Non-contact voltage measurement method, device, equipment, system and computer equipment

Abstract

The present application relates to a non-contact voltage measurement method, device, equipment, system and computer equipment. The method comprises: obtaining first electric field detection data and second electric field detection data detected by the voltage measurement device after being mounted on the outside of the conductor to be measured; determining first inversion coefficients and second inversion coefficients according to pre-acquired reference data, the first electric field detection data and the second electric field detection data; determining the target voltage of the conductor to be measured according to the first electric field detection data, the second electric field detection data, the first inversion coefficient and the second inversion coefficient. The use of this method can solve the problem of non-contact measurement of online voltage monitoring of high-voltage electrical equipment.

Description

Technical Field

[0001] The present application relates to the technical field of power equipment testing, and in particular to a non-contact voltage measurement method, device, equipment, system and computer equipment. Background Art

[0002] The national energy policy of "carbon neutrality and carbon peak" is constantly advancing. There is an urgent need to improve my country's high-energy consumption economic growth model, improve the efficiency of the integrated energy system, and build a new digital power system. Voltage / current is not only an important monitoring object for electrical equipment, but also an important state quantity that is inseparable from grid nodes and lines.

[0003] At present, the commonly used voltage and current monitoring equipment in the power system are electromagnetic voltage transformers and capacitive voltage transformers, which are large in size, high in insulation cost, narrow in measurement frequency band, and require power outage to be installed in contact with the primary side equipment. However, the current installation of a large number of existing equipment does not consider the sensor point layout, and the newly added sensor points cannot be measured in contact when the transmission and distribution line space is limited or when there are insulated cables. Summary of the invention

[0004] Based on this, it is necessary to provide a non-contact voltage measurement method, device, equipment, system and computer equipment that can solve the non-contact measurement problem of online voltage monitoring of high-voltage electrical equipment in response to the above technical problems.

[0005] In a first aspect, the present application provides a non-contact voltage measurement method, comprising:

[0006] Acquire first electric field detection data and second electric field detection data detected by the voltage measurement device set after being outside the conductor to be measured;

[0007] Determining a first inversion coefficient and a second inversion coefficient according to pre-acquired reference data, first electric field detection data, and second electric field detection data;

[0008] The target voltage of the conductor to be tested is determined according to the first electric field detection data, the second electric field detection data, the first inversion coefficient and the second inversion coefficient.

[0009] In one embodiment, the reference data includes first electric field reference data, second electric field reference data, first reference coefficient and second reference coefficient; the first inversion coefficient and the second inversion coefficient are determined based on the pre-acquired reference data, first electric field detection data and second electric field detection data, including:

[0010] Determining a corresponding relationship between a reference coefficient and an inversion coefficient according to the first electric field reference data, the second electric field reference data, the first electric field detection data, and the second electric field detection data;

[0011] Determine a first inversion coefficient according to the corresponding relationship and the first reference coefficient;

[0012] According to the corresponding relationship and the second reference coefficient, the second inversion coefficient is determined.

[0013] In one embodiment, the determining of the correspondence between the reference coefficient and the inversion coefficient according to the first electric field reference data, the second electric field reference data, the first electric field detection data, and the second electric field detection data includes:

[0014] determining a reference ratio according to the first electric field reference data and the second electric field reference data;

[0015] Determining a detection ratio according to the first electric field detection data and the second electric field detection data;

[0016] According to the reference ratio and the detection ratio, the corresponding relationship between the reference coefficient and the inversion coefficient is determined.

[0017] In one embodiment, the method further comprises:

[0018] After the voltage measuring device is mounted on the outside of the reference wire, first electric field reference data and second electric field reference data detected by the voltage measuring device are acquired.

[0019] In a second aspect, the present application also provides a non-contact voltage measurement device, comprising:

[0020] An acquisition module, used for acquiring first electric field detection data and second electric field detection data detected by the voltage measurement device after the voltage measurement device is installed outside the conductor to be measured;

[0021] An inversion coefficient determination module, used to determine a first inversion coefficient and a second inversion coefficient according to pre-acquired reference data, first electric field detection data and second electric field detection data;

[0022] The voltage determination module is used to determine the target voltage of the conductor to be tested according to the first electric field detection data, the second electric field detection data, the first inversion coefficient and the second inversion coefficient.

[0023] In a third aspect, the present application further provides a non-contact voltage measurement device, which includes a housing, a first electric field sensing unit and a second electric field sensing unit; the first electric field sensing unit and the second electric field sensing unit are arranged in the housing and are spaced apart by a preset distance in the same direction; a ground wire is connected to the outside of the housing; the first electric field sensing unit and the second electric field sensing unit are respectively connected to an external processor for communication;

[0024] A housing for mounting the conductor to be tested;

[0025] A first electric field sensing unit, used to detect the conductor to be measured to obtain first electric field data;

[0026] A second electric field sensing unit is used to detect the conductor to be measured to obtain second electric field data;

[0027] Among them, the first electric field data and the second electric field data are used by the processor to determine the first inversion coefficient and the second inversion coefficient according to the pre-acquired reference data, the first electric field detection data and the second electric field detection data; and the target voltage of the conductor to be tested is determined according to the first electric field detection data, the second electric field detection data, the first inversion coefficient and the second inversion coefficient.

[0028] In a fourth aspect, the present application further provides a non-contact voltage measurement system, comprising a non-contact voltage measurement device and a processor, wherein the processor implements the following steps when executing a computer program:

[0029] Acquire first electric field detection data and second electric field detection data detected by the voltage measurement device set after being outside the conductor to be measured;

[0030] Determining a first inversion coefficient and a second inversion coefficient according to pre-acquired reference data, first electric field detection data, and second electric field detection data;

[0031] The target voltage of the conductor to be tested is determined according to the first electric field detection data, the second electric field detection data, the first inversion coefficient and the second inversion coefficient.

[0032] In a fifth aspect, the present application further provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, the following steps are implemented:

[0033] Acquire first electric field detection data and second electric field detection data detected by the voltage measurement device set after being outside the conductor to be measured;

[0034] Determining a first inversion coefficient and a second inversion coefficient according to pre-acquired reference data, first electric field detection data, and second electric field detection data;

[0035] The target voltage of the conductor to be tested is determined according to the first electric field detection data, the second electric field detection data, the first inversion coefficient and the second inversion coefficient.

[0036] In a sixth aspect, the present application further provides a computer-readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the following steps are implemented:

[0037] Acquire first electric field detection data and second electric field detection data detected by the voltage measurement device set after being outside the conductor to be measured;

[0038] Determining a first inversion coefficient and a second inversion coefficient according to pre-acquired reference data, first electric field detection data, and second electric field detection data;

[0039] The target voltage of the conductor to be tested is determined according to the first electric field detection data, the second electric field detection data, the first inversion coefficient and the second inversion coefficient.

[0040] In a seventh aspect, the present application further provides a computer program product, including a computer program, which implements the following steps when executed by a processor:

[0041] Acquire first electric field detection data and second electric field detection data detected by the voltage measurement device set after being outside the conductor to be measured;

[0042] Determining a first inversion coefficient and a second inversion coefficient according to pre-acquired reference data, first electric field detection data, and second electric field detection data;

[0043] The target voltage of the conductor to be tested is determined according to the first electric field detection data, the second electric field detection data, the first inversion coefficient and the second inversion coefficient.

[0044] The above-mentioned non-contact voltage measurement method, device, equipment, system and computer equipment first obtain the first electric field detection data and the second electric field detection data detected by the voltage measurement device after being installed on the outside of the conductor to be measured; then determine the first inversion coefficient and the second inversion coefficient based on the pre-acquired reference data, the first electric field detection data and the second electric field detection data; finally, determine the target voltage of the conductor to be measured based on the first electric field detection data, the second electric field detection data, the first inversion coefficient and the second inversion coefficient; this method realizes non-contact measurement of the voltage of the conductor to be measured, reducing the safety risks and measurement errors that may be caused by direct contact with the conductor. BRIEF DESCRIPTION OF THE DRAWINGS

[0045] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the related technologies, the drawings required for use in the embodiments or the related technical descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0046] FIG1 is a diagram showing the internal structure of a computer device in one embodiment;

[0047] FIG2 is a schematic diagram of a flow chart of a non-contact voltage measurement method in one embodiment;

[0048] FIG3 is a schematic flow chart of a non-contact voltage measurement method in another embodiment;

[0049] FIG4 is a schematic flow chart of a non-contact voltage measurement method in another embodiment;

[0050] FIG5 is a block diagram of a non-contact voltage measuring device according to an embodiment;

[0051] FIG6 is a block diagram of a non-contact voltage measurement device in one embodiment;

[0052] Description of reference numerals:

[0053] A first electric field sensing unit 01; a second electric field sensing unit 02; and a housing 03. DETAILED DESCRIPTION

[0054] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0055] In an exemplary embodiment, a computer device is provided, which may be a server, and its internal structure diagram may be shown in FIG1. ​​The computer device includes a processor, a memory, an input / output interface (Input / Output, referred to as I / O) and a communication interface. The processor, the memory and the input / output interface are connected via a system bus, and the communication interface is connected to the system bus via the input / output interface. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store data in a non-contact voltage measurement process. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal via a network connection. When the computer program is executed by the processor, a non-contact voltage measurement method is implemented.

[0056] Those skilled in the art will understand that the structure shown in FIG. 1 is merely a block diagram of a partial structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than shown in the figure, or combine certain components, or have a different arrangement of components.

[0057] In an exemplary embodiment, as shown in FIG2 , a non-contact voltage measurement method is provided, which is described by taking the method applied to the computer device in FIG1 as an example, and includes the following S202 to S206 . Among them:

[0058] S202, obtaining first electric field detection data and second electric field detection data detected by a voltage measurement device after the voltage measurement device is installed outside the conductor to be measured.

[0059] The thickness of the insulation layer of the conductor to be tested has changed. The first electric field detection data and the second electric field detection data reflect the electric field strength around the conductor to be tested.

[0060] In the embodiment of the present application, first, the voltage measuring device set is correctly installed on the outside of the conductor to be measured, so that it is firmly fixed around the conductor to be measured, and there is no interference between the conductor to be measured and the voltage measuring device. Then, the voltage measuring device is started to put the voltage measuring device into a working state. Then, the electric field sensor on the voltage measuring device is used to measure the first electric field detection data and the second electric field detection data respectively.

[0061] S204: Determine a first inversion coefficient and a second inversion coefficient according to pre-acquired reference data, the first electric field detection data and the second electric field detection data.

[0062] The first inversion coefficient represents the change in electric field caused by a unit voltage change. The first inversion coefficient is usually used in the process of measuring voltage by an electric field sensor. It represents the proportional relationship between the electric field value output by the electric field sensor and the actual voltage to be measured. The reference data is the data obtained by measuring the conductor to be measured under standard voltage.

[0063] In the embodiment of the present application, first, reference data obtained by measuring the conductor to be tested under standard voltage is obtained, and the reference data may include known voltage values ​​to be tested, etc. Then, the first electric field detection data and the second electric field detection data are used in combination with the known reference data to calculate the first inversion coefficient and the second inversion coefficient.

[0064] S206, determining a target voltage of the conductor to be tested according to the first electric field detection data, the second electric field detection data, the first inversion coefficient, and the second inversion coefficient.

[0065] In the embodiment of the present application, the target voltage of the conductor to be tested is determined according to the first electric field detection data, the second electric field detection data, the first inversion coefficient and the second inversion coefficient, and the following formula (1) may be used:

[0066] (1)

[0067] In the above formula (1), represents the target voltage, represents the first inversion coefficient, represents the second inversion coefficient, represents the first electric field detection data, Indicates the second electric field detection data.

[0068] The principle of this formula is to calculate the target voltage by multiplying the electric field detection data by the inversion coefficient. By multiplying the first electric field detection data by the first inversion coefficient, and multiplying the second electric field detection data by the second inversion coefficient, and then adding the two and dividing by 2, the target voltage of the conductor to be tested can be obtained.

[0069] In the above-mentioned non-contact voltage measurement method, firstly, the first electric field detection data and the second electric field detection data detected by the voltage measurement device after being mounted on the outside of the conductor to be measured are obtained; then, the first inversion coefficient and the second inversion coefficient are determined according to the reference data, the first electric field detection data and the second electric field detection data acquired in advance; finally, the target voltage of the conductor to be measured is determined according to the first electric field detection data, the second electric field detection data, the first inversion coefficient and the second inversion coefficient; this method realizes the non-contact measurement of the voltage of the conductor to be measured, and reduces the safety risks and measurement errors that may be caused by direct contact with the conductor.

[0070] In an exemplary embodiment, as shown in FIG3 , S204 determines the first inversion coefficient and the second inversion coefficient according to the pre-acquired reference data, the first electric field detection data and the second electric field detection data, including S302 to S306. Wherein:

[0071] S302, determining a correspondence between a reference coefficient and an inversion coefficient according to the first electric field reference data, the second electric field reference data, the first electric field detection data, and the second electric field detection data.

[0072] In the embodiment of the present application, the correspondence between the reference coefficient and the inversion coefficient is determined according to the first electric field reference data, the second electric field reference data, the first electric field detection data and the second electric field detection data.

[0073] S304: Determine a first inversion coefficient according to the corresponding relationship and the first reference coefficient.

[0074] In the embodiment of the present application, the first inversion coefficient is determined according to the corresponding relationship and the first reference coefficient.

[0075] The first inversion coefficient can be calculated using the following formula:

[0076] (2)

[0077] In the above formula (2), represents the first inversion coefficient, represents the first reference coefficient, represents a ratio between the first electric field reference data and the second electric field reference data; Represents the ratio between the first electric field detection data and the second electric field detection data.

[0078] S306: Determine a second inversion coefficient according to the corresponding relationship and the second reference coefficient.

[0079] In the embodiment of the present application, the second inversion coefficient is determined according to the corresponding relationship and the second reference coefficient.

[0080] The first inversion coefficient can be calculated using the following formula:

[0081] (3)

[0082] In the above formula (3), represents the first inversion coefficient, represents the first reference coefficient, represents a ratio between the first electric field reference data and the second electric field reference data; Represents the ratio between the first electric field detection data and the second electric field detection data.

[0083] In the embodiment of the present application, the accuracy of the inversion process can be improved by establishing the corresponding relationship between the reference coefficient and the inversion coefficient, so that the obtained inversion coefficient can accurately reflect the relationship between the electric field detection data and the reference data. By using the corresponding relationship, the calculation process of determining the inversion coefficient can be simplified, and the efficiency and accuracy of the calculation can be improved. After determining the corresponding relationship between the reference coefficient and the inversion coefficient, the inversion process can be more reliably performed, thereby obtaining a more accurate and reliable target voltage value of the conductor to be measured.

[0084] In an exemplary embodiment, the reference data includes first electric field reference data, second electric field reference data, first reference coefficient and second reference coefficient, as shown in FIG4 , S302 determines the correspondence between the reference coefficient and the inversion coefficient according to the first electric field reference data, the second electric field reference data, the first electric field detection data and the second electric field detection data, including S402 to S406. Wherein:

[0085] S402, determining a reference ratio according to the first electric field reference data and the second electric field reference data.

[0086] In the embodiment of the present application, a reference ratio is determined according to the first electric field reference data and the second electric field reference data.

[0087] Since a charged conductor will excite a vector electric field in the space around it, Helmholtz's theorem shows that: in a given finite area, the field source information and the vector field under the boundary conditions of the area are uniquely determined. When the earth is used as the zero potential reference potential, the voltage of the conductor to be measured is linearly related to the electric field around it:

[0088] (4)

[0089] In the above formula (4), F(r) and k0 are variables, which are only related to the center position of the electric field to the conductor to be measured; Represents the electric field reference data.

[0090] In some embodiments, assuming that the outer distance of the insulation layer of the conductor to be measured is d1 and d2, two electric field sensors S1 and S2 are deployed at positions, assuming that the radius of the conductor to be measured is a, and the insulation thickness of the outer layer of the conductor is x, then the distances from the center of the conductor to the electric field sensors S1 and S2 are r1=a+x+d1 and r2=a+x+d2, respectively. According to formula (4), the electric field ratio of the two positions, i.e., the reference ratio, is obtained:

[0091] (5)

[0092] In the above formula (5), represents the reference ratio, represents the first electric field reference data, represents the second electric field reference data, , , , Represents a variable that is only related to the center position of the electric field to the conductor being measured.

[0093] S404: Determine a detection ratio according to the first electric field detection data and the second electric field detection data.

[0094] In the embodiment of the present application, a detection ratio is determined according to the first electric field detection data and the second electric field detection data.

[0095] In some embodiments, the thickness of the insulation layer may be different for different wires. Assuming that the thickness of the insulation layer changes by Δx, the position of the electric field sensor relative to the center of the wire also changes by Δx. Then and , which results in Changes to , then we need to solve the new :

[0096] (6)

[0097] make ,but , assuming that the electric field ratio of the two electric field sensors after the thickness of the insulating layer changes , which is the detection ratio:

[0098] (7)

[0099] S406, determining the corresponding relationship between the reference coefficient and the inversion coefficient according to the reference ratio and the detection ratio.

[0100] In the embodiment of the present application, the detection ratio is determined according to the first electric field detection data and the second electric field detection data, and then the corresponding relationship between the reference coefficient and the inversion coefficient is determined according to the reference ratio and the detection ratio.

[0101] Arranging formula (7) yields the expression for t:

[0102] (8)

[0103] Then the first inversion coefficient after the insulation layer thickness changes is:

[0104] (9)

[0105] According to formula (9), it can be seen that the proportional relationship of the electric field sensor can be used to realize the voltage measurement under different insulation layer thickness scenarios. (9) is the corresponding relationship between the reference coefficient and the inversion coefficient.

[0106] In the above embodiment, by performing ratio analysis on the reference data and the detection data, the relationship between the reference coefficient and the inversion coefficient can be determined more accurately, thereby improving the accuracy of voltage measurement. By comparing the reference ratio and the detection ratio, the corresponding relationship between the reference coefficient and the inversion coefficient is determined, which helps to improve the accuracy, real-time performance and ease of operation of voltage measurement.

[0107] In an exemplary embodiment, the method further includes: after the voltage measuring device is mounted on the outside of the reference wire, acquiring first electric field reference data and second electric field reference data detected by the voltage measuring device.

[0108] In the embodiment of the present application, a voltage measuring device is mounted on the outside of the reference wire so that it is firmly fixed near the reference wire. The voltage measuring device is turned on to start detecting the electric field data of the reference wire. Wait for a while to allow the voltage measuring device to stabilize and collect enough data. Then, the first electric field reference data and the second electric field reference data are recorded.

[0109] In the above embodiment, by acquiring the electric field data outside the reference wire, an accurate reference to the electric field can be provided as a basis for subsequent voltage measurement, which can improve the accuracy and reliability of voltage measurement.

[0110] A detailed embodiment is given below to illustrate the process of the non-contact voltage measurement method in the present application. Based on the above embodiment, the implementation process of the method may include the following contents:

[0111] S1, after a voltage measuring device is mounted on the outside of a reference conductor, first electric field reference data and second electric field reference data detected by the voltage measuring device are obtained.

[0112] S2, obtaining first electric field detection data and second electric field detection data detected by the voltage measurement device after the voltage measurement device is installed outside the conductor to be measured.

[0113] S3, determining a reference ratio according to the first electric field reference data and the second electric field reference data.

[0114] S4, determining a detection ratio according to the first electric field detection data and the second electric field detection data.

[0115] S5, determining the corresponding relationship between the reference coefficient and the inversion coefficient according to the reference ratio and the detection ratio.

[0116] S6, determining a first inversion coefficient according to the corresponding relationship and the first reference coefficient.

[0117] S7, determining a second inversion coefficient according to the corresponding relationship and the second reference coefficient.

[0118] S8, determining a target voltage of the conductor to be tested according to the first electric field detection data, the second electric field detection data, the first inversion coefficient and the second inversion coefficient.

[0119] It should be understood that, although the steps in the flowcharts involved in the above embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps is not strictly limited in order, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above embodiments may include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0120] Based on the same inventive concept, the embodiment of the present application also provides a non-contact voltage measurement device for implementing the non-contact voltage measurement method involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations in one or more non-contact voltage measurement device embodiments provided below can refer to the limitations of the non-contact voltage measurement method above, and will not be repeated here.

[0121] In an exemplary embodiment, as shown in FIG5 , a non-contact voltage measurement device is provided, comprising: an acquisition module 11, an inversion coefficient determination module 12 and a voltage determination module 13, wherein:

[0122] An acquisition module 11 is used to acquire first electric field detection data and second electric field detection data detected by the voltage measurement device after the voltage measurement device is installed outside the conductor to be measured;

[0123] An inversion coefficient determination module 12 is used to determine a first inversion coefficient and a second inversion coefficient according to pre-acquired reference data, first electric field detection data and second electric field detection data;

[0124] The voltage determination module 13 is used to determine the target voltage of the conductor to be tested according to the first electric field detection data, the second electric field detection data, the first inversion coefficient and the second inversion coefficient.

[0125] In another embodiment, another non-contact voltage measurement device is provided. Based on the above embodiment, the inversion coefficient determination module 12 may include:

[0126] A first determining unit, configured to determine a corresponding relationship between a reference coefficient and an inversion coefficient according to the first electric field reference data, the second electric field reference data, the first electric field detection data, and the second electric field detection data;

[0127] A second determining unit, configured to determine a first inversion coefficient according to the corresponding relationship and the first reference coefficient;

[0128] The third determining unit is used to determine the second inversion coefficient according to the corresponding relationship and the second reference coefficient.

[0129] In another embodiment, another non-contact voltage measurement device is provided. Based on the above embodiment, the first determination unit may include:

[0130] A first determining subunit, configured to determine a reference ratio according to the first electric field reference data and the second electric field reference data;

[0131] A second determination subunit, used to determine a detection ratio according to the first electric field detection data and the second electric field detection data;

[0132] The third determination subunit is used to determine the corresponding relationship between the reference coefficient and the inversion coefficient according to the reference ratio and the detection ratio.

[0133] In another embodiment, another non-contact voltage measuring device is provided. Based on the above embodiment, the device may further include:

[0134] The detection module is used to obtain the first electric field reference data and the second electric field reference data detected by the voltage measurement device after the voltage measurement device is mounted on the outside of the reference wire.

[0135] Each module in the above-mentioned non-contact voltage measurement device can be implemented in whole or in part by software, hardware and a combination thereof. Each of the above-mentioned modules can be embedded in or independent of a processor in a computer device in the form of hardware, or can be stored in a memory in a computer device in the form of software, so that the processor can call and execute the operations corresponding to each of the above modules.

[0136] In one embodiment, as shown in FIG6 , a non-contact voltage measuring device is provided, which includes a housing 03, a first electric field sensing unit 01 and a second electric field sensing unit 02; the first electric field sensing unit 01 and the second electric field sensing unit 02 are arranged in the housing 03 and are spaced apart by a preset distance in the same direction; a ground wire is connected to the outside of the housing 03; the first electric field sensing unit 01 and the second electric field sensing unit 02 are respectively connected to an external processor for communication; the housing 03 is used to cover the conductor to be measured; the first electric field sensing unit 01 is used to detect the conductor to be measured to obtain first electric field data; the second electric field sensing unit 02 is used to detect the conductor to be measured to obtain second electric field data; wherein the first electric field data and the second electric field data are used by the processor to determine the first inversion coefficient and the second inversion coefficient according to the pre-acquired reference data, the first electric field detection data and the second electric field detection data; the target voltage of the conductor to be measured is determined according to the first electric field detection data, the second electric field detection data, the first inversion coefficient and the second inversion coefficient.

[0137] The housing 03 is the outer shell of the non-contact voltage measuring device, which is used to fix and package the wire to be measured and the electric field sensing unit inside. The outer side of the housing 03 is connected to the ground wire to provide grounding protection and safety.

[0138] The first electric field sensing unit 01 and the second electric field sensing unit 02 are arranged in the housing 03, and are spaced apart by a preset distance along the same direction. They are responsible for detecting the surrounding electric field and transmitting the detected electric field data to an external processor.

[0139] The first electric field sensing unit 01 and the second electric field sensing unit 02 are respectively connected to an external processor for communication. The first electric field sensing unit 01 and the second electric field sensing unit 02 transmit the collected electric field data to the processor through the communication connection for further processing and analysis.

[0140] The non-contact voltage measurement device is mainly used for non-contact voltage measurement. It can be set on the wire to be measured and keep a certain distance from the wire to be measured during the measurement process. By detecting the surrounding electric field, the non-contact voltage measurement device can measure the voltage of the wire to be measured while avoiding the need to directly contact the wire to be measured.

[0141] The non-contact voltage measurement device provided in this embodiment first obtains the first electric field detection data and the second electric field detection data detected after the voltage measurement device is installed outside the conductor to be measured; then, the first inversion coefficient and the second inversion coefficient are determined according to the reference data, the first electric field detection data and the second electric field detection data acquired in advance; finally, the target voltage of the conductor to be measured is determined according to the first electric field detection data, the second electric field detection data, the first inversion coefficient and the second inversion coefficient; the method realizes the non-contact measurement of the voltage of the conductor to be measured, and reduces the safety risks and measurement errors that may be caused by direct contact with the conductor.

[0142] In one embodiment, a non-contact voltage measuring device is further provided, and the structure of the housing 03 can be any one of a snap-on type, an embedded type, and a clamp type.

[0143] The buckle structure is used to fix or connect objects. The buckle structure generally refers to a buckle or buckle ring on the device housing 03, which can be inserted or pressed with the corresponding part of other parts or devices to achieve the purpose of fixing or connecting.

[0144] Specifically, the snap-on structure usually includes the following features:

[0145] (1) Buckle or buckle: There will be protrusions or grooves on the housing 03, called buckles or buckles. These structures are usually designed in a semicircular or semi-square shape to facilitate the insertion of the wire to be tested.

[0146] (2) Insertion or pressing: Insert or press the snap-on part of the non-contact voltage measuring device into the corresponding part of the wire to be measured so that they are locked with each other, thereby achieving fixation or connection.

[0147] (3) Easy to operate: The snap-on structure is designed to be easy to operate and can be inserted or pressed manually without the need for additional tools.

[0148] Embedded refers to a structural design in which the conductor to be measured is embedded in the interior of the non-contact voltage measurement device, so that it is completely or partially hidden inside and is flush or almost flush with the external surface.

[0149] The clamp-type structure is used to fix the conductor to be tested to the structure of the non-contact voltage measurement device by clamping or fixing. The clamp-type design usually means that the housing 03 has a clamping or fixing device that can clamp the conductor to be tested and fix it firmly in the desired position.

[0150] The clamp-type structure usually has the following characteristics:

[0151] (1) Clamping device: The housing 03 is provided with a clamping device or a clamp for clamping the conductor to be tested. It can usually be clamped or released by manual operation or mechanical means.

[0152] (2) Firm fixation: Once clamped, the wire to be tested will be firmly fixed in the clamp structure and will not easily move or shake.

[0153] (3) Flexibility: The fixture structure is usually designed to be flexible and adjustable to accommodate objects or devices of different sizes or shapes, and can be adjusted or replaced when necessary.

[0154] The non-contact voltage measuring device provided in this embodiment has a shell with a snap-on design, which allows the device to be easily mounted on the wire to be tested and can be easily removed when necessary. This structure is suitable for situations where the device needs to be replaced or maintained frequently. The shell adopts an embedded design, and the device is completely embedded inside the shell, making the overall structure more compact and stable. The embedded structure is generally used for long-term fixed installation on the wire to be tested, where frequent replacement or maintenance of the equipment is not required. The shell is designed as a clamp-type structure, and the device can be fixed to the wire to be tested by clamping or fixing. This structure is suitable for situations where quick switching between different wires is required or the position of the device needs to be flexibly adjusted.

[0155] According to specific application requirements and usage scenarios, choosing a suitable casing structure can improve the ease of use, stability and safety of the equipment.

[0156] In one embodiment, a non-contact voltage measuring device is further provided. Referring to FIG. 6 , the housing 03 is provided with a snap-in groove along the radial direction.

[0157] The snap-fit ​​groove is a groove or a groove system for accommodating the inserted part of a buckle or a snap ring to fix or connect the wire to be tested.

[0158] The design of the housing 03 being provided with a snap-in groove along the radial direction has the following characteristics:

[0159] (1) Fixing or connection: The design of the snap-in groove allows a snap or a snap ring to be inserted into it. The device can be fixed or connected by inserting it into the groove and rotating or pressing it.

[0160] (2) Radial layout: The snap-in grooves are arranged along the radial direction of the housing 03, which means that they are arranged along the periphery or circumference of the housing 03. This layout is usually used in circular or cylindrical housing 03 designs.

[0161] (3) Simple operation: Users can fix or connect the device through simple insertion and rotation operations without the need for additional tools or complicated operations.

[0162] (4) Reliability: Once the buckle or snap ring is inserted into the snap groove and rotated or pressed, the device will be reliably fixed in the desired position and will not easily loosen or fall off.

[0163] The non-contact voltage measurement device provided in this embodiment can realize simple and effective device fixing or connection by arranging the snap-in grooves in the radial direction of the housing, thereby improving the stability and safety of the non-contact voltage measurement device.

[0164] In an exemplary embodiment, a non-contact voltage measurement system is provided, comprising a non-contact voltage measurement device and a processor, wherein the processor implements the following steps when executing a computer program:

[0165] Acquire first electric field detection data and second electric field detection data detected by the voltage measurement device set after being outside the conductor to be measured;

[0166] Determining a first inversion coefficient and a second inversion coefficient according to pre-acquired reference data, first electric field detection data, and second electric field detection data;

[0167] The target voltage of the conductor to be tested is determined according to the first electric field detection data, the second electric field detection data, the first inversion coefficient and the second inversion coefficient.

[0168] In one embodiment, the reference data includes first electric field reference data, second electric field reference data, a first reference coefficient and a second reference coefficient, and the processor further implements the following steps when executing the computer program:

[0169] Determining a corresponding relationship between a reference coefficient and an inversion coefficient according to the first electric field reference data, the second electric field reference data, the first electric field detection data, and the second electric field detection data;

[0170] Determine a first inversion coefficient according to the corresponding relationship and the first reference coefficient;

[0171] According to the corresponding relationship and the second reference coefficient, the second inversion coefficient is determined.

[0172] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0173] determining a reference ratio according to the first electric field reference data and the second electric field reference data;

[0174] Determining a detection ratio according to the first electric field detection data and the second electric field detection data;

[0175] According to the reference ratio and the detection ratio, the corresponding relationship between the reference coefficient and the inversion coefficient is determined.

[0176] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0177] After the voltage measuring device is mounted on the outside of the reference wire, first electric field reference data and second electric field reference data detected by the voltage measuring device are acquired.

[0178] In an exemplary embodiment, a computer device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and when the processor executes the computer program, the following steps are implemented:

[0179] Acquire first electric field detection data and second electric field detection data detected by the voltage measurement device set after being outside the conductor to be measured;

[0180] Determining a first inversion coefficient and a second inversion coefficient according to pre-acquired reference data, first electric field detection data, and second electric field detection data;

[0181] The target voltage of the conductor to be tested is determined according to the first electric field detection data, the second electric field detection data, the first inversion coefficient and the second inversion coefficient.

[0182] In one embodiment, the reference data includes first electric field reference data, second electric field reference data, a first reference coefficient and a second reference coefficient, and the processor further implements the following steps when executing the computer program:

[0183] Determining a corresponding relationship between a reference coefficient and an inversion coefficient according to the first electric field reference data, the second electric field reference data, the first electric field detection data, and the second electric field detection data;

[0184] Determine a first inversion coefficient according to the corresponding relationship and the first reference coefficient;

[0185] According to the corresponding relationship and the second reference coefficient, the second inversion coefficient is determined.

[0186] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0187] determining a reference ratio according to the first electric field reference data and the second electric field reference data;

[0188] Determining a detection ratio according to the first electric field detection data and the second electric field detection data;

[0189] According to the reference ratio and the detection ratio, the corresponding relationship between the reference coefficient and the inversion coefficient is determined.

[0190] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0191] After the voltage measuring device is mounted on the outside of the reference wire, first electric field reference data and second electric field reference data detected by the voltage measuring device are acquired.

[0192] In one embodiment, a computer readable storage medium is provided, on which a computer program is stored, and when the computer program is executed by a processor, the following steps are implemented:

[0193] Acquire first electric field detection data and second electric field detection data detected by the voltage measurement device set after being outside the conductor to be measured;

[0194] Determining a first inversion coefficient and a second inversion coefficient according to pre-acquired reference data, first electric field detection data, and second electric field detection data;

[0195] The target voltage of the conductor to be tested is determined according to the first electric field detection data, the second electric field detection data, the first inversion coefficient and the second inversion coefficient.

[0196] In one embodiment, the reference data includes first electric field reference data, second electric field reference data, first reference coefficient and second reference coefficient, and the computer program, when executed by the processor, further implements the following steps:

[0197] Determining a corresponding relationship between a reference coefficient and an inversion coefficient according to the first electric field reference data, the second electric field reference data, the first electric field detection data, and the second electric field detection data;

[0198] Determine a first inversion coefficient according to the corresponding relationship and the first reference coefficient;

[0199] According to the corresponding relationship and the second reference coefficient, the second inversion coefficient is determined.

[0200] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0201] determining a reference ratio according to the first electric field reference data and the second electric field reference data;

[0202] Determining a detection ratio according to the first electric field detection data and the second electric field detection data;

[0203] According to the reference ratio and the detection ratio, the corresponding relationship between the reference coefficient and the inversion coefficient is determined.

[0204] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0205] After the voltage measuring device is mounted on the outside of the reference wire, first electric field reference data and second electric field reference data detected by the voltage measuring device are acquired.

[0206] In one embodiment, a computer program product is provided, comprising a computer program, which, when executed by a processor, implements the following steps:

[0207] Acquire first electric field detection data and second electric field detection data detected by the voltage measurement device set after being outside the conductor to be measured;

[0208] Determining a first inversion coefficient and a second inversion coefficient according to pre-acquired reference data, first electric field detection data, and second electric field detection data;

[0209] The target voltage of the conductor to be tested is determined according to the first electric field detection data, the second electric field detection data, the first inversion coefficient and the second inversion coefficient.

[0210] In one embodiment, the reference data includes first electric field reference data, second electric field reference data, first reference coefficient and second reference coefficient, and the computer program, when executed by the processor, further implements the following steps:

[0211] Determining a corresponding relationship between a reference coefficient and an inversion coefficient according to the first electric field reference data, the second electric field reference data, the first electric field detection data, and the second electric field detection data;

[0212] Determine a first inversion coefficient according to the corresponding relationship and the first reference coefficient;

[0213] According to the corresponding relationship and the second reference coefficient, the second inversion coefficient is determined.

[0214] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0215] determining a reference ratio according to the first electric field reference data and the second electric field reference data;

[0216] Determining a detection ratio according to the first electric field detection data and the second electric field detection data;

[0217] According to the reference ratio and the detection ratio, the corresponding relationship between the reference coefficient and the inversion coefficient is determined.

[0218] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0219] After the voltage measuring device is mounted on the outside of the reference wire, first electric field reference data and second electric field reference data detected by the voltage measuring device are acquired.

[0220] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but are not limited to this.

[0221] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0222] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A non-contact voltage measurement method, characterized in that: The method comprises: Acquire first electric field detection data and second electric field detection data detected by the voltage measurement device set after being outside the conductor to be measured; the first electric field detection data is not equal to the second electric field detection data; Determine a first inversion coefficient and a second inversion coefficient according to pre-acquired reference data, the first electric field detection data, and the second electric field detection data; Determining a target voltage of the conductor to be tested according to the first electric field detection data, the second electric field detection data, the first inversion coefficient, and the second inversion coefficient; The reference data includes first electric field reference data, second electric field reference data, a first reference coefficient and a second reference coefficient; and determining the first inversion coefficient and the second inversion coefficient according to the pre-acquired reference data, the first electric field detection data and the second electric field detection data includes: determining a corresponding relationship between a reference coefficient and an inversion coefficient according to the first electric field reference data, the second electric field reference data, the first electric field detection data, and the second electric field detection data; Determining the first inversion coefficient according to the corresponding relationship and the first reference coefficient; The second inversion coefficient is determined according to the corresponding relationship and the second reference coefficient.

2. The method according to claim 1, characterized in that The determining the corresponding relationship between the reference coefficient and the inversion coefficient according to the first electric field reference data, the second electric field reference data, the first electric field detection data and the second electric field detection data comprises: determining a reference ratio according to the first electric field reference data and the second electric field reference data; determining a detection ratio according to the first electric field detection data and the second electric field detection data; The corresponding relationship between the reference coefficient and the inversion coefficient is determined according to the reference ratio and the detection ratio.

3. The method according to claim 1, characterized in that The method further comprises: After the voltage measuring device is mounted on the outside of the reference wire, the first electric field reference data and the second electric field reference data detected by the voltage measuring device are acquired.

4. A non-contact voltage measuring device, characterized in that: The device comprises: An acquisition module, used to acquire first electric field detection data and second electric field detection data detected by the voltage measurement device after the voltage measurement device is installed outside the conductor to be measured; the first electric field detection data is not equal to the second electric field detection data; an inversion coefficient determination module, configured to determine a first inversion coefficient and a second inversion coefficient according to pre-acquired reference data, the first electric field detection data, and the second electric field detection data; a voltage determination module, configured to determine a target voltage of the conductor to be tested according to the first electric field detection data, the second electric field detection data, the first inversion coefficient, and the second inversion coefficient; The reference data includes first electric field reference data, second electric field reference data, first reference coefficient and second reference coefficient; the inversion coefficient determination module includes: a first determining unit, configured to determine a corresponding relationship between a reference coefficient and an inversion coefficient according to the first electric field reference data, the second electric field reference data, the first electric field detection data, and the second electric field detection data; a second determining unit, configured to determine the first inversion coefficient according to the corresponding relationship and the first reference coefficient; The third determining unit is used to determine the second inversion coefficient according to the corresponding relationship and the second reference coefficient.

5. A non-contact voltage measuring device, characterized in that: The non-contact voltage measurement device comprises a housing, a first electric field sensing unit and a second electric field sensing unit; the first electric field sensing unit and the second electric field sensing unit are arranged in the housing and are spaced apart by a preset distance in the same direction; a ground wire is connected to the outer side of the housing; the first electric field sensing unit and the second electric field sensing unit are respectively connected to an external processor for communication; The housing is used to cover the conductor to be tested; The first electric field sensing unit is used to detect the conductor to be tested to obtain first electric field data; The second electric field sensing unit is used to detect the wire to be tested to obtain second electric field data; The first electric field data and the second electric field data are used by the processor to determine the first inversion coefficient and the second inversion coefficient according to the pre-acquired reference data, the first electric field detection data and the second electric field detection data; the target voltage of the conductor to be tested is determined according to the first electric field detection data, the second electric field detection data, the first inversion coefficient and the second inversion coefficient; the first electric field detection data is not equal to the second electric field detection data; The reference data includes first electric field reference data, second electric field reference data, a first reference coefficient and a second reference coefficient; and determining the first inversion coefficient and the second inversion coefficient according to the pre-acquired reference data, the first electric field detection data and the second electric field detection data includes: determining a corresponding relationship between a reference coefficient and an inversion coefficient according to the first electric field reference data, the second electric field reference data, the first electric field detection data, and the second electric field detection data; Determining the first inversion coefficient according to the corresponding relationship and the first reference coefficient; The second inversion coefficient is determined according to the corresponding relationship and the second reference coefficient.

6. The non-contact voltage measuring device according to claim 5, characterized in that: The structure of the shell can be any one of a snap-on type, an embedded type and a clamp type.

7. The non-contact voltage measuring device according to claim 5, characterized in that: The shell is provided with a clamping groove along the radial direction.

8. A non-contact voltage measurement system, characterized in that: The system comprises a non-contact voltage measurement device and a processor as claimed in any one of claims 5 to 7; The processor is used to execute the steps of the method according to any one of claims 1 to 3.

9. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 3 are implemented.

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