An electronic paper mother sheet AOI defect detection machine

Abstract

The present invention relates to the field of defect detection machines, and is used to solve the problem that the detection effect of the defect detection machine is affected by the working condition of the equipment, and the influence is not easy to be discovered. The present invention is a defect detection machine for electronic paper mother sheet AOI, comprising a defect detection machine and a detection control system. The defect detection machine adopts AOI visual detection to detect defects in the electronic paper mother sheet, and the detection control system comprises a visual detection unit, an equipment proofreading unit, a batch comprehensive analysis unit, an equipment maintenance unit and a data management unit. In the present invention, when the electronic paper mother sheet is subjected to defect detection, defect detection data is collected, and the collected multiple defect data are compared, and the defect rate and the number of defects are analyzed according to the comparison result, so that the defect detection result is visualized, and at the same time, whether the equipment has a fault is verified by the rationality of the defect detection result, so as to improve the fault detection capability when the equipment has a hidden abnormality.

Description

Technical Field

[0001] The present invention relates to the field of defect detection machines, and in particular to an electronic paper mother sheet AOI defect detection machine. Background Art

[0002] Electronic paper, also known as digital paper, is an ultra-thin and ultra-light display screen, which is understood as a display that is as thin, soft and rewritable as paper. Figuratively speaking, electronic paper is a thin film, and a layer of charged material coated on the film is electronic ink. It can also be seen as a thin embedded remote control display panel. In the current electronic paper industry, due to the characteristics of electronic paper display screens, all products need to undergo screen testing after program entry.

[0003] At present, the defect detection machines in the prior art still have shortcomings. Most of the existing defect detection machines can only be used to judge whether the product meets the standards. There is a lack of review of the judgment results and a lack of effective supervision means for the accuracy of the equipment. As a result, the detection accuracy of the defect detection machine is affected by the operating conditions of the equipment, and if there is an abnormality in the operation of the equipment, it is not easy to be discovered, which affects the detection effect of the defect detection machine.

[0004] In view of the above technical problems, this application proposes a solution. Summary of the invention

[0005] In the present invention, when defect detection is performed on an electronic paper mother sheet, defect detection data is collected, and multiple defect data collected are compared, and the defect rate and the number of defects are analyzed based on the comparison results, so that the defect detection results are visualized. At the same time, the rationality of the defect detection results is used to verify whether the equipment has a fault, thereby improving the fault detection capability when the equipment has hidden abnormalities, solving the problem that the detection effect of the defect detection machine is affected by the equipment working condition and the impact is not easy to be discovered, and proposing an electronic paper mother sheet AOI defect detection machine.

[0006] The purpose of the present invention can be achieved through the following technical solutions:

[0007] An electronic paper mother sheet AOI defect inspection machine, comprising a defect inspection machine and a defect inspection management system, wherein a visual controller and multiple groups of line scan cameras, line scan lenses and line scan light sources are arranged inside the defect inspection machine, wherein the multiple groups of line scan cameras form a line array, and a conveyor belt is arranged inside the defect inspection machine, wherein the electronic paper mother sheet is placed on the conveyor belt through a robot feeding structure, and is fed into the interior of the defect inspection machine through the conveyor belt, and image acquisition of the electronic paper mother sheet is completed through line array scanning;

[0008] The defect detection management system includes a visual inspection unit, an equipment calibration unit, a batch comprehensive analysis unit, an equipment maintenance unit and a data management unit. The visual inspection unit is used to collect images of the electronic paper master sheet and send the collected images to the batch comprehensive analysis unit.

[0009] The batch comprehensive analysis unit performs defect analysis on the collected images and sends the analysis results to the data management unit and the equipment maintenance unit;

[0010] The equipment maintenance unit can obtain the defect analysis result of the image, and determine whether to perform a self-check procedure on the equipment according to the defect analysis result, and send the self-check procedure running result to the data management unit;

[0011] The data management unit can obtain signals from the equipment maintenance unit and the batch comprehensive analysis unit, and generate corresponding signal warnings based on the signals.

[0012] As a preferred embodiment of the present invention, the visual inspection unit is capable of exchanging data with the visual controller, and the conveyor belt, line scan camera and line scan light source are controlled by the visual controller. The visual controller uploads the image acquired by the line array scanning to the visual inspection unit, and the visual inspection unit processes the image to acquire the number of defects in the image, and sends the number of defects to the batch comprehensive analysis unit.

[0013] As a preferred embodiment of the present invention, the batch comprehensive analysis unit counts the number of defects obtained by the visual inspection unit, and simultaneously obtains the number of all samples detected by the visual inspection unit, records it as the detection base, and obtains the defect rate by dividing the number of defects by the detection base. The batch comprehensive analysis unit compares the defect rate with a preset defect rate threshold. If the defect rate is greater than the preset defect rate threshold, a defect exceeding standard signal is generated; if the defect rate is less than or equal to the preset defect rate threshold, a defect rate qualified signal is generated.

[0014] As a preferred embodiment of the present invention, the batch comprehensive analysis unit performs overlap comparison on the defect positions in the acquired multiple groups of defect samples, and the overlap comparison steps are:

[0015] Step 1: The batch comprehensive analysis unit selects a group of defective samples and records them as the initial group, records the remaining defective samples as the comparison group, and calculates the defective areas in the defective samples. The area calculation is expressed in the form of the number of pixels;

[0016] Step 2: The batch comprehensive analysis unit selects a group of defective samples from the comparison group and also calculates the defect area in the form of the number of pixels;

[0017] Step 3: Compare the defect area of ​​the defective sample in step 2 with the defect area of ​​the defective sample in step 1. If the defect areas of the two groups are the same, a defect-similar signal is generated; if the defect areas of the two groups are different, an independent defect signal is generated.

[0018] The batch comprehensive analysis unit sends the defect exceeding standard signal and the defect close signal to the equipment maintenance unit, and sends the defect exceeding standard signal or the defect passing signal to the data management unit.

[0019] As a preferred embodiment of the present invention, after the equipment maintenance unit obtains the defect exceeding the standard signal, it generates an equipment self-test signal and sends the equipment self-test signal to the equipment proofreading unit. After the equipment proofreading unit obtains the equipment self-test signal, it runs the self-test program to perform fault self-test on the equipment. If the equipment has a fault, the fault signal is fed back to the batch comprehensive analysis unit. If the equipment does not have a fault, the normal signal of the equipment is fed back to the batch comprehensive analysis unit.

[0020] As a preferred embodiment of the present invention, after the equipment maintenance unit obtains the defect-similar signal, it generates a blank self-check signal and sends the blank self-check signal to the equipment proofreading unit. After the equipment proofreading unit obtains the blank self-check signal, it controls the defect detection machine to perform defect detection on the blank group, and performs image processing on the defect detection result of the blank group to obtain the number of defects in the image of the blank group. If the number of defects in the blank image is not 0, an image contamination signal is generated. If the number of defects in the blank image is 0, an image normal signal is generated.

[0021] As a preferred embodiment of the present invention, the equipment maintenance unit sends the image contamination signal to the data management unit, and the batch comprehensive analysis unit sends the equipment normal signal, fault signal, defect exceeding standard signal and defect qualified signal to the data management unit;

[0022] After the data management unit obtains the image contamination signal and the equipment failure signal, it generates a detection deviation warning based on the image contamination signal, and generates an equipment maintenance reminder at the same time. After the data management unit obtains the fault signal, it generates an equipment failure warning. After the data management unit obtains the equipment normal signal and the defect exceeding standard signal at the same time, it generates a product unqualified warning.

[0023] Compared with the prior art, the present invention has the following beneficial effects:

[0024] In the present invention, when defect detection is performed on the electronic paper mother sheet, defect detection data is collected, and the collected multiple defect data are compared, and the defect rate and the number of defects are analyzed according to the comparison results, so that the defect detection results are visualized and the presentation effect of the detection results is improved.

[0025] In the present invention, by comparing the number of defects of multiple groups of samples, the similarity of the detected defects is judged based on the comparison results, thereby analyzing the interference factors of the equipment during the detection, avoiding the detection results being affected by interference factors in the equipment, and preventing misjudgment of the product.

[0026] In the present invention, by analyzing the defect rate, intelligently analyzing the batch pass rate of the inspected products according to the analysis result of the defect rate, and automatically outputting the product inspection pass rate according to the analysis result, the functionality of the defect inspection machine is improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] In order to facilitate understanding by those skilled in the art, the present invention is further described below with reference to the accompanying drawings.

[0028] Figure 1 is a system block diagram of the present invention;

[0029] Figure 2 It is a system flow chart of the present invention. DETAILED DESCRIPTION

[0030] The technical solution of the present invention will be clearly and completely described below in conjunction with the embodiments. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention. Embodiment 1:

[0031] See also Figure 1 - Figure 2As shown, an electronic paper mother AOI defect inspection machine includes a defect inspection machine and a defect inspection management system, wherein the defect inspection machine adopts a line scanning method for visual inspection, a visual controller and multiple groups of line scanning cameras, line scanning lenses and line scanning light sources are arranged inside the defect inspection machine, each group of line scanning cameras, line scanning lenses and line scanning light sources correspond to each other, a conveyor belt is arranged inside the defect inspection machine, the electronic paper mother is placed on the conveyor belt through a robot feeding structure, and is sent into the interior of the defect inspection machine via the conveyor belt, the multiple groups of line scanning cameras inside the defect inspection machine form a line array, and the image acquisition of the electronic paper mother is completed through line array scanning, and the acquired image is processed. Graphics processing operation is performed to obtain comparable graphics. The comparable graphics after the graphics processing operation are detected and analyzed through algorithms. The AOI quality detection method is used for graphics detection and analysis. The template is aligned with the actual image by automatically selecting the positioning kernel, and the existence of defects is analyzed based on the gap between the aligned image and the template. The manual extraction method based on the human eye visual characteristics for regional sensitivity judgment has great limitations, and the modeling is complex when more positioning kernels are required. Therefore, the automatic extraction method is widely used at present to obtain the defect position of the electronic paper mother sheet being detected. The defect detection management system records and marks the defect position for management personnel to view;

[0032] The defect detection management system includes a visual inspection unit, an equipment calibration unit, a batch comprehensive analysis unit, an equipment maintenance unit and a data management unit. The visual inspection unit can exchange data with the visual controller and control the conveyor belt, line scan camera and line scan light source components through the visual controller. The visual controller uploads the image obtained by the line array scan to the visual inspection unit, which processes the image, obtains the number and location of defects in the image, and sends the number and location of defects to the batch comprehensive analysis unit.

[0033] The batch comprehensive analysis unit counts the number of defects and defect locations obtained by the visual inspection unit, and at the same time obtains the number of all samples detected by the visual inspection unit, records them as the detection base number, and obtains the defect rate by dividing the number of defects by the detection base number. The batch comprehensive analysis unit compares the defect rate with the preset defect rate threshold. If the defect rate is greater than the preset defect rate threshold, a defect exceeding standard signal is generated; if the defect rate is less than or equal to the preset defect rate threshold, a defect rate qualified signal is generated;

[0034] The batch comprehensive analysis unit compares the defect positions in the acquired multiple groups of defective samples. The steps of the comparison are as follows:

[0035] Step 1: The batch comprehensive analysis unit selects a group of defective samples and records them as the initial group, records the remaining defective samples as the comparison group, and calculates the defective areas in the defective samples. The area calculation is expressed in the form of the number of pixels;

[0036] Step 2: The batch comprehensive analysis unit selects a group of defective samples from the comparison group and also calculates the defect area in the form of the number of pixels;

[0037] Step 3: Compare the defect area of ​​the defective sample in step 2 with the defect area of ​​the defective sample in step 1. If the defect areas of the two groups are the same, a defect-similar signal is generated; if the defect areas of the two groups are different, an independent defect signal is generated.

[0038] The batch comprehensive analysis unit sends the defect exceeding standard signal and the defect similar signal to the equipment maintenance unit, and sends the defect exceeding standard signal or the defect passing signal to the data management unit. The data management unit can store the defect exceeding standard signal or the defect passing signal for subsequent viewing by the management personnel, thereby realizing the statistical analysis capability of the product batches. By analyzing the defect rate, the batch passing rate of the inspected products is intelligently analyzed according to the analysis results of the defect rate, thereby improving the functionality of the defect detection machine. Embodiment 2:

[0039] See also Figure 1 - Figure 2 As shown, after the equipment maintenance unit obtains the defect exceeding standard signal, it generates an equipment self-test signal and sends the equipment self-test signal to the equipment proofreading unit. After the equipment proofreading unit obtains the equipment self-test signal, it runs the self-test program to perform fault self-test on the equipment. After the self-test is completed, it generates a fault self-test log and sends it to the equipment maintenance unit. The equipment maintenance unit confirms the fault situation through the fault self-test log. If the equipment has a fault situation, the fault signal is fed back to the batch comprehensive analysis unit. If the equipment does not have a fault situation, the normal signal of the equipment is fed back to the batch comprehensive analysis unit.

[0040] After the equipment maintenance unit obtains the defect-similar signal, it indicates that the defects of the multiple groups of products detected are too similar. The defect detection capability of the equipment is self-checked to avoid the deviation of the detection result caused by the equipment interference factors during the detection. The equipment maintenance unit generates a blank self-check signal and sends the blank self-check signal to the equipment proofreading unit. After the equipment proofreading unit obtains the blank self-check signal, it controls the defect detection machine to perform defect detection on the blank group, and performs image processing and analysis on the defect detection results of the blank group to obtain the number of defects in the image of the blank group. If the number of defects in the blank image is not 0, an image contamination signal is generated. If the number of defects in the blank image is 0, an image normal signal is generated. The blank group is a standard electronic paper mother sheet without defects, so as to avoid the detection result being affected by the interference factors of the equipment and prevent misjudgment of the product.

[0041] The equipment maintenance unit sends the image contamination signal to the data management unit. After the data management unit obtains the image contamination signal and the equipment failure signal, it generates a detection deviation warning based on the image contamination signal and generates an equipment maintenance reminder.

[0042] The batch comprehensive analysis unit sends the equipment normal signal, fault signal, defect exceeding standard signal and defect qualified signal to the data management unit. After the data management unit obtains the fault signal, it generates an equipment fault warning. After the data management unit obtains the equipment normal signal and the defect exceeding standard signal at the same time, it generates a product unqualified warning.

[0043] In the present invention, when defect detection is performed on the electronic paper mother sheet, defect detection data is collected, and multiple defect data collected are compared. The defect rate and the number of defects are analyzed based on the comparison results, so that the defect detection results are visualized. At the same time, whether the device has a fault is verified through the rationality of the defect detection results, thereby improving the fault detection capability when the device has hidden abnormalities.

[0044] The preferred embodiments of the present invention disclosed above are only used to help explain the present invention. The preferred embodiments do not describe all the details in detail, nor do they limit the invention to only specific implementation methods. Obviously, many modifications and changes can be made according to the content of this specification. This specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the present invention, so that those skilled in the art can understand and use the present invention well. The present invention is limited only by the claims and their full scope and equivalents.

Claims

1. An electronic paper mother sheet AOI defect inspection machine, comprising a defect inspection machine and a defect inspection management system, characterized in that: The defect detection machine is provided with a visual controller and multiple groups of line scan cameras, line scan lenses and line scan light sources. The multiple groups of line scan cameras form a line array. A conveyor belt is provided inside the defect detection machine. The electronic paper mother sheet is placed on the conveyor belt through a robot feeding structure and is sent into the defect detection machine through the conveyor belt. The image of the electronic paper mother sheet is acquired through line array scanning. The defect detection management system includes a visual inspection unit, an equipment calibration unit, a batch comprehensive analysis unit, an equipment maintenance unit and a data management unit. The visual inspection unit is used to collect images of the electronic paper master sheet and send the collected images to the batch comprehensive analysis unit. The batch comprehensive analysis unit performs defect analysis on the collected images and sends the analysis results to the data management unit and the equipment maintenance unit; The batch comprehensive analysis unit performs overlap comparison on the defect positions in the acquired multiple groups of defect samples, and the overlap comparison steps are as follows: Step 1: The batch comprehensive analysis unit selects a group of defective samples and records them as the initial group, records the remaining defective samples as the comparison group, and calculates the defective areas in the defective samples. The area calculation is expressed in the form of the number of pixels; Step 2: The batch comprehensive analysis unit selects a group of defective samples from the comparison group and also calculates the defect area in the form of the number of pixels; Step 3: Compare the defect area of ​​the defective sample in step 2 with the defect area of ​​the defective sample in step 1. If the defect areas of the two groups are the same, a defect-similar signal is generated; if the defect areas of the two groups are different, an independent defect signal is generated. The batch comprehensive analysis unit sends the defect exceeding standard signal and the defect close signal to the equipment maintenance unit, and sends the defect exceeding standard signal or the defect qualified signal to the data management unit; The equipment maintenance unit can obtain the defect analysis result of the image, and determine whether to perform a self-check procedure on the equipment according to the defect analysis result, and send the self-check procedure running result to the data management unit; After the equipment maintenance unit obtains the defect-similar signal, it generates a blank self-check signal and sends the blank self-check signal to the equipment proofreading unit. After the equipment proofreading unit obtains the blank self-check signal, it controls the defect detection machine to perform defect detection on the blank group, and performs image processing on the defect detection result of the blank group to obtain the number of defects in the image of the blank group. If the number of defects in the blank image is not 0, an image contamination signal is generated. If the number of defects in the blank image is 0, an image normal signal is generated. The data management unit can obtain signals from the equipment maintenance unit and the batch comprehensive analysis unit, and generate corresponding signal warnings based on the signals.

2. The electronic paper mother sheet AOI defect inspection machine according to claim 1, characterized in that: The visual inspection unit can exchange data with the visual controller, and control the conveyor belt, line scan camera and line scan light source through the visual controller. The visual controller uploads the image acquired by the line array scanning to the visual inspection unit, and the visual inspection unit processes the image to acquire the number of defects in the image, and sends the number of defects to the batch comprehensive analysis unit.

3. The electronic paper mother sheet AOI defect inspection machine according to claim 2, characterized in that: The batch comprehensive analysis unit counts the number of defects obtained by the visual inspection unit, and at the same time obtains the number of all samples detected by the visual inspection unit, records it as the detection base, and obtains the defect rate by dividing the number of defects by the detection base. The batch comprehensive analysis unit compares the defect rate with a preset defect rate threshold. If the defect rate is greater than the preset defect rate threshold, a defect exceeding standard signal is generated; if the defect rate is less than or equal to the preset defect rate threshold, a defect rate qualified signal is generated.

4. The electronic paper mother sheet AOI defect inspection machine according to claim 3, characterized in that: After the equipment maintenance unit obtains the defect exceeding the standard signal, it generates an equipment self-test signal and sends the equipment self-test signal to the equipment proofreading unit. After the equipment proofreading unit obtains the equipment self-test signal, it runs the self-test program to perform fault self-test on the equipment. If the equipment has a fault, the fault signal is fed back to the batch comprehensive analysis unit. If the equipment does not have a fault, the normal signal of the equipment is fed back to the batch comprehensive analysis unit.

5. The electronic paper mother sheet AOI defect inspection machine according to claim 4, characterized in that: The equipment maintenance unit sends the image pollution signal to the data management unit, and the batch comprehensive analysis unit sends the equipment normal signal, fault signal, defect exceeding standard signal and defect qualified signal to the data management unit; After the data management unit obtains the image contamination signal and the equipment failure signal, it generates a detection deviation warning based on the image contamination signal, and generates an equipment maintenance reminder at the same time. After the data management unit obtains the fault signal, it generates an equipment failure warning. After the data management unit obtains the equipment normal signal and the defect exceeding standard signal at the same time, it generates a product unqualified warning.

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