A calibration method for digital-to-analog converter

Through a variety of testing methods and calibration analysis, the accuracy deviation problem caused by digital-to-analog converters due to manufacturing and environment is solved, iterative calibration and performance optimization are achieved, and the stability and reliability of digital-to-analog converters are improved.

CN118890046BActive Publication Date: 2024-12-31HEFEI PANSIN ELECTRONICS CO LTD
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Patent Information

Application Number
CN202410758001.6
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2024-06-12
Publication Date
2024-12-31
Estimated Expiration
2044-06-12

AI Technical Summary

Technical Problem

Digital-to-analog converters may result in manufacturing deviations, device deviations, environmental changes and long-term use, affecting signal reconstruction quality, system performance, data accuracy and stability.

Method used

Through various testing methods, the actual accuracy of the digital-to-analog converter is verified, and the static error, dynamic error, nonlinear error and curve accurate values ​​are fused to generate accuracy calibration signaling, perform calibration analysis and adjustment, and obtain manufacturing deviations, environmental impacts and states Difference, calculate parameter compensation coefficient, adjust internal settings, and form an iterative calibration process.

Benefits of technology

Dynamic optimization of digital-to-analog converters is realized, stability and reliability are improved, high-precision outputs are ensured in long-term use, and performance is optimized through iterative calibration.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present invention provides a calibration method for a digital-to-analog converter, which relates to the field of electronic engineering technology, and includes the following steps: S1: using multiple test methods to test the actual accuracy of the digital-to-analog converter to obtain digital-to-analog test data; S2: fusing all parameters in the digital-to-analog test data to obtain a comprehensive test accuracy; S3: comparing the comprehensive test threshold with its preset accuracy threshold, if the comprehensive test accuracy is less than or equal to the preset accuracy threshold, it means that the accuracy of the digital-to-analog converter does not meet the requirements, and then generating an accuracy calibration signal; S4: when generating the accuracy calibration signal, starting calibration analysis and execution processing of the digital-to-analog converter. The present invention obtains accuracy impact data and accuracy change data through calibration analysis and execution processing of the digital-to-analog converter, obtains parameter compensation coefficients through such fusing processing, and adjusts the internal settings of the digital-to-analog converter according to these coefficients, so as to realize dynamic optimization of the digital-to-analog converter and improve the stability and reliability of the digital-to-analog converter.
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Description

Technical Field

[0001] The invention relates to the technical field of electronic engineering, and in particular to a calibration method for a digital-to-analog converter. Background Art

[0002] A digital-to-analog converter (DAC) is an electronic device used to convert digital signals into analog signals. DACs play an important role in many applications, including audio players, communication systems, control systems, etc. Different types of DACs may have different performance characteristics and applicable scenarios. DACs are usually composed of a series of switches, resistor networks, or other components, and the states of these components are controlled according to the input digital data to produce analog outputs corresponding to the input data. These digital data are usually input in binary form, and the DAC converts them into analog signals, and its output voltage or current has a definite relationship with the input digital data.

[0003] However, due to manufacturing deviations and device deviations, environmental changes, performance changes caused by long-term use, and the accuracy requirements of application requirements, the accuracy of the digital-to-analog converter will deviate, affecting the signal reconstruction quality, system performance, data accuracy, and system stability and reliability. Therefore, we propose a calibration method for the digital-to-analog converter to solve the above problems. Summary of the invention

[0004] In view of the deficiencies in the prior art, the present invention provides a calibration method for a digital-to-analog converter to solve the problem in the above-mentioned background technology that the accuracy of the digital-to-analog converter may deviate due to manufacturing deviations and device deviations, performance changes caused by environmental changes and long-term use, and accuracy requirements of application needs.

[0005] The purpose of the present invention can be achieved by the following technical solution: comprising the following steps:

[0006] S1: Use multiple test methods to test the actual accuracy of the digital-to-analog converter to obtain digital-to-analog test data; wherein the digital-to-analog test data includes a static error value, a dynamic error value, a nonlinear error value, a curve accuracy value, and a repeated test error value;

[0007] S2: All parameters in the digital model test data are integrated to obtain the comprehensive test accuracy;

[0008] S3: setting a preset accuracy threshold of the comprehensive inspection accuracy, comparing the comprehensive inspection threshold with its preset accuracy threshold, if the comprehensive inspection accuracy is greater than the preset accuracy threshold, it means that the accuracy of the digital-to-analog converter meets the requirements; conversely, if the comprehensive inspection accuracy is less than or equal to the preset accuracy threshold, it means that the accuracy of the digital-to-analog converter does not meet the requirements, and then generating an accuracy calibration signaling;

[0009] S4: When the precision calibration signaling is generated, the calibration analysis and execution processing of the digital-to-analog converter is started, specifically:

[0010] S41: Acquire information related to the accuracy of the digital-to-analog converter;

[0011] S42: performing deviation analysis on the accuracy-related information of the digital-to-analog converter to obtain a manufacturing deviation value, an environmental impact value, and a digital-to-analog state difference value; combining the comprehensive inspection accuracy, the manufacturing deviation value, the environmental impact value, and the digital-to-analog state difference value into accuracy impact data;

[0012] S43: performing change analysis on the accuracy affecting data to obtain performance change values ​​of corresponding parameters in the accuracy affecting data; and combining the performance change values ​​of corresponding parameters in the accuracy affecting data into accuracy change data;

[0013] S44: fusing the precision impact data and the precision change data to obtain parameter compensation coefficients of corresponding parameters; and adjusting internal settings of the digital-to-analog converter according to the parameter compensation coefficients;

[0014] S5: Repeat steps S2 and S3. If an accuracy calibration signaling is generated, execute step S4.

[0015] As a preferred embodiment of the present invention, a variety of test methods are used to check the actual accuracy of the digital-to-analog converter, specifically:

[0016] Set known value analog signals, use a standard signal source to input multiple groups of known value analog signals into the digital-to-analog converter, and record each group of output digital signals; wherein the known value analog signals include static analog signals, dynamic analog signals, and nonlinear analog signals; perform difference calculation between each group of output digital signals and a preset standard signal to obtain a standard deviation value of each group of output signals; calculate the standard deviation values ​​of all static analog signals to obtain a static error value;

[0017] Calculate the standard deviation of all dynamic analog signals to obtain the dynamic error value;

[0018] Identify the characteristic information of the digital signal output by all nonlinear analog signals; the characteristic information includes frequency, amplitude, and peak-to-peak value; set the standard characteristic value corresponding to the nonlinear analog signal, perform difference calculation between the digital signal and its standard characteristic value, and obtain the nonlinear difference value; calculate the nonlinear difference value of the characteristic information in each group of nonlinear analog signals to obtain the nonlinear error value;

[0019] The digital signals output by each group of known value analog signals are connected in time sequence to generate digital curves of corresponding signals; a standard curve corresponding to the known analog signal is set, and a similarity calculation method is used to calculate the similarity between the digital curve of the corresponding signal and the standard curve to obtain a similarity difference value of the corresponding curve; a curve deviation process is performed on the similarity difference value corresponding to the known value analog signal to obtain an accurate value of the curve;

[0020] Set the minimum number of repeated inspection tests, record the digital-analog inspection data of each repeated inspection, and calculate the mean, variance and standard deviation; perform weighted calculation on the mean, variance and standard deviation of the corresponding data in the digital-analog inspection data to obtain the repeated inspection error value; combine the static error value, dynamic error value, nonlinear error value, curve accuracy value and repeated inspection error value into the digital-analog inspection data.

[0021] As a preferred embodiment of the present invention, the change analysis of the accuracy impact data is performed, specifically through the following steps:

[0022] Obtain the accuracy affecting data of the digital-to-analog converter; input any parameter and acquisition time in the accuracy affecting data into the performance data change trend diagram, mark the location of any data in the performance data as a data corresponding point, and connect adjacent data corresponding points to obtain a data corresponding line; calculate the slope of the data corresponding line, mark the slope with a positive value as a positive slope value, and mark the slope with a negative value as a negative slope value; sum all the positive slope values ​​and negative slope values ​​to obtain a positive slope total value and a negative slope total value; perform weighted calculation on the positive slope total value and the negative slope total value to obtain a change affecting value corresponding to the accuracy affecting data;

[0023] Obtain the initial time of the digital-to-analog converter, and calculate the time difference between the initial time and the current time to obtain the total time;

[0024] Obtain the time when the digital-to-analog converter generates the precision calibration signal closest to the current time, mark it as the calibration time, calculate the time difference between the calibration time and the current time, and obtain the calibration time difference;

[0025] Obtain all calibration moments of the digital-to-analog converter, calculate the difference between adjacent calibration moments in chronological order, and obtain the calibration interval; calculate the calibration interval to obtain the calibration change value;

[0026] Set the preset selected time zone, calculate the change impact value and total duration, calibration time difference, and calibration change value at any time in the preset selected time zone, and obtain the performance change value of the corresponding parameter in the accuracy impact data.

[0027] As a preferred implementation of the present invention, a fluctuation analysis is performed on the accuracy-related information of the digital-to-analog converter, specifically:

[0028] Obtain the manufacturing parameters of any part used in the digital-to-analog converter, identify the design specifications corresponding to the part, calculate the difference between the design specifications corresponding to the part and the manufacturing parameters to obtain the specification difference, calculate all the specification differences of all parts on the digital-to-analog converter, and obtain the manufacturing deviation value;

[0029] Acquire environmental information of the digital-to-analog converter; the environmental information includes temperature, humidity, vibration, and electromagnetic interference; set a parameter standard threshold value of any parameter in the environmental information, perform difference calculation between any parameter in the environmental information and its parameter standard threshold value, and obtain an environmental difference value corresponding to the parameter, which is expressed as Dm, where m represents the index of the parameter in the environmental information; calculate the environmental difference values ​​of all parameters in the environmental information to obtain an environmental impact value;

[0030] The state deviation information of the digital-to-analog converter is obtained; the state deviation information includes the difference between the rated value and the actual value of the resistor, capacitor, and inductor components; an allowable state deviation threshold is set, and the difference between any parameter in the state deviation information and its corresponding allowable state deviation threshold is calculated to obtain the state difference value corresponding to the parameter; the state difference values ​​of all parameters in the state deviation information are calculated to obtain the digital-to-analog state difference value.

[0031] As a preferred embodiment of the present invention, a plurality of sensors are provided on the digital-to-analog converter, and the sensors are used to collect manufacturing parameters, environmental information and state deviation information of parts on the digital-to-analog converter.

[0032] As a preferred embodiment of the present invention, when executing step S5, the calibration analysis and execution processing are also evaluated and analyzed, specifically:

[0033] The comprehensive inspection accuracy in step S2 is marked as the initial accuracy, and the comprehensive inspection accuracy obtained by repeating step S2 in step S5 is marked as the compensation accuracy; the compensation accuracy and the initial accuracy are calculated to obtain the accuracy adjustment value; the accuracy assessment time zone is set, and the accuracy adjustment value in the accuracy assessment time zone is calculated in chronological order to obtain the adjustment fluctuation value;

[0034] The time difference between the generation times of adjacent precision calibration signalings in the precision assessment time zone is calculated to obtain the repeated execution duration; if the repeated execution duration is less than or equal to the set duration threshold, the number of repeated executions is recorded plus one; if the repeated execution duration is greater than the set duration threshold, the number of repeated executions is reset to zero;

[0035] The adjustment fluctuation value and the number of repeated executions are calculated to obtain the calibration evaluation value RK; if the calibration evaluation value is not within the preset normal range, a calibration exception signal is generated: the calibration exception signal is used to notify the maintenance personnel of the number and position of the digital-to-analog converter through the intelligent terminal, and the maintenance personnel will check or adjust the digital-to-analog converter.

[0036] Compared with the prior art, the present invention has the following beneficial effects:

[0037] 1. The present invention obtains accuracy impact data and accuracy change data through calibration analysis and execution processing of the digital-to-analog converter, obtains parameter compensation coefficients through fusion processing, and adjusts the internal settings of the digital-to-analog converter based on these coefficients, thereby realizing dynamic optimization of the digital-to-analog converter and improving the stability and reliability of the digital-to-analog converter.

[0038] 2. The present invention repeats steps S2 and S3 through step S5, and executes step S4 when necessary, thereby forming an iterative calibration process, realizing continuous monitoring and iterative optimization of the accuracy of the digital-to-analog converter, ensuring that the digital-to-analog converter can still maintain high-precision output during long-term use, and through the iterative calibration process, continuously accumulating accuracy calibration data and experience, and being able to gradually optimize the performance of the digital-to-analog converter. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] In order to facilitate understanding by those skilled in the art, the present invention is further described below with reference to the accompanying drawings.

[0040] Figure 1 The present invention is a flowchart of a calibration method for a digital-to-analog converter.

[0041] Figure 2 It is a flowchart of step S4 of a calibration method for a digital-to-analog converter of the present invention. DETAILED DESCRIPTION

[0042] Exemplary embodiments will be described in detail herein, examples of which are shown in the accompanying drawings. When the following description refers to the drawings, the same numbers in different drawings represent the same or similar elements unless otherwise indicated. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present disclosure. Instead, they are merely examples of devices and methods consistent with some aspects of the present disclosure as detailed in the appended claims.

[0043] The terms used in this disclosure are for the purpose of describing specific embodiments only and are not intended to limit the disclosure. The singular forms of "class", "group" and "the" used in this disclosure and the appended claims are also intended to include plural forms unless the context clearly indicates otherwise. It should also be understood that the term "and / or" used herein refers to and includes any or all possible combinations of one or more associated listed items.

[0044] It should be understood that although the terms first, second, third, etc. may be used in the present disclosure to describe various information, such information should not be limited to these terms. These terms are only used to distinguish the same type of information from each other. For example, without departing from the scope of the present disclosure, the first information may also be referred to as the second information, and similarly, the second information may also be referred to as the first information. Depending on the context, the word "if" as used herein may be interpreted as "at the time of" or "when" or "in response to determining".

[0045] See also Figure 1-Figure 2 As shown, a calibration method for a digital-to-analog converter comprises the following steps:

[0046] S1: Use multiple test methods to test the actual accuracy of the digital-to-analog converter to obtain digital-to-analog test data; wherein the digital-to-analog test data includes a static error value, a dynamic error value, a nonlinear error value, a curve accuracy value, and a repeated test error value;

[0047] S2: All parameters in the digital model test data are integrated and processed using the formula The comprehensive inspection accuracy JD is obtained; wherein, e1, e2, e3, and e5 represent the weights corresponding to the static error value, the dynamic error value, the nonlinear error value, and the repeated inspection error value, respectively, and ie4 represents the weight of the accurate value of the curve corresponding to the known value simulation signal index i;

[0048] S3: setting a preset accuracy threshold of the comprehensive inspection accuracy, comparing the comprehensive inspection threshold with its preset accuracy threshold, if the comprehensive inspection accuracy is greater than the preset accuracy threshold, it means that the accuracy of the digital-to-analog converter meets the requirements; conversely, if the comprehensive inspection accuracy is less than or equal to the preset accuracy threshold, it means that the accuracy of the digital-to-analog converter does not meet the requirements, and then generating an accuracy calibration signaling;

[0049] S4: When the precision calibration signaling is generated, the calibration analysis and execution processing of the digital-to-analog converter is started, specifically:

[0050] S41: Acquire information related to the accuracy of the digital-to-analog converter;

[0051] S42: performing deviation analysis on the accuracy-related information of the digital-to-analog converter to obtain a manufacturing deviation value, an environmental impact value, and a digital-to-analog state difference value; combining the comprehensive inspection accuracy, the manufacturing deviation value, the environmental impact value, and the digital-to-analog state difference value into accuracy impact data;

[0052] S43: performing change analysis on the accuracy affecting data to obtain performance change values ​​of corresponding parameters in the accuracy affecting data; and combining the performance change values ​​of corresponding parameters in the accuracy affecting data into accuracy change data;

[0053] S44: The accuracy impact data and the accuracy change data are fused and processed, and the parameter compensation coefficient KG of the corresponding parameter is obtained by using the formula KG=f(DG×g1,AI×g2); wherein AI represents the parameter corresponding to the accuracy change data in the accuracy impact data, and g1 and g2 represent the weight influence factors of the parameters corresponding to the accuracy impact data and the accuracy change data, respectively; the internal settings of the digital-to-analog converter are adjusted according to the parameter compensation coefficient;

[0054] S5: Repeat steps S2 and S3. If an accuracy calibration signaling is generated, execute step S4.

[0055] In this application, a variety of test methods are used to verify the actual accuracy of the digital-to-analog converter, specifically:

[0056] Set known value analog signals, use a standard signal source to input multiple groups of known value analog signals into the digital-to-analog converter, and record each group of output digital signals; the known value analog signals include static analog signals, dynamic analog signals, and nonlinear analog signals; calculate the difference between each group of output digital signals and the preset standard signal to obtain the standard deviation value of each group of output signals, marked as TD; calculate the standard deviation values ​​of all static analog signals, and use the formula Get the static error value TR1; where t1TD i=1 represents the error value of the static analog signal with index t1, T1 represents the total index of the static analog signal in the known analog signal, t1β represents the weight corresponding to the error value of the static analog signal t1; i represents the index of the corresponding signal in the known value analog signal, where the indexes of the static analog signal, dynamic analog signal and nonlinear analog signal correspond to 1, 2 and 3 respectively;

[0057] Calculate the standard deviation of all dynamic analog signals using the formula Get the dynamic error value TR2; where t2TD i=2 represents the error value of the dynamic analog signal with index t2, T2 represents the total amount of the index of the static analog signal in the known analog signal, and t2χ represents the weight corresponding to the error value of the dynamic analog signal t2;

[0058] Identify the characteristic information of the digital signal output by all nonlinear analog signals; the characteristic information includes frequency, amplitude, and peak-to-peak value; set the standard characteristic value corresponding to the nonlinear analog signal, calculate the difference between the digital signal and its standard characteristic value, and obtain the nonlinear difference represented as GY; calculate the nonlinear difference of the characteristic information in each group of nonlinear analog signals, and use the formula The nonlinear error value GX is obtained; wherein u represents the index of the parameter in the characteristic information, p represents the index of the nonlinear analog signal, upGY represents the nonlinear difference value of the characteristic information parameter of the nonlinear analog signal p as u, The characteristic information parameter representing the nonlinear analog signal p is the weight corresponding to u;

[0059] The digital signals output by each group of known value analog signals are connected in time sequence to generate the digital curve of the corresponding signal; the standard curve corresponding to the known analog signal is set, and the similarity calculation method is used to calculate the similarity between the digital curve of the corresponding signal and the standard curve to obtain the similarity difference of the corresponding curve represented as GFi; the similarity difference corresponding to the known value analog signal is processed by curve deviation, and the formula is used The curve accuracy value GHi is obtained; wherein k represents the index of the digital curve, kGFi represents the similarity difference between the digital curve k corresponding to the known analog signal i and the standard curve, and kγ represents the weight corresponding to the similarity difference between the digital curve k and the standard curve;

[0060] Set the minimum number of repeated inspection tests, record the digital-analog inspection data of each repeated inspection, and calculate the mean, variance and standard deviation; perform weighted calculation on the mean, variance and standard deviation of the corresponding data in the digital-analog inspection data, and obtain the repeated inspection error value marked as CF; combine the static error value, dynamic error value, nonlinear error value, curve accuracy value and repeated inspection error value into the digital-analog inspection data.

[0061] It should be noted that a variety of testing methods can be used to help identify and solve possible problems and comprehensively evaluate the performance of the digital-to-analog converter under various operating conditions, including static, dynamic and nonlinear performance.

[0062] In this application, the change analysis of the accuracy impact data is carried out through the following steps:

[0063] Obtain the accuracy affecting data of the digital-to-analog converter; input any parameter and acquisition time in the accuracy affecting data into the performance data change trend diagram, mark the location of any data in the performance data as a data corresponding point, and connect adjacent data corresponding points to obtain a data corresponding line; calculate the slope of the data corresponding line, mark the slope with a positive value as a positive slope value, and mark the slope with a negative value as a negative slope value; sum all the positive slope values ​​and negative slope values ​​to obtain the total positive slope value and the total negative slope value; perform weighted calculation on the total positive slope value and the total negative slope value to obtain the change affecting value corresponding to the accuracy affecting data, which is expressed as DG1;

[0064] Obtain the initial time of the digital-to-analog converter, calculate the time difference between the initial time and the current time to obtain the total time length represented as DG2;

[0065] Obtain the time when the digital-to-analog converter generates the precision calibration signal closest to the current time, mark it as the calibration time, calculate the time difference between the calibration time and the current time, and obtain the calibration time difference, which is expressed as DG3;

[0066] Get all the calibration times of the DAC, calculate the difference between the adjacent calibration times in chronological order, and get the calibration interval represented as Z; calculate the calibration interval using the formula The calibration change value DG4 is obtained; wherein b represents the index of the calibration interval, represents the average value of all calibration intervals;

[0067] Set the preset selected time zone, calculate the change impact value and total time, calibration time difference, and calibration change value at any time in the preset selected time zone, and use the formula The performance change value DG of the corresponding parameter in the accuracy impact data is obtained; wherein, sDG1 represents the change impact value at time s in the preset selected time zone, sd1 represents the weight of the change impact value corresponding to time s in the preset selected time zone, d2, d3, and d4 represent the weights corresponding to the total time, calibration time difference, and calibration change value, respectively.

[0068] It should be noted that by comprehensively analyzing the changes in the data affecting accuracy, comprehensive monitoring and optimization of the performance of the digital-to-analog converter can be achieved.

[0069] In this application, the accuracy-related information of the digital-to-analog converter is subjected to fluctuation analysis, specifically:

[0070] Obtain the manufacturing parameters of any part used by the digital-to-analog converter, identify the design specifications corresponding to the part, calculate the difference between the design specifications corresponding to the part and the manufacturing parameters to obtain the specification difference marked as U, calculate all the specification differences on all the parts on the digital-to-analog converter, and use the formula to obtain the manufacturing deviation value GC; where q represents the index of the specification difference at each position on the part, v represents the index of the part on the digital-to-analog converter, qvU represents the specification difference at position q on part v on the digital-to-analog converter, and qvξ represents the weight of qvU representing the specification difference at position q on part v on the digital-to-analog converter;

[0071] Obtain the environmental information of the digital-to-analog converter; the environmental information includes temperature, humidity, vibration, and electromagnetic interference; set the parameter standard threshold of any parameter in the environmental information, calculate the difference between any parameter in the environmental information and its parameter standard threshold, and obtain the environmental difference value corresponding to the parameter, which is expressed as Dm, where m represents the index of the parameter in the environmental information; calculate the environmental difference values ​​of all parameters in the environmental information, and use the formula The environmental impact value DK is obtained; wherein mλ represents the weight corresponding to the parameter m in the environmental information;

[0072] Obtain the state deviation information of the digital-to-analog converter; the state deviation information includes the difference between the rated value and the actual value of the resistor, capacitor, and inductor components; set the allowable state deviation threshold, calculate the difference between any parameter in the state deviation information and its corresponding allowable state deviation threshold, and obtain the state difference value CL corresponding to the parameter; calculate the state difference of all parameters in the state deviation information, and use the formula The digital-analog state difference CG is obtained; wherein c represents the index of the parameter in the state deviation information, and cCL represents the state difference value corresponding to the parameter c in the state deviation information. Indicates the weight corresponding to the parameter c in the state deviation information.

[0073] It should be noted that by conducting a comprehensive fluctuation analysis on the accuracy-related information of the digital-to-analog converter, including analysis of manufacturing deviations, environmental impacts, and state deviation information, the accuracy and stability of the digital-to-analog converter can be improved, thereby enhancing system reliability.

[0074] In the present application, a number of sensors are provided on the digital-to-analog converter, and the sensors are used to collect manufacturing parameters, environmental information and state deviation information of parts on the digital-to-analog converter.

[0075] It should be noted that in order to comprehensively monitor the performance of the digital-to-analog converter and promptly discover and solve possible problems, these sensors can accurately evaluate the working status of the digital-to-analog converter by collecting and analyzing these data in real time, thereby realizing intelligent management and optimization of the equipment. At the same time, these sensors also provide effective support for the maintenance and maintenance of the digital-to-analog converter, which can help maintenance personnel locate and handle problems more accurately, and improve maintenance efficiency and accuracy.

[0076] In the present application, when executing step S5, the calibration analysis and execution processing are also evaluated and analyzed, specifically:

[0077] The comprehensive inspection accuracy in step S2 is marked as the initial accuracy R1, and the comprehensive inspection accuracy obtained by repeating step S2 in step S5 is marked as the compensation accuracy R2; the difference between the compensation accuracy and the initial accuracy is calculated, and the formula is expressed as R=R2-R1 to obtain the accuracy adjustment value R; the accuracy evaluation time zone is set, and the accuracy adjustment value in the accuracy evaluation time zone is calculated in chronological order, and the formula is used to calculate the accuracy adjustment value in the accuracy evaluation time zone. The adjusted fluctuation value RU is obtained; wherein h represents the total number of precision adjustment values ​​in the precision assessment time zone, and z represents the index of the precision adjustment value in the precision assessment time zone. Indicates the average value of the precision adjustment value in the precision evaluation time zone;

[0078] The time difference between the generation times of adjacent precision calibration signalings in the precision assessment time zone is calculated, and the obtained repeated execution duration is marked as RG; if the repeated execution duration is less than or equal to the set duration threshold, the number of repeated executions is recorded plus one; if the repeated execution duration is greater than the set duration threshold, the number of repeated executions is reset to zero;

[0079] The adjustment fluctuation value and the number of repeated executions are calculated, and the calibration evaluation value RK is obtained using the formula RK=RU*r1+RG*r2; wherein r1 and r2 represent the weights of the adjustment fluctuation value and the number of repeated executions, respectively; if the calibration evaluation value is not within the preset normal range, a calibration exception signal is generated: the calibration exception signal is used to notify the maintenance personnel of the number and position of the digital-to-analog converter through the intelligent terminal, and the maintenance personnel will check or adjust the digital-to-analog converter.

[0080] It should be noted that by evaluating and analyzing the precision adjustment value and repeated execution status, possible calibration problems of the digital-to-analog converter can be discovered in a timely manner, and corresponding abnormal signaling can be generated so that maintenance personnel can take necessary measures to ensure the accuracy and stability of the digital-to-analog converter.

[0081] The weights involved in the present invention are all set by professionals in the field according to actual conditions.

[0082] Those skilled in the art will readily appreciate other embodiments of the present disclosure after considering the specification and practicing the invention disclosed herein. The present disclosure is intended to cover any variations, uses or adaptations of the present disclosure that follow the general principles of the present disclosure and include common knowledge or customary techniques in the art that are not disclosed in the present disclosure. The description and examples are to be considered exemplary only, and the true scope and spirit of the present disclosure are indicated by the following claims.

[0083] The above description is only a preferred embodiment of the present disclosure and is not intended to limit the present disclosure. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present disclosure shall be included in the scope of protection of the present disclosure.

Claims

1. A method for calibrating a digital-to-analog converter, characterized in that: The following steps are involved: S1: Use multiple test methods to test the actual accuracy of the digital-to-analog converter to obtain digital-to-analog test data; wherein the digital-to-analog test data includes a static error value, a dynamic error value, a nonlinear error value, a curve accuracy value, and a repeated test error value; S2: All parameters in the digital model test data are integrated to obtain the comprehensive test accuracy; S3: setting a preset accuracy threshold of the comprehensive inspection accuracy, comparing the comprehensive inspection threshold with its preset accuracy threshold, if the comprehensive inspection accuracy is greater than the preset accuracy threshold, it means that the accuracy of the digital-to-analog converter meets the requirements; conversely, if the comprehensive inspection accuracy is less than or equal to the preset accuracy threshold, it means that the accuracy of the digital-to-analog converter does not meet the requirements, and then generating an accuracy calibration signaling; S4: When the precision calibration signaling is generated, the calibration analysis and execution processing of the digital-to-analog converter is started, specifically: S41: Acquire information related to the accuracy of the digital-to-analog converter; S42: performing deviation analysis on the accuracy-related information of the digital-to-analog converter to obtain a manufacturing deviation value, an environmental impact value, and a digital-to-analog state difference value; combining the comprehensive inspection accuracy, the manufacturing deviation value, the environmental impact value, and the digital-to-analog state difference value into accuracy impact data; S43: Perform change analysis on the accuracy impact data, specifically through the following steps: Obtain the accuracy affecting data of the digital-to-analog converter; input any parameter and acquisition time in the accuracy affecting data into the performance data change trend diagram, mark the location of any data in the performance data as a data corresponding point, and connect adjacent data corresponding points to obtain a data corresponding line; calculate the slope of the data corresponding line, mark the slope with a positive value as a positive slope value, and mark the slope with a negative value as a negative slope value; sum all the positive slope values ​​and negative slope values ​​to obtain a positive slope total value and a negative slope total value; perform weighted calculation on the positive slope total value and the negative slope total value to obtain a change affecting value corresponding to the accuracy affecting data; Obtain the initial time of the digital-to-analog converter, and calculate the time difference between the initial time and the current time to obtain the total time; Obtain the time when the digital-to-analog converter generates the precision calibration signal closest to the current time, mark it as the calibration time, calculate the time difference between the calibration time and the current time, and obtain the calibration time difference; Obtain all calibration moments of the digital-to-analog converter, calculate the difference between adjacent calibration moments in chronological order, and obtain the calibration interval; calculate the calibration interval to obtain the calibration change value; Set a preset selected time zone, calculate the change impact value and total duration, calibration time difference, and calibration change value at any time in the preset selected time zone, and obtain the performance change value of the corresponding parameter in the accuracy impact data; combine the performance change values ​​of the corresponding parameters in the accuracy impact data into accuracy change data; S44: fusing the precision impact data and the precision change data to obtain parameter compensation coefficients of corresponding parameters; and adjusting internal settings of the digital-to-analog converter according to the parameter compensation coefficients; S5: Repeat steps S2 and S3. If an accuracy calibration signaling is generated, execute step S4.

2. A calibration method for a digital-to-analog converter according to claim 1, characterized in that: The actual accuracy of the digital-to-analog converter is verified using a variety of test methods, specifically: Set known value analog signals, use a standard signal source to input multiple groups of known value analog signals into the digital-to-analog converter, and record each group of output digital signals; wherein the known value analog signals include static analog signals, dynamic analog signals, and nonlinear analog signals; perform difference calculation between each group of output digital signals and a preset standard signal to obtain a standard deviation value of each group of output signals; calculate the standard deviation values ​​of all static analog signals to obtain a static error value; Calculate the standard deviation of all dynamic analog signals to obtain the dynamic error value; Identify the characteristic information of the digital signal output by all nonlinear analog signals; the characteristic information includes frequency, amplitude, and peak-to-peak value; set the standard characteristic value corresponding to the nonlinear analog signal, perform difference calculation between the digital signal and its standard characteristic value, and obtain the nonlinear difference value; calculate the nonlinear difference value of the characteristic information in each group of nonlinear analog signals to obtain the nonlinear error value; The digital signals output by each group of known value analog signals are connected in time sequence to generate digital curves of corresponding signals; a standard curve corresponding to the known analog signal is set, and a similarity calculation method is used to calculate the similarity between the digital curve of the corresponding signal and the standard curve to obtain a similarity difference value of the corresponding curve; a curve deviation process is performed on the similarity difference value corresponding to the known value analog signal to obtain an accurate value of the curve; Set the minimum number of repeated inspection tests, record the digital-analog inspection data of each repeated inspection, and calculate the mean, variance and standard deviation; perform weighted calculation on the mean, variance and standard deviation of the corresponding data in the digital-analog inspection data to obtain the repeated inspection error value; combine the static error value, dynamic error value, nonlinear error value, curve accuracy value and repeated inspection error value into the digital-analog inspection data.

3. The calibration method of a digital-to-analog converter according to claim 1, characterized in that: The accuracy-related information of the digital-to-analog converter is analyzed for fluctuations, specifically: Obtain the manufacturing parameters of any part used in the digital-to-analog converter, identify the design specifications corresponding to the part, calculate the difference between the design specifications corresponding to the part and the manufacturing parameters to obtain the specification difference, calculate all the specification differences of all parts on the digital-to-analog converter, and obtain the manufacturing deviation value; Acquire environmental information of the digital-to-analog converter; the environmental information includes temperature, humidity, vibration, and electromagnetic interference; set a parameter standard threshold value of any parameter in the environmental information, perform difference calculation between any parameter in the environmental information and its parameter standard threshold value, and obtain an environmental difference value corresponding to the parameter, which is expressed as Dm, where m represents the index of the parameter in the environmental information; calculate the environmental difference values ​​of all parameters in the environmental information to obtain an environmental impact value; Obtaining state deviation information of the digital-to-analog converter; the state deviation information includes the difference between the rated value and the actual value of the resistor, capacitor, and inductor components; Set the allowable state deviation threshold, calculate the difference between any parameter in the state deviation information and its corresponding allowable state deviation threshold, and obtain the state difference value corresponding to the parameter; calculate the state difference values ​​of all parameters in the state deviation information to obtain the digital-analog state difference value.

4. A calibration method for a digital-to-analog converter according to claim 3, characterized in that: The digital-to-analog converter is provided with a plurality of sensors, and the sensors are used to collect manufacturing parameters, environmental information and state deviation information of parts on the digital-to-analog converter.

5. The calibration method of a digital-to-analog converter according to claim 1, characterized in that: When executing step S5, the calibration analysis and execution processing are also evaluated and analyzed, specifically: The comprehensive inspection accuracy in step S2 is marked as the initial accuracy, and the comprehensive inspection accuracy obtained by repeating step S2 in step S5 is marked as the compensation accuracy; the compensation accuracy and the initial accuracy are calculated to obtain the accuracy adjustment value; the accuracy assessment time zone is set, and the accuracy adjustment value in the accuracy assessment time zone is calculated in chronological order to obtain the adjustment fluctuation value; The time difference between the generation times of adjacent precision calibration signalings in the precision assessment time zone is calculated to obtain the repeated execution duration; if the repeated execution duration is less than or equal to the set duration threshold, the number of repeated executions is recorded plus one; if the repeated execution duration is greater than the set duration threshold, the number of repeated executions is reset to zero; The adjustment fluctuation value and the number of repeated executions are calculated to obtain the calibration evaluation value RK; if the calibration evaluation value is not within the preset normal range, a calibration exception signal is generated: the calibration exception signal is used to notify the maintenance personnel of the number and position of the digital-to-analog converter through the intelligent terminal, and the maintenance personnel will check or adjust the digital-to-analog converter.

Citation Information

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