the test piece from being subjected to a counter force to crack a clamping position; theforce application mechanisms get close to each other to drive the test piece to bend, and influences, caused by stress concentration, on bending and cracking of the test piece, are reduced, so that the accuracy of testing results is improved; and the bending guiding mechanism is arranged and the bending direction is controllable when the test piece is bent, so that photographing equipment is fixed at a certain part when operation including photographing, collection and the like needs to be carried out and other positions do not need to be adjusted, and a test is carried out smoothly.
Owner:NANJING COMM INST OF TECH

Test bracket for wireless charging device

The invention discloses a test bracket for a wireless charging device. The test bracket includes a vertical motion mechanism which is used for mounting a receiving coil and driving the receiving coilto perform vertical motion, a horizontal motion mechanism which is used for mounting a transmitting coil and driving the transmitting coil to perform horizontal motion, and a supporting mechanism which is used for mounting the vertical motion mechanism and the horizontal motion mechanism. When testing is performed, a distance between the receiving coil and the transmitting coil can be changed by operating the vertical motion mechanism; the relative offset of the receiving coil and the transmitting coil can be changed by operating the horizontal motion mechanism; and at the same time, under thejoint action of the vertical motion mechanism and the horizontal motion mechanism, the test of the charging coil of a wireless charging pile device can be successfully completed; and since manual movement operation of the receiving coil and the transmitting coil is abandoned, instead, the movement operation of the receiving coil and the transmitting coil is realized through the mechanical movement of the vertical motion mechanism and the horizontal motion mechanism, the motion adjustment of the receiving coil and the transmitting coil has greater precision and accuracy, and at the same time,test accuracy and the reliability of test results are improved.
Owner:ZONECHARGE (SHENZHEN) WIRELESS POWER TECH CO LTD

Automobile door hinge corrosion resistance detecting device

The invention discloses an automobile door hinge corrosion resistance detecting device comprising a main body casing and a control cabinet, wherein the outer surface of the upper end of the main bodycasing is movably provided with a visible box cover, a connecting shaft is fixedly connected to the outer surface of the rear end of the visible box cover, the outer surface of the connecting shaft iscovered with a fixed iron piece, and a test box is fixedly mounted on the outer surface of the lower end of the visible box cover. The automobile door hinge corrosion resistance detecting device hasa relatively-comprehensive detection effect, and can ensure that the outer surface of a hinge is evenly heated and receives a uniform liquid during detection, so that test results are more accurate, the automobile door hinge corrosion resistance detecting device has a better waste liquid treatment effect to ensure the inside of the automobile door hinge corrosion resistance detecting device may not be corroded by an acidic liquid, the automobile door hinge corrosion resistance detecting device can better carry out centralized treatment and movement of waste liquid, has a better fixing effect,can better fix the hinge, and can adjust the length of a clamp according to the size of the hinge. The scope of use of the device is enlarged.
Owner:安徽双红机械制造有限公司

Semiconductor element sorting and testing all-in-one machine

The invention discloses a semiconductor element sorting and testing all-in-one machine. The semiconductor element sorting and testing all-in-one machine comprises a base, wherein a supporting frame isfixedly mounted on the upper surface of the base; a transverse beam is fixedly mounted at the top of the supporting frame through a bolt; a movable plate is movably mounted at one side of the transverse beam; a hoisting arm is movably mounted at one side of the movable plate; a grasping mechanism is fixedly mounted at the bottom end of the hoisting arm; a socket plate is mounted on the upper surface of the base; a testing socket is mounted on the socket plate; a plurality of mounting grooves are formed in the testing socket; the grasping mechanism comprises a mounting plate; a plurality of outer splines are rotatably mounted on a supporting seat I; a ventilation pipe is movably mounted at the inner sides of the outer splines along the vertical direction; and a suction nozzle is fixedly mounted at the bottom of the ventilation pipe. The semiconductor element sorting and testing all-in-one machine disclosed by the invention can be used for testing a plurality of semiconductor elements in one time and the working efficiency is high; and angles of the semiconductor elements are convenient to adjust so that the semiconductor elements are accurately put into the mounting grooves and themounting speed of the semiconductor elements is rapid.
Owner:安徽富信半导体科技有限公司

Five-point recognition method for CCDs (Charge Coupled Devices)

ActiveCN107525477AStability analysis calculationAnalysis and calculation are accurateOptically investigating flaws/contaminationUsing optical meansEngineeringPrinted circuit board
The invention discloses a five-point recognition method for CCDs (Charge Coupled Devices). The method includes the following steps that: a PCB (printed circuit board) is fixed, three PIN holes on the PCB are positioned, two addition points are selected from the PCB and marked as MARK1 and MARK2 respectively; whether deformation occurs in the PCB is judged through judging whether the triangle of the PIN holes of the PCB is totally equal to the triangle of the PIN holes of a template, if no deformation occurs in the PCB or the expansion and shrinkage error r of the PCB is smaller than 1/2 (l+d), a coordinate system is built with a small-deformation reference edge of the PCB, namely, the opposite side of the smallest-deformation angle of the PCB is adopted as an X axis, and a PIN hole coordinate system is built with one endpoint or the middle point of the side adopted as an origin point; an included angle between a ling segment Mark1Mark2 and a line segment template Mark1 and template Mark2 is calculated, so that a rotation shift angle is obtained; the point Mark1 and point Mark2 are shifted to a fixture center coordinate system from the PIN hole coordinate system; and the translation quantities of the PCB on an X axis and a Y axis are recorded as X and Y respectively, and a fixture (or the PCB) is made to move according to X, Y and Theta (or -X,-Y and -Theta) on the basis of the rotation shift angle. The recognition method of the present invention is more accurate and more stable.
Owner:SHENZHEN MASONE ELECTRONICS

Packer for formation testing and method for performing formation testing by adopting packer

The invention relates to a packer for formation testing and a method for performing formation testing by adopting the packer. The packer comprises an upper joint, wherein a conical female thread is formed in the upper end of the upper joint, a core pipe extending downwards is screwed in an internal thread in the lower end of the upper joint, and the lower end of the core pipe is inserted into an upper port of a lower joint and is sealed through an O-shaped ring; a conical male thread is formed in the lower end of the lower joint; and a bypass mechanism capable of communicating upper liquid flow and lower liquid flow of the packer is arranged on the periphery of the core pipe and below the upper joint, a setting mechanism is arranged below the bypass mechanism, a shear pin mechanism is arranged below the setting mechanism, and a transposition mechanism for controlling bypass and setting is arranged below the shear pin mechanism. During well descending, the bypass is opened to communicate upper and lower annuluses, after in place, the core pipe is rotated, the bypass is closed, setting is performed, stratum fluid enters a string, then the bypass is opened, unsetting is performed, andthe string is lifted. In the drilling process, it is ensured that the straddle packer cannot be set in advance, so that packer rubber sleeves are effectively protected, and the straddle test successrate is practically increased.
Owner:CHINA PETROLEUM & CHEM CORP +1

Static cracking agent expansion force testing device and method

The invention provides a static cracking agent expansion force testing device and belongs to the technical field of rock engineering. The static cracking agent expansion force testing device comprisesa testing device body internally provided with a reaction cavity, a water injection pipe and a rubber sleeve, wherein the reaction cavity is formed in a temperature control system, the water inlet end of the water injection pipe is arranged outside the reaction cavity, the water outlet end of the water injection pipe extends into the reaction cavity, the end portion of the water outlet end is provided with a baffle for plugging an outlet of the water injection pipe, the side wall of the portion, extending into the reaction cavity, of the water injection pipe is provided with a water injectionhole enabling the inner cavity of the water injection pipe to be communicated with the reaction cavity, the rubber sleeve sleeves the side wall, provided with the water injection hole, of the water injection pipe and is used for plugging an outlet of the water injection hole. The invention also provides a static cracking agent expansion force testing method. By adopting the static cracking agentexpansion force testing device and the static cracking agent expansion force testing method, the technical problems are solved that at present, an expansion force testing device cannot measure the change of an expansion force of a static cracking agent during water injection and cannot achieve temperature control.
Owner:SHIJIAZHUANG TIEDAO UNIV +1

Polymer material density testing equipment

InactiveCN105424552APlay the effect of saving electricityComprehensive dataSpecific gravity measurementVolumetric Mass DensityEngineering
The invention provides polymer material density testing equipment and belongs to the field of testing equipment. The equipment comprises an equipment body, the equipment body comprises a weight testing instrument, the top of the equipment body is provided with a vacuum cover, which is detachably connected to the top of the equipment body; the top of the vacuum cover is provided with a cover body, which is connected to the top of the vacuum cover through screw joint; the lateral wall of the vacuum cover is provided with an exhaust opening; the top of the equipment body is provided with a plug-in mechanism, the plug-in mechanism comprises a slot, the external side of the slot is provided with a circular first boss, the top of the first boss is provided with a sealing ring; the bottom of the external side of the vacuum cover is provided with a circular second boss, the height of the second boss is lower than that of the first boss, a gap exists between the first boss and the second boss; and the edge of the sealing ring stretch out the first boss and extends to the space above the second boss. The provided density testing equipment can measure the weight of a polymer material in a vacuum state and then calculate the density of the polymer material, and thus more precise data can be obtained.
Owner:佛山市顺德区特丰塑料制品有限公司
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