Wafer socket and method for detecting horizontal positioning of wafer
A technology for horizontal positioning and chip application in measuring devices, surveying and navigation, measuring inclination, etc., which can solve problems such as damage to the chip 22, inaccurate positioning of the chip in the chip socket, and inability to obtain test results, etc., to achieve the effect of avoiding damage
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0063] For further elaborating the technical means and effects that the present invention adopts for reaching the intended invention purpose, below in conjunction with accompanying drawing and preferred embodiment, to its specific implementation mode, structure of the wafer socket proposed according to the present invention and the method for detecting the horizontal orientation of wafer , method features and effects thereof are described in detail below.
[0064] The aforementioned and other technical contents, features and effects of the present invention will be clearly presented in the following detailed description of preferred embodiments with reference to the drawings. For convenience of description, in the following embodiments, the same elements are denoted by the same numbers.
[0065] Figure 4 A wafer socket of an embodiment of the invention is shown. The wafer socket 30 includes a base 32 . The base 32 includes a positioning surface 33 for accommodating a wafer ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com