Isolation amplifier test method and test system

Abstract

The present application relates to the field of automated testing technology, specifically to an isolation amplifier testing method and testing system, wherein the testing method includes: obtaining the safety test results of the isolation amplifier; determining the actual test boundary conditions of the isolation amplifier based on the safety test results; generating a first actual test parameter sequence for testing based on the actual test boundary conditions, and obtaining a first actual test result; extracting a first result change feature sequence in the first actual test result, wherein the first result change feature sequence is a change feature between first actual test results corresponding to adjacent first actual test parameters; determining a second actual test parameter sequence based on the first result change feature sequence; fusing the first actual test result and the second actual test result obtained based on the second actual test parameter sequence to obtain the test result of the isolation amplifier. The application of the isolation amplifier is realized to provide more comprehensive and accurate test data.

Description

Technical Field

[0001] The present application relates to the field of automated testing technology, and in particular to an isolation amplifier testing method and testing system. Background Art

[0002] As a special measurement amplifier circuit, the isolation amplifier is usually used for various purposes such as electrical isolation and industrial automation. In the research and development of nuclear fusion devices, the isolation amplifier is also a very important device. Before application, the performance of the isolation amplifier needs to be fully tested. For example, the amplitude-frequency response characteristics and linearity of the isolation amplifier need to be tested.

[0003] Taking the test of the amplitude-frequency response of the isolation amplifier as an example, different frequencies need to be set when performing the amplitude-frequency test to test the attenuation of the amplitude of the excitation signal after passing through the isolation amplifier. In the prior art, each time a set of data is tested, the frequency of the signal generator needs to be manually set, which is a relatively complicated operation, causing visual and operational fatigue, resulting in low test efficiency and invalid data. Especially for the test requirements of the amplitude-frequency response and linearity of large quantities of isolation amplifiers, manually setting the amplitude and frequency of the excitation signal and saving the data requires a lot of human resources, and the test efficiency is extremely low.

[0004] Moreover, in the prior art, when conducting a test, the general test process is that the operator sets some discrete parameters, and the test process is carried out according to the parameters. If the parameters or the isolation amplifier are not set properly, the equipment or device may be damaged. In addition, since the test results of the isolation amplifier may have special problems such as abnormal fluctuations at some specific frequencies, it is difficult to find defects of such problems by setting discrete test parameters.

[0005] Therefore, how to test the isolation amplifier efficiently and accurately becomes a technical problem that needs to be solved urgently. Summary of the invention

[0006] The present application provides an isolation amplifier testing method and a testing system to solve the technical problem of how to efficiently and accurately test an isolation amplifier mentioned in the above background technology.

[0007] According to a first aspect, the present application provides an isolation amplifier testing method, the testing method comprising: obtaining a safety test result of the isolation amplifier; determining an actual test boundary condition of the isolation amplifier based on the safety test result; generating a first actual test parameter sequence for testing based on the actual test boundary condition, and obtaining a first actual test result; extracting a first result change characteristic sequence in the first actual test result, wherein the first result change characteristic sequence is a change characteristic between first actual test results corresponding to adjacent first actual test parameters; determining a second actual test parameter sequence based on the first result change characteristic sequence; and fusing the first actual test result and the second actual test result obtained based on the second actual test parameter sequence to obtain a test result of the isolation amplifier.

[0008] In one embodiment, determining the actual test boundary conditions of the isolation amplifier based on the safety test results includes: predicting the test results under all test parameters of the isolation amplifier based on the safety test results to obtain predicted test results; determining a test result safety range in the predicted test results; determining a test parameter safety range based on the test result safety range; and constructing the actual test boundary conditions based on the test result safety range and the side test parameter safety range.

[0009] In one embodiment, predicting the test results of all test parameters of the isolation amplifier based on the safety test results to obtain the predicted test results includes: performing polynomial fitting on the safety test results and the safety test parameters corresponding to the safety test results to obtain a test result prediction model; and predicting the predicted test results corresponding to any test parameter based on the test result prediction model.

[0010] In one embodiment, determining the second actual test parameter sequence based on the first result change characteristic sequence includes: determining whether there is fluctuation in the first actual test results between adjacent first actual test parameters based on the first result change characteristic sequence; if there is fluctuation, generating N test parameters between adjacent first actual test parameters as second actual test parameters, where N is a positive integer greater than or equal to 1.

[0011] In one embodiment, determining whether there is a fluctuation in the first actual test result between adjacent first actual test parameters based on the change characteristics includes: extracting the change trend and / or the change rate in each first result change characteristic; comparing the change trends and / or the change rates between adjacent first result change characteristics one by one; when adjacent change trends change and / or the difference between adjacent change rates is greater than a preset value, determining that the first actual test result fluctuates between the corresponding first actual test parameters.

[0012] In one embodiment, after determining that a first actual test result between adjacent first actual test parameters fluctuates, the method further includes: determining an abnormal test result in the second actual test result; and determining an inherent abnormal test parameter of the isolation amplifier based on the abnormal test result.

[0013] In one embodiment, when the isolation amplifier is tested based on the first actual test parameter sequence and / or the second actual test parameter sequence, a simulated magnetic field during the magnet discharge process in a nuclear fusion device is applied to the environment in which the isolation amplifier is located; the first actual test result and the second actual test result under the simulated magnetic field are obtained; the second result change characteristic sequence in the first actual test result and the second actual test result is extracted; and the working abnormality test parameter is determined based on the second result change characteristic sequence.

[0014] In one embodiment, applying a simulated magnetic field during magnet discharge in a nuclear fusion device in the environment where the isolation amplifier is located includes: respectively obtaining magnetic field parameters corresponding to the current increase period, current stabilization period, and current reduction period of the magnet discharge cycle in the nuclear fusion device; when testing the isolation amplifier based on the first actual test parameter sequence and / or the second actual test parameter sequence, applying magnetic field parameters corresponding to the current increase period, current stabilization period, and current reduction period in sequence.

[0015] In one embodiment, when testing a batch of isolation amplifiers, it also includes: selecting part or all of the actual test parameters in the first actual test parameter sequence and the second actual test parameter sequence of the previous isolation amplifier as the first actual test parameters of the next isolation amplifier to test the next isolation amplifier, and extracting a first result change characteristic sequence from the first actual test result obtained based on the first actual test parameter sequence, wherein the first result change characteristic sequence is a change characteristic between first actual test results corresponding to adjacent first actual test parameters; determining a second actual test parameter sequence based on the first result change characteristic sequence; and fusing the first actual test result and the second actual test result obtained based on the second actual test parameter sequence to obtain the test result of the isolation amplifier, until the testing of all isolation amplifiers is completed.

[0016] According to a second aspect, an embodiment of the present application provides an isolation amplifier testing system, comprising: a signal generator, a test result collector and a host computer, wherein the signal generator is connected to the input end of the isolation amplifier, the test result collector is connected to the output end of the isolation amplifier, the host computer is connected to the signal generator and the test result collector respectively, and the host computer is used to execute the isolation amplifier testing method described in any one of the above-mentioned first aspects.

[0017] Compared with the prior art, this application has at least the following technical effects:

[0018] When testing the isolation amplifier, the actual test boundary conditions of the isolation amplifier are determined based on the safety test results; a first actual test parameter sequence is generated within the actual test boundary conditions; a first result change characteristic sequence is extracted from the first actual test result obtained based on the first actual test parameter sequence, and the first result change characteristic sequence is the change characteristic between the first actual test results corresponding to adjacent first actual test parameters; a second actual test parameter sequence is determined based on the first result change characteristic sequence; and the first actual test result and the second actual test result obtained based on the second actual test parameter sequence are fused to obtain the test result of the isolation amplifier. That is, the actual safe test boundary conditions are first determined through the safety test parameters to prevent the test equipment or isolation amplifier from being damaged due to improper discrete test parameter setting during the test. In addition, in the present application, the first actual test parameter is determined based on the safety test parameter, and the first actual test result is obtained, so that tests such as amplitude-frequency response and linearity can be completed; further, the next parameter is automatically generated according to the change characteristics of the first batch of test results, which not only ensures safety while using as many test parameters as possible to achieve comprehensive testing, but also can efficiently determine the inherent abnormal test parameters and working abnormal test parameters of the current isolation amplifier through the change characteristics of the test results, so as to provide more comprehensive and accurate test data for the application of the isolation amplifier.

[0019] Furthermore, when performing the first actual test, the first actual test parameter can be selected with a larger step size to speed up the test efficiency, and the first actual test result can be obtained based on the first actual test parameter, and the test results of the amplitude-frequency response characteristics and linearity of the isolation amplifier can be preliminarily determined. By analyzing the first actual test result, the test parameter interval where abnormal fluctuations may exist is determined, and the second actual test parameter sequence is generated corresponding to the test parameter interval. The interval is tested more specifically to perform more detailed tests on some abnormal fluctuations that may exist between the test parameters on the adjacent sides, and the abnormal test parameter points of the isolation amplifier can be obtained with higher efficiency.

[0020] Further, the change characteristics between the first actual test results are analyzed one by one, specifically, the change trend and / or change rate in each first result change characteristic are extracted; the change trends and / or the change rates between adjacent first result change characteristics are compared one by one; when the adjacent change trends change and / or the difference between adjacent change rates is greater than a preset value, it is determined that the first actual test result fluctuates between the corresponding first actual test parameters. The change rate and change trend between adjacent first actual test results are calculated. When the change trend changes, there may be a peak between adjacent first actual test results; when the change trends are the same, by comparing the values ​​of the change rates, if the difference between the values ​​of the adjacent change rates is large, the test results may have a mutation. In view of this, more test parameters are selected with a smaller step size between two or three first actual test parameters to determine the specific frequency point corresponding to the fluctuation of the test result as the inherent abnormal test parameter of the isolation amplifier.

[0021] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, preferred embodiments are specifically cited below and described in detail with reference to the attached drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0023] Figure 1 A schematic diagram of an isolation amplifier test system provided for this application;

[0024] Figure 2 A schematic diagram of a process for testing an isolation amplifier provided in this application;

[0025] Figure 3 A schematic diagram of a discharge cycle for discharging a magnet in a nuclear fusion device in an embodiment of the present application;

[0026] Figure 4 It is a schematic diagram of the structure of the host computer in the embodiment of the present application. DETAILED DESCRIPTION

[0027] The technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all of the embodiments. The components of the embodiments of the present application described and shown in the drawings here can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the application claimed for protection, but merely represents the selected embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without making creative work belong to the scope of protection of the present application.

[0028] The present application embodiment provides an isolation amplifier test method, which is executed by an isolation amplifier test system and can test the input and output characteristics, isolation characteristics, frequency response characteristics and power supply characteristics of the isolation amplifier. In this embodiment, the amplitude-frequency response test and the linearity test are used as examples for explanation. Figure 1 As shown, the test system includes:

[0029] A signal generator 10, a test result collector 20 and a host computer 30, wherein the signal generator 10 is connected to the input end of the isolation amplifier, the test result collector 20 is connected to the output end of the isolation amplifier, and the host computer 30 is connected to the signal generator 10 and the test result collector 20 respectively. Figure 2 As shown, the testing method includes the following steps S10 to S60:

[0030] S10. Obtain the safety test results of the isolation amplifier.

[0031] In this embodiment, before testing the isolation amplifier, some safety test parameters can be selected according to the nominal parameters of the isolation amplifier. The so-called safety test parameters are: when the safety test parameters are input for testing, the hardware such as the test equipment and the isolation amplifier will not be damaged, and the safety test parameters are all within the cutoff test parameter range. The host computer 30 outputs a test instruction corresponding to the safety test parameter to control the signal generator 10 to output the safety test parameter, the safety test parameter is input to the isolation amplifier for testing, and the test result collector 20 collects the test results to obtain the safety test result. Exemplarily, taking the amplitude-frequency response test of the isolation amplifier as an example, its cutoff test parameters can be parameters such as the maximum cutoff frequency, the minimum cutoff frequency, and the frequency corresponding to the maximum amplitude.

[0032] S20. Determine actual test boundary conditions of the isolation amplifier based on the safety test result.

[0033] After obtaining the safety test result, the safety test result is analyzed to obtain the actual test boundary conditions. In this embodiment, for determining the actual test boundary conditions, the safety test result can be used to fit the test results corresponding to the global test parameters of the isolation amplifier to obtain the fitting test results. For example, the safety test result is an amplitude-frequency response test result. In this case, after obtaining the corresponding amplitude output by the isolation amplifier based on the safety test frequency, the fitting amplitude-frequency response curve of the isolation amplifier is fitted based on the amplitude and the corresponding safety test frequency, and the safety test frequency value and the safety amplitude are determined on the fitting amplitude-frequency response curve, that is, the cutoff frequency and the frequency corresponding to the maximum amplitude, and the maximum amplitude are used as the safety test boundary. For another example, the safety test result is a linearity test result. In this case, after obtaining the corresponding output voltage output by the isolation amplifier based on the safety test voltage, the fitting linearity curve of the isolation amplifier is fitted based on the safety test voltage and the corresponding output voltage, and the safety voltage values ​​of the input and output are determined on the fitting linearity curve, that is, the maximum voltage value and the minimum voltage value of the input and output are used as the safety test boundary.

[0034] S30. Based on the actual test boundary conditions, generate a first actual test parameter sequence for testing, and obtain a first actual test result.

[0035] In this embodiment, after obtaining the actual test boundary conditions, a plurality of corresponding test parameters can be selected within the actual test boundary conditions to form a first actual test parameter sequence, the first actual test parameter sequence can be input into the isolation amplifier, and the corresponding first actual test result can be collected by the test result collector 20. In this embodiment, any actual test parameter can be selected within the actual test boundary conditions, or the actual test parameter can be selected according to a preset step size in the actual test boundary conditions. After obtaining the first actual test parameter sequence, the isolation amplifier is tested using the first actual test parameter to obtain the first actual test result corresponding to the first actual test parameter sequence.

[0036] Taking the amplitude-frequency response test as an example, the actual test boundary conditions may include the maximum amplitude and minimum amplitude of the test signal sent by the signal generator 10 to the isolation amplifier, the maximum cutoff frequency and minimum cutoff frequency of the test signal, etc., and a corresponding amplitude sequence is selected between the maximum amplitude and the minimum amplitude of the test signal, and a corresponding frequency is selected between the maximum cutoff frequency and the minimum cutoff frequency to construct a first actual test parameter sequence.

[0037] Similarly, for linearity testing, the actual boundary conditions may be the maximum voltage value and the minimum voltage value of the test signal sent by the signal generator 10 to the isolation amplifier, and a corresponding voltage value between the maximum voltage value and the minimum voltage value is selected to construct the first actual test parameter sequence.

[0038] S40. Extract a first result change feature sequence from the first actual test result, wherein the first result change feature sequence is a change feature between first actual test results corresponding to adjacent first actual test parameters.

[0039] After obtaining the first actual test result sequence, the change characteristics between adjacent first actual test results or between M first actual test results are extracted respectively. The change characteristics may include slope values, change trends, etc. between the actual results, so as to determine whether the first actual test results have abnormal fluctuations through the first result change characteristic sequence, for example, some abnormal attenuation, gain or resonance phenomena occur.

[0040] S50. Determine a second actual test parameter sequence based on the first result change characteristic sequence.

[0041] In this embodiment, when performing the first actual test, the first actual test parameter can be selected with a larger step size to speed up the test efficiency. After obtaining the first actual test result, the test parameter interval where abnormal fluctuations may exist is determined by analyzing the actual test result, and a second actual test parameter sequence is generated corresponding to the test parameter interval. The interval is tested more specifically to perform more detailed tests on some abnormal fluctuations that may exist between the test parameters on the adjacent sides, so that the abnormal test parameter points of the isolation amplifier can be obtained with higher efficiency.

[0042] S60. Fusing the first actual test result and the second actual test result obtained based on the second actual test parameter sequence to obtain a test result of the isolation amplifier.

[0043] The first actual test result and the second actual test result can be a plurality of test result sequence points obtained based on the first actual test parameter sequence and the second actual test parameter sequence, respectively. In one embodiment, when the first actual test result and the second actual test result are fused, the second actual test result can be interpolated into the first actual test result according to the correspondence between the first actual test parameter sequence and the second actual test parameter sequence to obtain the test result of the isolation amplifier. In an optional embodiment, each sequence point value in the interpolation result can be further curve-fitted to obtain a test result curve.

[0044] In another optional embodiment, when the first actual test result and the second actual test result are merged, the sequence point values ​​corresponding to the first actual test result can be respectively curve-fitted to obtain the first test result curve corresponding to the first actual test result, and the sequence point values ​​corresponding to the second actual test result can be curve-fitted to obtain the second test result curve corresponding to the second actual test result, and the average curve of the first test result curve and the second test result curve is obtained to obtain the test result of the isolation amplifier. The first actual test result and the second actual test result are merged and stored. In this embodiment, the second actual test result can be interpolated into the first actual test result according to the corresponding relationship between the first actual test parameter and the second actual test parameter to obtain the final test result. For the amplitude-frequency response test, the echarts plug-in can also be used to draw the final test result into an amplitude response curve and present it on the display page. Among them, the x-axis of the amplitude-frequency response curve is the frequency corresponding to the first actual test parameter and the second actual test parameter, and the y-axis is the amplitude corresponding to the corresponding final test result, or other test indicators. For example, if the test indicator is amplitude, the y-axis displays the test result corresponding to the amplitude of the output signal of the isolation amplifier. You can also select the minimum, maximum, average and effective value in the test results for statistical analysis and draw curves to increase the richness, validity and reliability of the data.

[0045] In the present application, when testing the isolation amplifier, the actual test boundary conditions of the isolation amplifier are determined based on the safety test results; a first actual test parameter sequence is generated within the actual test boundary conditions; a first result change feature sequence is extracted from the first actual test result obtained based on the first actual test parameter sequence, and the first result change feature sequence is the change feature between the first actual test results corresponding to adjacent first actual test parameters; a second actual test parameter sequence is determined based on the first result change feature sequence; and the first actual test result and the second actual test result obtained based on the second actual test parameter sequence are integrated to obtain the test result of the isolation amplifier. That is, the actual test boundary conditions of safety are first determined by the safety test parameters to prevent the damage of the test equipment or the isolation amplifier caused by improper setting of discrete test parameters during the test. In addition, in the present application, starting from the safety test parameters, the next parameter is automatically generated according to the change characteristics of the first batch of test results, which not only uses as many test parameters as possible while ensuring safety to achieve comprehensive testing, but also can efficiently determine the inherent abnormal test parameters and working abnormal test parameters of the current isolation amplifier through the change characteristics of the test results, so as to provide more comprehensive and accurate test data for the application of the isolation amplifier.

[0046] In one embodiment, for the determination of the actual test boundary conditions, in this embodiment, the test results corresponding to the global test parameters of the isolation amplifier can be predicted by the safety test results to obtain the corresponding prediction results. And based on the performance of the test equipment, such as the withstand voltage level, the predicted test results are analyzed to determine the test result safety range, and then the corresponding test parameter safety range can be determined by the test result safety range. In this embodiment, after obtaining the predicted test results, the cutoff values ​​of the corresponding test parameters can also be determined based on the predicted test results, for example, the maximum cutoff frequency, the minimum cutoff frequency, the maximum input amplitude, the minimum input amplitude, the maximum input voltage, the minimum input voltage and other test parameter ranges.

[0047] For the prediction of the test results, in this embodiment, a polynomial fitting method can be used to construct multiple sets of known data groups through the first actual test result sequence and the first actual test parameter sequence, and the coefficients of the initial polynomial are obtained using the multiple sets of known parameter groups, thereby obtaining the polynomial corresponding to the isolation amplifier as a test result prediction model. Any test parameter can be input into the test result prediction model to obtain the corresponding predicted test result.

[0048] In this embodiment, a test curve of the isolation amplifier can also be constructed based on the test result prediction model. For example, an amplitude-frequency response curve can be constructed, and a linearity curve can also be constructed. After obtaining the test curve, the test result boundary and the test parameter boundary are determined on the test curve to determine the actual test boundary conditions.

[0049] In another embodiment, an actual test curve can also be constructed for the first actual test parameter sequence and the first actual test result, and the actual test curve can be compared with the nominal test curve of the isolation amplifier to obtain an error characteristic, and the error characteristic can be used as the error characteristic of the global test parameters and the global test results of the isolation amplifier to further construct the actual test curve, and the test result boundary and the test parameter boundary can be determined based on the actual test curve to determine the actual test boundary conditions.

[0050] Taking the amplitude-frequency response test as an example, due to the physical characteristics of the isolation amplifier, obvious attenuation or resonance phenomena, as well as abnormal fluctuations in the test results such as sudden changes in gain may occur at certain frequencies. For example, the parasitic capacitance and inductance inside the isolation amplifier may form resonance at a specific frequency, resulting in changes in impedance, thereby causing a sudden change in gain. The characteristics of some inductive devices change at specific frequencies, affecting the overall gain of the amplifier. For another example, when the output signal is delayed and a phase shift occurs, oscillation may occur. Therefore, in this embodiment, the frequency range of the input signal corresponding to the possible abnormal fluctuation can be determined by analyzing the first actual test result, and then new test parameters can be further generated based on the range, that is, within the frequency range of the input signal corresponding to the possible abnormal fluctuation, the step size of the test parameter can be further reduced, so that the frequency point where the abnormality occurs can be obtained efficiently and accurately.

[0051] Specifically, based on the first result change characteristic sequence, determine whether there is fluctuation in the first actual test results between adjacent first actual test parameters; if there is fluctuation, generate N test parameters between the adjacent first actual test parameters as second actual test parameters, where N is a positive integer greater than or equal to 1.

[0052] In this embodiment, the change characteristics between the first actual test results can be analyzed one by one. Specifically, the change trend and / or change rate in each first result change characteristic are extracted; the change trend and / or the change rate between adjacent first result change characteristics are compared one by one; when the adjacent change trends change and / or the difference between adjacent change rates is greater than a preset value, it is determined that the first actual test result fluctuates between the corresponding first actual test parameters. The change rate and change trend between adjacent first actual test results are calculated. When the change trend changes, there may be a peak between adjacent first actual test results; when the change trends are the same, by comparing the values ​​of the change rates, if the difference between the values ​​of the adjacent change rates is large, the test results may have a mutation. In view of this, more test parameters are selected with a smaller step size between two or three first actual test parameters to determine the specific frequency point corresponding to the fluctuation of the test result as the inherent abnormal test parameter of the isolation amplifier.

[0053] In one embodiment, if there is a peak between adjacent first actual test results in the second actual test result, when the first actual test result and the second actual test result are fused by obtaining the average curve of the first test result curve and the second test result curve, the first actual test result is ignored at the peak and only the second actual test result is taken.

[0054] In one embodiment, the isolation amplifier is used in a nuclear fusion device, and the nuclear fusion device often generates a huge magnetic field when it is in operation. The magnetic field has a great impact on the magnetic components in the isolation amplifier. In the high magnetic field environment of the nuclear fusion operation, the internal circuit of the isolation amplifier may induce additional voltage and current, thereby introducing electromagnetic interference. Abnormal attenuation or gain may occur at certain frequency points. In addition, the magnetic components (such as transformers) included in the isolation amplifier may change the magnetic permeability and inductance of the magnetic components in the high magnetic field environment. This will affect the frequency response characteristics of the amplifier, resulting in a sudden change in gain at some frequency points.

[0055] The test parameters corresponding to the above-mentioned abnormalities may be different from the inherent abnormal parameters of the isolation amplifier. Therefore, in order to test whether the isolation amplifier can work normally in a nuclear fusion environment, that is, to test the abnormal working parameters of the isolation amplifier in its working environment, in this embodiment, when the isolation amplifier is tested based on the first actual test parameter sequence and / or the second actual test parameter sequence, a simulated magnetic field during the magnet discharge process in a nuclear fusion device is applied to the environment in which the isolation amplifier is located; the first actual test result and the second actual test result under the simulated magnetic field are obtained; the second result change characteristic sequence in the first actual test result and the second actual test result is extracted; and the abnormal working test parameters are determined based on the second result change characteristic sequence.

[0056] See also Figure 3 As shown, the power supply in the nuclear fusion device performs pulse discharge on the magnet, and in one discharge cycle there are a current increase period, a current stabilization period and a current decrease period, wherein the magnetic field parameters corresponding to each period are different. Therefore, in order to be able to determine all the abnormal working test parameters of the isolation amplifier when facing different magnetic field parameters during the entire discharge cycle, in one embodiment, when the isolation amplifier is tested based on the first actual test parameter sequence and / or the second actual test parameter sequence, the magnetic field parameters corresponding to the current increase period, the current stabilization period and the current decrease period are applied in sequence.

[0057] In one embodiment, when testing a batch of isolation amplifiers, since there are certain differences in the manufacturing process of each isolation amplifier, the inherent abnormal frequency and working abnormal frequency of each isolation amplifier, as well as the corresponding test results may be different. At the same time, in order to improve the test efficiency, in this embodiment, part or all of the actual test parameters can be selected from the first actual test parameter sequence and the second actual test parameter sequence of the previous isolation amplifier as the first actual test parameters of the next isolation amplifier to test the next isolation amplifier, and extract the first result change feature sequence from the first actual test result obtained based on the first actual test parameter sequence, the first result change feature sequence is the change feature between the first actual test results corresponding to adjacent first actual test parameters; determine the second actual test parameter sequence based on the first result change feature sequence; and fuse the first actual test result and the second actual test result obtained based on the second actual test parameter sequence to obtain the test result of the isolation amplifier, until the testing of all isolation amplifiers is completed.

[0058] Use part or all of the first actual test parameters and the second actual test parameters of the previous isolation amplifier as the first actual test parameters of the next isolation amplifier, and cyclically execute the first result change characteristic sequence of the first actual test result obtained by the first actual test parameters of the current isolation amplifier to supplement the second actual test parameters of the current isolation amplifier, so as to obtain the comprehensive test results of the current isolation amplifier as well as the inherent abnormal test parameters and the working abnormal test parameters in a more comprehensive and efficient manner.

[0059] The present application also provides an isolation amplifier test system. Figure 1 As shown, the test system includes: a signal generator 10, a test result collector 20 and a host computer 30, wherein the signal generator 10 is connected to the input end of the isolation amplifier, the test result collector 20 is connected to the output end of the isolation amplifier, and the host computer 30 is connected to the signal generator 10 and the test result collector 20 respectively, and the host computer 30 can be a server, a terminal, or a combination thereof. The test result collector 20 is an oscilloscope or ADC module. In this embodiment, an oscilloscope can be used as the test result collector 20. Among them, for the amplitude-frequency response test, the oscilloscope and the signal generator 10 are connected through Ethernet, and the host computer 30 remotely interacts with the oscilloscope and the signal generator 10 through the SCPI protocol, and the amplitude and frequency of the excitation signal are remotely controlled by software to realize the automatic test of the amplitude-frequency response of the isolation amplifier. In addition, for the hardware linearity test, the multimeter and the voltage regulator are connected through the Raspberry Pi serial port, and the relevant parameters are remotely controlled through the SCPI protocol to realize the automatic test of the hardware linearity.

[0060] Take the automated test of the amplitude-frequency response of an isolation amplifier as an example:

[0061] Before testing, the oscilloscope and signal generator 10 are powered on, connected to the host computer 30 through the Ethernet port, and an IP address is assigned to them. When the user enters the front-end page, the browser generates an ID to distinguish the user. The host computer 30 establishes a connection through Ethernet based on the IP addresses of the signal generator 10 and the oscilloscope. After the connection is successful, the device connection status can be returned through the socket and displayed on the front-end page. After the connection is successful, the amplitude-frequency response automated test of the isolation amplifier can be remotely implemented.

[0062] After the device is successfully connected, select the channel where the oscilloscope and signal generator 10 are connected to the isolation amplifier. Take the example that both the signal generator 10 and the oscilloscope have four channels. The signal generator 10 is connected to the input of the isolation amplifier to provide it with an input signal; the oscilloscope collects the output signal of the isolation amplifier. During the channel selection process, the input channel can be unselected, and the output channel must be lower than the input channel. The host computer 30 will make a judgment based on the selected input and output channels, and other channels whose output channels are higher than the input channels are forced not to be selected.

[0063] After connecting the channels, the safety test parameters are set, including signal amplitude, signal frequency, test index, statistical index, statistical measurement times, attenuation of the signal generator 10 and the oscilloscope, and impedance of the signal generator 10 .

[0064] The signal amplitude is the amplitude of the waveform sent by the signal generator 10 to the isolation amplifier; the signal frequency is the frequency at which the signal generator 10 sends the corresponding input signal to the isolation amplifier; the test index is the peak value, effective value, phase difference and other indicators of the amplitude of the output signal after the input signal passes through the isolation amplifier.

[0065] The oscilloscope measures the output signal of the isolation amplifier according to the selected statistical indicators, which may include, for example, minimum value, average value, maximum value, effective value, and other statistical indicators.

[0066] The oscilloscope measures the statistical interval, which can represent that the oscilloscope acquires data of the signal output by the isolation amplifier every a preset number of cycles.

[0067] At the same time, the attenuation of the signal generator 10 needs to be considered, and the attenuation of the signal generator 10 represents the multiple of the amplification of the output signal of the signal generator 10. By selecting different parameters, the output signal is amplified by different multiples. The parameters of the attenuation of the signal generator 10 include 1 times, 2 times, 5 times and 10 times.

[0068] At the same time, the oscilloscope attenuation needs to be considered: the oscilloscope collects the output signal of the isolation amplifier. In order to ensure the accuracy of the measured data, the oscilloscope range can be amplified by the same multiple through the different attenuation parameters of the oscilloscope. The attenuation of the oscilloscope includes 1x, 2x, 5x and 10x.

[0069] The impedance of the signal generator 10 has two parameters, "XΩ" and "infinity". "XΩ" is a low-impedance output and "infinity" is a high-impedance output. If the signal generator 10 is regarded as a voltage source, the impedance is a resistor. When the impedance is "XΩ", the actual output of the signal generator 10 is 0.5 times the amplitude. If the impedance of the signal generator 10 is Infinity, that is, a high-impedance input, that is, the impedance is much greater than "XΩ", the actual output of the signal generator 10 is the amplitude set by the user. The impedance of the signal generator 10 is determined according to the resistance and transmission line connected to the circuit to achieve impedance matching.

[0070] After the test parameters are set, the test is started and the test phase is entered. The host computer 30 controls the signal generator 10 and the test result collector 20 to execute the isolation amplifier test method in the above embodiment.

[0071] Take the automated test of the linearity of an isolation amplifier as an example:

[0072] Among them, the signal generator 10 can use a regulated power supply, and the test results can be collected using a multimeter; when conducting the test, the device is remotely connected, the multimeter and the regulated power supply are powered on, and the host computer 30 is connected to the communication interface of the device to achieve remote control. The same as the amplitude-frequency response automation test, when entering the page front end, an ID will be automatically generated and stored in the browser. After the connection is successful, the device status will be returned through the socket, and the front end will display it according to the returned status. After the device is successfully connected, the remote automated test starts.

[0073] For the automated test of the linearity of the isolation amplifier, the safety test parameters that can be selected remotely on the front-end page may include the start voltage, stop voltage, step length, test interval, wiring direction of the regulated power supply, and statistical indicators. Among them, the step length is the step length output from the regulated power supply.

[0074] Among them, when the regulated power supply is connected positively, the multimeter output is negative, and when the regulated power supply is connected reversely, the multimeter output is positive.

[0075] Statistical indicators refer to the statistical analysis of the voltage values ​​measured by the multimeter according to different indicators, including the minimum value, average value, maximum value and other indicators of the voltage.

[0076] After setting the test voltage range, step size, test interval, wiring direction and statistical indicators, the test is started, and the test parameters are sent to the back end through a request to realize remote control of the voltage stabilizer and the multimeter. The voltage stabilizer outputs voltage to the output of the isolation amplifier one by one according to the voltage range and step size set for the isolation amplifier. The multimeter collects the isolation amplifier output signal according to the test interval and statistical indicators set by the user, and executes the isolation amplifier test method in the above embodiment through the host computer 30.

[0077] Figure 4 is a structural block diagram of an optional upper computer, such as Figure 4 As shown, it includes a processor 401, a communication interface 402, a memory 403 and a communication bus 404, wherein the processor 401, the communication interface 402 and the memory 403 communicate with each other through the communication bus 404, wherein,

[0078] Memory 403, used for storing computer programs;

[0079] The processor 401 is used to implement the following steps when executing the computer program stored in the memory 403:

[0080] Obtain safety test results for isolation amplifiers;

[0081] Determining actual test boundary conditions of the isolation amplifier based on the safety test results;

[0082] Based on the actual test boundary conditions, generate a first actual test parameter sequence for testing, and obtain a first actual test result;

[0083] Extracting a first result change feature sequence from the first actual test result, wherein the first result change feature sequence is a change feature between first actual test results corresponding to adjacent first actual test parameters;

[0084] Determine a second actual test parameter sequence based on the first result change characteristic sequence;

[0085] The first actual test result and the second actual test result obtained based on the second actual test parameter sequence are integrated to obtain a test result of the isolation amplifier.

[0086] Optionally, in this embodiment, the communication bus may be a PCI (Peripheral Component Interconnect) bus or an EISA (Extended Industry Standard Architecture) bus. The communication bus may be divided into an address bus, a data bus, a control bus, etc. For ease of representation, Figure 4 Only one thick line is used in the diagram, but this does not mean that there is only one bus or only one type of bus.

[0087] The communication interface is used for communication between the above electronic device and other devices.

[0088] The memory may include RAM, or may include non-volatile memory, such as at least one disk memory. Optionally, the memory may also be at least one storage device located away from the aforementioned processor.

[0089] The above-mentioned processor can be a general-purpose processor, which can include but not be limited to: CPU (Central Processing Unit), NP (Network Processor), etc.; it can also be DSP (Digital Signal Processing), ASIC (Application Specific Integrated Circuit), FPGA (Field-Programmable Gate Array) or other programmable logic devices, discrete gates or transistor logic devices, discrete hardware components.

[0090] Optionally, the specific examples in this embodiment may refer to the examples described in the above embodiments, and this embodiment will not be described in detail here.

[0091] It can be understood by those skilled in the art that Figure 4 The structure shown is for illustration only, and the device implementing the above isolation amplifier testing method may be a terminal device. Figure 4 It does not limit the structure of the above electronic device. For example, the terminal device may also include Figure 4 More or fewer components (such as network interfaces, display devices, etc.) shown in, or with Figure 4 Different configurations shown.

[0092] A person of ordinary skill in the art can understand that all or part of the steps in the various methods of the above embodiments can be completed by instructing the hardware related to the terminal device through a program, and the program can be stored in a computer-readable storage medium, which can include: a flash drive, ROM, RAM, a magnetic disk or an optical disk, etc.

[0093] According to another aspect of the embodiment of the present application, a storage medium is further provided. Optionally, in this embodiment, the storage medium can be used to execute the program code of the isolation amplifier testing method.

[0094] Optionally, in this embodiment, the storage medium may be located on at least one network device among a plurality of network devices in the network shown in the above embodiment.

[0095] Optionally, in this embodiment, the storage medium is configured to store program codes for executing the following steps:

[0096] Obtain safety test results for isolation amplifiers;

[0097] Determining actual test boundary conditions of the isolation amplifier based on the safety test results;

[0098] Based on the actual test boundary conditions, generate a first actual test parameter sequence for testing, and obtain a first actual test result;

[0099] Extracting a first result change feature sequence from the first actual test result, wherein the first result change feature sequence is a change feature between first actual test results corresponding to adjacent first actual test parameters;

[0100] Determine a second actual test parameter sequence based on the first result change characteristic sequence;

[0101] The first actual test result and the second actual test result obtained based on the second actual test parameter sequence are integrated to obtain a test result of the isolation amplifier.

[0102] Optionally, the specific examples in this embodiment may refer to the examples described in the above embodiments, which will not be described in detail in this embodiment.

[0103] Optionally, in this embodiment, the storage medium may include, but is not limited to, various media that can store program codes, such as a USB flash drive, a ROM, a RAM, a mobile hard disk, a magnetic disk, or an optical disk.

[0104] The serial numbers of the above-mentioned embodiments of the present application are for description only and do not represent the advantages or disadvantages of the embodiments.

[0105] If the integrated units in the above embodiments are implemented in the form of software functional units and sold or used as independent products, they can be stored in the above computer-readable storage medium. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, or all or part of the technical solution can be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for enabling one or more computer devices (which may be personal computers, servers or network devices, etc.) to execute all or part of the steps of the methods described in the various embodiments of the present application.

[0106] In the above embodiments of the present application, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, please refer to the relevant description of other embodiments.

[0107] In the several embodiments provided in the present application, it should be understood that the disclosed client can be implemented in other ways. Among them, the device embodiments described above are only schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of units or modules, which can be electrical or other forms.

[0108] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution provided in this embodiment.

[0109] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0110] Anything not described in this application can be achieved by adopting or drawing on existing technologies.

[0111] Each embodiment in this specification is described in a progressive manner, and the same and similar parts between the embodiments can be referred to each other, and each embodiment focuses on the differences from other embodiments. The above is only a preferred embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various changes and variations. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present application should be included in the scope of protection of the present application. It should be noted that similar numbers and letters represent similar items in the following drawings, so once an item is defined in one drawing, it does not need to be further defined and explained in subsequent drawings.

Claims

1. A method for testing an isolation amplifier, characterized in that: The test method includes: Obtain safety test results for isolation amplifiers; Determining actual test boundary conditions of the isolation amplifier based on the safety test result includes: Predicting the test results of all test parameters of the isolation amplifier based on the safety test results to obtain predicted test results; determining a test result safety range in the predicted test results; Determining a test parameter safety range based on the safety range of the test result; The actual test boundary condition is constructed based on the test result safety range and the test parameter safety range; wherein, the test results of all test parameters of the isolation amplifier are predicted based on the safety test result to obtain the predicted test result, including: Performing polynomial fitting on the safety test results and the safety test parameters corresponding to the safety test results to obtain a test result prediction model; Predicting a predicted test result corresponding to any test parameter based on the test result prediction model; Based on the actual test boundary conditions, generate a first actual test parameter sequence for testing, and obtain a first actual test result; Extracting a first result change feature sequence from the first actual test result, wherein the first result change feature sequence is a change feature between first actual test results corresponding to adjacent first actual test parameters; Determining a second actual test parameter sequence based on the first result change characteristic sequence includes: Determining whether there is fluctuation in the first actual test results between adjacent first actual test parameters based on the first result change characteristic sequence; If there is fluctuation, N test parameters are generated between adjacent first actual test parameters as second actual test parameters, where N is a positive integer greater than or equal to 1; The first actual test result and a second actual test result obtained based on the second actual test parameter sequence are integrated to obtain a test result of the isolation amplifier.

2. The isolation amplifier testing method according to claim 1, characterized in that: The determining whether there is fluctuation in the first actual test results between adjacent first actual test parameters based on the first result change characteristic sequence includes: Extracting a change trend and / or change rate in each adjacent first result change feature; Comparing the change trends and / or the change rates between adjacent first result change features one by one; When adjacent change trends change and / or the difference between adjacent change rates is greater than a preset value, it is determined that the first actual test result fluctuates between the corresponding first actual test parameters.

3. The isolation amplifier testing method according to claim 1, characterized in that: After obtaining a second actual test result based on the second actual test parameter sequence, the testing method further includes: determining an abnormal test result in the second actual test result; An inherent abnormal test parameter of the isolation amplifier is determined based on the abnormal test result.

4. The isolation amplifier testing method according to claim 1, wherein: When testing the isolation amplifier based on the first actual test parameter sequence and / or the second actual test parameter sequence, applying a simulated magnetic field in a nuclear fusion device during a magnet discharge process to the environment where the isolation amplifier is located; Obtaining a first actual test result and a second actual test result under a simulated magnetic field; extracting a second result change feature sequence from the first actual test result and the second actual test result; The working abnormality test parameter is determined based on the second result change characteristic sequence.

5. The isolation amplifier testing method according to claim 4, characterized in that: The step of applying a simulated magnetic field to a magnet during discharge in a nuclear fusion device in an environment where the isolation amplifier is located comprises: Respectively obtaining magnetic field parameters corresponding to a current increase period, a current stabilization period, and a current reduction period of a magnet discharge cycle in a nuclear fusion device; When the isolation amplifier is tested based on the first actual test parameter sequence and / or the second actual test parameter sequence, magnetic field parameters corresponding to the current increasing period, the current stabilizing period and the current decreasing period are applied in sequence.

6. The isolation amplifier testing method according to any one of claims 1 to 5, characterized in that: Testing of isolation amplifiers in batches also includes: Select part or all of the actual test parameters in the first actual test parameter sequence and the second actual test parameter sequence of the previous isolation amplifier as the first actual test parameters of the next isolation amplifier to test the next isolation amplifier, and perform the steps of extracting the first result change characteristic sequence in the first actual test result obtained based on the first actual test parameter sequence, wherein the first result change characteristic sequence is the change characteristic between the first actual test results corresponding to adjacent first actual test parameters; determining the second actual test parameter sequence based on the first result change characteristic sequence; and fusing the first actual test result and the second actual test result obtained based on the second actual test parameter sequence to obtain the test result of the isolation amplifier, until the testing of all isolation amplifiers is completed.

7. An isolation amplifier test system, characterized in that: The test system comprises: a signal generator, a test result collector and a host computer, wherein the signal generator is connected to the input end of the isolation amplifier, the test result collector is connected to the output end of the isolation amplifier, the host computer is connected to the signal generator and the test result collector respectively, and the host computer is used to execute the isolation amplifier test method described in any one of claims 1 to 6.

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